CN110388884A - Structured Illumination three-dimensional measuring apparatus - Google Patents

Structured Illumination three-dimensional measuring apparatus Download PDF

Info

Publication number
CN110388884A
CN110388884A CN201910675986.5A CN201910675986A CN110388884A CN 110388884 A CN110388884 A CN 110388884A CN 201910675986 A CN201910675986 A CN 201910675986A CN 110388884 A CN110388884 A CN 110388884A
Authority
CN
China
Prior art keywords
light
optical chip
light source
photodetector
beam splitting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201910675986.5A
Other languages
Chinese (zh)
Inventor
胡诗铭
刘文文
魏清泉
俞育德
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Institute of Semiconductors of CAS
Original Assignee
Institute of Semiconductors of CAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Institute of Semiconductors of CAS filed Critical Institute of Semiconductors of CAS
Priority to CN201910675986.5A priority Critical patent/CN110388884A/en
Publication of CN110388884A publication Critical patent/CN110388884A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/254Projection of a pattern, viewing through a pattern, e.g. moiré

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

The invention discloses a kind of Structured Illumination three-dimensional measuring apparatus, comprising: a light source, for emitting light beam;One beam splitting optical chip is connect with the light source by an optical fiber, forms multi beam emergent light for the light beam to be carried out light splitting;One shifter is set to beam splitting optical chip side, is mechanically connected with the beam splitting optical chip, mobile for controlling beam splitting optical chip, indirectly controls the Exit positions of multi-beam;One photodetector, the reflected beams reflected for detecting multi beam emergent light through object under test;One control module is electrically connected in the light source, shifter and photodetector, for the movement of command displacement device, and control photodetector.The present invention realizes light splitting using beam splitting optical chip, generates area-structure light projection by interference, and operating wavelength range is wide, can be used for different application scene, and do not have diffraction loss, utilization ratio of optical energy is high;Meanwhile present apparatus structure is simple, and it is at low cost and small in size, it is suitable for several work scene.

