CN110514159A - The grading ring size and location of D.C. resistance divider determine method and device - Google Patents
The grading ring size and location of D.C. resistance divider determine method and device Download PDFInfo
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Abstract
The grading ring size and location that the present invention provides a kind of D.C. resistance divider determine method and device, wherein, this method comprises: based on the D.C. resistance divider limit element artificial module pre-established, first round orthogonal test is executed to emulate maximum field intensity around D.C. resistance divider, obtain the optimal inner ring radius size of the corresponding main grading ring of first round orthogonal test and the optimal inner ring radius size and location information of location information and auxiliary grading ring;Based on the simulation model and the corresponding optimal size of first round orthogonal test and location information, iteration orthogonal test is executed, corresponding optimal grading ring size i.e. position when obtaining that maximum field intensity meets predetermined threshold around emulation D.C. resistance divider;The D.C. resistance divider limit element artificial module includes main grading ring and auxiliary grading ring.Above-mentioned technical proposal improves the precision and efficiency that the grading ring size and location of D.C. resistance divider determine.
Description
Technical field
The present invention relates to technical field of ultrahigh voltage direct current, in particular to a kind of grading ring ruler of D.C. resistance divider
Very little and location determining method and device.
Background technique
In recent years, the HVDC transmission system of China 500kV or more is just in Fast Construction and development, direct current transportation
The voltage class of route is constantly promoted, and plays huge effect in the strong networking project in China region.With voltage class
It improves, the electric field distortion at certain positions is even more serious.Since certain end surface electric field strengths of D.C. resistance divider are higher,
Most probably occur corona discharge phenomenon in operation, then brings a systems such as corona loss, hot-spot, leakage current increase
Column malicious influences eventually lead to the accuracy of divider.And HVDC transmission line and D.C. resistance divider design
A big Important Economic technical indicator be corona loss, so the external insulation design of 500kV voltage levels direct current voltage transformer,
And if it is particularly critical to study the excessively high field strength of balance end surface.If do not taken measures around D.C. resistance divider
Even field distribution, then the electromagnetic environment problems such as corona loss, electric field distortion will occur in D.C. resistance divider.
The size of optimal settings grading ring and its position can utmostly reduce maximum field intensity and improve electric field
Aberration problems, but have following three problems for the size of grading ring at present: first, the size of most of selection grading ring at present
And its location method is to try to gather to verify with actual tests, specifically enumerates the size and its position data of several groups grading ring
And emulation testing is carried out, it is one group the smallest to select maximum field intensity in simulation result;Second, China is not directed to and presses at present
The size of ring and its unified standard of position and unified approach;Third, variation and the war of China's energy due to world energy sources environment
Slightly adjustment, the pressure of energy-saving and emission-reduction is increasing, the accuracy requirement of electrical energy measurement is being continuously improved, this inevitable requirement into
The measuring accuracy that one step improves high voltage direct current divider is horizontal.
In view of the above-mentioned problems, currently no effective solution has been proposed.
Summary of the invention
The embodiment of the invention provides a kind of grading ring size and location of D.C. resistance divider to determine method, to mention
The precision and efficiency that its position of the grading ring size of high D.C. resistance divider determines, this method comprises:
Based on the D.C. resistance divider limit element artificial module pre-established, it is straight to emulate to execute first round orthogonal test
Maximum field intensity around leakage resistance divider, the corresponding main grading ring of optimum test result after obtaining first round orthogonal test
Optimal inner ring radius size and optimal location information and the optimal inner ring radius size and optimal location of auxiliary grading ring letter
Breath;
Based on optimal after the D.C. resistance divider limit element artificial module and first round orthogonal test pre-established
The optimal inner ring radius size of the corresponding main grading ring of test result and the optimal inner ring of optimal location information and auxiliary grading ring
Radius size and optimal location information, execute iteration orthogonal test to emulate maximum field intensity around D.C. resistance divider,
Until obtain emulation D.C. resistance divider around maximum field intensity meet predetermined threshold when the corresponding master of test result it is equal
The inner ring radius size and location information of pressure ring and the inner ring radius size and location information of auxiliary grading ring, as direct current
Hinder grading ring optimal size and the position of divider;
Wherein, the D.C. resistance divider limit element artificial module includes main grading ring and auxiliary grading ring, main grading ring
Inner ring radius, the location information of the location information of main grading ring, the inner ring radius of auxiliary grading ring and auxiliary grading ring is test
Factor.
The embodiment of the invention also provides a kind of grading ring size and location determining device of D.C. resistance divider, to
Precision and efficiency that the grading ring size and location of D.C. resistance divider determine are improved, which includes:
First round optimal solution determination unit, for based on the D.C. resistance divider limit element artificial module pre-established,
First round orthogonal test is executed to emulate maximum field intensity around D.C. resistance divider, after obtaining first round orthogonal test
The optimal inner ring radius size and optimal location information of the corresponding main grading ring of optimum test result and auxiliary grading ring it is optimal
Inner ring radius size and optimal location information;
Optimal size and position determination unit, for based on the D.C. resistance divider finite element simulation mould pre-established
The optimal inner ring radius size of the corresponding main grading ring of optimum test result after type and first round orthogonal test and optimal position
The optimal inner ring radius size and optimal location information of confidence breath and auxiliary grading ring, it is straight to emulate to execute iteration orthogonal test
Maximum field intensity around leakage resistance divider, until obtain emulation D.C. resistance divider around maximum field intensity meet it is pre-
The inner ring radius size and location information of the corresponding main grading ring of test result when determining threshold value and the inner ring half of auxiliary grading ring
Diameter size and location information, as the grading ring optimal size of D.C. resistance divider and position;
Wherein, the D.C. resistance divider limit element artificial module includes main grading ring and auxiliary grading ring, main grading ring
Inner ring radius, the location information of the location information of main grading ring, the inner ring radius of auxiliary grading ring and auxiliary grading ring is test
Factor.
The embodiment of the invention also provides a kind of computer equipments, including memory, processor and storage are on a memory
And the computer program that can be run on a processor, the processor realize above-mentioned D.C. resistance when executing the computer program
The grading ring size and location of divider determine method.
The embodiment of the invention also provides a kind of computer readable storage medium, the computer-readable recording medium storage
There are the grading ring size and location for executing above-mentioned D.C. resistance divider to determine the computer program of method.
