CN107807296A - Separator for testing electronic parts - Google Patents

Separator for testing electronic parts Download PDF

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Publication number
CN107807296A
CN107807296A CN201710805550.4A CN201710805550A CN107807296A CN 107807296 A CN107807296 A CN 107807296A CN 201710805550 A CN201710805550 A CN 201710805550A CN 107807296 A CN107807296 A CN 107807296A
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CN
China
Prior art keywords
chamber
test
mobile
test pallet
pallet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201710805550.4A
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Chinese (zh)
Other versions
CN107807296B (en
Inventor
罗闰成
卢锺基
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Techwing Co Ltd
Original Assignee
Techwing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR1020170000801A external-priority patent/KR102664951B1/en
Application filed by Techwing Co Ltd filed Critical Techwing Co Ltd
Priority to CN202011106276.XA priority Critical patent/CN112595922B/en
Publication of CN107807296A publication Critical patent/CN107807296A/en
Application granted granted Critical
Publication of CN107807296B publication Critical patent/CN107807296B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/36—Sorting apparatus characterised by the means used for distribution

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The present invention relates to a kind of separator for testing electronic parts.Included according to the separator for testing electronic parts of the present invention：Mobile chamber, can house the test pallet that heap is loaded with electronic unit, and move along predetermined mobile route.Also, mobile chamber can include：First chamber part, the temperature for being loaded in the electronic unit of test pallet for adjusting heap；Second chamber part, for making the temperature of electronic unit that heap is loaded in test pallet recover to normal temperature.According to the present invention, multiple test windows can be configured with unit form by forming mobile chamber, therefore can significantly reduce the installation space relative to processing capacity, and by the way that a chamber is divided into two separately to set its function, setting area can be minimized.

Description

Separator for testing electronic parts
Technical field
The present invention relates to a kind of separator for testing electronic parts.
Background technology
The electronic unit produced is divided into non-defective unit and substandard products after the test of tested device and only non-defective unit is dispatched from the factory.
The electrical connection of tester and electronic unit passes through the separator (hereinafter referred to as " sorting for testing electronic parts Machine ") realize, and various separators are had according to the species of electronic unit.Wherein, the present invention relates to one kind to apply energy The separator of the test pallet of the multiple electronic units of enough preloadings.
There are a variety of shapes including KR published patent 10-2013-0105104 grades using the separator of test pallet State, generally, as shown in Fig. 1 conceptual plan, including：Loading machine 110；First chamber 120；Test chamber 130；Connection Device 140；Second chamber 150 and unloader 160.
Heap is loaded in client's pallet (Customer-tray) CT by loading machine 1101Electronic unit to be tested load in place In " loaded " position (LP：LOADING POSITION) test pallet TT.
First chamber 120 is for basis before being tested in the electronic unit that the test pallet TT being received is loaded in heap Test temperature condition carries out temperature adjustment (preheating or precooling) and is equipped with advance.
Test chamber 130 in order to be preheated in first chamber 120/precooling after be transplanted on test position (TP：TEST POSITION the electronic unit on test pallet TT) is tested and is equipped with.That is, test chamber 130 in order that heap be loaded in by The temperature of electronic unit on the test pallet TT of collecting maintains test temperature condition and is equipped with.
The electronic unit that heap is loaded on test position TP test pallet TT is electrically connected to tester by connector 140.
Second chamber 150 from test chamber 130 in order to transferring on the test pallet TT to come in heated state Electronic unit carry out cooling make it restore to room temperature or unloading when occur without problem degree predetermined temperature and be equipped with.
Unloader 160 is from positioned at unloading position (UP：UNLOADING POSITION) test pallet TT unloading electronics The client's pallet CT for being classified by grade is tested while part and being moved into sky2。
As described above, test pallet TT is according to by " loaded " position LP, test position TP and unloading position UP and again The circulating path CC for returning to " loaded " position LP is circulated, therefore, multiple transfer devices (not shown) are forming circulating path CC's Each section transfer test pallet TT.
In addition, as shown in figure 1, separator 100 have test chamber 130 be located at first chamber 110 and second chamber 150 it Between structure test pallet TT structure is transferred with the circulating path CC to closing, therefore in view of the width and height of equipment When, it is difficult to configure the test window TW of more than 4.Herein, test window TW refers to electronic unit and tester (TESTER) The window of electrical connection, every 1 test window TW correspond to 1 test pallet TT.Certainly, tester (TESTER) passes through testing window Mouth TW is combined with separator 100.
Therefore, the test support that heap is loaded at least one to most 3 is also defined in by i.e. 1 testable electronic unit Disk TT quantity, this makes the limit of the separator 100 with processing capacity that can not infinitely expand size.
The content of the invention
It can supply and survey to multiple test windows it is an object of the invention to provide a kind of one chamber for being used for temperature adjustment Examination pallet or the technology that the test pallet from multiple test windows can be received.
Included according to the separator for testing electronic parts of the first viewpoint of the present invention：Mobile chamber, can be housed Heap is loaded with the test pallet of electronic unit, and is moved along predetermined mobile route；Device is transferred, is transferred on the mobile route The mobile chamber；Connector, at least side of the mobile route is configured at, so that test can be received from the mobile chamber Pallet provides test pallet to the mobile chamber, also, electronic unit is electrically connected with being incorporated into the tester of test window Connection is connect or releases, can carry out being loaded in heap the test of the electrology characteristic of the electronic unit of test pallet；And at least one Individual mobile device, test pallet is set to be moved between the mobile chamber and the connector.
At least one mobile device can be arranged on the mobile chamber and be moved together with the mobile chamber.
The mobile chamber, including：First chamber part, the temperature for being loaded in the electronic unit of test pallet for adjusting heap Degree；And second chamber part, it is arranged side-by-side along the vertical direction with the first chamber part, heap is loaded in the electricity of test pallet The temperature of subassembly is recovered to normal temperature, and the inside of the first chamber part and the second chamber part is isolated wall and divided each other From.
The first chamber part includes：Switch gate, by for receiving positioned at the test pallet of " loaded " position or to institute The first moving hole switch of connector transmission test pallet is stated, the second chamber part includes：Second moving hole, for unloading Carry position transmission test pallet or receive test pallet from the connector, the inside of the second chamber part passes through second Moving hole and ft connection.
It can also include：Lift, by making the mobile chamber lifting be at can be from first chamber part To the position of connector transmission test pallet, or it can receive and survey from the connector in the second chamber part Try the position of pallet.
It can also include：Rising machine, pass through the test pallet for making to be moved to test chamber from the first chamber part Rise, and the test pallet equipped with the electronic unit for completing test is taken out of and be configured at the upper of the first chamber part The second chamber part of side.
The test window is multiple, and multiple test windows are each configured with the connector.
