CN108169635A - A kind of tooling of patch optocoupler voltage-withstand test - Google Patents

Abstract

The invention discloses a tooling for pressure-resistant testing of patch optocouplers, and relates to the technical field of testing tooling. It includes an upper shell and a lower shell, the upper shell and the lower shell are rotatably connected, the lower shell is provided with a lower test slot for accommodating multiple optocouplers, and the lower test slot is provided with two parallel conductive slots, the conductive slot There is a conductive part that supplies power to the optocoupler inside, and the conductive part is connected to a withstand voltage instrument through a wire. One end of the lower test tank is provided with an inlet that guides the optocoupler to slide in. The inlet is provided with a seal that closes the inlet. The upper housing is provided with a pressing piece that presses the optocoupler into the conductive slot, and the pressing piece is located at the position corresponding to the upper housing and the lower test slot. The invention adopts a transparent and insulating upper shell and a lower shell to carry out a withstand voltage test on the optocoupler, which is convenient and safe to use; and adopts a flexible and rotatable sealing member, which facilitates the installation of the optocoupler and prevents the optocoupler from slipping out.

Description

A kind of tooling for SMD optocoupler withstand voltage test

technical field

The invention relates to the technical field of testing tooling, in particular to a tooling for pressure-resistant testing of patch optocouplers.

Background technique

Existing optocoupler devices need to undergo factory inspection before use, including various electrical performance tests. The electrical performance tests include withstand voltage tests, current tests, etc., and must meet technical requirements before they can be used. At present, when optocoupler devices are tested for withstand voltage, a single optocoupler is directly electrically connected to the withstand voltage instrument through the test line. The pins of the optocoupler are welded on the pad, and the pad is then electrically connected to the test line. After testing the optocoupler for the first time, it is necessary to separate the optocoupler pins from the pads, which not only consumes time and effort, but also makes the test efficiency low, and the test is inconvenient and not suitable for batch testing.

Contents of the invention

Aiming at the deficiencies of the prior art, the invention discloses a chip optocoupler voltage withstand test tool, which can solve the problem that the existing test tool is not suitable for batch testing.

To achieve the above object, the present invention is achieved through the following technical solutions:

A tooling for voltage resistance testing of patch optocouplers, including an upper case and a lower case, the upper case and the lower case are rotatably connected, the lower case is provided with a lower test slot for accommodating multiple optocouplers, and the lower test slot There are two parallel conduction slots, in which there is a conductive piece that supplies power to the optocoupler. There is a seal for closing the inlet in the mouth, the seal is connected to the lower case, and the upper case is provided with a transparent pressing part that presses the optocoupler in the conductive groove, and the pressing part is located between the upper case and the lower case. The location corresponding to the test slot.

Further, the upper housing is provided with an upper test slot corresponding to the lower test slot, and the pressing member is located in the upper test slot.

Further, the upper test slot is provided with an elastic piece that drives the pressing piece to press the optocoupler, one end of the elastic piece is connected to the pressing piece, and the other end of the elastic piece is connected to the bottom surface of the upper testing slot.

Further, the lower casing is provided with a rotating shaft that drives the seal to rotate in the inlet, one end of the rotating shaft is connected to the lower casing, and the other end of the rotating shaft is connected to the sealing member.

Further, the inlet is wedge-shaped, and the width of the inlet gradually decreases from the end of the inlet far away from the lower test slot to the end of the inlet near the lower test slot.

Further, the bottom surface of the lower test slot and the surface of the lower housing are provided with marks corresponding to and parallel to the optocoupler, and the marks are distributed at intervals along the length direction of the lower test slot.

Further, the upper case is provided with a first opening for opening the upper case and the lower case, and the lower case is provided with a second opening for opening the upper case and the lower case, and the first opening and the second opening are mutually stagger.

Further, the upper case is provided with a first magnetic switch for closing the upper case and the lower case, the lower case is provided with a second magnetic switch for closing the upper case and the lower case, the first magnetic switch and the second Corresponds to the magnetic switch position.

The invention discloses a tooling for withstand voltage testing of patch optocouplers, which adopts a transparent and insulating upper shell and a lower shell to conduct withstand voltage tests on optocouplers, which is convenient and safe to use; It is easy to observe the mark of the corresponding optocoupler through the transparent upper shell, and it is convenient to identify and locate the faulty optocoupler during the experiment and test, so as to improve the experimental effect; the seal that can rotate flexibly is used, which is convenient Install the optocoupler and prevent the optocoupler from sliding out.

Description of drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only These are some embodiments of the present invention. Those skilled in the art can also obtain other drawings based on these drawings without creative work.

Fig. 1 is a top view of the present invention in an open state;

Fig. 2 is a cross-sectional view in the side view direction of Embodiment 1 of the present invention in a closed state;

Fig. 3 is a cross-sectional view in the side view direction of Embodiment 2 of the present invention in a closed state.

In the figure 1. Upper housing, 2. Lower housing, 3. Lower test slot, 4. Conductive member, 5. Inlet, 6. Upper test slot, 7. Mark, 8. First opening, 9. Second Opening, 10, first magnetic switch, 11, second magnetic switch, 12, loose leaf, 13, pressing member, 14, elastic member, 15, sealing member, 16, rotating shaft, 17, wire.

Detailed ways

In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

Example 1

As shown in FIG. 1 and FIG. 2 , a tooling for the SMT optocoupler withstand voltage test according to the embodiment of the present invention includes an upper casing 1 and a lower casing 2 , and the upper casing 1 and the lower casing 2 pass through a hinge 12 The rotation connection is convenient to drive the upper casing 1 and the lower casing 2 to open or close through rotation. Both the upper casing 1 and the lower casing 2 are made of transparent insulating materials (such as plastics), which are safe and will not leak electricity during use, and It is convenient to observe the experiment process. The lower housing 2 is provided with a lower test slot 3 for accommodating a plurality of optocouplers. The lower test slot 3 is provided with two parallel conductive slots, and a conductive part 4 for supplying power to the optocoupler is arranged in the conductive slot. The conductive part 4 is embedded In the conductive groove, the conductive part 4 can adopt an integrated conductive contact bar, and is connected to an external withstand voltage instrument through a wire 17 for testing the optocoupler.

The optocouplers are sequentially arranged in the lower test slot 3 and electrically connected with the conductive member 4. One end of the lower test slot 3 is provided with an inlet 5 for guiding the optocoupler to slide in. The inlet 5 is wedge-shaped, and the width of the inlet 5 is determined by the inlet 5 The end away from the lower test slot 3 gradually decreases toward the end of the entrance 5 near the lower test slot 3, which is convenient for the optocoupler to be inserted.

The inlet 5 is provided with a seal 15 that closes the inlet 5. The seal 15 is connected to the lower housing 2. The lower housing 2 is provided with a rotating shaft 16 that drives the sealing 15 to rotate in the inlet 5. One end of the rotating shaft 16 It is connected with the lower casing 2, and the other end of the rotating shaft 16 is connected with the seal 15. It is convenient for the sealing member 15 to rotate flexibly. When the optocoupler is installed, the inlet 5 is opened, and the inlet 5 is sealed during the installation and testing process, thereby improving the convenience of the whole testing process.

The upper housing 1 is provided with a pressing member 13 that compresses the optocoupler in the lower test slot 3, and the pressing member 13 is located at the position corresponding to the upper housing 1 and the upper testing slot 6, so that the upper housing 1 and the lower housing can be easily connected. 2 Press the optocoupler directly when it is closed. The upper case 1 is provided with an upper test slot 6 corresponding to the lower test slot 3 , and the pressing member 13 is located in the upper test slot 6 , so that the pressing member 13 is less likely to be accidentally touched when the upper case 1 is opened. The pressing part 13 adopts a transparent rubber pad or a transparent integrated pressure plate, which is convenient for observing the contact condition of the optocoupler and observing the experiment process during the withstand voltage test.

The conductive parts 4 are located on both sides of the lower test slot 3, and the conductive parts 4 extend along the length direction of the lower test slot 3, so that the electrodes on both sides of the optocoupler can keep in contact with the conductive parts 4 while sliding in the lower test slot 3. The bottom surface of the lower test slot 3 and the surface of the lower housing 2 are provided with marks 7 corresponding to and parallel to the optocoupler. The marks 7 can adopt labels, patterns or colors, and the marks 7 are distributed at intervals along the length direction of the lower test slot 3 to facilitate The optocouplers sequentially arranged in the lower test slot 3 are distinguished, thereby quickly identifying and locating the position of the faulty optocoupler.

The upper case 1 is provided with a first opening 8 for opening the upper case 1 and the lower case 2, and the lower case 2 is provided with a second opening 9 for opening the upper case 1 and the lower case 2, and the first opening 8 and The second openings 9 are staggered from each other, so that when the first opening 8 and the second opening 9 are opened, fingers can be inserted in and drive the upper casing 1 and the lower casing 2 to separate.

The upper case 1 is provided with a first magnetic switch 10 for closing the upper case 1 and the lower case 2, and the lower case 2 is provided with a second magnetic switch 11 for closing the upper case 1 and the lower case 2, and the first magnetic switch 10 corresponds to the position of the second magnetic switch 11. Both the first magnetic switch 10 and the second magnetic switch 11 use magnets. When the first magnetic switch 10 and the second magnetic switch 11 are in contact, they can attract and fix each other. When closed with the lower case 2, the upper case 1 and the lower case 2 are firmly fixed to prevent the upper case 1 and the lower case 2 from being easily separated by external force.

Example 2

As shown in Figure 3, the difference between the embodiment of the present invention and embodiment 1 is that the upper test groove 6 is provided with an elastic member 14 that drives the pressing member 13 to compress the optocoupler, the elastic member 14 can be a compression spring, and the elastic member 14 One end of the elastic member is connected with the pressing member 13, and the other end of the elastic member 14 is connected with the bottom surface of the upper test groove 6, so as to strengthen the pressure on the optocoupler, thereby improving the experimental effect.

Refer to Example 1 for other undescribed structures.

To sum up, the present invention discloses a tooling for withstand voltage testing of patch optocouplers. The transparent and insulating upper and lower housings are used for withstand voltage testing of optocouplers, which is convenient and safe to use; Conductive grooves are used to install optocouplers in batches, and the transparent upper shell is convenient for observing the marks of corresponding optocouplers, which is convenient for identifying and locating faulty optocouplers during experiments and tests, thereby improving the experimental effect; Seal to facilitate optocoupler installation and prevent optocoupler from slipping out.

It should be noted that in this article, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply that there is a relationship between these entities or operations. There is no such actual relationship or order between them. Furthermore, the term "comprises", "comprises" or any other variation thereof is intended to cover a non-exclusive inclusion such that a process, method, article, or apparatus comprising a set of elements includes not only those elements, but also includes elements not expressly listed. other elements of or also include elements inherent in such a process, method, article, or device. Without further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of additional identical elements in the process, method, article or apparatus comprising said element.

The above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: it can still be described in the foregoing embodiments Modifications are made to the recorded technical solutions, or equivalent replacements are made to some of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims (8)

1. A tooling for pressure testing of patch optocouplers, characterized in that: it includes an upper housing and a lower housing, the upper housing and the lower housing are rotatably connected, and the lower housing is provided with a lower test chamber for accommodating a plurality of optocouplers There are two conductive grooves parallel to each other in the lower test groove. There are conductive parts that supply power to the optocoupler in the conductive groove. The conductive parts are connected to the withstand voltage instrument through wires. The inlet is provided with a sealing member for closing the inlet, the sealing member is connected to the lower housing, and the upper housing is provided with a transparent pressing member that presses the optocoupler in the conductive groove. It is located at the corresponding position of the upper case and the lower test slot. 2 . The tooling for withstand voltage testing of SMD optocouplers according to claim 1 , wherein the upper housing is provided with an upper test slot corresponding to the lower test slot, and the pressing member is located in the upper test slot. 3 . 3. The tooling of the chip optocoupler pressure test as claimed in claim 2, characterized in that: the upper test groove is provided with an elastic piece that drives the pressing piece to compress the optocoupler, and one end of the elastic piece is connected to the pressing piece connected, the other end of the elastic member is connected with the bottom surface of the upper test slot. 4. The tooling for the SMT optocoupler pressure test according to claim 1, characterized in that: the lower housing is provided with a rotating shaft that drives the seal to rotate in the inlet, one end of the rotating shaft is connected to the lower housing, and the rotating shaft The other end of the adapter is connected to the seal. 5. The tooling for SMD optocoupler withstand voltage test as claimed in claim 1, characterized in that: the inlet is wedge-shaped, and the width of the inlet is from the end of the inlet far away from the lower test slot to the end of the inlet near the lower test slot slowing shrieking. 6. The tooling for the SMT optocoupler pressure test according to claim 1, characterized in that: the bottom surface of the lower test groove and the surface of the lower housing are provided with marks corresponding to and parallel to the optocoupler, and the marks are tested along the lower surface. The grooves are distributed at intervals along the length direction. 7. As claimed in claim 1, the tooling for withstand voltage test of SMD optocoupler is characterized in that: the upper housing is provided with a first opening for opening the upper housing and the lower housing, and the lower housing is provided with an opening for opening the upper housing. The second opening of the casing and the lower casing, the first opening and the second opening are staggered from each other. 8. The tooling for SMD optocoupler withstand voltage test according to claim 1, characterized in that: the upper housing is provided with a first magnetic switch for closing the upper housing and the lower housing, and the lower housing is provided with a closing upper housing. The housing and the second magnetic switch of the lower housing correspond to the positions of the first magnetic switch and the second magnetic switch.