Technical solution provided in an embodiment of the present invention passes through: firstly, limited based on the D.C. resistance divider pre-established
First simulation model executes first round orthogonal test to emulate maximum field intensity around D.C. resistance divider, obtains the first round
The optimal inner ring radius size and optimal location information of the corresponding main grading ring of optimum test result after orthogonal test, Yi Jifu
The optimal inner ring radius size and optimal location information of grading ring;Secondly, limited based on the D.C. resistance divider pre-established
The optimal inner ring radius size of the corresponding main grading ring of optimum test result after first simulation model and first round orthogonal test
With the optimal inner ring radius size and optimal location information of optimal location information and auxiliary grading ring, iteration orthogonal test is executed
It is strong until obtaining maximum field around emulation D.C. resistance divider to emulate maximum field intensity around D.C. resistance divider
The inner ring radius size and location information of the corresponding main grading ring of test result when degree meets predetermined threshold and auxiliary grading ring
Inner ring radius size and location information realized simple as the grading ring optimal size of D.C. resistance divider and position
High-precision best grading ring size and location are quickly determined, to significantly reduce electric field strength and improve electric field distortion, most
Big degree corona loss, hot-spot, leakage current is avoided to increase.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
Some embodiments of invention for those of ordinary skill in the art without creative efforts, can be with
It obtains other drawings based on these drawings.
Fig. 1 is that the grading ring size and location of D.C. resistance divider in the embodiment of the present invention determine the process signal of method
Figure;
Fig. 2 is that the grading ring size and location of D.C. resistance divider in the embodiment of the present invention determine not installing for method
Divider surrounding electric field distribution schematic diagram when pressure ring;
Fig. 3 is that the grading ring size and location of D.C. resistance divider in the embodiment of the present invention determine that the first round of method changes
Schematic diagram is emulated for the optimum producting condition of orthogonal solving method;
Fig. 4 is that the grading ring size and location of D.C. resistance divider in the embodiment of the present invention determine that the first time of method changes
The optimum producting condition simulation result schematic diagram solved for orthogonal test;
Fig. 5 is the structural representation of the grading ring size and location determining device of D.C. resistance divider in the embodiment of the present invention
Figure.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that the described embodiment is only a part of the embodiment of the present invention, instead of all the embodiments.Based on this
Embodiment in invention, every other reality obtained by those of ordinary skill in the art without making creative efforts
Example is applied, shall fall within the protection scope of the present invention.
Fig. 1 is the flow diagram of the grading ring method for determining size of D.C. resistance divider in the embodiment of the present invention, such as
Shown in Fig. 1, the grading ring method for determining size of the D.C. resistance divider includes the following steps:
Step 101: based on the D.C. resistance divider limit element artificial module pre-established, executing first round orthogonal test
To emulate maximum field intensity around D.C. resistance divider, the optimum test result after obtaining first round orthogonal test is corresponding
The optimal inner ring radius size and optimal location information of main grading ring and the optimal inner ring radius size of auxiliary grading ring and optimal
Location information;
Step 102: based on the D.C. resistance divider limit element artificial module and first round orthogonal test pre-established
The optimal inner ring radius size and optimal location information of the corresponding main grading ring of optimum test result afterwards and auxiliary grading ring
Optimal inner ring radius size and optimal location information execute iteration orthogonal test to emulate maximum electricity around D.C. resistance divider
Field intensity, until obtaining test result correspondence when maximum field intensity meets predetermined threshold around emulation D.C. resistance divider
Main grading ring inner ring radius size and location information and auxiliary grading ring inner ring radius size and location information, as
The grading ring optimal size of D.C. resistance divider and position;
Its wherein, the D.C. resistance divider limit element artificial module includes main grading ring and auxiliary grading ring, and master presses
The inner ring radius of ring, the location information of main grading ring, the inner ring radius of auxiliary grading ring and the location information of auxiliary grading ring are examination
Test factor.
In one embodiment, the main grading ring and auxiliary grading ring are not overlapped with D.C. resistance divider ontology respectively.
With reference to the accompanying drawing 2 to Fig. 4, to the present embodiments relate to each step describe in detail.
One, the step of pre-establishing D.C. resistance divider limit element artificial module is introduced first.
In one embodiment, the location information of the main grading ring includes: distance of the main grading ring center of circle to symmetry axis,
And the main grading ring center of circle is to the distance on ground;The location information of the auxiliary grading ring includes: the auxiliary grading ring center of circle to symmetry axis
Distance and the auxiliary grading ring center of circle to ground distance.
When it is implemented, D.C. resistance divider limit element artificial module is established, the D.C. resistance divider finite element
Simulation model includes main grading ring and auxiliary grading ring, wherein the inner ring radius D of main grading ring, the location information of main grading ring is (
The pressure ring center of circle to symmetry axis distance E and the main grading ring center of circle to ground distance F), the inner ring radius A of auxiliary grading ring with
And location information (the distance in the distance B in the auxiliary grading ring center of circle to symmetry axis and the auxiliary grading ring center of circle to ground of auxiliary grading ring
It C) is experimental factor.
Two, above-mentioned steps 101 are then introduced.
In one embodiment, based on the D.C. resistance divider limit element artificial module pre-established, the first round is executed
Optimum test knot of the orthogonal test to emulate maximum field intensity around D.C. resistance divider, after obtaining first round orthogonal test
The optimal inner ring radius size and optimal location information of the corresponding main grading ring of fruit and the optimal inner ring radius ruler of auxiliary grading ring
Very little and optimal location information, comprising:
Based on the number and number of levels of D.C. resistance divider limit element artificial module experimental factor, determine that the first round is orthogonal
The orthogonal arrage of test number (TN);
Based on the orthogonal arrage, the test result after first round orthogonal test is analyzed using method of analysis of variance, is obtained
The optimal inner ring radius size and optimal location of the corresponding main grading ring of optimum test result after to first round orthogonal test are believed
The optimal inner ring radius size and optimal location information of breath and auxiliary grading ring.
When it is implemented, determining the orthogonal arrage L of first round orthogonal test number based on factor number and horizontal numbern(rm),
Method of analysis of variance is analyzed first round orthogonal experiments to find out first round orthogonal test optimal solution, and direct current is improved
Hinder precision and efficiency that the grading ring size and location of divider determine.
In one embodiment, the number of levels of the orthogonal arrage and the number of levels of experimental factor are consistent, the columns of orthogonal arrage
Not less than the number of experimental factor.
