CN109753027A - It is a kind of industry manufacture in parameter monitoring method and device - Google Patents

It is a kind of industry manufacture in parameter monitoring method and device Download PDF

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Publication number
CN109753027A
CN109753027A CN201711092136.XA CN201711092136A CN109753027A CN 109753027 A CN109753027 A CN 109753027A CN 201711092136 A CN201711092136 A CN 201711092136A CN 109753027 A CN109753027 A CN 109753027A
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China
Prior art keywords
parameter
schedule
curve
technological parameter
technological
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徐宇
吴云崇
邓超
戢洋
张伟强
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Alibaba Group Holding Ltd
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Alibaba Group Holding Ltd
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Priority to CN201711092136.XA priority Critical patent/CN109753027A/en
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

Abstract

The embodiment of the present application disclose it is a kind of industry manufacture in parameter monitoring method, when technological parameter is monitored in the batch to an industry manufacture, current manufacturing schedule that can be locating in industry manufacture according to the batch, the standard parameter for monitoring the technological parameter is determined from schedule parameter curve, in monitoring the batch during technological parameter, as the standard parameter that corresponding different manufacturing schedules can be used in the passage of manufacturing schedule is monitored, since standard parameter corresponding to a manufacturing schedule can embody the normal range (NR) that the technological parameter should be in the manufacturing schedule, therefore it is contemplated that technological parameter may be in the otherness under different manufacturing schedules in such a way that the standard parameter in schedule parameter curve is monitored, improve monitoring accuracy.The embodiment of the present application also discloses monitoring device, processing equipment and the corresponding medium and computer program product etc. of parameter in a kind of industry manufacture.

Description

It is a kind of industry manufacture in parameter monitoring method and device
Technical field
This application involves data processing fields, more particularly to the monitoring method and device of parameter in a kind of industry manufacture.
Background technique
With manufacturing development, normality is become by Machine automated manufacturing product.It is carried out using machine During the manufacturing, the parameters during manufacturing can be monitored by devices such as sensors.It is collected Various process parameters can reflect out running precision of the machine during manufacturing.
For machine with using the appearance strain that the time can be more or less to even result in failure, strain or failure influence whether machine The running precision that device can be provided.Therefore in traditional approach, general every technological parameter by acquiring during manufacturing, and According to the running precision that the change monitoring machine of every technological parameter provides, to determine whether machine situations such as strain occurs.
For a batch in production process, i.e., certain produces product from the production for starting to produce to production is terminated Journey, traditional approach can be monitored the collected technological parameter in the batch, in monitoring, can will generally adopt in the batch A kind of parameter of collection monitors whether this kind of parameter has exceeded Standard of Monitoring as individual monitored object.
Summary of the invention
It is all unified in entire batch to use fixed preset areas when being monitored due to being directed to a kind of parameter in traditional approach Between as monitoring foundation, not in view of in a batch, otherness of this kind of parameter in different manufacturing schedules may Larger, by taking temperature as an example, in a batch, temperature can tend towards stability after low be gradually increased when starting production, then fast Terminate to gradually decrease when production, temperature range when according to unified Standard of Monitoring such as steady production then may cause Production start or at the end of because temperature it is relatively low mistake carry out alarm even shut down, affect production efficiency.
So in traditional approach, in a batch in such a way that unified Standard of Monitoring is monitored parameter simultaneously Inaccuracy.
In order to solve the above-mentioned technical problem, this application provides it is a kind of industry manufacture in parameter monitoring method and device,
The embodiment of the present application discloses following technical solution:
In a first aspect, the embodiment of the present application provide it is a kind of industry manufacture in parameter monitoring method, comprising:
Determine current manufacturing schedule;
Based on schedule parameter curve, the corresponding standard parameter of the current manufacturing schedule is determined;
The technological parameter that will be detected under the current manufacturing schedule, compares with determining standard parameter, with reality Now the technological parameter is monitored;
Wherein, the schedule parameter curve is the curve that the standard process parameters under corresponding different manufacturing schedules are formed.
Optionally, the schedule parameter curve is obtained according to following manner:
The setting value that the technological parameter is arranged is determined according to the technological parameter of acquisition;
Determine to correspond to the schedule parameter curve of the technological parameter according to the setting value.
Optionally, the history number of the setting value is met according to the schedule parameter curve of the correspondence technological parameter It is obtained according to cluster, the historical data is historical data of the technological parameter in history batch.
Optionally, in the corresponding schedule parameter curve of the calculating technological parameter, the method also includes:
Obtain historical data of the technological parameter in history batch;
Remove in the historical data due to the extremely caused abnormal data of acquisition device;
The corresponding schedule parameter curve of the technological parameter is determined according to the historical data after the removal abnormal data.
Optionally, the standard parameter is according to the corresponding relationship between manufacturing schedule and the schedule parameter curve, from institute State the parameter corresponding with the current manufacturing schedule determined in schedule parameter curve.
Optionally, the technological parameter that will be detected under the current manufacturing schedule, with determining standard parameter into Row comparison, is monitored the technological parameter with realizing, comprising:
Count the mean value of the technological parameter collected in the current manufacturing schedule;
The mean value is monitored using the standard parameter.
Second aspect, the embodiment of the present application provide a kind of monitoring device of parameter in industry manufacture, including determination unit And monitoring unit:
The determination unit, for determining current manufacturing schedule;
The determination unit is also used to determine the corresponding standard ginseng of the current manufacturing schedule based on schedule parameter curve Number;
The monitoring unit, the technological parameter for will be detected under the current manufacturing schedule, with determining standard Parameter compares, and is monitored with realizing to the technological parameter;
Wherein, the schedule parameter curve is the curve that the standard process parameters under corresponding different manufacturing schedules are formed.
