CN111291105B - PCB board inspection data processing method, device and storage medium - Google Patents

PCB board inspection data processing method, device and storage medium Download PDF

Info

Publication number
CN111291105B
CN111291105B CN202010068890.5A CN202010068890A CN111291105B CN 111291105 B CN111291105 B CN 111291105B CN 202010068890 A CN202010068890 A CN 202010068890A CN 111291105 B CN111291105 B CN 111291105B
Authority
CN
China
Prior art keywords
information
inspection
defect
lot card
database
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202010068890.5A
Other languages
Chinese (zh)
Other versions
CN111291105A (en
Inventor
曾建华
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jiangmen Glory Faith Pcb Co ltd
Original Assignee
Jiangmen Glory Faith Pcb Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jiangmen Glory Faith Pcb Co ltd filed Critical Jiangmen Glory Faith Pcb Co ltd
Priority to CN202010068890.5A priority Critical patent/CN111291105B/en
Publication of CN111291105A publication Critical patent/CN111291105A/en
Application granted granted Critical
Publication of CN111291105B publication Critical patent/CN111291105B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F16/00Information retrieval; Database structures therefor; File system structures therefor
    • G06F16/20Information retrieval; Database structures therefor; File system structures therefor of structured data, e.g. relational data
    • G06F16/25Integrating or interfacing systems involving database management systems
    • G06F16/252Integrating or interfacing systems involving database management systems between a Database Management System and a front-end application
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F16/00Information retrieval; Database structures therefor; File system structures therefor
    • G06F16/20Information retrieval; Database structures therefor; File system structures therefor of structured data, e.g. relational data
    • G06F16/24Querying
    • G06F16/248Presentation of query results
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06KGRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K17/00Methods or arrangements for effecting co-operative working between equipments covered by two or more of main groups G06K1/00 - G06K15/00, e.g. automatic card files incorporating conveying and reading operations
    • G06K17/0022Methods or arrangements for effecting co-operative working between equipments covered by two or more of main groups G06K1/00 - G06K15/00, e.g. automatic card files incorporating conveying and reading operations arrangements or provisions for transferring data to distant stations, e.g. from a sensing device
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/30Computing systems specially adapted for manufacturing

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Databases & Information Systems (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Data Mining & Analysis (AREA)
  • Computational Linguistics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Factory Administration (AREA)

Abstract

The application discloses a PCB inspection data processing method, a device and a storage medium. The client acquires LOT card information acquired through two-dimensional code identification, reads out a plurality of preset inspection item information according to the LOT card information, acquires a defect information list corresponding to the selected inspection item information, and displays different types of defects through defect numbers and defect names, so that workers can find out corresponding defects during inspection; meanwhile, when the defect information is detected to be clicked, the state of the defect information is set to be the state that the inspection is not passed and is stored, and LOT card inspection information is generated after all inspection project information is finished.

