CN110010483A - 一种电磁屏蔽功能的射频芯片三维封装工艺 - Google Patents

一种电磁屏蔽功能的射频芯片三维封装工艺 Download PDF

Info

Publication number
CN110010483A
CN110010483A CN201811176942.XA CN201811176942A CN110010483A CN 110010483 A CN110010483 A CN 110010483A CN 201811176942 A CN201811176942 A CN 201811176942A CN 110010483 A CN110010483 A CN 110010483A
Authority
CN
China
Prior art keywords
circuit board
flexible circuit
chip
functional chip
pad
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201811176942.XA
Other languages
English (en)
Other versions
CN110010483B (zh
Inventor
马飞
冯光建
王永河
程明芳
郭丽丽
郑赞赞
陈雪平
郁发新
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Zhejiang Jimeike Microelectronics Co Ltd
Zhejiang Jimaike Microelectronics Co Ltd
Original Assignee
Zhejiang Jimeike Microelectronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zhejiang Jimeike Microelectronics Co Ltd filed Critical Zhejiang Jimeike Microelectronics Co Ltd
Priority to CN201811176942.XA priority Critical patent/CN110010483B/zh
Publication of CN110010483A publication Critical patent/CN110010483A/zh
Application granted granted Critical
Publication of CN110010483B publication Critical patent/CN110010483B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/48Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
    • H01L21/4814Conductive parts
    • H01L21/4846Leads on or in insulating or insulated substrates, e.g. metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/552Protection against radiation, e.g. light or electromagnetic waves
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L24/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L24/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16135Disposition the bump connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
    • H01L2224/16145Disposition the bump connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/832Applying energy for connecting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/852Applying energy for connecting

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
  • Structure Of Printed Boards (AREA)

Abstract

本发明公开了一种电磁屏蔽功能的射频芯片三维封装工艺,包括如下步骤:101)柔性电路板处理步骤、102)安置功能芯片步骤、103)封装步骤;本发明提供避免了芯片间的电磁干扰的一种电磁屏蔽功能的射频芯片三维封装工艺。

