CN111158348B - A hardware maintenance and testing platform for subway vehicle signal control equipment - Google Patents

Abstract

The present invention relates to a hardware maintenance and testing platform for subway vehicle signal control equipment, comprising a PXI control chassis, a signal conditioning chassis, a test chassis, a main power control module and a host computer, wherein the PXI control chassis is respectively connected to the signal conditioning chassis, the test chassis, the main power control module and the host computer, and the main power control module is respectively connected to the signal conditioning chassis and the test chassis; the PXI control chassis controls the test chassis to send and collect signals of a product to be tested, and completes unit function and overall test of a functional board of the product to be tested; the signal conditioning chassis is used to connect the test chassis and the product to be tested, and is used to realize signal transfer between the two. Compared with the prior art, the present invention has the advantages of improving the efficiency of maintenance and fault diagnosis, etc.

Description

A hardware maintenance and testing platform for subway vehicle signal control equipment

Technical Field

The invention relates to a hardware maintenance test platform, in particular to a hardware maintenance test platform for a subway vehicle-mounted signal control device (iCC200).

Background Art

With the rapid development of modern technology, rail transit systems have increasingly higher requirements for the reliability, stability, accuracy and coverage of functional testing of hardware systems.

The existing iCC200 hardware function test platform is unable to repeatedly test a single function item of the tested board, and is unable to accurately locate the fault of the iCC200 system hardware board, resulting in low maintenance efficiency and poor accuracy.

Summary of the invention

The purpose of the present invention is to provide a hardware maintenance and testing platform for subway vehicle signal control equipment in order to overcome the defects of the above-mentioned prior art.

The purpose of the present invention can be achieved by the following technical solutions:

A hardware maintenance and testing platform for subway on-board signal control equipment, comprising a PXI control chassis, a signal conditioning chassis, a test chassis, a main power control module and a host computer, wherein the PXI control chassis is respectively connected to the signal conditioning chassis, the test chassis, the main power control module and the host computer, and the main power control module is respectively connected to the signal conditioning chassis and the test chassis;

The PXI control chassis controls the test chassis to send and collect signals of the product to be tested, and completes unit function and overall testing of the functional board of the product to be tested;

The signal conditioning chassis is used to connect the test chassis and the product under test to achieve signal switching between the two.

Preferably, the PXI control chassis includes an NI PXIe-8840 controller and a PXI-2567 external relay driver, a PXI-7841 multi-function reconfigurable I/O module, a PXIe-5641R intermediate frequency transceiver, a PXIe-4080 digital multimeter, a PXI-8513 CAN interface module, a PXI-8431 serial instrument control module, a PXIe-5114 oscilloscope, and a PXI-2529 matrix switch module, which are respectively connected to the NI PXIe-8840 controller.

Preferably, the signal conditioning chassis includes a speed signal conditioning board, a beacon signal conditioning board, a relay driver board, an IMP modulation board, a matrix routing board, a serial port board, a PWM output board, a DMM switching board, a load board, a VPB distribution board, a DTG board, an oscilloscope board and a power switching board.

Preferably, the matrix routing board is used to connect the resources of the PXI control chassis to the matrix switch, so as to ensure that the instrument can be connected to the product test point through the matrix switch later;

The serial port board is used to connect the industrial communication node simulated by the PXI control chassis to the matrix switch, including 1 CAN channel, 2 RS232 channels, and 2 RS485/422 channels;

The relay driver board is connected to the PXI-2567 external relay driver to drive various relays to work, realize small current control of large current work, and is used to supply power to the load connected to the product port;

The PWM output board is used to realize the output of PWM signals, connected to the PXI-7841 multi-function reconfigurable I/O module, and controls the output of pulses. After passing through a first-stage amplification circuit, the OC gate output is realized externally, and is used for radar testing of the VPB-2 board under test.

