CN110764246A - Equipment for shooting large-area sample on microscope and using method thereof - Google Patents
Equipment for shooting large-area sample on microscope and using method thereof Download PDFInfo
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- CN110764246A CN110764246A CN201911056722.8A CN201911056722A CN110764246A CN 110764246 A CN110764246 A CN 110764246A CN 201911056722 A CN201911056722 A CN 201911056722A CN 110764246 A CN110764246 A CN 110764246A
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/362—Mechanical details, e.g. mountings for the camera or image sensor, housings
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/365—Control or image processing arrangements for digital or video microscopes
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Abstract
The invention discloses a device for shooting a large-area sample on a microscope and a using method thereof.A base of the microscope is provided with two electric translation tables which are orthogonally stacked and installed together, and a slide block of the electric translation table positioned at the upper part is used as a sample placing table; the top of the microscope is provided with an image acquisition sensor which is used for photographing a sample and acquiring an image of the sample; an image acquisition sensor of the microscope is connected with an upper computer, the upper computer controls the image acquisition sensor to take a picture, and an image acquired by the image acquisition sensor by taking the picture is transmitted back to the upper computer to carry out subsequent image splicing processing; the electric translation platforms are connected with an upper computer, and the upper computer controls the two electric translation platforms to move so as to control the shooting position of the sample. The invention can fully utilize the imaging advantages of the optical polarized light microscope, increase the photographing resolution by hundreds of times compared with the photos of the digital camera, and bring breakthrough to the imaging range of the existing microscope.
Description
Technical Field
The invention belongs to the technical field of microscopic image acquisition, and particularly relates to equipment for shooting a large-area sample on a microscope.
Background
The image field of the lowest-multiple lens of the current commercial optical polarized light microscope objective is about 1 multiplied by 1cm2, which cannot meet the requirement of directly shooting a sample with a size larger than a centimeter level, and limits the optical characterization of a large-size sample. For large-size samples, particularly crystal samples, although shooting can be completed by using an independent polarizing film together with a commercial digital camera lens, the contrast and resolution of photos cannot meet the requirements of scientific research, and the microstructure of the samples cannot be captured.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provide a device for shooting a large-area sample on a microscope.
The invention is realized by the following technical scheme:
the device for shooting a large-area sample on a microscope comprises a microscope and an upper computer, wherein two electric translation stages which are orthogonally stacked and installed together are arranged on a base of the microscope, and a sliding block of the electric translation stage positioned at the upper part is used as a sample placing stage;
the top of the microscope is provided with an image acquisition sensor which is used for photographing a sample and acquiring an image of the sample; an image acquisition sensor of the microscope is connected with an upper computer, the upper computer controls the image acquisition sensor to take a picture, and an image acquired by the image acquisition sensor by taking the picture is transmitted back to the upper computer to carry out subsequent image splicing processing;
the electric translation stages are connected with an upper computer, and the upper computer controls the two electric translation stages to move so as to control the shooting position of the sample.
In the above technical solution, the microscope is a polarized light microscope.
In the above technical solution, the image capturing sensor is a CCD image capturing sensor.
In the above technical solution, the electric translation stage adopts a roller bearing electric translation stage driven by a stepping motor.
In the technical scheme, the upper computer end utilizes LabVIEW software to control the moving step length, the moving direction and the waiting time of the electric translation stage.
The use method of the device for shooting the large-area sample on the microscope is as follows:
the method comprises the following steps: placing a sample to be shot on a slide block of an electric translation table positioned at the upper part;
step two: selecting the objective lens multiple of the microscope, finishing focusing, determining a reasonable imaging range, and setting the photographing moving step length, the moving direction, the waiting time, the photographing interval time and the number of photos of the sample at the upper computer end;
step three: according to the control parameters determined in the second step, the upper computer controls the electric translation stage and the CCD image acquisition sensor to complete image acquisition of the sample;
step four: and finally, carrying out size calibration in the horizontal and vertical directions on the shot photo set, inputting the calibrated offset into software, reading and positioning the shooting coordinates through LabVIEW, and completing splicing of the shot images.
The invention has the advantages and beneficial effects that:
the invention adds a two-axis electric control translation stage on the microscope, controls the translation distance and the photographing through LabVIEW software, and finally performs picture splicing on the photographed pictures of all parts through the software to obtain a large-area sample microscope picture. The method can fully utilize the imaging advantages of the optical polarized light microscope, increase the photographing resolution by hundreds of times compared with the photos of the digital camera, bring breakthrough to the imaging range of the existing microscope, and provide a novel characterization means for scientific research and other fields.
Drawings
Fig. 1 is a schematic structural view of an apparatus for photographing a large-area sample on a microscope according to the present invention.
Fig. 2 is a schematic diagram of a photo stitching method.
Wherein:
1: first motorized translation stage, 2: second motorized translation stage, 3: and a CCD image acquisition sensor.
