CN111239444A - Positioning detection device based on leaf spring fine adjustment - Google Patents
Positioning detection device based on leaf spring fine adjustment Download PDFInfo
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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- G01R1/02—General constructional details
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- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- G—PHYSICS
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
本发明为一种基于板簧微调的定位检测装置,包括底座,底座上设有安装架,安装架上连接有能够左右移动的Y轴滑动台,Y轴滑动台上连接有能够上下移动的Z轴滑动台,Z轴滑动台通过Z轴连接块连接有组合探针调整机构,组合探针调整机构中通过微分头调节板簧弯曲状态从而带动滑动轴左右细微的滑动;滑动轴上通过滑动轴连接块上连接有探针间距调整机构,探针间距调整机构中通过旋转连接杆带动旋向相反的螺纹套一和螺纹套二相向或相背运动,进而带动探针进行间距调整,通过位置与连接杆同轴设置的位置指示器精确显示探针间距。本装置能够通过快速高精度的调整组合探针位置及探针间距来适应不同型号的芯片或PCB板的测试,使用方便,适宜推广。
The invention is a positioning detection device based on the fine adjustment of the leaf spring, which comprises a base, a mounting frame is arranged on the base, a Y-axis sliding table that can move left and right is connected to the mounting frame, and a Z-axis sliding table that can move up and down is connected to the Y-axis sliding table. Axis sliding table, Z-axis sliding table is connected with a combined probe adjustment mechanism through the Z-axis connection block. In the combined probe adjustment mechanism, the bending state of the leaf spring is adjusted by the differential head to drive the sliding axis to slide slightly left and right; the sliding axis passes through the sliding axis. The connecting block is connected with a probe spacing adjustment mechanism. In the probe spacing adjustment mechanism, the threaded sleeve 1 and the threaded sleeve 2 in opposite directions are driven to move toward or away from each other by rotating the connecting rod, thereby driving the probe to adjust the spacing. Position indicators positioned coaxially on the connecting rods accurately display the probe spacing. The device can adapt to the testing of different types of chips or PCB boards by adjusting the position of the combined probes and the spacing of the probes quickly and accurately, and is convenient to use and suitable for promotion.
Description
(一)技术领域(1) Technical field
本发明涉及半导体检测设备技术领域,具体为一种基于板簧微调的定位检测装置。The invention relates to the technical field of semiconductor detection equipment, in particular to a positioning detection device based on fine adjustment of a leaf spring.
(二)背景技术(2) Background technology
半导体行业、光电行业、集成电路以及封装的测试中,为确保质量及可靠性,并缩减研发时间和器件制造工艺的成本,需要高精度的定位检测装置的参与。现有技术中的定位检测装置大多组合探针和探针之间的位置相对固定的,只能实现某种特定尺寸或类型的芯片或PCB板导通的测试,对于不同型号的芯片需要准备相应专门的定位检测装置,使用局限性较大,测试成本高,给检测带来不便;目前也有些检测装置的探针之间能够实现一定的位置调整,但是调整精度低,调整操作过程麻烦,效率较低。In the testing of semiconductor industry, optoelectronic industry, integrated circuit and packaging, in order to ensure the quality and reliability, and reduce the research and development time and the cost of the device manufacturing process, the participation of high-precision positioning detection equipment is required. Most of the positioning detection devices in the prior art are combined with probes and the positions between the probes are relatively fixed, and can only test the continuity of a certain size or type of chip or PCB board. For different types of chips, corresponding preparations are required. The special positioning detection device has large limitations in use, high test cost, and brings inconvenience to the detection; at present, some detection devices can achieve a certain position adjustment between the probes, but the adjustment accuracy is low, the adjustment operation process is troublesome, and the efficiency lower.