Description

一种电磁屏蔽功能的射频芯片三维封装工艺
技术领域
本发明涉及半导体技术领域,更具体的说,它涉及一种电磁屏蔽功能的射频芯片三维封装工艺。
背景技术
随着芯片尺寸的逐渐缩小,传统的单片式封装工艺已经从原来的插槽式过渡到BGA,再到WLCSP最后到Fan-out,但是随着系统级功能模块的提出,系统级封装的方式又逐渐取代了过去的单片式,通过载体,把不同材质和不同功能的芯片集成到一个较小的区域,减少了芯片的单位占用面积,缩短了信号互联线,同时有利于产品的组装。
然而对于通信行业来讲,高频的射频芯片逐渐替代了原来的低频产品,这样射频芯片与射频芯片之间,射频芯片与其他功能芯片之间以及射频系统级模块跟其他射频系统级模块之间的电磁波干扰问题就越来越被重视起来。
为了应对这个问题,电磁屏蔽层的增加是目前的主流手段,也是防止电磁波污染所必须的防护手段,一般IC芯片塑胶体是不导电的,对电磁场几乎没有屏蔽作用。目前比较多的是在封装体外面放置金属屏蔽罩,这种方式屏蔽性能好,但是比重大,占用面积大,成本高,且不耐腐蚀。
发明内容
本发明克服了现有技术的不足,提供避免了芯片间的电磁干扰的一种电磁屏蔽功能的射频芯片三维封装工艺。
本发明的技术方案如下:
一种电磁屏蔽功能的射频芯片三维封装工艺,具体处理包括如下步骤:
101)柔性电路板处理步骤:在柔性电路板的表面制作线路RDL,柔性电路板包括线路层和有机膜,线路层为N层,有机膜为N+1层,线路层和有机膜之间间隔设置;有机膜厚度在100nm到500um之间,线路层厚度在100nm到500um之间,宽度在1um到500um之间;线路层的金属材质采用钛、铜、铝、银、钯、金、铊、锡或镍;
柔性电路板上一端的下表面刻蚀孔,使RDL和焊盘露出来,然后通过光刻电镀工艺在有机膜上制作金属层,金属层采用钛、铜、铝、银、钯、金、铊、锡或镍,金属层厚度范围在100nm到300um之间;金属层包括互联焊盘和粘接焊盘;
在柔性电路板上做镂空结构,在镂空结构上镶嵌铜块,铜块厚度范围在300nm到600um之间;镂空结构包括两处,第一镂空处在柔性电路板的中间,第二镂空处在柔性电路板的另一端;
102)安置功能芯片步骤;把第一功能芯片焊接在柔性电路板的第一镂空处上,打引线使第一功能芯片跟电路板互联,通过贴片工艺把第二功能芯片贴装在第一功能芯片上,第二功能芯片表面涂胶,把柔性线路板刻蚀孔的一端粘贴在第二功能芯片的表面;
103)封装步骤:通过键合工艺把第三功能芯片放置于柔性线路板的一端的金属层粘接焊盘上,把柔性线路板的另一端的镶铜通过粘接的工艺盖在第三功能芯片的顶部;切割成单一模组,通过贴片工艺把模组焊接在基板或者电路板表面的焊球或焊盘上完成芯片的互联。
进一步的,基板或者PCB板上制作RDL和焊盘,焊盘表面制作焊球,在基板或者PCB板的下方做镂空,中间嵌铜。
进一步的,有机膜包括聚四氟乙烯塑料、环氧树脂或聚氨酯。
本发明相比现有技术优点在于:本发明利用柔性电路板做基板,在上面制作线路和电磁屏蔽功能的金属块,通过柔性电路板的折叠实现芯片的三维堆叠和电磁屏蔽,节省了面积,同时还使每个芯片都有自己的区域,避免了芯片间的电磁干扰。
附图说明
图1为本发明的柔性电路板结构图;
图2为本发明的柔性电路板上设置第一功能芯片结构图;
图3为本发明的图2上设置第二功能芯片结构图;
图4为本发明的图3上折形的结构图;
图5为本发明的图4上设置第三功能芯片的结构图;
图6为本发明的基板结构图;
图7为本发明的结构图。
图中标识:柔性电路板101、铜块102、金属层103、第一功能芯片201、第二功能芯片202、第三功能芯片203、基板301、焊球302、嵌铜303。
具体实施方式
下面详细描述本发明的实施方式,其中自始至终相同或类似的标号表示相同或类似的元件或类似功能的元件。下面通过参考附图描述的实施方式是示例性的,仅用于解释本发明而不能作为对本发明的限制。
本技术领域技术人员可以理解的是,除非另外定义,这里使用的所有术语(包括技术术语和科技术语)具有与本发明所属领域中的普通技术人员的一般理解相同的意义。还应该理解的是,诸如通用字典中定义的那些术语应该被理解为具有与现有技术的上下文中的意义一致的意义,并且除非像这里一样的定义,不会用理想化或过于正式的含义来解释。
各实施方式中提到的有关于步骤的标号,仅仅是为了描述的方便,而没有实质上先后顺序的联系。各具体实施方式中的不同步骤,可以进行不同先后顺序的组合,实现本发明的发明目的。
下面结合附图和具体实施方式对本发明进一步说明。
如图1至图7所示,一种电磁屏蔽功能的射频芯片三维封装工艺,具体处理包括如下步骤:
101)柔性电路板101处理步骤:在柔性电路板101的表面制作线路RDL,柔性电路板101包括线路层和有机膜,线路层为N层,有机膜为N+1层,线路层和有机膜之间间隔设置。即可以是一层线路,两层有机膜,也可以是两层线路,三层有机膜等,此处一般线路层数在1~10层之间,有机膜在2~11层之间,两者间互相穿插,一层线路层一层有机膜的结构,其中有机膜多的一层为底层。有机膜厚度在100nm到500um之间,线路层厚度在100nm到500um之间,宽度在1um到500um之间。线路层的金属材质采用钛、铜、铝、银、钯、金、铊、锡或镍。
柔性电路板101上一端的下表面刻蚀孔,使RDL和焊盘露出来,然后通过光刻电镀工艺在有机膜上制作金属层103,金属层103采用钛、铜、铝、银、钯、金、铊、锡或镍,金属层103厚度范围在100nm到300um之间。金属层103包括互联焊盘和粘接焊盘两种结构。
在柔性电路板101上做镂空结构,在镂空结构上镶嵌铜块102,铜块102厚度范围在300nm到600um之间。镂空结构包括两处,第一镂空处在柔性电路板101的中间,第二镂空处在柔性电路板101的另一端。
102)安置功能芯片步骤。把第一功能芯片201焊接在柔性电路板101的第一镂空处上,打引线使第一功能芯片201跟电路板互联,通过贴片工艺把第二功能芯片202贴装在第一功能芯片201上,第二功能芯片202表面涂胶,把柔性线路板刻蚀孔的一端粘贴在第二功能芯片202的表面。
具体如图2所示,把第一功能芯片201焊接在柔性电路板101的镶铜上,打引线使第一功能芯片201跟电路板互联。
如图3所示,贴片工艺把第二功能芯片202贴装在第一功能芯片201上,使这两种芯片形成chip to chip键合即芯片对芯片的键合。此处的第二功能芯片202上预先布置RDL和焊盘。
如图4所示,在第三功能芯片203表面涂胶,把柔性线路板粘贴在第二功能芯片202的表面。
103)封装步骤:通过键合工艺把第三功能芯片203放置于柔性线路板的一端的金属层103粘接焊盘上,把柔性线路板的另一端的铜块102通过粘接的工艺盖在第三功能芯片203的顶部,再切割成单一模组,通过贴片工艺把模组焊接在基板301或者电路板表面的焊球302或焊盘上完成芯片的互联。
具体如图5所示,通过键合工艺把第三功能芯片203放置于柔性线路板的金属层103粘接焊盘上,使第三功能芯片203上的线路跟柔性线路板上的焊盘互联。
如图6所示,制作基板301或者PCB板,在板上制作RDL和焊盘,焊盘表面制作BGA植球302,在基板301的下方做镂空,中间嵌铜303。
把柔性线路板切割成单一模组,通过贴片工艺把模组焊接在基板301或者电路板表面的焊球302或焊盘上完成芯片的互联。
以上所述仅是本发明的优选实施方式,应当指出,对于本技术领域的普通技术人员,在不脱离本发明构思的前提下,还可以做出若干改进和润饰,这些改进和润饰也应视为本发明保护范围内。

