CN107894315A - A kind of four-axle type exciting bank that shock loading can be loaded to MEMS micro-structurals - Google Patents
A kind of four-axle type exciting bank that shock loading can be loaded to MEMS micro-structurals Download PDFInfo
- Publication number
- CN107894315A CN107894315A CN201711355476.7A CN201711355476A CN107894315A CN 107894315 A CN107894315 A CN 107894315A CN 201711355476 A CN201711355476 A CN 201711355476A CN 107894315 A CN107894315 A CN 107894315A
- Authority
- CN
- China
- Prior art keywords
- piezoelectric ceramics
- sleeve
- loaded
- structurals
- mems micro
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M7/00—Vibration-testing of structures; Shock-testing of structures
- G01M7/08—Shock-testing
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Electrical Machinery Utilizing Piezoelectricity, Electrostriction Or Magnetostriction (AREA)
Abstract
本发明公开了一种可对MEMS微结构加载冲击载荷的四轴式激励装置,包括套筒,叠堆压电陶瓷,压力传感器,上、下联接块和MEMS微结构;在套筒内设有支撑板及连接下联接块的电动丝杠传动机构;在上、下联接块上分别设有相互配合的球面凸起和球面凹槽;叠堆压电陶瓷夹持在压力传感器与弹性支撑件之间;在上联接块上均布连接有球头柱塞,球头柱塞外端顶入套筒内壁的矩形凹槽内。该装置能够灵活对叠堆压电陶瓷施加不同大小的预紧力,同时使所获得的预紧力测量值更加准确,可使补偿叠堆压电陶瓷两工作表面平行度误差的调节过程变得更加顺畅和平滑,大大减小了叠堆压电陶瓷各层之间的剪切力,能够避免测试用微器件的脱落,便于测试MEMS微结构的动态特性参数。
The invention discloses a four-axis excitation device capable of applying impact loads to MEMS microstructures, comprising a sleeve, stacked piezoelectric ceramics, pressure sensors, upper and lower coupling blocks and MEMS microstructures; The supporting plate and the electric screw drive mechanism connected to the lower connecting block; the upper and lower connecting blocks are respectively provided with mutually matching spherical protrusions and spherical grooves; stacked piezoelectric ceramics are clamped between the pressure sensor and the elastic support The upper connection block is evenly connected with ball plungers, and the outer ends of the ball plungers push into the rectangular grooves on the inner wall of the sleeve. The device can flexibly apply different sizes of pre-tightening force to the stacked piezoelectric ceramics, and at the same time make the measured value of the pre-tightening force more accurate, and can make the adjustment process of compensating the parallelism error of the two working surfaces of the stacked piezoelectric ceramics easy. It is smoother and smoother, greatly reduces the shear force between the layers of the stacked piezoelectric ceramics, can avoid the falling off of the micro-device used for testing, and is convenient for testing the dynamic characteristic parameters of the MEMS microstructure.
Description
技术领域technical field
本发明属于微型机械电子系统技术领域,特别涉及一种可对MEMS微结构加载冲击载荷的四轴式激励装置。The invention belongs to the technical field of micromechanical electronic systems, in particular to a four-axis excitation device capable of loading impact loads on MEMS microstructures.
背景技术Background technique
由于MEMS微器件具有成本低、体积小和重量轻等优点,使其在汽车、航空航天、信息通讯、生物化学、医疗、自动控制和国防等诸多领域都有着广泛的应用前景。对于很多MEMS器件来说,其内部微结构的微小位移和微小变形是器件功能实现的基础,因此对这些微结构的振幅、固有频率、阻尼比等动态特性参数进行精确测试已经成为开发MEMS产品的重要内容。Due to the advantages of low cost, small size and light weight, MEMS microdevices have broad application prospects in many fields such as automobile, aerospace, information communication, biochemistry, medical treatment, automatic control and national defense. For many MEMS devices, the micro-displacement and micro-deformation of their internal microstructures are the basis for the realization of device functions. Therefore, accurate testing of dynamic characteristic parameters such as the amplitude, natural frequency, and damping ratio of these microstructures has become the key to developing MEMS products. important content.