(三)发明内容(3) Contents of the invention
为克服现有技术中存在的上述问题,本发明提供了一种基于板簧微调的定位检测装置,能够通过快速高精度的调整组合探针位置及探针间距来适应不同型号的芯片或PCB板的测试,本发明是通过如下技术方案实现的:In order to overcome the above-mentioned problems in the prior art, the present invention provides a positioning detection device based on the fine-tuning of the leaf spring, which can adapt to different types of chips or PCB boards by adjusting the combined probe position and the probe spacing quickly and accurately. The test of the present invention is realized by the following technical solutions:
一种基于板簧微调的定位检测装置,包括底座,所述底座上设有安装架,所述安装架上连接有Z轴滑动台,所述Z轴滑动台通过Z轴连接块连接有组合探针调整机构;所述组合探针调整机构包括水平连接在Z轴连接块上的支撑板,所述支撑板的顶面上左、右两侧分别设有对称的左支承座和右支承座,所述左支承座和右支承座之间贯穿有能够左右滑动的滑动轴,所述滑动轴上连接有滑动轴连接块,所述滑动轴上连接还有止旋限位装置,所述滑动轴连接块上连接有探针间距调整机构;所述探针间距调整机构包括连接在滑动轴连接块上的间距调整基板,所述间距调整基板的左、右两侧均设有连接座,左、右的所述连接座之间连接有连接杆,所述连接杆上配合连接有螺纹套一和螺纹套二,所述螺纹套一和螺纹套二能够在连接杆上左、右运动,所述螺纹套一和螺纹套二的下端均连接有螺纹套连接板,所述螺纹套连接板上连接有用于固定探针的探针支架。A positioning detection device based on fine adjustment of leaf springs, comprising a base, a mounting frame is arranged on the base, a Z-axis sliding table is connected to the mounting frame, and the Z-axis sliding table is connected with a combined probe through a Z-axis connecting block. Needle adjustment mechanism; the combined probe adjustment mechanism includes a support plate horizontally connected to the Z-axis connecting block, and the left and right sides of the top surface of the support plate are respectively provided with symmetrical left support seats and right support seats, A sliding shaft that can slide left and right runs through the left support base and the right support base. The connecting block is connected with a probe spacing adjustment mechanism; the probe spacing adjustment mechanism includes a spacing adjustment base plate connected to the sliding shaft connecting block, the left and right sides of the spacing adjustment base plate are provided with connecting seats, and the left and right sides of the spacing adjustment base plate are provided with connecting seats. A connecting rod is connected between the connecting seats on the right, and a threaded
优选的,所述左支承座和右支承座均包括左侧板、右侧板及连接在左侧板和右侧板上方的顶板,所述滑动轴滑动连接于左支承座的右侧板和右支承座的左侧板;所述左支承座的左侧板与滑动轴的左端及右支承座的右侧板与滑动轴的右端均通过板簧连接;所述左支承座的顶板上设有微分头,所述微分头位于板簧正上方,微分头能够上下运动按压或放松所述板簧。Preferably, each of the left support base and the right support base includes a left side plate, a right side plate and a top plate connected above the left side plate and the right side plate, and the sliding shaft is slidably connected to the right side plate and the right side plate of the left support base. The left side plate of the right bearing seat; the left side plate of the left bearing seat and the left end of the sliding shaft and the right side plate of the right bearing seat and the right end of the sliding shaft are connected by a leaf spring; the top plate of the left bearing seat is provided with There is a differential head, the differential head is located just above the leaf spring, and the differential head can move up and down to press or loosen the leaf spring.
优选的,所述微分头下端与左支承座的顶板螺纹连接,且微分头下端螺纹部分的上方圆周面上设有上下方向的刻度层。Preferably, the lower end of the differential head is threadedly connected to the top plate of the left support seat, and a scale layer in the vertical direction is provided on the upper circumferential surface of the threaded portion of the lower end of the differential head.
优选的,所述左支承座和右支承座的板簧下方均设有下限位杆,所述下限位杆连接在支撑板上;所述右支承座的板簧上方还设有上限位杆。Preferably, lower limit rods are provided below the leaf springs of the left and right support bases, and the lower limit rods are connected to the support plate; and an upper limit rod is also provided above the leaf spring of the right support base.