Optionally, the determination unit is also used to be determined according to the technological parameter of acquisition to set the technological parameter The setting value set;Determine to correspond to the schedule parameter curve of the technological parameter according to the setting value.
Optionally, the history number of the setting value is met according to the schedule parameter curve of the correspondence technological parameter It is obtained according to cluster, the historical data is historical data of the technological parameter in history batch.
Optionally, the determination unit is also used to obtain historical data of the technological parameter in history batch;Removal In the historical data due to the extremely caused abnormal data of acquisition device;According to the history number after the removal abnormal data According to determining the corresponding schedule parameter curve of the technological parameter.
Optionally, the standard parameter is according to the corresponding relationship between manufacturing schedule and the schedule parameter curve, from institute State the parameter corresponding with the current manufacturing schedule determined in schedule parameter curve.
Optionally, the monitoring unit is also used to count the technological parameter collected in the current manufacturing schedule Mean value;The mean value is monitored using the standard parameter.
The third aspect, the embodiment of the present application provides a kind of processing equipment for parameter monitoring in industry manufacture, described Processing equipment includes processor and memory, in which:
The memory is transferred to the processor for storing program code, and by said program code;
The processor, for according to the instruction execution following methods in said program code:
Determine current manufacturing schedule;
Based on schedule parameter curve, the corresponding standard parameter of the current manufacturing schedule is determined;
The technological parameter that will be detected under the current manufacturing schedule, compares with determining standard parameter, with reality Now the technological parameter is monitored;
Wherein, the schedule parameter curve is the curve that the standard process parameters under corresponding different manufacturing schedules are formed.
Optionally, the processor is also used to according to the following method of instruction execution in said program code:
The setting value that the technological parameter is arranged is determined according to the technological parameter of acquisition;
Determine to correspond to the schedule parameter curve of the technological parameter according to the setting value.
Optionally, the history number of the setting value is met according to the schedule parameter curve of the correspondence technological parameter It is obtained according to cluster, the historical data is historical data of the technological parameter in history batch.
Optionally, the processor is also used to according to the following method of instruction execution in said program code:
Obtain historical data of the technological parameter in history batch;
Remove in the historical data due to the extremely caused abnormal data of acquisition device;
The corresponding schedule parameter curve of the technological parameter is determined according to the historical data after the removal abnormal data.
Optionally, the standard parameter is according to the corresponding relationship between manufacturing schedule and the schedule parameter curve, from institute State the parameter corresponding with the current manufacturing schedule determined in schedule parameter curve.
Optionally, the processor is also used to according to the following method of instruction execution in said program code:
Count the mean value of the technological parameter collected in the current manufacturing schedule;
The mean value is monitored using the standard parameter.
It, can when technological parameter is monitored in the batch to an industry manufacture it can be seen from above-mentioned technical proposal With the current manufacturing schedule locating in industry manufacture according to the batch, determined from schedule parameter curve for monitoring the work The standard parameter of skill parameter, in monitoring the batch during technological parameter, as the passage of manufacturing schedule can be used pair The standard parameter of different manufacturing schedules is answered to be monitored, the standard parameter as corresponding to a manufacturing schedule can embody this The normal range (NR) that the technological parameter should be in manufacturing schedule, therefore be monitored by the standard parameter in schedule parameter curve Mode it is contemplated that technological parameter may improve monitoring accuracy in the otherness under different manufacturing schedules.
Detailed description of the invention
In order to illustrate the technical solutions in the embodiments of the present application or in the prior art more clearly, to embodiment or will show below There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this Some embodiments of application without any creative labor, may be used also for those of ordinary skill in the art To obtain other drawings based on these drawings.
Fig. 1 is a kind of corresponding schedule parameter curve synoptic diagram of technological parameter provided by the embodiments of the present application;
Fig. 2 is the method flow of the monitoring method of the parameter in a kind of batch industry manufacture provided by the embodiments of the present application Figure;
Fig. 3 (a) is the parameter value scatter plot after a kind of history batch cluster of technological parameter provided by the embodiments of the present application;
Fig. 3 (b) is the probability density distribution figure of technological parameter mean value under a kind of manufacturing schedule provided by the embodiments of the present application;
Fig. 4 (a) is the parameter before a kind of removal extremely caused abnormal data of acquisition device provided by the embodiments of the present application It is worth curve;
Fig. 4 (b) is the parameter after a kind of removal extremely caused abnormal data of acquisition device provided by the embodiments of the present application It is worth curve;
Fig. 5 is the structure drawing of device of the monitoring device of parameter in a kind of industry manufacture provided by the embodiments of the present application;
Fig. 6 is a kind of structure chart for the processing equipment of parameter monitoring in industry manufacture provided by the embodiments of the present application.
Specific embodiment
With reference to the accompanying drawing, embodiments herein is described.
In the production process of industry manufacture, equipment can acquire the physical quantitys such as real-time temperature, flow, linear velocity, humidity, These physical quantitys are properly termed as technological parameter.In order to find the abnormal conditions of process parameter value in time in process of production, It needs to monitor technological parameter in real time in entire production process, whether monitoring parameter value exceeds reasonable parameter value model It encloses.In traditional parameter monitoring mode, collected technological parameter in a batch can be generally monitored.In the mistake of monitoring Cheng Zhong, it will usually collected a kind of technological parameter in the batch be selected to set as individual monitored object, and for this kind of parameter A fixed parameter value standard is set, and then monitors whether this kind of parameter has exceeded the parameter value standard.
Inventors have found that all uniformly making in entire batch when being monitored in traditional approach for a kind of technological parameter Use the same parameter value as the foundation of monitoring.But in fact, the same technological parameter is in different production in a batch Otherness in progress may be larger, if all being monitored using the same standard in entire batch, it is likely that will lead in life Alarm continually occurs during producing even to shut down, so that production efficiency is affected, for example, being during intermetallic composite coating Allow metal that can reach fusing point to carry out plastic deformation, temperature can tend towards stability after low be gradually increased when starting production, then After the completion of plastic deformation, temperature is gradually decreased, if being all made of the same standard such as steady production in entire batch process When temperature range, then may result in production start or at the end of, mistakenly alarmed even because temperature is relatively low It shuts down.It obviously, is unreasonable in such a way that unified Standard of Monitoring is monitored parameter in a batch.