For a person skilled in the art, other relevant figures can be obtained from the above figures without inventive effort.
Detailed Description
In order to make the technical solution of the present invention better understood, the technical solution of the present invention is further described below with reference to specific examples.
Example one
Referring to the attached drawings, the equipment for shooting large-area samples on a microscope comprises a polarized light microscope and an upper computer, wherein two electric translation tables which are orthogonally overlapped and installed together are arranged on a base of the polarized light microscope, namely, a first electric translation table 1 arranged along a Y axis and a second electric translation table 2 arranged along an X axis are arranged on the base of the polarized light microscope, the second electric translation table 2 is fixedly installed on a sliding block of the first electric translation table 1, and then the sliding block of the first electric translation table 1 can drive the whole second electric translation table 2 to move along the Y axis, the sliding block of the second electric translation table 2 can move along the X axis, and further the sliding block of the second electric translation table 2 can be adjusted at will in the plane.
The slider of the second electric translation stage 2 is used as a sample placing stage, the sample is placed on the slider of the second electric translation stage 2 during shooting, and the slider of the second electric translation stage 2 drives the sample to adjust and shoot positions.
The top of the polarized light microscope is provided with a CCD image acquisition sensor 3 which is used for photographing a sample and acquiring an image thereof.
The CCD image acquisition sensor of the polarized light microscope is connected with an upper computer (PC), the CCD image acquisition sensor is controlled by the upper computer to shoot, and images shot by the CCD image acquisition sensor are transmitted back to the upper computer to be spliced with subsequent images.
First electronic translation platform 1 and second electronic translation platform 2 all are connected with host computer (PC), by the motion of host computer control first electronic translation platform 1 and second electronic translation platform 2, and then the position of control sample.
Example two
Further, the first electric translation stage 1 and the second electric translation stage 2 both adopt roller bearing electric translation stages driven by stepping motors, and the upper computer end utilizes LabVIEW software to control the moving step length, the moving direction and the waiting time of the first electric translation stage 1 and the second electric translation stage 2 and the shooting shutter trigger of the CCD image acquisition sensor.
EXAMPLE III
The method of use of the apparatus for taking large area samples on a microscope is as follows:
the method comprises the following steps: placing a sample to be photographed on a slide block of the second electric translation stage 2;
step two: selecting the objective lens multiple of the polarized light microscope, finishing focusing, determining a reasonable imaging range, and setting the photographing moving step length, the moving direction, the waiting time, the photographing interval time and the number of photos of the sample at the upper computer end;
step three: according to the control parameters determined in the second step, the upper computer controls the first electric translation stage 1, the second electric translation stage 2 and the CCD image acquisition sensor to finish the image acquisition of the sample;
step four: and finally, carrying out size calibration in the horizontal and vertical directions on the shot photo set, inputting the calibrated offset into software, reading and positioning the shooting coordinates through LabVIEW, and adopting a splicing mode shown in figure 2, wherein the mode is correspondingly designed aiming at the selected moving mode of the two-axis electric translation table to finish automatic splicing of the shot photos.
Spatially relative terms, such as "upper," "lower," "left," "right," and the like, may be used in the embodiments for ease of description to describe one element or feature's relationship to another element or feature as illustrated in the figures. It will be understood that the spatial terms are intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the figures. For example, if the device in the figures is turned over, elements described as "below" other elements or features would then be oriented "above" the other elements or features. Thus, the exemplary term "lower" can encompass both an upper and a lower orientation. The device may be otherwise oriented (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly.
Moreover, relational terms such as "first" and "second," and the like, may be used solely to distinguish one element from another element having the same name, without necessarily requiring or implying any actual such relationship or order between such elements.
The invention has been described in an illustrative manner, and it is to be understood that any simple variations, modifications or other equivalent changes which can be made by one skilled in the art without departing from the spirit of the invention fall within the scope of the invention.
Claims (6)
1. An apparatus for taking large area samples on a microscope, characterized by: the microscope comprises a microscope and an upper computer, wherein two electric translation stages which are orthogonally stacked and installed together are arranged on a base of the microscope, and a sliding block of the electric translation stage positioned at the upper part is used as a sample placing stage;
the top of the microscope is provided with an image acquisition sensor which is used for photographing a sample and acquiring an image of the sample; an image acquisition sensor of the microscope is connected with an upper computer, the upper computer controls the image acquisition sensor to take a picture, and an image acquired by the image acquisition sensor by taking the picture is transmitted back to the upper computer to carry out subsequent image splicing processing;
the electric translation stages are connected with an upper computer, and the upper computer controls the two electric translation stages to move so as to control the shooting position of the sample.
2. The apparatus of claim 1 for photographing large area samples on a microscope, characterized in that: the microscope is a polarized light microscope.
3. The apparatus of claim 1 for photographing large area samples on a microscope, characterized in that: the image acquisition sensor is a CCD image acquisition sensor.