Description

PCB board inspection data processing method, device and storage medium
Technical Field
The application relates to the field of data processing, in particular to a PCB inspection data processing method, a device and a storage medium.
Background
In the quality inspection process of the double-sided multi-layer PCB, a worker is required to inspect the product by observing and record the existing defects. However, the inspection items involved in each product are not the same, and the requirements of different customers on the process are different, so that the types of defects which may exist in different products are different. The existing method requires workers to inquire out test items and possible defects before testing, records the test items by manual recording, then records corresponding test results manually in the testing process, and performs statistics reporting afterwards, so that more time is consumed on a single LOT card, and the production efficiency is not improved.
Disclosure of Invention
In order to overcome the defects of the prior art, the application aims to provide a PCB inspection data processing method, a device and a storage medium, which can automatically record and process inspection data in practical application and improve production efficiency.
The application solves the problems by adopting the following technical scheme: in a first aspect, the present application provides a method for processing inspection data of a PCB board, including the steps of:
the client acquires LOT card information acquired through two-dimensional code identification, and reads a plurality of preset inspection item information from a database according to the LOT card information and displays the information;
the client acquires the selected inspection item information, and reads a defect information list corresponding to the inspection item information from a database, wherein the defect information list comprises a plurality of defect information with initial states set to pass inspection, and the defect information comprises a defect number and a defect name;
if the client detects that the defect information is clicked, setting the state of the clicked defect information to be failed in detection, marking the defect number and sending the defect number to a database;
and if the client detects the checking completion signal, reading the marked defect number from a database and generating LOT card checking information.
Further, the LOT card information includes process information, LOT information, sample number information, and previous production information.
Further, the defect information is preset in a database, and the defect information list is generated according to the selected defect information.
Further, the verification completion signal is generated by:
if the client detects that a checking completion button in the checking item information is clicked, setting the checking item information to a completion state;
and if the client detects that the states of all the inspection item information corresponding to the LOT card information are the completion states, generating an inspection completion signal.
Further, the LOT card verification information includes time information at the time of completion of verification.
Further, if the number of the LOT card inspection information in the database is greater than 1, generating a summary graph according to the time information and the LOT card inspection information.
In a second aspect, the present application provides a PCB board inspection data processing apparatus, comprising:
the LOT card information acquisition device is used for acquiring LOT card information acquired through two-dimensional code identification by the client, and reading and displaying a plurality of preset inspection item information from the database according to the LOT card information;
a defect information list obtaining device, configured to obtain selected inspection item information from the client, and read a defect information list corresponding to the inspection item information from a database, where the defect information list includes a plurality of defect information whose initial states are set to pass inspection, and the defect information includes a defect number and a defect name;
a defect information state setting device, configured to set, if the client detects that the defect information is clicked, a state of the clicked defect information to be failed in verification, mark the defect number, and send the marked defect number to a database;
and the LOT card inspection information generating device is used for reading the marked defect number from the database and generating LOT card inspection information if the client detects the inspection completion signal.
Further, the LOT card verification information generating apparatus further includes:
the device is used for setting the inspection item information to be in a finished state if the client detects that an inspection finishing button in the inspection item information is clicked;
if the client detects that all the states of the inspection item information corresponding to the LOT card information are finished states, generating an inspection completion signal;
and the summary graph generating device is used for generating a summary graph according to the time information and the LOT card inspection information if the number of the LOT card inspection information in the database is more than 1.
In a third aspect, the present application provides a PCB board inspection data processing apparatus comprising at least one control processor and a memory for communication connection with the at least one control processor; the memory stores instructions executable by the at least one control processor to enable the at least one control processor to perform the PCB board inspection data processing method as described above.
In a fourth aspect, the present application provides a computer-readable storage medium storing computer-executable instructions for causing a computer to perform the PCB board inspection data processing method as described above.
In a fifth aspect, the present application also provides a computer program product comprising a computer program stored on a computer readable storage medium, the computer program comprising program instructions which, when executed by a computer, cause the computer to perform a PCB board inspection data processing method as described above.
One or more technical solutions provided in the embodiments of the present application have at least the following beneficial effects: the client acquires LOT card information acquired through two-dimensional code identification, reads out a plurality of preset inspection item information according to the LOT card information, acquires a defect information list corresponding to the selected inspection item information, and displays different types of defects through defect numbers and defect names, so that workers can find out corresponding defects during inspection; meanwhile, when the defect information is detected to be clicked, the state of the defect information is set to be the state that the inspection is not passed and is stored, and LOT card inspection information is generated after all inspection project information is finished.
Drawings
The application is further described below with reference to the drawings and examples.
Fig. 1 is a flowchart of a PCB board inspection data processing method according to an embodiment of the present application;
fig. 2 is a flowchart of generating a test completion signal in a PCB board test data processing method according to a first embodiment of the present application;
fig. 3 is a schematic diagram of a PCB board inspection data processing apparatus according to a second embodiment of the present application;
fig. 4 is a schematic structural diagram of a PCB board inspection data processing apparatus according to a third embodiment of the present application.
Detailed Description
The present application will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present application more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the application.