So the embodiment of the present application provide it is a kind of industry manufacture in parameter monitoring method and device, it is desirable to be directed to During technological parameter is monitored, can fully take into account the same technological parameter may be in the difference under different manufacturing schedules The opposite sex to improve the accuracy of monitoring, and then can help producers that can timely and effectively find machine or spare part Abnormal conditions.
The schedule parameter curve being previously mentioned in the embodiment of the present application is to be able to intuitively embody monitored parameter one Regime values or numberical range under each manufacturing schedule of a batch, wherein schedule parameter curve can be used for one batch Parameter in secondary is monitored.And for a batch in the production process of industry manufacture, i.e., certain production product is from the beginning of Produce the production process for terminating production.
Under normal circumstances, the abscissa of coordinate system where schedule parameter curve can be manufacturing schedule, and ordinate can be The parameter value of the parameter, in some cases, when manufacturing schedule has certain corresponding relationship with the time, the horizontal seat of schedule parameter curve Mark can also be the time.And the form of the schedule parameter curve does not limit in the embodiment of the present application, such as can be numerical value The form that range changes with manufacturing schedule is also possible to the form that numerical value changes with manufacturing schedule.In numerical value with production Under the form of progress variation, schedule parameter curve can be a curve, as manufacturing schedule floats up and down, schedule parameter curve It can be the form of two curves, this two curves can be used for limiting the upper and lower bound of parameter fluctuation respectively, when monitored The numerical value of the parameter be located between this two curves it may be considered that normal.
For convenience of understanding, next Fig. 1 is combined to be illustrated schedule parameter curve.In a batch shown in Figure 1 The corresponding schedule parameter curve of certain technological parameter, the schedule parameter curve are made of upper limit curve A and offline curve B, abscissa Axis is the manufacturing schedule in the batch, and axis of ordinates is parameter value, wherein the schedule parameter curve is preceding 5% in manufacturing schedule When part and the schedule parameter curve manufacturing schedule be 5% to manufacturing schedule be 20% when part defined by numerical value Section is different, and the schedule parameter curve manufacturing schedule be 20% to manufacturing schedule be 40% when part therewith Numerical intervals defined by corresponding schedule parameter curved portion are different again under preceding manufacturing schedule, that is to say, that entire In batch, the corresponding schedule parameter curve numberical range defined in different manufacturing schedules of same technological parameter can be with It has differences.
It should be noted that manufacturing schedule can be performance level of the product within some stage, generally in secondary by the gross Manufacturing schedule, such as 50%, 90% are indicated in the form of percentage.Under normal circumstances, over time, a batch Manufacturing schedule can also increase accordingly.
Since different production technologies usually can be used in the different production phases in actual production process, and it is different Production technology requires but to be different for the parameter value of same technological parameter, for example technological parameter is pressure, the weldering of metal Melting welding or pressure welding can be divided by connecing technique, wherein melting welding for pressure there is no any requirement, and requirement of the pressure welding for pressure It is higher.Even and if being all made of same production technology in process of production, but the requirement in the different production phases for parameter value Also it is still different, for example, technological parameter is temperature, in the process of metal, for temperature in the plastic deformation stage It is required that be the fusing point that temperature value is higher than metal, and the requirement in metal hardening phase for temperature is usually that temperature value is 800-1000 degrees Celsius.
So needing to reasonably monitor the same technological parameter under different manufacturing schedules to the different production phases Corresponding measurement standard is set, and the embodiment of the present application can pass through the parameter value difference of different manufacturing schedules in the entire batch of combination Property, several manufacturing schedule sections are divided into according to manufacturing schedule to entire batch, so as to according to each manufacturing schedule section Reasonable measurement standard is determined from schedule parameter curve corresponding to the technological parameter.
For ease of description, schedule parameter curve measurement standard corresponding to different manufacturing schedule sections can be known as marking Quasi- parameter, the standard parameter determined by manufacturing schedule section with measurement standard, the corresponding progress of a technological parameter Parameter curve can determine multiple standard parameters according to manufacturing schedule, and wherein any one standard parameter can embody this The zone of reasonableness that the technological parameter should be in manufacturing schedule section corresponding to standard parameter.Manufacturing schedule area for ease of understanding Between corresponding relationship with standard parameter, equally illustrated with temperature, it is assumed that in a batch, manufacturing schedule section is When [10%, 30%], the corresponding standard parameter in manufacturing schedule section can be 90 DEG C, and manufacturing schedule section be [90%, When 95%], which can be 35 DEG C;At this point, when manufacturing schedule is 25%, due to this Manufacturing schedule 25% is located in manufacturing schedule section [10%, 30%], it can be considered that the corresponding mark of manufacturing schedule 25% Quasi- parameter is 90 DEG C;When manufacturing schedule is 93%, since the manufacturing schedule 93% is located at manufacturing schedule section [90%, 95%] In, it can be considered that the corresponding standard parameter of manufacturing schedule 93% is 35 DEG C.
Since entire batch can be divided into multiple manufacturing schedule sections, and different manufacturing schedule section corresponding one Subparameter, therefore standard corresponding with manufacturing schedule section locating for the manufacturing schedule can be used under different manufacturing schedules Parameter is monitored technological parameter, so as in view of technological parameter may in the otherness under different manufacturing schedules, And then improve the accuracy of monitoring.
The parameter in batch is monitored next, illustrating how the embodiment of the present application is realized in conjunction with Fig. 2.