Also include：Multiple test chambers, the test pallet from the mobile chamber is housed, and be configured at each testing window To maintain the test temperature condition of electronic unit, the mobile chamber with the test chamber there is one-to-many quantity to close for mouth side System.
The multiple connector is respectively arranged at the both sides of the mobile route.
It can also include：Test chamber, the test pallet from the mobile chamber is housed, and heap is loaded in what is be received The temperature of the electronic unit of test pallet maintains test temperature condition；And isolator, it is located at for isolating from the movement The electronic unit and extraneous air for the test pallet on path that chamber moves to the test chamber.
The separator also includes：First buffer chamber, the test pallet for having electronic unit to be tested in preloading move It is standby before to the mobile chamber；And second buffer chamber, house the heap from the mobile chamber and be loaded with and completed to survey The test pallet of the electronic unit of examination simultaneously makes its standby, and first buffer chamber is configurable to fix with the second buffer chamber Type.
Before test pallet moves from the inside of first buffer chamber to the inside of the mobile chamber, described the Warm status inside one buffer chamber is logical by the closing that is formed between first buffer chamber and the mobile chamber Road and the inside for being delivered to the mobile chamber, and the temperature of the mobile chamber interior is assimilated into first buffer chamber Internal temperature.
Included according to the separator for testing electronic parts of the second viewpoint of the present invention：Chamber is housed, can be housed Heap is loaded with the test pallet of electronic unit；Connector, it is configured to receive test pallet or to institute from the collecting chamber State and house chamber transmission test pallet, electronic unit is electrically connected or release connection with being incorporated into the tester of test window, Can carry out being loaded in heap the test of the electrology characteristic of the electronic unit of test pallet, and it is configured at the one of the collecting chamber Side；And multiple mobile devices, test pallet is moved between the collecting chamber and the connector, the collecting chamber Including：First chamber part, the temperature for being loaded in the electronic unit of test pallet for adjusting heap；And second chamber part, with First chamber part integratedly with reference to and be arranged side-by-side, it is internal to be separated with the first chamber part by divider wall, use In making the temperature of electronic unit that heap is loaded in test pallet recover to normal temperature, the part in the multiple mobile device makes test Pallet is partially moved to the connector from the first chamber, and another part makes test pallet be moved to institute from the connector State second chamber part.
The first chamber part and the second chamber part along the vertical direction on be arranged side-by-side.
According to the present invention, have the effect that.
First, multiple testing windows can be configured with unit form close to the mobile chamber of test window by forming Mouthful, therefore the size of the separator relative to processing capacity can be minimized.
Second, it can be connected with multiple test chambers (or connector) while a mobile chamber movement, therefore can be with Test pallet is used in correspondingly to be greatly decreased via the quantity of the transfer device of each test chamber, so as to so that size more Minimize and production cost can be reduced.
3rd, the increase and decrease of unit number can be carried out with identical structure, therefore be easier to produce and meet client company It is required that separator.That is, the otherwise designed without the increase and decrease for capacity.
4th, a mobile chamber can be close to each test chamber (or connector), so if will mobile chamber It is divided into two regions and differently sets its function, then can be not only tested in various temperature environments, additionally it is possible to enter one Step minimizes the size of separator.
5th, it should be formed for the testing time than the environment in mobile cavity room for time long equipment, Ke Yishi The equipment of optimization.
Brief description of the drawings
Fig. 1 is the conceptual plan to the conventional separator for testing electronic parts.
Fig. 2 is the conceptual plan to the separator according to the first embodiment of the present invention.
Fig. 3 is the schematical orthogonal view to the mobile chamber of the separator applied to Fig. 2.
Fig. 4 is the conceptual stereogram to the lifter cam mechanism of the mobile chamber applied to Fig. 3.
Fig. 5 is the reference picture for illustrating the work of Fig. 4 lifter cam mechanism.
Fig. 6 is the conceptual front elevation to the elevating mechanism of the separator applied to Fig. 2.
Fig. 7 is the reference picture for illustrating the work of Fig. 6 lift.
Fig. 8 is the conceptual plan to the transfer device applied to Fig. 2 separators.
Fig. 9 is the conceptual orthogonal view to the test chamber of the separator applied to Fig. 2.
Figure 10 is the conceptual sectional side view to the connector of the separator applied to Fig. 2.
Figure 11 is the reference picture for illustrating the work of Figure 10 connector.
Figure 12 is the conceptual stereogram to the mobile device of the separator applied to Fig. 2.
Figure 13 is the reference picture for illustrating the work of Figure 12 mobile device.
Figure 14 is the conceptual orthogonal view to the isolator of the separator applied to Fig. 2.
Figure 15 is for illustrating the work of Figure 12 isolator and the reference picture of function.
Figure 16 is the conceptual plan to separator according to the second embodiment of the present invention.
Figure 17 is the conceptual plan to the separator of deformation according to the second embodiment of the present invention.
Figure 18 is the conceptual plan to the separator of the 3rd embodiment according to the present invention.
Figure 19 is the reference picture of situation for showing that more Figure 18 separator is set up in parallel and used.
Figure 20 is the conceptual plan to the separator of the 4th embodiment according to the present invention.
Figure 21 is the movement for being used to realize the test pallet carried out between mobile chamber and test chamber in the present invention Extra example rising machine schematic diagram.
Symbol description
200：Separator 210：Mobile chamber
211：First chamber part 212：Second chamber part
220：Lift 230：Transfer device
241~248：Test chamber 251~258：Connector
261a、261b：First mobile device 262a, 262b：Second mobile device
271：Loading machine 272：Unloader
291、292：Isolator
Embodiment
Referring to the drawings to illustrating according to a preferred embodiment of the invention, but can be omitted as far as possible for the terseness of explanation Or compression is to repetition or the explanation of identical composition.
<First embodiment>
1. pair general description formed
Fig. 2 is the conceptual plan to the separator 200 according to the first embodiment of the present invention.
Included according to the separator 200 of the present embodiment：Mobile chamber 210；Lift 220；Transfer device 230；8 test chambers Room 241~248；8 connectors 251~258；2 the first mobile devices 261a, 261b；2 the second mobile device 262a, 262b；Loading machine 271；Unloader 272；First opens machine 281；Second opens machine 282；Drive tester DT；2 isolators 291、292。
Mobile chamber 210 reciprocates predetermined mobile route MC in the longitudinal direction.This mobile chamber 210 can house Test pallet (TT).
Lift 220, which makes to move chamber 210, to be lifted.This is to enable to move chamber 210 in position to test Chamber 241~248 or unloading position UP provide test pallet TT or received from test chamber 241~248 or " loaded " position LP Test pallet TT.
Transfer device 230 makes to move chamber 210 to be moved on mobile route MC.