The input of the load card is a programmable power supply, a programmable load, a digital multimeter, and a relay drive interface. It outputs a high-power power supply and routes the corresponding signal to the matrix switch. Different test circuits are realized through the combination of relays to meet different types of tests on product channels.

The VPB breakout board is used to implement the conditioning of beacon-related signals. The PXIe-5641R intermediate frequency transceiver sends a single-ended FSK signal to simulate the beacon, which is converted into a differential FSK signal after passing through the corresponding conditioning board, and the TOPLOC and PHASE signals sent by the PXI control chassis are converted from single-ended to differential signals.

The PXI-7841 multi-function reconfigurable I/O module detects the D signal from the VPB breakout board and sends the C signal to the VPB breakout board;

The power switching board inputs the power output of the main power control module, outputs the power of the load circuit, and finally connects to the backplane of the test circuit;

The DTG board generates a ±15V test square wave;

The oscilloscope board is used to monitor current ripple, PWM waveform, serial port signal waveform, and CAN port signal waveform.

Preferably, the test chassis includes a high-power test chassis and a low-power test chassis;

The high-power test chassis includes a high-current test board and a high-current relay board, which are used to simulate the load output by the product;

The low-power test chassis comprises a low-current test board and a network load board, and is used for testing low-current signals and network loads.

Preferably, the main power control module provides 110VDC working power to the product under test, and provides 24VDC/5VDC conditioning power to the signal conditioning chassis.

Preferably, the platform further comprises a network switch for connecting the product under test and the PXI control chassis.

Preferably, the platform also includes a programmable DC electronic load for simulating the load test of the HSS board under test, a programmable power supply for providing load test power, and a serial port switch for supporting multi-serial port communication.

Preferably, the platform also includes MCU, FPGA, CPLD program burning interface, and DATAPLUG IIC test interface.

Preferably, the host computer realizes hardware control, human-computer test interaction, history record management, and report generation, adopts NI_Labview as the software development platform, and National Instruments' Teststand as the test sequence management software to manage user test cases, realize the arrangement of test sequences and complete the automated testing of product cards.

Compared with the prior art, the present invention has the following advantages:

The functions of the hardware boards of the iCC200 system are complex. The platform of the present invention automatically obtains the test data of the measured points, flexibly provides various signal excitations required by the boards, realizes the accurate fault location of the hardware boards of the iCC200 system, improves the efficiency of maintenance and fault diagnosis, and has the characteristics of high reliability and high flexibility.

BRIEF DESCRIPTION OF THE DRAWINGS

Fig. 1 is a structural block diagram of the present invention;

Fig. 2 is a schematic diagram of a specific structure of the present invention;

Fig. 3 is a schematic diagram of the internal test principle;

Figure 4 is a schematic diagram of the communication node test principle;

Figure 5 is a schematic diagram of the product output test principle;

Figure 6 is a schematic diagram of the product input test principle;

FIG7 is a schematic diagram of a product output signal test;

Figure 8 is a diagram of the manual debugging interface;

Figure 9 is a diagram of the test report interface.

DETAILED DESCRIPTION

The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

As shown in FIG1 , a hardware maintenance test platform for subway vehicle signal control equipment includes a PXI control chassis 1, a signal conditioning chassis 2, a test chassis 3, a main power control module 4 and a host computer 5, wherein the PXI control chassis 1 is respectively connected to the signal conditioning chassis 2, the test chassis 3, the main power control module 4 and the host computer 5, the main power control module 4 is respectively connected to the signal conditioning chassis 2 and the test chassis 3, and the signal conditioning chassis 2 is connected to a product under test 6;

The PXI control chassis controls the test chassis to send and collect signals of the product to be tested, and completes unit function and overall testing of the functional board of the product to be tested;

The signal conditioning chassis is used to connect the test chassis and the product under test to achieve signal switching between the two.

The PXI control chassis meets the system's high reliability, high-performance data acquisition and processing requirements, including the NI PXIe-8840 controller, PXI-2567 external relay driver, PXI-7841 multifunction reconfigurable I/O module, PXIe-5641R intermediate frequency (IF) transceiver, PXIe-4080 digital multimeter, PXI-8513 CAN interface module, PXI-8431 serial instrument control module, PXIe-5114 oscilloscope, and PXI-2529 matrix switch module.

The signal conditioning chassis mainly realizes the signal transfer between the test platform and the product under test, including speed signal conditioning board, beacon signal conditioning board, relay board, IMP modulation board, matrix routing board, DMM switching board, load board, VPB distribution board, and power switching board.

The Measx Matrix board in the signal conditioning chassis is used to connect NI test instrument resources to the matrix switch to ensure that the instruments can be connected to the product test points through the matrix switch in the future; the serial port board is used to connect the industrial communication nodes simulated by the NI test instrument to the matrix switch, mainly including 1 CAN channel, 2 RS232 channels, and 2 RS485/422 channels. The analog interface can be used to perform communication tests with the main control board; the drive signal of the relay driver board comes from 3 PXI-2567 boards with 64 channels each, and outputs 12 interfaces with 16 channels. The main function is to drive various relays to achieve small current control of large current, and to supply power to the load connected to the product port; the PWM output module is used to realize the output of PWM signals, and the control board is the PXI-7841 counter board, which controls the output of pulses. After passing through the first-stage amplification circuit, the external OC gate output is realized, which is used for the radar test of the VPB-2 board under test; the input of the load circuit module is the programmable power supply, programmable load, digital multimeter, and relay drive interface, which outputs high-power power supply and routes the corresponding signal to the matrix switch. Different test circuits can be realized through the combination of relays to meet different types of tests on product channels; the VPB conditioning board is used to realize the conditioning of beacon-related signals. The PXIe-5641R sends a single-ended FSK signal to simulate the beacon, which becomes a differential FSK signal after the corresponding conditioning board, and converts the TOPLOC and PHASE signals sent by the NI board from single-ended to differential signals. The PXI-7841 board detects the D signal from the VPB-2 board and sends the C signal to the VPB-2 board. The corresponding conditioning board mainly realizes the conversion between the instrument board input and output 5V and the VPB-2 board 24V; the power input/output module inputs the power output of the power box, outputs the power of the load circuit, and finally connects to the backplane of the test circuit. The DTG board generates ±15V test square waves. The oscilloscope board is used to monitor current ripple, PWM waveform, serial port signal waveform, CAN port signal waveform, etc.

The high-power test chassis includes a high-current test board and a high-current relay board, which are used to simulate the load of the product's external output.

The low-power test chassis includes a low-current test board and a network load board (simulating a 100-meter network transmission line) for testing low-current signals and network loads.

The main power module provides 110VDC working power to the product under test and provides 24VDC/5VDC conditioning power to the conditioning chassis.

The network switch provides network communication between the host and the product.

The programmable DC electronic load IT8512 simulates the load test of the HSS and other boards under test.

The programmable power supply N5770A provides load test power.

The serial port switch supports multi-serial port communication.

The platform cable includes the power supply cable required by the test equipment itself and the cable between the test equipment and the fixture. One end is a high-density connector connected to the fixture, such as (HAN108), and the other end is a group of classified signal connectors connected to the instrument or load.

The platform provides MCU, FPGA, CPLD program burning interface, DATAPLUG IIC test interface.

The extension board takes into account that when repairing and debugging the board, it is necessary to remove the board under test from the cage, replace it with the extension board, and then insert the board under test on the extension board for easy debugging. The extension board interface includes CPM front board connector, CPM rear board connector, VIOM48 core connector, PSB board connector, and pinch board connector.

The host computer test software realizes hardware control, human-computer test interaction, history record management, report generation and other tasks. This system uses NI_Labview as the software development platform and National Instruments' Teststand as the test sequence management software to manage user test cases, realize the arrangement of test sequences and complete the automated testing of product cards.