优选的,所述止旋限位装置包括的导向轴及滑动连接于所述导向轴两端的导向轴座,所述导向轴座的下端固定在支撑板上;所述导向轴与滑动轴通过固定夹连接。Preferably, the anti-rotation limiting device includes a guide shaft and a guide shaft seat slidably connected to both ends of the guide shaft, and the lower end of the guide shaft seat is fixed on the support plate; the guide shaft and the sliding shaft are fixed by fixing clip connection.
优选的,所述连接座为滚动轴承座,所述连接杆为螺纹杆,螺纹套一和螺纹套二与连接杆螺纹配合连接且旋向相反;连接杆的右端设有调整旋钮;所述螺纹套连接板的内侧连接有螺纹套滑块,所述间距调整基板上连接有左右方向的螺纹套导轨,所述螺纹套滑块和螺纹套导轨配合连接;所述连接座上还连接有固定旋钮,所述固定旋钮与连接座螺纹连接,通过旋转固定旋钮抵住或松开连接杆。Preferably, the connecting seat is a rolling bearing seat, the connecting rod is a threaded rod, the threaded
优选的,所述连接座与调整旋钮之间设有位置指示器。Preferably, a position indicator is provided between the connection base and the adjustment knob.
优选的,所述螺纹套一和螺纹套二之间连接有对中弹簧。Preferably, a centering spring is connected between the first threaded sleeve and the second threaded sleeve.
优选的,所述间距调整基板前侧面下端设有水平的刻度尺,所述所述螺纹套连接板下端连接有间距指针。Preferably, a horizontal scale is provided at the lower end of the front side surface of the spacing adjustment base plate, and a spacing pointer is connected to the lower end of the threaded sleeve connecting plate.
优选的,所述安装架与Z轴滑动台之间还设有Y轴滑动台,所述底座上设有左上料台和右上料台,所述左上料台和右上料台的位置分别与Y轴滑动台上的Y轴滑块的左、右止点位置相对应。Preferably, a Y-axis sliding table is further provided between the mounting frame and the Z-axis sliding table, a left feeding table and a right feeding table are provided on the base, and the positions of the left feeding table and the right feeding table are respectively the same as the Y-axis sliding table. The left and right dead center positions of the Y-axis slider on the axis slide table correspond.
本发明的有益效果是:The beneficial effects of the present invention are:
1、通过调节组合探针调节机构和探针间距调整机构,能够适应多种型号的芯片或PCB板的测试。1. By adjusting the combined probe adjustment mechanism and the probe spacing adjustment mechanism, it can adapt to the testing of various types of chips or PCB boards.
2、组合探针调节机构中,通过旋转微分头调节板簧的弯曲状态,进而板簧的弹力推动滑动轴左右运动来调整探针间距调整机构的左右位置,可以以较低成本实现组合探针的高精度调整。2. In the combined probe adjustment mechanism, the bending state of the leaf spring is adjusted by rotating the differential head, and then the elastic force of the leaf spring pushes the sliding shaft to move left and right to adjust the left and right positions of the probe spacing adjustment mechanism, which can realize the combined probe at a lower cost. high-precision adjustment.
3、微分头的圆周面上设有上下方向的刻度层,刻度值根据微分头伸出或缩回的位移与板簧的形变换算关系得到,组合探针位置的调整更加的精确。3. There is a scale layer in the upper and lower directions on the circumference of the differential head. The scale value is calculated according to the relationship between the extension or retraction of the differential head and the shape transformation of the leaf spring. The adjustment of the combined probe position is more accurate.
4、板簧的上方和下方设有限位杆,使得板簧在一定的范围内形变,以免过量形变损坏板簧或超过形变位置时影响调整的精准度。4. There are limit rods above and below the leaf spring, so that the leaf spring can be deformed within a certain range, so as to avoid excessive deformation from damaging the leaf spring or affecting the accuracy of adjustment when it exceeds the deformation position.