4, and in order that the survey being received is respectively configured in mobile route MC left and right sides in 8 test chambers 241~248 Examination pallet TT electronic unit maintains test temperature condition and configured.
8 connectors 251~258 electrically connect the electronic unit for the test pallet TT for being housed in test chamber 241~248 In tester (not shown).Also, each connector 251~258 be configured to from mobile chamber 210 receive test pallet TT or to Mobile chamber 210 provides test pallet TT.Therefore, 8 connectors 251~258 are also distinguished in the mobile route MC left and right sides Configuration 4.
2 first mobile devices 261a, 261b and 2 the second mobile devices 262a, 262b are arranged at mobile chamber 210 simultaneously Moved with together with mobile chamber 210.Here, the first mobile device 261a, 261b, which performs, to have loaded the test support of electronic unit Disk TT is transplanted on mobile chamber 210 from " loaded " position LP or is transplanted on the test pallet TT for being housed in mobile chamber 210 respectively The function of individual test chamber 241~248.Also, the second mobile device 262a, 262b, which performs, will be located at test chamber 241~248 Test pallet TT be transplanted on mobile chamber 210 or be transplanted on unloading position UP function.
Loading machine 271 makes to be located at client's pallet CT1Electronic unit move into place test pallet TT in " loaded " position LP.
Electronic unit is moved to client's pallet CT of sky by unloader 272 from the test pallet TT positioned at unloading position UP2、 CT3。
First opening machine 281 enables electronic unit suitably by the open test pallet TT positioned at " loaded " position LP Heap is downloaded to test pallet TT.
Second opening machine 282 enables electronic unit suitably by the open test pallet TT positioned at unloading position UP Removed from corresponding test pallet TT.
Driving tester DT in order to simple test electronic unit electric drive whether and be equipped with.
2 isolators 291,292 are arranged at mobile chamber 210, execution will from mobile chamber 210 to test chamber 241~ The function that the test pallet TT of 248 movements isolates with extraneous air.
2. pair explanation formed individually
A. to the explanation of mobile chamber 210
As shown in Fig. 3 schematical orthogonal view, mobile chamber 210 is isolated the DW points of first chamber portions for downside of wall Divide the 211 second chamber parts 212 with upside.Here, in order to isolate hot movement, divider wall DW is preferably made up of heat-barrier material.
First chamber part 211 in order to be pre-adjusted heap be loaded in test pallet TT electronic unit temperature and be equipped with so that It can correspond to test temperature environmental condition.This first chamber part 211 can incite somebody to action according to the application conditions of separator 200 For forming the heater HT of hot environment with optionally having or all having for forming the refrigerating module CM of low temperature environment Have.Here, in view of being moved according to the air of air themperature state, heater HT is preferably to configure in first chamber part 211 Bottom, refrigerating module CM is preferably configured in the top of first chamber part 211.Here, refrigerating module CM can be by evaporator 1st, circulating fan 2, housing 3 are formed, and the inner air of first chamber part 211 is with by the inside of the inflow housing 3 of circulating fan 2 The mode discharged afterwards by evaporator 1 from housing 3 circulates, so as to cool down test pallet TT electronic unit.Here, in order to anti- Only the drive motor 2a of circulating fan 2 is damaged because of heat or frosting, is preferably configured in the outside of first chamber part 211.
As reference, according to performance, mobile chamber 210 can be presented as that first chamber part 211 plays heating chamber The effect of room and second chamber part 212 play the effect of cooling chamber.In such case, it is contemplated that hot gas rises and cold air The reason in the principle and equipment configuration of decline in bottom be typically cram many structures structure and top do not have Other structures thing and the structure of opening, preferably in downside, configuration makes first chamber part 211 that temperature rises and matched somebody with somebody in upside Putting reduces the second chamber part 212 of temperature.Also, in the case where normal temperature is tested, may be designed in makes the second of upside Chamber portion 212 opens to greatest extent, but in order to return to predetermined temperature or be cooled to predetermined temperature, can preferably consider Second chamber part 212 is also arranged to the structure of closing that can isolate extraneous air.
Also, for make " loaded " position LP of the first chamber part 211 on the left of mobile route MC receive test pallet TT or Test pallet TT can be optionally transferred to the test chamber 241~248 in the left side and right side for being located at mobile route MC respectively, In left side wall formed with left side moving hole LH1, in right side wall formed with right side moving hole RH1.Obviously, in order to isolate first chamber The inside of part 211 and extraneous air, first chamber part 211, which has, to be used to switch left side moving hole LH1Left-side switch door LD switchs right side moving hole RH with being used for1Right side opening shutdown RD.Here, each switch gate LD, RD can be configured to pass through gas Other driving sources such as cylinder CD and lift and switch moving hole LH1、RH1.Obviously, can also be configured to according to performance, switch gate Switched by hinge arrangement, but more preferably lifting structure is used to prevent the width of equipment from broadening.
Also, first chamber part 211 has a pair of supporting track 211a and lifter cam mechanism 211b.
A pair of supporting track 211a supports are housed to the test pallet TT of first chamber part 211 rear and front end and guiding The test pallet TT moved in the lateral direction movement.
Lifter cam mechanism 211b makes a pair of supporting track liftings.Therefore, as shown in figure 4, lifter cam mechanism 211b bags Include：Drive shaft DS；Driven axle PS；Conveyer belt TB and rotation motor RM.
In cam projection CPs of the drive shaft DS and driven axle PS formed with the center O` with the center O for deviateing each axle.One To supporting track 211a being supported with the state that is held up by cam projection CP.
Drive shaft DS revolving force is delivered to driven axle PS by conveyer belt TB.This conveyer belt TB can contemplate preferably by same Walk with forming to realize drive shaft DS and driven axle PS accurate linkage.
Rotation motor RM rotates drive shaft DS.Therefore, if rotation motor RM works, drive shaft DS and driven axle PS Rotate and cam projection CP is also rotated, and as shown in figure 5, supporting track 211a lifts predetermined height H.Obviously, with branch Track 211a lifting is supportted, is positioned over a supporting track 211a test pallet TT also liftings.
Second chamber part 212 is close to normal temperature or by temperature to change the temperature for the electronic unit for completing test Change at least can rightly unload the degree of electronic unit in the case of the damage of no electronic unit or unloader 272 Temperature and configure.
Second chamber part 212 is configured to the structure of closing also according to the application conditions of separator 200, can also be configured to The heater of temperature for improving electronic unit and the refrigerating module of the temperature for reducing electronic unit are optionally had Have or all have.But in the present embodiment, only it is made up of following simplest cooling structure, i.e. completed to change The temperature of the electronic unit of test and be close to normal temperature and electronic unit is exposed to extraneous air, and dropped by ventilating fan VP The temperature of low electronic unit.