Claims (3)

1.一种电磁屏蔽功能的射频芯片三维封装工艺,其特征在于,具体处理包括如下步骤:
101)柔性电路板处理步骤:在柔性电路板的表面制作线路RDL,柔性电路板包括线路层和有机膜,线路层为N层,有机膜为N+1层,线路层和有机膜之间间隔设置;有机膜厚度在100nm到500um之间,线路层厚度在100nm到500um之间,宽度在1um到500um之间;线路层的金属材质采用钛、铜、铝、银、钯、金、铊、锡或镍;
柔性电路板上一端的下表面刻蚀孔,使RDL和焊盘露出来,然后通过光刻电镀工艺在有机膜上制作金属层,金属层采用钛、铜、铝、银、钯、金、铊、锡或镍,金属层厚度范围在100nm到300um之间;金属层包括互联焊盘和粘接焊盘;
在柔性电路板上做镂空结构,在镂空结构上镶嵌铜块,铜块厚度范围在300nm到600um之间;镂空结构包括两处,第一镂空处在柔性电路板的中间,第二镂空处在柔性电路板的另一端;
102)安置功能芯片步骤;把第一功能芯片焊接在柔性电路板的第一镂空处上,打引线使第一功能芯片跟电路板互联,通过贴片工艺把第二功能芯片贴装在第一功能芯片上,第二功能芯片表面涂胶,把柔性线路板刻蚀孔的一端粘贴在第二功能芯片的表面;
103)封装步骤:通过键合工艺把第三功能芯片放置于柔性线路板的一端的金属层粘接焊盘上,把柔性线路板的另一端的镶铜通过粘接的工艺盖在第三功能芯片的顶部;切割成单一模组,通过贴片工艺把模组焊接在基板或者电路板表面的焊球或焊盘上完成芯片的互联。
2.根据权利要求1所述的一种电磁屏蔽功能的射频芯片三维封装工艺,其特征在于:基板或者PCB板上制作RDL和焊盘,焊盘表面制作焊球,在基板或者PCB板的下方做镂空,中间嵌铜。
3.根据权利要求1所述的一种电磁屏蔽功能的射频芯片三维封装工艺,其特征在于:有机膜包括聚四氟乙烯塑料、环氧树脂或聚氨酯。
CN201811176942.XA 2018-10-10 2018-10-10 一种电磁屏蔽功能的射频芯片三维封装工艺 Active CN110010483B (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201811176942.XA CN110010483B (zh) 2018-10-10 2018-10-10 一种电磁屏蔽功能的射频芯片三维封装工艺