5、探针间距调整机构中,螺纹套一和螺纹套二与连接杆螺纹连接,且旋向相反,通过旋转调整旋钮就能够方便的调节探针间距。5. In the probe spacing adjustment mechanism, the threaded
6、连接座与调整旋钮之间设有位置指示器,可以精确控制探针间距。6. There is a position indicator between the connection seat and the adjustment knob, which can precisely control the distance between the probes.
7、螺纹套一和螺纹套二之间连接有对中弹簧,可以在调整旋钮左右微调时,施加背向力,消除反向调整间隙,进一步提高探针间距的调节精度。7. A centering spring is connected between the threaded
8、间距调整基板下端设有水平的刻度尺,能够直观的读取探针间距。8. Spacing adjustment The lower end of the substrate is provided with a horizontal scale, which can read the probe spacing intuitively.
9、安装架与Z轴滑动台之间还设有Y轴滑动台,底座上设有左上料台和右上料台,通过左上料台和右上料台交替检测与上料,工作效率更高。9. There is also a Y-axis sliding table between the mounting frame and the Z-axis sliding table. The base is provided with a left feeding table and a right feeding table. The left feeding table and the right feeding table are alternately detected and loaded, and the work efficiency is higher.
(四)附图说明(4) Description of drawings
下面结合附图对本发明作进一步的说明。The present invention will be further described below in conjunction with the accompanying drawings.
图1为本发明的立体结构示意图。FIG. 1 is a schematic diagram of the three-dimensional structure of the present invention.
图2为本发明的侧视结构示意图。FIG. 2 is a schematic side view of the structure of the present invention.
图3为本发明中的Y轴滑动台与Z轴滑动台安装结构示意图。FIG. 3 is a schematic diagram of the installation structure of the Y-axis sliding table and the Z-axis sliding table in the present invention.
图4为本发明中的上料台结构图。FIG. 4 is a structural diagram of the feeding table in the present invention.
图5为本发明中的组合探针调整机构与探针间距调整机构连接结构主视图。5 is a front view of the connection structure of the combined probe adjustment mechanism and the probe spacing adjustment mechanism in the present invention.
图6为本发明中的组合探针调整机构与探针间距调整机构连接结构立体图。6 is a perspective view of the connection structure of the combined probe adjustment mechanism and the probe spacing adjustment mechanism in the present invention.
图7为本发明中的组合探针调整机构的主视结构示意图。FIG. 7 is a schematic front view of the structure of the combined probe adjustment mechanism in the present invention.
图8为本发明中的组合探针调整机构的俯视结构示意图。FIG. 8 is a schematic top view of the structure of the combined probe adjustment mechanism in the present invention.
图9为本发明中的组合探针调整机构的左视结构示意图。FIG. 9 is a left-view structural schematic diagram of the combined probe adjustment mechanism in the present invention.
图10为本发明中的组合探针调整机构的立体结构示意图。FIG. 10 is a schematic three-dimensional structure diagram of the combined probe adjustment mechanism in the present invention.
图11为本发明中的探针间距调整机构的主视结构示意图。FIG. 11 is a schematic front view of the structure of the probe pitch adjustment mechanism in the present invention.
图12为本发明中的探针间距调整机构的右视结构示意图。FIG. 12 is a schematic view of the structure of the probe distance adjustment mechanism in the right side view of the present invention.
图13为本发明中的探针间距调整机构的立体结构示意图。FIG. 13 is a schematic three-dimensional structure diagram of the probe spacing adjustment mechanism in the present invention.
