CN109446010B - AEP memory pressure performance stability testing method and system - Google Patents
AEP memory pressure performance stability testing method and system Download PDFInfo
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Abstract
The invention provides an AEP memory pressure performance stability test method and system, wherein both the AEP memory and the AEP memory are subjected to memory read-write performance test by an MLC test tool, and a test result1 is recorded; then, carrying out pressure test on the AEP memory of the test host through a FIO test tool; then, performing memory read-write performance test on the AEP memory of the test host by using the MLC test tool again, and recording a test result 2; and then calculating the performance deviation corresponding to the recorded test result1 and test result2, and automatically determining the pressure performance stability test result of the AEP memory of the test host based on the calculated performance deviation. The method is used for testing the stability of the AEP memory pressure performance, and ensures the accuracy and precision of the test result.
Description
Technical Field
The invention relates to the field of server testing, in particular to a method and a system for testing stability of AEP (external-access-point) memory pressure performance, which are used for testing the stability of the AEP memory pressure performance.
Background
The AEP (Apache pass) memory adopts a 3D XPoint technology, is between a DRAM and a NAND, and fills the performance and the time delay GAP between the DRAM and the NAND. From a theoretical point of view, the Apache Pass DIMM performs 8-10 times better than DRAM and has another big advantage of non-volatility. Compared with Flash, Apache Pass DIMM is more durable than Flash NAND although the writing modes of Apache Pass DIMM are different. In brief, the AEP memory can be regarded as a high-performance memory hard disk combination, which can be used as a memory (memory mode) or a storage medium (APD mode).
The AEP memory is a brand-new product introduced by intel in 2017, is adapted to the next generation cascade CPU, has unsuspecting high performance, but is also very concerned by users whether the AEP memory can continuously provide high performance. At present, no good strategy for testing the stability of the AEP memory pressure performance exists in the prior art.
Based on this, the invention provides an AEP memory pressure performance stability testing method and system, which are used for solving the technical problems.
Disclosure of Invention
The invention aims to solve the technical problem of providing an AEP memory pressure performance stability testing method and system, which are used for testing the stability of the AEP memory pressure performance.
In order to solve the technical problem, the invention provides an AEP memory pressure performance stability testing method, which comprises the following steps:
step s1, performing memory read-write performance test on the AEP memory of the test host through the MLC test tool, and recording a test result 1; then step s2 is performed;
step s2, performing pressure test on the AEP memory of the test host through a FIO test tool; then step s3 is performed;
step s3, performing memory read-write performance test on the AEP memory of the test host by the MLC test tool in step s1 again, and recording a test result 2; then step s4 is performed;
and step s4, calculating the performance deviation corresponding to the recorded test result1 and test result2, and automatically determining the pressure performance stability test result of the AEP memory of the test host based on the calculated performance deviation.
In step s4, the method for automatically determining the pressure performance stability test result of the test host AEP memory based on the calculated performance deviation includes:
and comparing the calculated performance deviation with a preset performance deviation threshold, if the calculated performance deviation does not exceed the preset performance deviation threshold, judging that the pressure performance of the AEP memory of the test host is stable, otherwise, judging that the pressure performance of the AEP memory of the test host is unstable.
In step s2, the test host AEP memory is subjected to a pressure test for a predetermined number of days d by the FIO test tool, whose QD value is predetermined to be 128.
The memory read-write modes of the memory read-write performance test in steps s1 and s3 are read, write, random read and random write.
Before step s1, the method further includes a step of building a test environment, and specifically includes the steps of:
s01, installing a Linux operating system on the test host;
s02, restarting the test host, entering a Linux operating system, and logging in by using a root user;
s03, installing an AEP test software environment on the test host;
s04, checking and setting the AEP memory of the test host as a storage mode (APD mode);
s05, copying the auto _ run script, the MLC test tool and the FIO test tool to a test host Linux system/root directory;
s06, running a terminal program under the test host Linux system, and executing the following operations under terminal:
# cd/root carriage return
#./auto _ run carriage return
After the Terminal shows that the mlc and the FIO are installed successfully, the auto _ run script starts to be executed, namely, the automatic test of the pressure performance stability of the AEP memory of the test host is started.