This second chamber part 212 also for can from the test chamber 241 of the left and right sides positioned at mobile route MC~ 248 receive test pallet TT or to the unloading position UP transfer test pallet TT in front of right side and in left side wall and right side wall It is respectively formed with left side moving hole LH2With right side moving hole RH2.Also, the second chamber part 212 in the present embodiment does not have Electronic unit to make it internal is exposed to extraneous air and switchs left side moving hole LH2With right side moving hole RH2Other switch Door, to make more to be exposed in extraneous air inside it, and is also formed with intercommunicating pore CH in front-rear side walls.
Similarly, second chamber part 212 also includes：Front and rear a pair of supporting tracks 212a, for supporting the survey being received Try pallet TT and guide the test pallet TT of direction movement to the left and right movement；Lifter cam mechanism 212b, for making support Track 212a is lifted.
As described above, first chamber part 211 is as the supply chamber that test pallet TT is supplied to test chamber 241~248 Room plays a role, and second chamber part 212 is as the recovery chamber hair that test pallet TT is reclaimed from test chamber 241~248 The effect of waving.Also, first chamber part 211 is as the thermal processing chamber (SOAK for applying thermal stimulus to electronic unit CHAMBER) play a role, and second chamber part 212 is as the place of bringing down a fever for eliminating the thermal stimulus from electronic unit Reason chamber (DESOAK CHAMBER) plays a role.Obviously, the upper-lower position of two chambers part 211,212 can also exchange.
B. to the explanation of lift (220)
Lift 220, which makes to move chamber 210, to be lifted.This is in order that mobile chamber 210 can provide in position Or receive test pallet TT.As shown in fig. 6, this lift 220 can transfer the mobility framework 231 of device 230 by being arranged at Lift cylinder 221 is formed.
Therefore, if lift cylinder 221 works, as shown in fig. 7, the moving hole LH of first chamber part 2111、RH1It is in With the switch hole OH identicals height of test chamber 241~248 or the moving hole LH of second chamber part 2122、RH2In with survey Try the switch hole identical height of chamber 241~248.Therefore, can be from first chamber part 211 to survey in test pallet TT The movement of examination chamber 241~248 or the state that can be moved from test chamber 241~248 to second chamber part 212.Obviously, rise Sending down abnormally ascending cylinder 221 can configure one or more quantity.
Also, as the scheme for adjusting appropriate position, it may be designed in 281,282 liters of opening machine for making both sides The structure of drop rather than mobile chamber 210.But in this case, each open machine 281,282 needs to have more than one Lift cylinder, thus from production cost, equip the optimization of size in terms of and the consideration of control side etc., be more preferably configured to Make to move chamber 210 and lift.
Obviously, it is higher than the upper-lower height of mobile chamber 210 in the upper-lower height for applying test chamber 241~248, and works as When applying the structure for lifting electronic unit in test chamber, can also not have to separately to form for make to move chamber 210 or The lift that open machine 281,282 lifts.That is, test pallet TT can be made optionally being embodied as connector described below In the case of the height of first chamber part 211 or second chamber part 212, without being separately configured to make to move chamber The lift that 210 or open machines 281,282 lift.
C. to the explanation of transfer device 230
Transfer device 230 makes to move chamber 210 to be moved on mobile route MC.Here, mobile route MC is can be in left and right The long path on fore-and-aft direction moved back and forth between the " loaded " position LP or unloading position UP and test chamber 241~248 of side. As shown in figure 8, transfer device 230 includes mobility framework 231, rotary shaft 232, transfer motor 233, a pair of guide rails 234.
Mobility framework 231 is combined in a manner of bolt combines with rotary shaft 232, therefore can be according to the rotation of rotary shaft 232 Then move in front-rear direction.This mobility framework 231 is provided with lift 220 as described above, combined in lift 220 There is mobile chamber 210, therefore mobile chamber 210 and lift 220 move together according to the movement of mobility framework 231.
In order to provide mobile route MC, rotary shaft 232 is formed as in the longer shape of fore-and-aft direction.
Transfer motor 233 rotates positive and reverse return rotating shaft 232.
A pair of guide rails 234 guides the movable of mobility framework 231.
D. to the explanation of test chamber 241~248
Left and right sides of 8 test chambers 241~248 in mobile route MC is respectively configured 4.
Such as Fig. 9 schematical orthogonal view, in order that test pallet TT can come from the mobile transfer of chamber 210 or Mobile chamber 210 is transferred to, formed with open pore OH on the mobile route MC of test chamber 241.It is also, natural Ground, the control door CG for controlling switch hole OH is configured with order to heat-insulated.
In addition, it is incorporated in test window formed with test window TW, tester (TESTER) in the downside of test chamber 241 TW sides.Generally, a test chamber 241~248 is configured with a test window TW, therefore in the separator according to the present embodiment 8 test window TW are configured with 200 altogether.Described test window TW refers to test site (test zone) herein, i.e. The region that test chamber meets with tester.
Obviously, test chamber 241 can will form the heater HT of hot environment according to the application conditions of separator 200 With formed low temperature environment refrigerating module CM optionally with or all with.Obviously, it is uniform for hot gas or cold air Distribution, is preferable configured with air circulation fan (PAN).
Also, test chamber 241 is provided with electromagnet EM in its switch hole OH sides.If supply electricity to this electromagnet EM Source, then isolator 291 work.
The test chamber of symbol 242 to 248 it is identical with the test chamber of symbol 241 or on the basis of mobile route MC line and Symmetrically, therefore the description thereof will be omitted.
Configured according to 241~248 points of the test chamber of the separator 200 of the present invention for left and right and in the form of chamber, therefore Need processing capacity expand separator in the case of, still can by it is described below transfer device 230 be configured to it is longer and Configuration testing chamber is added again, so as to simply design.
Obviously, need not make when being configured to tested electronic unit maintain predetermined temperature be used for carry out normal temperature test Equipment in the case of, without being equipped with test chamber.That is, only the dress of the testing electronic parts within the scope of predetermined temperature is being needed Standby configuration testing chamber 241.Obviously, in the case where being presented as normal temperature test equipment, test chamber can also be configured Into open form.
E. to the explanation of connector 251~258
8 connectors 251~258 pass through the electronic unit for the test pallet TT being loaded in heap in test chamber 241~248 Tester (TESTER) side test trough side of tester (accurately says be) is pressurized to, so that electronic unit is electrically connected into test Device (TESTER).Therefore, as shown in Figure 10, connector 251 includes holding part GE and pressurized source PS.
Holding part GE is configured in the inside of test chamber 241, and including the grasping for grasping test pallet TT both ends Groove GH.Here, grasping groove GH is formed in the lateral direction longlyer, therefore the test pallet moved in the lateral direction can also be guided TT movement.
