CN109425840B - Nanocrystalline rotating magnetic property testing system and measuring method - Google Patents

Nanocrystalline rotating magnetic property testing system and measuring method Download PDF

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CN109425840B
CN109425840B CN201710760713.1A CN201710760713A CN109425840B CN 109425840 B CN109425840 B CN 109425840B CN 201710760713 A CN201710760713 A CN 201710760713A CN 109425840 B CN109425840 B CN 109425840B
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CN109425840A (en
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李永建
王利祥
李昂轩
张长庚
陈瑞颖
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Hebei University of Technology
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    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/12Measuring magnetic properties of articles or specimens of solids or fluids
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Abstract

The invention discloses a system and a method for testing the rotating magnetic property of a nanocrystalline, belongs to equipment for measuring the magnetic property of a nanocrystalline material, and relates to a device and a method for measuring the rotating magnetic property of the nanocrystalline material. The device comprises an NI industrial personal computer, a LabVIEW signal generating and collecting board card, a rotating magnetic characteristic tester, a power amplifier, an impedance matching capacitor box, a B-H composite magnetic sensor and a differential amplification circuit; the two orthogonal magnetic circuits of the invention adopt a symmetrical double-yoke structure, and the two magnetic circuits are independently excited, so that alternating excitation in any direction of a circle, an ellipse and a plane can be carried out according to the actual working condition. The B-H composite magnetic sensor is composed of two H coils and four probes, wherein the H coils vertical to the two window directions are wound on a detachable square inner ring PCB substrate and used for testing the magnetic field intensity H in two orthogonal directions, the four steel needles are installed on an outer PCB substrate, the two probes are in a group, and the magnetic flux density B in the two directions is tested. The outer PCB substrate is provided with welding spots and lead fixing holes. Shimming protective layers are arranged on two sides of the test sample, so that the uniformity of a test area is ensured, and the test precision is improved.

Description

Nanocrystalline rotating magnetic property testing system and measuring method
Technical Field
The invention relates to a device for detecting the rotating magnetic property of a nanocrystalline, in particular to a system and a method for testing the rotating magnetic property of the nanocrystalline.
Background
The rotating magnetic field exists at the T-shaped joint of the nanocrystalline iron core three-phase high-frequency transformer, which generates rotating loss, the rotating magnetic field cannot be tested by adopting the existing annular sample piece testing method, and the accurate calculation of the loss of the nanocrystalline iron core three-phase high-frequency transformer is difficult to realize, so a nanocrystalline rotating magnetic property testing device needs to be built. The nanocrystalline rotation magnetic characteristic detection is based on Faraday electromagnetic induction law and eddy current effect under an alternating magnetic field to obtain a magnetic field signal in a sample. Exciting the sample by two pairs of axially orthogonal excitation windings, and accurately controlling the spatial trajectory of the magnetic field by a LabVIEW feedback control program; and detecting the magnetic field signal in the sample by a B-H composite magnetic sensor which is tightly attached to the surface of the sample and combines a probe and an induction coil.
In the magnetic characteristic detection device in the prior art, a magnetic circuit structure adopts a single C ring structure, and the magnetic circuit symmetry is poor; the excitation winding adopts a rectangular structure, the window utilization rate is low, and the magnetic flux leakage problem is prominent; the magnetic circuit material is silicon steel sheet, which has high iron core loss and serious heating problem under high frequency. The prior art detection device cannot realize the simulation of the rotating magnetic characteristics at high frequency.
In the magnetic characteristic detection device in the prior art, the B sensor and the H sensor have low integration level and need a larger uniform magnetic field area, and the B sensor adopts a punching mode and is easy to damage the magnetic characteristic of a sample; in the process of wire perforation, the insulation of the wire is easily damaged, turn-to-turn short circuit is caused, and the test result is influenced; the H sensor is arranged above the B sensor, so that the distance between the H sensor and the surface of a sample is increased, the test error is increased, and the area requirement of a uniform magnetic field area can be increased when the H sensor is not arranged above the H coil.
Disclosure of Invention
1. The purpose of the invention is as follows:
aiming at the defects and problems in the prior art, the invention provides a nanocrystalline rotating magnetic property testing system and a magnetic property detection method of a sample under a circular rotating magnetic field, an elliptical rotating magnetic field and an alternating magnetic field in any direction of a plane.
2. The technical scheme is as follows: the invention provides the following technical scheme:
a nanocrystalline rotation magnetic characteristic test system comprises an NI industrial personal computer, a LabVIEW signal generation and collection board card connected with the industrial personal computer, wherein the signal output end of the LabVIEW board card is sequentially connected with a power amplifier, a rotation magnetic characteristic tester, an impedance matching capacitor box and a high-power water-cooling resistor as an excitation loop of the system; the B-H composite magnetic sensor implanted in the tester passes through the differential amplification circuit through the shielding wire respectively, and the signal input end of the LabVIEW board card is used as the acquisition loop of the system; the NI industrial personal computer sets an excitation signal, the excitation signal is amplified by the power amplifier and then drives two pairs of axially orthogonal excitation windings, and the impedance matching capacitor box is used for resonating with the excitation inductor and improving the excitation current so as to more easily realize the sufficient magnetization of the sample. The B-H composite magnetic sensor implanted on the surface of the test sample detects a magnetic field signal, the magnetic field signal is input into a differential amplification circuit through a shielding wire to amplify a tiny signal, the signal is input into a LabVIEW signal acquisition end after being amplified, and data processing and storage are carried out through an industrial personal computer.
The excitation magnetic circuit of the nanocrystalline rotating magnetic characteristic tester comprises an iron core, an iron yoke, an iron core pole head and a pole head end face. The iron yoke is connected with the fixing device;
two pairs of trapezoidal sectional type excitation windings are wound at the excitation iron core, and the sectional type excitation windings are wound by litz wires; the first section, the second section and the third section are respectively provided with 1 tap, 2 taps and 3 taps, the number of turns of a winding between every two taps is the same, epoxy resin pouring is carried out after the winding of the excitation winding is finished, and pouring and fixing are carried out between the winding and the iron core;
the square areas between the cubic sensing box and the pole head are the same, so that the close contact between the end face of the pole head and a sample is conveniently realized. The four square columns are positioned at four corners of the base and used for supporting the positioning plate, the shimming protective layer and the sample. The sample and the shimming protective layer are made of a rectangular nanocrystalline sheet with notches. The top cover on the sensing box is fixed and detachable by screws, a sample is placed between the positioning plate and the positioning plate, and shimming protective layers are placed between the positioning plate and the base as well as between the positioning plate and the top cover. The center of the positioning plate is hollowed to embed the B-H composite magnetic sensor.
The B-H composite magnetic sensor comprises two H coils and four probes, wherein the H coils vertical to the two window directions are wound on a detachable square inner PCB substrate by adopting a direct-welding self-adhesive enameled copper wire, the four steel pins are installed on an outer PCB substrate, the two probes are in a group, and the height of each probe is slightly higher than that of the H coil. The outer PCB substrate is provided with welding spots and wire fixing holes. The inner PCB substrate and the outer PCB substrate are adhered by non-conductive adhesive, and the outgoing lines of the B-H composite magnetic sensor are overlapped and twisted to reduce the influence of interference signals.
A system and a method for testing the rotation magnetic characteristics of a nanocrystalline comprise the following steps:
the method comprises the following steps: placing a sample box with a built-in sample, shimming pole shoes and a sensor between the two pairs of pole heads, and adjusting the position of the sample box to enable the sample box to be aligned with and tightly contacted with the pole head faces;
step two: selecting a winding connection mode according to an excitation frequency table look-up;
step three: looking up a table to obtain the capacitance value of the capacitance box, and determining the connection mode of the capacitance box;
step four: sending a unidirectional alternating excitation signal through a LabVIEW program, loading the unidirectional alternating excitation signal on an excitation winding, and forming an alternating magnetic field on a sample;
step five: observing the magnetic flux density and magnetic field intensity waveforms, storing magnetic characteristic data, and judging whether the sample is saturated or not; if the sample does not reach saturation, increasing an excitation voltage signal;
step six: repeating the fifth step until the sample is saturated;
step seven: after the magnetic field is observed to be saturated, slowly reducing the excitation signal, and demagnetizing the sample;
step eight: sending an alternating excitation signal in the other direction through a LabVIEW program, and repeating the fifth step, the sixth step and the seventh step to complete demagnetization of the sample;
step nine: generating two paths of independent excitation signals matched with phases through LabVIEW program control, loading the independent excitation signals to two pairs of excitation windings which are orthogonal in the axial direction, forming a required magnetic field on the sample, and repeating the step five;
step ten: and (4) replacing the winding connection mode, and repeating the fourth, fifth, sixth, seventh, eighth and ninth steps until the magnetic characteristic detection under the required frequency and excitation mode is completed.
3. The advantages and effects are as follows: compared with the prior art, the invention has the following advantages:
1) the magnetic circuit material of the invention selects Fe-M-V series nanocrystalline material with high saturation magnetic density, high initial permeability, low magnetic core loss, good heat resistance and good wear resistance under high frequency. The excitation frequency range is 10k-50kHz, and the magnetic characteristics of the nanocrystalline material under the actual working condition can be accurately simulated.
2) The magnetic circuit structure adopts a double-yoke structure, and the two magnetic yokes have the same length, so that the magnetic circuit has high symmetry and small magnetic leakage; the excitation winding adopts a trapezoidal sectional structure, so that the window utilization rate of the tester is improved, the excitation difficulty is reduced, the taps are arranged between the sections, the number of turns of the winding between the two taps is the same, and the winding is convenient to realize flexible series-parallel connection.
3) The cubic sample box is convenient for the replacement and accurate positioning of samples, and the shimming protective layer is arranged to enable the magnetic field of the test area to be more uniform.
4) The B-H composite magnetic sensor has higher integration level, and reduces the area requirement of a uniform magnetic field area; the outgoing line is fixed by the fixing hole and the fixing paint, so that the interference caused by the vibration of the outgoing line and the damage of the lead caused by the stress of the lead in the installation process are prevented; a coil window formed between the two welding spots is parallel to the testing direction, so that the interference of a magnetic field in the other direction is effectively reduced; the outgoing line adopts the superposition twisted pair to reduce the interference of stray fields.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts
FIG. 1 is a schematic view of a measurement system of the present invention.
FIG. 2 is a schematic view of the main structure of the detecting device of the present invention.
FIG. 3 is a schematic diagram of a B-H composite magnetic sensor in accordance with the present invention.
Figure 4 is a schematic view of a sample kit according to the present invention.
Description of reference numerals:
1. an NI industrial personal computer 2, an LabVIEW signal generating and collecting board card 3, a power amplifier 4, an impedance matching capacitor box 5, a high-power resistor 6, a nanocrystalline rotating magnetic characteristic tester 7, a differential amplifying circuit 8, an upper magnetic yoke 9, a lower magnetic yoke 9, a left magnetic yoke 10, a right magnetic yoke 10, a trapezoidal sectional excitation winding 11, a sample box 12, an iron core 13, an iron core polar head end face 14, an H coil 15, an inner PCB substrate 16, an outer PCB substrate 17, a welding point 118 of a shielding wire connected with the H coil, a welding point 219 of the shielding wire connected with the H coil, an H coil welding point 120, an H coil welding point 221, a through plate hole 22, a welding point 23 connected with a probe 25, a welding point 124 of the shielding wire connected with the probe, a welding point 225 of the shielding wire connected with the probe, a group of probes 26 for measuring a magnetic flux density signal in a certain direction, a group of probes 27 for, A probe 28 which is a group of probes 26 for measuring magnetic flux density signals in the other direction, a probe 29 for supporting, a welding point 30 connected with the probe 26, a welding point 131 connected with a shielding wire connected with the probe, a welding point 232 connected with the shielding wire connected with the probe, a base 33, a top cover 34, a shimming protective layer 35, a test sample 36, a positioning plate 37, a positioning plate 38 embedded with a B-H composite magnetic sensor, a B-H composite magnetic sensor
Detailed Description
The technical solutions of the present invention will be described clearly and completely with reference to the accompanying drawings, and it is to be understood that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Fig. 1 shows a nanocrystalline rotating magnetic characteristic test system, an NI industrial personal computer 1 sends out an excitation signal, the excitation signal is output from an output end of a LabVIEW board card 2, amplified by a power amplifier 3 and drives two pairs of axially orthogonal excitation windings 10, and the excitation signals respectively pass through an impedance matching capacitor box 4 which resonates with an excitation inductor and a high-power resistor 5 for short-circuit protection. The B-H composite magnetic sensor 38 implanted on the surface of the test sample 35 detects a magnetic field signal, inputs the magnetic field signal into the differential amplification circuit 7 through a shielded wire to amplify a tiny signal, inputs the amplified signal into a signal acquisition end of the LabVIEW board card, and processes and stores data through an industrial personal computer. The arrows in the figure represent the signal progression.
The specific measurement method comprises the following steps:
the method comprises the following steps: placing a sample box 11 with a built-in sample, a shimming protective layer 34 and a B-H composite magnetic sensor between two pairs of pole heads, and adjusting the position of the sample box to enable the sample box to be aligned with and tightly contacted with the end faces 13 of the pole heads;
step two: selecting a winding connection mode according to an excitation frequency table look-up;
step three: looking up a table to obtain the capacitance value of the capacitance box, and determining the connection mode of the capacitance box;
step four: sending a unidirectional alternating excitation signal through a LabVIEW program, loading the unidirectional alternating excitation signal on an excitation winding, and forming an alternating magnetic field on a sample;
step five: observing the magnetic flux density and magnetic field intensity waveforms, storing magnetic characteristic data, and judging whether the sample is saturated or not; if the sample does not reach saturation, increasing an excitation voltage signal;
step six: repeating the fifth step until the sample is saturated;
step seven: after the magnetic field is observed to be saturated, slowly reducing the excitation signal, and demagnetizing the sample;
step eight: sending an alternating excitation signal in the other direction through a LabVIEW program, and repeating the fifth step, the sixth step and the seventh step to complete demagnetization of the sample;
step nine: generating two paths of independent excitation signals matched with phases through LabVIEW program control, loading the independent excitation signals to two pairs of excitation windings which are orthogonal in the axial direction, forming a required magnetic field in the sample, and repeating the step five;
step ten: and (4) changing the connection mode of the excitation winding, and repeating the steps of four, five, six, seven, eight and nine until the detection of the required frequency and the magnetic characteristics in the excitation mode is completed.
The invention adds the impedance matching capacitor box in the excitation loop, and can flexibly adjust the matching capacitance value according to the excitation frequency and the connection mode of the excitation winding.
Fig. 2, 3 and 4 show the structure of the rotating magnetic characteristic tester 6 for nanocrystals, the magnetic circuit structure adopts a double yoke structure, and the two yokes 8 and 9 have the same length. The excitation winding adopts a trapezoidal sectional structure, taps are arranged between the sections, the number of turns of the winding between the two taps is the same, and the two taps are symmetrically wound on the two pairs of orthogonal iron cores 12.
The cubic sample box is arranged in a square area formed by end faces of two pairs of iron core polar heads, the top cover 33 is connected with the base 32 through screws so as to be convenient for replacing samples, the two shimming protective layers are arranged between the positioning plates 36 and 37 and the base and the top cover of the sample box, the test samples are arranged between the positioning plates, the surface insulation of the contact part of the test samples and the probes is removed, the B-H composite magnetic sensor is embedded in one positioning plate 37, and the total thickness of the positioning plates and the samples is slightly larger than the distance between the base and the top cover of the sample box so as to. The four corners of the base are provided with square holes, and signal wires of the B-H composite magnetic sensor can be led out from the square holes.
The B-H composite magnetic sensor is composed of two H coils 14 and four probes 25, 26, 27 and 28, wherein the H coils vertical to the two window directions are wound on a detachable square inner PCB substrate 15 and used for testing the magnetic field intensity H in two orthogonal directions, the four probes are installed on an outer PCB substrate 16, and the two probes are in a group and used for testing the magnetic flux density B in two directions. The outer PCB substrate is provided with welding spots and lead fixing holes, the window directions of the welding spots 17, 18, 23, 24, 30 and 31 connected with the shielding wires are consistent with the direction of a measured magnetic field, the welding spots 19, 20, 22 and 29 are used for fixing the outgoing lines of the H coils or the probes 25 and 26 respectively, and the lead is guided from the back surface of the PCB to the front surface for welding through the plate holes 21.
The working principle of the system is as follows: the NI industrial personal computer sets an excitation signal, the excitation signal is amplified by the power amplifier and then drives two pairs of axially orthogonal excitation windings, and the impedance matching capacitor box is used for resonating with the excitation inductor and improving the excitation current so as to more easily realize the sufficient magnetization of the sample. The B-H composite magnetic sensor implanted on the surface of the test sample detects a magnetic field signal, the magnetic field signal is input into a differential amplification circuit through a shielding wire to amplify a tiny signal, the signal is input into a LabVIEW signal acquisition end after being amplified, and data processing and storage are carried out through an industrial personal computer.
Through the above contents, the invention has the following advantages:
1) an impedance matching capacitor box is added in an excitation loop of the measuring system, so that the excitation difficulty is reduced.
2) The magnetic circuit structure adopts a double-yoke structure, and the two magnetic yokes have the same length, so that the magnetic circuit has high symmetry and small magnetic leakage; the excitation winding adopts a trapezoidal sectional structure, so that the window utilization rate of the tester is improved, the excitation difficulty is reduced, the taps are arranged between the sections, the number of turns of the winding between the two taps is the same, and the winding is convenient to realize flexible series-parallel connection.
3) The cubic sample box is convenient for the replacement and accurate positioning of samples, and the shimming protective layer is arranged to enable the magnetic field of the test area to be more uniform.
4) The B-H composite magnetic sensor has higher integration level, and reduces the area requirement of a uniform magnetic field area; the outgoing line is fixed by the fixing hole and the fixing paint, so that the interference caused by the vibration of the outgoing line and the damage of the lead caused by the stress of the lead in the installation process are prevented; a coil window formed between the two welding spots is parallel to the testing direction, so that the interference of a magnetic field in the other direction is effectively reduced; the outgoing line adopts the superposition twisted pair to reduce the interference of stray fields.
The above description is only for the specific embodiments of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can easily conceive of the changes or substitutions within the technical scope of the present invention, and all the changes or substitutions should be covered within the scope of the present invention. Therefore, the protection scope of the present invention should be defined by the appended claims.

Claims (5)

1. A nanocrystalline rotation magnetic characteristic test system comprises an NI industrial personal computer, a LabVIEW signal generation and acquisition board card connected with the NI industrial personal computer, wherein the signal output end of the LabVIEW signal generation and acquisition board card is sequentially connected with a power amplifier, a rotation magnetic characteristic tester, an impedance matching capacitor box and a high-power water-cooling resistor as an excitation loop of the system; the B-H composite magnetic sensor sequentially passes through a differential amplification circuit through a shielding wire, and the signal input end of a LabVIEW signal generation and acquisition board card is used as an acquisition loop of the system; the method is characterized in that: an excitation loop adopts an impedance matching capacitor box, and improves excitation current by using series resonance;
the B-H composite magnetic sensor consists of an inner PCB substrate and an outer PCB substrate, wherein H coils vertical to two window directions are wound on the detachable square inner PCB substrate and used for testing the magnetic field intensity H in two orthogonal directions; designing welding points and wire through-plate holes on the outer PCB substrate; the outgoing lines of the B-H composite magnetic sensor are overlapped and twisted to reduce the influence of interference signals.
2. The rotating magnetic property testing system of nano-crystal as claimed in claim 1, wherein the main magnetic path of the rotating magnetic property tester is composed of four C-rings with the same size, two C-rings are combined to form an excitation loop, the excitation loop comprises an iron core and an iron yoke, the notch of the iron core is a plane or frustum structure, the sectional type trapezoid excitation winding is wound on the winding frame and then assembled at the position of the iron core, and the square area formed at the center of the iron core is provided with the cubic sensing box.
3. The system for testing the rotating magnetic property of the nanocrystals, as recited in claim 2, wherein the cubic sensor box comprises a base, a top cover, two positioning plates, three rectangular nanocrystalline thin plates with notches as the sample and the shimming protection layer; the top cover on the sensing box is fixed and detachable by screws, a sample is placed between the positioning plate and the positioning plate, and a shimming protective layer is placed between the positioning plate and the base as well as between the positioning plate and the top cover; the central area of the positioning plate is hollowed for embedding the B-H composite magnetic sensor.
4. The system for testing the rotating magnetic properties of the nano-crystal as claimed in claim 3, wherein the excitation circuit further comprises an iron core pole head, the shimming protection layer and the sample are all nano-crystal thin plates, the materials, the sizes and the shapes of the shimming protection layer and the sample are the same, the probe is mounted on the surface of the sample for insulation, and four square notches are designed at four corners of the shimming protection layer and the sample to ensure that the effective side length is the same as that of the iron core pole head.
5. A measuring method of a nanocrystalline rotating magnetic property testing system according to any one of claims 1-4, characterized by: the method comprises the following steps:
the method comprises the following steps: placing a sample box with a built-in sample, a shimming protective layer and a B-H composite magnetic sensor between two pairs of iron core pole heads, and adjusting the position of the sample box to enable the sample box to be aligned with and tightly contacted with the end faces of the iron core pole heads;
step two: selecting a winding connection mode according to an excitation frequency table look-up;
step three: looking up a table to obtain a capacitance value of the impedance matching capacitor box, and determining a connection mode of the impedance matching capacitor box;
step four: sending a unidirectional alternating excitation signal through a LabVIEW program, loading the unidirectional alternating excitation signal on an excitation winding, and forming an alternating magnetic field on a sample;
step five: observing the magnetic flux density and magnetic field intensity waveforms, storing magnetic characteristic data, and judging whether the sample is saturated or not; if the sample does not reach saturation, increasing an excitation voltage signal;
step six: repeating the fifth step until the sample is saturated;
step seven: after the magnetic field is observed to be saturated, slowly reducing the excitation signal, and demagnetizing the sample;
step eight: sending an alternating excitation signal in the other direction through a LabVIEW program, and repeating the fifth step, the sixth step and the seventh step to complete demagnetization of the sample;
step nine: generating two paths of independent excitation signals matched with phases through LabVIEW program control, loading the independent excitation signals to two pairs of excitation windings which are orthogonal in the axial direction, forming a required magnetic field on the sample, and repeating the step five;
step ten: and (4) replacing the winding connection mode, and repeating the fourth, fifth, sixth, seventh, eighth and ninth steps until the magnetic characteristic detection under the required frequency and excitation mode is completed.
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