It should be noted that, if not in conflict, the features of the embodiments of the present application may be combined with each other, which is within the protection scope of the present application. In addition, while functional block division is performed in a device diagram and logical order is shown in a flowchart, in some cases, the steps shown or described may be performed in a different order than the block division in the device, or in the flowchart.
Referring to fig. 1, a first embodiment of the present application provides a PCB board inspection data processing method, including the steps of:
step S100, a client acquires LOT card information acquired through two-dimensional code identification, and reads a plurality of preset inspection item information from a database according to the LOT card information and displays the inspection item information;
step S200, the client acquires the selected inspection item information, reads a defect information list corresponding to the inspection item information from a database, wherein the defect information list comprises a plurality of defect information with initial states set to pass inspection, and the defect information comprises a defect number and a defect name;
step S300, if the client detects that the defect information is clicked, setting the state of the clicked defect information to be failed in inspection, marking the defect number and sending the defect number to a database;
step S400, if the client detects the checking completion signal, the marked defect number is read from the database, and LOT card checking information is generated.
It should be noted that, the two-dimensional code in step S100 may be obtained by any mode in the prior art, for example, mobile phone scanning, etc., and the specific obtaining method is not an improvement of the present application, and will not be described herein. It should be noted that, because the number of LOT cards in actual production is large, in order to distinguish different batches, in this embodiment, it is preferable that the LOT card information corresponding to the two-dimensional codes on different LOT cards is different. It can be understood that the LOT information is different from each other for the purpose of distinguishing products of different batches, if the products in the LOT cards belong to the same batch, i.e. the inspection standards are the same, those skilled in the art have an incentive to set a plurality of inspection item information corresponding to the LOT card information to be the same. It should be noted that, because there are many items to be inspected in the PCB board manufacturing, the number of inspection item information corresponding to each LOT card information is adjusted according to the actual requirement, which is not limited in this embodiment.
In order to save the steps of the operation, in this embodiment, the initial state of the defect information is preferably a verification passing state, and in actual use, if a worker verifies that the product is qualified, the worker does not need to operate the product and directly enters the next step, and only the client is operated when the product is found to be unqualified, so that the operation steps can be greatly reduced. It is understood that the defect name may be any defect in the PCB production process, such as poor exposure, film misalignment, etc. It will be appreciated that, in order to distinguish defects, the defect number and defect name uniquely correspond. It can be understood that the defect number and the defect name are unique in the same defect information list, so that the defect that the repeated identical settings are avoided, and the operation error is caused.
It should be noted that, in this embodiment, it is preferable that the defect information is set to be sent to the database after the defect information is clicked and the defect information is not checked, so that repeated work caused by forgetting to save the defect information in the operation process of a worker can be omitted. It should be noted that, since the initial state of the defect information is that the defect information passes the inspection, those skilled in the art have an incentive to send the inspected state to the database for storage after the inspection is completed, so as to facilitate the subsequent data statistics.
Further, the LOT card information includes process information, LOT information, sample number information, and previous production information.
It should be noted that the process information may be any content related to the production process, which is not described herein. It will be appreciated that the LOT information is information for a plurality of LOT cards in the same LOT, for example, different LOTs may be distinguished by a combination of words and numbers, which is not described herein. It should be noted that, it is not practical to perform a full inspection on all products, so in this embodiment, the sample number information is preferably used to guide the worker to perform the inspection, for example, the number of the inspection extracted from one LOT of LOT cards is preset according to the requirement, or the number of the LOT cards extracted from the same LOT is adjusted according to the actual requirement. It will be appreciated that, because the PCB production process is long, each stage may have certain defects, and thus the embodiment preferably records the inspection condition of each step through the previous production information, so that the inspection condition is convenient to be used as the data base for analysis when a problem occurs.
Further, defect information is preset in a database, and a defect information list is generated based on the selected defect information.
It should be noted that, since the process of PCB production is known in advance, the defect numbers corresponding to the defect names are preferably preset in the database in this embodiment, which is beneficial to unified management. It can be understood that the defect information list may be used to select defect information through a background system and other ways, so as to collect test item information, and the specific preset manner is not an improvement related to the embodiment and will not be described herein.
Referring to fig. 2, further, a verification completion signal is generated by:
step S410, if the client detects that a checking completion button in the checking item information is clicked, setting the checking item information to a completion state;
in step S420, if the client detects that all the states of the inspection item information corresponding to the LOT card information are complete states, an inspection completion signal is generated.
It should be noted that, in this embodiment, the inspection completion button is preferably set in the list interface of each inspection item information, and since the initial state of the defect information is the inspection passing state, in the actual operation process, all inspection items will not be clicked, so that the operation process can be more concise by preferably setting the inspection completion button. It should be noted that, because the PCB inspection process needs to ensure that both the left and right items are inspected, in this embodiment, it is preferable that the inspection completion signal is automatically generated after all the inspection item information is in the completed state, so as to avoid the workers missing the inspection items.
Further, the LOT card verification information includes time information at the time of completion of verification.
In the actual production process, if the number of products is large, it is necessary to take a plurality of days to produce, so that the LOT card inspection information in this embodiment preferably includes time information, so that the generation of the summary graph is performed in time units during the later statistics. It is understood that the time information may include year, month, day, specific time, etc., and those skilled in the art are motivated to adjust according to actual needs, and will not be described herein.
