CN109557116A - X-ray quarter-phase grating contrast image-forming system - Google Patents

X-ray quarter-phase grating contrast image-forming system Download PDF

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CN109557116A
CN109557116A CN201811647639.3A CN201811647639A CN109557116A CN 109557116 A CN109557116 A CN 109557116A CN 201811647639 A CN201811647639 A CN 201811647639A CN 109557116 A CN109557116 A CN 109557116A
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grating
phase grating
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李冀
雷耀虎
黄建衡
刘鑫
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Shenzhen University
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    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/041—Phase-contrast imaging, e.g. using grating interferometers

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Abstract

The invention discloses a kind of X-ray quarter-phase grating contrast image-forming system, including set gradually along X-ray emission direction X-ray tube, source grating G0, phase grating and X-ray detector, the phase grating includes interval setting first phase grating G1With second phase grating G '1, the first phase grating G1, second phase grating G '1Positioned at source grating G0Between X-ray detector, in first phase grating G1It is formed afterwards from imaging secondary source G2；The X-ray of the X-ray tube sending, source grating G0With first phase grating G1Form a Taibo labor system；Certainly the imaging secondary source G2With second phase grating G '1Form inverse Taibo labor system.System of the invention can be avoided the use of minor cycle, the source grating of high-aspect-ratio and large area, minor cycle, high-aspect-ratio absorption grating, reduce the realization difficulty of grating contrast image-forming system.

Description

X-ray quarter-phase grating contrast image-forming system
Technical field
The present invention relates to phase contrast imaging system more particularly to a kind of X-ray quarter-phase grating contrast image-forming systems.
Background technique
The research of nearly 20 years numerous X-ray phase contrast imaging technologies, which is compared, in the world shows based on Taibo labor interferometer Phase contrast imaging technology get rid of synchrotron radiation source is relied on while, be capable of providing including absorbing contrast, phase contrast and dark The image of more contrast mechanism such as field picture, reflects the immanent structure of object, is the major transformation of x-ray imaging technology, clinically Lesion is early diagnosed, the characterization of polymer in material science, the fields such as nondestructive testing of industry and safety, which have, potentially answers With value.
2006, F.Pfeiffer et al. modified Taibo interferometer according to Taibo-labor principle, proposed to utilize common X-ray Source and absorption grating constitute spatial coherence array X radiographic source.This had not only solved partially coherent light lighting problem, but also improved simultaneously Light-source brightness is for X-ray Taibo-labor interferometer.It makes the technology get rid of the dependence to synchrotron radiation source, it is possible to enter Common lab is even clinical, becomes the research hotspot in this field.
Existing Taibo or Taibo-labor interferometer are obtained using X-ray phase gradient as the image of contrast.What it was relied on is The measurement of interference fringe shear amount.The difference that these interference fringes are originated from the grating (usually phase grating) as beam splitter is spread out Beam interferes.When with parallel light, these interference fringes have the period identical with beam-splitting optical grating (or half, Property depending on grating), i.e., it is so-called " from being imaged ".When cone-beam illuminates, the period of fringe period and beam-splitting optical grating meets The proportionate relationship of one projective amplification.The geometrical condition of the spatial coherence of x-ray source requires the period of beam-splitting optical grating several In micron range.Period in this way " from being imaged " is also several microns of scale (bigger).And common radioscopic image detector Pixel at 20-200 microns, that is, can not directly record such interference fringe, the shear amount of more leisure opinion striped.
Existing interference fringe and shear detection method are to introduce another absorption grating, are taken to the interference fringe of minor cycle Sample, that is, form Moire fringe amplification shear amount and record it.But the production of the absorption grating of large area, high-aspect-ratio is always It is a technical bottleneck.Moreover, the use of absorption grating reduces photon utilization efficiency, lead to picture signal signal-to-noise ratio degradation or exposure Extend between light time.It is obvious that do not depend on absorption grating and record equiphase line, i.e., amplification fringe period is solve the quagmire upper The road Xuan Zhi.But according to the geometrical condition of spatial coherence, directly amplifying striped leads to the emission area that must reduce light source.It solves Road have two: the source grating of the smaller slit of production；Development transmitting scale is less than several microns of structure anode.The former more increases Depth-to-width ratio, it is more difficult to realize (although area reduction)；The realization of the latter sees it is with small x-ray photon energy (copper at present Characteristic spectrum) and power capacity be cost.