When it is implemented, execute first round orthogonal test to emulate maximum field intensity around D.C. resistance divider,
In, the objective function of first round orthogonal test is 6 experimental factor xiFunction (i=1,2 ... 6), y=f (x1,x2,…x6),
Wherein, x1∈(A1,A2,…,Ar), △ Q1=| A1-A2|,x2∈(B1,B2,…,Br), △ Q2=| B1-B2|, y is that the first round is orthogonal
Test result, if ybestFor the optimal result after first round orthogonal test, corresponding each factor (optimal inner ring of auxiliary grading ring half
Diameter A, the optimal distance B in the auxiliary grading ring center of circle to symmetry axis, the optimal distance C in the auxiliary grading ring center of circle to ground, main grading ring
The optimal distance F of optimal inner ring radius D, the optimal distance E in the main grading ring center of circle to symmetry axis and the main grading ring center of circle to ground)
Value are as follows: x1best,x2best,…x6best, r is the horizontal number of each factor, the level of i-th of factor of first round orthogonal test
Between difference be △ Qi, first round orthogonal test is analyzed using method of analysis of variance, judges that design variable (experimental factor) is right
Whether test influences significant to result, the best formation condition of first round orthogonal test (the optimal inner ring radius of auxiliary grading ring is found out
A, the auxiliary grading ring center of circle to the optimal distance B of symmetry axis, the optimal distance C in the auxiliary grading ring center of circle to ground, main grading ring most
The optimal distance F of excellent inner ring radius D, the optimal distance E in the main grading ring center of circle to symmetry axis and the main grading ring center of circle to ground),
I-th of horizontal effect α of calculating factor Ai,And so on calculate Bi、
Ci... FiEffect bi、ci... fi, horizontal AiWith BjCombination gross effect that test result is generated be denoted as joint effect
[ab]ij, [ab]ij=μij- μ, wherein μijIt is horizontal AiWith BjMean value under combination, μ are the grand mean of all horizontal combinations, water
Flat combination AiWith BjReciprocation influence that test result is generated be interaction be (ab)ij, (ab)ij=[ab]ij-ai-
bj, and so on obtain the interaction of other experimental factors, first round orthogonal test is obtained based on interaction and is most preferably generated
Condition.
Three, above-mentioned steps 102 are then introduced.
In one embodiment, based on the D.C. resistance divider limit element artificial module pre-established and the first round
The optimal inner ring radius size and optimal location information of the corresponding main grading ring of optimum test result after orthogonal test, Yi Jifu
The optimal inner ring radius size and optimal location information of grading ring execute iteration orthogonal test to emulate D.C. resistance divider week
Maximum field intensity is enclosed, until obtaining test when maximum field intensity meets predetermined threshold around emulation D.C. resistance divider
As a result the inner ring radius size and location information of corresponding main grading ring and the inner ring radius size of auxiliary grading ring and position letter
Breath, as the grading ring optimal size of D.C. resistance divider and position, comprising:
Based on the D.C. resistance divider limit element artificial module pre-established, the optimal inner ring radius size of main grading ring
With the optimal inner ring radius size and optimal location information of optimal location information and auxiliary grading ring, iteration orthogonal test is executed
To emulate maximum field intensity around D.C. resistance divider, the corresponding test result of more wheel orthogonal tests is obtained;
The test result is taken into opposite number, obtains the test result for taking opposite number;
Using method of analysis of variance, the test result for taking opposite number is analyzed, obtains emulation D.C. resistance partial pressure
The inner ring radius size of the corresponding main grading ring of test result when maximum field intensity meets predetermined threshold around device and position
The inner ring radius size and location information of information and auxiliary grading ring, the grading ring optimal size as D.C. resistance divider
And position.
When it is implemented, taking opposite number with maximizing test result, method of analysis of variance divides test result
Analysis improves precision and effect that the grading ring size and location of D.C. resistance divider determine to find out orthogonal test optimal solution
Rate.
In one embodiment, based on the D.C. resistance divider limit element artificial module pre-established and the first round
The optimal inner ring radius size and optimal location information of the corresponding main grading ring of optimum test result after orthogonal test, Yi Jifu
The optimal inner ring radius size and optimal location information of grading ring execute iteration orthogonal test to emulate D.C. resistance divider week
Maximum field intensity is enclosed, until obtaining test when maximum field intensity meets predetermined threshold around emulation D.C. resistance divider
As a result the inner ring radius size and location information of corresponding main grading ring and the inner ring radius size of auxiliary grading ring and position letter
Breath, as the grading ring optimal size of D.C. resistance divider and position, comprising:
Based on optimal after the D.C. resistance divider limit element artificial module and first round orthogonal test pre-established
The optimal inner ring radius size of the corresponding main grading ring of test result and the optimal inner ring of optimal location information and auxiliary grading ring
Radius size and optimal location information, at least iteration orthogonal test is maximum electric around D.C. resistance divider to emulate three times for execution
Field intensity is less than in advance until obtaining the difference between last wheel and the maximum field intensity of wheel orthogonal test emulation second from the bottom
The inner ring radius size and location information of the corresponding main grading ring of test result when determining range and the inner ring half of auxiliary grading ring
Diameter size and location information, as the grading ring optimal size of D.C. resistance divider and position.
When it is implemented, 3 iteration orthogonal tests are at least carried out, so that last wheel and wheel orthogonal test second from the bottom are imitative
Genuine maximum field strength difference is less than preset range, improves the grading ring size and location determination of D.C. resistance divider
Precision and efficiency.
When it is implemented, executing iteration orthogonal test based on the best formation condition of first round orthogonal test to emulate direct current
Maximum field intensity around divider is hindered, maximum field intensity meets predetermined threshold around the emulation D.C. resistance divider
Value, the inner ring radius A of the auxiliary grading ring of experimental factor at this time, the distance B in the auxiliary grading ring center of circle to symmetry axis, the auxiliary grading ring center of circle
It is arrived to the distance C on ground, the inner ring radius D of main grading ring, the distance E in the main grading ring center of circle to symmetry axis and the main grading ring center of circle
The distance F on ground is optimal size and its position, wherein the objective function of iteration are as follows: y '=f (x '1,x′2,…x′n), wherein
x′1∈(A′1,A′2,…,A′r), △ Q '1=| A '1-A′2|,x′2∈(B′1,B′2,…,B′r), △ Q '2=| B '1-B′2|,| ε | < △ Q 'i, △ Q 'iFor the iteration step length of iteration orthogonal test, i.e. i-th of a new round
Difference between the level of factor, △ Q 'i=μ △ Qi(μ≤1), wherein μ is iteration coefficient, and ε is deviation ratio.
