CN107923736B - 三维测量装置 - Google Patents

三维测量装置 Download PDF

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Publication number
CN107923736B
CN107923736B CN201680046181.9A CN201680046181A CN107923736B CN 107923736 B CN107923736 B CN 107923736B CN 201680046181 A CN201680046181 A CN 201680046181A CN 107923736 B CN107923736 B CN 107923736B
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China
Prior art keywords
light
image data
light intensity
grating
intensity distribution
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CN201680046181.9A
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English (en)
Chinese (zh)
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CN107923736A (zh
Inventor
梅村信行
大山刚
坂井田宪彦
奥田学
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CKD Corp
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CKD Corp
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Publication of CN107923736A publication Critical patent/CN107923736A/zh
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518Projection by scanning of the object
    • G01B11/2527Projection by scanning of the object with phase change by in-plane movement of the patern

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  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
CN201680046181.9A 2015-11-27 2016-07-08 三维测量装置 Active CN107923736B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2015-231661 2015-11-27
JP2015231661A JP6062523B1 (ja) 2015-11-27 2015-11-27 三次元計測装置
PCT/JP2016/070238 WO2017090268A1 (ja) 2015-11-27 2016-07-08 三次元計測装置

Publications (2)

Publication Number Publication Date
CN107923736A CN107923736A (zh) 2018-04-17
CN107923736B true CN107923736B (zh) 2020-01-24

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Family Applications (1)

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CN201680046181.9A Active CN107923736B (zh) 2015-11-27 2016-07-08 三维测量装置

Country Status (6)

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JP (1) JP6062523B1 (es)
CN (1) CN107923736B (es)
DE (1) DE112016005425T5 (es)
MX (1) MX366402B (es)
TW (1) TWI610061B (es)
WO (1) WO2017090268A1 (es)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7371443B2 (ja) * 2019-10-28 2023-10-31 株式会社デンソーウェーブ 三次元計測装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007113958A (ja) * 2005-10-18 2007-05-10 Yamatake Corp 3次元計測装置、3次元計測方法、及び3次元計測プログラム
JP2013167464A (ja) * 2012-02-14 2013-08-29 Ckd Corp 三次元計測装置
JP2015087244A (ja) * 2013-10-30 2015-05-07 キヤノン株式会社 画像処理装置、画像処理方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4701948B2 (ja) * 2005-09-21 2011-06-15 オムロン株式会社 パタン光照射装置、3次元形状計測装置、及びパタン光照射方法
CN100561258C (zh) * 2008-02-01 2009-11-18 黑龙江科技学院 一种三维测量系统中相移光栅
DE202010018585U1 (de) * 2009-05-27 2017-11-28 Koh Young Technology Inc. Vorrichtung zur Messung einer dreidimensionalen Form
JP2013124938A (ja) * 2011-12-15 2013-06-24 Ckd Corp 三次元計測装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007113958A (ja) * 2005-10-18 2007-05-10 Yamatake Corp 3次元計測装置、3次元計測方法、及び3次元計測プログラム
JP2013167464A (ja) * 2012-02-14 2013-08-29 Ckd Corp 三次元計測装置
JP2015087244A (ja) * 2013-10-30 2015-05-07 キヤノン株式会社 画像処理装置、画像処理方法

Also Published As

Publication number Publication date
JP2017096866A (ja) 2017-06-01
WO2017090268A1 (ja) 2017-06-01
MX2018001490A (es) 2018-08-01
MX366402B (es) 2019-07-08
CN107923736A (zh) 2018-04-17
DE112016005425T5 (de) 2018-08-16
TW201719112A (zh) 2017-06-01
TWI610061B (zh) 2018-01-01
JP6062523B1 (ja) 2017-01-18

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