Description

Structured Illumination three-dimensional measuring apparatus
Technical field
The present invention relates to a kind of three-dimensional measuring apparatus more particularly to a kind of Structured Illumination three-dimensional measuring apparatus.
Background technique
Optical three-dimensional measurement is as a kind of important measuring technique, due to non-contact, quick and high-resolution Advantage is measured, the industries such as medical treatment, industry are widely used in.At the development of modern technologies, especially laser technology, image The high speed development of reason technology and optical image technology, three-dimensional measurement have developed the different form for different application scene.
Optical three-dimensional measuring method can be divided into passive type and active, and passive type includes that monocular, binocular and more mesh are vertical Body vision method;Active includes time flight method, projecting structural optical method, trigonometry and Moire fringe technique;Wherein projection structure Light method has the advantages that speed is fast, direct and with high accuracy, has been widely applied to including heavy construction to the various of small items The measurement of target size.
In Structured Illumination three-dimensional measurement technology, a kind of prior art is to generally use liquid crystal display or digital projection Instrument realizes the projection of the type structures light such as point, line, grating, by be placed on axis of projection it is angled on photodetection Then the image of device (usually camera) Lai Jilu body surface realizes object by the analysis deformed to its structured light patterns again The measurement of body three-dimensional surface shape.In addition, in such technology, it can also be by using the structured light projection of different coding mode Realize high-precision measurement, but since projection device volume is larger, it is difficult to realize miniaturization.
Another prior art is that the projection of line-structured light is realized using laser line generator, is swept by hand-held or fixed angle It retouches, realizes the measurement of object dimensional.Although this technology can be realized the miniaturization of measuring device, but need mobile object (or Measuring device) Lai Shixian object entirety three-dimensional appearance measurement.It there are also a kind of prior art is swashed using vertical-cavity surface-emitting Light device is arranged in pairs or groups DOE (Diffractive optical elements, diffraction optical device), is realized using the principle of optical diffraction The projection of structured light patterns is widely used in the preposition recognition of face of current mobile phone, although this to realize three-dimensional measurement Technology has small in size, the high advantage of diffraction efficiency, but it is dependent on complicated DOE design and processing, and operation wavelength is necessary It is related to DOE design.
Therefore, based on the above problem of the existing technology, it would be highly desirable to it is simple to research and develop a kind of small size, low cost and structure Structured Illumination three-dimensional measuring apparatus.
Summary of the invention
(1) technical problems to be solved
The present invention provides a kind of Structured Illumination three-dimensional measuring apparatus, at least partly to solve present in existing method It is bulky or be unable to fixation measuring, and it is related to and processes complicated disadvantage.
(2) technical solution
According to an aspect of the present invention, a kind of Structured Illumination three-dimensional measuring apparatus, including a light source are provided, for sending out Irradiating light beam;One beam splitting optical chip is connect with the light source by an optical fiber, is formed multi beam for the light beam to be carried out light splitting and is gone out Penetrate light;One shifter is set to beam splitting optical chip side, is mechanically connected with the beam splitting optical chip, for controlling beam splitting Optical chip is mobile, indirectly controls the Exit positions of multi-beam;One photodetector, for detecting multi beam emergent light through object under test The reflected beams of reflection;One control module is electrically connected in the light source, shifter and photodetector, is used for control bit Move the movement of device, and control photodetector.
In further embodiment, the light source is the laser light source with single wavelength, wave-length coverage 400- 1600nm。
In further embodiment, the beam splitting optical chip includes a quartz base plate and a light splitting waveguide, output end Face is plane, and emergent light is to set angle of divergence vertical output.
In further embodiment, the shifter is motor machine shifter or displacement bimorph device.
In further embodiment, the photodetector includes the CMOS camera with fixed-focus or zoom lens.
In further embodiment, the control module can be configured to SCM system or FPGA (Field- Programmable Gate Array, field programmable gate array), in addition, the control module further includes a communication port, and By the communication port by data transfer to back-end computing system, back-end computing system utilizes corresponding three-dimensional reconstruction algorithm weight Build the three-dimensional surface shape of object under test.
In further embodiment, described device further includes a shell, and the shell includes a horizontal base, is used for institute Light source is stated, beam splitting optical chip, shifter, photodetector and control module are fixed on same level.
(3) beneficial effect
It can be seen from the above technical proposal that a kind of Structured Illumination three-dimensional measuring apparatus provided by the invention, using point Beam optical chip realizes light splitting, generates area-structure light projection by interference, operating wavelength range is wide, can be used for different application field Scape, while the diffraction loss without being similar to spatial light modulator, utilization ratio of optical energy are high;Meanwhile present apparatus structure is simple, It is at low cost and small in size, it is suitable for several work scene.
Detailed description of the invention
Fig. 1 is a kind of top view of Structured Illumination three-dimensional measuring apparatus of the embodiment of the present invention.
Fig. 2 is the front view of Fig. 1 shown device.
Fig. 3 is the schematic diagram of Fig. 1 shown device three-dimensional measurement
Fig. 4 is the interference fringe image of Fig. 1 shown device photodetector acquisition.
[description of symbols]
1- light source;2- optical fiber;3- beam splitting optical chip;4- shifter;5- photodetector;
6- control module;7- shell;8- object under test;301- quartz base plate;302- is divided waveguide.
Specific embodiment
To make the objectives, technical solutions, and advantages of the present invention clearer, below in conjunction with specific embodiment, and reference Attached drawing, the present invention is described in further detail.
In the present invention, " on being set to ... " or " on being pasted to ... " is for including straight with single or multiple inter-module Connect contact relation.Moreover, ordinal number such as " first ", " second ", " No.1 " or " two used in specification and claims Number " etc. words, to modify claimed component, itself and do not include and represent the component have it is any before ordinal number, The sequence or the sequence in manufacturing method for not representing a certain component and another component, the use of these ordinal numbers are only used to make to have One component of certain name is able to that clear differentiation can be made with another component with identical name.
The present invention provides a kind of Structured Illumination three-dimensional measuring apparatus, are realized using beam splitting optical chip by light source output Single beam incident light is divided into two bundles or multi beam, by the side that two beam or multi-beam are directly output to object under test from flat end face Formula interferes forming face structured light projection, and the phase-modulation of interference fringe, same time are then realized by the displacement function of shifter Electric explorer acquires the reflected light of object under test, and the surface three dimension shape of object under test is finally rebuild using corresponding three-dimensional reconstruction algorithm Looks.
Fig. 1 is a kind of top view of Structured Illumination three-dimensional measuring apparatus of the embodiment of the present invention, as shown in Figure 1, comprising:
Light source 1, in the present embodiment, light source 1 are the laser light source with single wavelength, wave-length coverage 400- 1600nm;
Beam splitting optical chip 3, for single beam incident light of the light source 1 to be divided into two beams or multi beam, the beam splitting optical chip 3 with Light source 1 is connected by optical fiber 2, and list beam incident light caused by light source 1 is coupled into beam splitting optical chip by optical fiber 2;
Shifter 4 is set to described 3 one end of beam splitting optical chip, is mechanically connected with the beam splitting optical chip 3, the displacement Device 4 can be motor machine shifter and displacement bimorph device, for being emitted the mobile beam splitting optical chip 3 of light direction, so as to Realize the phase-modulation of interference fringe;
Photodetector 5 can be configured to the CMOS camera with fixed-focus or zoom lens, for acquiring and the light source one The optical information of the wavelength of cause records the image of body surface, and the analysis by deforming to its structured light patterns, to realize object The measurement of body three-dimensional surface shape, in other embodiments of the invention, if you need to further increase the specificity of detection, Ke Yi The camera lens surface plated film of the photodetector 5 makes the light of its only probe source output wavelength.
Control module 6 is electrically connected in the light source 1, shifter 4 and photodetector 5, for 1 wave of light source to be arranged It is long, data collected by the operating mode and acquisition photodetector 5 of shifter 4, in the present embodiment, the control module 6 can be configured to SCM system or FPGA, it is preferred that control module 6 further includes a communication port, and passing through the communication port will Data transfer to back-end computing system, back-end computing system rebuilds the surface of object under test using corresponding three-dimensional reconstruction algorithm Three-dimensional appearance.
In addition, the beam splitting optical chip 3 includes quartz base plate 301 and light splitting waveguide 302, the output end face of emergent light is flat Face, perpendicular to light splitting waveguide 302.
The present apparatus further includes shell 7, and the shell 7 includes a horizontal base, is used for the light source 1, beam splitting optical chip 3, shifter 4, photodetector 5 and control module 6 are fixed on same level.
Fig. 2 is the front view of Fig. 1 shown device, as shown in Fig. 2, shifter 4 is set to the side of beam splitting optical chip 3, is led to Excessively emergent light direction is displaced beam splitting optical chip 3, realizes stripe displacement, meets the reconstruct of fringe structure light 3-D image to obtain Required data.
Fig. 3 is the schematic diagram of Fig. 1 shown device three-dimensional measurement, below with reference to Fig. 3 to a specific embodiment of the invention It is further elaborated, please refers to Fig. 3.
In the present embodiment, the wavelength of 1 output light of light source is 635nm, and beam splitting optical chip 3 is PLC (planar Lightwave circuit, planar optical waveguide) optical chip, light can be divided evenly into two beams, between two light splitting waveguides 302 Away from being 250 μm, shifter 4 is piezoelectric ceramics shifter, can drive beam splitting under the control for the electric signal that control module 6 exports The movement of optical chip 3, moving direction is parallel with two light splitting lines of 302 output point of waveguide, and photodetector 5 is to include The CMOS camera of camera lens.
As shown in figure 3, two are divided the light direct irradiation of the output of waveguides 302 on object under test 8, while photodetector The light that 5 acquisitions are reflected from object under test.Fig. 4 is the interference fringe image of Fig. 1 shown device photodetector acquisition, such as Fig. 4 It is shown, according to principle of interference, the light of the output of waveguide 302 is divided in 8 Surface Interference of object under test, forms interference fringe image.
5 acquired image of photodetector is the image I with interference fringe, mathematical expression are as follows:
I (x, y)=I ' (x, y)+I " (x, y) cos (φ (x, y))
The wherein coordinate of the pixel of x and y representative image, phase (x, y) represent the letter of object surface three-dimensional morphology Breath.
The displacement of beam splitting optical chip 3 is driven by shifter 4, realizes that interference fringe phase step is the displacement of pi/2, at this In embodiment, it is displaced 3 times, acquires 4 width images in total, mathematical expression is respectively as follows:
I1(x, y)=I ' (x, y)+I " (x, y) cos (φ (x, y))
I2(x, y)=I ' (x, y)+I " (x, y) cos (φ (x, y)+pi/2)
I3(x, y)=I ' (x, y)+I " (x, y) cos (φ (x, y)+π)
I4(x, y)=I ' (x, y)+I " (x, y) cos (+3 pi/2 of φ (x, y))
Phase (x, y) can be calculated according to this four width image:
The 3 d surface topography of object under test 8 can be recovered finally by respective phase deployment algorithm.
By above statement, aiming at the problems existing in the prior art and disadvantage, the embodiment of the invention provides a kind of knots Structure optical illumination three-dimensional measuring apparatus is realized using beam splitting optical chip and is divided, and generates area-structure light projection, operating wave by interference Long range is wide, can be used for different application scene, while the diffraction loss without being similar to spatial light modulator, and light energy utilizes Rate is high;Meanwhile present apparatus structure is simple, and it is at low cost and small in size, it is suitable for several work scene.
Particular embodiments described above has carried out further in detail the purpose of the present invention, technical scheme and beneficial effects Describe in detail bright, it should be understood that the above is only a specific embodiment of the present invention, is not intended to restrict the invention, it is all Within the spirit and principles in the present invention, any modification, equivalent substitution, improvement and etc. done should be included in protection of the invention Within the scope of.

Claims (7)

1. a kind of Structured Illumination three-dimensional measuring apparatus, comprising:
One light source, for emitting light beam;
One beam splitting optical chip is connect with the light source by an optical fiber, forms multi beam outgoing for the light beam to be carried out light splitting Light;
One shifter is set to beam splitting optical chip side, is mechanically connected with the beam splitting optical chip, for controlling beam splitting light Chip is mobile, indirectly controls the Exit positions of multi-beam;
One photodetector, the reflected beams reflected for detecting multi beam emergent light through object under test;
One control module, is electrically connected in the light source, shifter and photodetector, for the movement of command displacement device, And control photodetector.
2. the apparatus according to claim 1, wherein the light source is the laser light source with single wavelength, wavelength model It encloses for 400-1600nm.
3. the apparatus according to claim 1, wherein the beam splitting optical chip includes a quartz base plate and a light splitting waveguide.
4. device according to claim 3, wherein the output end face of the beam splitting optical chip is plane, the multi beam goes out Light is penetrated to set angle of divergence vertical output.
5. the apparatus according to claim 1, wherein the shifter is motor machine shifter or displacement bimorph device.
6. the apparatus according to claim 1, wherein the photodetector includes with fixed-focus or zoom lens CMOS camera.
7. the apparatus according to claim 1 is used for transmission measurement wherein the control module further includes a communication port Data.
CN201910675986.5A 2019-07-24 2019-07-24 Structured Illumination three-dimensional measuring apparatus Pending CN110388884A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910675986.5A CN110388884A (en) 2019-07-24 2019-07-24 Structured Illumination three-dimensional measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910675986.5A CN110388884A (en) 2019-07-24 2019-07-24 Structured Illumination three-dimensional measuring apparatus

Publications (1)

Publication Number Publication Date
CN110388884A true CN110388884A (en) 2019-10-29

Family

ID=68287283

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201910675986.5A Pending CN110388884A (en) 2019-07-24 2019-07-24 Structured Illumination three-dimensional measuring apparatus

Country Status (1)

Country Link
CN (1) CN110388884A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113648094A (en) * 2021-08-11 2021-11-16 苏州喆安医疗科技有限公司 Split type oral cavity digital impression instrument

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100641885B1 (en) * 2004-06-15 2006-11-02 주식회사 나노시스템 light phase interferrometry method and system for horizontal scanning type
CN101033948A (en) * 2007-03-29 2007-09-12 上海大学 Measurement system for three-dimensional deformation based on splitting optical fiber
CN200962029Y (en) * 2006-07-21 2007-10-17 上海大学 3D distortion measurement system based on bundle optical fiber
CN101608904A (en) * 2009-07-21 2009-12-23 清华大学 Multifunction three-dimensional displacement and pattern laser interferometry system
CN203687880U (en) * 2014-01-20 2014-07-02 浙江大学 Optical displacement measuring system

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100641885B1 (en) * 2004-06-15 2006-11-02 주식회사 나노시스템 light phase interferrometry method and system for horizontal scanning type
CN200962029Y (en) * 2006-07-21 2007-10-17 上海大学 3D distortion measurement system based on bundle optical fiber
CN101033948A (en) * 2007-03-29 2007-09-12 上海大学 Measurement system for three-dimensional deformation based on splitting optical fiber
CN101608904A (en) * 2009-07-21 2009-12-23 清华大学 Multifunction three-dimensional displacement and pattern laser interferometry system
CN203687880U (en) * 2014-01-20 2014-07-02 浙江大学 Optical displacement measuring system

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
F. CEYSSENS ET AL: "A low-cost and highly integrated fiber optical pressure sensor system", 《SENSORS AND ACTUATORS 》 *
王付印: "基于F-P干涉仪的微型化光纤水声传感关键技术研究", 《中国优秀博士论文集信息科技辑》 *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113648094A (en) * 2021-08-11 2021-11-16 苏州喆安医疗科技有限公司 Split type oral cavity digital impression instrument
CN113648094B (en) * 2021-08-11 2023-10-27 苏州喆安医疗科技有限公司 Split type oral cavity digital impression instrument

Similar Documents

Publication Publication Date Title
US11680790B2 (en) Multiple channel locating
CN102289152B (en) Optical system wave aberration detection device
CN111399245A (en) Laser emission module and 3D imaging device
CN104121872B (en) Measuring device for surface roughness
CN115079340A (en) Spatial division multiplexing optical coherence tomography using low-loss integrated photonic chips
CN103900493A (en) Micro-nano structure morphology measuring device and method based on digital scanning white light interference
EP0880676A1 (en) Apparatus and methods for surface contour measurement
CN112013791B (en) Three-wavelength variable-scale interference microscopic imaging system, imaging method and three-phase restoration method
CN109579728A (en) Pattern light projective module group based on holographical wave guide
WO2005065178A2 (en) System and method for optical navigation using a projected fringe technique
CN108303038A (en) Reflection-type surface shape measurement method and device based on two-dimension optical dot matrix
CN211878344U (en) Laser emission module and 3D imaging device
CN110007384B (en) Two-dimensional plane holographic grating exposure method
CN113804112B (en) Displacement measurement system and lithography equipment
CN109870754B (en) Two-dimensional plane holographic grating exposure device
Yang et al. Overview of modulation techniques for spatially structured-light 3d imaging
CN110388884A (en) Structured Illumination three-dimensional measuring apparatus
CN205192445U (en) Optics three -dimensional imaging device
CN105783776A (en) Device and method of measuring surface topography based on double-wave surface interference fringe array
CN111610534B (en) Image forming apparatus and image forming method
CN103471725B (en) Based on the Wave-front measurement device of modulated light source and positive and negative order of diffraction separate detection structure
CN115031630A (en) Optical frequency comb dispersion interference plane pose measuring device and measuring method
CN209055782U (en) A kind of system of auto-focusing
US20240184022A1 (en) Illumination line generation by double-duty diffusion
CN114295227B (en) System and method for measuring orbital angular momentum beam topology charge value

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication
RJ01 Rejection of invention patent application after publication

Application publication date: 20191029