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201811176942.XA CN110010483B (zh) 2018-10-10 2018-10-10 一种电磁屏蔽功能的射频芯片三维封装工艺

Publications (2)

Publication Number Publication Date
CN110010483A true CN110010483A (zh) 2019-07-12
CN110010483B CN110010483B (zh) 2020-08-28

Family

ID=67164969

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201811176942.XA Active CN110010483B (zh) 2018-10-10 2018-10-10 一种电磁屏蔽功能的射频芯片三维封装工艺

Country Status (1)

Country Link
CN (1) CN110010483B (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115119487A (zh) * 2022-04-15 2022-09-27 平头哥(上海)半导体技术有限公司 电磁干扰屏蔽组件、制造方法以及电磁干扰屏蔽方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004128418A (ja) * 2002-10-07 2004-04-22 Matsushita Electric Ind Co Ltd 半導体装置およびその製造方法
US20070138615A1 (en) * 2005-12-16 2007-06-21 Chieh-Chia Hu Packaging method of a plurality of chips stacked on each other and package structure thereof
CN103560125A (zh) * 2013-11-05 2014-02-05 华进半导体封装先导技术研发中心有限公司 三维柔性基板电磁屏蔽封装结构及制作方法
CN103560119A (zh) * 2013-11-05 2014-02-05 华进半导体封装先导技术研发中心有限公司 用于多屏蔽芯片的三维柔性基板封装结构及制作方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004128418A (ja) * 2002-10-07 2004-04-22 Matsushita Electric Ind Co Ltd 半導体装置およびその製造方法
US20070138615A1 (en) * 2005-12-16 2007-06-21 Chieh-Chia Hu Packaging method of a plurality of chips stacked on each other and package structure thereof
CN103560125A (zh) * 2013-11-05 2014-02-05 华进半导体封装先导技术研发中心有限公司 三维柔性基板电磁屏蔽封装结构及制作方法
CN103560119A (zh) * 2013-11-05 2014-02-05 华进半导体封装先导技术研发中心有限公司 用于多屏蔽芯片的三维柔性基板封装结构及制作方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115119487A (zh) * 2022-04-15 2022-09-27 平头哥(上海)半导体技术有限公司 电磁干扰屏蔽组件、制造方法以及电磁干扰屏蔽方法

Also Published As

Publication number Publication date
CN110010483B (zh) 2020-08-28

Similar Documents

Publication Publication Date Title
US5987744A (en) Method for supporting one or more electronic components
US6734534B1 (en) Microelectronic substrate with integrated devices
US8004068B2 (en) Shielded multi-layer package structures
US7885079B2 (en) Flexible electronic assembly
KR100834657B1 (ko) 전자 장치용 기판 및 그 제조 방법, 및 전자 장치 및 그제조 방법
US20080157342A1 (en) Package with a marking structure and method of the same
US10573536B2 (en) Semiconductor package and method for fabricating base for semiconductor package
US9589920B2 (en) Chip package
JP2000323616A (ja) 半導体パッケージ及びその製造方法
US10847496B2 (en) Chip wiring method and structure
US20100236821A1 (en) Electronic Component-Embedded Printed Circuit Board
US8421204B2 (en) Embedded semiconductor power modules and packages
CN112103194A (zh) 转接基板及其制作方法、器件封装结构
KR100411862B1 (ko) 배선기판 및 반도체장치
KR20210114196A (ko) 인쇄회로기판 및 이의 제조 방법
CN112042283B (zh) 印刷电路板和印刷电路板条带
CN116097910A (zh) 电路板
CN110010483A (zh) 一种电磁屏蔽功能的射频芯片三维封装工艺
KR20210154450A (ko) 인쇄회로기판 및 이의 제조 방법
US20090108444A1 (en) Chip package structure and its fabrication method
CN109661124A (zh) 一种ic载板新型表面处理方法
US20060284290A1 (en) Chip-package structure and fabrication process thereof
CN108461458B (zh) 表面贴装型封装结构及其制作方法
US6420207B1 (en) Semiconductor package and enhanced FBG manufacturing
KR20210080833A (ko) 인쇄회로기판 및 이의 제조 방법

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant