CN111485283A - A kind of crystal growth device and growth method - Google Patents
A kind of crystal growth device and growth method Download PDFInfo
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- CN111485283A CN111485283A CN202010417703.XA CN202010417703A CN111485283A CN 111485283 A CN111485283 A CN 111485283A CN 202010417703 A CN202010417703 A CN 202010417703A CN 111485283 A CN111485283 A CN 111485283A
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- 239000013078 crystal Substances 0.000 title claims abstract description 102
- 238000000034 method Methods 0.000 title claims abstract description 25
- 239000000155 melt Substances 0.000 claims description 42
- 239000002994 raw material Substances 0.000 claims description 14
- 238000002109 crystal growth method Methods 0.000 claims description 11
- 239000000463 material Substances 0.000 claims description 6
- 239000007788 liquid Substances 0.000 claims description 5
- BPQQTUXANYXVAA-UHFFFAOYSA-N Orthosilicate Chemical compound [O-][Si]([O-])([O-])[O-] BPQQTUXANYXVAA-UHFFFAOYSA-N 0.000 claims description 3
- ANDNPYOOQLLLIU-UHFFFAOYSA-N [Y].[Lu] Chemical compound [Y].[Lu] ANDNPYOOQLLLIU-UHFFFAOYSA-N 0.000 claims description 3
- 239000002223 garnet Substances 0.000 claims description 3
- WSMQKESQZFQMFW-UHFFFAOYSA-N 5-methyl-pyrazole-3-carboxylic acid Chemical compound CC1=CC(C(O)=O)=NN1 WSMQKESQZFQMFW-UHFFFAOYSA-N 0.000 claims description 2
- GQYHUHYESMUTHG-UHFFFAOYSA-N lithium niobate Chemical compound [Li+].[O-][Nb](=O)=O GQYHUHYESMUTHG-UHFFFAOYSA-N 0.000 claims description 2
- QWVYNEUUYROOSZ-UHFFFAOYSA-N trioxido(oxo)vanadium;yttrium(3+) Chemical compound [Y+3].[O-][V]([O-])([O-])=O QWVYNEUUYROOSZ-UHFFFAOYSA-N 0.000 claims description 2
- 238000010438 heat treatment Methods 0.000 claims 1
- 238000002844 melting Methods 0.000 claims 1
- 230000008018 melting Effects 0.000 claims 1
- 238000005336 cracking Methods 0.000 abstract description 9
- 230000007547 defect Effects 0.000 abstract description 8
- 238000004519 manufacturing process Methods 0.000 description 8
- 239000000126 substance Substances 0.000 description 8
- 238000010586 diagram Methods 0.000 description 6
- 239000012535 impurity Substances 0.000 description 6
- 238000004321 preservation Methods 0.000 description 4
- 230000001788 irregular Effects 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 230000007423 decrease Effects 0.000 description 2
- 229910052688 Gadolinium Inorganic materials 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- JNDMLEXHDPKVFC-UHFFFAOYSA-N aluminum;oxygen(2-);yttrium(3+) Chemical compound [O-2].[O-2].[O-2].[Al+3].[Y+3] JNDMLEXHDPKVFC-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- UIWYJDYFSGRHKR-UHFFFAOYSA-N gadolinium atom Chemical compound [Gd] UIWYJDYFSGRHKR-UHFFFAOYSA-N 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 230000009643 growth defect Effects 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000010899 nucleation Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000000191 radiation effect Effects 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000004781 supercooling Methods 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
- 229910019901 yttrium aluminum garnet Inorganic materials 0.000 description 1
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/10—Crucibles or containers for supporting the melt
- C30B15/12—Double crucible methods
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/16—Oxides
- C30B29/22—Complex oxides
- C30B29/30—Niobates; Vanadates; Tantalates
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/34—Silicates
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
本发明公开了一种晶体的生长装置,包括相互独立的外坩埚和内坩埚,所述内坩埚的直径小于所述外坩埚的直径;所述内坩埚底部设有使熔体流入或流出的小孔,所述内坩埚顶部设有坩埚盖,所述坩埚盖上设有内坩埚固定杆,所述内坩埚固定杆的底部固定在所述坩埚盖上,所述内坩埚固定杆的顶部与炉体相连接;所述外坩埚底部设有控制外坩埚升降的坩埚支撑杆。同时,本发明还公开了利用所述装置生长晶体的方法。本发明的生长装置及生长方法所制备得到的晶体无开裂、气泡、夹杂、散射等缺陷。
The invention discloses a crystal growth device, comprising an outer crucible and an inner crucible which are independent of each other, wherein the diameter of the inner crucible is smaller than the diameter of the outer crucible; The top of the inner crucible is provided with a crucible cover, the crucible cover is provided with an inner crucible fixing rod, the bottom of the inner crucible fixing rod is fixed on the crucible cover, and the top of the inner crucible fixing rod is connected to the furnace The body is connected; the bottom of the outer crucible is provided with a crucible support rod that controls the lifting and lowering of the outer crucible. At the same time, the invention also discloses a method for growing crystals by using the device. The crystal prepared by the growth device and the growth method of the present invention has no defects such as cracking, bubbles, inclusions, and scattering.