The upper computer software communication method uses network communication to send test start and stop commands to the lower computer, and receives the test results uploaded by the lower computer. It can realize automated testing, test one board at a time, support single board single or multiple functions selective testing, and support the setting of test time or test cycle number for full function test and selective test. It can display the current test progress in real time and the details of each test in real time. The test results are saved in the form of reports, and the test reports can be exported.

The host computer program burning interface platform can realize the one-key burning function of the program corresponding to a single board. The host computer burning interface must have a corresponding prompt interface, such as a prompt for successful program import, a progress prompt during the burning process, etc. After the burning is completed, there must be an obvious prompt interface for the burning result, etc. The host computer has the management function of the burning files corresponding to each board.

The host computer software provides the function of observing and saving the waveforms collected by the oscilloscope.

The host computer software has the function of frequently powering on and off the board under test. The number of power-on and power-off times and the time interval between power-on and power-off can be set. The VIOC board and VLE-2 board can record the error codes during the power-on and power-off process.

When the host computer software tests a single board, it only needs to scan the serial number of the board being tested, and the gold board serial number is automatically obtained from the configuration file.

The test platform can realize the functional test of VIOC board debugging network port, debugging serial port, CPU main frequency, internal timer, external counter, FLASH file system, EEPROM, DATAPLUG, IOBUS bus, DPRAM, working network port, RS422 serial port, IIC interface and digital tube.

The test platform can realize DSB board MOSFET action test, relay status readback, 2OO2 test, on-power test, on-resistance test, on-voltage test, leakage current test, IOBUS bus test, MCU main frequency test, CPLD/FPGA test, 574/244 chip test, baseboard power circuit relay test, output relay test, output acquisition circuit function test, contact acquisition function test, PMP bus test, output circuit status check.

The test platform can realize PSB board 2OO2 test, on-power test, on-resistance test, on-voltage test, leakage current test, IOBUS bus test, MCU main frequency test, CPLD/FPGA test, 574/244 chip test, baseboard power circuit relay test, output relay test, output acquisition circuit function test, contact acquisition function test, PMP bus test, and output circuit status check.

The test platform can realize FAB board output current test, current ripple test, output voltage test, PWM output test, PWM duty cycle readback test, channel output test, and IOBUS bus test.

The test platform can realize FDB board output status acquisition, output voltage test, 2oo2 test, load capacity test, leakage current test, and IOBUS bus test.

The test platform can realize VDI board single-channel current test, single-channel status readback, 16-channel simultaneous test, and IOBUS bus test.

The test platform can realize 5VDC and 24VDC load testing of the VPU board.

The test platform can realize VPB-2 board CPCI bus test, zero speed test, encoder odometer 50km/h gear and tooth number test, downlink function test, FSK signal test, PHASE signal test, TOPLOC signal test, ATO function test, radar RS485 channel test, radar pulse signal test.

The test platform can realize the functional test of VLE-2 board debugging network port, debugging serial port, CPU main frequency, internal timer, external counter, FLASH file system, EEPROM, DATAPLUG, DPRAM, working network port, RS485 serial port, IIC interface, RTC clock test, safety clock, and digital tube.

The test platform can realize the functional test of DVCOM-2 board (part number 42015-117-00 and 42015-117-01) debugging network port, debugging serial port, CPU main frequency, internal timer, external counter, FLASH file system, EEPROM, DATAPLUG, DPRAM, working network port, RS485 serial port, RS422 serial port, CAN port, ATO interface, digital tube, CPCI bus, and DTG signal.

The test platform can realize the functional test of DVCOM-2 board (part number 42015-117-02) debugging network port, debugging serial port, CPU main frequency, internal timer, external counter, FLASH file system, EEPROM, DATAPLUG, DPRAM, working network port, RS485 serial port, RS422 serial port, CAN port, ATO interface, digital tube, CPCI bus, DTG signal, RTC clock, eMMC storage, USB interface, and power-off retention time.