图中,1-底座、2安装架、3-Y轴滑动台、31-Y轴滑块、32-Y轴连接块、4-Z轴滑动台、41-Z轴滑块、42-Z轴连接块、5-组合探针调整机构、51-支撑板、52-左支承座、521-板簧固定台一、53-右支承座、54-滑动轴、541-板簧固定台二、55-板簧、56-下限位杆、561-上限位杆、57-微分头、58-滑动轴连接块、59-固定夹、50-导向轴、501-导向轴座、6-探针间距调整机构、61-间距调整基板、62-连接杆、63-螺纹套一、631-螺纹套连接板、632-探针支架、633-螺纹套滑块、634-螺纹套导轨、635-探针、64-螺纹套二、65-位置指示器、66-调整旋钮、67-固定旋钮、68-刻度尺、681-间距指针、69-对中弹簧、60-连接座、7-上料台一、71-上料台滑块、72-芯片定位工装、73-上料台安装孔、8-上料台二、9-芯片。In the figure, 1-base, 2-mounting frame, 3-Y-axis sliding table, 31-Y-axis sliding block, 32-Y-axis connecting block, 4-Z-axis sliding table, 41-Z-axis sliding block, 42-Z-axis Connection block, 5-combination probe adjustment mechanism, 51-support plate, 52-left support base, 521-plate spring fixing table 1, 53-right support base, 54-sliding shaft, 541-leaf spring fixing table 2, 55 -leaf spring, 56-lower limit rod, 561-upper limit rod, 57-differential head, 58-slide shaft connecting block, 59-fixing clip, 50-guide shaft, 501-guide shaft seat, 6-probe spacing adjustment Mechanism, 61-spacing adjustment base plate, 62-connecting rod, 63-threaded sleeve one, 631-threaded sleeve connecting plate, 632-probe bracket, 633-threaded sleeve slider, 634-threaded sleeve guide rail, 635-probe, 64-threaded sleeve II, 65-position indicator, 66-adjustment knob, 67-fixed knob, 68-scale, 681-spacing pointer, 69-centering spring, 60-connecting seat, 7-feeding table 1, 71- Loading table slider, 72- Chip positioning tool, 73- Loading table mounting hole, 8- Loading table two, 9- Chip.
(五)具体实施方式(5) Specific implementation methods
为使本领域技术人员能够更好的理解本发明,下面将结合附图对本发明技术方案做进一步的说明。In order to enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be further described below with reference to the accompanying drawings.
本发明为一种基于板簧微调的定位检测装置,如图1-2所示,包括底座1,所述底座1上设有安装架2,安装架2上连接有左右方向的Y轴滑动台3,Y轴滑动台3采用气动滑台,Y轴滑动台3上的Y轴滑块31在气动下,能够左右方向伸出或收回,带动探针检测上料台一7与上料台二8左右两个工位上的芯片,提高工作效率。The present invention is a positioning detection device based on the fine adjustment of the leaf spring. As shown in Figures 1-2, it includes a
Y轴滑块31上螺钉连接有Y轴连接块32,Y轴连接块32固定安装有Z轴滑动台4,Z轴滑动台4也采用气动滑台,Z轴滑动台4上的Z轴滑块41在气动下,能够上下运动。Z轴滑动台4的作用是带动下端的探针上下运动,对芯片或PCB板进行导通测试。The Y-
Z轴滑动台4通过Z轴连接块4连接有组合探针调整机构5,组合探针调整机构5包括水平连接在Z轴连接块42上的支撑板51,支撑板51的顶面上左、右两侧分别设有对称的左支承座52和右支承座53,左支承座52和右支承座53关于支撑板51的中心截面左右对称。左支承座52和右支承座53均包括左侧板、右侧板及连接在左侧板和右侧板上方的顶板,左支承座52的右侧板和右支承座53的左侧板之间滑动连接有滑动轴54,为了减小滑动阻力,左支承座52的右侧板和右支承座53的左侧板上装有滑动轴承,滑动轴54在两个滑动轴承之间滑动。The Z-axis sliding table 4 is connected with the combined