Description
技术领域technical field
本发明涉及一种晶体制备领域,尤其涉及一种晶体的生长装置及生长方法。The invention relates to the field of crystal preparation, in particular to a crystal growth device and a growth method.
背景技术Background technique
提拉法是一种从熔体中生长晶体的方法,具有生长速度快、易观察、晶体质量高等优点,广泛应用于硅、锗、蓝宝石、激光晶体、闪烁晶体的生长。The pulling method is a method of growing crystals from melts. It has the advantages of fast growth rate, easy observation and high crystal quality. It is widely used in the growth of silicon, germanium, sapphire, laser crystals and scintillation crystals.
原料在坩埚内熔化后,原料和热场中的杂质会漂浮在坩埚表面,并聚集在熔体中间,影响引晶和晶体生长的进行,严重的会导致多晶和应力的出现,最终导致晶体开裂或利用率下降。此外,在传统的提拉装置及晶体生长方法中,随着晶体生长的进行,坩埚内熔体逐渐减少,坩埚的裸露面逐渐增加,坩埚对晶体的热辐射作用逐渐增强,造成晶体生长面附近温度梯度逐渐减小,容易造成组分过冷、界面反转、包裹、云层等缺陷。After the raw material is melted in the crucible, the impurities in the raw material and the thermal field will float on the surface of the crucible and gather in the middle of the melt, which will affect the seeding and crystal growth. Cracking or decreased utilization. In addition, in the traditional pulling device and crystal growth method, with the progress of crystal growth, the melt in the crucible gradually decreases, the exposed surface of the crucible gradually increases, and the thermal radiation effect of the crucible on the crystal gradually increases, resulting in a near-crystal growth surface. The temperature gradient decreases gradually, which is easy to cause defects such as supercooling of components, interface inversion, wrapping, and cloud formation.
所以,有必要设计一种新的晶体的生长装置及生长方法以解决上述技术问题。Therefore, it is necessary to design a new crystal growth device and growth method to solve the above-mentioned technical problems.
发明内容SUMMARY OF THE INVENTION
基于此,本发明的目的在于克服上述现有技术的不足之处而提供一种晶体的生长装置及生长方法。Based on this, the purpose of the present invention is to overcome the above-mentioned shortcomings of the prior art and provide a crystal growth device and growth method.
为实现上述目的,本发明所采取的技术方案为:一种晶体的生长装置,包括相互独立的外坩埚和内坩埚,所述内坩埚的直径小于所述外坩埚的直径;所述内坩埚底部设有使熔体流入或流出的小孔,所述内坩埚顶部设有坩埚盖,所述坩埚盖上设有内坩埚固定杆,所述内坩埚固定杆的底部固定在所述坩埚盖上,所述内坩埚固定杆的顶部与炉体相连接;所述外坩埚底部设有控制外坩埚升降的坩埚支撑杆。In order to achieve the above object, the technical scheme adopted in the present invention is: a crystal growth device, comprising an outer crucible and an inner crucible independent of each other, the diameter of the inner crucible is smaller than the diameter of the outer crucible; the bottom of the inner crucible is A small hole is provided for the melt to flow in or out, a crucible cover is provided on the top of the inner crucible, an inner crucible fixing rod is arranged on the crucible cover, and the bottom of the inner crucible fixing rod is fixed on the crucible cover, The top of the inner crucible fixing rod is connected with the furnace body; the bottom of the outer crucible is provided with a crucible support rod that controls the lifting and lowering of the outer crucible.