Pressurized source PS is configurable to motor, by making holding part GE liftings make the test grasped by holding part GE Pallet TT is down or up.Now, as shown in fig. 11a, if connector 251 make test pallet TT decline, electronic unit to Tester (TESTER) side pressurization of lower section is incorporated in, so that tester (TESTER) electrically connects with electronic unit.Also, such as Shown in Figure 11 b, if connector 251 rises test pallet TT, releasing tester (TESTER) is electrically connected with electronic unit Connect.
Obviously, test pallet TT movement is realized in the state of as shown in figure 11b.
As reference, to make the influence of the pressurized source PS not internal temperature environment of tested person chamber 241, pressurized source PS preferably matches somebody with somebody It is placed in the outside of test chamber 241 (in the present embodiment positioned at the upside of test chamber).
The connector of symbol 252 to 258 is identical with the connector of symbol 251 or line is mutually right on the basis of mobile route C Claim, therefore the description thereof will be omitted.
F. to mobile device 261a, 261b, 262a, 262b explanation
First mobile device 261a, 261b is arranged at first chamber part 211, and symbol 261a the first mobile device is responsible for In the movement for the test pallet TT that mobile route C left direction is carried out, symbol 261b the first mobile device is responsible in movement The movement for the test pallet TT that path C right direction is carried out.
Second mobile device 262a, 262b is arranged at second chamber part 212, and symbol 262a the second mobile device is responsible for In the movement for the test pallet TT that mobile route C left direction is carried out, symbol 262b the second mobile device is responsible in movement The movement for the test pallet TT that path C right direction is carried out.
As shown in figure 12, the first mobile device 261a includes grasping push rod GS and moving source MS.
Grasping push rod GS has the grasping pin GP for being used for grasping test pallet TT in its left end, and is formed in the lateral direction There is rack RG.As shown in Figure 13 a and Figure 13 b, grasping pin GP is by means of lifter cam mechanism 211b work and in test pallet Test pallet TT grip hole GH is inserted when TT rises and grasps test pallet TT, when test pallet TT declines from grip hole GH Depart from.
Moving source MS makes grasping push rod GS move in the lateral direction, so that the test pallet TT grasped by grasping push rod GS Move in the lateral direction.Therefore, moving source MS includes the little gear PG engaged with grasping push rod GS rack RG gears.This shifting Dynamic source MS preferably considers configuration in the outside of mobile chamber 210 to prevent fire damage.Also, if moving source MS is Figure 13 a's Worked under state, then as shown in figure 13 c, as grasping push rod GS is moved to the left, test pallet TT is also moved to the left together.
Symbol 261b the first mobile device and the second mobile device 262a, 262b is actually all configured to identical knot Structure, therefore the description thereof will be omitted.
G. to the explanation of loading machine 271 and unloader 272
Loading machine 271 is with unloader 272 as long as there is the structure for moving electronic unit.Loading machine 271 and unloading Machine 272 is the instrument that electronic unit is positioned over required place by grasping and mobile electron part afterwards, and it can be according to electricity The species of subassembly and there are various grasping structures.Technology on this variety of grasping structures according to electronic unit species is It is known by Korean Patent Publication 10-2002-0049848, No. 10-2003-0016060 etc., therefore it is detailed to omit its Explanation.According to performance, electronic unit can be enumerated it is loaded in heap in the state of test pallet and be supplied to showing for separator Example, in such a case, it is possible to omit loading machine 271.Also, in the shape for being configured to heap being loaded with the electronic unit for completing test The test pallet of state takes out from separator and in the case of other equipment classification, can also omit unloader 272.
H. to the explanation of open machine 281,282
As long as open machine 281,282 is performed to take out electricity to test pallet TT preloadings electronic unit or from test pallet TT Subassembly and the function of opening test pallet TT.Obviously, open machine 281,282 can also be according to the electricity of electronic unit species The fixed structure of subassembly has various open architecture.A variety of open architectures on this species according to electronic unit Technology, also by Korean Patent Publication 10-2009-0008062, No. 10-2011-0136312 etc. and known, therefore save Slightly its detailed description.
As reference, in the state of test pallet level, in the horizontal separator tested, according to the ministry of electronics industry The species of part can also configure or not configure open machine.
I. to driving tester DT explanation
Driving tester DT is used for whether the testing electronic parts when power supply is supplied to electronic unit suitably to drive, and drives Tester DT, which is configured to loading machine 271, to be electrically connected to driving by the electronic unit of the state grasped in the machine that is loaded 271 Tester DT position.The front that driving tester DT in the present embodiment is configured at " loaded " position LP is loaded with minimizing The radius of clean-up of machine 271.
J. to the explanation of isolator 291,292
As long as the test pallet that isolator 291,292 will can move from mobile chamber 210 to test chamber 241~248 TT isolates with extraneous air and (more particularly, the electronic unit moved together with test pallet isolated with extraneous air), It then can be configured to any form.
In the present embodiment, shifting of the isolator 291,292 with encirclement positioned at the first chamber part 211 of mobile chamber 210 Dynamic hole LH1、RH1Mode be arranged at mobile chamber 210.Obviously, according to performance, can also preferably consider in test chamber Room 241~248 sets 8 isolators.
As shown in figure 14, in the present embodiment, isolator 291 can be made up of bellows WT and coupling collar CR.
Bellows WT side is incorporated into mobile chamber 210, is configured to the form shunk and expanded in the lateral direction, The passage that test pallet TT can pass through is internally formed at it.
Coupling collar CR is made up of magnetic and is configured at bellows WT left-hand ends.As shown in figure 15, this coupling collar 291b When the electromagnet EM positioned at test chamber 241 is magnetized, magnetic force is incorporated into the right side wall of test chamber 241.Accordingly, testing The moving hole LH of the switch hole (OH) of chamber 241 and mobile chamber 2101Between, it is formed through bellows WT and empty with outside The mobile route MW for the test pallet TT that sealing gland is closed.This isolator 291 plays prevents heat or cold air from losing to greatest extent Effect.Especially, in low-temperature test, moved by preventing from being in from first chamber part 211 to test chamber 241~248 During the test pallet (TT, including the electronic unit of preloading) for assimilating into low temperature caused by condensation, can prevent from tying The damage of electronic unit caused by dew.
The isolator of symbol 292 is that direction is different from the isolator of symbol 291 and other structures are identical, therefore saves Slightly its explanation.
