CN110737120B - Automated testing equipment - Google Patents
Automated testing equipment Download PDFInfo
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- CN110737120B CN110737120B CN201910990154.2A CN201910990154A CN110737120B CN 110737120 B CN110737120 B CN 110737120B CN 201910990154 A CN201910990154 A CN 201910990154A CN 110737120 B CN110737120 B CN 110737120B
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Liquid Crystal (AREA)
Abstract
本发明涉及一种自动化检测设备，包括支承模块(1)、支承在所述支承模块(1)上的检测平台模块(2)和位于所述检测平台模块(2)一侧的线扫模块(3)，还包括：PCB板定位模块(4)，位于所述线扫模块(3)的上方；检测轴(5)，与所述PCB板定位模块平行设置；银胶检测模块(6)，滑动安装在所述检测轴(5)上；PCB板检测模块(7)，与所述银胶检测模块(6)并列地滑动安装在所述检测轴(5)上。本发明的自动化检测设备，能够同时对液晶面板的导电粒子数及压合装置、液晶面板的银胶涂覆情况和PCB板的压合状态进行检测，提升了检测效率和精度。此外，本发明的自动化检测设备可以嵌入到液晶器件的流水生产线中，保留了原有的产品生产线。
The present invention relates to an automated detection device, comprising a support module (1), a detection platform module (2) supported on the support module (1), and a line scanning module (3) located on one side of the detection platform module (2), and further comprising: a PCB board positioning module (4) located above the line scanning module (3); a detection shaft (5) arranged in parallel with the PCB board positioning module; a silver glue detection module (6) slidably mounted on the detection shaft (5); and a PCB board detection module (7) slidably mounted on the detection shaft (5) in parallel with the silver glue detection module (6). The automated detection device of the present invention can simultaneously detect the number of conductive particles and the pressing device of the liquid crystal panel, the silver glue coating condition of the liquid crystal panel, and the pressing state of the PCB board, thereby improving the detection efficiency and accuracy. In addition, the automated detection device of the present invention can be embedded in the assembly line of liquid crystal devices, retaining the original product production line.
Description
Technical Field
The invention relates to the technical field of liquid crystal device detection, in particular to automatic detection equipment.
Background
Nowadays, the liquid crystal device is widely applied to the field of electronic products, with the increasing production requirements and the increasing progress of panel technologies of the liquid crystal device, the requirements on the defect detection technology of the liquid crystal panel are also higher and higher, and test items are also gradually increased, such as detection of the number of conductive particles and the lamination state of the ACF of the liquid crystal panel, detection of the silver colloid coating condition on the liquid crystal panel and detection of the lamination state of the PCB. For various test items, the prior art generally needs to test manually or by means of separate setting, and the problems of low detection efficiency and large detection error generally exist.
Disclosure of Invention
The invention aims to provide automatic detection equipment, which solves the problem that a plurality of test items cannot be performed simultaneously.
In order to achieve the above object, the present invention provides an automated inspection apparatus, including a support module, an inspection platform module supported on the support module, and a line sweep module located at one side of the inspection platform module, further including:
the PCB positioning module is positioned above the line scanning module;
The detection shaft is arranged in parallel with the PCB positioning module;
the silver colloid detection module is slidably arranged on the detection shaft;
And the PCB detection module and the silver colloid detection module are arranged on the detection shaft in a sliding manner.
According to one aspect of the invention, the PCB positioning module comprises a fixed plate, a PCB baffle fixedly connected to the fixed plate, and a connecting plate fixedly connected to the fixed plate in parallel with the PCB;
The lower side of PCB baffle is the plane, the connecting plate is located PCB baffle below, be equipped with PCB board top pressure cylinder on the connecting plate, the stroke of PCB board top pressure cylinder is along vertical direction.