优选地,所述小孔的直径为2-5mm。直径为2-5mm的孔可以有效避免熔体中的杂质进入到内坩埚中,又能使熔体通过。Preferably, the diameter of the small hole is 2-5mm. The hole with a diameter of 2-5mm can effectively prevent impurities in the melt from entering the inner crucible, and also allow the melt to pass through.
优选地,所述外坩埚底部设有保温装置,所述保温装置的底部设有坩埚托,所述坩埚支撑杆设于所述坩埚托底部。Preferably, the bottom of the outer crucible is provided with a heat preservation device, the bottom of the heat preservation device is provided with a crucible holder, and the crucible support rod is provided at the bottom of the crucible holder.
同时,本发明还提供一种晶体的生长方法,采用上述生长装置进行生长晶体。At the same time, the present invention also provides a method for growing a crystal, using the above-mentioned growth device to grow a crystal.
优选地,所述的晶体的生长方法,包括如下步骤:Preferably, the crystal growth method includes the following steps:
S1、化料阶段:将外坩埚套于内坩埚外部;将外坩埚降低,使内坩埚的底部高于外坩埚的顶部;然后将原料置于外坩埚中,升温融化原料至熔体稳定;S1, material chemical stage: the outer crucible is placed outside the inner crucible; the outer crucible is lowered so that the bottom of the inner crucible is higher than the top of the outer crucible; then the raw materials are placed in the outer crucible, and the temperature rises to melt the raw materials until the melt is stable;
S2、长晶阶段:缓慢上升外坩埚,使外坩埚中的熔体通过内坩埚底部的小孔进入内坩埚;待熔体稳定后,在内坩埚中完成晶体生长。S2. Crystal growth stage: slowly raise the outer crucible so that the melt in the outer crucible enters the inner crucible through the small hole at the bottom of the inner crucible; after the melt is stabilized, crystal growth is completed in the inner crucible.
更优选地,步骤S2中,晶体生长结束后,缓慢下降外坩埚,使熔体通过内坩埚底部小孔流入外坩埚中,并使内坩埚的底部高于外坩埚的顶部,然后进行熔体冷却。More preferably, in step S2, after the crystal growth is completed, the outer crucible is slowly lowered, so that the melt flows into the outer crucible through the small hole at the bottom of the inner crucible, and the bottom of the inner crucible is higher than the top of the outer crucible, and then the melt is cooled. .
本申请内坩埚底部接触熔体时,外坩埚熔体中心的漂浮杂质会聚集在内外坩埚之间的熔体上,并最终粘附在内坩埚外壁上。熔体稳定后,在内坩埚中完成晶体生长,晶体生长结束后,缓慢下降外坩埚,使熔体通过内坩埚底部小孔流入外坩埚中,并使内坩埚的底部高于外坩埚的顶部。熔体冷却后,没有结晶的尾料均在外坩埚中,便于清理。When the bottom of the inner crucible of the present application contacts the melt, the floating impurities in the melt center of the outer crucible will gather on the melt between the inner and outer crucibles, and finally adhere to the outer wall of the inner crucible. After the melt is stable, the crystal growth is completed in the inner crucible. After the crystal growth is completed, the outer crucible is slowly lowered so that the melt flows into the outer crucible through the small hole at the bottom of the inner crucible, and the bottom of the inner crucible is higher than the top of the outer crucible. After the melt is cooled, the uncrystallized tailings are kept in the outer crucible for easy cleaning.