4. The apparatus of claim 1 for photographing large area samples on a microscope, characterized in that: the electric translation stage adopts a roller bearing electric translation stage driven by a stepping motor.
5. The apparatus of claim 1 for photographing large area samples on a microscope, characterized in that: the upper computer end utilizes LabVIEW software to control the moving step length, the moving direction and the waiting time of the electric translation stage.
6. Use of an apparatus for taking large area samples on a microscope according to claim 1 characterised in that:
the method comprises the following steps: placing a sample to be shot on a slide block of an electric translation table positioned at the upper part;
step two: selecting the objective lens multiple of the microscope, finishing focusing, determining a reasonable imaging range, and setting the photographing moving step length, the moving direction, the waiting time, the photographing interval time and the number of photos of the sample at the upper computer end;
step three: according to the control parameters determined in the second step, the upper computer controls the electric translation stage and the CCD image acquisition sensor to complete image acquisition of the sample;
step four: and finally, carrying out size calibration in the horizontal and vertical directions on the shot photo set, inputting the calibrated offset into software, reading and positioning the shooting coordinates through LabVIEW, and completing splicing of the shot images.
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113050264A (en) * | 2021-04-23 | 2021-06-29 | 南京甬宁科学仪器有限公司 | Microscope objective automatic identification system |
Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101363712A (en) * | 2008-08-27 | 2009-02-11 | 天津大学 | Dynamic precision target drone for demarcating three-dimensional colourful digital system |
CN102169076A (en) * | 2010-12-16 | 2011-08-31 | 西北工业大学 | Device and method for detecting rich-Te phase in telluride semiconductor crystal |
CN102636493A (en) * | 2012-05-03 | 2012-08-15 | 齐齐哈尔华工机床有限公司 | Automatic imaging detection analysis processing system for macroscopic test |
CN102735687A (en) * | 2012-06-15 | 2012-10-17 | 北京航空航天大学 | Infrared sequence thermography analysis method for impact defects of carbon fiber composite material |
CN104198458A (en) * | 2014-09-26 | 2014-12-10 | 哈尔滨工业大学 | Femtosecond laser two-photon fluorescent biological microimaging system and imaging method thereof |
CN104959730A (en) * | 2015-06-26 | 2015-10-07 | 吉林大学 | Rotating table type femtosecond laser direct writing method and device |
CN106895781A (en) * | 2017-01-20 | 2017-06-27 | 大连理工大学 | A kind of hot part physical dimension Measurement and Control System of view-based access control model |
CN106897974A (en) * | 2017-01-24 | 2017-06-27 | 武汉帝尔激光科技股份有限公司 | The contour correction method and system of a kind of fault image |
CN108401085A (en) * | 2018-03-14 | 2018-08-14 | 河北南昊高新技术开发有限公司 | A kind of scan method, scanner and scanning system |
CN110146974A (en) * | 2019-05-29 | 2019-08-20 | 电子科技大学 | A kind of intelligent biological microscope |
-
2019
- 2019-10-31 CN CN201911056722.8A patent/CN110764246A/en active Pending
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101363712A (en) * | 2008-08-27 | 2009-02-11 | 天津大学 | Dynamic precision target drone for demarcating three-dimensional colourful digital system |
CN102169076A (en) * | 2010-12-16 | 2011-08-31 | 西北工业大学 | Device and method for detecting rich-Te phase in telluride semiconductor crystal |
CN102636493A (en) * | 2012-05-03 | 2012-08-15 | 齐齐哈尔华工机床有限公司 | Automatic imaging detection analysis processing system for macroscopic test |
CN102735687A (en) * | 2012-06-15 | 2012-10-17 | 北京航空航天大学 | Infrared sequence thermography analysis method for impact defects of carbon fiber composite material |
CN104198458A (en) * | 2014-09-26 | 2014-12-10 | 哈尔滨工业大学 | Femtosecond laser two-photon fluorescent biological microimaging system and imaging method thereof |
CN104959730A (en) * | 2015-06-26 | 2015-10-07 | 吉林大学 | Rotating table type femtosecond laser direct writing method and device |
CN106895781A (en) * | 2017-01-20 | 2017-06-27 | 大连理工大学 | A kind of hot part physical dimension Measurement and Control System of view-based access control model |
CN106897974A (en) * | 2017-01-24 | 2017-06-27 | 武汉帝尔激光科技股份有限公司 | The contour correction method and system of a kind of fault image |
CN108401085A (en) * | 2018-03-14 | 2018-08-14 | 河北南昊高新技术开发有限公司 | A kind of scan method, scanner and scanning system |
CN110146974A (en) * | 2019-05-29 | 2019-08-20 | 电子科技大学 | A kind of intelligent biological microscope |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113050264A (en) * | 2021-04-23 | 2021-06-29 | 南京甬宁科学仪器有限公司 | Microscope objective automatic identification system |
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