As reference, in first chamber part 211, conduct heating chamber plays a role and second chamber part 212 turns into envelope The structure closed and in the example that is played a role as cooling chamber, isolator should the left and right sides of first chamber part 211 with The each side configuration of second chamber part 212 1 and configure 4 altogether.That is, may not be needed when only carrying out normal temperature test Isolator including bellows, but when needing to be tested at a predetermined temperature, it may be necessary to the isolator including bellows. This is due to that the principle that frost occurs when the air of cooled object and normal temperature meets may cause including semiconductor The damage of electronic unit including element, therefore isolator can be respectively configured in two chambers part 211,212 as needed Or in all configuration isolation devices of two chambers part 211,212.For example, when carrying out normal temperature test, it is not necessary to isolator, mobile cavity Room can also be all formed as style of opening also without two chambers part is divided into, even if two chambers part is divided into.This In the case of, mobile chamber does not have temp regulating function, therefore can only play the effect of transfer test pallet.In addition, surveyed in low temperature In the case of examination, two chambers part needs to be respectively provided with the structure of closing, and in order to prevent dew condensation phenomenon, two chambers part is equal Need configuration isolation device.
3. refer to item
A. symbol A is loading car, and symbol B is unloading car.
Loading car A can be with the multiple client's pallets of preloading, and are releasably installed on separator 200.Obviously, heap is loaded in dress Carry client's pallet CT with car A1On be mounted with electronic unit to be tested.Now, loading is installed to separator 200 with car A Technology in loading car A with making client's pallet CT1The technology of circulation, the applicant pass through korean patent application 10-2016- No. 0026482 offer, therefore description is omitted.
Unloading car B can also the multiple client's pallet CT of preloading2, and releasably it is installed on separator 100.This unloading The client's pallet CT for the electronic unit for completing test is carried with car B heaps2。
It is obvious also possible to consider to substitute loading car A or unloading car B and configure the loading for being substantially installed on separator With stacker or unloading stacker, supply or the retracting device for configuring other different modes are also can contemplate completely.
B. the electronic unit that substandard products are judged as preloading is configured with unloader box (C, Unloader Bin Box) Client's pallet CT3。
C. separator 200 can also possess according to selection and the buffer table BT of interim preloading electronic unit or for identifying electricity Identifier (BR, such as bar code reader) of subassembly etc..
D. as it was previously stated, test pallet TT has the grip hole GH for being inserted into grasping pin GP, and can be according to the ministry of electronics industry The species of part and there are a variety of preloading structures.Test pallet TT on this diversified forms passes through KR published patent 10- No. 2011-0136312, the existing patent document offer such as No. 10-2008-0040654, therefore the description thereof will be omitted.
E. in addition, in the present embodiment, using first chamber part 211 as the thermal processing chamber (Soak for applying thermal stress Chamber) use, using second chamber part 212 as the processing chamber housing (Desoak that brings down a fever for eliminating applied thermal stress Chamber) use.Also, configure having heaters HT and refrigerating module CM in first chamber part 211.
But according to performance, can be configured to first chamber part and second chamber part can inside it The structure of closing, in this case, for example, it is also possible to heater is configured in first chamber part, and in second chamber part It is equipped with refrigerating module.During using this example, in high temperature test, first chamber part play a part of thermal processing chamber and Two chamber portions act processing chamber housing of bringing down a fever, and in low-temperature test, thermal processing chamber is played a part of in second chamber part And processing chamber housing of bringing down a fever is acted in first chamber part.
4. job description
Loading machine 271 is by electronic unit from client's pallet CT positioned at loading car A top sides1Move into place in loading position Put LP test pallet TT.Now, the first opening machine 281 makes test pallet TT maintain open state.Also, loading machine 271 exists During mobile electron part, the electronic unit for making to be grasped electrically connects with driving tester DT, so as to testing electronic parts Whether it is electrically driven.Electric drive electronic unit of problems is determined in the process is dumped be downloaded to buffer table BT, and it is good Electronic unit be moved to test pallet TT.Obviously, during electronic unit moves by loading machine 271, also pass through Electronic unit is identified identifier DA, therefore can carry out an other history management to electronic unit.
In addition, after electronic unit has been loaded to " loaded " position LP test pallet TT, symbol 261a the first movement Device works and " loaded " position LP test pallet TT is moved to the inside of first chamber part 211.Accordingly, heap is loaded in test Pallet TT electronic unit starts the internal temperature environment assimilation to first chamber part 211.At the same time, mobile chamber 210 Moved to the empty side of test chamber 241,242,243,244,245,246,247,248 at present, the first mobile device 261a or Person 261b work and make test pallet TT from first chamber part 211 be moved to test chamber 241,242,243,244,245, 246、247、248.Now, isolator 291,292 is (especially, first between mobile chamber 210 and test chamber 241~248 Between part of detecting and test chamber) formed can make test pallet TT move closing mobile route MW.Also, collecting is arrived The test pallet TT of test chamber 241~248 is in the state grasped by holding part GE, and pressurized source PS works and makes test Pallet TT declines to tester (TESTER) side.If test pallet TT decline terminates, test pallet TT electricity is loaded into Subassembly electrically connects with tester (TESTER), in this state, carries out the test to electronic unit.
In addition, if the test to electronic unit terminates, then connector 251,252,253,254,255,256,257,258 Test pallet TT is set to increase, and the second mobile device 262a or 262b works and make test pallet TT to second chamber part 212 movements.Now, mobile chamber 210 is in the state declined by lift 220, therefore the movement of second chamber part 212 Hole LH2、RH2Positioned at position corresponding with the switch hole OH of test chamber 241,242,243,244,245,246,247.Then, such as Fruit test pallet TT terminates to the movement inside second chamber part 212, then moves chamber 210 and move forwards and be located at unloading Position UP left side, in this state, symbol 262b the second mobile device work and make test pallet TT to unloading position UP is moved.Then, the work of unloader 272 makes electronic unit from the test pallet TT positioned at unloading position UP to positioned at unloading car Empty client's pallet CT on the upside of B2It is mobile.Now, the electronic unit for being judged as substandard products is dumped the visitor being loaded in positioned at unloader box C Family pallet CT3。
<Second embodiment>
Figure 16 is the conceptual plan to separator 300 according to the second embodiment of the present invention.
Included according to the separator 300 of the present embodiment：Mobile chamber 310；Lift 320；Transfer device 330；8 test chambers Room 341~348；8 connectors 351~358；2 the first mobile devices 361a, 361b；2 the second mobile device 362a, 362b；Loading/unloader 370；First opens machine 381；Second opens machine 382；Drive tester DT；2 isolators 391, 392.Wherein, mobile chamber 310, lift 320, the transfer test chamber 341~348,8 of device 330,8 connector 351~ 358th, 2 first mobile device 361a, 361b, 2 second mobile device 362a, 362b, first open machine 381, second and opened Machine 382, driving tester DT, the structure of 2 isolators 391,392 and function respectively with the separator according to first embodiment 200 mobile chamber 210, lift 220, the transfer connector 251~258,2 of test chamber 241~248,8 of device 230,8 Individual first mobile device 261a, 261b, 2 second mobile device 262a, 262b, first open machine 281, second open machine 282, Drive tester DT, 2 isolators 291,292 identical, therefore the description thereof will be omitted.