优选地,步骤S2中,晶体生长结束后,外坩埚的下降速率为0.5-2mm/h。在外坩埚下降过程中,晶体逐渐远离高温熔体和外坩埚,晶体所处的温场发生变化,晶体逐渐冷却。保持外坩埚下降速率为0.5-2mm/h,可以减弱晶体温场变化造成的热应力,避免晶体开裂。Preferably, in step S2, after the crystal growth is completed, the descending rate of the outer crucible is 0.5-2 mm/h. During the descending process of the outer crucible, the crystal gradually moves away from the high-temperature melt and the outer crucible, the temperature field where the crystal is located changes, and the crystal gradually cools. Keeping the falling rate of the outer crucible at 0.5-2mm/h can reduce the thermal stress caused by the change of the crystal temperature field and prevent the crystal from cracking.
优选地,步骤S2中,随着晶体生长的进行,外坩埚逐渐上升,使外坩埚中的熔体进入内坩埚中,并使内坩埚和外坩埚中的液面始终保持同一高度。液面高度保持不变,可以使晶体生长所处的温度梯度保持一致,减少由于温度梯度变化导致的晶体生长缺陷。Preferably, in step S2, as the crystal growth proceeds, the outer crucible gradually rises, so that the melt in the outer crucible enters the inner crucible, and the liquid level in the inner crucible and the outer crucible is always maintained at the same height. The height of the liquid level remains unchanged, which can keep the temperature gradient in which the crystal grows consistent, and reduce the crystal growth defects caused by the change of the temperature gradient.
此外,本发明还提供一种所述的晶体生长方法制备得到的晶体。采用本申请生长装置及生长方法所制备得到的晶体无开裂、气泡、夹杂、散射等缺陷。In addition, the present invention also provides a crystal prepared by the crystal growth method. The crystal prepared by the growth device and the growth method of the present application has no defects such as cracking, bubbles, inclusions, and scattering.
优选地,所述晶体为掺杂的石榴石晶体、掺杂的钒酸钇晶体、掺杂的硅酸钇镥晶体、掺杂的铌酸锂晶体、掺杂的钽酸锂晶体中的一种。Preferably, the crystal is one of doped garnet crystal, doped yttrium vanadate crystal, doped yttrium lutetium silicate crystal, doped lithium niobate crystal, doped lithium tantalate crystal .
相对于现有技术,本发明的有益效果为:Compared with the prior art, the beneficial effects of the present invention are:
本发明的生长装置及生长方法所制备得到的晶体无开裂、气泡、夹杂、散射等缺陷。The crystal prepared by the growth device and the growth method of the present invention has no defects such as cracking, bubbles, inclusions, and scattering.
附图说明Description of drawings
图1为本发明所述晶体的生长装置的一种结构示意图;1 is a schematic structural diagram of a crystal growth device according to the present invention;
图2为未采用本发明生长装置及生产方法的晶体散射情况(左)与采用本发明生长装置及生产方法生长的晶体的散射情况(右)的对比图;FIG. 2 is a comparison diagram of the crystal scattering situation (left) without using the growth device and production method of the present invention and the scattering situation (right) of the crystal grown by using the growth device and production method of the present invention;
图3为未采用本发明生长装置及生产方法的晶体位错情况(左)与采用本发明生长装置及生产方法生长的晶体位错情况(右)的对比图。3 is a comparison diagram of the crystal dislocation situation (left) without using the growth device and production method of the present invention and the crystal dislocation situation (right) grown by using the growth device and production method of the present invention.
其中,1、外坩埚;2、内坩埚;3、坩埚盖;4、内坩埚固定杆;5、坩埚底部保温;6、坩埚托;7、坩埚支撑杆;8、熔体;9、液面;10、籽晶杆;11、晶体。Among them, 1, outer crucible; 2, inner crucible; 3, crucible cover; 4, inner crucible fixing rod; 5, crucible bottom insulation; 6, crucible holder; 7, crucible support rod; 8, melt; 9, liquid level ; 10, seed rod; 11, crystal.