When it is implemented, for a further understanding of the present invention, in one embodiment, as shown in Fig. 2, the present invention is used for
Around 500kV D.C. resistance standard voltage divider in the solution of grading ring optimum size and installation site.If 500kV D.C. resistance mark
Grading ring is not installed, then maximum field intensity is 4212.5V/mm around it around quasi- divider.Ensure maximum around divider
Electric field strength is as low as possible, thus around divider maximum field intensity size, it is the smaller the better.ANSYS of the Fig. 2 into Fig. 4
It represents ANSYS software: being large-scale general finite element analysis (FEA) software that ANSYS company, the U.S. develops.
When it is implemented, main and auxiliary two grading rings of installation can be effectively reduced around 500kV D.C. resistance standard voltage divider
Maximum field intensity, guarantee the accuracy of voltage divider.And the size of main and auxiliary grading ring and the difference of installation site, it is right
The reduction degree of maximum field intensity influences very big around divider.Therefore present embodiment includes 6 design variables, i.e.,
6 factors, specifically include: the inner ring radius A of auxiliary grading ring, the distance B in the auxiliary grading ring center of circle to symmetry axis, the auxiliary grading ring center of circle
It is arrived to the distance C on ground, the inner ring radius D of main grading ring, the distance E in the main grading ring center of circle to symmetry axis, the main grading ring center of circle
The distance F on ground.Due to using etc. repeat the calculating of test to repeat test simpler, convenient compared to not equal, and repetitions is waited to try
It tests higher compared to not equal test accuracy that repeats, so present case uses etc. and to repeat to test, therefore has taken 3 to each experimental factor
The differences such as a, i.e., three levels, i.e. r=3, the value of each variable are respectively Ai、Bi、Ci、Di、Ei、Fi, then i in the present embodiment
Value is 1~r, as shown in table 1 below.It is △ Q that the first round, which tests the difference that each level takes every time, is respectively as follows:
△QA=| A1-A2|=| 280-290 |=10;
△QB=| B1-B2|=| 850-860 |=10;
△QC=| C1-C2|=| 3560-3580 |=20;
△QD=| D1-D2|=| 130-140 |=10;
△QE=| E1-E2|=| 550-560 |=10;
△QF=| F1-F2|=| 4000-4100 |=100;
Specific value is as shown in table 1.
1 first round of table iteration-each variable of orthogonal test value
When it is implemented, selecting satisfactory orthogonal arrage and carrying out gauge outfit design, the embodiment of the present invention is six factors three
Hydraulic test needs to complete 3 if doing total factor test6=729 tests carry out scientific design using orthogonal arrage now and test, can
To efficiently reduce test number (TN).Orthogonal arrage Ln(rm) selection mainly determined by factor number and horizontal number, the principle of selection
Consistent with the number of levels of factor for the number of levels r of orthogonal arrage, the columns of orthogonal arrage cannot be less than the number of factor [9].Due to this
In inventive embodiments, each design variable not only individually has an impact test result, but also may connect each other, restrict, from
And test result generation is acted on, therefore present case needs to consider the interaction between design variable.Present case investigates 3 groups of interactions
Effect, so being best suitable in the three horizontal quadrature tables selected and being required of L27(313), i.e. n=27, r=3, m=9, so choosing
Select L27(313) orthogonal arrage experiment arrangement, wherein m be experimental factor number, n be orthogonal arrage in element number.Provide each variable
Influence each other effect table, and arranges to test, and selects the strong calculating side of a few representative by certain rule in numerous design conditions
Case determines that each variable influences each other effect table, wherein influence each other between variables A and B influence each other between A × B, variables A and C for
It is influenced each other between A × C, variable B and C as B × C, including error comparison column.
Design experiment scheme table simultaneously is completed to test, and this example arranges factor A and factor B to arrange in the 1st column of orthogonal arrage and the 2nd,
So interaction of factor A and factor B is denoted as A × B, A × B be arranged in the 1st column and the 2nd column row, column crosspoint " 3 " and
On " 4 ", then other factors cannot be arranged on the 3rd column and the 4th column, therefore factor C is arranged in the 5th column, then interaction A
× C should be arranged on the row, column crosspoint " 6 " and " 7 " of the 1st column and the 5th column, and interaction B × C should be arranged in the 2nd column
On the row, column crosspoint " 8 " and " 11 " of the 5th column, it is so far occupied in orthogonal arrage be classified as the 1st, the 2nd, the 3rd, the 4th,
5th, the 6th, the 7th, the 8th and the 11st arrange, and the blank column of at least 1 column should be arranged in orthogonal arrage, to analytical error to examination
The influence situation of result is tested, arranges the 10th to be classified as blank column in present case, factor D, factor E, factor F is arranged in respectively
9th column, the 11st column, the 12nd column.Traditional enumerative technique needs to do 36=729 l-G simulation tests are tested by this form scientific arrangement, can
Simulation times are decreased to 27 times, i.e. test number (TN) m=27.It completes to test in strict accordance with test arrangement table, table L27(313) it is every
A line has all determined a testing program, completes 27 tests according to table, logging is entered in table.
When it is implemented, poor analytic approach development test as a result, since this example needs to find minimum value, that is, is determined and optimal is pressed
Ring size and position reduce maximum field intensity around divider, analyze for convenience, test result is taken opposite number, become
For maximizing.Experimental result is analyzed using method of analysis of variance, it is aobvious to judge that design variable is influenced on test on result
Whether work, epicycle test optimal solution is found out.Following values: K is calculated firstij、Sj、ST、
Wherein, KijFor upper i-th horizontal calculated result summation of jth column;For sum-total average, wherein t is jth column
The number that upper variable i occurs;SjFor the sum of square of deviations of jth column factor;Interactive sum of square of deviations is equal to corresponding two
The sum of sum of square of deviations of column;STFor the square sum of total departure for calculating test result, wherein T is the summation of all test results,
It is the average value of all test result summations;For it is each side and.
Calculate ST、Sj、SA×BFreedom degree, freedom degree is respectively fT、fjAnd fA×B, fT=n-1, fj=r-1, fA×B=fA×
fB=(r-1) (r-1).