But in the separator 300 according to the present embodiment, " loaded " position LP and unloading position UP is not distinguished and divided For first position 1P and second place 2P.Also, first position 1P and second place 2P can be according to loading/unloader 370 Working condition and be converted into " loaded " position or unloading position.That is, loading/unloader 370 loads electronic unit to be tested To the empty test pallet TT positioned at first position 1P or second place 2P, or from positioned at first position 1P or second place 2P Heap be loaded with complete test electronic unit test pallet TT unloading electronic unit.
In the separator 300 according to the present embodiment, to minimize the mobile route of loading/unloader 370, preferably drive Dynamic tester DT is configured at the front of mobile chamber 310.Obviously, driving tester can also be equipped with two or more.
Also, according to performance, it is also contemplated that loading/unloader is divided into the first picking machine (Picking Machine) with the second picking machine (Picking machine) and configure, in this case it is necessary to carry out preventing the first picking The control method of work interference or the separate design of working region between machine and the second picking machine.
<To the variation of second embodiment>
Figure 17 is the conceptual plan to the separator 400 of deformation according to the second embodiment of the present invention.
In Figure 17 variation, do not configure unloading car separately and by 3 unloader box C1、C2、C3In the plane to along a left side Right direction is arranged in a row, classifies so as to the non-defective unit in the electronic unit that will be unloaded from test pallet TT and substandard products.Also, Non-defective unit further can also be categorized as each grade.
<3rd embodiment>
Figure 18 is the conceptual plan to the separator 500 of the 3rd embodiment according to the present invention.
Included according to the separator 500 of the present embodiment：House chamber 510；Lift 520；Test chamber 540；Connector 550；First mobile device 561a, 561b；Second mobile device 562a, 562b；Loading/unloader 570 and open machine 580.
In the present embodiment, the front that chamber 510 is located at test chamber 540 is housed.
But housing chamber 510 has being divided into the vertical direction by divider wall as first embodiment The state of first chamber part and second chamber part is in the structure being arranged side-by-side along the vertical direction.That is, first chamber part with Second chamber part is combined as a whole and forms a collecting chamber 510.Collecting chamber 510 in the present embodiment does not move forwards, backwards It is dynamic, and can only be lifted by lift 520.
Remaining composition is lift 520, test chamber 540, connector 550, first mobile device 561a, 561b, Two mobile device 562a, 562b, loading/unloader 570 and open machine 580 and the separator 300 in second embodiment liter Drop machine 320, test chamber 341 to 348, connector 351 to 358, first mobile device 361a, 361b, the second mobile device 362a, 362b, loading/unloader 370 and open machine 380 are identical, therefore the description thereof will be omitted.
As reference, Figure 19 shows the situation for setting more Figure 18 separator 300 and using.
In the present embodiment, also in the same manner, apply and housing upper-lower height, the test chamber of chamber 510 and test chamber 540 It is used in room 540 in the case of making structure of test pallet TT liftings etc., lift 520 can also be omitted.
<Fourth embodiment>
The present embodiment is to enable test pallet TT movement smoothly and make required by electronic unit quickly reaches test Temperature example.
Figure 20 is the conceptual plan to the separator 600 of the 4th embodiment according to the present invention.
Included according to the separator 600 of the present embodiment：Mobile chamber 610；Lift 620；Transfer device 630；8 test chambers Room 641~648；8 connectors 651~658；2 the first mobile devices 661a, 661b；2 the second mobile device 662a, 662b；Loading and unloader 670；First opens machine 681；Second opens machine 682；Drive tester DT；2 isolators 691, 692.In addition, it is configured with according to the separator 600 of the present embodiment between the first opening machine 681 and the test chamber of symbol 641 First buffer chamber BC1, the second buffer chamber BC2 is configured between the second opening machine 682 and the test chamber of symbol 645.
In being formed more than, mobile chamber 610, lift 620, the transfer test chamber 641~648,8 of device 630,8 651~658,2 first mobile device 661a, 661b of connector, 2 second mobile device 662a, 662b, first open machine 681st, second open machine 682, drive tester DT, the composition of 2 isolators 691,692 actually real with first respectively with acting on Apply mobile chamber 210 in example, lift 220, the transfer test chamber 241~248,8 of device 230,8 connector 251~ 258th, 2 first mobile device 261a, 261b, 2 second mobile device 262a, 262b, first open machine 281, second and opened Machine 282, driving tester DT, 2 isolators 291,292 are identical, therefore the description thereof will be omitted.
Load and unloader 670 will be located at client's pallet CT1Electronic unit move into place in " loaded " position LP test Pallet TT and client's pallet CT that electronic unit is moved to sky from the test pallet TT positioned at unloading position UP2、CT3.This dress The loading machine 271 and unloader 272 of load and unloader 670 also with first embodiment play identical.I.e., it is possible to according to be branch The specification that the specification quickly tested still is supported to test at a slow speed is held, it is as in the present embodiment by one that can properly select Load and unloader 670 complete to load and unloading or be divided into such as first embodiment loading machine 271 and unloader 272 carry out and Design equipment.
First buffer chamber BC1 house preloading is complete should be in the test support for the electronic unit that " loaded " position LP is tested After disk TT, waited before mobile chamber 610 is moved to.Certainly, such as KR published patent 10-2008-0082591 Number, it is possible to achieve it is to house multiple test pallet TT in the first buffer chamber BC1 and make the parallel shiftings of test pallet TT being received It is dynamic.
Also, the first buffer chamber BC1 is configured to provide the temperature environment according to test condition.In such case Under, when carrying out high temperature test, high temperature, when carrying out low-temperature test, the first buffer chamber are maintained inside the first buffer chamber BC1 Low temperature is maintained inside BC1.
In the second buffer chamber BC2, heap is loaded with the test pallet of the electronic unit of the completion test from mobile chamber 610 TT is received and standby before being moved to unloading position UP.This second buffer chamber BC2 is configured to from from movement The electronic unit that the heap of chamber 610 is loaded in test pallet TT eliminates thermostimulation.Equally, the second buffer chamber can also be configured to Enough house more than one test pallet TT.
If it is configured to control by the first buffer chamber BC1 and the second buffer chamber BC2 for being configured to fixed chamber The temperature of electronic unit, then it can save electronic unit and rest on the time of mobile chamber 610 and improve the profit of mobile chamber 610 With rate.Therefore, with only control electricity by also performing loading and transferring the function of electronic unit and transportable mobile chamber 210 The first embodiment of the temperature of subassembly is compared, and can more be quickly removed test pallet TT, therefore can be increased processing and be held Amount.
Hereinafter, continue to being illustrated as described above according to the work of the separator 600 of the present embodiment.