Summary of the invention
The technical problem to be solved in the present invention is that providing a kind of X-ray quarter-phase grating contrast image-forming system, the system It can be avoided the use of minor cycle, the source grating of high-aspect-ratio and large area, minor cycle, high-aspect-ratio absorption grating, reduce light The realization difficulty of grid phase contrast imaging system.
The technical solution adopted by the present invention to solve the technical problems is:
A kind of X-ray quarter-phase grating contrast image-forming system, including set gradually along X-ray emission direction X-ray tube, Source grating G0, phase grating and X-ray detector, the phase grating includes interval setting first phase grating G1With the second phase Position grating G '1, the first phase grating G1, second phase grating G '1Positioned at source grating G0Between X-ray detector, One phase grating G1It is formed afterwards from imaging secondary source G2；The X-ray of the X-ray tube sending, source grating G0With first phase grating G1Form a Taibo labor system；Certainly the imaging secondary source G2, second phase grating G '1Form inverse Taibo labor system.
Further, in X-ray quarter-phase grating contrast image-forming system, preferably first phase grating G1Position and the period Meet: making X-ray through source grating G0After travel to first phase grating G1The coherence length at place is not less than first phase grating G1's Period；Second phase grating G '1Position and the period meet: from imaging secondary source G2Travel to second phase grating G '1The phase at place Dry length is not less than second phase grating G '1Period
Further, in X-ray quarter-phase grating contrast image-forming system, the preferably described secondary source G2Positioned at first phase Position grating G1Talbot distance at.
The first phase grating G1Talbot distance R2Meet:
Wherein, p1It is first phase grating G1Period, R1It is source grating G0With first phase grating G1Between spacing, λ It is the wavelength of X-ray, k is constant, for the phase grating of pi/2, k=1/2,3/2,5/2 ..., for the phase grating of π, k= 1/8,3/8,5/8,…。
Further, in X-ray quarter-phase grating contrast image-forming system, the preferably described first phase grating G1With the second phase Position grating G '1Period it is identical；The source grating G0With first phase grating G1Between spacing R1, second phase grating G '1With It is from imaged striation G '2Between spacing R2' equal；
Or the first phase grating G1With second phase grating G '1Period it is different；The source grating G0With the first phase Position grating G1Between spacing R1, second phase grating G '1With it from imaged striation G '2Between spacing R2' different.
Further, in X-ray quarter-phase grating contrast image-forming system, the preferably described second phase grating G '1Self-contained The period of slice line is 20-300 microns.
Further, in X-ray quarter-phase grating contrast image-forming system, the preferably described source grating G0For by the incident beam modulated For the absorption grating of coherent light, or the source grating G to be coupled on x-ray anode target0Structure.
Further, in X-ray quarter-phase grating contrast image-forming system, the preferably described source grating G0Period be 5-50 it is micro- Rice, duty ratio 0.25-0.5；Or the source grating G0Period be 1-5 microns, duty ratio 1.
Further, in X-ray quarter-phase grating contrast image-forming system, the preferably described X-ray tube and the source grating G0 Distance be 0mm-100mm；The source grating G0With the first phase grating G1Distance be 5mm-1000mm；Described second Phase grating G '1With at a distance from the X-ray detector be 100mm-2000mm.
Further, in X-ray quarter-phase grating contrast image-forming system, the preferably described first phase grating G1With the second phase Position grating G '1It all respectively include the transmission layer and phase change layer through X-ray line being arranged alternately.
Further, in X-ray quarter-phase grating contrast image-forming system, before the preferably described X-ray detector second Phase grating G '1Talbot distance at can be equipped with one with from imaged striation period G '2Identical absorption grating.
Further, in X-ray quarter-phase grating contrast image-forming system, the preferably described X-ray tube is transmitting x-ray photon Energy range is the X-ray tube of 8keV-70keV.