In order to parse orthogonal experiments with method of analysis of variance, need to construct test statistics:
Wherein, SeFor error sum of squares, that is, the sum of square of deviations for all blank columns of summing,
feIt is error sum of squares SeFreedom degree.
fe=fTThe sum of the freedom degree of each column (each factor and each reciprocation),
Point following two situation is needed when constructing test statistics:
Situation one: if respectively arrangeThe step of after then continuing directly to;
Situation two: if respectively arrangeThe influence of specification error column may be bigger than the influence of certain column, then needs
The S that these are arrangedjAdd up and and SeSummation remembers that symbol is as new error sum of squaresThe freedom degree of these column is also wanted
Phase adduction and feSummation, as new error column freedom degree, note symbol is fe σ.The new test statistics constructed at this time is following formula.
If Fj σ≥F1-α(fj,fe σ), it is believed that the shadow of the factors on test result
It rings than more significant, otherwise it is believed that the influence of the factors on test result is less significant.Test result of embodiment of the present invention yiAnd
Calculate resulting T, Kij、Sj、Se、fe、Deng insert table in, as a result retain a decimal.
Calculate each Fj, list that variance analysis is as shown in table 2, and poor F distribution table is faced with a F value with the F distribution table checked in
Dividing value each variable compared to known to influences the significance degree of result, if Fj σ≥F1-α(fj,fe σ), then it is assumed that the factors on test knot
Fruit has a significant impact, and conspicuousness is strong to be indicated with No. *.
2 first round of table iteration-orthogonal test analysis of variance table
In order to find optimum producting condition, need to introduce the effect of each level.I-th of horizontal effect of factor A is calculated first
It answers, i.e. AiEffect αi, αiCalculation formula beWherein T is the synthesis of all test results,Similarly, B is definedi、Ci... FiEffect bi、ci... fi.Define horizontal AiWith BjCombination to test result produce
Raw gross effect is joint effect, and symbol is denoted as [ab]ij, [ab]ij=μij- μ, wherein μijIt is horizontal AiWith BjIt is equal under combination
Value, μ are the grand mean of all horizontal combinations, horizontal combination AiWith BjReciprocation influence that test result is generated be interaction
Effect is (ab)ij, (ab)ij=[ab]ij-ai-bj。
When selecting best formation condition, it should following principle is generally conformed to, by taking factor A, factor B, factor A × B as an example:
(1) it if factor A, factor B, factor A × B have a significant impact experimental result, should be arranged with two-element list
[ab] outij、αiAnd bi, select [ab]ijIn the maximum [18];
(2) if factor A, factor A × B have a significant impact experimental result, influence of the factor B to experimental result is less aobvious
It writes, then should be listed with two-element list (ab)ij、αiAnd bi, select interaction (ab)ijWith effect αiIn the maximum [19].
In the embodiment of the present invention, factor A, factor C and reciprocation A × B, reciprocation B × C influence test result aobvious
It writes, the influence of factor B and factor A × C to test result is less significant, so interaction (ab) should be selectedijWith effect αi
In the maximum, interaction (bc)ijWith effect ciIn the maximum.Calculate two-element list such as 3 institute of table of income factor A, factor B
Show, interaction table is as shown in table 4 between factor A, factor B.
3 first round of table iteration-orthogonal test factor A and factor B two-element list
4 first round of table iteration-interaction table between orthogonal test factor A and factor B
It can be seen that αiIn maximum value be α3=8.8, followed by α2=7.6, reciprocation (ab)ijMaximum value be A1B1=
19.5, it is secondly A2B3=9.6, A3B2=7.2, so factor A should take A3, with A3The maximum reciprocation of collocation is A3B2=
7.2, therefore factor B takes B2。
It is as shown in table 5 to calculate income factor A, the two-element list of factor C, joint effect table such as 6 institute of table between factor A, factor C
Show.
Effects visible αiMaximum value be α3=8.8, benefit ciMaximum value be c3=13.2, synergy [ac]ijMost
Big value is A3C3=21.0, so factor C should take horizontal C3。
It is other to influence significant factor, including factor D, factor F, the i.e. each K of optimal value is taken respectivelyijIt is maximized, passes through
Comparison, which obtains factor D, should take horizontal D3, factor F should take horizontal F2。
5 first round of table iteration-orthogonal test factor A and factor C two-element list
6 first round of table iteration-joint effect table between orthogonal test factor A and factor C
Factor E can be combined since the influence to test result is not significant by doing three groups of tests again
A3B2C3D3ExF2.When x takes 1,2,3 respectively, obtained test result be respectively 827.756mm/V, 836.132mm/V,
831.318mm/V.Therefore, the optimum producting condition of this test is A3B2C3D3E1F2, ANSYS emulation experiment is done under this condition
As a result as shown in Figure 3.
Sometimes an orthogonal test cannot fully meet engine request, and possible maximum field intensity, which has been still greater than, has stage fright
By force, it is possible to using orthogonal test-iterative method near the optimum producting condition that a upper section acquires iteration, more subtly divide
Factor level, iteration is until meeting engine request.
In present case, iteration is in test combinations A3B2C3D3E1F2Lower progress, wherein A3=300mm, B2=860mm, C3=
3600mm, D3=150mm, E1=550mm, F2=4100mm.The difference of second wheel each factor level of orthogonal test is denoted as △ Q 'A、
△Q′B、△Q′C、△Q′D、△Q′E、△Q′F, it takes respectively:
△Q′A=| A '1-A′2|=| 294-299 |=5;
△Q′B=| B '1-B′2|=| 854-859 |=5;
△Q′C=| C '1-C′2|=| 3590-3601 |=11;
△Q′D=| D '1-D′2|=| 146-151 |=5;
△Q′E=| E '1-E′2|=| 546-551 |=5;
△Q′F=| F '1-F′2|=| 4060-4110 |=50.
Each horizontal specific value of second wheel iteration is as shown in table 7.It calculates with first round orthogonal test, obtains analysis of variance table
8。
In the embodiment of the present invention, since factor C ' and reciprocation B ' × C ' influences significantly test result, factor B ' is right
The influence of test result is not significant, so interaction (bc) should be selectedij', effect cj' in the maximum.Calculate gained because
Plain B ', the two-element list of factor C ' are as shown in table 9, and joint effect table is as shown in table 10 between factor B ', factor C '.