The test platform can realize 3.3VDC, 5VDC, and 12VDC load testing of CPB boards.

The test platform can realize the corresponding state test of the normally closed/normally open contacts of a single relay on the HSS board, and the simultaneous test of 19 channels corresponding to the A/B channels respectively.

The test platform can realize VDI-3 board MCU main frequency test, AD circuit BIT test, single channel current test, single channel status readback test, 24 channels simultaneous test, CPU1/2 internal communication CRC test, overvoltage test, undervoltage test, AD chip select test, 24-channel century acquisition high 4-bit comparison test, and IOBUS bus test.

The test platform can realize DWU board DATAPLUG read and write test, working network port test, debugging network port test, debugging serial port test, 110V input acquisition test, wake-up output test, indicator light test, USB interface test, EEPROM read and write test, power-off retention time test, eMMC storage test, CPU frequency test, RTC clock test, and FLASH read and write test.

The test platform can realize TCN board ATO function test, RS422 serial port test, RS485 serial port test, DTG interface test, working network port test, CAN port communication test, MVB function test, TRDP function test, DATAPLUG read and write test, and SPIEEPROM read and write test.

The test platform can realize the SWEC board working network port message receiving and sending test, DATAPLUG reading and writing test, debugging network port test, debugging serial port test, electronic tag reading test and fault feedback test.

The test platform can realize the load test of VPU-3 board 5VDC, 24VDC, and 12VDC.

As shown in Figure 3-7, the internal testing principle of the product is that the test host establishes a connection with the ICC200 main control board VLE-2 and VIOC board through network communication. The self-test and mutual test results of the internal functions of each board in the VIOM chassis and CPM chassis are then transmitted to the host computer software through the cPCI bus or IOBUS bus.

Communication node test principle, the test equipment provides communication simulators, such as CAN, RS485, RS422, RS232, network nodes, to achieve point-to-point communication of products to verify the communication quality of VIOC, VLE-2, and DVCOM-2 boards.

The principle of product power drive output test is to use a digital multimeter, electronic load, programmable power supply, etc. to test the status of the product under power drive output, such as the voltage or resistance when the PSB, DSB, and FDB board relays are turned on.

The product input test principle uses a signal generator and a programmable power supply to simulate different input voltages for the product, and then reads back the working status of the VDI board through test instructions.

Product signal output test principle, use the acquisition card to test the VPB downlink waveform output signal.

As shown in Figures 8 and 9, in order to facilitate engineers to locate board faults more flexibly, the device opens a manual debugging interface, which can select a single board, send and receive a single instruction, and manually control the combined instrument.

For normal testing, log in to the test interface, click Start Test, and then you can perform tests according to the selected board, function items, and configured test sequences. The test interface will display the test results in real time, and the indicator light will display the current test status, such as whether the system is normal and whether the handshake status is good. The final test results can be saved in real time.

The above is only a specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art can easily think of various equivalent modifications or substitutions within the technical scope disclosed by the present invention, and these modifications or substitutions should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention shall be based on the protection scope of the claims.

Claims (7)

