CN108107289A - A kind of SV input circuits automatic test approach - Google Patents
A kind of SV input circuits automatic test approach Download PDFInfo
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- CN108107289A CN108107289A CN201711247433.7A CN201711247433A CN108107289A CN 108107289 A CN108107289 A CN 108107289A CN 201711247433 A CN201711247433 A CN 201711247433A CN 108107289 A CN108107289 A CN 108107289A
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- rated value
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- input circuits
- virtual terminator
- automatic test
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- 238000012360 testing method Methods 0.000 title claims abstract description 92
- 238000013459 approach Methods 0.000 title claims abstract description 18
- 238000005259 measurement Methods 0.000 claims description 9
- 230000037361 pathway Effects 0.000 claims description 4
- 238000004886 process control Methods 0.000 abstract description 2
- 101150023901 phsC gene Proteins 0.000 description 4
- 230000001681 protective effect Effects 0.000 description 4
- 230000008901 benefit Effects 0.000 description 2
- 230000002146 bilateral effect Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 101150086130 phsB gene Proteins 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000007667 floating Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 101150029741 phsA gene Proteins 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Abstract
The invention discloses a kind of SV input circuits automatic test approach, including editing the corresponding automatic test template of SV input circuits；The example information of secondary device to be measured is imported, generates preliminary test example；Secondary device to be measured is connected, obtains a rated value of each SV inputs virtual terminator；Secondary rated value is obtained from the automatic test template of SV input circuits or by reading the secondary rated value of data service acquisition, generate complete test case；It puts into all SV and receives soft pressing plate, SV energizing quantities are applied to secondary device to be measured；The order of virtual terminator is inputted according to SV in the complete test case, sequentially each SV inputs virtual terminator is tested.Test template in the present invention can be edited in advance, and test case generation, test process control, test result obtains, test result judgement can be automatically performed, and reduces the labor intensity of test job, improves testing efficiency.
Description
Technical field
The invention belongs to relay protection of power system testing fields, and in particular to a kind of SV input circuits side of test automatically
Method.
Background technology
The secondary circuit realized in traditional substation using cable is replaced in intelligent substation by optical fiber, previous visible
Secondary circuit test job that is tangible, being completed with the break-make shelves of universal meter can not meet intelligent substation secondary
The requirement of loop-around test can only could complete the work by the way of energizing quantity is applied.
The test job of SV input circuits is the key content of secondary circuit test, is mainly protected at present using digital relay
Tester manual configuration SV message parameters are protected, SV messages is sent to secondary device to be measured, and is looked into before the operator control panel of protective device
See data and artificial judgment test result, therefore the testing time is longer.Particularly current site protective device eliminates this
Ground operator control panel in central station of floating dock, it is necessary to can just check data, so as to create a further reduction testing efficiency.
The content of the invention
In view of the above-mentioned problems, the present invention proposes a kind of SV input circuits automatic test approach, SV inputs can be tested automatically
Whether circuit correctly connects, and whether the state of SV input virtual terminators is correctly validated, and avoids substantial amounts of manually authenticated
Journey.
It realizes above-mentioned technical purpose, reaches above-mentioned technique effect, the invention is realized by the following technical scheme：
A kind of SV input circuits automatic test approach, comprises the following steps：
(1) according to the ICD files of secondary device to be measured, the corresponding automatic test template of SV input circuits is edited；
All SV that the automatic test template of SV input circuits includes secondary device to be measured receive soft platen pathway, institute
There is the related information of SV input virtual terminators and each SV input virtual terminators；
The related information of each SV input virtual terminators of the secondary device to be measured includes：Internal virtual terminator path, pole
Property, telemetering amount amplitude path, telemetering amount phase path, a rated value path, secondary rated value/secondary rated value path, survey
Try phase etc.；
When not including "/" symbol in the secondary rated value/secondary rated value routing information, show the type of the information
It is secondary rated value, for not inputting virtual terminator to the SV of secondary rated value modeling；When the secondary rated value/secondary specified
When being worth in routing information comprising "/" symbol, the type for showing the information is secondary rated value path, for secondary specified
The SV input virtual terminators of value modeling；
The value of the polarity of the SV inputs virtual terminator is positive polarity or negative polarity, and positive polarity is examining phase to miss for expression
When poor, phase measurement is telemetering amount phase, and for negative polarity for representing when examining phase error, phase measurement is telemetering amount
Antiphase；
The SV receives the device name in soft platen pathway, and it is empty that the SV inputs the inside in the related information of virtual terminator
Device in terminal path, telemetering amount amplitude path, telemetering amount phase path, a rated value path, secondary rated value path
Title is " TEMPLATE "；
The reference phasor of secondary device to be measured is arranged to the 1st SV input in the automatic test template of SV input circuits
Virtual terminator, for example, the reference phasor of line protective devices is A phase voltages, the reference phasor of mother protective device is A phase currents,
And the test phase in its related information should be arranged to 0 °；
In order not to the engaged test time, in the specific implementation, the automatic test template of SV input circuits can be advance
Editor, and test template file is saved as, the secondary device of same model can only be repeated with test template of editor
It uses.
(2) example information of secondary device to be measured is imported from SCD the CID files of secondary device to be measured, by described in
The automatic test template instantiation of SV input circuits, generates preliminary test example；
When it is implemented, when carrying out test template instantiation, it is necessary to by the dress in the automatic test template of SV input circuits
It puts title " TEMPLATE " and replaces with actual device title；
It is not only instantiated unreferenced comprising the SV input virtual terminators for referring to external data in the preliminary test example
The SV input virtual terminators of external data, the 1st SV input virtual terminators in the automatic test template of SV input circuits must be real
Exampleization, wherein, whether SV inputs virtual terminator refer to external data according to " inputs " section in configuration file comprising the SV
Virtual terminator is inputted to judge.
The example information of the secondary device to be measured includes：Actual device title, IP address subscribe to the configuration of SV data sets
Information, SV input virtual terminator connection relations；The subscription SV data sets configuration information includes SV parameter set metadatas, SV control blocks are joined
Number and SV messaging parameters.
(3) secondary device to be measured is connected by bilateral association service, by reading data service from secondary device to be measured
Obtain a rated value of each SV inputs virtual terminator；For not inputting virtual terminator to the SV of secondary rated value modeling, from described
Secondary rated value is obtained in the automatic test template of SV input circuits；For to the empty end of SV inputs of secondary rated value modeling
Son obtains secondary rated value from secondary device to be measured by reading data service, improves preliminary test example, it is real to generate complete test
Example；
(4) all SV are put into and receives soft pressing plate, matched somebody with somebody according to the subscription SV data sets in the example information of secondary device to be measured
Confidence breath applies SV energizing quantities to secondary device to be measured；
(5) order of virtual terminator is inputted according to SV in the complete test case, it is corresponding to the 1st SV inputs virtual terminator
External SV passages dosage, wherein, amplitude is a rated value, and phase is corresponding logical in the automatic test template of SV input circuits
The test phase (being preferably 0 °) in road, frequency 50Hz are inputted by reading data service reading SV in the related information of virtual terminator
Telemetering amount amplitude, and examine amplitude error；
The 1st SV input virtual terminators should be continuously applied energizing quantity as reference amount and terminate until entirely testing；To the 1st
A SV inputs virtual terminator, and magnitude references value is secondary rated value, and amplitude measure is telemetering amount amplitude, and amplitude error is：(| width
It is worth measured value-magnitude references value |)/magnitude references value, the amplitude error should be no more than 0.5%.
(6) order of virtual terminator is inputted according to SV in the complete test case, virtual terminator pair is inputted to other SV successively
The external SV passages dosage answered, and amplitude error and phase error are examined, it is tested automatically until completing all SV input circuits.
Described that other SV are inputted with virtual terminator, magnitude references value is secondary rated value, and amplitude measure is telemetering amount amplitude,
Amplitude error is：(| amplitude measure-magnitude references value |)/magnitude references value；Virtual terminator, phase reference value are inputted to other SV
For test phase, phase measurement is for telemetering amount phase or telemetering amount antiphase, phase error：| phase measurement-phase
A reference value |, the amplitude error should be not more than 0.5%；Phase error should be not more than 0.5 °.
Beneficial effects of the present invention：
The SV input circuit automatic test approach of the present invention, test template can be edited in advance, and test case generation was tested
Process control, test result obtain, test result judgement need not manually participate in being automatically performed, and reduce SV input circuits
The labor intensity of test job, improves testing efficiency.
Description of the drawings
Fig. 1 is the SV input circuit automatic test approach flow charts of an embodiment of the present invention.
Specific embodiment
In order to make the purpose , technical scheme and advantage of the present invention be clearer, with reference to embodiments, to the present invention
It is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, it is not used to
Limit the present invention.
The application principle of the present invention is explained in detail below in conjunction with the accompanying drawings.
As shown in Figure 1, by taking the route protection PCS-931-D of certain company as an example, SV input circuit automatic test approach includes
Following steps：
Step 1：According to the ICD files of PCS-931-D, the automatic test template of SV input circuits is edited；
The SV comprising PCS-931-D receives soft platen pathway in the automatic test template of SV input circuits：
The association of all SV input virtual terminators and each SV input virtual terminators of " TEMPLATELD0/GGIO1.SPCSO4 ", PCS-931-D
Information, the related information include internal virtual terminator path, polarity, telemetering amount amplitude path, telemetering amount phase path, once
Rated value path, secondary rated value/secondary rated value path and test phase, referring specifically to table 1；
Table 1
Wherein, voltage type SV, which inputs virtual terminator, does not have secondary rated value model, and current type SV inputs virtual terminator has two
Secondary rated value model；
Step 2：For PCS-931-D devices to be measured, example information is imported from its CID file, by SV input circuits
Automatic test template instantiation, generation input the preliminary test example of virtual terminator with 4 SV；
The example information of importing includes：
Actual device title：“PL2201A”；
IP address：“172.200.1.180”；
1 SV data set is had subscribed, the text of SV parameter set metadatas is described as follows：
The text of SV control block parameters is described as follows：
<SampledValueControl smvID=" ML2201AMU/LLN0.smvcb0 " desc=" " multicast
=" true " nofASDU=" 1 " confRev=" 1 " smpRate=" 4000 " datSet=" dsSV0 " name=" smvcb0 "/
>
The text of SV messaging parameters is described as follows：
4 SV input virtual terminators are instantiated, the text of connection relation is described as follows：
Step 3：PCS-931-D devices to be measured are connected by bilateral association service, it is each by reading data service acquisition
A rated value and secondary rated value and each voltage type SV inputs virtual terminator for current type SV input virtual terminators is once
Rated value, the secondary rated value of each voltage type SV inputs virtual terminator are tested automatically from the SV input circuits of PCS-931-D devices
It is obtained in template；
The rated value of SV inputs virtual terminator is shown in Table 2 in the complete test case ultimately generated；
Table 2
Step 4：The soft pressing plate " PL2201ALD0/GGIO1.SPCSO4 " of input SV receptions is serviced by controlling, according to subscription
SV data sets configuration information applies SV energizing quantities to PCS-931-D devices to be measured；
Step 5：Examine the amplitude error of the 1st SV input virtual terminator " PL2201ASVLD1/SVINUATVTR1.Vol "
Whether meet the requirements, comprise the following steps：
1) to external SV passages " ML2201AMU/TVTR2.Vol " dosage, wherein, amplitude 220kV, phase is 0 °, frequency
Rate is 50Hz；
2) it is by reading the value of data service reading " PL2201APROT/MMUX1.PhV.phsA.cVal.mag.f "
100.1, then magnitude references value is 100V, amplitude measure 100.1V, and amplitude error 0.1% meets the requirements；
3) step 6：The amplitude of the 2nd SV input virtual terminator " PL2201ASVLD1/SVINUBTVTR1.Vol " is examined to miss
Whether difference and phase error meet the requirements, and comprise the following steps：
1) to external SV passages " ML2201AMU/TVTR2.Vol " dosage, wherein, amplitude 220kV, phase is 0 °, frequency
Rate is 50Hz；To external SV passages " ML2201AMU/TVTR3.Vol " dosage, wherein, amplitude 220kV, phase is -120 °,
Frequency is 50Hz；
2) it is by reading the value of data service reading " PL2201APROT/MMUX1.PhV.phsB.cVal.mag.f "
100.2, then magnitude references value is 100V, amplitude measure 100.2V, and amplitude error 0.2% meets the requirements；
3) be by reading the value of data service reading " PL2201APROT/MMUX1.PhV.phsB.cVal.ang.f "-
120.3, then phase reference value is -120 °, and phase measurement is -120.3 °, and phase error is 0.3 °, is met the requirements；
4) step 7：The amplitude of the 3rd SV input virtual terminator " PL2201ASVLD1/SVINUCTVTR1.Vol " is examined to miss
Whether difference and phase error meet the requirements, and comprise the following steps：
1) to external SV passages " ML2201AMU/TVTR2.Vol " dosage, wherein, amplitude 220kV, phase is 0 °, frequency
Rate is 50Hz；To external SV passages " ML2201AMU/TVTR4.Vol " dosage, wherein, amplitude 220kV, phase is 120 °, frequency
Rate is 50Hz；
2) it is by reading the value of data service reading " PL2201APROT/MMUX1.PhV.phsC.cVal.mag.f "
100.6, then magnitude references value is 100V, amplitude measure 100.6V, and amplitude error 0.6% is unsatisfactory for requiring；
3) value that " PL2201APROT/MMUX1.PhV.phsC.cVal.ang.f " is read by reading data service is 121,
So phase reference value is 120 °, and phase measurement is 121 °, and phase error is 1.0 °, is unsatisfactory for requiring；
4) step 8：The amplitude of the 4th SV input virtual terminator " PL2201ASVLD1/SVINA1TVTR1.Vol " is examined to miss
Whether difference and phase error meet the requirements, and comprise the following steps：
1) to external SV passages " ML2201AMU/TVTR2.Vol " dosage, wherein, amplitude 220kV, phase is 0 °, frequency
Rate is 50Hz；To external SV passages " ML2201AMU/TCTR1.Amp " dosage, wherein, amplitude 600A, phase is -90 °, frequency
Rate is 50Hz；
2) value that " PL2201APROT/MMUX1.A.phsC.cVal.mag.f " is read by reading data service is 1.002,
So magnitude references value is 1A, and amplitude measure 1.002, amplitude error 0.2% meets the requirements；
The value that " PL2201APROT/MMUX1.A.phsC.cVal.ang.f " is read by reading data service is 89, then
Phase reference value is 120 °, and phase measurement is -91 ° (89 ° of reverse phases), and phase error is 1.0 °, is unsatisfactory for requiring.
The basic principles, main features and the advantages of the invention have been shown and described above.The technology of the industry
Personnel are it should be appreciated that the present invention is not limited to the above embodiments, and the above embodiments and description only describe this
The principle of invention, without departing from the spirit and scope of the present invention, various changes and modifications of the present invention are possible, these changes
Change and improvement all fall within the protetion scope of the claimed invention.The claimed scope of the invention by appended claims and its
Equivalent thereof.
Claims (10)
1. a kind of SV input circuits automatic test approach, which is characterized in that comprise the following steps：
(1) according to the ICD files of secondary device to be measured, the corresponding automatic test template of SV input circuits is edited；
(2) example information of secondary device to be measured is imported from SCD the CID files of secondary device to be measured, the SV is defeated
The automatic test template instantiation of entry loop, generates preliminary test example；
(3) secondary device to be measured is connected, each SV inputs virtual terminator is obtained once from secondary device to be measured by reading data service
Rated value；For not inputting virtual terminator to the SV of secondary rated value modeling, from the automatic test template of SV input circuits
Obtain secondary rated value；For inputting virtual terminator to the SV of secondary rated value modeling, by reading data service to be measured two
Secondary device obtains secondary rated value, improves preliminary test example, generates complete test case；
(4) all SV are put into and receives soft pressing plate, match somebody with somebody confidence according to the subscription SV data sets in the example information of secondary device to be measured
Breath applies SV energizing quantities to secondary device to be measured；
(5) order of virtual terminator is inputted according to SV in the complete test case, outside corresponding to the 1st SV inputs virtual terminator
SV passage dosages, wherein, amplitude is a rated value, and phase is respective channel in the automatic test template of SV input circuits
Test phase reads the telemetering amount amplitude in the related information of SV input virtual terminators, and examines amplitude error；
(6) order of virtual terminator is inputted according to SV in the complete test case, it is corresponding to other SV inputs virtual terminator successively
External SV passages dosage, and amplitude error and phase error are examined, it is tested automatically until completing all SV input circuits.
2. a kind of SV input circuits automatic test approach according to claim 1, it is characterised in that：In the step (1)
The automatic test template of SV input circuits all SV for including secondary device to be measured receive soft platen pathway, the empty end of all SV inputs
The related information of son and each SV inputs virtual terminator.
3. a kind of SV input circuits automatic test approach according to claim 2, it is characterised in that：It is described to be measured secondary to set
The related information of standby each SV input virtual terminators includes：Internal virtual terminator path, polarity, telemetering amount amplitude path, telemetering amount
Phase path, a rated value path, secondary rated value/secondary rated value path, test phase.
4. a kind of SV input circuits automatic test approach according to claim 3, it is characterised in that：When described secondary specified
When not including "/" symbol in value/secondary rated value routing information, the type for showing the information is secondary rated value, for not having
Virtual terminator is inputted to the SV of secondary rated value modeling；It is accorded with when including "/" in the secondary rated value/secondary rated value routing information
Number when, the type for showing the information is secondary rated value path, for secondary rated value modeling SV input virtual terminator.
5. a kind of SV input circuits automatic test approach according to claim 3, it is characterised in that：The empty end of SV inputs
The value of the polarity of son is positive polarity or negative polarity, and for positive polarity for representing when examining phase error, phase measurement is telemetering
Phase is measured, for negative polarity for representing when examining phase error, phase measurement is the antiphase of telemetering amount phase.
6. a kind of SV input circuits automatic test approach according to claim 3, it is characterised in that：The SV receives soft pressure
Device name in plate circuit footpath, the SV input inside virtual terminator path, telemetering amount amplitude road in the related information of virtual terminator
Device name in footpath, telemetering amount phase path, a rated value path, secondary rated value path is " TEMPLATE "；Step
Suddenly in (2), when test template instantiates, the device name " TEMPLATE " in the automatic test template of SV input circuits is replaced with
Actual device title.
7. a kind of SV input circuits automatic test approach according to claim 1, it is characterised in that：In the step (2)
Preliminary test example in only comprising the SV input virtual terminators for referring to external data, do not instantiate the SV of unreferenced external data
Virtual terminator is inputted, the 1st SV inputs virtual terminator in the automatic test template of SV input circuits must instantiate, wherein, SV
Whether input virtual terminator refers to external data and inputs the judgement of virtual terminator connection relation according to the SV.
8. a kind of SV input circuits automatic test approach according to claim 7, it is characterised in that：In the step (2)
The example information of secondary device to be measured include：Actual device title, IP address subscribe to SV data sets configuration information, SV inputs
Virtual terminator connection relation；The subscription SV data sets configuration information includes SV parameter set metadatas, SV control blocks parameter and SV communications
Parameter.
9. a kind of SV input circuits automatic test approach according to claim 1, it is characterised in that：In the step (5),
1st SV input virtual terminator should be continuously applied energizing quantity as reference amount and terminate until entirely testing；To the 1st empty end of SV inputs
Son, magnitude references value are secondary rated value, and amplitude measure is telemetering amount amplitude, and amplitude error is：
(| amplitude measure-magnitude references value |)/magnitude references value.
10. a kind of SV input circuits automatic test approach according to claim 1, it is characterised in that：The step (6)
In, for other SV input virtual terminator for, magnitude references value be secondary rated value, amplitude measure be telemetering amount amplitude, width
Value error is：(| amplitude measure-magnitude references value |)/magnitude references value；For other SV input virtual terminator, phase base
Quasi- value is test phase, and phase measurement is for telemetering amount phase or telemetering amount antiphase, phase error：| phase measurement-
Phase reference value |.
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