According to one aspect of the invention, the PCB board detection module comprises a mounting plate, a first detection camera and a second detection camera which are fixedly mounted on the mounting plate, a first driving component for driving the mounting plate to move up and down along the vertical direction, and a second driving component for driving the mounting plate to move back and forth along the horizontal direction;
The first detection camera is a halation detection camera, and the second detection camera is an offset detection camera.
According to one aspect of the invention, the silver colloid detection module comprises an area array camera, a third driving component for driving the area array camera to move up and down along the vertical direction and a fourth driving component for driving the area array camera to move back and forth along the horizontal direction;
The device also comprises a laser height measuring part which is used for measuring the heights from the silver colloid detection module to the detection platform module and the PCB positioning module.
According to one aspect of the invention, the detection platform module comprises:
A gas supply device;
A rotary drive assembly supported on the air supply device;
the adsorption workbench is provided with an air passage communicated with the air supply device;
The rotary driving assembly drives the adsorption workbench to rotate in a horizontal plane.
According to one aspect of the invention, the detection platform module further comprises a panel primary positioning assembly, wherein the panel primary positioning assembly comprises a calibration driving assembly and a positioning plate fixedly connected with the calibration driving assembly.
According to one aspect of the invention, the wire sweep module comprises a wire sweep shaft, a detection camera slidingly mounted on the wire sweep shaft, and a power source for driving the detection camera to move;
the detection camera is used for detecting the number of conductive particles and the particle diameter of the liquid crystal panel on the detection platform module.
According to one aspect of the invention, the automated inspection device is an embedded device.
According to one aspect of the invention, the support module comprises a frame and a support plate disposed on the frame,
The line scanning module and the detection platform module are both arranged on the supporting plate.
According to one aspect of the invention, the support plate is a marble plate, and a damping device is arranged between the frame and the support plate.
According to one scheme of the invention, the automatic detection device has the functions of detecting ACF conductive particles of the liquid crystal panel, detecting silver colloid coating condition of the liquid crystal panel and detecting the pressing state of the PCB, and compared with the mode of singly detecting each test item manually or by means of equipment in the prior art, the automatic detection device can effectively improve detection efficiency and detection precision.
According to one aspect of the present invention, the automated inspection apparatus of the present invention is an embedded apparatus, i.e., the automated inspection apparatus of the present invention may be embedded in a liquid crystal device production line. Therefore, the automatic detection equipment provided by the invention has strong adaptability, can work under the condition of not influencing the production line of the liquid crystal device, and can further improve the overall production efficiency and reduce the cost.
According to the scheme of the invention, the PCB baffle is provided with the plurality of PCB jacking cylinders at the lower side, the lower side surface of the PCB baffle is a plane, so that the PCB can be placed between the lower side of the PCB baffle and the PCB jacking cylinders through the feeding and discharging mechanical arm, and then the PCB can be jacked on the lower side surface of the PCB baffle through the PCB jacking cylinders. Because most of the PCB is in a warping state, the PCB positioning module can press the PCB in the warping state on the lower side plane of the PCB baffle, and the problem of poor accuracy of the PCB detection result caused by the warping of the PCB is avoided.
According to one aspect of the invention, the support plate is a marble plate and the other components of the invention are disposed on or above the support plate of marble plate material. Therefore, the gravity center of the detection equipment can be effectively reduced, and the stability of the detection equipment is improved. In addition, a damping device is arranged between the frame and the supporting plate, so that the automatic detection equipment has certain anti-interference capability, and the working stability of the automatic detection equipment is guaranteed.
Drawings
Fig. 1 schematically shows an internal structural view of an automatic inspection apparatus according to the present invention;
FIG. 2 schematically illustrates a partial block diagram of an automated inspection apparatus according to the present invention;
fig. 3 is a perspective view schematically showing the external appearance of an automatic inspection apparatus according to the present invention;
Fig. 4 schematically shows a diagram one of an automated inspection apparatus embedded in a liquid crystal device automated production line according to the present invention;
FIG. 5 schematically illustrates a second view of an automated inspection apparatus embedded in a liquid crystal device automated manufacturing line in accordance with the present invention;
fig. 6 is a schematic view showing the structure of a PCB board positioning module according to the present invention;
fig. 7 is a schematic view showing the structure of a PCB board inspection module according to the present invention;
Fig. 8 is a schematic diagram showing the construction of a silver paste detection module according to the present invention;
FIG. 9 schematically shows a structural view of a detection platform module according to the present invention;
fig. 10 schematically shows a structural view of a wire sweep module according to the present invention.