The value of the wheel each variable of iteration of table 7 second
Table 8 second takes turns iteration-orthogonal test analysis of variance table
The two-element list of table 9 factor B ' and factor C '
Interaction table between table 10 factor B ' and factor C '
It can be seen that CiIn maximum value be C1'=2.9, followed by C2'=- 1.3, horizontal C1' lower reciprocation [bc]ij' most
Big value is [bc]31Secondly '=6.2 are [bc]32'=3.6, so factor B' should take B3', factor C' should take C1'。
It is other to influence significant factor, including factor A', factor F ', the i.e. each K of optimal value is taken respectivelyij' be maximized, it passes through
It crosses and compares, factor A', factor F ' horizontal A should be taken respectively3'、F3'。
Influence due to factor D' and factor E' to test result is not significant, can be by doing nine groups of tests again, i.e.,
Combine A3'B3'C1'D3'E2'F1'.When x, y distinguish permutation and combination level 1,2,3, obtained optimum test result is
820.719mm/V, factor D' and E' pairs of factor of optimal level group are combined into D3'E2'.Therefore, the optimum producting condition of this test
For A3'B3'C1'D3'E2'F1', it is as shown in Figure 4 that ANSYS the simulation experiment result is done under this condition.
Second wheel iteration-orthogonal experiments of analysis are it can be found that this time test result is generally speaking more orthogonal than the first round
The experimental result of test method(s) is more excellent, falls below 820.719mm/V by the maximum field intensity around divider after this iteration,
A possibility that corona discharge occurs becomes smaller, and divider accuracy of measurement will be promoted.
Iteration-orthogonal experiment of the invention can be accurately obtained the size of grading ring around D.C. resistance standard voltage divider
It has selected experimental factor, interaction factor after specifying test objective and test index with installation site information and has selected orthogonal
Table L27(313), test is completed then according to the testing program of design, with method of analysis of variance development test as a result, passing through the first round
Iteration-orthogonal test has obtained one group of optimal combination scheme, declines maximum field intensity around divider from 4212.5V/mm
To 827.756V/mm, second of iterative test is carried out near this group of optimal combination scheme, keeps maximum field around divider strong
Degree has decreased to 820.719V/mm from 827.756V/mm again.The comparative analysis first round and second wheel iteration-orthogonal experiments
It can be found that this time experimental result of the test result generally speaking than simple orthogonal experiment is more excellent, pass through after this iteration points
A possibility that maximum field intensity around depressor falls below 820.719mm/V, and corona discharge occurs becomes smaller, and divider measurement is quasi-
Exactness will be promoted.This time test, which demonstrates iteration-orthogonal experiment proposed in this paper, to effectively reduce 500kV direct current
While hindering initial electric field intensity around standard voltage divider, the Search Range of grading ring installation site and dimensional parameters is quickly determined
And direction, test number (TN) and the number of iterations are effectively reduced, production efficiency is improved, iteration-orthogonal experiment overcomes commonly
Orthogonal test can only use the problem of directed variation operator, the generation that can only evolve, and both ensure that analyzing influence test result factor
While, it also can satisfy engineering demand, the departments such as can design, manufacture, run for divider has preferable reference function.This
Invention can be applied not only to solve around 500kV D.C. resistance standard voltage divider in the size and installation site information of grading ring,
Can also be applied to other voltage class divider grading ring design, be particularly suitable for electrical engineering field test number (TN) it is more,
Search Range it is wide take optimal value problem.The algorithm, which embodies, electrically to intersect and merges with mathematical statistics field.
Based on the same inventive concept, a kind of grading ring size of D.C. resistance divider is additionally provided in the embodiment of the present invention
And position determining means, as described in the following examples.Since the grading ring size and location of D.C. resistance divider determine dress
The grading ring size and location for setting the principle and D.C. resistance divider solved the problems, such as determine that method is similar, therefore D.C. resistance point
The implementation of the grading ring size and location determining device of depressor may refer to the grading ring size and location of D.C. resistance divider
Determine the implementation of method, overlaps will not be repeated.Used below, term " unit " or " module " may be implemented to make a reservation for
The combination of the software and/or hardware of function.It is hard although device described in following embodiment is preferably realized with software
The realization of the combination of part or software and hardware is also that may and be contemplated.
Fig. 5 is the structural representation of the grading ring size and location determining device of D.C. resistance divider in the embodiment of the present invention
Figure, as shown in figure 5, the device includes:
First round optimal solution determination unit 01, for based on the D.C. resistance divider finite element simulation mould pre-established
Type executes first round orthogonal test to emulate maximum field intensity around D.C. resistance divider, obtains first round orthogonal test
The optimal inner ring radius size and optimal location information of the corresponding main grading ring of optimum test result afterwards and auxiliary grading ring
Optimal inner ring radius size and optimal location information;
Optimal size and position determination unit 02, for based on the D.C. resistance divider finite element simulation mould pre-established
The optimal inner ring radius size of the corresponding main grading ring of optimum test result after type and first round orthogonal test and optimal position
The optimal inner ring radius size and optimal location information of confidence breath and auxiliary grading ring, it is straight to emulate to execute iteration orthogonal test
Maximum field intensity around leakage resistance divider, until obtain emulation D.C. resistance divider around maximum field intensity meet it is pre-
The inner ring radius size and location information of the corresponding main grading ring of test result when determining threshold value and the inner ring half of auxiliary grading ring
Diameter size and location information, as the grading ring optimal size of D.C. resistance divider and position;
Wherein, the D.C. resistance divider limit element artificial module includes main grading ring and auxiliary grading ring, main grading ring
Inner ring radius, the location information of the location information of main grading ring, the inner ring radius of auxiliary grading ring and auxiliary grading ring is test
Factor.
In one embodiment, the location information of the main grading ring includes: distance of the main grading ring center of circle to symmetry axis,
And the main grading ring center of circle is to the distance on ground;The location information of the auxiliary grading ring includes: the auxiliary grading ring center of circle to symmetry axis
Distance and the auxiliary grading ring center of circle to ground distance.
In one embodiment, the main grading ring and auxiliary grading ring are not overlapped with D.C. resistance divider ontology respectively.
In one embodiment, the first round optimal solution determination unit specifically can be used for:
Based on the number and number of levels of D.C. resistance divider limit element artificial module experimental factor, determine that the first round is orthogonal
The orthogonal arrage of test number (TN);
Based on the orthogonal arrage, the test result after first round orthogonal test is analyzed using method of analysis of variance, is obtained
The optimal inner ring radius size and optimal location of the corresponding main grading ring of optimum test result after to first round orthogonal test are believed
The optimal inner ring radius size and optimal location information of breath and auxiliary grading ring.