In addition, the invention also provides an AEP memory pressure performance stability test system, which comprises:
the first-time memory read-write performance testing module is used for testing the memory read-write performance of the AEP memory of the testing host through the MLC testing tool;
the pressure filling module is connected with the first memory read-write performance testing module and used for carrying out pressure testing on the AEP memory of the testing host through a FIO testing tool;
the second memory read-write performance testing module is connected with the pressure filling module and used for carrying out memory read-write performance testing on the AEP memory of the testing host again through the MLC testing tool;
the storage module is respectively connected with the first memory read-write performance test module and the second memory read-write performance test module and is used for storing data of the system, and the storage module comprises a test result1 for storing the first memory read-write performance test module and a test result2 for storing the second memory read-write performance test module;
and the pressure performance stability testing module is connected with the storage module, and is used for reading and calculating the performance deviation between the testing result1 and the testing result2 stored in the storage module, and judging the pressure performance stability testing result of the AEP memory of the testing host machine based on the calculated performance deviation.
In the pressure performance stability test module, the method for determining the pressure performance stability test result of the test host AEP memory based on the performance deviation obtained by the calculation is as follows:
and comparing the performance deviation of the test result1 and the test result2 with the preset performance deviation threshold, if the performance deviation does not exceed the preset performance deviation threshold, determining that the pressure performance of the AEP memory of the test host is stable, otherwise, determining that the pressure performance of the AEP memory of the test host is unstable.
The pressure filling module carries out pressure test on the AEP memory of the test host for a preset number of days d through the FIO test tool, and the QD value of FIO of the FIO test tool is preset to be 128.
The memory read-write modes of the memory read-write performance test of the test host AEP memory by the MLC test tool are read, write, random read and random write.
The AEP memory pressure performance stability test system further comprises an installation module, which is used for automatically installing the MLC test tool and the FIO test tool on a test host, wherein the test host meets all the following conditions:
a Linux operating system is installed on the test host;
logging in a Linux operating system of a test host by using a root user;
the test host is provided with an AEP test software environment (namely, the ndctl and a dependent software package thereof are installed on a Linux OS which uses root user login, and an ixpdimm software package is installed);
testing the memory of the host AEP as a storage mode (APD mode);
auto _ run script, the MLC testing tool and the FIO testing tool are stored in advance under a Linux system/root directory of a testing host;
running a terminal program under a test host Linux system, and executing the following operations under terminal:
# cd/root carriage return
#./auto _ run carriage return
After the Terminal shows that the mlc and the FIO are installed successfully, the auto _ run script starts to be executed, namely, the automatic test of the pressure performance stability of the AEP memory of the test host is started.
Compared with the prior art, the invention has the advantages that:
according to the method and the system for testing the pressure performance stability of the AEP memory, the read-write performance of the AEP memory of the test host is tested twice through the MLC test tool, and the pressure test which is carried out once through the FIO test tool is inserted between the two read-write performance tests, so that the problem that a single test host cannot provide enough pressure to test the performance stability of the AEP memory is avoided; in addition, the method and the system for testing the pressure performance stability of the AEP memory also can automatically judge the pressure performance stability test result of the AEP memory of the test host according to the performance deviation obtained by calculation by calculating the performance deviation of the results of two performance tests, thereby ensuring the accuracy and precision of the test result.
Therefore, compared with the prior art, the invention has prominent substantive features and remarkable progress, and the beneficial effects of the implementation are also obvious.
Drawings
FIG. 1 is a schematic flow chart of the AEP memory pressure performance stability testing method of the present invention.
FIG. 2 is a schematic diagram of a functional block diagram of the AEP memory pressure performance stability test system according to the present invention.
Detailed Description
In order to make the technical solutions and advantages of the present invention clearer, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings.
Fig. 1 is a specific embodiment of the AEP memory pressure performance stability testing method according to the present invention. In this embodiment, the method for testing the stability of the AEP memory pressure performance includes steps s1-s4, which are used to implement the test of the stability of the AEP memory pressure performance of the test host.
And step s1, performing memory read-write performance test on the AEP memory of the test host through the MLC test tool, and recording a test result 1. Step s2 is then performed.
The MLC test tool in this embodiment is installed in the test host in advance, and the memory read-write modes of the memory read-write performance test are read, write, random read, and random write. Correspondingly, the test result1 recorded in this step is the corresponding test result data corresponding to each of the memory read-write modes read, write, random read, and random write.
And step s2, performing pressure test on the AEP memory of the test host through the FIO test tool. Step s3 is then performed.
The FIO test tool according to the present embodiment is previously installed in the test host.
In this embodiment, the FIO test tool described in the present invention has a QD value of 128 for FIO and test block sizes of 4k, 8k, 16k, 32k, 64k, 128k, 256k, 512k, and 1024k for FIO.
In step s2, the test host AEP memory is subjected to a pressure test for a preset number of days d by the FIO test tool, where the preset number of days d is 7 days in the present embodiment. It should be noted that the preset number of days d is obtained from experience of those skilled in the art, and those skilled in the art may set other values, such as 7.5 days or 8 days, according to actual needs.
Step s3, performing the memory read-write performance test on the AEP memory of the test host by the MLC test tool in step s1 again, and recording the test result 2. Step s4 is then performed.
Accordingly, the memory read/write modes of the memory read/write performance test in step s3 are read, write, random read and random write. Correspondingly, the test result2 recorded in this step is the corresponding test result data corresponding to each of the memory read-write modes read, write, random read, and random write.
And step s4, calculating the performance deviation corresponding to the recorded test result1 and test result2, and automatically determining the pressure performance stability test result of the AEP memory of the test host based on the calculated performance deviation.
The method for automatically determining the pressure performance stability test result of the AEP memory of the test host based on the calculated performance deviation in the step s4 includes:
comparing the performance deviation calculated in the step s4 with a preset performance deviation threshold, if the performance deviation does not exceed the preset performance deviation threshold, determining that the pressure performance of the test host AEP memory is stable, otherwise determining that the pressure performance of the test host AEP memory is unstable.
Further, if the preset performance deviation threshold is 2%, the test result1 sequentially records the corresponding test result data under the memory read-write mode read, write, random read and random write as p1, p2, p3 and p4, and the test result2 sequentially records the corresponding test result data under the memory read-write mode read, write, random read and random write as q1, q2, q3 and q4, then the performance deviation of the recorded test result1 and the test result2 calculated in step s4 is | p1-q1|, | p2-q2|, | p3-q3| and | p4-q4|, and the table details are shown in table 1; respectively comparing the performance deviation | p1-q1|, | p2-q2|, | p3-q3| and | p4-q4| obtained by the calculation with a performance deviation threshold value of 2%, if | p1-q1|, | p2-q2|, | p3-q3| and | p4-q4| do not exceed 2%, judging that the pressure performance of the memory of the current test host AEP is stable, and otherwise, judging that the pressure performance of the memory of the current test host AEP is unstable.
TABLE 1
The preset performance deviation threshold value in the present invention is also obtained from experience of those skilled in the art, and corresponds to the preset number of days d. The skilled person can set the specific value of the preset performance deviation threshold to be other values according to different values of the preset number of days d and experience.
In addition, before the step s1, the method for testing the stability of the pressure performance of the AEP memory further includes a step of building a test environment, specifically including the following steps s01-s06, and the steps s01-s06 are sequentially performed.
And step s01, installing the Linux operating system on the test host.
And step s02, restarting the test host, entering a Linux operating system, and logging in by using a root user.
Step s03, install the AEP test software environment on the test host.
In this embodiment, the installation of the AEP test software environment on the test host specifically includes: install ndctl (i.e., ndctl-master. zip tool software package) and its dependent software package on Linux OS, and install ixpdimm (i.e., ixpdimm _ sw-master. zip tool software package) software package.
Step s04, check and set test host AEP memory to storage mode (APD mode).
During specific implementation, whether the memory of the AEP of the test host is in a storage mode (APD mode) is checked, if not, the current mode is manually deleted and set as the storage mode. The specific operation comprises the following steps:
# ixpdimm-cli delete-good,// delete original good, initialize
# ixpdimm-cli create-f-good persistence type appdirect,// create good, and set ADP mode
# ixpdimm-cli delete-pool,// delete pool, initialize
# ixpdimm-cli create-namespace-pool (PoolID) persistence capacity ═ appdeletion capacity ═ X,// create pool, and set the APD mode.
It should be noted that before the step s04, it is possible to check whether the basic information in the AEP memory in the test host is correct, and then perform the step s04 after checking that the basic information is correct. The specific operation comprises the following steps:
dmidreode-t memory | more,// Command View memory frequency
Ixplimm-cli show-dimm,// view AEP memory information
Ixplimm-cli show-topology,// view memory mount information
ixpdimm-cli show-sensor. The/view sensor information can be read normally.
Step s05, copying the auto _ run script, MLC test tool and FIO test tool to the test host Linux system/root directory.
Step s06, running a terminal program under the test host Linux system, and executing the following operations under terminal:
# cd/root carriage return
#./auto _ run carriage return
And (5) after the Terminal shows that the mlc and the FIO are successfully installed, automatically testing the pressure performance stability of the AEP memory of the test host, namely correspondingly executing the steps s1-s 4.
It should be noted that the auto _ run script is implemented through the shell script, that is, the automation program largely implements automation of the test, and is simple, time-saving, easy to operate, and labor-saving.
It should be noted that, in step s06, the operations "# cd/root enter" and "#./auto _ run enter" executed under terminal are used to automatically complete the installation of the MLC test tool and the FIO test tool, and to automatically complete the setting of all the test parameters (by the shell script) during the installation of the MLC test tool and the FIO test tool, where the test parameters include the read-write patterns read, write, random read, and random write of the MLC test tool, and include the test block sizes 4k, 8k, 16k, 32k, 64k, 128k, 256k, 512k, 1024k of the FIO test tool, and the QD value of the FIO test tool (the QD value of FIO is 128).
In summary, according to the method for testing the stability of the pressure performance of the AEP memory, the MLC test tool is used to perform the read/write performance test on the AEP memory of the test host twice, and the FIO test tool is inserted between the two read/write performance tests to perform the pressure test once, so as to avoid that a single test host cannot provide enough pressure to test the stability of the performance of the AEP memory.
In addition, the AEP memory pressure performance stability test method disclosed by the invention can automatically judge the test result of the AEP memory pressure performance stability of the test host according to the performance deviation obtained based on the calculation by calculating the performance deviation of the results of two performance tests, thereby ensuring the accuracy and precision of the test result.
In addition, the pressure test of the invention sets fio QD as 128, and the system runs for 7 days under full pressure and high load according to experience, the process runs completely automatically, and the long-time pressure test can be carried out by fully utilizing the time at night and in holidays, and the efficiency and the precision are higher than those of manual tests.
Fig. 2 is a specific embodiment of the AEP memory pressure performance stability testing system according to the present invention, which corresponds to the above AEP memory pressure performance stability testing method. In this embodiment, the system for testing stability of AEP memory pressure performance includes:
the first-time memory read-write performance testing module is used for testing the memory read-write performance of the AEP memory of the testing host through the MLC testing tool;
the pressure filling module is connected with the first memory read-write performance testing module and used for carrying out pressure testing on the AEP memory of the testing host through a FIO testing tool;
the second memory read-write performance testing module is connected with the pressure filling module and used for carrying out memory read-write performance testing on the AEP memory of the testing host again through the MLC testing tool;
the storage module is respectively connected with the first memory read-write performance test module and the second memory read-write performance test module and is used for storing data of the system, and the storage module comprises a test result1 for storing the first memory read-write performance test module and a test result2 for storing the second memory read-write performance test module;
and the pressure performance stability testing module is connected with the storage module, and is used for reading and calculating the performance deviation between the testing result1 and the testing result2 stored in the storage module, and judging the pressure performance stability testing result of the AEP memory of the testing host machine based on the calculated performance deviation.
When the test device is used, the first memory read-write performance test module performs memory read-write performance test on the AEP memory of the test host through the MLC test tool, and stores a corresponding test result1 into the storage module; then, the pressure filling module carries out pressure test on the AEP memory of the test host through a FIO test tool; then the memory read-write performance test module carries out memory read-write performance test on the AEP memory of the test host again through the MLC test tool for the second time, and stores the corresponding test result2 into the storage module; and then the pressure performance stability testing module reads and calculates the performance deviation between the test result1 and the test result2 stored in the storage module, and judges the pressure performance stability testing result of the AEP memory of the testing host machine based on the calculated performance deviation.
In the pressure performance stability test module, the method for determining the pressure performance stability test result of the test host AEP memory based on the performance deviation obtained by the calculation is as follows:
and comparing the performance deviation of the test result1 and the test result2 with the preset performance deviation threshold, if the performance deviation does not exceed the preset performance deviation threshold, determining that the pressure performance of the AEP memory of the test host is stable, otherwise, determining that the pressure performance of the AEP memory of the test host is unstable.
The pressure filling module carries out pressure test on the AEP memory of the test host for a preset number of days d through the FIO test tool, and the QD value of FIO of the FIO test tool is preset to be 128.
The memory read-write modes of the memory read-write performance test of the test host AEP memory by the MLC test tool are read, write, random read and random write.
The AEP memory pressure performance stability test system also comprises an installation module, which is used for automatically installing the MLC test tool and the FIO test tool on a test host, wherein the test host meets all the following conditions:
a Linux operating system is installed on the test host;
logging in a Linux operating system of a test host by using a root user;
the test host is provided with an AEP test software environment;
testing the memory of the host AEP as a storage mode (APD mode);
auto _ run script, the MLC testing tool and the FIO testing tool are stored in advance under a Linux system/root directory of a testing host;
running a terminal program under a test host Linux system, and executing the following operations under terminal:
# cd/root carriage return
#./auto _ run carriage return
And (4) after the Terminal shows that the mlc and the FIO are successfully installed, automatically testing the pressure performance stability of the AEP memory of the testing host.
The test host is provided with an AEP test software environment, and the test host is provided with an ndctl and a dependent software package thereof and an ixpdimm software package on a Linux OS.
It should be noted that the auto _ run script is implemented through the shell script, that is, the automation program largely implements automation of the test, and is simple, time-saving, easy to operate, and labor-saving.
It should be noted that the operations "# cd/root enter" and "#./auto _ run enter" executed under terminal are used to automatically complete the installation of the MLC test tool and the FIO test tool, and to automatically complete the setting of all the test parameters (through the shell script) in the installation process of the MLC test tool and the FIO test tool, where the test parameters include the read-write patterns read, write, random read, random write of the MLC test tool, the test block sizes 4k, 8k, 16k, 32k, 64k, 128k, 256k, 512k, 1024k of the FIO test tool, and the QD value of the FIO test tool (the QD value of the FIO is 128).
The above embodiments are only for illustrating the technical solutions of the present invention, and not for limiting the same; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may be modified or some technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present invention.
Claims (8)
1. A method for testing stability of AEP (internal memory pressure) performance is characterized by comprising the following steps:
step s1, performing memory read-write performance test on the AEP memory of the test host through the MLC test tool, and recording a test result 1; then step s2 is performed;
step s2, performing pressure test on the AEP memory of the test host through a FIO test tool; then step s3 is performed;
step s3, performing memory read-write performance test on the AEP memory of the test host by the MLC test tool in step s1 again, and recording a test result 2; then step s4 is performed;
and step s4, calculating the performance deviation corresponding to the recorded test result1 and test result2, and automatically determining the pressure performance stability test result of the AEP memory of the test host based on the calculated performance deviation.
2. The AEP memory pressure stability testing method of claim 1, wherein in step s4, the method for automatically determining the pressure stability testing result of the test host AEP memory based on the calculated performance deviation comprises:
and comparing the calculated performance deviation with a preset performance deviation threshold, if the calculated performance deviation does not exceed the preset performance deviation threshold, judging that the pressure performance of the AEP memory of the test host is stable, otherwise, judging that the pressure performance of the AEP memory of the test host is unstable.
3. The AEP memory pressure performance stability testing method of claim 1 or 2, wherein in step s2, the AEP memory of the testing host is subjected to a pressure test for a preset number of days d by a FIO testing tool, the QD value of FIO of which is preset to 128.
4. The AEP memory pressure performance stability testing method of claim 1 or 2, wherein the memory read/write modes of the memory read/write performance test in steps s1 and s3 are read, write, random read and random write.
5. An AEP memory pressure performance stability test system, comprising:
the first-time memory read-write performance testing module is used for testing the memory read-write performance of the AEP memory of the testing host through the MLC testing tool;
the pressure filling module is connected with the first memory read-write performance testing module and used for carrying out pressure testing on the AEP memory of the testing host through a FIO testing tool;
the second memory read-write performance testing module is connected with the pressure filling module and used for carrying out memory read-write performance testing on the AEP memory of the testing host again through the MLC testing tool;
the storage module is respectively connected with the first memory read-write performance test module and the second memory read-write performance test module and is used for storing data of the system, and the storage module comprises a test result1 for storing the first memory read-write performance test module and a test result2 for storing the second memory read-write performance test module;
and the pressure performance stability testing module is connected with the storage module, and is used for reading and calculating the performance deviation between the testing result1 and the testing result2 stored in the storage module, and judging the pressure performance stability testing result of the AEP memory of the testing host machine based on the calculated performance deviation.
6. The AEP memory pressure stability testing system of claim 5, wherein in said pressure stability testing module, said method for determining the pressure stability testing result of said test host AEP memory based on said calculated performance deviation comprises:
and comparing the performance deviation of the test result1 and the test result2 with a preset performance deviation threshold, if the performance deviation does not exceed the preset performance deviation threshold, determining that the pressure performance of the AEP memory of the test host is stable, otherwise, determining that the pressure performance of the AEP memory of the test host is unstable.
7. The AEP memory pressure performance stability testing system of claim 5 or 6, wherein the pressure filling module performs a pressure test on the AEP memory of the test host for a preset number of days d by the FIO testing tool, and the QD value of the FIO of the FIO testing tool is preset to 128.
8. The AEP memory pressure performance stability testing system of claim 5 or 6, wherein the memory read/write modes of the memory read/write performance test performed by the MLC test tool on the test host AEP memory are read, write, random read and random write.
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