The reference numerals in the drawings represent the following meanings:
1. The support module. 2. And the detection platform module. 3. And a line scanning module. 4. And the PCB positioning module. 5. And detecting the shaft. 6. And a silver colloid detection module. 7. And the PCB detection module. 41. And a fixing plate. 42. PCB baffle. 43. And (5) connecting a plate. 44. The PCB board pushes up the cylinder. 71. And (3) mounting a plate. 72. A first detection camera. 73. And a second detection camera. 74. A first drive assembly. 75. And a second drive assembly. 61. An area array camera. 62. And a third drive assembly. 63. And a fourth drive assembly. 21. And a rotary drive assembly. 22. And (5) an adsorption workbench. 23. And a panel primary positioning assembly. 231. Calibrating the driving assembly. 232. And (5) positioning the plate. 31. A line sweep axis. 32. And detecting a camera. 33. And a power source. 11. A frame. 12. A support plate.
Detailed Description
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings that are required to be used in the embodiments will be briefly described below. It is apparent that the drawings in the following description are only some embodiments of the present invention, and that other drawings may be obtained from these drawings without inventive effort for a person of ordinary skill in the art.
In describing embodiments of the present invention, the terms "longitudinal," "transverse," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like are used in terms of orientation or positional relationship shown in the drawings for convenience of description and simplicity of description only, and do not denote or imply that the devices or elements in question must have a particular orientation, be constructed and operated in a particular orientation, so that the above terms are not to be construed as limiting the invention.
The present invention will be described in detail below with reference to the drawings and the specific embodiments, which are not described in detail herein, but the embodiments of the present invention are not limited to the following embodiments.
As shown in fig. 1, 2 and 3 in combination, according to one embodiment of the present invention, the automated inspection apparatus of the present invention includes a support module 1, an inspection platform module 2, a wire sweep module 3, a PCB board positioning module 4, an inspection shaft 5, a silver paste inspection module 6 and a PCB board inspection module 7.
The support module 1 of the present invention is arranged at the lowest part and plays a supporting role. In the present embodiment, the support module 1 includes a frame 11 and a support plate 12, and the support plate 12 is provided on the frame 11. In this embodiment, the support plate 12 is a marble plate, and other components of the present invention are disposed on the support plate 12 of marble plate material or above the support plate 12. The support plate 12 is arranged on the frame 11, so that the gravity center of the detection device can be effectively reduced, and the stability of the detection device can be improved.
In addition, in the present embodiment, a damping device is further provided between the frame 11 and the support plate 12, so that the automatic detection apparatus of the present invention can be ensured to have a certain anti-interference capability, thereby being beneficial to ensuring the working stability of the automatic detection apparatus of the present invention.
In the invention, the detection platform module 2 and the line scanning module 3 are fixedly supported on the supporting module 1, specifically, the detection platform module 2 and the line scanning module 3 are fixed on the supporting plate 12, and the detection platform module 2 is used for supporting and positioning a liquid crystal panel to be detected. The line scanning module 3 is used for detecting ACF conductive particle number, conductive particle diameter and lamination state of the liquid crystal panel. According to one embodiment of the invention, the PCB positioning module 4 is arranged above the online scanning module 3 and is used for clamping and positioning the PCB. The detection shaft 5 and the PCB positioning module 4 are arranged in parallel, and the detection shaft 5 is positioned on one side of the PCB positioning module 4 and higher than the PCB positioning module 4. The silver colloid detection module 6 is slidably mounted on the detection shaft 5 and is used for detecting the silver colloid coating condition of the liquid crystal panel. The PCB detection module and the silver colloid detection module 6 are arranged on the detection shaft 5 in a sliding manner in parallel and are used for detecting the lamination state of the PCB.