In one embodiment, the number of levels of the orthogonal arrage and the number of levels of experimental factor are consistent, the columns of orthogonal arrage
Not less than the number of experimental factor.
In one embodiment, optimal size and position determination unit specifically can be used for:
Based on the D.C. resistance divider limit element artificial module pre-established, the optimal inner ring radius size of main grading ring
With the optimal inner ring radius size and optimal location information of optimal location information and auxiliary grading ring, iteration orthogonal test is executed
To emulate maximum field intensity around D.C. resistance divider, the corresponding test result of more wheel orthogonal tests is obtained;
The test result is taken into opposite number, obtains the test result for taking opposite number;
Using method of analysis of variance, the test result for taking opposite number is analyzed, obtains emulation D.C. resistance partial pressure
The inner ring radius size of the corresponding main grading ring of test result when maximum field intensity meets predetermined threshold around device and position
The inner ring radius size and location information of information and auxiliary grading ring, the grading ring optimal size as D.C. resistance divider
And position.
In one embodiment, optimal size and position determination unit specifically can be used for:
Based on optimal after the D.C. resistance divider limit element artificial module and first round orthogonal test pre-established
The optimal inner ring radius size of the corresponding main grading ring of test result and the optimal inner ring of optimal location information and auxiliary grading ring
Radius size and optimal location information, at least iteration orthogonal test is maximum electric around D.C. resistance divider to emulate three times for execution
Field intensity is less than in advance until obtaining the difference between last wheel and the maximum field intensity of wheel orthogonal test emulation second from the bottom
The inner ring radius size and location information of the corresponding main grading ring of test result when determining range and the inner ring half of auxiliary grading ring
Diameter size and location information, as the grading ring optimal size of D.C. resistance divider and position.
The embodiment of the invention also provides a kind of computer equipments, including memory, processor and storage are on a memory
And the computer program that can be run on a processor, the processor realize above-mentioned D.C. resistance when executing the computer program
The grading ring size and location of divider determine method.
The embodiment of the invention also provides a kind of computer readable storage medium, the computer-readable recording medium storage
There are the grading ring size and location for executing above-mentioned D.C. resistance divider to determine the computer program of method.
The embodiment of the present invention provides the advantageous effects that reach of technical solution: realize quickly and easily determine it is high-precision
The best grading ring size and location of degree farthest avoid electricity to significantly reduce electric field strength and improve electric field distortion
Dizzy loss, hot-spot, leakage current increase.
It should be understood by those skilled in the art that, the embodiment of the present invention can provide as method, system or computer program
Product.Therefore, complete hardware embodiment, complete software embodiment or reality combining software and hardware aspects can be used in the present invention
Apply the form of example.Moreover, it wherein includes the computer of computer usable program code that the present invention, which can be used in one or more,
The computer program implemented in usable storage medium (including but not limited to magnetic disk storage, CD-ROM, optical memory etc.) produces
The form of product.
The present invention be referring to according to the method for the embodiment of the present invention, the process of equipment (system) and computer program product
Figure and/or block diagram describe.It should be understood that every one stream in flowchart and/or the block diagram can be realized by computer program instructions
The combination of process and/or box in journey and/or box and flowchart and/or the block diagram.It can provide these computer programs
Instruct the processor of general purpose computer, special purpose computer, Embedded Processor or other programmable data processing devices to produce
A raw machine, so that being generated by the instruction that computer or the processor of other programmable data processing devices execute for real
The device for the function of being specified in present one or more flows of the flowchart and/or one or more blocks of the block diagram.
These computer program instructions, which may also be stored in, is able to guide computer or other programmable data processing devices with spy
Determine in the computer-readable memory that mode works, so that it includes referring to that instruction stored in the computer readable memory, which generates,
Enable the manufacture of device, the command device realize in one box of one or more flows of the flowchart and/or block diagram or
The function of being specified in multiple boxes.
These computer program instructions also can be loaded onto a computer or other programmable data processing device, so that counting
Series of operation steps are executed on calculation machine or other programmable devices to generate computer implemented processing, thus in computer or
The instruction executed on other programmable devices is provided for realizing in one or more flows of the flowchart and/or block diagram one
The step of function of being specified in a box or multiple boxes.
The foregoing is only a preferred embodiment of the present invention, is not intended to restrict the invention, for the skill of this field
For art personnel, the embodiment of the present invention can have various modifications and variations.All within the spirits and principles of the present invention, made
Any modification, equivalent substitution, improvement and etc. should all be included in the protection scope of the present invention.
Claims (10)
1. a kind of grading ring size and location of D.C. resistance divider determine method characterized by comprising
Based on the D.C. resistance divider limit element artificial module pre-established, first round orthogonal test is executed to emulate direct current
Maximum field intensity around divider is hindered, the corresponding main grading ring of optimum test result after obtaining first round orthogonal test is most
The optimal inner ring radius size and optimal location information of excellent inner ring radius size and optimal location information and auxiliary grading ring;
Based on the optimum test after the D.C. resistance divider limit element artificial module and first round orthogonal test pre-established
As a result the optimal inner ring radius size and optimal location information of corresponding main grading ring and the optimal inner ring radius of auxiliary grading ring
Size and optimal location information, execute iteration orthogonal test to emulate maximum field intensity around D.C. resistance divider, until
Obtain the corresponding main grading ring of test result when maximum field intensity around emulation D.C. resistance divider meets predetermined threshold
Inner ring radius size and location information and auxiliary grading ring inner ring radius size and location information, as D.C. resistance point
The grading ring optimal size of depressor and position;
Wherein, the D.C. resistance divider limit element artificial module includes main grading ring and auxiliary grading ring, main grading ring it is interior
Ring radius, the location information of main grading ring, the inner ring radius of auxiliary grading ring and the location information of auxiliary grading ring are experimental factor.
2. the grading ring size and location of D.C. resistance divider as described in claim 1 determine method, which is characterized in that institute
The location information for stating main grading ring includes: distance and the main grading ring center of circle to ground of the main grading ring center of circle to symmetry axis
Distance;The location information of the auxiliary grading ring includes: that the auxiliary grading ring center of circle is arrived to the distance of symmetry axis and the auxiliary grading ring center of circle
The distance on ground.