X-ray quarter-phase grating contrast image-forming system of the invention, using the source grating of common x-ray source and large period, Two phase gratings can be realized as phase contrast imaging, two phase gratings -- the first phase grating G being arranged about the present invention1With Second phase grating G '1, due to all gratings period with it is mutual at a distance from there is significantly linkage, the present invention Phase grating be quarter-phase grating, single be composed of two single-phase grating contrast image-forming systems, It is respectively formed Taibo labor and inverse Taibo labor imaging system, wherein it is micron-sized structure light that Taibo labor system, which can provide the period, Then, by inverse Taibo labor system, can obtain large period from imaged striation.And the absorption grating of large period being capable of conduct Sampled-grating thus greatly reduces the difficulty of production large area and high-aspect-ratio absorption grating.
For the production for avoiding small scale light source and large area, minor cycle, high-aspect-ratio absorption grating, quarter-phase optical grating contrast The picture (interference fringe) that imaging system is generated using common Taibo-labor system, should be " from imaging secondary as " from imaging secondary source " Adjusting for the period size in source " can be by between adjusting Taibo-source grating of labor system and the period of phase grating and they Distance obtains, and when its period is smaller, by second phase grating, it is biggish certainly that the period just can be obtained in shorter distance Imaged striation.If striped at this time is still not enough to be detected, can assist visiting by the way that the absorption grating of one piece of large area is added Survey, but the absorption grating due to the period it is larger, therefore depth-to-width ratio is little, and manufacture difficulty is little.
Detailed description of the invention
Present invention will be further explained below with reference to the attached drawings and examples, in attached drawing:
Fig. 1 is the structural schematic diagram of the embodiment of the present invention；
Fig. 2 is the structural schematic diagram of another embodiment of the embodiment of the present invention；
Fig. 3 is the structural analysis schematic diagram of the embodiment of the present invention；
Fig. 4 is the Moire fringe that the present invention obtains；
Fig. 5 is the embodiment of the present invention along the fringe contrast on horizontal line；
Fig. 6 a-6c is to absorb picture, phase-contrast images and dark field image in phase contrast experiment.
Specific embodiment
For a clearer understanding of the technical characteristics, objects and effects of the present invention, now control attached drawing is described in detail A specific embodiment of the invention.
As shown in Figure 1, a kind of X-ray quarter-phase grating contrast image-forming system of the invention, including along X-ray emission direction The X-ray tube that sets gradually, source grating G0, phase grating and X-ray detector, the phase grating includes interval setting first Phase grating G1With second phase grating G '1.It is i.e. specific as shown in Figure 1, from left to right are as follows: X-ray tube, source grating G0, the first phase Position grating G1, second phase grating G '1And X-ray detector.
Specifically, the first phase grating G1, second phase grating G '1Positioned at source grating G0With X-ray detector it Between, first phase grating G1Position and the period meet: make X-ray through source grating G0After travel to first phase grating G1Place Coherence length is not less than first phase grating G1Period, in this way, in first phase grating G1Talbot distance at just form him Zi imaging to get to from be imaged secondary source G2, secondary source G is imaged in this certainly2For virtual source, to illuminate second phase grating G ′1.Similarly, second phase grating G '1Position and the period it is related with the period of virtual source, i.e. second phase grating G '1Position with Period meets: from imaging secondary source G2Travel to second phase grating G '1The coherence length at place is not less than second phase grating G '1 Period.
The above structure of imaging system of the invention is actually the inverse Taibo labor system of a Taibo labor system and one, Wherein, the X-ray of X-ray tube sending, source grating G0With first phase grating G1A Taibo labor system is formed, week can be provided Phase is micron-sized structure light, i.e., from imaging secondary source G2.Then, pass through imaging secondary source G certainly2With second phase grating G '1Group At inverse Taibo labor system, finally detected by X-ray detector.The program can provide sufficiently large enlargement ratio for striped, obtain Large period from imaged striation, can directly to be differentiated by X-ray detector.
In Taibo labor system, labor condition is writeable are as follows:
Wherein p0、p1And p2Respectively source grating G0, first phase grating G1With imaging secondary source G certainly2Period, constant α It is 1 or 2, specific value depends on first phase grating G1For pi/2 grating or π grating.