左支承座52的左侧板及右支承座53的右侧板的内侧面上设有板簧固定台一521,滑动轴54左右两端均设有板簧固定台二541,左支承座52的板簧固定台一521与滑动轴54左端的板簧固定台二541之间连接有板簧55,同样右支承座53的板簧固定台一521与滑动轴54右端的板簧固定台二541之间连接也连接有板簧55,连接方式为螺钉紧固连接。The left side plate of the
左支承座52的顶板上设有微分头57,微分头57位于板簧55正上方,微分头57下端与左支承座52的顶板螺纹连接,且微分头57下端螺纹部分的上方圆周面上设有刻度层,刻度层上设有上下方向的刻度值,刻度值根据微分头伸出或缩回的上下位移与板簧的左右方向的形变值换算关系得到,这样通过向下旋转微分头57,微分头57的底部向下压板簧55的弯曲形态,板簧55受压后,会发生横向位移,从而推动滑动轴54向右轴向滑动,进而带动探针间距调整机构6整体向右轴向移动;当反向旋转微分头57时,微分头57的底部脱离左侧的板簧55,板簧55在弹力下向上弯曲,从而拉动滑动轴54向左轴向滑动,进而带动探针间距调整机构6整体向左轴向移动。The top plate of the
板簧55的下方均设有下限位杆56,下限位杆56固定连接在支撑板51上;连接在右支承座53上的板簧55上方还设有上限位杆561,上限位杆561和下限位杆56能够使得板簧55在一定的范围内形变,以免过量形变损坏板簧55或超过形变位置时影响调整的精准度,比如图7中,板簧55是上凸的,当微分头57向下压板簧55形变过量变为下凹的,就不再符合依据的形变值换算关系,导致调节不准确。A
滑动轴54上还连接有止旋限位装置,能够防止探针间距调整机构6带动滑动轴54旋转,同时也防止该旋转力对板簧55施加一个扭力,影响板簧55寿命。止旋限位装置包括的导向轴50及滑动连接于所述导向轴50两端的导向轴座501,导向轴座501的下端固定在支撑板(51)上,导向轴座501内还设有滑动轴承,这样导向轴50能够更顺畅的左右滑动,导向轴50与滑动轴54通过固定夹59固定在一块,在滑动轴54受力左右滑动时,导向轴50起到左右滑动导向作用。The sliding
滑动轴54上固定连接有滑动轴连接块58,滑动轴连接块58上螺钉紧固连接有探针间距调整机构6,探针间距调整机构6包括连接在滑动轴连接块58上的间距调整基板61,间距调整基板61的左、右两侧均设有连接座60,左、右的所述连接座60之间连接有连接杆62,连接杆62上配合连接有螺纹套一63和螺纹套二64,所述螺纹套一63和螺纹套二64能够在连接杆62上左、右运动,其中连接座60为滚动轴承座,连接座60内装有滚动轴承,连接杆62为螺纹杆,连接杆62两端固定在两侧的连接座60内的滚动轴承内圈中,螺纹套一63和螺纹套二64与连接杆62螺纹连接,且螺纹套一63和螺纹套二64旋向相反,在本实施例中,螺纹套一63上设有左旋螺纹,螺纹套二64上设有右旋螺纹,这样在旋转连接杆62时,螺纹套一63和螺纹套二64同时相向或相背运动。The sliding
螺纹套一63和螺纹套二64的下端均连接有螺纹套连接板631,螺纹套连接板631的内侧连接有螺纹套滑块633,间距调整基板61上连接有左右方向的螺纹套导轨634,螺纹套滑块633和螺纹套导轨634配合连接,这样在通过旋转连接杆62调节螺纹套一63和螺纹套二64之间距离时,螺纹套一63和螺纹套二64不会跟着旋转,只会沿着螺纹套导轨634方向左右移动。螺纹套连接板631上连接有用于固定探针635的探针支架632,通过旋转连接杆62就可以调节探针635的间距。The lower ends of the first threaded
连接座60上还连接有固定旋钮67,在本实施例中,固定旋钮67位于右侧的连接座60上,固定旋钮67与连接座60螺纹连接,固定旋钮67的杆端穿过连接座60,通过旋转固定旋钮67能够抵住或松开连接杆62,当调节好探针635之间的间距时,通过旋转固定旋钮67将连接杆62固定死,防止在工作时探针635被动左右移动,间距产生变化,测量结果不准确。The connecting
连接杆62的右端设有调整旋钮66,方便操作人员抓握来调节探针635的间距;连接座60与调整旋钮66之间设有位置指示器65,位置指示器能够监测旋转圈数,通过输入螺距、连接杆62直径等参数,能够直接显示出探针635之间的间距,精度高。The right end of the connecting
螺纹套一63和螺纹套二64之间连接有对中弹簧69,在调整旋钮左右微调时,对中弹簧69会施加背向力,消除反向调整间隙,进一步保提高探针间距的调节精度。A centering
间距调整基板61前侧面下端设有水平的刻度尺68,螺纹套连接板631下端连接有间距指针681,能够直观的读取探针间距,更加方便。The lower end of the front side of the spacing
底座1上设有左上料台7和右上料台8,左上料台7和右上料台8结构完全相同,均为气动滑台,通过底座1上的上料台安装孔73固定在底座1上左右两侧。由于气动滑台上的上料台滑块71只能够从一端滑向另一端,不能够中间任意点启停,因此左上料台7和右上料台8的安装位置分别与Y轴滑动台3上的Y轴滑块31的左、右止点位置相对应。上料台滑块71上设有芯片固定工装72,芯片固定工装72内固定有芯片9。The
