CN110231499A - A kind of circuit board testing device - Google Patents
A kind of circuit board testing device Download PDFInfo
- Publication number
- CN110231499A CN110231499A CN201910657905.9A CN201910657905A CN110231499A CN 110231499 A CN110231499 A CN 110231499A CN 201910657905 A CN201910657905 A CN 201910657905A CN 110231499 A CN110231499 A CN 110231499A
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- connecting rod
- circuit board
- clamp assemblies
- pedestal
- hole
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- 238000012360 testing method Methods 0.000 title claims abstract description 75
- 239000000523 sample Substances 0.000 claims abstract description 42
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims abstract description 40
- 230000000712 assembly Effects 0.000 claims abstract description 34
- 238000000429 assembly Methods 0.000 claims abstract description 34
- 230000000694 effects Effects 0.000 abstract description 7
- 238000013102 re-test Methods 0.000 abstract description 4
- 229920001821 foam rubber Polymers 0.000 description 6
- 230000005611 electricity Effects 0.000 description 2
- 230000006978 adaptation Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
A kind of circuit board testing device, it include: pedestal, fixed mechanism, clamping device, the first test probe and the second test probe, the pedestal, which offers, sets board slot, fixed mechanism includes several first screw rods and several second screw rods, one end of first screw rod is provided with the first locking assembly, one end of second screw rod is provided with the second locking assembly, clamping device includes several first clamp assemblies and several second clamp assemblies, first test probe is arranged on the first clamp assemblies, and the second test probe is arranged on the second clamp assemblies.It is provided with the first screw rod and the second screw rod, adjust the first locking assembly and the second locking assembly position, circuit board to be tested is locked in setting board slot, the first clamp assemblies and the second clamp assemblies being arranged by the activity of pedestal both ends, the position for adjusting the first test probe and the second test probe, detects two faces of circuit board, avoids test one side re-test another side, testing efficiency is improved, tester's operation is facilitated.
Description
Technical field
The present invention relates to test equipment technical field, in particular to a kind of plate slowdown monitoring circuit board test device.
Background technique
Circuit board is the supporter of electronic component, when important electronic component lead to when testing electronic product
It is often to be detected to the function and performance of the circuit board in electronic product, printed board develops to two-sided, multilayer from single layer and scratches
Property, and respective development trend is still kept, existing circuit board is dual platen mostly, in test, is needed to circuit
The two sides of plate is detected, and still, existing test device can only generally carry out single side test, in testing two-sided circuit board,
After needing first to test one side, re-test another side after being overturn is not easy to tester's operation, meanwhile, also it is easily damaged electricity
Road plate causes unnecessary loss.
Summary of the invention
Technical problem to be solved by the invention is to provide a kind of circuit board testing devices.
The technical scheme to solve the above technical problems is that a kind of circuit board testing device, comprising: pedestal is consolidated
Determine mechanism, clamping device, several first test probes and several second test probes, the pedestal, which offers, sets board slot, described
One end of pedestal offers several first locking holes, and the other end of the pedestal offers several second locking holes, the fixation
Mechanism includes several first screw rods and several second screw rods, the inner sidewall screw thread company of first screw rod and first locking hole
It connects, one end of first screw rod is provided with the first locking assembly, the inner sidewall of second screw rod and second locking hole
It is threadedly coupled, one end of second screw rod is provided with the second locking assembly, and the clamping device includes several first clamping groups
Part and several second clamp assemblies, several first clamp assemblies are movably arranged on one end of the pedestal, several described
Second clamp assemblies are movably arranged on the other end of the pedestal, and the first test probe is arranged in the first clamping group
On part, the second test probe is arranged on second clamp assemblies.
Further, one end of the pedestal is provided with the first sliding rail, and the other end of the pedestal is provided with the second sliding rail,
First clamp assemblies include the first sliding block, the first grip block, first connecting rod and the second connecting rod, and first sliding block is sliding
It is dynamic to be arranged on first sliding rail, one end of the first connecting rod and first sliding block pivot joint, the first connecting rod
The other end and second connecting rod one end pivot joint, the other end of second connecting rod and the first grip block pivot
It connects, first grip block offers the first mounting hole, and the first test probe is threaded through institute by first mounting hole
It states on the first grip block.
Further, second clamp assemblies include the second sliding block, the second grip block, third connecting rod and the 4th connection
Bar, second sliding block are slidably arranged on second sliding rail, one end of the third connecting rod and second slider pivot
Connect, the pivot joint of one end of the other end of the third connecting rod and the 4th connecting rod, the other end of the 4th connecting rod and
Second grip block pivot joint, second grip block offer the second mounting hole, and the second test probe passes through described the
Two mounting holes are threaded through on second grip block.
It further, further include the first bolt and the second bolt, first sliding block offers the first tapped through hole, described
The inner sidewall of first bolt and first tapped through hole is threadedly coupled, and second sliding block offers the second tapped through hole, institute
The inner sidewall for stating the second bolt and second tapped through hole is threadedly coupled.
Further, first locking assembly includes the first link block and the first clamping plate, and first link block is opened
Equipped with the first threaded hole, the inner sidewall of one end of first screw rod and first threaded hole is threadedly coupled, first folder
Tight plate is connected with first link block.
Further, second locking assembly includes the second link block and the second clamping plate, and second link block is opened
Equipped with the second threaded hole, the inner sidewall of one end of second screw rod and second threaded hole is threadedly coupled, second folder
Tight plate is connected with second link block.
Further, first clamping plate is provided with the first foam-rubber cushion.
Further, second clamping plate is provided with the second foam-rubber cushion.
The beneficial effects of the present invention are: the both ends of pedestal are respectively arranged with several first screw rods and several second screw rods, the
One screw rod and the second screw rod are oppositely arranged, by rotating the first screw rod and the second screw rod, adjustable first locking assembly respectively
With the position of the second locking assembly, circuit board to be tested is vertically locked setting in board slot in pedestal, bottom is then passed through
The first clamp assemblies and the second clamp assemblies of seat both ends activity setting can test probe and the second test with flexible modulation first
Two faces of circuit board are respectively detected in the position of probe, re-test another side after test one side are avoided, when saving
Between, testing efficiency is improved, damage circuit board shows when also facilitating tester's operation, while also circuit board being avoided to change face
As.
Detailed description of the invention
Fig. 1 is a kind of structural schematic diagram of circuit board testing device of one embodiment;
Fig. 2 is a kind of top view of circuit board testing device of one embodiment.
Specific embodiment
It should be noted that in the absence of conflict, the feature in embodiment and embodiment in the present invention can phase
Mutually combination.Below with reference to the attached drawing of the embodiment of the present invention, technical solution of the present invention is described further, the present invention is not only
It is limited to following specific embodiments.
It is to be appreciated that in the attached drawing of embodiment, the same or similar label correspond to the same or similar components.At this
In the description of invention, it is to be understood that if there is the finger such as term " on ", "lower", "front", "rear", "left", "right", "top", "bottom"
The orientation or positional relationship shown is to be based on the orientation or positional relationship shown in the drawings, and is merely for convenience of the description present invention and simplifies
Description, rather than the equipment of indication or suggestion meaning or element must have a particular orientation, constructed and grasped with specific orientation
Make, therefore the terms describing the positional relationship in the drawings are only for illustration, should not be understood as the limitation to this patent, for
For those skilled in the art, the concrete meaning of above-mentioned term can be understood as the case may be.
As shown in Figure 1 to Figure 2, in one embodiment, a kind of circuit board testing device, comprising: pedestal 100, fixed machine
Structure 200, clamping device 300, several first test probes 400 and several second test probes 500, the pedestal 100 offer
Board slot 101 is set, one end of the pedestal 100 offers several first locking holes, and the other end of the pedestal 100 offers several
Second locking hole, specifically, the top set board slot 101 and be provided with the pedestal 100, it should be understood that the pedestal
100 top is the upper surface of pedestal 100, and first locking hole and second locking hole connect with the board slot 101 of setting
Logical, first locking hole and second locking hole are oppositely arranged one by one.
The fixed mechanism 200 includes several first screw rods 210 and several second screw rods 220,210 He of the first screw rod
The inner sidewall of first locking hole is threadedly coupled, and one end of first screw rod 210 is provided with the first locking assembly 230, institute
The inner sidewall for stating the second screw rod 220 and second locking hole is threadedly coupled, and one end of second screw rod 220 is provided with second
Locking assembly 240, specifically, first screw rod 210 and first locking hole are adapted, first screw rod 210 passes through
First locking hole is threaded through on one end of the pedestal 100, and one end setting of first screw rod 210 sets plate described
In slot 101, first screw rod 210 is arranged in close to described one end for setting board slot 101 in first locking assembly 230, thus
First locking assembly 230 is arranged and is set in board slot 101 described, second screw rod 220 and the second locking hole phase
Adaptation, second screw rod 220 are threaded through on the other end of the pedestal 100 by second locking hole, and described second
One end setting of screw rod 220 is set in board slot 101 described, and the setting of the second locking assembly 240 is leaned in second screw rod 220
Nearly described one end for setting board slot 101, sets in board slot 101 to being arranged second locking assembly 240 described, described first
Locking assembly 230 and second locking assembly 240 or so are oppositely arranged, thus from left and right two sides to circuit board to be detected into
Row is fixedly clamped.
The clamping device 300 includes several first clamp assemblies 310 and several second clamp assemblies 320, several described
First clamp assemblies 310 are movably arranged on one end of the pedestal 100, several second clamp assemblies, 320 activity settings
On the other end of the pedestal 100, the first test probe 400 is arranged on first clamp assemblies 310, and described the
Two test probes 500 are arranged on second clamp assemblies 320.Specifically, first clamp assemblies 310 are arranged described
Pedestal 100 offers one end of first locking hole, and the setting of the second clamp assemblies 320 is offered in the pedestal 100
One end of second locking hole.
In one embodiment, one end of the pedestal 100 is provided with the first sliding rail 110, and the other end of the pedestal 100 is set
It is equipped with the second sliding rail 120, first clamp assemblies 310 include the first sliding block 311, the first grip block 312, first connecting rod
313 and second connecting rod 314, first sliding block 311 be slidably arranged on first sliding rail 110, the first connecting rod
313 one end and first sliding block 311 pivot joint, the other end of the first connecting rod 313 and second connecting rod 314
One end pivot joint, the other end of second connecting rod 314 and first grip block 312 pivot joint, first grip block 312 are opened
Equipped with the first mounting hole, the first test probe 400 is threaded through first grip block 312 by first mounting hole
On.Specifically, one end that the pedestal 100 offers first locking hole is provided with first sliding rail 110, the pedestal
100 one end for offering second locking hole are provided with second sliding rail 120, first sliding rail 110 and described second
Sliding rail 120 or so is oppositely arranged, and first sliding block 311 is slidably arranged on first sliding rail 110, is driven and is arranged described
The first connecting rod 313 on first sliding block 311 is mobile, to drive described the with the first connecting rod 313 pivot joint
Two connecting rods 314 are mobile, so that first grip block 312 movement with second connecting rod 314 pivot joint is driven, thus real
The movement of the existing first test probe 400, in the present embodiment, one end of the first connecting rod 313 and first sliding block
311 are pivotally connected by pin realization, and one end of the other end of the first connecting rod 313 and second connecting rod 314 passes through pin
Nail realizes that pivot joint, the other end of second connecting rod 314 and first grip block 312 realize pivot joint, this hair by pin
The bright middle device that uses of being pivotally connected can be not limited to the embodiment for the device being pivotally connected may be implemented obtained by the prior art
The device referred to, in the present embodiment, not burdensome description.
In one embodiment, second clamp assemblies 320 include the second sliding block 321, the second grip block 322, third company
Extension bar 323 and the 4th connecting rod 324, second sliding block 321 are slidably arranged on second sliding rail 120, and the third connects
One end of extension bar 323 and second sliding block 321 pivot joint, the other end of the third connecting rod 323 and the 4th connecting rod
324 one end pivot joint, the other end of the 4th connecting rod 324 and second grip block 322 pivot joint, second grip block
322 offer the second mounting hole, and the second test probe 500 is threaded through second grip block by second mounting hole
On 322.Specifically, second sliding block 321 is slidably arranged on second sliding rail 120, drive setting sliding described second
The third connecting rod 323 on block 321 is mobile, so that drive is connect with the described 4th that the third connecting rod 323 is pivotally connected
Bar 324 is mobile, so that second grip block 322 movement with the 4th connecting rod 324 pivot joint is driven, thus described in realizing
The movement of second test probe 500, in the present embodiment, one end of the third connecting rod 323 and second sliding block 321 pass through
Pin, which is realized, to be pivotally connected, and pivot is realized by pin in one end of the other end of the third connecting rod 323 and the 4th connecting rod 324
It connects, the other end and second grip block 322 of the 4th connecting rod 324 are realized by pin to be pivotally connected, and is pivotally connected in the present invention
The device used can be the obtainable device that pivot joint may be implemented in the prior art, be not limited to the embodiment in the dress that refers to
It sets, in the present embodiment, not burdensome description.
Specifically, by circuit board to be tested be vertically disposed in it is described set in board slot 101, according to the big of circuit board to be detected
It is small, suitable first screw rod 210 and the second screw rod 220 are selected, twists first screw rod 210 and institute toward circuit board direction
The second screw rod 220 is stated, drives first locking assembly 230 and second locking assembly 240 mobile toward circuit board direction, from
And circuit board to be detected is fixedly clamped from left and right both direction and is set in board slot 101 described, then pass through mobile described the
The position of one sliding block 311, while the first connecting rod 313 and second connecting rod 314 are rotated, adjustable described first
The first test probe 400 is moved to the specified position in circuit board one side to be detected top by the position for testing probe 400,
By the position of movement second sliding block 321, while the third connecting rod 323 and the 4th connecting rod 324 are rotated, it can
To adjust the position of the second test probe 500, the second test probe 500 is moved to circuit board another side to be detected
The specified position in top can also adjust the first test probe 400 and circuit board by rotating first grip block 312
The angle of contact rotates the adjustable second test probe 500 of second grip block 322 and the circuit board contacts
Angle avoids the occurrence of poor contact phenomenon, according to specific test needs, regulates each first test probe 400 and each
The position of a second test probe 500, passes through the first test probe 400 and described second test, 500 pairs of electricity of probe
Road plate is detected.The both ends of pedestal 100 are respectively arranged with several first screw rods 210 and several second screw rods 220, the first screw rod
210 and second screw rod 220 be oppositely arranged, by rotating the first screw rod 210 and the second screw rod 220 respectively, adjustable first lock
The position of tight component 230 and the second locking assembly 240, circuit board to be tested is vertically locked and sets plate in pedestal 100
In slot 101, the first clamp assemblies 310 and the second clamp assemblies 320, Ke Yiling that are then arranged by 100 both ends activity of pedestal
The position living for adjusting the first test probe 400 and the second test probe 500, respectively detects two faces of circuit board, keeps away
Exempt from test one side after re-test another side, save the time, improve testing efficiency, also facilitate tester operation, simultaneously
The phenomenon that circuit board is damaged when also circuit board being avoided to change face.
It in one embodiment, further include the first bolt 600 and the second bolt 700, first sliding block 311 offers
The inner sidewall of one tapped through hole, first bolt 600 and first tapped through hole is threadedly coupled, second sliding block 321
Offer the second tapped through hole, the inner sidewall threaded connection of second bolt 700 and second tapped through hole.Specifically,
First tapped through hole is axially perpendicular to first sliding rail 110, and first sliding rail 110 has the first sliding groove, described
First bolt 600 is abutted by the bottom activity of first tapped through hole and first sliding groove, when first sliding block
311 when sliding into the position of needs, can tighten first bolt 600, makes first bolt 600 and first sliding
The bottom of slot abuts, and first sliding block 311 is fixed, second tapped through hole is axially perpendicular to second sliding rail
120, second sliding rail 120 has the second sliding groove, and second bolt 700 passes through second tapped through hole and described the
The bottom activity of two sliding grooves abuts, and when second sliding block 321 slides into the position of needs, can tighten second spiral shell
Bolt 700 abuts the bottom of second bolt 700 and second sliding groove, second sliding block 321 is fixed, if
First bolt 600 and second bolt 700 have been set, can prevent from shifting, can more preferably fix first test
The position of probe 400 and the second test probe 500, to improve the accuracy of detection.
In one embodiment, first locking assembly 230 includes the first link block 231 and the first clamping plate 232, institute
It states the first link block 231 and offers the first threaded hole, the inner sidewall of one end of first screw rod 210 and first threaded hole
It is threadedly coupled, first clamping plate 232 and first link block 231 connection.Specifically, first link block 231 is logical
First screw hole is crossed on first screw rod 210, to being arranged first clamping plate 232 described first
On screw rod 210, by being provided with first link block 231, preferably first clamping plate 232 can be mounted on described
On first screw rod 210, so that connection is stronger, it is not easy to damage, improve the service life of the circuit board testing device.
In one embodiment, second locking assembly 240 includes the second link block 241 and the second clamping plate 242, institute
It states the second link block 241 and offers the second threaded hole, the inner sidewall of one end of second screw rod 220 and second threaded hole
It is threadedly coupled, second clamping plate 242 and second link block 241 connection.Specifically, second link block 241 is logical
Second screw hole is crossed on second screw rod 220, to being arranged second clamping plate 242 described second
On screw rod 220, by being provided with second link block 241, preferably second clamping plate 242 can be mounted on described
On second screw rod 220, so that connection is stronger, it is not easy to damage, improve the service life of the circuit board testing device.
In one embodiment, first clamping plate 232 is provided with the first foam-rubber cushion.Second clamping plate 242 is set
It is equipped with the second foam-rubber cushion.Provided with the first foam-rubber cushion and the second foam-rubber cushion, certain buffer function can be played, avoids described
One clamping plate 232 and circuit board to be tested directly contact, and second clamping plate 242 and circuit board to be tested is avoided directly to connect
Touching, avoids hard contact, to avoid damaging circuit board to be measured, plays a protective role to circuit board, reduce fraction defective, together
When the phenomenon that can also playing insulating effect, avoiding the occurrence of electric shock, it is highly-safe.
Obviously, the above embodiment of the present invention be only to clearly illustrate example of the present invention, and not be pair
The restriction of embodiments of the present invention.For those of ordinary skill in the art, may be used also on the basis of the above description
To make other variations or changes in different ways.There is no necessity and possibility to exhaust all the enbodiments.It is all this
Made any modifications, equivalent replacements, and improvements etc., should be included in the claims in the present invention within the spirit and principle of invention
Protection scope within.
Claims (8)
1. a kind of circuit board testing device characterized by comprising pedestal, fixed mechanism, clamping device, several first tests
Probe and several second test probes, the pedestal, which offers, sets board slot, and one end of the pedestal offers several first lockings
Hole, the other end of the pedestal offer several second locking holes, and the fixed mechanism includes several first screw rods and several
The inner sidewall of two screw rods, first screw rod and first locking hole is threadedly coupled, and one end of first screw rod is provided with
The inner sidewall of first locking assembly, second screw rod and second locking hole is threadedly coupled, one end of second screw rod
It is provided with the second locking assembly, the clamping device includes several first clamp assemblies and several second clamp assemblies, Ruo Gansuo
It states the first clamp assemblies to be movably arranged on one end of the pedestal, several second clamp assemblies are movably arranged on the bottom
On the other end of seat, the first test probe is arranged on first clamp assemblies, and the second test probe setting exists
On second clamp assemblies.
2. circuit board testing device as described in claim 1, which is characterized in that it is sliding that one end of the pedestal is provided with first
Rail, the other end of the pedestal are provided with the second sliding rail, and first clamp assemblies include the first sliding block, the first grip block, the
One connecting rod and the second connecting rod, first sliding block are slidably arranged on first sliding rail, and the one of the first connecting rod
End and first sliding block pivot joint, one end pivot joint of the other end of the first connecting rod and second connecting rod, described the
The other end of two connecting rods and first grip block pivot joint, first grip block offer the first mounting hole, and described first
Test probe is threaded through on first grip block by first mounting hole.
3. circuit board testing device as claimed in claim 2, which is characterized in that second clamp assemblies include second sliding
Block, the second grip block, third connecting rod and the 4th connecting rod, second sliding block are slidably arranged on second sliding rail, institute
One end and second sliding block pivot joint of third connecting rod are stated, the other end of the third connecting rod and the 4th connecting rod
One end pivot joint, the other end of the 4th connecting rod and second grip block pivot joint, second grip block offer second
Mounting hole, the second test probe are threaded through on second grip block by second mounting hole.
4. circuit board testing device as claimed in claim 3, which is characterized in that further include the first bolt and the second bolt, institute
It states the first sliding block and offers the first tapped through hole, the inner sidewall of first bolt and first tapped through hole is threadedly coupled,
Second sliding block offers the second tapped through hole, the inner sidewall screw thread company of second bolt and second tapped through hole
It connects.
5. circuit board testing device as described in claim 1, which is characterized in that first locking assembly includes the first connection
Block and the first clamping plate, first link block offer the first threaded hole, one end of first screw rod and first spiral shell
The inner sidewall of pit is threadedly coupled, and first clamping plate is connected with first link block.
6. circuit board testing device as claimed in claim 5, which is characterized in that second locking assembly includes the second connection
Block and the second clamping plate, second link block offer the second threaded hole, one end of second screw rod and second spiral shell
The inner sidewall of pit is threadedly coupled, and second clamping plate is connected with second link block.
7. circuit board testing device as claimed in claim 6, which is characterized in that first clamping plate is provided with the first sponge
Pad.
8. circuit board testing device as claimed in claim 7, which is characterized in that second clamping plate is provided with the second sponge
Pad.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201910657905.9A CN110231499A (en) | 2019-07-20 | 2019-07-20 | A kind of circuit board testing device |
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CN201910657905.9A CN110231499A (en) | 2019-07-20 | 2019-07-20 | A kind of circuit board testing device |
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CN201910657905.9A Pending CN110231499A (en) | 2019-07-20 | 2019-07-20 | A kind of circuit board testing device |
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CN110596573A (en) * | 2019-10-12 | 2019-12-20 | 苏州恒河激光科技有限公司 | A detection device for FPC |
CN115267270A (en) * | 2022-08-01 | 2022-11-01 | 展讯通信(上海)有限公司 | Fixing support |
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CN110596573A (en) * | 2019-10-12 | 2019-12-20 | 苏州恒河激光科技有限公司 | A detection device for FPC |
CN115267270A (en) * | 2022-08-01 | 2022-11-01 | 展讯通信(上海)有限公司 | Fixing support |
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