具体实施方式Detailed ways
为更好的说明本发明的目的、技术方案和优点,下面将结合附图和具体实施例对本发明作进一步说明。In order to better illustrate the purpose, technical solutions and advantages of the present invention, the present invention will be further described below with reference to the accompanying drawings and specific embodiments.
本发明所述晶体生长装置的结构示意图如附图1所示:包括相互独立的外坩埚1和内坩埚2,内坩埚2的直径小于外坩埚1的直径;内坩埚2底部设有使熔体流入或流出的小孔,小孔的直径为2-5mm;内坩埚2顶部设有坩埚盖3,坩埚盖3上设有内坩埚固定杆4,内坩埚固定杆4的底部固定在坩埚盖3上,内坩埚固定杆4的顶部与炉体相连接;外坩埚1底部设有控制外坩埚1升降的坩埚支撑杆7,外坩埚1底部设有保温装置5,保温装置5的底部设有坩埚托6,坩埚支撑杆7设于坩埚托6底部。The schematic structural diagram of the crystal growth device according to the present invention is shown in FIG. 1 : it includes an
本发明所述晶体生长方法,采用上述的晶体生长装置,具体步骤如下:The crystal growth method of the present invention adopts the above-mentioned crystal growth device, and the specific steps are as follows:
S1、化料阶段:将外坩埚1降低,使内坩埚2的底部高于外坩埚1的顶部,将原料置于外坩埚1中;升温融化原料,待熔体8稳定;S1, chemical material stage: lower the
S2、长晶阶段:缓慢上升外坩埚1,使外坩埚1中的熔体通过内坩埚2底部的小孔进入内坩埚2;熔体稳定后,保持液面9高度不变,下降籽晶杆10,在内坩埚2中完成晶体11生长;晶体11生长结束后,缓慢下降外坩埚1,外坩埚的下降速率为0.5-2mm/h,使熔体通过内坩埚2底部小孔流入外坩埚1中,并使内坩埚2的底部高于外坩埚1的顶部。S2. Crystal growth stage: slowly rise the
实施例1Example 1
本发明所述晶体生长方法的一种实施例,本实施例所述晶体生长方法采用上述晶体生长装置进行,具体步骤如下:An embodiment of the crystal growth method of the present invention, the crystal growth method described in this embodiment is carried out by using the above crystal growth device, and the specific steps are as follows:
将15kg铈掺杂硅酸钇镥多晶原料装入外坩埚中,将内坩埚固定在内坩埚固定杆上;调整内外坩埚的高度,使内坩埚的底部高于外坩埚的顶部。开启电源进入化料阶段,开始升温化料。化料结束后,观察原料完全熔化,并在外坩埚的中心出现不规则的颗粒杂质。通过坩埚支撑杆缓慢上升外坩埚,使内坩埚接触外坩埚中的熔体,并使熔体通过内坩埚底部的直径为2mm的孔进入内坩埚中。待熔体稳定后,下降籽晶杆开始晶体生长。晶体生长过程中,通过坩埚支撑杆缓慢上升外坩埚,并使熔体液面保持在同一高度上。晶体生长结束后,通过坩埚支撑杆缓慢下降外坩埚,外坩埚下降速率为0.5mm/h,使内坩埚中的熔体通过底部的孔进入外坩埚中,并使内坩埚的底部高于外坩埚的顶部低于内坩的底部。Put 15kg of cerium-doped yttrium lutetium silicate polycrystalline raw material into the outer crucible, fix the inner crucible on the inner crucible fixing rod; adjust the height of the inner and outer crucibles so that the bottom of the inner crucible is higher than the top of the outer crucible. Turn on the power to enter the chemical stage, and start to heat up the chemical. After the material is finished, observe that the raw material is completely melted, and irregular particle impurities appear in the center of the outer crucible. The outer crucible is slowly raised through the crucible support rod, so that the inner crucible contacts the melt in the outer crucible, and the melt enters the inner crucible through a hole with a diameter of 2 mm at the bottom of the inner crucible. After the melt is stabilized, the seed rod is lowered to start crystal growth. During the crystal growth process, the outer crucible is slowly raised through the crucible support rod, and the melt level is kept at the same height. After the crystal growth is completed, slowly lower the outer crucible through the crucible support rod, and the lowering rate of the outer crucible is 0.5mm/h, so that the melt in the inner crucible enters the outer crucible through the hole at the bottom, and the bottom of the inner crucible is higher than the outer crucible. The top is lower than the bottom of the inner crucible.
采用上述生长方法所制备得到的晶体为无色,晶体直径为80mm、长度为200mm,晶体无开裂、气泡、夹杂、散射等缺陷。The crystal prepared by the above-mentioned growth method is colorless, the crystal diameter is 80 mm, the length is 200 mm, and the crystal has no defects such as cracking, bubbles, inclusions, and scattering.
实施例2Example 2
本发明所述晶体生长方法的一种实施例,本实施例所述晶体生长方法采用上述晶体生长装置进行,具体步骤如下:An embodiment of the crystal growth method of the present invention, the crystal growth method described in this embodiment is carried out by using the above crystal growth device, and the specific steps are as follows:
将9kg铈掺杂钆镓铝石榴石原料装入外坩埚中,将内坩埚固定在内坩埚固定杆上。调整内外坩埚的高度,使内坩埚的底部高于外坩埚的顶部。开启电源进入化料阶段,开始升温化料。化料结束后,观察原料完全熔化,并在外坩埚的中心出现不规则的颗粒杂质。通过坩埚支撑杆缓慢上升外坩埚,使内坩埚接触外坩埚中的熔体,并使熔体通过内坩埚底部的直径为3mm的孔进入内坩埚中。待熔体稳定后,下降籽晶杆开始晶体生长。晶体生长过程中,通过坩埚支撑杆缓慢上升外坩埚,并使熔体液面保持在同一高度上。晶体生长结束后,通过坩埚支撑杆缓慢下降外坩埚,外坩埚下降速率为1mm/h,使内坩埚中的熔体通过底部的孔进入外坩埚中,并使内坩埚的底部高于外坩埚的顶部低于内坩的底部。9kg of cerium-doped gadolinium gallium aluminum garnet raw material was put into the outer crucible, and the inner crucible was fixed on the inner crucible fixing rod. Adjust the height of the inner and outer crucibles so that the bottom of the inner crucible is higher than the top of the outer crucible. Turn on the power to enter the chemical stage, and start to heat up the chemical. After the material is finished, observe that the raw material is completely melted, and irregular particle impurities appear in the center of the outer crucible. The outer crucible is slowly raised through the crucible support rod, so that the inner crucible contacts the melt in the outer crucible, and the melt enters the inner crucible through a hole with a diameter of 3 mm at the bottom of the inner crucible. After the melt is stabilized, the seed rod is lowered to start crystal growth. During the crystal growth process, the outer crucible is slowly raised through the crucible support rod, and the melt level is kept at the same height. After the crystal growth is over, slowly lower the outer crucible through the crucible support rod, and the lowering rate of the outer crucible is 1mm/h, so that the melt in the inner crucible enters the outer crucible through the bottom hole, and the bottom of the inner crucible is higher than the outer crucible. The top is lower than the bottom of the inner crucible.
采用上述生长方法所制备得到的晶体为黄色,晶体直径为60mm、长度为200mm,晶体无开裂、气泡、夹杂、散射等缺陷。The crystal prepared by the above-mentioned growth method is yellow, the crystal diameter is 60 mm, the length is 200 mm, and the crystal has no defects such as cracking, bubbles, inclusions, and scattering.