Further, if the number of the LOT card inspection information in the database is greater than 1, generating a summary graph according to the time information and the LOT card inspection information.
It should be noted that, if the number of the LOT card inspection information is only 1, the defect information may be displayed directly, and if the number of the LOT card inspection information is greater than 1, in order to facilitate data analysis, the embodiment preferably generates a summary chart according to time information, for example, the defect information of each LOT card is displayed in a daily unit, and the like, and the summary chart is selected according to actual requirements.
Referring to fig. 3, a second embodiment of the present application also provides a PCB board inspection data processing apparatus, in which the PCB board inspection data processing apparatus 3000 includes, but is not limited to: the LOT card information acquiring means 3100, the defect information list acquiring means 3200, the defect information status setting means 3300, and the LOT card verification information generating means 3400.
The LOT card information acquisition device 3100 is used for acquiring LOT card information acquired through two-dimensional code identification by a client, and reading and displaying a plurality of preset inspection item information from a database according to the LOT card information;
a defect information list obtaining device 3200, configured to obtain, by a client, selected inspection item information, read a defect information list corresponding to the inspection item information from a database, where the defect information list includes a plurality of defect information whose initial states are set to pass inspection, and the defect information includes a defect number and a defect name;
a defect information state setting device 3300, configured to set the state of the clicked defect information to be failed in inspection if the client detects that the defect information is clicked, mark the defect number, and send the mark to the database;
and LOT card inspection information generating means 3400 for reading the marked defect number from the database and generating LOT card inspection information if the client detects the inspection completion signal.
Further, in another embodiment of the present application, the LOT card verification information generating apparatus 3400 further includes:
the test item information state setting means 3410 is configured to set the test item information to a completed state if the client detects that a test completion key in the test item information is clicked;
if the checking completion signal generating device 3420 is configured to generate a checking completion signal when the client detects that all the states of the checking item information corresponding to the LOT card information are complete states;
the summary map generating device 3430 is configured to generate a summary map according to the time information and the LOT card verification information if the number of LOT card verification information in the database is greater than 1.
It should be noted that, since the PCB board inspection data processing apparatus in the present embodiment and the PCB board inspection data processing method described above are based on the same inventive concept, the corresponding content in the method embodiment is also applicable to the apparatus embodiment, and will not be described in detail herein.
Referring to fig. 4, a third embodiment of the present application also provides a PCB board inspection data processing apparatus 4000, which may be any type of smart terminal, such as a mobile phone, a tablet computer, a personal computer, etc.
Specifically, the PCB board inspection data processing apparatus 4000 includes: one or more control processors 4100 and memory 4200, one control processor 4100 being illustrated in fig. 4.
The control processor 4100 and memory 4200 may be connected by a bus or otherwise, for example in fig. 4.
The memory 4200 is used as a non-transitory computer readable storage medium for storing non-transitory software programs, non-transitory computer executable programs, and modules, such as program instructions/modules corresponding to the PCB board inspection data processing apparatus in the embodiment of the present application, for example, the LOT card information acquiring device 3100 and the defect information list acquiring device 3200 shown in fig. 3. The control processor 4100 executes various functional applications and data processing of the PCB inspection data processing apparatus 3000 by executing non-transitory software programs, instructions, and modules stored in the memory 4200, that is, implements the PCB inspection data processing method of the above-described method embodiment.
Memory 4200 may include a storage program area and a storage data area, wherein the storage program area may store an operating system, at least one application program required for functionality; the storage data area may store data created according to the use of the PCB board inspection data processing apparatus 3000, and the like. In addition, memory 4200 may include high-speed random access memory, and may also include non-transitory memory, such as at least one magnetic disk storage device, flash memory device, or other non-transitory solid state storage device. In some embodiments, memory 4200 optionally includes memory remotely located with respect to control processor 4100, which may be connected to the PCB board inspection data processing apparatus 4000 through a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof.
The one or more modules are stored in the memory 4200, which when executed by the one or more control processors 4100, perform the PCB inspection data processing method in the method embodiment described above, e.g., perform the method steps S100 through S400 in fig. 1, the method steps S410 through S420 in fig. 2, and the method steps S31-S32 in fig. 3 described above, to implement the functions of the apparatuses 3100-3400 in fig. 3.
Embodiments of the present application also provide a computer-readable storage medium storing computer-executable instructions that are executed by one or more control processors, for example, by one of the control processors 4100 in fig. 4, which may cause the one or more control processors 4100 to perform the PCB inspection data processing method in the method embodiment described above, for example, to perform the method steps S100 to S400 in fig. 1, and the method steps S410 to S420 in fig. 2 described above, to implement the functions of the apparatuses 3100 to 3400 in fig. 3.
The device embodiments described above are merely illustrative, in that the devices illustrated as separate components may or may not be physically separate, i.e., may be located in one place, or may be distributed over multiple network devices. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
From the above description of embodiments, it will be apparent to those skilled in the art that the embodiments may be implemented in software plus a general purpose hardware platform. Those skilled in the art will appreciate that all or part of the processes implementing the methods of the above embodiments may be implemented by a computer program for instructing relevant hardware, where the program may be stored in a computer readable storage medium, and where the program, when executed, may include the processes of the embodiments of the methods described above. The storage medium may be a magnetic disk, an optical disk, a Read Only Memory (ROM), a random access Memory (Random Access Memory, RAM), or the like.
While the preferred embodiment of the present application has been described in detail, the present application is not limited to the above embodiment, and various equivalent modifications and substitutions can be made by those skilled in the art without departing from the spirit of the present application, and these equivalent modifications and substitutions are intended to be included in the scope of the present application as defined in the appended claims.