工作过程:探针台开始工作前,先精确调整探针位置,以便适应不同尺寸的芯片或PCB。先通过组合探针调整机构5中的微分头57微调探针的左右方向的位置,再通过探针间距调整机构6中的调整旋钮66调整左右探针的间距,调整好后,拧紧固定旋钮;由左上料台7、右上料台8交替放入芯片9或PCB检测件,左上料台7将芯片9推进到左检测位置,Y轴滑动台3移动到左侧位置,Z轴滑动台4向下移动,开始检测,检测完成后,Z轴滑动台4向上回退,左上料台7退回,拿下检测完成的芯片9,装上待检测的芯片9;左上料台7退回的同时,右上料台8将芯片9推进到右检测位置,Y向气动滑台移动到右侧位置,Z向气动滑台向下移动,开始检测,检测完成后,Z轴滑动台4向上回退,右上料台8退回,右上料台8下料然后再上新料,上上料完毕的左上料台7又将芯片9推进到左检测位置,开始新一轮的检测循环。Working process: Before the probe station starts to work, adjust the position of the probe precisely to adapt to different sizes of chips or PCBs. First, use the
本发明的描述中,术语“上”、“下”、“前”、“后”、“左”、“右”、“顶”、“底”、“竖直”、“水平”等指示的方位或位置关系为基于附图所示的方位或位置关系,仅是为了描述本发明而不是要求本发明必须以特定的方位构造或操作,因此不能理解为对本发明的限制。本发明中的“相连”“连接”应作广义理解,例如,可以是连接,也可以是可拆卸连接;可以是直接连接,也可以是通过中间部件间接连接,对于本领域的普通技术人员而言,可以具体情况理解上述术语的具体含义。In the description of the present invention, the terms "upper", "lower", "front", "rear", "left", "right", "top", "bottom", "vertical", "horizontal", etc. The orientation or positional relationship is based on the orientation or positional relationship shown in the drawings, and is only for describing the present invention rather than requiring the present invention to be constructed or operated in a specific orientation, and therefore should not be construed as a limitation of the present invention. In the present invention, "connected" and "connected" should be understood in a broad sense, for example, it may be a connection or a detachable connection; it may be a direct connection or an indirect connection through an intermediate component. In other words, the specific meanings of the above terms can be understood in specific situations.
以上所述为本发明的优选实施方式,具体实施例的说明仅用于更好的理解本发明的思想。对于本技术领域的普通技术人员来说,依照本发明原理还可以做出若干改进或者同等替换,这些改进或同等替换也视为落在本发明的保护范围。The above descriptions are the preferred embodiments of the present invention, and the description of the specific embodiments is only used to better understand the idea of the present invention. For those skilled in the art, several improvements or equivalent replacements can also be made according to the principles of the present invention, and these improvements or equivalent replacements are also considered to fall within the protection scope of the present invention.
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