3. the grading ring size and location of D.C. resistance divider as described in claim 1 determine method, which is characterized in that institute
Main grading ring and auxiliary grading ring is stated not to be overlapped with D.C. resistance divider ontology respectively.
4. the grading ring size and location of D.C. resistance divider as described in claim 1 determine method, which is characterized in that base
In the D.C. resistance divider limit element artificial module pre-established, first round orthogonal test is executed to emulate D.C. resistance partial pressure
Maximum field intensity around device, the optimal inner ring of the corresponding main grading ring of optimum test result after obtaining first round orthogonal test
The optimal inner ring radius size and optimal location information of radius size and optimal location information and auxiliary grading ring, comprising:
Based on the number and number of levels of D.C. resistance divider limit element artificial module experimental factor, first round orthogonal test is determined
The orthogonal arrage of number;
Based on the orthogonal arrage, the test result after first round orthogonal test is analyzed using method of analysis of variance, obtains
The optimal inner ring radius size and optimal location information of the corresponding main grading ring of optimum test result after one wheel orthogonal test, with
And the optimal inner ring radius size and optimal location information of auxiliary grading ring.
5. the grading ring size and location of D.C. resistance divider as claimed in claim 4 determine method, which is characterized in that institute
The number of levels for stating orthogonal arrage is consistent with the number of levels of experimental factor, and the columns of orthogonal arrage is not less than the number of experimental factor.
6. the grading ring size and location of D.C. resistance divider as described in claim 1 determine method, which is characterized in that base
Optimum test result pair after the D.C. resistance divider limit element artificial module and first round orthogonal test pre-established
The optimal inner ring radius size of the optimal inner ring radius size and optimal location information of the main grading ring answered and auxiliary grading ring and
Optimal location information executes iteration orthogonal test to emulate maximum field intensity around D.C. resistance divider, until being imitated
The inner ring of the corresponding main grading ring of test result when maximum field intensity meets predetermined threshold around true D.C. resistance divider
The inner ring radius size and location information of radius size and location information and auxiliary grading ring, as D.C. resistance divider
Grading ring optimal size and position, comprising:
Based on the D.C. resistance divider limit element artificial module pre-established, the optimal inner ring radius size of main grading ring and most
The optimal inner ring radius size and optimal location information of excellent location information and auxiliary grading ring execute iteration orthogonal test with imitative
Maximum field intensity around true D.C. resistance divider obtains the corresponding test result of more wheel orthogonal tests;
The test result is taken into opposite number, obtains the test result for taking opposite number;
Using method of analysis of variance, the test result for taking opposite number is analyzed, obtains emulation D.C. resistance divider week
The inner ring radius size and location information of the corresponding main grading ring of test result when maximum field intensity meets predetermined threshold are enclosed,
And the inner ring radius size and location information of auxiliary grading ring, as the grading ring optimal size of D.C. resistance divider and position
It sets.
7. the grading ring size and location of D.C. resistance divider as described in claim 1 determine method, which is characterized in that base
Optimum test result pair after the D.C. resistance divider limit element artificial module and first round orthogonal test pre-established
The optimal inner ring radius size of the optimal inner ring radius size and optimal location information of the main grading ring answered and auxiliary grading ring and
Optimal location information executes iteration orthogonal test to emulate maximum field intensity around D.C. resistance divider, until being imitated
The inner ring of the corresponding main grading ring of test result when maximum field intensity meets predetermined threshold around true D.C. resistance divider
The inner ring radius size and location information of radius size and location information and auxiliary grading ring, as D.C. resistance divider
Grading ring optimal size and position, comprising:
Based on the optimum test after the D.C. resistance divider limit element artificial module and first round orthogonal test pre-established
As a result the optimal inner ring radius size and optimal location information of corresponding main grading ring and the optimal inner ring radius of auxiliary grading ring
Size and optimal location information, at least iteration orthogonal test is strong to emulate maximum field around D.C. resistance divider three times for execution
Degree is less than predetermined model until obtaining the difference between last wheel and the maximum field intensity of wheel orthogonal test emulation second from the bottom
The inner ring radius size of the corresponding main grading ring of test result when enclosing and the inner ring radius ruler of location information and auxiliary grading ring
Very little and location information, as the grading ring optimal size of D.C. resistance divider and position.
8. a kind of grading ring size and location determining device of D.C. resistance divider characterized by comprising
First round optimal solution determination unit, for executing based on the D.C. resistance divider limit element artificial module pre-established
First round orthogonal test is optimal after obtaining first round orthogonal test to emulate maximum field intensity around D.C. resistance divider
The optimal inner ring radius size of the corresponding main grading ring of test result and the optimal inner ring of optimal location information and auxiliary grading ring
Radius size and optimal location information;
Optimal size and position determination unit, for based on the D.C. resistance divider limit element artificial module pre-established, with
And optimal inner ring radius size and the optimal location letter of the corresponding main grading ring of optimum test result after first round orthogonal test
The optimal inner ring radius size and optimal location information of breath and auxiliary grading ring execute iteration orthogonal test to emulate direct current
Maximum field intensity around divider is hindered, meets predetermined threshold until obtaining maximum field intensity around emulation D.C. resistance divider
The inner ring radius size of the corresponding main grading ring of test result when value and the inner ring radius ruler of location information and auxiliary grading ring
Very little and location information, as the grading ring optimal size of D.C. resistance divider and position;
Wherein, the D.C. resistance divider limit element artificial module includes main grading ring and auxiliary grading ring, main grading ring it is interior
Ring radius, the location information of main grading ring, the inner ring radius of auxiliary grading ring and the location information of auxiliary grading ring are experimental factor.
9. a kind of computer equipment including memory, processor and stores the meter that can be run on a memory and on a processor
Calculation machine program, which is characterized in that the processor realizes any side of claim 1 to 7 when executing the computer program
Method.
10. a kind of computer readable storage medium, which is characterized in that the computer-readable recording medium storage has perform claim
It is required that the computer program of 1 to 7 any the method.
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Cited By (2)
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CN112528534A (en) * | 2020-11-19 | 2021-03-19 | 南方电网科学研究院有限责任公司 | Method, system and device for acquiring surface maximum electric field intensity of direct current voltage divider |
CN112528534B (en) * | 2020-11-19 | 2024-05-28 | 南方电网科学研究院有限责任公司 | Method, system and device for acquiring surface maximum electric field intensity of direct current voltage divider |
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