为了测试微结构的动态特性参数,首先需要使微结构产生振动,也就是需要对微结构进行激励。由于MEMS微结构具有尺寸小、重量轻和固有频率高等特点,传统机械模态测试中的激励方法和激励装置无法被应用在MEMS微结构的振动激励当中。近三十年来,国内外的研究人员针对MEMS微结构的振动激励方法进行了大量的探索,研究出了一些可用于MEMS微结构的激励方法以及相应的激励装置。其中,以叠堆压电陶瓷作为激励源的底座激励装置具备激励带宽较大,装置简单、易操作,以及适用性强等优点,因此在MEMS微结构动态特性测试领域得到了广泛的应用。David等在《A base excitation test facility fordynamic testing of microsystems》一文中介绍了一种基于压电陶瓷的底座激励装置,在该装置中叠堆压电陶瓷被直接粘接在一个固定的底座上,由于叠堆压电陶瓷是一种多层粘接结构,所以叠堆压电陶瓷能够承受较大的压力,但不能承受拉力,拉力会导致叠堆压电陶瓷的损坏,当叠堆压电陶瓷在使用时,对其施压一定的预紧力有利于延长叠堆压电陶瓷的使用寿命,而该装置并未考虑上述问题;Wang等在《Dynamic characteristic testing forMEMS micro-devices with base excitation》一文中介绍了一种基于压电陶瓷的底座激励装置,在该装置中考虑到了对叠堆压电陶瓷施加一定预紧力的问题,使用了压板、底座和调节螺钉组成的机构来压紧叠堆压电陶瓷,并可通过旋拧调节螺钉来改变预紧力的大小,但该装置并未考虑到在使用上述机构对叠堆压电陶瓷施加预紧力时,由于叠堆压电陶瓷两工作表面的平行度误差,在叠堆压电陶瓷的层与层之间会产生剪切力,该剪切力会对叠堆压电陶瓷产生机械损伤,此外,该装置无法测量所施加预紧力的大小,如果调节不当,则也会对叠堆压电陶瓷造成机械损伤。公开号为CN101476970A的中国发明专利公开了一种基于压电陶瓷的底座激励装置,在该装置中通过十字弹簧片对叠堆压电陶瓷施加预紧力,并通过将叠堆压电陶瓷底部安装在一个可动的底座结构上来减小压电陶瓷所受到的剪切力,此外,在装置中还设有压力传感器,用来检测对压电陶瓷所施加的预紧力以及叠堆压电陶瓷在工作时的输出力。但该装置仍存在下列缺点:In order to test the dynamic characteristic parameters of the microstructure, it is first necessary to make the microstructure vibrate, that is, to excite the microstructure. Due to the small size, light weight and high natural frequency of MEMS microstructures, the excitation methods and excitation devices in traditional mechanical mode testing cannot be applied to the vibration excitation of MEMS microstructures. In the past thirty years, researchers at home and abroad have conducted a lot of explorations on the vibration excitation methods of MEMS microstructures, and have developed some excitation methods and corresponding excitation devices that can be used for MEMS microstructures. Among them, the base excitation device using stacked piezoelectric ceramics as the excitation source has the advantages of large excitation bandwidth, simple device, easy operation, and strong applicability, so it has been widely used in the field of MEMS microstructure dynamic characteristic testing. In the article "A base excitation test facility fordynamic testing of microsystems", David et al. introduced a base excitation device based on piezoelectric ceramics. In this device, stacked piezoelectric ceramics are directly bonded on a fixed base. The stacked piezoelectric ceramics is a multi-layer bonding structure, so the stacked piezoelectric ceramics can withstand a large pressure, but it cannot bear the tensile force. The tensile force will cause the damage of the stacked piezoelectric ceramics. When the stacked piezoelectric ceramics are in When in use, applying a certain pre-tightening force is beneficial to prolong the service life of stacked piezoelectric ceramics, but this device does not consider the above problems; Wang et al. in the article "Dynamic characteristic testing forMEMS micro-devices with base excitation" This paper introduces a base excitation device based on piezoelectric ceramics. In this device, the problem of applying a certain pre-tightening force to the stacked piezoelectric ceramics is considered. Electric ceramics, and the size of the pre-tightening force can be changed by turning the adjusting screw, but this device does not take into account that when the above-mentioned mechanism is used to apply the pre-tightening force to the stacked piezoelectric ceramics, due to the two working surfaces of the stacked piezoelectric ceramics The parallelism error will generate a shear force between the layers of the stacked piezoelectric ceramics, which will cause mechanical damage to the stacked piezoelectric ceramics. In addition, the device cannot measure the applied preload. If the size is not adjusted properly, it will also cause mechanical damage to the stacked piezoelectric ceramics. The Chinese invention patent with the publication number CN101476970A discloses a base excitation device based on piezoelectric ceramics. In this device, a cross spring plate is used to apply a preload to the stacked piezoelectric ceramics, and the bottom of the stacked piezoelectric ceramics is installed On a movable base structure to reduce the shear force on the piezoelectric ceramics, in addition, a pressure sensor is also provided in the device to detect the pre-tightening force applied to the piezoelectric ceramics and stack piezoelectric ceramics output force at work. But this device still has following shortcoming:
1、该装置的可动底座结构由上联接块、钢球和下联接块组成,钢球和上联接块、下联接块之间均为线接触,当需要补偿叠堆压电陶瓷顶面和底面两个工作表面的平行度误差而自行调节可动底座结构时,钢球无法平滑的转动,甚至会出现被卡住的状况;1. The movable base structure of the device is composed of an upper connection block, a steel ball and a lower connection block. The steel ball, the upper connection block and the lower connection block are in line contact. When it is necessary to compensate the top surface of the stacked piezoelectric ceramics and the When the movable base structure is adjusted by itself due to the parallelism error of the two working surfaces on the bottom surface, the steel ball cannot rotate smoothly, and may even be stuck;
2、上联接块和下联接块与套筒之间均无直接联接,而是采用间隙配合的方式依次安装到套筒之中,若叠堆压电陶瓷两个工作表面的平行度误差较大,则无足够的空间去调节可动底座结构;2. There is no direct connection between the upper connection block and the lower connection block and the sleeve, but are installed in the sleeve in turn by means of clearance fit. If the parallelism error of the two working surfaces of the stacked piezoelectric ceramics is large , there is not enough space to adjust the movable base structure;
3、压力传感器被安装在下联接块的底部,由于可动底座结构自行调节后,下联接块的底部与压电陶瓷的工作表面之间存在一定的倾角,因此压力传感器所测得的预紧力或压电陶瓷的输出力并不准确;另外,如果可动底座结构在调节后导致上联接块或下联接块与套筒相接触,则测量结果的误差会进一步增大;3. The pressure sensor is installed at the bottom of the lower connecting block. Since the movable base structure is self-adjusted, there is a certain inclination between the bottom of the lower connecting block and the working surface of the piezoelectric ceramic, so the pre-tightening force measured by the pressure sensor Or the output force of piezoelectric ceramics is not accurate; in addition, if the movable base structure causes the upper coupling block or the lower coupling block to contact the sleeve after adjustment, the error of the measurement result will further increase;
4、装置中采用十字弹簧片的一面来压紧叠堆压电陶瓷,在十字弹簧片的另一面上则粘接测试用的微器件,当压电陶瓷工作时,十字弹簧片的变形较大会导致微器件与十字弹簧片之间的胶体开裂,致使微器件脱落;4. In the device, one side of the cross spring is used to compress the stacked piezoelectric ceramics, and the other side of the cross spring is bonded to the micro device for testing. When the piezoelectric ceramics are working, the deformation of the cross spring is relatively large. Cause the colloid between the micro-device and the cross spring to crack, causing the micro-device to fall off;
5、该装置中通过使用不同厚度的垫片来改变施加在叠堆压电陶瓷上预紧力的大小,导致调节过程复杂,不够灵活。5. In this device, gaskets of different thicknesses are used to change the magnitude of the pre-tightening force applied to the stacked piezoelectric ceramics, resulting in a complicated adjustment process and insufficient flexibility.
发明内容Contents of the invention
本发明所要解决的技术问题是要提供一种可对MEMS微结构加载冲击载荷的四轴式激励装置,该装置能够更加灵活的对叠堆压电陶瓷施加不同大小的预紧力,同时使所获得的预紧力测量值更加准确,可使补偿叠堆压电陶瓷两工作表面平行度误差的调节过程变得更加顺畅和平滑,大大减小了叠堆压电陶瓷各层之间的剪切力,能够避免测试用微器件的脱落,便于测试MEMS微结构的动态特性参数。The technical problem to be solved by the present invention is to provide a four-axis excitation device that can apply impact loads to MEMS microstructures. The obtained pre-tightening force measurement value is more accurate, which can make the adjustment process of compensating the parallelism error of the two working surfaces of the stacked piezoelectric ceramics smoother and smoother, and greatly reduces the shear between the layers of the stacked piezoelectric ceramics The force can avoid the falling off of the micro-device used in the test, and it is convenient to test the dynamic characteristic parameters of the MEMS microstructure.
为解决上述问题,本发明采用如下技术方案:In order to solve the above problems, the present invention adopts the following technical solutions:
一种可对MEMS微结构加载冲击载荷的四轴式激励装置,包括套筒,在套筒内设有叠堆压电陶瓷、压力传感器、上联接块和下联接块,在套筒上面设有弹性支撑件和MEMS微结构,其特征是:A four-axis excitation device capable of applying impact loads to MEMS microstructures, including a sleeve, in which a stack of piezoelectric ceramics, a pressure sensor, an upper connection block and a lower connection block are arranged, and on the sleeve is a Elastic support and MEMS microstructure characterized by:
在套筒上面设有环形顶板,所述MEMS微结构通过弹性支撑件安装在环形顶板上;所述弹性支撑件包括一块基板和四个圆周均布的支撑臂,每个支撑臂均由依次相互垂直连接的第一连接臂、第二连接臂、第三连接臂和第四连接臂组成并与基板外缘形成一个L型间隙,用于减小基板的变形量;An annular top plate is arranged on the sleeve, and the MEMS microstructure is installed on the annular top plate through an elastic support; the elastic support includes a base plate and four support arms uniformly distributed around the circumference, and each support arm is connected to each other in sequence. The vertically connected first connecting arm, second connecting arm, third connecting arm and fourth connecting arm form an L-shaped gap with the outer edge of the substrate to reduce the deformation of the substrate;
在套筒内下部设有支撑板,在支撑板中心沿竖直方向安装有电动丝杠传动机构,电动丝杠传动机构的丝母与下联接块连接,用于带动下联接块上下移动;A support plate is provided at the lower part of the sleeve, and an electric screw transmission mechanism is installed in the center of the support plate along the vertical direction. The screw nut of the electric screw transmission mechanism is connected with the lower connection block to drive the lower connection block to move up and down;
在上联接块和下联接块的相对面上分别设有相互配合的球面凸起和球面凹槽,所述球面凸起插入球面凹槽内且球面凸起的曲率半径小于球面凹槽的曲率半径,使上联接块和下联接块之间形成点接触;所述压力传感器镶装在上联接块顶面的中心孔内,叠堆压电陶瓷夹持在压力传感器与弹性支撑件之间;On the opposite surfaces of the upper coupling block and the lower coupling block, there are respectively provided spherical protrusions and spherical grooves which cooperate with each other, the spherical protrusions are inserted into the spherical grooves and the radius of curvature of the spherical protrusions is smaller than that of the spherical grooves , so that a point contact is formed between the upper coupling block and the lower coupling block; the pressure sensor is embedded in the center hole on the top surface of the upper coupling block, and the stacked piezoelectric ceramics are clamped between the pressure sensor and the elastic support;
在上联接块外缘圆周均布连接有球头柱塞,球头柱塞外端的钢珠分别顶入到沿圆周方向均布在套筒内壁的矩形凹槽内,用于辅助上联接块补偿叠堆压电陶瓷两工作表面平行度误差的调节;Ball plungers are evenly distributed on the outer edge of the upper connection block, and the steel balls at the outer ends of the ball plunger are pushed into the rectangular grooves uniformly distributed on the inner wall of the sleeve along the circumferential direction, which are used to assist the upper connection block to compensate for stacking Adjustment of the parallelism error of the two working surfaces of piezoelectric ceramics;
在套筒内沿圆周方向均布设有导向轴,导向轴通过间隙配合穿过设置在下联接块下端的法兰盘上均布的导向孔,用于保证下联接块上下移动时的水平度。Guide shafts are evenly distributed in the sleeve along the circumferential direction, and the guide shafts pass through the uniform guide holes arranged on the flange plate at the lower end of the lower connection block through clearance fit to ensure the levelness of the lower connection block when moving up and down.
作为进一步优选,在上联接块外缘圆周均布连接有调节杆,调节杆分别由沿圆周方向均布在套筒壁上的长孔穿过;用于实现测试后上联接块的复位。As a further preference, adjusting rods are evenly distributed around the outer edge of the upper coupling block, and the adjusting rods are respectively passed through long holes uniformly distributed on the sleeve wall along the circumferential direction; for realizing the reset of the upper coupling block after the test.
作为进一步优选,所述基板为正方形,四个支撑臂分别通过第一连接臂连接在基板四周的一端;以进一步减小基板的变形量,避免MEMS微结构因胶体开裂而发生脱落。As a further preference, the substrate is square, and the four support arms are respectively connected to one end around the substrate through the first connecting arm; to further reduce the deformation of the substrate and prevent the MEMS microstructure from falling off due to colloidal cracking.
作为进一步优选,所述弹性支撑件的四个支撑臂外端分别通过支柱支撑固定在环形顶板上面。As a further preference, the outer ends of the four support arms of the elastic support are respectively supported and fixed on the annular top plate through pillars.
作为进一步优选,所述上联接块外缘为正八边形,且在外缘每个面中部分别设有一个连接螺孔。As a further preference, the outer edge of the upper coupling block is a regular octagon, and a connecting screw hole is respectively provided in the middle of each surface of the outer edge.
作为进一步优选,所述球头柱塞为四个且一端分别通过螺纹连接在上联接块外缘的连接螺孔内。As a further preference, there are four ball plungers, one end of which is respectively threaded into the connecting screw holes on the outer edge of the upper coupling block.
作为进一步优选,所述调节杆为四个且与球头柱塞间隔布置。As a further preference, there are four adjusting rods and they are spaced apart from the ball plunger.
作为进一步优选,在叠堆压电陶瓷上端扣设有安装套,所述弹性支撑件压在安装套上,用于避免由于叠堆压电陶瓷顶部工作表面的粗糙不平所导致的叠堆压电陶瓷和弹性支撑件接触不良的问题。As a further preference, a mounting sleeve is fastened on the upper end of the stacked piezoelectric ceramics, and the elastic support is pressed on the mounting sleeve to avoid the stacked piezoelectric ceramics caused by the roughness of the top working surface of the stacked piezoelectric ceramics. Poor contact between ceramic and elastic supports.
作为进一步优选,所述长孔的中心线与矩形凹槽的中心线均与套筒的轴线平行,且每个长孔的中心线与相邻的矩形凹槽的中心线所夹的圆心角为45度。As a further preference, the centerline of the long hole and the centerline of the rectangular groove are parallel to the axis of the sleeve, and the central angle between the centerline of each long hole and the centerline of the adjacent rectangular groove is 45 degree.
作为进一步优选,所述导向轴为四根,所述长孔的中心线和相邻的导向轴轴线与套筒的轴线所夹的圆心角为22.5度。As a further preference, there are four guide shafts, and the central angle formed by the center line of the long hole and the axis of the adjacent guide shaft and the axis of the sleeve is 22.5 degrees.
本发明的有益效果是:The beneficial effects of the present invention are:
1、由于在上联接块和下联接块的相对面上分别设有相互配合的球面凸起和球面凹槽,所述球面凸起插入球面凹槽内且球面凸起的曲率半径小于球面凹槽的曲率半径,因此上联接块和下联接块之间形成点接触,当需要补偿叠堆压电陶瓷两工作表面的平行度误差来调节由上联接块和下联接块所组成的可动底座时,上联接块会以球面凸起与球面凹槽的接触点为转动中心进行转动,调节过程顺畅、平滑,不会出现被卡住的问题,大大减小了叠堆压电陶瓷各层之间的剪切力。1. Since the opposite surfaces of the upper coupling block and the lower coupling block are respectively provided with mutually matching spherical protrusions and spherical grooves, the spherical protrusions are inserted into the spherical grooves and the radius of curvature of the spherical protrusions is smaller than that of the spherical grooves Therefore, a point contact is formed between the upper connecting block and the lower connecting block. When it is necessary to compensate the parallelism error of the two working surfaces of the stacked piezoelectric ceramics to adjust the movable base composed of the upper connecting block and the lower connecting block , the upper connecting block will rotate with the contact point between the spherical protrusion and the spherical groove as the center of rotation, the adjustment process is smooth and smooth, and there will be no problem of being stuck, which greatly reduces the gap between the layers of stacked piezoelectric ceramics. of shear force.
2、由于在上联接块外缘圆周均布连接有球头柱塞,球头柱塞外端的钢珠分别顶入到沿圆周方向均布在套筒内壁的矩形凹槽内,当需要补偿叠堆压电陶瓷两工作表面的平行度误差来调节可动底座时,可以通过球头柱塞内的弹簧和钢珠的配合来实现上联接块在不同方向上的摆动,可调节的空间更大。2. Since the ball plunger is evenly distributed on the outer edge of the upper connection block, the steel balls at the outer end of the ball plunger are pushed into the rectangular grooves uniformly distributed on the inner wall of the sleeve along the circumferential direction. When it is necessary to compensate for the stacking pressure When the parallelism error of the two working surfaces of the electroceramic is used to adjust the movable base, the upper connecting block can swing in different directions through the cooperation of the spring in the ball plunger and the steel ball, and the adjustable space is larger.
3、由于所述压力传感器镶装在上联接块顶面的中心孔内,叠堆压电陶瓷夹持在压力传感器与弹性支撑件之间,因此当对叠堆压电陶瓷施加预紧力后,避免了可动底座结构对压力传感器的干扰,可以获得更准确的预紧力数据;当叠堆压电陶瓷工作时,所获得的激振力的测量值也更加准确。3. Since the pressure sensor is embedded in the center hole on the top surface of the upper connecting block, the stacked piezoelectric ceramics are clamped between the pressure sensor and the elastic support, so when the pre-tightening force is applied to the stacked piezoelectric ceramics , which avoids the interference of the movable base structure on the pressure sensor, and can obtain more accurate pre-tightening force data; when the stacked piezoelectric ceramics work, the measured value of the excitation force obtained is also more accurate.
4、由于弹性支撑件包括一块基板和四个圆周均布的支撑臂,每个支撑臂均由依次相互垂直连接的第一连接臂、第二连接臂、第三连接臂和第四连接臂组成,当叠堆压电陶瓷工作时,弹性支撑件的振动变形主要来自四个支撑臂,而基板的变形量则很小,因此不会导致胶体开裂,微器件不会发生脱落。4. Since the elastic support includes a base plate and four support arms uniformly distributed on the circumference, each support arm is composed of a first connecting arm, a second connecting arm, a third connecting arm and a fourth connecting arm which are vertically connected to each other in sequence , when the stacked piezoelectric ceramics work, the vibration deformation of the elastic support mainly comes from the four support arms, while the deformation of the substrate is very small, so the colloid will not crack and the micro devices will not fall off.
5、由于在支撑板中心沿竖直方向安装有电动丝杠传动机构,电动丝杠传动机构的丝母与下联接块连接,当需要对叠堆压电陶瓷施加不同大小的预紧力时,可以通过电动丝杠传动机构带动可动底座移动来实现,调节过程简单、灵活。5. Since the electric screw drive mechanism is installed in the vertical direction in the center of the support plate, the nut of the electric screw drive mechanism is connected to the lower connecting block. When it is necessary to apply different sizes of preload to the stacked piezoelectric ceramics, It can be realized by driving the movable base to move through the electric screw transmission mechanism, and the adjustment process is simple and flexible.
附图说明Description of drawings
图1是本发明的立体结构示意图。Fig. 1 is a schematic diagram of the three-dimensional structure of the present invention.
图2是本发明的俯视图。Figure 2 is a top view of the present invention.
图3是图2的A-A剖视图。Fig. 3 is a cross-sectional view along line A-A of Fig. 2 .
图4是图2的B-B剖视图。Fig. 4 is a B-B sectional view of Fig. 2 .
图5是图2的C-C剖视图。Fig. 5 is a C-C sectional view of Fig. 2 .
图6是本发明拆除掉环形顶板后的俯视图。Fig. 6 is a top view of the present invention with the annular top plate removed.
图7是弹性支撑件的结构示意图。Fig. 7 is a schematic diagram of the structure of the elastic support.
图中:1.套筒,101.矩形凹槽,102.长孔,2.环形顶板,3.底板,4.MEMS微结构,5.微结构安装板,6.弹性支撑件,601.支撑臂,6011.第一连接臂,6012.第二连接臂,6013.第三连接臂,6014.第四连接臂,602.基板,7.支柱,8.安装套,9.球头柱塞,10.叠堆压电陶瓷,11.压力传感器,12.调节杆,13.上联接块,1301.球面凸起,14.导向轴,15.下联接块,1501.球面凹槽,16.丝母,17.支撑板,18.直线步进电机,19.丝杠,20.轴套。In the figure: 1. sleeve, 101. rectangular groove, 102. long hole, 2. annular top plate, 3. bottom plate, 4. MEMS microstructure, 5. microstructure mounting plate, 6. elastic support, 601. support Arm, 6011. First connecting arm, 6012. Second connecting arm, 6013. Third connecting arm, 6014. Fourth connecting arm, 602. Base plate, 7. Prop, 8. Mounting sleeve, 9. Ball plunger, 10. Stacked piezoelectric ceramics, 11. Pressure sensor, 12. Adjusting rod, 13. Upper connection block, 1301. Spherical protrusion, 14. Guide shaft, 15. Lower connection block, 1501. Spherical groove, 16. Wire Female, 17. support plate, 18. linear stepper motor, 19. leading screw, 20. axle sleeve.
具体实施方式Detailed ways
如图1~图7所示,本发明涉及的一种可对MEMS微结构加载冲击载荷的四轴式激励装置,包括一个空心套筒1,在套筒1内设有叠堆压电陶瓷10、压力传感器11以及由上联接块13和下联接块15构成的可动底座,在套筒1上面设有弹性支撑件6和MEMS微结构4。As shown in Figures 1 to 7, the present invention relates to a four-axis excitation device capable of applying impact loads to MEMS microstructures, including a hollow sleeve 1, and stacked piezoelectric ceramics 10 are arranged in the sleeve 1. , a pressure sensor 11 and a movable base composed of an upper coupling block 13 and a lower coupling block 15 , and an elastic support 6 and a MEMS microstructure 4 are arranged on the sleeve 1 .
在套筒1上面和底面分别通过螺栓固定有环形顶板2和底板3,所述MEMS微结构4通过弹性支撑件6安装在环形顶板2上。所述弹性支撑件包括一块正方形基板602和四个圆周均布的支撑臂601,每个支撑臂601均由依次相互垂直连接的第一连接臂6011、第二连接臂6012、第三连接臂6013和第四连接臂6014组成,四个支撑臂601分别通过第一连接臂6011连接在基板602四周端面的一端,第二连接臂6012和第三连接臂6013与基板602外缘形成一个L型间隙;用于减小基板的变形量,避免MEMS微结构4因胶体开裂而发生脱落。所述弹性支撑件6的四个支撑臂601分别通过空心支柱7使用螺钉支撑固定在环形顶板2上面,MEMS微结构4通过微结构安装板5粘固在弹性支撑件6的基板602上表面中心处。An annular top plate 2 and a bottom plate 3 are respectively fixed on the upper surface and the bottom surface of the sleeve 1 by bolts, and the MEMS microstructure 4 is mounted on the annular top plate 2 through an elastic support 6 . The elastic support includes a square base plate 602 and four support arms 601 uniformly distributed around the circumference, each support arm 601 is composed of a first connecting arm 6011, a second connecting arm 6012, and a third connecting arm 6013 which are vertically connected in sequence. Composed of the fourth connecting arm 6014, the four supporting arms 601 are respectively connected to one end of the peripheral end surface of the substrate 602 through the first connecting arm 6011, and an L-shaped gap is formed between the second connecting arm 6012 and the third connecting arm 6013 and the outer edge of the substrate 602 ; It is used to reduce the deformation of the substrate and prevent the MEMS microstructure 4 from falling off due to cracking of the colloid. The four support arms 601 of the elastic support 6 are supported and fixed on the annular top plate 2 through the hollow pillars 7 respectively, and the MEMS microstructure 4 is bonded to the center of the upper surface of the substrate 602 of the elastic support 6 through the microstructure mounting plate 5 place.
在套筒1内下部的阶梯处通过螺钉固定设有支撑板17,在支撑板17中心沿竖直方向安装有电动丝杠传动机构,该电动丝杠传动机构由直线步进电机18、连接直线步进电机18输出轴的丝杠19和丝母16构成,其中直线步进电机18安装在支撑板17底面,丝杠19上端插入下联接块15底面的中心孔内,丝母16上端与下联接块15底面通过圆周均布的螺钉连接,用于带动下联接块15上下移动。A support plate 17 is fixed by screws at the bottom step of the sleeve 1, and an electric screw drive mechanism is installed in the center of the support plate 17 along the vertical direction. The screw 19 of the output shaft of the stepping motor 18 and the screw nut 16 constitute, wherein the linear stepping motor 18 is installed on the bottom surface of the support plate 17, the upper end of the screw screw 19 is inserted in the center hole of the bottom surface of the lower connecting block 15, and the upper end of the screw nut 16 is connected to the bottom surface of the lower connecting block 15. The bottom surface of the coupling block 15 is connected by screws evenly distributed on the circumference, and is used to drive the lower coupling block 15 to move up and down.
在上联接块13和下联接块15的相对面上分别设有相互配合的球面凸起1301和球面凹槽1501,所述球面凸起1301插入球面凹槽1501内且球面凸起的曲率半径小于球面凹槽的曲率半径,使上联接块和下联接块之间形成点接触;并使上联接块13底面和下联接块15顶面之间形成一个调整间隙,该调整间隙优选为2~5mm。On the opposite surface of the upper coupling block 13 and the lower coupling block 15 are respectively provided with a spherical protrusion 1301 and a spherical groove 1501 that cooperate with each other, and the spherical protrusion 1301 is inserted into the spherical groove 1501 and the radius of curvature of the spherical protrusion is less than The radius of curvature of the spherical groove makes point contact between the upper coupling block and the lower coupling block; and an adjustment gap is formed between the bottom surface of the upper coupling block 13 and the top surface of the lower coupling block 15, and the adjustment gap is preferably 2 to 5mm .
所述压力传感器11镶装并粘接在上联接块13顶面的中心孔内,叠堆压电陶瓷10为圆柱形且下端粘接在压力传感器11上,叠堆压电陶瓷10上下两端夹持在压力传感器11与弹性支撑件6的基板602之间。在叠堆压电陶瓷10上端扣设并粘接有安装套8,所述基板602压在安装套8上,用于使叠堆压电陶瓷10与弹性支撑件底面实现良好的接触,避免由于叠堆压电陶瓷10顶部工作表面的粗糙不平所导致的叠堆压电陶瓷10和弹性支撑件6接触不良的问题。The pressure sensor 11 is embedded and bonded in the center hole on the top surface of the upper connecting block 13, the stacked piezoelectric ceramic 10 is cylindrical and the lower end is bonded on the pressure sensor 11, and the upper and lower ends of the stacked piezoelectric ceramic 10 are clamped between the pressure sensor 11 and the base plate 602 of the elastic support 6 . A mounting sleeve 8 is fastened and bonded to the upper end of the stacked piezoelectric ceramics 10, and the substrate 602 is pressed on the mounting sleeve 8 for making the stacked piezoelectric ceramics 10 and the bottom surface of the elastic support member realize good contact, avoiding the The problem of poor contact between the stacked piezoelectric ceramics 10 and the elastic support member 6 is caused by the roughness of the top working surface of the stacked piezoelectric ceramics 10 .
所述上联接块13外缘为正八边形,且在外缘每个面中部沿径向分别设有一个连接螺孔。在上联接块13外缘沿圆周方向均布连接有球头柱塞9,球头柱塞9为四个且一端分别通过螺纹沿径向连接在上联接块外缘的四个连接螺孔内,球头柱塞9外端的钢珠分别顶入到沿圆周方向均布在套筒1内壁的四个矩形凹槽101内,用于辅助可动底座补偿叠堆压电陶瓷10两工作表面平行度误差的调节。The outer edge of the upper coupling block 13 is a regular octagon, and a connecting screw hole is respectively arranged in the middle of each surface of the outer edge along the radial direction. The outer edge of the upper coupling block 13 is uniformly connected with ball plungers 9 along the circumferential direction, and the number of the ball plungers 9 is four, and one end is connected to the four connecting screw holes in the outer edge of the upper coupling block in a radial direction through threads respectively. , the steel balls at the outer end of the ball plunger 9 are pushed into four rectangular grooves 101 uniformly distributed on the inner wall of the sleeve 1 along the circumferential direction, which are used to assist the movable base to compensate the parallelism of the two working surfaces of the stacked piezoelectric ceramics 10 error adjustment.
在上联接块13外缘沿圆周方向均布连接有调节杆12,所述调节杆12为四个且分别沿径向连接在上联接块外缘的其余四个连接螺孔内,并与球头柱塞间隔布置。调节杆12外端分别由沿圆周方向均布在套筒1壁上的四个长孔102穿过,用于实现测试后上联接块13的复位。所述长孔102的中心线与矩形凹槽101的中心线均与套筒1的轴线平行,且每个长孔102的中心线与相邻的矩形凹槽101的中心线所夹的圆心角为45度。The outer edge of the upper coupling block 13 is uniformly connected with adjusting rods 12 along the circumferential direction. The head plungers are arranged at intervals. The outer ends of the adjustment rods 12 pass through four long holes 102 uniformly distributed on the wall of the sleeve 1 along the circumferential direction, so as to realize the reset of the upper coupling block 13 after the test. The centerlines of the elongated holes 102 and the centerlines of the rectangular grooves 101 are parallel to the axis of the sleeve 1, and the central angle between the centerline of each elongated hole 102 and the centerline of the adjacent rectangular groove 101 is is 45 degrees.
在套筒1内沿圆周方向均布设有四根导向轴19,导向轴19两端分别通过螺钉连接在环形顶板2与支撑板17之间。导向轴19通过间隙配合穿过均布设置在下联接块15下端的法兰盘上的导向孔,用于保证下联接块15上下移动时的水平度。在下联接块15下端位于导向孔内分别镶装有轴套20。所述长孔102的中心线和相邻的导向轴19轴线与套筒1的轴线所夹的圆心角为22.5度。Four guide shafts 19 are evenly distributed along the circumferential direction in the sleeve 1 , and both ends of the guide shafts 19 are respectively connected between the annular top plate 2 and the support plate 17 by screws. The guide shaft 19 passes through the guide holes evenly distributed on the flange plate at the lower end of the lower coupling block 15 through clearance fit, so as to ensure the levelness of the lower coupling block 15 when moving up and down. Axle sleeves 20 are fitted respectively in the guide holes at the lower end of the lower coupling block 15 . The central angle formed by the central line of the long hole 102 and the axis of the adjacent guide shaft 19 and the axis of the sleeve 1 is 22.5 degrees.
工作时,首先启动直线步进电机18通过丝杠19和丝母16传动向上推动由上联接块13和下联接块15所组成的可动底座对叠堆压电陶瓷10施加预紧力,同时监测由压力传感器11测得的预紧力数据,当预紧力的大小达到设定值之后,控制直线步进电机18停止工作。然后,使用外部电源在叠堆压电陶瓷10的两电极间施加脉冲信号,利用叠堆压电陶瓷10的逆压电效应实现对MEMS微结构4的激励,同时使用外部光学非接触式的测振装置检测MEMS微结构4的振动响应,利用压力传感器11检测叠堆压电陶瓷10的输出力。最后,当完成对MEMS微结构4的激励后,控制直线步进电机18带动下联接块15向下移动,再手动调节四个调节杆12带动上联接块13向下移动,使叠堆压电陶瓷10顶部安装套8与弹性支撑件6分离开,避免叠堆压电陶瓷10一直处于受力的状态。When working, first start the linear stepper motor 18 to push upwards through the transmission of the lead screw 19 and the screw nut 16. The movable base composed of the upper coupling block 13 and the lower coupling block 15 exerts a pre-tightening force on the stacked piezoelectric ceramics 10, and at the same time The pre-tightening force data measured by the pressure sensor 11 is monitored, and when the pre-tightening force reaches a set value, the linear stepper motor 18 is controlled to stop working. Then, an external power supply is used to apply a pulse signal between the two electrodes of the stacked piezoelectric ceramics 10, and the inverse piezoelectric effect of the stacked piezoelectric ceramics 10 is used to excite the MEMS microstructure 4. The vibration device detects the vibration response of the MEMS microstructure 4, and the pressure sensor 11 is used to detect the output force of the stacked piezoelectric ceramics 10. Finally, after the excitation of the MEMS microstructure 4 is completed, the linear stepping motor 18 is controlled to drive the lower connecting block 15 to move downward, and then the four adjusting rods 12 are manually adjusted to drive the upper connecting block 13 to move downward, so that the stacked piezoelectric The mounting sleeve 8 on the top of the ceramic 10 is separated from the elastic support member 6 to prevent the stacked piezoelectric ceramic 10 from being under stress all the time.
尽管本发明的实施方案已公开如上,但其并不仅仅限于说明书和实施方式中所列运用,它完全可以被适用于各种适合本发明的领域,对于熟悉本领域的人员而言,可容易地实现另外的修改,因此在不背离权利要求及等同范围所限定的一般概念下,本发明并不限于特定的细节和这里示出与描述的图例。Although the embodiment of the present invention has been disclosed as above, it is not limited to the use listed in the specification and implementation, it can be applied to various fields suitable for the present invention, and it can be easily understood by those skilled in the art Therefore, the invention is not limited to the specific details and examples shown and described herein without departing from the general concept defined by the claims and their equivalents.
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201711355476.7A CN107894315B (en) | 2017-12-16 | 2017-12-16 | A four-axis excitation device that can load impact loads on MEMS microstructures |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201711355476.7A CN107894315B (en) | 2017-12-16 | 2017-12-16 | A four-axis excitation device that can load impact loads on MEMS microstructures |
Publications (2)
Publication Number | Publication Date |
---|---|
CN107894315A true CN107894315A (en) | 2018-04-10 |
CN107894315B CN107894315B (en) | 2019-07-02 |
Family
ID=61808029
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201711355476.7A Expired - Fee Related CN107894315B (en) | 2017-12-16 | 2017-12-16 | A four-axis excitation device that can load impact loads on MEMS microstructures |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN107894315B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2021244156A1 (en) * | 2020-06-05 | 2021-12-09 | 上海隐冠半导体技术有限公司 | Leveling device |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN2613471Y (en) * | 2003-04-11 | 2004-04-28 | 华中科技大学 | Three-dimension measurer for dynamic property of micro-electromechanical system |
CN101476970A (en) * | 2009-01-14 | 2009-07-08 | 大连理工大学 | Seat excitation apparatus used for MEMS dynamic characteristics test |
JP2009222437A (en) * | 2008-03-13 | 2009-10-01 | Toyota Motor Corp | Vibration tester |
CN104445056A (en) * | 2014-12-12 | 2015-03-25 | 东南大学 | Four-beam testing structure for vibratory fatigue or torsional fatigue of MEMS (micro-electromechanical system) |
CN206074210U (en) * | 2016-10-15 | 2017-04-05 | 渤海大学 | A kind of hot environment charger for the test of MEMS micro-structure dynamic characteristics |
CN206074211U (en) * | 2016-10-15 | 2017-04-05 | 渤海大学 | A kind of low temperature environment charger for the test of MEMS micro-structure dynamic characteristics |
-
2017
- 2017-12-16 CN CN201711355476.7A patent/CN107894315B/en not_active Expired - Fee Related
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN2613471Y (en) * | 2003-04-11 | 2004-04-28 | 华中科技大学 | Three-dimension measurer for dynamic property of micro-electromechanical system |
JP2009222437A (en) * | 2008-03-13 | 2009-10-01 | Toyota Motor Corp | Vibration tester |
CN101476970A (en) * | 2009-01-14 | 2009-07-08 | 大连理工大学 | Seat excitation apparatus used for MEMS dynamic characteristics test |
CN104445056A (en) * | 2014-12-12 | 2015-03-25 | 东南大学 | Four-beam testing structure for vibratory fatigue or torsional fatigue of MEMS (micro-electromechanical system) |
CN206074210U (en) * | 2016-10-15 | 2017-04-05 | 渤海大学 | A kind of hot environment charger for the test of MEMS micro-structure dynamic characteristics |
CN206074211U (en) * | 2016-10-15 | 2017-04-05 | 渤海大学 | A kind of low temperature environment charger for the test of MEMS micro-structure dynamic characteristics |
Non-Patent Citations (3)
Title |
---|
佘东生: "T型硅微悬臂梁频率温度系数的测试研究", 《仪器仪表学报》 * |
施阳和: "基于压电陶瓷的MEMS测试用的多载荷加载台的研制", 《中国陶瓷》 * |
王晓东: "MEMS微构件动态特性测试的激励技术和方法", 《测试技术学报》 * |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2021244156A1 (en) * | 2020-06-05 | 2021-12-09 | 上海隐冠半导体技术有限公司 | Leveling device |
Also Published As
Publication number | Publication date |
---|---|
CN107894315B (en) | 2019-07-02 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN108217587B (en) | Four-axle type seat excitation apparatus for the test of MEMS micro-structure dynamic characteristics | |
CN108120578B (en) | A kind of triple axle exciting bank that shock loading can be loaded to MEMS micro-structure | |
CN108217590B (en) | Three-axis pedestal excitation device for testing dynamic characteristics of MEMS microstructures | |
CN108036912B (en) | A MEMS microstructure three-axis off-chip excitation device based on inverse piezoelectric effect | |
CN107894315A (en) | A kind of four-axle type exciting bank that shock loading can be loaded to MEMS micro-structurals | |
CN108181069B (en) | A MEMS microstructure four-axis dynamic loading device based on piezoelectric ceramics | |
CN108217589B (en) | A three-axis dynamic loading device for MEMS microstructure based on piezoelectric ceramics | |
CN108163805B (en) | Three-axis vibration excitation device for testing the dynamic characteristics of MEMS microstructures | |
CN108225700B (en) | A MEMS microstructure four-axis excitation device driven by piezoelectric ceramics | |
CN108151991B (en) | A kind of four-axle type Piezoelectric Ceramics Excitation device for the test of MEMS micro-structure dynamic characteristics | |
CN108020392B (en) | A MEMS microstructure four-axis off-chip excitation device based on inverse piezoelectric effect | |
CN108163806B (en) | A MEMS microstructure four-axis base excitation device based on piezoelectric ceramics | |
CN108168814B (en) | A four-axis vibration excitation device that can excite MEMS microstructures off-chip | |
CN108217586B (en) | Four-axle type exciting device for the test of MEMS micro-structure dynamic characteristics | |
CN108168817B (en) | A kind of MEMS micro-structure triple axle exciting device based on pedestal motivational techniques | |
CN108217583A (en) | A kind of MEMS micro-structure triple axle exciting banks with mobile base structure | |
CN108168816A (en) | It is a kind of can dynamic driving MEMS micro-structures triple axle exciting bank | |
CN108168815A (en) | A kind of MEMS micro-structure triple axle exciting banks by Piezoelectric Ceramic | |
CN108195536B (en) | A kind of four-axle type exciting device for MEMS micro-structure progress dynamically load | |
CN108217585B (en) | A MEMS microstructure four-axis vibration device with piezoelectric ceramics as the excitation source | |
CN108217582B (en) | A kind of MEMS micro-structure four-axle type exciting device based on pedestal motivational techniques | |
CN108168818B (en) | A MEMS microstructure three-axis base excitation device based on piezoelectric ceramics | |
CN108163804A (en) | It is a kind of can dynamic driving MEMS micro-structures four-axle type exciting bank | |
CN108217584B (en) | A three-axis vibration excitation device for dynamic loading of MEMS microstructures | |
CN108168813B (en) | A MEMS microstructure four-axis excitation device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20190702 Termination date: 20191216 |
|
CF01 | Termination of patent right due to non-payment of annual fee |