The automatic detection device has the functions of detecting ACF conductive particles of the liquid crystal panel, detecting silver colloid coating conditions of the liquid crystal panel and detecting the pressing state of the PCB, and compared with the mode of single detection of each test item by manpower or by means of equipment in the prior art, the automatic detection device can effectively improve detection efficiency and detection precision.
As shown in fig. 4 and 5, the automatic inspection apparatus of the present invention is an embedded apparatus, that is, the automatic inspection apparatus of the present invention may be embedded in a liquid crystal device line. The dashed line in fig. 4 is a portion of the automated inspection apparatus of the present invention embedded in a liquid crystal device manufacturing line. According to the conception of the invention, the automatic detection equipment can be provided with an embedded structure which is suitable for production lines on different liquid crystal devices according to actual needs. Therefore, the automatic detection equipment provided by the invention has strong adaptability, can work under the condition of not influencing the production line of the liquid crystal device, and can further improve the overall production efficiency and reduce the cost.
The following describes the present invention in detail. As shown in fig. 6, the PCB board positioning module 4 of the present invention includes a fixing plate 41, a PCB baffle 42, and a connection plate 43 according to an embodiment of the present invention. As shown in fig. 2 and 6, in the present embodiment, the PCB positioning module 4 is located above the wire sweep module 3. Specifically, the wire sweep module 3 is fixedly supported on the support module 1, two support frames are fixedly installed on the support module 1, and the two support frames are arranged on two sides of the wire sweep module 3 and extend in the vertical direction. The two support frames are fixedly supported by a second support frame, the second support frame is horizontally arranged, and the fixing plate 41 of the PCB positioning module 4 is fixedly arranged on the second support frame in a bolt mode.
In the present invention, the fixing plate 41 is a flat plate, and its mounted state is disposed in the vertical direction. The PCB baffle 42 and the connection plate 43 are fixedly connected to the same side of the fixing plate 41. As shown in fig. 6, in the present embodiment, the PCB baffle 42 and the connection plate 43 are fixedly connected to the right side of the fixing plate 41. The connection plate 43 and the PCB baffle 42 are disposed parallel to each other, and the connection plate 43 is located in the direction of the PCB baffle 42. The connecting plate 43 is provided with a plurality of PCB jacking cylinders 44, in this embodiment, the PCB jacking cylinders 44 are provided, the plurality of PCB jacking cylinders 44 are arranged at equal intervals along the length direction of the connecting plate 43, and the travel of the PCB jacking cylinders 44 is along the vertical direction. Namely, a plurality of PCB jacking air cylinders 44 are arranged on the lower side of the PCB baffle 42, the lower side surface of the PCB baffle 42 is a plane, so that a PCB can be placed between the lower side of the PCB baffle and the PCB jacking air cylinders 44 through a feeding and discharging manipulator, and then the PCB can be jacked on the lower side surface of the PCB baffle 42 through the PCB jacking air cylinders 44. Because most of the PCBs are in a warping state, the PCB positioning module 4 can press the PCB in the warping state on the lower side plane of the PCB baffle 42, and the problem of poor accuracy of PCB detection results caused by the warping of the PCB is avoided.
As shown in fig. 2,6 and 7, the PCB board inspection module 7 of the present invention includes a mounting board 71, a first inspection camera 72 and a second inspection camera 73 fixedly installed on the mounting board 71, a first driving assembly 74 for driving the mounting board 71 to move up and down in a vertical direction, and a second driving assembly 75 for driving the mounting board 71 to move back and forth in a horizontal direction. According to one embodiment of the invention, the second drive assembly 73 is slidably supported on the detection shaft 5 and is movable in the direction of the detection shaft 5. The PCB board detection module 7 can adjust the positions of the first detection camera 72 and the second detection camera 73 through the first driving component 74 and the second driving component 75, so that the pressing state of the PCB is detected.