Fig. 2 it is provided by the embodiments of the present application it is a kind of industry manufacture in parameter monitoring method method flow diagram, this method Applied to a batch, specifically, method includes the following steps:
S201: current manufacturing schedule is determined.
When carrying out technological parameter monitoring to a batch in industry manufacture, it is as provided by the embodiment of the present application Monitor mode based on manufacturing schedule, therefore need the clearly current manufacturing schedule of the batch is how many, so as to accurately really Make the standard parameter of corresponding current manufacturing schedule.
S202: it is based on schedule parameter curve, determines the corresponding standard parameter of the current manufacturing schedule.
S203: the technological parameter that will be detected under the current manufacturing schedule is compared with determining standard parameter, The technological parameter is monitored with realizing.
It, can since a schedule parameter curve can correspond to a kind of technological parameter, therefore when being monitored to technological parameter To determine the required corresponding schedule parameter curve of technological parameter monitored.Wherein, which is corresponding different lifes The curve that standard process parameters under production progress are formed
In this step, the schedule parameter curve being based on can be the technological parameter monitored as needed and determine, need The technological parameter of monitoring can be one or more.
In industrial manufacturing process, the requirement due to different products for working condition is also different, at one batch In secondary, the technological parameter for needing to monitor first can be determined according to the requirement of working condition.For example, during food packaging, Requirement for humidity is very high, if air humidity is excessive, may result in the food dampness produced, to influence food Quality, therefore, when needing monitoring humidity, technological parameter is humidity.
After technological parameter has been determined, the schedule parameter curve of the available correspondence technological parameter, due to schedule parameter Curve is to be able to intuitively embody reasonable value range of the technological parameter in a batch, so, schedule parameter curve can Being obtained by theory analysis, it is also possible to be also possible to pass through history come what is be configured according to production actual needs Data obtain.
In the present embodiment, in order to which the difference in change for considering technological parameter in different manufacturing schedules is anisotropic, batch can be with Multiple manufacturing schedule sections are divided into according to manufacturing schedule.
Specific division mode can be configured according to the otherness that technological parameter in manufacturing schedule is likely to occur, if work The otherness of skill parameter and the ratio of manufacturing schedule are related, then can be drawn a batch with a certain number of percentage progresses It is divided into multiple manufacturing schedule sections, it is assumed that in a batch, if being divided into a manufacturing schedule with every 10% manufacturing schedule The batch is then divided into 10 manufacturing schedule sections by section.If the otherness of technological parameter is related to the different production phases, One batch can also be divided into multiple manufacturing schedule sections according to the production phase different in production process.Due to one The different manufacturing schedule sections marked off in batch all respectively correspond to a standard parameter, therefore, when the production of the batch When progress is in current manufacturing schedule, it can be joined according to the corresponding relationship between manufacturing schedule and schedule parameter curve from the progress Standard parameter corresponding with manufacturing schedule section locating for preceding manufacturing schedule is deserved is determined in number curve.
For example, it is assumed that in a batch, when manufacturing schedule section is [10%, 35%], production section of entering is corresponding Subparameter be 90 DEG C;When detect the batch manufacturing schedule be 30% when, i.e., target progress be 30%, due to the target into Degree 30% is in manufacturing schedule section [10%, 35%], therefore, can be according to manufacturing schedule section [10%, 35%] and son Corresponding relationship between 90 DEG C of parameter determines that the corresponding standard parameter of target progress 30% is 90 DEG C.
It can be technique ginseng between the schedule parameter curve used in technological parameter detected in S203 and S202 The corresponding curve of number.And the standard parameter determined in S202 can produce for technological parameter detected in S203 currently Measurement standard corresponding to progress, for whether measuring the technological parameter in current manufacturing schedule in normal range (NR).
Next, the method for determination of the schedule parameter curve in above-mentioned S202 is specifically introduced.
In order to accurately determine schedule parameter curve corresponding with technological parameter in the batch, it is suitable in other words Monitor the schedule parameter curve of the technological parameter.The embodiment of the present application provides different modes, such as can be from this batch of execution The historical data of the former batches of secondary machine determines the schedule parameter curve, or can also from production like products other The schedule parameter curve is determined in the historical data of machine.
Optionally, the embodiment of the present application provides a kind of mode of the corresponding schedule parameter curve of determining technological parameter, In the method, this concept of setting value is used, the setting value of a technological parameter can be understood as machine and carry out one batch During the secondary manufacturing, under normal operation, which may be in the parameter value of its left and right fluctuation.One batch It to the setting value of technological parameter setting is determined by equipment such as manufacturing process, precision itself in secondary, but due to production technology The problem of, there is the otherness of individual between distinct device in terms of working performance, so that for same ginseng between distinct device There may be differences for several setting values.Simultaneously as equipment itself with the increase of running time, equipment itself indices It can change, for example, the runing time of equipment is longer, the temperature of equipment itself can be higher and higher, to will lead to same A machine is also not quite similar for the setting value of same technological parameter in different batches.
Therefore in determining a batch when the corresponding schedule parameter curve of technological parameter, need first to determine to join the technique The setting value of number setting.Such as can when the batch starts elder generation's collection technology parameter, according to the fluctuation of the technological parameter of acquisition Trend is determined in the batch to the setting value of technological parameter setting.And the schedule parameter curve due to obtaining in advance is generally all It is to be obtained according to historical data, therefore the corresponding setting value of schedule parameter curve can be predefined out.It should so as to basis The setting value determined in batch is from finding out the setting determined in the corresponding batch in the schedule parameter curve obtained in advance The schedule parameter curve of value is as the schedule parameter curve for monitoring the technological parameter.
It specifically, is all to join under the different manufacturing schedules of entire batch around the technique due to the parameter value of technological parameter What several setting values fluctuated up and down, it therefore, can should by acquisition when it needs to be determined that when the setting value of technological parameter in the batch Parameter value of the technological parameter in the batch under different manufacturing schedules, then analyzes collected parameter value, and judge These parameter values fluctuate a surrounded parameter value up and down out, then the parameter value is and the technological parameter is arranged in the batch Setting value.