实施例3Example 3
本发明所述晶体生长方法的一种实施例,本实施例所述晶体生长方法采用上述晶体生长装置进行,具体步骤如下:An embodiment of the crystal growth method of the present invention, the crystal growth method described in this embodiment is carried out by using the above crystal growth device, and the specific steps are as follows:
将27kg钕掺杂钇铝石榴石原料装入感应坩埚中,将内坩埚固定在内坩埚固定杆上。调整内外坩埚的高度,使内坩埚的底部高于外坩埚的顶部。开启电源进入化料阶段,开始升温化料。化料结束后,观察原料完全熔化,并在外坩埚的中心出现不规则的颗粒杂质。通过坩埚支撑杆缓慢上升外坩埚,使内坩埚接触外坩埚中的熔体,并使熔体通过内坩埚底部的直径为5mm的孔进入内坩埚中。待熔体稳定后,下降籽晶杆开始晶体生长。晶体生长过程中,通过坩埚支撑杆缓慢上升外坩埚,并使熔体液面保持在同一高度上。晶体生长结束后,通过坩埚支撑杆缓慢下降外坩埚,外坩埚下降速率为2mm/h,使内坩埚中的熔体通过底部的孔进入外坩埚中,并使内坩埚的底部高于外坩埚的顶部低于内坩的底部。27kg of neodymium-doped yttrium aluminum garnet raw material was put into the induction crucible, and the inner crucible was fixed on the inner crucible fixing rod. Adjust the height of the inner and outer crucibles so that the bottom of the inner crucible is higher than the top of the outer crucible. Turn on the power to enter the chemical stage, and start to heat up the chemical. After the material is finished, observe that the raw material is completely melted, and irregular particle impurities appear in the center of the outer crucible. The outer crucible is slowly raised through the crucible support rod, so that the inner crucible contacts the melt in the outer crucible, and the melt enters the inner crucible through a hole with a diameter of 5 mm at the bottom of the inner crucible. After the melt is stabilized, the seed rod is lowered to start crystal growth. During the crystal growth process, the outer crucible is slowly raised through the crucible support rod, and the melt level is kept at the same height. After the crystal growth is completed, the outer crucible is slowly lowered through the crucible support rod, and the lowering rate of the outer crucible is 2 mm/h, so that the melt in the inner crucible enters the outer crucible through the bottom hole, and the bottom of the inner crucible is higher than the outer crucible. The top is lower than the bottom of the inner crucible.
采用上述生长方法所制备得到的晶体为紫色,晶体直径为100mm、长度为200mm,晶体无开裂、气泡、夹杂、散射等缺陷。The crystal prepared by the above growth method is purple, the crystal diameter is 100 mm, the length is 200 mm, and the crystal has no defects such as cracking, bubbles, inclusions, and scattering.
图2为未采用本发明生长装置及生产方法的晶体散射情况(左)与采用本发明生长装置及生产方法生长的晶体的散射情况(右)的对比图;图3为未采用本发明生长装置及生产方法的晶体位错情况(左)与采用本生长装置及生产方法生长的晶体位错情况(右)的对比图;可以看出,本晶体的生长装置及生长方法所制备得到的晶体无开裂、气泡、夹杂、散射等缺陷,位错密度显著降低。Fig. 2 is a comparison diagram of the scattering situation of the crystal without using the growth device and production method of the present invention (left) and the scattering situation of the crystal grown by the growth device and production method of the present invention (right); Fig. 3 is the crystal without the growth device of the present invention. The comparison diagram of the crystal dislocation situation (left) of the production method and the crystal dislocation situation (right) grown by the growth device and the production method; it can be seen that the crystal prepared by the crystal growth device and the growth method has no Defects such as cracking, bubbles, inclusions, scattering, etc., the dislocation density is significantly reduced.
最后所应当说明的是,以上实施例仅用以说明本发明的技术方案而非对本发明保护范围的限制,尽管参照较佳实施例对本发明作了详细说明,本领域的普通技术人员应当理解,可以对本发明的技术方案进行修改或者等同替换,而不脱离本发明技术方案的实质和范围。Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and not to limit the protection scope of the present invention. Although the present invention is described in detail with reference to the preferred embodiments, those of ordinary skill in the art should understand that, The technical solutions of the present invention may be modified or equivalently replaced without departing from the spirit and scope of the technical solutions of the present invention.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113061980A (en) * | 2021-04-13 | 2021-07-02 | 秦皇岛本征晶体科技有限公司 | Device and method for growing lithium fluoride single crystal |
| CN119265710A (en) * | 2023-07-07 | 2025-01-07 | 中国科学院上海硅酸盐研究所 | Annealing crucible and annealing method for fluoride crystal |
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