CN107907499A - 多频太赫兹检测装置、系统及其方法 - Google Patents
多频太赫兹检测装置、系统及其方法 Download PDFInfo
- Publication number
- CN107907499A CN107907499A CN201711458638.XA CN201711458638A CN107907499A CN 107907499 A CN107907499 A CN 107907499A CN 201711458638 A CN201711458638 A CN 201711458638A CN 107907499 A CN107907499 A CN 107907499A
- Authority
- CN
- China
- Prior art keywords
- thz wave
- multifrequency
- terahertz
- tested article
- detection device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 title claims abstract description 88
- 238000000034 method Methods 0.000 title abstract description 13
- 238000003384 imaging method Methods 0.000 claims abstract description 60
- 230000005540 biological transmission Effects 0.000 claims abstract description 51
- 230000003287 optical effect Effects 0.000 claims abstract description 5
- 238000000862 absorption spectrum Methods 0.000 claims description 24
- 239000000463 material Substances 0.000 claims description 20
- 238000004611 spectroscopical analysis Methods 0.000 claims description 17
- 239000000203 mixture Substances 0.000 claims description 16
- 230000011514 reflex Effects 0.000 claims description 13
- 238000012360 testing method Methods 0.000 claims description 12
- 238000010304 firing Methods 0.000 claims description 6
- 230000001105 regulatory effect Effects 0.000 claims 1
- 238000009659 non-destructive testing Methods 0.000 abstract description 6
- 238000012545 processing Methods 0.000 abstract description 5
- 239000004020 conductor Substances 0.000 description 7
- 238000010521 absorption reaction Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- 238000002347 injection Methods 0.000 description 4
- 239000007924 injection Substances 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 238000007689 inspection Methods 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000012937 correction Methods 0.000 description 2
- 238000000921 elemental analysis Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- 229910000980 Aluminium gallium arsenide Inorganic materials 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 210000001367 artery Anatomy 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 229910021418 black silicon Inorganic materials 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000005022 packaging material Substances 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 238000004080 punching Methods 0.000 description 1
- 230000035484 reaction time Effects 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 238000005057 refrigeration Methods 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 230000007723 transport mechanism Effects 0.000 description 1
- 210000003462 vein Anatomy 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
- G01N21/3586—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation by Terahertz time domain spectroscopy [THz-TDS]
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Toxicology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
Claims (10)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201711458638.XA CN107907499B (zh) | 2017-12-28 | 2017-12-28 | 多频太赫兹检测装置、系统及其方法 |
PCT/CN2018/080622 WO2019127949A1 (zh) | 2017-12-28 | 2018-03-27 | 多频太赫兹检测装置、系统及其方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201711458638.XA CN107907499B (zh) | 2017-12-28 | 2017-12-28 | 多频太赫兹检测装置、系统及其方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN107907499A true CN107907499A (zh) | 2018-04-13 |
CN107907499B CN107907499B (zh) | 2020-09-04 |
Family
ID=61871708
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201711458638.XA Active CN107907499B (zh) | 2017-12-28 | 2017-12-28 | 多频太赫兹检测装置、系统及其方法 |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN107907499B (zh) |
WO (1) | WO2019127949A1 (zh) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109241937A (zh) * | 2018-09-26 | 2019-01-18 | 武汉夏宇信息技术有限公司 | 基于太赫兹波的识别方法、装置及存储介质 |
CN109613619A (zh) * | 2018-12-21 | 2019-04-12 | 济南爱我本克网络科技有限公司 | 单臂式毫米波成像系统转动机构的驱动装置和方法 |
CN110426351A (zh) * | 2019-08-28 | 2019-11-08 | 广东成丰环保工程有限公司 | 一种基于太赫兹的材料识别装置和垃圾分选系统 |
CN110764158A (zh) * | 2018-07-27 | 2020-02-07 | 中国科学院电子学研究所 | 基于反射型频控波束扫描器件的太赫兹成像系统 |
CN112068157A (zh) * | 2020-07-30 | 2020-12-11 | 国家卫星气象中心(国家空间天气监测预警中心) | 静止轨道多频太赫兹探测仪对地观测模式实现方法及装置 |
CN115047635A (zh) * | 2022-05-19 | 2022-09-13 | 北京理工大学 | 一种多频段太赫兹调频连续波透射与反射成像系统 |
US11513004B2 (en) | 2019-08-08 | 2022-11-29 | Apple Inc. | Terahertz spectroscopy and imaging in dynamic environments |
US11555792B2 (en) | 2019-08-08 | 2023-01-17 | Apple Inc. | Terahertz spectroscopy and imaging in dynamic environments with performance enhancements using ambient sensors |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111399073A (zh) * | 2020-03-26 | 2020-07-10 | 浙江大华技术股份有限公司 | 一种智能安检方法、智能安检机及计算机可读存储介质 |
JP2023527115A (ja) * | 2020-04-30 | 2023-06-27 | プロメガ・コーポレーション | キャピラリ電気泳動のためのレーザ照明技法 |
CN111781650B (zh) * | 2020-05-29 | 2023-03-21 | 欧必翼太赫兹科技(北京)有限公司 | 太赫兹安检成像装置 |
CN111982854B (zh) * | 2020-08-27 | 2023-06-27 | 中电科思仪科技股份有限公司 | 基于频分复用的物质太赫兹波谱分析装置及分析测试方法 |
CN113406039A (zh) * | 2021-06-09 | 2021-09-17 | 烟台光基物联网科技有限公司 | 一种太赫兹主动式风力叶片泡沫芯材无损检测方法及装置 |
CN114324345B (zh) * | 2021-11-01 | 2024-01-12 | 清华大学深圳国际研究生院 | 一种材料成像方法、装置、终端设备及存储介质 |
CN114216853B (zh) * | 2021-12-13 | 2023-12-29 | 清华大学 | 基于太赫兹漏波天线的实时探测系统以及方法 |
CN114460032B (zh) * | 2022-01-21 | 2023-10-27 | 华太极光光电技术有限公司 | 一种使用太赫兹光谱与成像检测流水线上物体的系统 |
CN115561201B (zh) * | 2022-10-10 | 2023-07-07 | 安徽工程大学 | 一种热障涂层结构完整性太赫兹评价装置及其使用方法 |
CN116106254B (zh) * | 2023-04-07 | 2023-06-23 | 北京理工大学 | 太赫兹三维层析成像系统及方法 |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101059439A (zh) * | 2006-04-19 | 2007-10-24 | 中国科学院半导体研究所 | 显微拉曼谱仪与近红外光谱仪的联合测试系统 |
CN101194828A (zh) * | 2007-12-24 | 2008-06-11 | 清华大学深圳研究生院 | 物质浓度的无损光学检测方法及其装置 |
CN101526464A (zh) * | 2008-03-05 | 2009-09-09 | 清华大学 | 相衬成像方法及设备 |
CN101526477A (zh) * | 2009-04-21 | 2009-09-09 | 北京理工大学 | 激光差动共焦图谱显微层析成像装置 |
CN102759753A (zh) * | 2011-04-29 | 2012-10-31 | 同方威视技术股份有限公司 | 隐藏危险品检测方法及设备 |
US20140070103A1 (en) * | 2012-09-12 | 2014-03-13 | Stmicroelectronics Sa | Terahertz Imager |
CN106290228A (zh) * | 2016-08-09 | 2017-01-04 | 上海拓领光电科技有限公司 | 一种配件组合式太赫兹时域光谱系统 |
CN106441580A (zh) * | 2016-06-16 | 2017-02-22 | 电子科技大学 | 可变角度入射同时测透射和反射的太赫兹时域光谱仪 |
CN106908407A (zh) * | 2017-02-22 | 2017-06-30 | 天津大学 | 一种摆动反射扫描式多组分物质非色散红外检测装置 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5035618B2 (ja) * | 2006-12-05 | 2012-09-26 | 独立行政法人理化学研究所 | 電磁波を用いた検出方法、及び検出装置 |
US20140098360A1 (en) * | 2012-10-04 | 2014-04-10 | Kisan Electronics Co., Ltd. | Method of discriminating banknote using terahertz electromagnetic waves |
CN105445538A (zh) * | 2015-12-31 | 2016-03-30 | 北京无线电计量测试研究所 | 一种用于太赫兹频段的新型量热式功率计 |
CN106769997A (zh) * | 2016-11-14 | 2017-05-31 | 中国电子科技集团公司第四十研究所 | 一种太赫兹扫描成像装置 |
-
2017
- 2017-12-28 CN CN201711458638.XA patent/CN107907499B/zh active Active
-
2018
- 2018-03-27 WO PCT/CN2018/080622 patent/WO2019127949A1/zh active Application Filing
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101059439A (zh) * | 2006-04-19 | 2007-10-24 | 中国科学院半导体研究所 | 显微拉曼谱仪与近红外光谱仪的联合测试系统 |
CN101194828A (zh) * | 2007-12-24 | 2008-06-11 | 清华大学深圳研究生院 | 物质浓度的无损光学检测方法及其装置 |
CN101526464A (zh) * | 2008-03-05 | 2009-09-09 | 清华大学 | 相衬成像方法及设备 |
CN101526477A (zh) * | 2009-04-21 | 2009-09-09 | 北京理工大学 | 激光差动共焦图谱显微层析成像装置 |
CN102759753A (zh) * | 2011-04-29 | 2012-10-31 | 同方威视技术股份有限公司 | 隐藏危险品检测方法及设备 |
US20140070103A1 (en) * | 2012-09-12 | 2014-03-13 | Stmicroelectronics Sa | Terahertz Imager |
CN106441580A (zh) * | 2016-06-16 | 2017-02-22 | 电子科技大学 | 可变角度入射同时测透射和反射的太赫兹时域光谱仪 |
CN106290228A (zh) * | 2016-08-09 | 2017-01-04 | 上海拓领光电科技有限公司 | 一种配件组合式太赫兹时域光谱系统 |
CN106908407A (zh) * | 2017-02-22 | 2017-06-30 | 天津大学 | 一种摆动反射扫描式多组分物质非色散红外检测装置 |
Non-Patent Citations (1)
Title |
---|
(加)达里宇舒•萨义德齐亚(DARYOOSH SAEEDKIA): "《太赫兹成像 传感及通信技术手册》", 30 May 2016, 国防工业出版社 * |
Cited By (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110764158B (zh) * | 2018-07-27 | 2022-11-22 | 中国科学院电子学研究所 | 基于反射型频控波束扫描器件的太赫兹成像系统 |
CN110764158A (zh) * | 2018-07-27 | 2020-02-07 | 中国科学院电子学研究所 | 基于反射型频控波束扫描器件的太赫兹成像系统 |
CN109241937A (zh) * | 2018-09-26 | 2019-01-18 | 武汉夏宇信息技术有限公司 | 基于太赫兹波的识别方法、装置及存储介质 |
CN109241937B (zh) * | 2018-09-26 | 2020-01-07 | 武汉夏宇信息技术有限公司 | 基于太赫兹波的识别方法、装置及存储介质 |
CN109613619A (zh) * | 2018-12-21 | 2019-04-12 | 济南爱我本克网络科技有限公司 | 单臂式毫米波成像系统转动机构的驱动装置和方法 |
CN109613619B (zh) * | 2018-12-21 | 2020-11-17 | 济南爱我本克网络科技有限公司 | 单臂式毫米波成像系统转动机构的驱动装置和方法 |
US11513004B2 (en) | 2019-08-08 | 2022-11-29 | Apple Inc. | Terahertz spectroscopy and imaging in dynamic environments |
US11555792B2 (en) | 2019-08-08 | 2023-01-17 | Apple Inc. | Terahertz spectroscopy and imaging in dynamic environments with performance enhancements using ambient sensors |
CN110426351A (zh) * | 2019-08-28 | 2019-11-08 | 广东成丰环保工程有限公司 | 一种基于太赫兹的材料识别装置和垃圾分选系统 |
CN110426351B (zh) * | 2019-08-28 | 2024-04-30 | 广东成丰环保工程有限公司 | 一种基于太赫兹的材料识别装置和垃圾分选系统 |
CN112068157A (zh) * | 2020-07-30 | 2020-12-11 | 国家卫星气象中心(国家空间天气监测预警中心) | 静止轨道多频太赫兹探测仪对地观测模式实现方法及装置 |
CN112068157B (zh) * | 2020-07-30 | 2024-04-12 | 国家卫星气象中心(国家空间天气监测预警中心) | 静止轨道多频太赫兹探测仪对地观测模式实现方法及装置 |
CN115047635A (zh) * | 2022-05-19 | 2022-09-13 | 北京理工大学 | 一种多频段太赫兹调频连续波透射与反射成像系统 |
Also Published As
Publication number | Publication date |
---|---|
CN107907499B (zh) | 2020-09-04 |
WO2019127949A1 (zh) | 2019-07-04 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN107907499A (zh) | 多频太赫兹检测装置、系统及其方法 | |
KR101332068B1 (ko) | 반사 및 전송 모드에서의 수화물 및 승객 검사용테라헤르쯔 영상 | |
CN103207161B (zh) | 具有激光反馈优化的基于激光的腔增强光学吸收气体分析仪 | |
US7378658B2 (en) | Security portal with THz trans-receiver | |
US6754518B1 (en) | Method and apparatus for detecting an object within a dynamic scattering media | |
EP0060280A1 (en) | AERIAL SURVEY OF OCEANIC BOTTOMS USING A LASER RADIUS. | |
CN105738972A (zh) | 一种水下探测系统及水下探测方法 | |
WO2013053168A1 (zh) | 基于太赫兹量子器件的透射成像装置及成像方法 | |
CN207798672U (zh) | 多频太赫兹检测装置和系统 | |
CN112698348A (zh) | 一种单光子三维扫描成像系统 | |
CN104568818B (zh) | 一种基于光纤传导的主动式太赫兹光谱检测内窥探头 | |
CN206339653U (zh) | 复合式毫米波成像系统 | |
US3829694A (en) | An apparatus for detecting gases or corpuscles by light absorption and scattering | |
US4986655A (en) | Apparatus for measuring diffuse attenuation coefficient of sea water | |
CN205787179U (zh) | 一种水下探测系统 | |
CN206945533U (zh) | 小型化太赫兹时域光谱仪 | |
CN106153571A (zh) | 太赫兹泵浦‑太赫兹探测时域光谱系统 | |
KR20130001969A (ko) | 테라헤르츠파를 이용한 샘플의 분석 방법 및 장치 | |
CN117008139A (zh) | 激光雷达的检测方法及其检测系统、激光雷达 | |
Tulldahl et al. | Lidar for shallow underwater target detection | |
Cadalli et al. | Three-dimensional tomographic imaging of ocean mines from real and simulated lidar returns | |
Shi et al. | Polarization-dependent characteristics of a photon-counting laser ranging system | |
CN114503007B (zh) | 激光扫描装置和激光扫描系统 | |
Estes et al. | Laser beam propagation through the ocean's surface | |
Caimi et al. | Real-time 3D underwater imaging and mapping using a laser line scan technique |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20201020 Address after: Room 430, building 37, chentian Industrial Zone, Baotian 1st Road, Xixiang street, Bao'an District, Shenzhen City, Guangdong Province Patentee after: Shenzhen Zhongtou Huaxun Terahertz Technology Co.,Ltd. Patentee after: SHENZHEN INSTITUTE OF TERAHERTZ TECHNOLOGY AND INNOVATION Co.,Ltd. Address before: 518101 404, building 37, chentian Industrial Zone, chentian community, Xixiang street, Bao'an District, Shenzhen City, Guangdong Province Patentee before: Shenzhen Huaxun ark Photoelectric Technology Co.,Ltd. Patentee before: SHENZHEN INSTITUTE OF TERAHERTZ TECHNOLOGY AND INNOVATION Co.,Ltd. Effective date of registration: 20201020 Address after: 518101 404, building 37, chentian Industrial Zone, chentian community, Xixiang street, Bao'an District, Shenzhen City, Guangdong Province Patentee after: Shenzhen Huaxun ark Photoelectric Technology Co.,Ltd. Patentee after: SHENZHEN INSTITUTE OF TERAHERTZ TECHNOLOGY AND INNOVATION Co.,Ltd. Address before: 518102 Guangdong Province, Baoan District Xixiang street Shenzhen City Tian Yi Lu Chen Tian Bao Industrial District 37 building two floor East Patentee before: SHENZHEN THZ SCIENCE AND TECHNOLOGY INNOVATION INSTITUTE Patentee before: SHENZHEN INSTITUTE OF TERAHERTZ TECHNOLOGY AND INNOVATION Co.,Ltd. |
|
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20210929 Address after: 518000 Shenzhen, Baoan District, Xixiang, Guangdong Xixiang street, thirty-seventh fields, 430 estate. Patentee after: Shenzhen Zhongtou Huaxun Terahertz Technology Co.,Ltd. Address before: 518101 room 430, building 37, chentian Industrial Zone, Baotian 1st Road, Xixiang street, Bao'an District, Shenzhen City, Guangdong Province Patentee before: Shenzhen Zhongtou Huaxun Terahertz Technology Co.,Ltd. Patentee before: SHENZHEN INSTITUTE OF TERAHERTZ TECHNOLOGY AND INNOVATION Co.,Ltd. |