The talbot distance R2 of the first phase grating G1 meets:
Wherein, p1 is first phase grating G1Period, R1 is source grating G0With first phase grating G1Between spacing, λ It is the wavelength of X-ray, k is constant, for the phase grating of pi/2, k=1/2,3/2,5/2 ..., for the phase grating of π, k= 1/8,3/8,5/8,…。
Functionally, the source grating G of Taibo labor system0It is the coherent light for meeting image-forming condition by the incident beam modulated, Then, in first phase grating G1After will form from imaging secondary source.These can be used as from imaging secondary source from imaged striation " light source " of subsequent inverse Taibo labor system, i.e., as shown in figure 3, the first phase grating G1Afterwards, second phase grating G '1Preceding shape At imaging secondary source certainly.
The first phase grating G1With second phase grating G '1Period may be the same or different.It is preferred that first Phase grating G1Period p1With second phase grating G '1Period p1' identical (p1'=p1).Form symmetrical Taibo labor system With inverse Taibo labor system.Symmetrically placed Taibo labor and inverse Taibo labor system have been selected, need to only make the grating of two kinds of specifications in this way, And the grating of three kinds of specifications is needed in traditional Taibo labor system, The present invention reduces grating specifications types.The source grating G0With First phase grating G1Between spacing R1, second phase grating G '1It is formed from imaged striation G '2Between spacing R2′ Equal (R1=R2'), and first phase grating G1Spacing R between the secondary source of imaging certainly of formation2, from imaging secondary source With second phase grating G '1Between spacing R1' equal (R2=R1′)。
The second phase grating G '1The period from imaged striation be 20-300 microns.
Specific structure of the present invention is described in detail below:
X-ray tube selection can generate X-ray energy range in 17keV~70keV, there is large radiation flux and the wide angle of departure X-ray beam.
The source grating G0For the absorption grating for by the incident beam modulated being coherent light.Source grating G0The X that X-ray tube is generated Ray has modulating action, and modulated X-ray is one group of array of parallel lines, and every line is all the line source of an X-ray.
Source grating G0Structure are as follows: make the transmission layer and layers of absorbent material being arranged alternately in substrate, layers of absorbent material and The width ratio of transmission layer is 2:1 to 4:1.Area is advisable with that can cover entire imaging viewing field.Choice of substrate materials silicon base Shape adaptation imaging viewing field, layers of absorbent material select the materials such as gold, bismuth, gold-tin alloy, and transmission layer selects silicon, photoresist, air Equal materials are made.
It is preferred that the source grating G0Period for large period source grating, the source grating is 5-50 microns, and duty ratio is 0.25-0.5；Such as: the line width range of X-ray is 5-100 microns after source grating modulation, and optimizing numberical range is 10-20 micro- Rice；Its length range is 0.3-2mm, and optimization range is 0.6-1.2mm.The duty cycle range of line emitter array is 0.1-0.5, Optimization duty ratio is 0.2-0.35.
Further, in the X-ray quarter-phase grating contrast image-forming system, the preferably described X-ray tube and the source Grating G0Distance be 0mm-100mm；The source grating G0With the first phase grating G1Distance be 2mm-1000mm；Institute State second phase grating G '1With at a distance from the X-ray detector be 100mm-2000mm.Above-mentioned each device position and its size It can be designed and calculate according to actual needs, only can need to meet needs of the invention by arbitrary data within the above range, And it is not necessarily to some specific data.
The first phase grating G1With second phase grating G '1It is that one layer is covered on base material by completely through layer The micro-structure separately constituted with phase change layer.The i.e. preferably first phase grating G1With second phase grating G '1All respectively Including the transmission layer and phase change layer through X-ray line being arranged alternately, the phase change layer, with silicon, aluminium, nickel, Jin Dengcai Material is made, completely through layer using materials such as air, photoresists.Thickness by changing grating makes the corresponding light of its central wavelength Sub- energy can be adjusted within the scope of 17-70keV, and the X-ray bandwidth of permission is ± 20%.First phase grating G1And second phase Grating G '1With diffraction, by source grating G0The X-ray transparent first phase grating G of modulation1After generate diffraction, make 0 grade Diffraction light energy is minimum, and ± 1 grade of diffraction light energy is maximum, and ± 1 grade of diffraction light interaction generates differential interference effect.
Further, in the X-ray quarter-phase grating contrast image-forming system, the preferably described X-ray detector is flat Partitioned detector or by the way of indirect detection X-ray, the X-ray detector are existing product, and details are not described herein.
Further, it is preferable to be equipped with an absorption grating G ' before the X-ray detector2, in second phase grating G '1Thailand At primary distance.As source grating G0With first phase grating G1With second phase grating G '1When with suitable cooperation, inverse Taibo labor System is formed larger from the imaged striation period, when not less than 2 times of X-ray detector Pixel Dimensions, can directly be differentiated, Above-mentioned absorption grating G ' can be saved at this time2, when what inverse Taibo labor system was formed is less than X-ray detector from the imaged striation period At 2 times of size, then above-mentioned absorption grating G '2It cannot omit.I.e. in fact, in absorption grating G '2Position, if the X used is penetrated The inverse Taibo labor system that the resolution ratio of line detector still is not enough to differentiate the position formed from imaged striation (quarter-phase of the present invention The advantage of grating image system is exactly that fringe period is become larger, and about tens microns, even more greatly), then it should use an absorption light Grid G '2, absorption grating G '2Period formed with inverse Taibo labor system it is equal from the imaged striation period, as in Fig. 2 in X-ray Absorption grating G ' is equipped with before detector2.It is capable of forming Moire fringe in this way to facilitate X-ray detector to detect, meanwhile, it is big in this way The absorption grating G ' in period2Manufacture difficulty is relatively low.
Present invention is preferably applicable to large period source grating G0, while being also applied for minor cycle source grating G0。
Formula (2) can be converted are as follows:
Wherein:
In (3), R1And R2Commutative position, p in (1)0And p2Commutative position, i.e., by the source grating G of minor cycle0It can obtain Large period from imaged striation.The source grating G0For minor cycle source grating G0, the source grating G0Period be 1-5 it is micro- Rice, duty ratio 1.
In addition to the above implementation exceptions, in addition in other embodiments, the first phase grating G1With second phase grating G′1Period it is different；The source grating G0With first phase grating G1Between spacing R1, second phase grating G '1With its self-contained Slice line G '2Between spacing R2' different.
It is described in detail below with a specific embodiment:
As Figure 2-3, a kind of X-ray quarter-phase grating contrast image-forming system, including including along X-ray emission direction X-ray tube that (as shown in Figure 1 from left to right) sets gradually, source grating G0, first phase grating G1, second phase grating G ′1, absorption grating G '2And X-ray detector, each device position and its size are as follows: R1=R2'=0.763m, R2=R1'= 0.101m, p1'=p1=5.6 μm, p2'=p0=24 μm, source grating G0Duty ratio 25%, 130 μm of depth.Absorption grating duty ratio 50%, 130 μm of depth, absorbing material used in the two is bismuth.X-ray wavelength used is 0.043nm, i.e. photon energy is 28keV, corresponding first phase grating G1It is 36 μm with second phase grating thickness.Above-described embodiment is one specific Embodiment, each device position and its size can be designed and calculate according to actual needs, and the present invention simultaneously limits.
The effective focal spot area of x-ray source of X-ray tube transmitting is 1 × 0.8mm2, application voltage is 40kV, electric current 4mA.
X-ray detector uses flat panel detector, and X-ray detector pixel size is 74.8 μm.Time for exposure is 3s, such as Shown in Fig. 4, the field range of display is absorption grating (diameter: 10.5cm) and X-ray detector area (11.5 × 6.5cm2) Intersection.By measuring the pixel value on the horizontal line in Fig. 4, can calculate fringe contrast is about 17%, therefore, I Deducibility in G2' place from imaging cycle.It is illustrated in figure 5 along the fringe contrast on horizontal line.
Phase contrast experiment:
Using lemon as sample, imaging system parameters of the present invention are as when above-mentioned acquisition Moire fringe, and only X-ray is visited It surveys device and is changed to Visible-light CCD (Spectral Instruments Inc., 4096 × 4096 pixel numbers, 9 μm/pixel) and flashing The light-cone QCD sum rules that body CsI (Tl) (thickness:400 μm) passes through 2:1.Voltage value 40kV and current value 4mA are applied to X-ray On source, the time for exposure is set as 60s, and image effective area is 70 × 70mm2, the absorption of lemon, phase are obtained by 4 step phase shift methods Lining and darkfield image, as shown in fig. 6a-6c.
Show that quarter-phase optical grating contrast imaging of the invention can be as common Taibo labor by above-mentioned phase contrast and darkfield image System is the same.And since quarter-phase optical-mechanical system is made of a Taibo labor and an inverse Taibo labor system, retain two germlines While advantage of uniting, the shortcomings that having abandoned each.Allow to avoid minor cycle source grating using large period source grating Production.More importantly the system can largely amplify interference fringe, tens microns of the period can be such as amplified to, very It can directly be differentiated so as to avoid the production of minor cycle absorption grating even with Flat X-ray detector to several hundred microns.

Claims (10)

1. a kind of X-ray quarter-phase grating contrast image-forming system, including set gradually along X-ray emission direction X-ray tube, source Grating G0, phase grating and X-ray detector, which is characterized in that the phase grating includes interval setting first phase grating G1 With second phase grating G '1, the first phase grating G1, second phase grating G '1Positioned at source grating G0And X-ray detector Between, in first phase grating G1It is formed afterwards from imaging secondary source G2；The X-ray of the X-ray tube sending, source grating G0With One phase grating G1Form a Taibo labor system；Certainly the imaging secondary source G2With second phase grating G '1Form inverse Taibo labor System.
2. X-ray quarter-phase grating contrast image-forming system according to claim 1, which is characterized in that the first phase Grating G1Position and the period meet: make X-ray through source grating G0After travel to first phase grating G1The coherence length at place is not small In first phase grating G1Period；The second phase grating G '1Position and the period meet: from imaging secondary source G2It propagates To second phase grating G '1The coherence length at place is not less than second phase grating G '1Period.
3. X-ray quarter-phase grating contrast image-forming system according to claim 1, which is characterized in that described secondary from being imaged Grade source G2Positioned at the first phase grating G1Talbot distance at.
4. X-ray quarter-phase grating contrast image-forming system according to claim 1, which is characterized in that the first phase Grating G1With second phase grating G '1Period it is identical；The source grating G0With first phase grating G1Between spacing R1, second Phase grating G '1It is formed from imaged striation G '2Between spacing R2' equal；
Or the first phase grating G1With second phase grating G '1Period it is different；The source grating G0With first phase light Grid G1Between spacing R1, second phase grating G '1It is formed from imaged striation G '2Between spacing R2' different.
5. X-ray quarter-phase grating contrast image-forming system according to claim 4, which is characterized in that the second phase Grating G '1Formed from imaged striation G '2Period be 20-300 microns.
6. X-ray quarter-phase grating contrast image-forming system according to claim 1, which is characterized in that the source grating G0For It is the absorption grating of coherent light, or the source grating structure to be coupled on x-ray anode target by the incident beam modulated.
7. X-ray quarter-phase grating contrast image-forming system according to claim 1, which is characterized in that the source grating G0's Period is 1-50 microns, duty ratio 0.25-0.5.
8. X-ray quarter-phase grating contrast image-forming system according to claim 1, which is characterized in that the X-ray tube with The source grating G0Distance be 0mm-100mm；The source grating G0With the first phase grating G1Distance be 5mm- 1000mm；The second phase grating G '1With at a distance from the X-ray detector be 100mm-2000mm.
9. X-ray quarter-phase grating contrast image-forming system according to claim 1, which is characterized in that the first phase Grating G1With second phase grating G '1It all respectively include the transmission layer and phase change layer through X-ray line being arranged alternately.
10. X-ray quarter-phase grating contrast image-forming system according to claim 1, which is characterized in that the X-ray is visited Before surveying device, and in second phase grating G '1Talbot distance at can be equipped with a period with from imaged striation G '2Identical absorption light Grid.
CN201811647639.3A 2018-12-29 2018-12-29 X-ray quarter-phase grating contrast image-forming system Pending CN109557116A (en)

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