Claims (9)

1. The PCB board inspection data processing method is characterized by comprising the following steps:
the client acquires LOT card information acquired through two-dimensional code identification, and reads a plurality of preset inspection item information from a database according to the LOT card information and displays the information;
the client acquires the selected inspection item information, reads a defect information list corresponding to the inspection item information from a database, wherein the defect information list comprises a plurality of defect information with initial states set to pass inspection, the defect information comprises a defect number and a defect name, the defect information is preset in the database, and the defect information list is generated according to the selected defect information;
if the client detects that the defect information is clicked, setting the state of the clicked defect information to be failed in detection, marking the defect number and sending the defect number to a database;
and if the client detects the checking completion signal, reading the marked defect number from a database and generating LOT card checking information.
2. The method for processing the test data of the PCB according to claim 1, wherein: the LOT card information includes process information, LOT information, sample number information, and previous production information.
3. The method of claim 1, wherein the test completion signal is generated by:
if the client detects that a checking completion button in the checking item information is clicked, setting the checking item information to a completion state;
and if the client detects that the states of all the inspection item information corresponding to the LOT card information are the completion states, generating an inspection completion signal.
4. The method for processing the test data of the PCB according to claim 1, wherein: the LOT card inspection information includes time information at the time of completion of inspection.
5. The method for processing the test data of the PCB according to claim 4, wherein: if the number of the LOT card inspection information in the database is more than 1, generating a summary graph according to the time information and the LOT card inspection information.
6. A PCB board inspection data processing apparatus, comprising:
the LOT card information acquisition device is used for acquiring LOT card information acquired through two-dimensional code identification by the client, and reading and displaying a plurality of preset inspection item information from the database according to the LOT card information;
a defect information list obtaining device, configured to obtain selected inspection item information from the client, and read a defect information list corresponding to the inspection item information from a database, where the defect information list includes a plurality of defect information whose initial states are set to pass inspection, the defect information includes a defect number and a defect name, the defect information is preset in the database, and the defect information list is generated according to the selected defect information;
a defect information state setting device, configured to set, if the client detects that the defect information is clicked, a state of the clicked defect information to be failed in verification, mark the defect number, and send the marked defect number to a database;
and the LOT card inspection information generating device is used for reading the marked defect number from the database and generating LOT card inspection information if the client detects the inspection completion signal.
7. The PCB board inspection data processing apparatus of claim 6, wherein the LOT card inspection information generating apparatus further comprises:
the device is used for setting the inspection item information to be in a finished state if the client detects that an inspection finishing button in the inspection item information is clicked;
if the client detects that all the states of the inspection item information corresponding to the LOT card information are finished states, generating an inspection completion signal;
and the summary graph generating device is used for generating a summary graph according to the time information and the LOT card inspection information if the number of the LOT card inspection information in the database is more than 1.
8. A PCB board inspection data processing device is characterized in that: comprising at least one control processor and a memory for communication connection with the at least one control processor; the memory stores instructions executable by the at least one control processor to enable the at least one control processor to perform a PCB board inspection data processing method according to any one of claims 1-5.
9. A computer-readable storage medium, characterized by: the computer-readable storage medium stores computer-executable instructions for causing a computer to perform a PCB inspection data processing method according to any one of claims 1-5.
CN202010068890.5A 2020-01-21 2020-01-21 PCB board inspection data processing method, device and storage medium Active CN111291105B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202010068890.5A CN111291105B (en) 2020-01-21 2020-01-21 PCB board inspection data processing method, device and storage medium

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202010068890.5A CN111291105B (en) 2020-01-21 2020-01-21 PCB board inspection data processing method, device and storage medium

Publications (2)

Publication Number Publication Date
CN111291105A CN111291105A (en) 2020-06-16
CN111291105B true CN111291105B (en) 2023-12-15

Family

ID=71021305

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202010068890.5A Active CN111291105B (en) 2020-01-21 2020-01-21 PCB board inspection data processing method, device and storage medium

Country Status (1)

Country Link
CN (1) CN111291105B (en)

Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002175668A (en) * 2000-12-06 2002-06-21 Sony Corp Defect information management method and recording medium processing device
JP2006277475A (en) * 2005-03-30 2006-10-12 Toppan Printing Co Ltd Method for providing inspection result information and its providing system
WO2014131262A1 (en) * 2013-02-28 2014-09-04 华为技术有限公司 Defect prediction method and device
CN104299106A (en) * 2014-11-03 2015-01-21 叶校然 Product tracing inquiry system of PCB enterprise
CN104573137A (en) * 2015-01-04 2015-04-29 东莞市威力固电路板设备有限公司 PCB process monitoring method
CN104820849A (en) * 2015-04-22 2015-08-05 上海凯思尔电子有限公司 Traceability system suitable for PCB manufacturing
CN107832454A (en) * 2017-11-24 2018-03-23 武汉精测电子集团股份有限公司 A kind of centralized management of AOI detection devices and valid data display systems
CN108037739A (en) * 2017-11-09 2018-05-15 广州兴森快捷电路科技有限公司 The process management and control method and system of PCB product
CN108304991A (en) * 2017-12-28 2018-07-20 研祥智能科技股份有限公司 Product defects management method, device, computer equipment and storage medium
CN109508341A (en) * 2019-01-08 2019-03-22 广东电网有限责任公司 Defect management method and system
CN109583526A (en) * 2018-10-26 2019-04-05 南通深南电路有限公司 Two dimensional code application method, device and the storage medium of pcb board
CN109815220A (en) * 2018-12-14 2019-05-28 深圳壹账通智能科技有限公司 A kind of defective data treating method and apparatus
US10360238B1 (en) * 2016-12-22 2019-07-23 Palantir Technologies Inc. Database systems and user interfaces for interactive data association, analysis, and presentation

Patent Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002175668A (en) * 2000-12-06 2002-06-21 Sony Corp Defect information management method and recording medium processing device
JP2006277475A (en) * 2005-03-30 2006-10-12 Toppan Printing Co Ltd Method for providing inspection result information and its providing system
WO2014131262A1 (en) * 2013-02-28 2014-09-04 华为技术有限公司 Defect prediction method and device
CN104299106A (en) * 2014-11-03 2015-01-21 叶校然 Product tracing inquiry system of PCB enterprise
CN104573137A (en) * 2015-01-04 2015-04-29 东莞市威力固电路板设备有限公司 PCB process monitoring method
CN104820849A (en) * 2015-04-22 2015-08-05 上海凯思尔电子有限公司 Traceability system suitable for PCB manufacturing
US10360238B1 (en) * 2016-12-22 2019-07-23 Palantir Technologies Inc. Database systems and user interfaces for interactive data association, analysis, and presentation
CN108037739A (en) * 2017-11-09 2018-05-15 广州兴森快捷电路科技有限公司 The process management and control method and system of PCB product
CN107832454A (en) * 2017-11-24 2018-03-23 武汉精测电子集团股份有限公司 A kind of centralized management of AOI detection devices and valid data display systems
CN108304991A (en) * 2017-12-28 2018-07-20 研祥智能科技股份有限公司 Product defects management method, device, computer equipment and storage medium
CN109583526A (en) * 2018-10-26 2019-04-05 南通深南电路有限公司 Two dimensional code application method, device and the storage medium of pcb board
CN109815220A (en) * 2018-12-14 2019-05-28 深圳壹账通智能科技有限公司 A kind of defective data treating method and apparatus
CN109508341A (en) * 2019-01-08 2019-03-22 广东电网有限责任公司 Defect management method and system

Also Published As

Publication number Publication date
CN111291105A (en) 2020-06-16

Similar Documents

Publication Publication Date Title
CN105404243B (en) Flow control and manufacturing execution system in industrial production line
CN108170447A (en) The on-line automatic method for burn-recording of chip and system
CN111523805A (en) Method and device for inspecting incoming goods
CN112348530A (en) Automatic server production inspection and repair method
CN112069073A (en) Test case management method, terminal and storage medium
CN115619091A (en) Medicine industry material inspection release control method and device and storage medium
CN113052457A (en) Manufacturing management method and system of intelligent product and readable storage medium
CN111291105B (en) PCB board inspection data processing method, device and storage medium
CN117608903A (en) Method, device, equipment and storage medium for automatically generating test report
CN115829191B (en) Method, apparatus and storage medium for generating inspection plan
JP5824550B1 (en) Data management apparatus and data management program
CN111897737A (en) Omission detection method and device for program test of micro-service system
JP2018077147A (en) Inspection system, method for controlling inspection device, and program
CN115470953A (en) Exhibition hall management method, electronic device and computer-readable storage medium
CN115963379A (en) Automatic test method, device, equipment and storage medium for circuit board
CN111401578B (en) Equipment spot inspection management method and device and computer readable storage medium
CN113793120A (en) Material management system and method
CN115879665B (en) Method and equipment for determining inspection requirements of product configuration and identifying product configuration
CN111882220B (en) Data detection method and device
TWI723861B (en) Externally-connected shop floor control system
KR102236911B1 (en) System and method for vision inspection automation and smart operation management of harness manufacturing process
CN112783708B (en) DTU hardware testing method, terminal and computer readable storage medium
CN114860599A (en) Data processing method and device, electronic equipment and storage medium
CN112783708A (en) DTU hardware testing method, terminal and computer readable storage medium
CN117271320A (en) Code change examination method based on function granularity

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant