CN110186654A - A kind of longitudinal resolution test device - Google Patents

A kind of longitudinal resolution test device Download PDF

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Publication number
CN110186654A
CN110186654A CN201910459755.0A CN201910459755A CN110186654A CN 110186654 A CN110186654 A CN 110186654A CN 201910459755 A CN201910459755 A CN 201910459755A CN 110186654 A CN110186654 A CN 110186654A
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CN
China
Prior art keywords
light
transmitting plate
longitudinal resolution
test device
resolution test
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CN201910459755.0A
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CN110186654B (en
Inventor
罗斯特
王丹
罗伶娟
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Shenzhen Wisdom Map Technology Co Ltd
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Shenzhen Wisdom Map Technology Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0242Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
    • G01M11/0264Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested by using targets or reference patterns
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/04Optical benches therefor

Abstract

The invention belongs to optical technology more particularly to a kind of longitudinal resolution test devices.Described device includes: the first light-transmitting plate and the second light-transmitting plate, first light-transmitting plate and second light-transmitting plate one end abut each other connection, the other end is attached by connection structure, so as to form the wedge-shaped air gap of thickness size gradual change between first light-transmitting plate and second light-transmitting plate.A kind of longitudinal resolution test device provided in an embodiment of the present invention can be simple and convenient and objectively tests longitudinal resolution;And measurement accuracy is high, and it is easy to make, it is low in cost, it is easy to accomplish.