Specifically, in this embodiment, the first detection camera 72 is a halation detection camera, and is configured to capture a halation picture of the indentation of the PCB board, and then process and analyze the halation picture to determine the lamination condition of the PCB board in the vertical direction. The second detecting camera 73 is a deviation detecting camera, and is used for detecting a deviation picture of the indentation of the PCB board, and then processing and analyzing the deviation picture to determine the lamination condition of the PCB board in the horizontal direction.
As shown in fig. 2 and 8, the silver colloid detection module 6 of the present invention includes an area camera 61, a third driving assembly 62, and a fourth driving assembly 63. Wherein the area camera 61 is used for photographing the silver paste coating condition on the liquid crystal panel. The third driving assembly 62 is used for driving the area camera 61 to move up and down in the vertical direction, and the fourth driving assembly 63 is used for driving the area camera 61 to move back and forth in the horizontal direction.
The silver colloid detection module 6 of the invention also comprises a laser height measuring piece 64 for measuring the height from the silver colloid detection module 6 to the detection platform module 2 and the PCB positioning module 4. Because the liquid crystal panel is supported and positioned on the detection platform module 2, the PCB is positioned on the PCB positioning module 4, the laser height measuring piece 64 is used for measuring the heights of the panel and the PCB, and after the heights of the liquid crystal panel are measured, the heights are fed back to the third driving assembly 62 and the fourth driving assembly 63 so as to adjust the position of the area array camera 61, so that the shot image is clear, and the accuracy of the detection result is improved.
After the laser height measuring part 6 measures the height of the PCB, the measuring structure is fed back to the first driving assembly 72 in the PCB detection module 7, so that the first driving assembly 74 drives the first detection camera 72 and the second detection camera 73 to move in the vertical direction, and the height difference between the first detection camera 72 and the second detection camera 73 and the PCB is always within the depth of field. According to one embodiment of the invention, the depth of field is controlled to within 37 μm.
It should be noted that, the selection of the first driving assembly 74 and the second driving assembly 75 in the PCB board detection module 7 and the selection of the third driving assembly 62 and the fourth detection assembly 63 in the silver paste detection module 6 are not limited, and for example, a servo motor driving mode or a precise electric sliding table mode may be selected.
As shown in fig. 2 and 9, the inspection platform module 2 of the present invention includes an air supply device, a rotation driving assembly 21, and an adsorption table 22. In the present embodiment, the air supply device is provided on the support plate 12, and the rotating assembly 21 is supported on the air supply device. In the present embodiment, the rotation assembly 21 may employ a rotation driving motor. The suction table 22 is supported by a rotation unit 21, and the driving unit 21 can drive the suction table 22 to rotate in a horizontal plane. The adsorption table 22 is provided therein with a plurality of air passages communicating with the air supply means. The arrangement can generate adsorption force on the upper surface of the adsorption table 22, and fix the liquid crystal panel on the adsorption table 22.
In the present invention, the detection platform module 2 further includes a panel initial positioning assembly 23, and the panel initial positioning assembly 23 includes a calibration driving assembly 231 and a positioning plate 232 fixedly connected to the calibration driving assembly 231. The panel initial positioning assembly 23 is used for calibrating the initial position of the liquid crystal panel.
In addition, an adjusting screw is further arranged at the joint of the rotating assembly 21 and the adsorption platform 22 and used for leveling the adsorption platform 22, so that the detection precision is guaranteed.
As shown in fig. 2 and 10 in combination, the wire sweep module 3 of the present invention includes a wire sweep shaft 31, a detection camera 32 slidably mounted on the wire sweep shaft 31, and a power source 33 for driving the detection camera 32 to move. The inspection camera 32 is first used for coarse positioning inspection of the liquid crystal panel on the inspection stage module 2, and then used for inspecting the conductive particle count and particle diameter of the liquid crystal panel on the inspection stage module 2. Likewise, any power generating device may be used as the power source 33 of the wire sweep module 3.