1. A hardware maintenance test platform for subway vehicle signal control equipment, characterized in that it comprises a PXI control chassis, a signal conditioning chassis, a test chassis, a main power control module and a host computer, wherein the PXI control chassis is respectively connected to the signal conditioning chassis, the test chassis, the main power control module and the host computer, and the main power control module is respectively connected to the signal conditioning chassis and the test chassis; The PXI control chassis controls the test chassis to send and collect signals of the product to be tested, and completes unit function and overall testing of the functional board of the product to be tested; The signal conditioning chassis is used to connect the test chassis and the product under test to achieve signal transfer between the two; The PXI control chassis includes a NIPXIe-8840 controller and a PXI-2567 external relay driver, a PXI-7841 multi-function reconfigurable I/O module, a PXIe-5641R intermediate frequency transceiver, a PXIe-4080 digital multimeter, a PXI-8513 CAN interface module, a PXI-8431 serial instrument control module, a PXIe-5114 oscilloscope, and a PXI-2529 matrix switch module respectively connected to the NIPXIe-8840 controller; The signal conditioning chassis includes a speed signal conditioning board, a beacon signal conditioning board, a relay driver board, an IMP modulation board, a matrix routing board, a serial port board, a PWM output board, a DMM switching board, a load board, a VPB distribution board, a DTG board, an oscilloscope board and a power switching board; The matrix routing board is used to connect the resources of the PXI control chassis to the matrix switch, ensuring that the instrument can be connected to the product test point through the matrix switch later; The serial port board is used to connect the industrial communication node simulated by the PXI control chassis to the matrix switch, including 1 CAN channel, 2 RS232 channels, and 2 RS485/422 channels; The relay driver board is connected to the PXI-2567 external relay driver to drive various relays to work, realize small current control of large current work, and is used to supply power to the load connected to the product port; The PWM output board is used to realize the output of PWM signals, connected to the PXI-7841 multi-function reconfigurable I/O module, and controls the output of pulses. After passing through a first-stage amplification circuit, the OC gate output is realized externally, and is used for radar testing of the VPB-2 board under test. The input of the load card is a programmable power supply, a programmable load, a digital multimeter, and a relay drive interface. It outputs a high-power power supply and routes the corresponding signal to the matrix switch. Different test circuits are realized through the combination of relays to meet different types of tests on product channels. The VPB breakout board is used to implement the conditioning of beacon-related signals. The PXIe-5641R intermediate frequency transceiver sends a single-ended FSK signal to simulate the beacon, which is converted into a differential FSK signal after passing through the corresponding conditioning board, and the TOPLOC and PHASE signals sent by the PXI control chassis are converted from single-ended to differential signals. The PXI-7841 multi-function reconfigurable I/O module detects the D signal from the VPB breakout board and sends the C signal to the VPB breakout board; The power switching board inputs the power output of the main power control module, outputs the power of the load circuit, and finally connects to the backplane of the test circuit; The DTG board generates a ±15V test square wave; The oscilloscope board is used to monitor current ripple, PWM waveform, serial port signal waveform, and CAN port signal waveform. 2. A hardware maintenance test platform for subway vehicle signal control equipment according to claim 1, characterized in that the test chassis includes a high-power test chassis and a low-power test chassis; The high-power test chassis includes a high-current test board and a high-current relay board, which are used to simulate the load output by the product; The low-power test chassis comprises a low-current test board and a network load board, and is used for testing low-current signals and network loads. 3. A hardware maintenance test platform for subway vehicle signal control equipment according to claim 1, characterized in that the main power control module provides 110VDC working power to the product under test and provides 24VDC/5VDC conditioning power to the signal conditioning chassis. 4. A hardware maintenance test platform for subway vehicle signal control equipment according to claim 1, characterized in that the platform also includes a network switch for connecting the product under test and the PXI control chassis. 5. A hardware maintenance and testing platform for subway vehicle signal control equipment according to claim 1, characterized in that the platform also includes a programmable DC electronic load for simulating the load test of the HSS board under test, a programmable power supply for providing load test power, and a serial port switch for supporting multi-serial port communication. 6. The hardware maintenance test platform of a subway vehicle signal control device according to claim 1, characterized in that the platform also includes MCU, FPGA, CPLD program burning interface, and DATAPLUG IIC test interface. 7. According to claim 1, a hardware maintenance and testing platform for subway vehicle signal control equipment is characterized in that the host computer realizes hardware control, human-computer test interaction, history record management, and report generation, adopts NI_Labview as the software development platform, and National Instruments' Teststand as the test sequence management software to manage user test cases, realize the arrangement of test sequences and complete the automated testing of product cards.