CN107966408B - A calibration tool for measuring the absorption rate of optical components - Google Patents
A calibration tool for measuring the absorption rate of optical components Download PDFInfo
- Publication number
- CN107966408B CN107966408B CN201711451489.4A CN201711451489A CN107966408B CN 107966408 B CN107966408 B CN 107966408B CN 201711451489 A CN201711451489 A CN 201711451489A CN 107966408 B CN107966408 B CN 107966408B
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- fixture
- calibration
- sample
- anchor clamps
- base
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- 230000003287 optical effect Effects 0.000 title claims abstract description 17
- 238000010521 absorption reaction Methods 0.000 title claims abstract description 11
- 238000005259 measurement Methods 0.000 claims abstract description 11
- 239000000523 sample Substances 0.000 claims description 66
- 230000000694 effects Effects 0.000 claims description 2
- 230000009286 beneficial effect Effects 0.000 abstract description 2
- 230000002452 interceptive effect Effects 0.000 abstract 1
- 238000001514 detection method Methods 0.000 description 9
- 238000006243 chemical reaction Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 2
- 238000010276 construction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25B—TOOLS OR BENCH DEVICES NOT OTHERWISE PROVIDED FOR, FOR FASTENING, CONNECTING, DISENGAGING OR HOLDING
- B25B11/00—Work holders not covered by any preceding group in the subclass, e.g. magnetic work holders, vacuum work holders
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- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
本发明公开了一种光学元件吸收测量的快速标定工装，包括夹具底座，所述第一夹具内设有待测样品安装槽，所述第一夹具上端设有调整螺钉，所述第二夹具内设有定标样品安装孔，所述定标样品安装孔内设有定标样品支撑面，所述第一夹具与第二夹具与夹具底座固定连接时所述待测样品支撑板上端面与所述定标样品支撑面处于同一平面内，本发明的有益效果是：本发明将待检测样品夹具与定标样品夹具分别固定在夹具底板上，互不干涉，可将定标样品固定在夹具上，实现随时可以进行定标的功能，在定标样品和检测样品尺寸不同的情况下实现简易定标，相比定标样品与检测样品共用夹具时，夹具结构简单，成本低。
The present invention discloses a rapid calibration tool for absorption measurement of optical elements, comprising a fixture base, a sample mounting groove to be tested is provided in the first fixture, an adjustment screw is provided at the upper end of the first fixture, a calibration sample mounting hole is provided in the second fixture, a calibration sample supporting surface is provided in the calibration sample mounting hole, and when the first fixture and the second fixture are fixedly connected to the fixture base, the upper end surface of the sample supporting plate to be tested and the calibration sample supporting surface are in the same plane. The beneficial effects of the present invention are as follows: the present invention fixes the sample fixture to be tested and the calibration sample fixture on the fixture bottom plate respectively without interfering with each other, and the calibration sample can be fixed on the fixture to realize the function of calibration at any time, and realizes simple calibration when the calibration sample and the test sample are of different sizes. Compared with the case where the calibration sample and the test sample share a fixture, the fixture structure is simple and the cost is low.
Description
Technical Field
The invention relates to the technical field of optical element measurement calibration tools, in particular to a calibration tool for measuring the absorptivity of an optical element.
Background
When the optical element detection device detects the absorption rate, the optical element detection device needs to have a reference value, the reference value needs to calibrate a calibration sample with a known absorption rate value, the calibration value is stored and used as a reference value for detection, and when other samples are measured, the measured value is compared with the reference value, so that the absorption rate of the detection sample is converted.
Generally, when calibrating, the calibration sample and the detection sample share one clamping position, the sample needs to be replaced when calibrating, if the sizes of the detection sample and the calibration sample are different, the calibration sample can be clamped only by adjusting or replacing the clamp, and after the calibration is completed, the calibration sample needs to be detached and stored by the device. The whole calibration process has complex operation flow and lower efficiency.
Disclosure of Invention
The invention aims to provide a calibration tool for measuring the absorptivity of an optical element, so as to solve the problems in the background art.
In order to achieve the above purpose, the present invention provides the following technical solutions:
The utility model provides an optical element absorbs quick demarcation frock of measuring, includes the anchor clamps base, its characterized in that, the activity is dismantled on the anchor clamps base and is connected with first anchor clamps and second anchor clamps, be equipped with the sample mounting groove that awaits measuring in the first anchor clamps, be equipped with the sample backup pad that awaits measuring on the first anchor clamps of sample mounting groove bottom that awaits measuring, first anchor clamps upper end is equipped with adjusting screw, be equipped with calibration sample mounting hole in the second anchor clamps, be equipped with calibration sample supporting surface in the calibration sample mounting hole, first anchor clamps and second anchor clamps and anchor clamps base fixed connection time sample backup pad up end awaits measuring with calibration sample supporting surface are in the coplanar.
As a further proposal of the invention, the clamp base is fixedly connected with an X-Y moving platform positioned in front of the measuring head
As a further scheme of the invention, a first clamp mounting groove is formed in the clamp base, a plurality of fixing blocks are arranged on the first clamp, and the first clamp is detachably connected in the first clamp mounting groove on the clamp base through the plurality of fixing blocks.
As a further scheme of the invention, a plurality of second clamp mounting grooves are formed in the clamp base, and the second clamps are detachably connected in the second clamp mounting grooves.
As a further scheme of the invention, the front end of the clamp base is provided with a plurality of clamp base handles.
As a further proposal of the invention, the adjusting screw is provided with a plurality of adjusting screws which are arranged on one side of the first clamp.
As a further proposal of the invention, the second clamp is provided with a plurality of calibration sample mounting holes, and the cross-sectional shapes of the calibration sample mounting holes on each second clamp are different from each other.
Compared with the prior art, the invention has the beneficial effects that the clamp for the sample to be detected and the clamp for the calibration sample are respectively fixed on the clamp bottom plate without interference, the calibration sample can be fixed on the clamp, the function of calibrating at any time is realized, the simple calibration is realized under the condition that the sizes of the calibration sample and the detection sample are different, and compared with the case that the clamp is shared by the calibration sample and the detection sample, the clamp has simple structure and low cost.
Drawings
Fig. 1 is a front view of a fixture base of the present invention.
Fig. 2 is a front view of a first clamp of the present invention.
Fig. 3 is a front view of a second clamp of the present invention.
Fig. 4 is a diagram showing the construction of the working state of the present invention.
In the figure, a 1-clamp base, a 101-first clamp mounting groove, a 102-second clamp mounting groove, a 103-clamp base handle 2-first clamp, a 201-sample to be tested supporting plate, a 202-adjusting screw, a 203-fixing block, a 204-sample to be tested mounting groove, a 3-second clamp, a 301-calibration sample mounting hole, a 302-calibration sample supporting surface, a 4-measuring head, a 5-sample to be tested and a 6-calibration sample are arranged.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Referring to fig. 1-4, in an embodiment of the present invention, a calibration tool for measuring absorption rate of an optical element includes a fixture base 1, a first fixture 2 and a second fixture 3 are movably and detachably connected to the fixture base 1, a first fixture mounting groove 101 is provided on the fixture base 1, a plurality of fixing blocks 203 are provided on the first fixture 2, the first fixture 2 is detachably connected to the first fixture mounting groove 101 on the fixture base 1 through the plurality of fixing blocks 203, a plurality of second fixture mounting grooves 102 are provided in the fixture base 1, the second fixture mounting grooves 102 are distributed around the first fixture mounting grooves, the second fixture 3 is detachably connected to the second fixture mounting grooves 102, a sample mounting groove 204 to be measured is provided in the first fixture 2, a sample supporting plate 201 to be measured is provided on the first fixture 2 at the bottom of the sample mounting groove 204, an adjusting screw 202 is provided at the upper end of the first fixture 2, a plurality of fixture bases 103 are provided for detachably taking and placing the fixture base 1 through the adjusting screw 202, a calibration sample mounting hole 301 is provided in the second fixture 3, a calibration sample mounting hole 301 is provided in the same plane as the calibration sample mounting hole 301 in the first fixture base 1, and the calibration sample mounting hole 301 is located in a plane surface of the calibration sample mounting plane of the first fixture 1, and the calibration sample can be measured in the same plane as the calibration plane of the sample mounting hole 301 is located in the calibration plane of the sample mounting 1.
When the invention is used, a sample 5 to be measured is placed into the sample mounting groove 204, and the sample to be measured is supported by the sample supporting plate 201 to be measured, then the sample 5 to be measured is fixed in the sample mounting groove 204 by the adjusting screw 202, meanwhile, the calibration sample 6 is mounted and fixed in the calibration sample mounting hole 301, the first clamp 2 and the second clamp 3 are mounted on the clamp base 1, the clamp base 1 is mounted on the X-Y moving platform arranged in front of the measuring head 4, the measuring head 4 is started, the scanning of the probe 4 on the calibration sample 6 can be completed by the two-dimensional movement of the moving platform, the calibration is further carried out, the sample 5 to be measured can be used as a reference value for detection, the conversion from calibration to measurement can be completed without adjusting the clamp or replacing the clamp in the conversion process of calibration and measurement, and the conversion from calibration to measurement can be completed simultaneously, the top sample 6 and the sample 5 to be measured with different sizes can be calibrated and measured respectively.
It will be evident to those skilled in the art that the invention is not limited to the details of the foregoing illustrative embodiments, and that the present invention may be embodied in other specific forms without departing from the spirit or essential characteristics thereof. The present embodiments are, therefore, to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Furthermore, it should be understood that although the present disclosure describes embodiments, not every embodiment is provided with a separate embodiment, and that this description is provided for clarity only, and that the disclosure is not limited to the embodiments described in detail below, and that the embodiments described in the examples may be combined as appropriate to form other embodiments that will be apparent to those skilled in the art.
Claims (7)
1. The utility model provides a mark frock for optical element absorptivity measurement, includes anchor clamps base (1), its characterized in that, activity on anchor clamps base (1) can be dismantled and is connected with first anchor clamps (2) and second anchor clamps (3), be equipped with sample mounting groove (204) that await measuring in first anchor clamps (2), be equipped with sample backup pad (201) that await measuring on first anchor clamps (2) of sample mounting groove (204) bottom that await measuring, first anchor clamps (2) upper end is equipped with adjusting screw (202), be equipped with calibration sample mounting hole (301) in second anchor clamps (3), be equipped with calibration sample supporting surface (302) in calibration sample mounting hole (301), first anchor clamps (2) and second anchor clamps (3) are in with during anchor clamps base (1) fixed connection sample backup pad (201) up end with calibration sample supporting surface (302) are in the coplanar.
2. Calibration fixture for optical element absorption rate measurement according to claim 1, characterized in that the fixture base (1) is fixedly connected to an X-Y moving platform located in front of the probe (4).
3. The calibration fixture for measuring the absorptivity of the optical element according to claim 1, wherein a first fixture mounting groove (101) is formed in the fixture base (1), a plurality of fixing blocks (203) are arranged on the first fixture (2), and the first fixture (2) is detachably connected in the first fixture mounting groove (101) on the fixture base (1) through the plurality of fixing blocks (203).
4. Calibration fixture for optical element absorption rate measurement according to claim 1, characterized in that the fixture base (1) is provided with a plurality of second fixture mounting grooves (102), and the second fixture (3) is detachably connected in the second fixture mounting grooves (102).
5. Calibration fixture for optical element absorption rate measurement according to claim 1, characterized in that the fixture base (1) front end is provided with a plurality of fixture base handles (103).
6. Calibration fixture for optical element absorption measurement according to claim 1, characterized in that the adjusting screw (202) is provided in plurality and is arranged on one side of the first clamp (2).
7. Calibration fixture for optical element absorption rate measurement according to claim 1, characterized in that the second fixture (3) is provided with a plurality of calibration sample mounting holes (301) on each second fixture (3) with different cross-sectional shapes.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711451489.4A CN107966408B (en) | 2017-12-27 | 2017-12-27 | A calibration tool for measuring the absorption rate of optical components |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711451489.4A CN107966408B (en) | 2017-12-27 | 2017-12-27 | A calibration tool for measuring the absorption rate of optical components |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107966408A CN107966408A (en) | 2018-04-27 |
| CN107966408B true CN107966408B (en) | 2024-12-27 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201711451489.4A Active CN107966408B (en) | 2017-12-27 | 2017-12-27 | A calibration tool for measuring the absorption rate of optical components |
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| Country | Link |
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| CN (1) | CN107966408B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108705472B (en) * | 2018-07-12 | 2023-10-13 | 合肥知常光电科技有限公司 | Component clamping tool and clamping method thereof |
Citations (4)
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| JPH07294400A (en) * | 1994-04-28 | 1995-11-10 | Rigaku Corp | Sample retention device for x-ray diffraction device |
| CN103278455A (en) * | 2013-05-16 | 2013-09-04 | 宁波大学 | Measurement device and measurement method of optical parameters of dielectric film |
| CN105547156A (en) * | 2016-02-29 | 2016-05-04 | 苏州精创光学仪器有限公司 | Rapid quadratic element optical measurement device |
| CN207689350U (en) * | 2017-12-27 | 2018-08-03 | 合肥知常光电科技有限公司 | A kind of calibration tooling for optical element Optical thin film |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH1038856A (en) * | 1996-07-22 | 1998-02-13 | Nikon Corp | Optical absorptance measuring apparatus and measuring method |
| TW200606391A (en) * | 2004-05-10 | 2006-02-16 | Koninkl Philips Electronics Nv | Device and method for optical precision measurement |
| KR101417349B1 (en) * | 2012-09-25 | 2014-07-08 | 현대자동차주식회사 | Non-destructive measurement apparatus for composite |
| KR101595814B1 (en) * | 2014-01-09 | 2016-02-19 | 세이프텍(주) | Automatic device for inspection of heat treatment state |
| CN105223149A (en) * | 2015-11-13 | 2016-01-06 | 苏州谱道光电科技有限公司 | Measuring system and optical element thereof |
| CN205209991U (en) * | 2015-11-18 | 2016-05-04 | 同方威视技术股份有限公司 | Mark device and installation device for material is distinguishd |
| CN106152951A (en) * | 2016-07-05 | 2016-11-23 | 中国工程物理研究院激光聚变研究中心 | A kind of two-sided interference device measuring non-transparent film thickness distribution and method |
| CN206399633U (en) * | 2017-01-18 | 2017-08-11 | 福州荣德光电科技有限公司 | A kind of optics optical angle test device |
| CN106979842A (en) * | 2017-05-01 | 2017-07-25 | 沈阳建筑大学 | Quick rotation inertia quality somascope |
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2017
- 2017-12-27 CN CN201711451489.4A patent/CN107966408B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07294400A (en) * | 1994-04-28 | 1995-11-10 | Rigaku Corp | Sample retention device for x-ray diffraction device |
| CN103278455A (en) * | 2013-05-16 | 2013-09-04 | 宁波大学 | Measurement device and measurement method of optical parameters of dielectric film |
| CN105547156A (en) * | 2016-02-29 | 2016-05-04 | 苏州精创光学仪器有限公司 | Rapid quadratic element optical measurement device |
| CN207689350U (en) * | 2017-12-27 | 2018-08-03 | 合肥知常光电科技有限公司 | A kind of calibration tooling for optical element Optical thin film |
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| CN107966408A (en) | 2018-04-27 |
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