Referring to fig. 1 to 10, the workflow of the automated inspection apparatus of the present invention is as follows:
Firstly, the automatic detection equipment is embedded into a liquid crystal device production line, and a liquid crystal panel is placed at a designated position of an adsorption plate 22 for positioning and clamping according to the early calibration of a panel initial positioning assembly 23 by feeding a manipulator of the liquid crystal device production line. And the PCB is fed by the manipulator, and is fixed by jacking by the PCB positioning module 4.
The line scanning module 3 then operates, and the detection camera 32 moves downstream along the line scanning axis 31 to perform coarse positioning detection of the liquid crystal panel, and outputs the alignment compensation coordinates and angles. Meanwhile, the silver colloid detection module 6 and the PCB detection module move to the downstream side along the detection shaft 5 to carry out laser height measurement and PCB deviation detection. And then the detection platform module 2 adjusts the Y axis and the theta axis of the adsorption platform 22 according to the compensation value output by the coarse positioning. The detection camera 32 then moves along the line sweep axis 31 back to the upstream side of the apparatus for panel COG, FOG particle detection. Meanwhile, the silver colloid detection module 6 and the PCB detection module return to move towards the upstream side to detect silver colloid and PCB indentation color corona. And finally outputting a detection result, and carrying out blanking sorting by a downstream manipulator of the liquid crystal device production line.
The above description is only one embodiment of the present invention, and is not intended to limit the present invention, but various modifications and variations can be made to the present invention by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (9)
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| CN201910990154.2A CN110737120B (en) | 2019-10-17 | 2019-10-17 | Automated testing equipment |
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| CN201910990154.2A CN110737120B (en) | 2019-10-17 | 2019-10-17 | Automated testing equipment |
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| CN110737120A CN110737120A (en) | 2020-01-31 |
| CN110737120B true CN110737120B (en) | 2025-06-13 |
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| CN204462583U (en) * | 2015-03-05 | 2015-07-08 | 昆山龙腾光电有限公司 | Liquid crystal panel test system |
| CN108614370A (en) * | 2018-07-26 | 2018-10-02 | 宁波舜宇仪器有限公司 | Liquid crystal panel detection device |
| CN210690985U (en) * | 2019-10-17 | 2020-06-05 | 宁波舜宇仪器有限公司 | Automatic change check out test set |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101772673B1 (en) * | 2017-05-13 | 2017-08-29 | 주식회사 에이피에스 | Multiple optics vision inspection system |
| CN107807134A (en) * | 2017-11-09 | 2018-03-16 | 上海御渡半导体科技有限公司 | A kind of electric testing agency of pcb board pressing degree |
| CN109084709B (en) * | 2018-10-15 | 2025-04-04 | 苏州精濑光电有限公司 | Automatic detection device |
| CN109814285A (en) * | 2019-01-11 | 2019-05-28 | 深圳市联得自动化装备股份有限公司 | Detect the apparatus and system of defects of display panel |
| CN110146028B (en) * | 2019-06-10 | 2024-07-26 | 苏州隆格尔精密自动化科技有限公司 | Silver colloid measuring equipment and measuring method |
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- 2019-10-17 CN CN201910990154.2A patent/CN110737120B/en active Active
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN204462583U (en) * | 2015-03-05 | 2015-07-08 | 昆山龙腾光电有限公司 | Liquid crystal panel test system |
| CN108614370A (en) * | 2018-07-26 | 2018-10-02 | 宁波舜宇仪器有限公司 | Liquid crystal panel detection device |
| CN210690985U (en) * | 2019-10-17 | 2020-06-05 | 宁波舜宇仪器有限公司 | Automatic change check out test set |
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