Such as, it is assumed that when manufacturing schedule is respectively 0.1%, 0.3%, 0.7%, 1.1%, 1.5%, the collected work of institute The parameter value of skill parameter is respectively 1.03,1.001,0.99,0.97,1.01, can be obtained by analysis, these collected parameter values It is about 1 fluctuation around parameter value, it may be considered that be 1 to the setting value of technological parameter setting in the batch, thus The progress of the corresponding setting value 1 can be found out from the schedule parameter curve obtained in advance according to the setting value 1 determined Parameter curve, and the schedule parameter curve found out using this monitors the technological parameter after the batch under manufacturing schedule.
In actual production, since in different production batch, the setting value that same technological parameter is arranged is different, because This, correspondingly, in different production batch, the schedule parameter curve determined for same technological parameter can not also Together.
Next, being specifically introduced to the corresponding schedule parameter curve of corresponding technological parameter how is calculated.
In an embodiment of the present embodiment, the schedule parameter curve of corresponding technological parameter can meet according to be set The historical data for setting value clusters to obtain, wherein the historical data is historical data of the technological parameter in history batch, this is gone through History batch can be same machine and implement the batch manufactured, and is also possible to different machines and implements the batch manufactured.
Specifically, the history batch first can be determined according to historical data of the technological parameter in each history batch In to the technological parameter setting setting value.Then the identical history batch of setting value is polymerized to one kind, such as can be by mixed Gauss model is closed to cluster history batch.Then, the history batch after at least one aggregation can be chosen according to actual needs The secondary sample as calculating schedule parameter curve, for example the most history batch of aggregation batch size can be chosen.
It should be noted that history batch first can be divided into multiple lifes during calculating schedule parameter curve Production progress section, then historical data corresponding to the manufacturing schedule section marked off is clustered, it can also be first to history batch It is secondary to be clustered, then the history batch after cluster is divided into multiple manufacturing schedule sections, here for the cluster of batch, division Execution sequence without any restriction.
After having determined for the history batch as sample, extracts and meet in the history batch to technological parameter setting The historical data of setting value.Since parameter value mean value of the technological parameter under each manufacturing schedule section is in all history batches The stochastic variable of Normal Distribution, and be located at except positive and negative three standard deviations according to normal distribution data for small probability thing Part, therefore, can be obtained by calculation the historical data in the history batch under each manufacturing schedule section average value u and Standard deviation s is [u-3s, u+ so as to obtain the range of the corresponding subparameter in each manufacturing schedule section in the history batch 3s], each subparameter is combined to the schedule parameter curve that can obtain technological parameter.
For convenience of understanding, be illustrated now in conjunction with Fig. 3 (a) and Fig. 3 (b) how to obtain corresponding technological parameter into Spend parameter curve.
Parameter value scatter plot after the history batch cluster of the technological parameter as shown in Fig. 3 (a), horizontal axis indicate a batch In manufacturing schedule, the longitudinal axis indicates the mean value of the corresponding technological parameter of manufacturing schedule.By Fig. 3 (a) it is found that the ginseng of the technological parameter Numerical value is mainly distributed in section [1450,1650], and minority is distributed in section [1190,1210], in [1790,1810], it is clear that The parameter value of the technological parameter is fluctuated up and down around section [1450,1650], therefore, it is possible to judge that going out in the batch to this Setting value set by technological parameter is the parameter value in section [1450,1650].
Further, the probability density of the mean value of technological parameter is divided under certain manufacturing schedule in Fig. 3 (a) as shown in Fig. 3 (b) Butut, axis of abscissas indicate the mean value of the corresponding technological parameter of manufacturing schedule, and axis of ordinates indicates the technique under the manufacturing schedule The probability density of mean parameter.By Fig. 3 (b) it is found that in the mean value of all technological parameters, the highest mean value of probability density is 1550, hence, it can be determined that being 1550 to the setting value of technological parameter setting in the batch.Then it extracts and meets setting value and be 1550 historical data extracts the historical data to float up and down around parameter value 1550.And then, it is extracted by calculating Historical data, the average value u1 and standard deviation s1 of the historical data in available each manufacturing schedule section, so as to Range to the corresponding subparameter in each manufacturing schedule section is [u1-3s1, u1+3s1], and each subparameter is combined just The schedule parameter curve of the available technological parameter.
As it can be seen that when technological parameter is monitored in the batch to an industry manufacture, it can be according to the batch in industry Locating current manufacturing schedule, determines the standard parameter for monitoring the technological parameter from schedule parameter curve in manufacture, In monitoring the batch during technological parameter, as the mark of corresponding different manufacturing schedules can be used in the passage of manufacturing schedule Quasi- parameter is monitored, and the standard parameter as corresponding to a manufacturing schedule can embody the technique in the manufacturing schedule and join Several should be at normal range (NR)s, therefore it is contemplated that work in such a way that the standard parameter in schedule parameter curve is monitored Skill parameter may improve monitoring accuracy in the otherness under different manufacturing schedules.
It should be noted that when the acquisition device (such as sensor) of technological parameter occurs abnormal, the acquisition device institute It is more that the parameter value of collected technological parameter can deviate normal range (NR), in this way, will lead to according to collected parameter value meter When calculating the schedule parameter curve of technological parameter, since there are acquisition device exception bring exception numbers in collected parameter value According to so that the range of schedule parameter curve obtained by calculation is than broad, even if occur so as to cause equipment itself it is abnormal, Technological parameter will not exceed the range of schedule parameter curve, and then will not issue alarm.
In order to avoid the generation of above situation, optionally, for S201, in the embodiment of the present application, technological parameter is being calculated Schedule parameter curve when, can also first obtain historical data of the technological parameter in history batch, then remove the history number In due to the extremely caused abnormal data of acquisition device, determined then according to the historical data after the abnormal data is removed The schedule parameter curve of the technological parameter.
In the embodiment of the present application, it can be removed by quartile counting method due to the extremely caused abnormal number of acquisition device According to.Specifically, historical data of the technological parameter in history batch can be first obtained, and the historical data is obtained by calculation First quartile Q1, third quartile Q2And quartile is away from IQR.Due in anomaly data detection theory, it is believed that position In section [Q1- 3IQR, Q3+ 3IQR] except data be abnormal data.And since the present embodiment is concerned with since equipment is different Normal bring abnormal data, rather than due to the extremely caused abnormal data of acquisition device, in removal due to acquisition device While abnormal caused abnormal data, need to retain due to unit exception bring abnormal data.Since acquisition device occurs The collected abnormal data deviation normal range (NR) of institute is relatively more when abnormal, so, it is believed that it is located at sectionExcept data be the extremely caused abnormal data of acquisition device, whereinIt needs Illustrate,Value can be adjusted according to the actual situation, andValue it is more big, illustrate the collected exception of institute Data more may be since acquisition device appearance is abnormal caused.
To more fully understand, illustrate that the acquisition device for removing technological parameter causes extremely now in conjunction with Fig. 4 (a) and Fig. 4 (b) Abnormal data after, for improve schedule parameter curve accuracy influence.
Parameter value curve before the removal extremely caused abnormal data of acquisition device as shown in Fig. 4 (a), horizontal axis indicate one The different time of a batch, the longitudinal axis indicate the parameter value of corresponding time collected technological parameter.In this batch known to Fig. 4 (a) In secondary, the parameter value of collected technological parameter is 43600 when the time is 25s and 148s, therefore, should in the batch The range of parameter values of technological parameter is [20,43600].Obviously, when the two moment collected parameter value is far longer than other Collected parameter value is carved, it is therefore contemplated that collected parameter value is acquisition device exception when the time is 25s and 148s Caused abnormal data.
After removing the two abnormal datas, the extremely caused exception of acquisition device is removed shown in available Fig. 4 (b) Parameter value curve after data, by being in the range of parameter values removed in the parameter curve after the abnormal data known to Fig. 4 (b) [20,28].As it can be seen that the range of parameter values of range of parameter values ratio Fig. 4 (a) of Fig. 4 (b) will be more in line with normal range (NR), therefore, root The schedule parameter curve being calculated according to parameter value curve shown in Fig. 4 (b) can be than the parameter value curve according to shown in Fig. 4 (a) The schedule parameter curve being calculated is more accurate.
As it can be seen that in the embodiment of the present application, can by removal historical data since acquisition device is extremely caused Abnormal data obtains the historical data for being more in line with actual technological parameter, thus obtain more accurate technological parameter into Parameter curve is spent, and then ensure that and can alarm when equipment itself occurs abnormal.
In the actual production process, the frequency of acquisition device acquisition data is higher, and often collects a parameter value just It needs once to be judged, judges whether collected parameter value meets subparameter corresponding to current manufacturing schedule section, from And cause in entire batch, equipment is excessive for the judgement number of collected parameter value, and then increases equipment processing number According to pressure.And in entire batch, since the parameter value meeting of technological parameter is fluctuated up and down, at certain moment, acquisition The collected parameter value of device may be a little higher than or lower than subparameter corresponding to current manufacturing schedule section, so as to cause ginseng The normal fluctuation of numerical value can cause to alarm.
The case where handling the pressure of data to mitigate equipment, and the normal fluctuation of parameter value is avoided to cause alarm hair Raw, optionally, in the embodiment of the present application, S202 can be for when a batch of manufacturing schedule is in target progress, statistics should The mean value of batch technological parameter collected in target progress, and the mean value is monitored using standard parameter.
Specifically, when determining that a batch of manufacturing schedule is in target progress, available acquisition device is in the mesh The parameter value of lower collected technological parameter of mark progress, and the mean value of the parameter value is obtained by calculation.It should then, it is determined that going out Manufacturing schedule section locating for target progress, and obtain the corresponding subparameter in manufacturing schedule section, then the subparameter is to mark Quasi- parameter.Then, using the mean value as the monitoring objective under the target progress, monitor whether the mean value meets the standard parameter.
For example, it is assumed that in a lot the parameter value of lower collected technological parameter of target progress be respectively 1.01, 1.02,0.97,0.98,1.01,0.99, and the range of the corresponding standard parameter in manufacturing schedule section locating for the target progress is [0.95,1].The mean value that the technological parameter is obtained by calculation is 0.99, since the mean value of the technological parameter is not out the mark The range of quasi- parameter, therefore, the batch will not alarm under the target progress.
As it can be seen that in the embodiment of the present application, being supervised by the mean value to the technological parameter under target progress in a batch Control to wish that equipment greatly reduces the judgement number of collected parameter value, and then mitigates the pressure of equipment processing data, And it can alarm to avoid caused by the parameter value normal fluctuation as technological parameter, thereby reduce the ratio of alarm.
The monitoring method of parameter in a kind of industry manufacture provided based on the above embodiment, the embodiment of the present application also provides It is a kind of industry manufacture in parameter monitoring device.Fig. 5 is the monitoring of parameter in a kind of industry manufacture provided by the embodiments of the present application The structure drawing of device of device, including determination unit 501 and monitoring unit 502:
The determination unit 501, for determining current manufacturing schedule;
The determination unit 501 is also used to determine the corresponding standard of the current manufacturing schedule based on schedule parameter curve Parameter;
The monitoring unit 502, the technological parameter for will be detected under the current manufacturing schedule, with determining mark Quasi- parameter compares, and is monitored with realizing to the technological parameter;
Wherein, the schedule parameter curve is the curve that the standard process parameters under corresponding different manufacturing schedules are formed.