Description

A kind of longitudinal resolution test device
Technical field
The invention belongs to optical technology more particularly to a kind of longitudinal resolution test devices.
Background technique
In optical imaging field, in order to illustrate the ability of optical imaging system, the resolution of optical imaging system is usually used Rate is measured.Wherein the resolution ratio of optical imaging system includes lateral resolution and longitudinal resolution, can by some test boards Directly to measure lateral resolution, such as the standard resolution test board that Thorlab company provides, the test board is by a variety of differences The vertical and horizontal line of dimension forms, which scale an optical imaging system can clearly be imaged onto, then illustrate the optical imaging system Resolution ratio it is how high, this method is very convenient and practical.
Imaging system corresponding to lateral resolution is mainly for traditional optical system, such as microscope, magnifying glass etc. Deng.And modern calculating imaging technique can do tomographic imaging, namely can not only make face imaging, while can make depth side To imaging, such as optical coherent chromatographic imaging (OCT).And how to measure (namely longitudinal point of imaging resolution of depth direction Resolution), there is no the longitudinal resolution test boards of standard at present.Engineering in practice, the method for above-mentioned measurement lateral resolution It can not be used to test longitudinal resolution.In optical computing imaging technique, test for longitudinal resolution only passes through one A reflecting mirror measures the point spread function of the reflecting mirror as imaging surface, to measure the true longitudinal direction of optical imaging system Resolution ratio.But point spread function measurement is needed in best signal-to-noise ratio condition, measured under best system condition one group it is anti- Then the data for penetrating mirror imaging make the imaging waveform that certain specific operation obtains reflecting mirror, then pass through measurement 3db strength retrogression Numerical value calculate true longitudinal resolution, this method is bothersome laborious, complicated for operation.Moreover, different calculating imaging systems, For example laser scanning co-focusing imaging, the imaging modes such as photoacoustic imaging, the measurement method of longitudinal resolution are different.Therefore mesh The longitudinal resolution test method of preceding also none standard.
Secondly, not high enough using the accuracy of the method test longitudinal resolution of point spread function.The reason is that: it calculates point and expands Dissipating numerical value used in the 3db length of function is the data acquired by data acquisition device, and the sample rate of data acquisition device With bandwidth can not infinite height, therefore this sample loading mode measurement data be discrete values, so -3dB at it is true Data point can only calculate its resolution ratio by way of interpolation.Under the influence of noise, the method for this measurement longitudinal resolution There is large error, typical frequency sweep OCT system longitudinal resolution is about 2 μm~3 μm of measurement error of 10 μm~15 μm.
As it can be seen that the longitudinal resolution method of measurement optical imaging system is more complicated at present, precision is not high, general without energy In the various longitudinal resolution test equipments and method for carrying out Depth Imaging.
Summary of the invention
The embodiment of the present invention is designed to provide a kind of longitudinal resolution test device, it is intended to solve prior art test The complicated and not accurate problem of optical imaging system longitudinal resolution.
The embodiments of the present invention are implemented as follows, a kind of longitudinal resolution test device, and described device includes:
First light-transmitting plate and the second light-transmitting plate, first light-transmitting plate and second light-transmitting plate one end abut each other company It connects, the other end is attached by connection structure, so as to form thickness between first light-transmitting plate and second light-transmitting plate The wedge-shaped air gap of size gradual change.
Further, first light-transmitting plate is to be fixedly connected or can be rotated with the end that is connected of second light-transmitting plate Connection.
Further, first light-transmitting plate can be integrated or separately fabricated with second light-transmitting plate.
Further, first light-transmitting plate is to be fixedly connected with the end that is connected of second light-transmitting plate, the company Binding structure is optical fiber, and the fiber gripper is fixed between first light-transmitting plate and second light-transmitting plate.
Further, the end that is connected of first light-transmitting plate and second light-transmitting plate is to be rotatably connected, described Connection structure is retractable structure.
Further, maximal clearance is 20~120 microns between first light-transmitting plate and second light-transmitting plate.
Further, second light-transmitting plate is equipped with scale marker, and the scale marker is for indicating described second thoroughly The current location of tabula rasa apart from the wedge-shaped air gap with a thickness of zero at distance.
Further, second light-transmitting plate is equipped with opaque scale plate, institute backwards to the side of first light-transmitting plate It states and corresponds to scale on scale plate equipped with graduation mark, when for for optical imaging system test using the graduation mark as described in Imageable target is observed.
A kind of longitudinal resolution test device provided in an embodiment of the present invention can simple and convenient and objective test it is longitudinal Resolution ratio;And measurement accuracy is high, and it is easy to make, it is low in cost, it is easy to accomplish.
Detailed description of the invention
Fig. 1 is a kind of structural schematic diagram of longitudinal resolution test device provided in an embodiment of the present invention;
Fig. 2 is a kind of schematic diagram that longitudinal resolution test device uses provided in an embodiment of the present invention.
In attached drawing: 1, the first light-transmitting plate;2, the second light-transmitting plate;3, wedge-shaped air gap;4, optical fiber;5, graph paper.
Specific embodiment
In order to make the objectives, technical solutions, and advantages of the present invention clearer, with reference to the accompanying drawings and embodiments, right The present invention is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, and It is not used in the restriction present invention.
Specific implementation of the invention is described in detail below in conjunction with specific embodiment.
It is structure chart and the use of a kind of longitudinal resolution test device provided in an embodiment of the present invention as shown in Fig. 1~2 Schematic diagram, the longitudinal resolution test device in the embodiment of the present invention include:
First light-transmitting plate 1 and the second light-transmitting plate 2, the first light-transmitting plate 1 and 2 one end of the second light-transmitting plate abut each other connection, separately One end is attached by connection structure, so as to form the wedge of thickness size gradual change between the first light-transmitting plate 1 and the second light-transmitting plate 2 Shape the air gap 3.
In embodiments of the present invention, optical imaging system refers to by a variety of optics members such as lens, reflecting mirror, prism and diaphragm The imaging system that part is combined into a certain order.When testing optical imaging system longitudinal resolution, longitudinal resolution is tested and is filled It is placed between optical imaging system and imageable target, the first light-transmitting plate 1 is towards optical imaging system side, and the second light-transmitting plate 2 plate faces are vertical with the direction of observation of optical imaging system;By mobile longitudinal resolution test device, when passing through optical imagery system System it is observed that clearly the image of imageable target when, corresponding wedge-shaped air gap thickness is in longitudinal resolution test device For the resolution ratio of optical imaging system.Entire test process simple operations, convenient test do not need to carry out big data processing point Analysis, greatly improves the test jobs efficiency of longitudinal resolution.
In embodiments of the present invention, by optical imaging system it is observed that clearly the image judgement of imageable target can be with It is observed using more traditional limit, for example observes imaging contexts during moving longitudinal resolution test device, work as imaging When after gradually clear by gradually obscuring, moves repeatedly and search the optimal position of clarity, be located as resolution ratio and most preferably test Point, and then measure the wedge-shaped air gap thickness at this and the longitudinal resolution of optical imaging system can be obtained.
In embodiments of the present invention, the first light-transmitting plate 1 is to be fixedly connected or can turn with the end that is connected of the second light-transmitting plate 2 Dynamic connection;Meanwhile first light-transmitting plate 1 can be integrated with the second light-transmitting plate 2 or separately fabricated;In addition, the embodiment of the present invention In the first light-transmitting plate and the second light-transmitting plate be transparent planarizing material, such as glass material specifically can select glass according to practical The common components such as glass coverslip, the present invention do not enumerate other materials further.
Specifically, as shown in Figure 1, in embodiments of the present invention, the first light-transmitting plate 1 is connected with the second light-transmitting plate 2 To be fixedly connected, connection structure is optical fiber 4 at end, and fiber gripper is fixed between the first light-transmitting plate 1 and the second light-transmitting plate 2.Specifically , optical fiber can be fixed between the first light-transmitting plate 1 and the second light-transmitting plate 2 by optical glue, and use ultraviolet light The fixation that cured mode carries out optical fiber is irradiated, other common optical fiber installation fixed form present invention do not enumerate further And description.
In other embodiments of the invention, the end that is connected of the first light-transmitting plate 1 and the second light-transmitting plate 2 is rotatably to connect It connects, connection structure is retractable structure.Specifically, stretching structure may include that rotation respectively is fixed on the first light-transmitting plate and second The first connecting rod of light-transmitting plate and the second connecting rod, and it is threadedly coupled the adjusting sleeve of first connecting rod and the second connecting rod. By rotating regulating sleeve by the distance between first connecting rod and second connecting rod zoom, thus between adjusting wedge air The maximal clearance thickness value of gap, preferably to test the longitudinal resolution of a variety of different and bigger span optical imaging systems Rate meets greater demand.Specifically, the simple adjustment structure present invention is not further enumerated and is illustrated, those skilled in the art Member is understood that and realizes in foregoing description of the invention.
In embodiments of the present invention, maximal clearance is 20~120 microns between the first light-transmitting plate 1 and the second light-transmitting plate 2, wedge The thickness change of shape the air gap is slower, and the longitudinal resolution precision tested out is higher.
In embodiments of the present invention, the second light-transmitting plate 2 is equipped with scale marker, and scale marker is for indicating the second light-transmitting plate 2 current location apart from wedge-shaped air gap 3 with a thickness of zero at distance.Specifically, scale can make directly in the second light transmission Engraving generation is carried out on plate, it can also be by external reference.For example, by pasting graph paper 5 in the second light transmission back, when When just can clearly differentiate, corresponding wedge-shaped air gap thickness is exactly the longitudinal resolution of system for imaging, combines the at this time One light-transmitting plate and the second light-transmitting plate angle and corresponding graduation range can calculate the thickness for locating the wedge-shaped air gap of the position Degree, the i.e. longitudinal resolution of optical imaging system.Specifically, as shown in Fig. 2, by preset the air gap maximum value h and The distance value L of gap maximum and zero clearance, and then can be found out by the graduation range l proportion of utilization relationship that graph paper 5 is recorded The thickness of corresponding position wedge-shaped air gap, and then obtain the longitudinal resolution of optical imaging system.
In addition, in other embodiments of the invention, it can be on side of second light-transmitting plate 2 backwards to the first light-transmitting plate 1 Equipped with opaque scale plate, scale is corresponded on scale plate equipped with graduation mark, by graduation mark when for testing for optical imaging system It is observed as imageable target, likewise, corresponding wedge-shaped air gap thickness is just when imaging just can be differentiated clearly It is the longitudinal resolution of system, graduated scale is used to have both the effect as imageable target while determining graduation range, so that inspection It surveys and has more simplicity.
In addition, in embodiments of the present invention, test device can be mounted on to accurate mobile platform, for example micrometer drives Moving platform etc., precision when to guarantee that test device is mobile, and then guarantee the precision of test result.
A kind of longitudinal resolution test device provided in an embodiment of the present invention, can be from 0 gradually by building longitudinal size The wedge-shaped air gap of increase, can be simple and convenient and objectively tests longitudinal resolution;And measurement accuracy is high, it is easy to make, It is low in cost, it is easy to accomplish.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all in essence of the invention Made any modifications, equivalent replacements, and improvements etc., should all be included in the protection scope of the present invention within mind and principle.

Claims (8)

1. a kind of longitudinal resolution test device, which is characterized in that described device includes:
First light-transmitting plate and the second light-transmitting plate, first light-transmitting plate and second light-transmitting plate one end abut each other connection, separately One end is attached by connection structure, so as to form thickness size gradually between first light-transmitting plate and second light-transmitting plate The wedge-shaped air gap of change.
2. longitudinal resolution test device according to claim 1, which is characterized in that first light-transmitting plate and described the Two light-transmitting plates are connected end to be fixedly connected or being rotatably connected.
3. longitudinal resolution test device according to claim 1, which is characterized in that first light-transmitting plate and described the Two light-transmitting plates can be integrated or separately fabricated.
4. longitudinal resolution test device according to claim 2, which is characterized in that first light-transmitting plate and described the The end that is connected of two light-transmitting plates is is fixedly connected with, and the connection structure is optical fiber, and the fiber gripper is fixed on described first Between light-transmitting plate and second light-transmitting plate.
5. longitudinal resolution test device according to claim 2, which is characterized in that first light-transmitting plate and described the To be rotatably connected, the connection structure is retractable structure at the end that is connected of two light-transmitting plates.
6. longitudinal resolution test device according to claim 4 or 5, which is characterized in that first light-transmitting plate and institute Stating maximal clearance between the second light-transmitting plate is 20~120 microns.
7. longitudinal resolution test device according to claim 1, which is characterized in that second light-transmitting plate, which is equipped with, to be carved Scale is known, the scale marker be used to indicate the current location of second light-transmitting plate apart from the wedge-shaped air gap with a thickness of Distance at zero.
8. longitudinal resolution test device according to claim 7, which is characterized in that second light-transmitting plate is backwards to described The side of first light-transmitting plate is equipped with opaque scale plate, and scale is corresponded on the scale plate equipped with graduation mark, described in supplying Optical imaging system is observed when testing using the graduation mark as the imageable target.
CN201910459755.0A 2019-05-29 2019-05-29 Longitudinal resolution testing device Active CN110186654B (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112057050A (en) * 2019-09-17 2020-12-11 苏州阿格斯医疗技术有限公司 OCT system axial resolution measuring method
CN112957012A (en) * 2021-02-01 2021-06-15 浙江省医疗器械检验研究院 Axial resolution measuring device and method for optical interference tomography system

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52110684A (en) * 1976-03-15 1977-09-16 Nippon Telegr & Teleph Corp <Ntt> Measuring apparatus for refractive index distribution
GB2250884A (en) * 1990-12-07 1992-06-17 Philips Electronic Associated Optical image sensing array with microscan
JPH11248597A (en) * 1998-03-06 1999-09-17 Nikon Corp Method for measuring laser durability
CN1184927C (en) * 2002-06-14 2005-01-19 清华大学 Method and system of raising longitudinal resolution of optical coherent chromatographic imaging
CN101055343A (en) * 2006-04-12 2007-10-17 明基电通信息技术有限公司 Resolution-adjustable imaging device
CN103822971A (en) * 2014-03-06 2014-05-28 北京理工大学 Resolution detecting and calibrating method for ultrasonic microscope

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52110684A (en) * 1976-03-15 1977-09-16 Nippon Telegr & Teleph Corp <Ntt> Measuring apparatus for refractive index distribution
GB2250884A (en) * 1990-12-07 1992-06-17 Philips Electronic Associated Optical image sensing array with microscan
JPH11248597A (en) * 1998-03-06 1999-09-17 Nikon Corp Method for measuring laser durability
CN1184927C (en) * 2002-06-14 2005-01-19 清华大学 Method and system of raising longitudinal resolution of optical coherent chromatographic imaging
CN101055343A (en) * 2006-04-12 2007-10-17 明基电通信息技术有限公司 Resolution-adjustable imaging device
CN103822971A (en) * 2014-03-06 2014-05-28 北京理工大学 Resolution detecting and calibrating method for ultrasonic microscope

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112057050A (en) * 2019-09-17 2020-12-11 苏州阿格斯医疗技术有限公司 OCT system axial resolution measuring method
CN112057050B (en) * 2019-09-17 2022-07-12 苏州阿格斯医疗技术有限公司 OCT system axial resolution measuring method
CN112957012A (en) * 2021-02-01 2021-06-15 浙江省医疗器械检验研究院 Axial resolution measuring device and method for optical interference tomography system

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