Optionally, the determination unit is also used to be determined according to the technological parameter of acquisition to set the technological parameter The setting value set;Determine to correspond to the schedule parameter curve of the technological parameter according to the setting value.
Optionally, the history number of the setting value is met according to the schedule parameter curve of the correspondence technological parameter It is obtained according to cluster, the historical data is historical data of the technological parameter in history batch.
Optionally, the determination unit is also used to obtain historical data of the technological parameter in history batch;Removal In the historical data due to the extremely caused abnormal data of acquisition device;According to the history number after the removal abnormal data According to determining the corresponding schedule parameter curve of the technological parameter.
Optionally, the standard parameter is according to the corresponding relationship between manufacturing schedule and the schedule parameter curve, from institute State the parameter corresponding with the current manufacturing schedule determined in schedule parameter curve.
Optionally, the monitoring unit is also used to count the technological parameter collected in the current manufacturing schedule Mean value;The mean value is monitored using the standard parameter.
The associated description of feature may refer to the explanation in Fig. 1-4 in the present embodiment, and which is not described herein again.
As it can be seen that when technological parameter is monitored in the batch to an industry manufacture, it can be according to the batch in industry Locating current manufacturing schedule, determines the standard parameter for monitoring the technological parameter from schedule parameter curve in manufacture, In monitoring the batch during technological parameter, as the mark of corresponding different manufacturing schedules can be used in the passage of manufacturing schedule Quasi- parameter is monitored, and the standard parameter as corresponding to a manufacturing schedule can embody the technique in the manufacturing schedule and join Several should be at normal range (NR)s, therefore it is contemplated that work in such a way that the standard parameter in schedule parameter curve is monitored Skill parameter may improve monitoring accuracy in the otherness under different manufacturing schedules.
Above from the angle of modular functionality entity to the monitoring device of parameter in the industry manufacture in the embodiment of the present application It is described, the embodiment of the present application also provides a kind of processing equipments for parameter monitoring in industry manufacture, below from hard The processing equipment in the embodiment of the present application is described in the angle of part processing.
Fig. 6 is a kind of structure chart for the processing equipment of parameter monitoring in industry manufacture provided by the embodiments of the present application, The processing equipment 600 includes processor 602 and memory 601, in which:
The memory 601 is transferred to the processor for storing program code, and by said program code;
The processor 602, for according to the instruction execution following methods in said program code:
Determine current manufacturing schedule;
Based on schedule parameter curve, the corresponding standard parameter of the current manufacturing schedule is determined;
The technological parameter that will be detected under the current manufacturing schedule, compares with determining standard parameter, with reality Now the technological parameter is monitored;
Wherein, the schedule parameter curve is the curve that the standard process parameters under corresponding different manufacturing schedules are formed.
Optionally, the processor is also used to according to the following method of instruction execution in said program code:
The setting value that the technological parameter is arranged is determined according to the technological parameter of acquisition;
Determine to correspond to the schedule parameter curve of the technological parameter according to the setting value.
Optionally, the history number of the setting value is met according to the schedule parameter curve of the correspondence technological parameter It is obtained according to cluster, the historical data is historical data of the technological parameter in history batch.
Optionally, the processor is also used to according to the following method of instruction execution in said program code:
Obtain historical data of the technological parameter in history batch;
Remove in the historical data due to the extremely caused abnormal data of acquisition device;
The corresponding schedule parameter curve of the technological parameter is determined according to the historical data after the removal abnormal data.
Optionally, the standard parameter is according to the corresponding relationship between manufacturing schedule and the schedule parameter curve, from institute State the parameter corresponding with the current manufacturing schedule determined in schedule parameter curve.
Optionally, the processor is also used to according to the following method of instruction execution in said program code:
Count the mean value of the technological parameter collected in the current manufacturing schedule;
The mean value is monitored using the standard parameter.
The associated description of feature may refer to the explanation in Fig. 1-4 in the present embodiment, and which is not described herein again.
As it can be seen that when technological parameter is monitored in the batch to an industry manufacture, it can be according to the batch in industry Locating current manufacturing schedule, determines the standard parameter for monitoring the technological parameter from schedule parameter curve in manufacture, In monitoring the batch during technological parameter, as the mark of corresponding different manufacturing schedules can be used in the passage of manufacturing schedule Quasi- parameter is monitored, and the standard parameter as corresponding to a manufacturing schedule can embody the technique in the manufacturing schedule and join Several should be at normal range (NR)s, therefore it is contemplated that work in such a way that the standard parameter in schedule parameter curve is monitored Skill parameter may improve monitoring accuracy in the otherness under different manufacturing schedules.
In the above-described embodiments, can come wholly or partly by software, hardware, firmware or any combination thereof real It is existing.When implemented in software, it can entirely or partly realize in the form of a computer program product.
The computer program product includes one or more computer instructions.Load and execute on computers the meter When calculation machine program instruction, entirely or partly generate according to process or function described in the embodiment of the present invention.The computer can To be general purpose computer, special purpose computer, computer network or other programmable devices.The computer instruction can be deposited Storage in a computer-readable storage medium, or from a computer readable storage medium to another computer readable storage medium Transmission, for example, the computer instruction can pass through wired (example from a web-site, computer, server or data center Such as coaxial cable, optical fiber, Digital Subscriber Line (DSL)) or wireless (such as infrared, wireless, microwave) mode to another website Website, computer, server or data center are transmitted.The computer readable storage medium can be computer and can deposit Any usable medium of storage either includes that the data storages such as one or more usable mediums integrated server, data center are set It is standby.The usable medium can be magnetic medium, (for example, floppy disk, hard disk, tape), optical medium (for example, DVD) or partly lead Body medium (such as solid state hard disk Solid State Disk (SSD)) etc..
Those of ordinary skill in the art will appreciate that: realize that all or part of the steps of above method embodiment can pass through The relevant hardware of program instruction is completed, and foregoing routine can be stored in a computer readable storage medium, which exists When execution, step including the steps of the foregoing method embodiments is executed;And storage medium above-mentioned can be at least one in following media Kind: read-only memory (English: read-only memory, abbreviation: ROM), RAM, magnetic or disk etc. are various to be can store The medium of program code.
It should be noted that all the embodiments in this specification are described in a progressive manner, each embodiment it Between same and similar part may refer to each other, each embodiment focuses on the differences from other embodiments. For equipment and system embodiment, since it is substantially similar to the method embodiment, so describe fairly simple, The relevent part can refer to the partial explaination of embodiments of method.Equipment and system embodiment described above is only schematic , wherein unit may or may not be physically separated as illustrated by the separation member, it is shown as a unit Component may or may not be physical unit, it can and it is in one place, or may be distributed over multiple networks On unit.Some or all of the modules therein can be selected to achieve the purpose of the solution of this embodiment according to the actual needs. Those of ordinary skill in the art can understand and implement without creative efforts.
The above, only a kind of specific embodiment of the application, but the protection scope of the application is not limited thereto, Within the technical scope of the present application, any changes or substitutions that can be easily thought of by anyone skilled in the art, Should all it cover within the scope of protection of this application.Therefore, the protection scope of the application should be with scope of protection of the claims Subject to.

Claims (13)

1. the monitoring method of parameter in a kind of industry manufacture characterized by comprising
Determine current manufacturing schedule;
Based on schedule parameter curve, the corresponding standard parameter of the current manufacturing schedule is determined;
The technological parameter that will be detected under the current manufacturing schedule, compares with determining standard parameter, with realization pair The technological parameter is monitored;
Wherein, the schedule parameter curve is the curve that the standard process parameters under corresponding different manufacturing schedules are formed.
2. the method according to claim 1, wherein the schedule parameter curve is obtained according to following manner:
The setting value that the technological parameter is arranged is determined according to the technological parameter of acquisition;
Determine to correspond to the schedule parameter curve of the technological parameter according to the setting value.
3. according to the method described in claim 2, it is characterized in that, the schedule parameter curve of the correspondence technological parameter is It clusters to obtain according to the historical data for meeting the setting value, the historical data is the technological parameter in history batch Historical data.
4. the method according to claim 1, wherein calculating the corresponding schedule parameter curve of the technological parameter When, the method also includes:
Obtain historical data of the technological parameter in history batch;
Remove in the historical data due to the extremely caused abnormal data of acquisition device;
The corresponding schedule parameter curve of the technological parameter is determined according to the historical data after the removal abnormal data.
5. the method according to claim 1, wherein the standard parameter is according to manufacturing schedule and the progress Corresponding relationship between parameter curve, the ginseng corresponding with the current manufacturing schedule determined from the schedule parameter curve Number.
6. the method according to claim 1, wherein the work that will be detected under the current manufacturing schedule Skill parameter is compared with determining standard parameter, is monitored with realizing to the technological parameter, comprising:
Count the mean value of the technological parameter collected in the current manufacturing schedule;
The mean value is monitored using the standard parameter.
7. the monitoring device of parameter in a kind of industry manufacture, which is characterized in that including determination unit and monitoring unit:
The determination unit, for determining current manufacturing schedule;
The determination unit is also used to determine the corresponding standard parameter of the current manufacturing schedule based on schedule parameter curve;
The monitoring unit, the technological parameter for will be detected under the current manufacturing schedule, with determining standard parameter It compares, the technological parameter is monitored with realizing;
Wherein, the schedule parameter curve is the curve that the standard process parameters under corresponding different manufacturing schedules are formed.
8. a kind of processing equipment for parameter monitoring in industry manufacture, which is characterized in that the processing equipment includes processor And memory, in which:
The memory is transferred to the processor for storing program code, and by said program code;
The processor, for according to the instruction execution following methods in said program code:
Determine current manufacturing schedule;
Based on schedule parameter curve, the corresponding standard parameter of the current manufacturing schedule is determined;
The technological parameter that will be detected under the current manufacturing schedule, compares with determining standard parameter, with realization pair The technological parameter is monitored;
Wherein, the schedule parameter curve is the curve that the standard process parameters under corresponding different manufacturing schedules are formed.
9. processing equipment according to claim 8, which is characterized in that the processor is also used to according to said program code In the following method of instruction execution:
The setting value that the technological parameter is arranged is determined according to the technological parameter of acquisition;
Determine to correspond to the schedule parameter curve of the technological parameter according to the setting value.
10. processing equipment according to claim 9, which is characterized in that the schedule parameter of the correspondence technological parameter The historical data for meeting the setting value according to curve clusters to obtain, and the historical data is the technological parameter in history batch Historical data in secondary.
11. processing equipment according to claim 8, which is characterized in that the processor was also used to according to described program generation The following method of instruction execution in code:
Obtain historical data of the technological parameter in history batch;
Remove in the historical data due to the extremely caused abnormal data of acquisition device;
The corresponding schedule parameter curve of the technological parameter is determined according to the historical data after the removal abnormal data.
12. processing equipment according to claim 8, which is characterized in that the standard parameter is according to manufacturing schedule and institute The corresponding relationship between schedule parameter curve is stated, that determines from the schedule parameter curve is corresponding with the current manufacturing schedule Parameter.
13. processing equipment according to claim 8, which is characterized in that the processor was also used to according to described program generation The following method of instruction execution in code:
Count the mean value of the technological parameter collected in the current manufacturing schedule;
The mean value is monitored using the standard parameter.
CN201711092136.XA 2017-11-08 2017-11-08 It is a kind of industry manufacture in parameter monitoring method and device Pending CN109753027A (en)

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