If heap will be loaded with it is loaded with client's pallet CT of electronic unit1Loading be installed to separator 600 with car A, then fill Carry and unloader 670 by electronic unit from client's pallet CT positioned at loading car A top side1Move into place in " loaded " position LP test pallet TT.In the process, load and unloader 670 can pass through identifier BR and driving tester DT, accordingly, electricity After subassembly is identified device BR identifications, by driving tester DT to complete 1 test, electronic unit is according to 1 test by once Sieved for substandard products whether.Now, the electronic unit for being judged as substandard products is dumped and is downloaded to buffer table BT
Electronic unit is being loaded into after " loaded " position LP test pallet TT is finished, test pallet TT is to first Buffer chamber BC1 is mobile and standby, is then moved to mobile chamber 610.Then, test pallet TT is together with mobile chamber 610 Test chamber 641~648 is supplied to after to the side of test chamber 641~648 movement of sky, in test chamber 641~648 Heap is loaded in 2 tests of test pallet TT electronic unit.If 2 tests to electronic unit terminate, test Pallet TT re-moves mobile chamber 610, then mobile to the second buffer chamber BC2 and wait, then to unloading position UP It is mobile.Also, if all electronic units are unloaded from the test pallet TT positioned at unloading position UP by loading and unloader 670 Carry, then test pallet TT is moved to " loaded " position LP from unloading position UP.Obviously, by load and unloader 670 and from positioned at The electronic unit of unloading position UP test pallet TT unloadings, can move into place empty client's pallet on the upside of unloading car B CT2Or it is judged as the electronic units of substandard products and moves into place client's pallet CT in unloader box C3。
The confirmation to electronic unit and driving test process can be increased as reference, during loading, and to electronic unit The time of application thermostimulation is longer than the time that thermostimulation is eliminated from electronic unit, therefore can preferably consider that being configured to first delays Rush chamber BC1 and house more test pallet TT than the second buffer chamber BC2.
Such as the present embodiment, if configuring the first buffer chamber BC1 and the second buffer chamber BC2, can be carried according to control Rise the design freedom to mobile chamber 610.
For example, as described below, when carrying out low-temperature test, mobile chamber can be assimilated by the first buffer chamber BC1 610 temperature.
When carrying out low-temperature test, the first buffer chamber BC1's is internally formed as the temperature of -40 degree.If mobile chamber 610 are located at the first buffer chamber BC1 side, then isolator 691 works and opens the first buffer chamber BC1 and mobile chamber Passage between 610.At the moment, the door of the door and the first buffer chamber BC1 of mobile chamber 610 is closed.
Air themperature in passage is sensed by sensing, and the door of the first buffer chamber BC1 and mobile chamber 610 is with 2 Individual step work.
Firstly, it is necessary to the inside temperature by the internal temperature for the passage opened by isolator 691 and the first buffer chamber BC1 Spend the process of assimilation.Therefore, the degree that the temperature of passage can be assimilated to additional injection inside the first buffer chamber BC1 Cryogenic gas.Then, the first buffer chamber BC1 door is slightly opened as first step, and adds the buffering of injection first Cryogenic gas inside chamber BC1 is that the passage opened by isolator 691 is assimilated into required low temperature (- 40 degree or root It is the temperature more slightly lower than -40 degree according to situation) play a role.That is, the passage opened by isolator 691, because with passing through The opening slightly opened and the additional degree for flowing into amount required corresponding to the first buffer chamber BC1 cryogenic gas it is quick Mobile cold air, the first buffer chamber BC1 internal temperature is assimilated into rapidly.Obviously, the now door of first chamber 610 Remain off state.
If the passage opened due to sensing by isolator 691 is assimilated as required low temperature, the first cushion chamber Room BC1 door opens to second step completely, and needs to be enough the low temperature for being allowed to assimilate into the internal temperature of mobile chamber 610 Gas, therefore add supply cryogenic gas to the first buffer chamber BC1.After the cryogenic gas of injection sufficient amount, mobile cavity The door of room 610 is opened, and the inside of mobile chamber 610 also begins to the internal temperature assimilation to buffer chamber BC1.Obviously, now The internal temperature of sensing movement chamber 610.Also, according to the convection phenomena as caused by draught head and temperature difference, mobile chamber 610 Internal temperature be rapidly reduced to required low temperature.Herein, the door of mobile chamber 610 can also be by 2 steps more than Step is opened.Here, in the state of the first buffer chamber BC1 doors are slightly opened, can also be first by the inside of mobile chamber 610 Temperature assimilates into required low temperature and then opens the first buffer chamber BC1 door completely.According to performance, mobile cavity The door of room 610 can also be configured to open completely in first step.
Also, if the inside of mobile chamber 610 assimilates as required low temperature, then by test pallet TT from the first cushion chamber Room BC1 is moved to mobile chamber 610.
That is, according to this example, mobile chamber 610 is moved to from the inside of the first buffer chamber BC1 in test pallet TT Before, by the passage of the closing formed between the first buffer chamber BC1 and mobile chamber 610 by isolator 691, first The Warm status of buffer chamber BC1 inside is delivered to rapidly the inside of mobile chamber 610, so that inside mobile chamber 610 Temperature assimilates as the temperature inside the first buffer chamber BC1.
If as described above, the internal temperature of mobile chamber 610 to be assimilated into the first buffer chamber BC1 internal temperature, Then in mobile chamber 610 without separately configuring cooler or Air Blast fan.In such examples, can preferably consider, Also using in the first buffer chamber BC1 with more than and mobile chamber 610 between test chamber 641~648 and mobile chamber 610 Temprature control method identical temprature control method.Obviously, in the case of according to this example, mobile chamber 610 every It is hot further to be strengthened.
As reference, the process cooled down in above example to injection cryogenic gas (such as LN2 gases) is said It is bright, but can also take into full account and supply cold air by using the cooling system of other compressor and evaporator and cool down first Buffer chamber BC1 inside.
And then illustrated above with respect to temperature controlled example by taking low-temperature test as an example, but when implementing in high temperature Can also similarly it be applied completely in test.
<Additional example>
1. the lifting of test chamber
In the above-described embodiment, mobile chamber and test chamber are mainly realized by lifting moving chamber 210,310,610 The movement of test pallet TT between room.But according to performance, also completely it is contemplated that not making to move chamber lifting and make Test chamber lifts.
2. the lifting of the test pallet in test chamber
Also, by making test pallet TT rise inside test chamber, so as to realize test pallet TT in movement Movement between chamber and test chamber.For example, can take does not make to move chamber lifting and make to be moved to test chamber The structure that the test pallet of underside area rises and taken out of in upper-side area.This structure can realize by the following method, After the test of the electronic unit to being loaded into test pallet terminates, the rising machine that test pallet can be made to increase is formed.Figure 21 show to be used for the simplest example for rising machine for making test pallet increase in test chamber.(a) of reference picture 21 with (b), rising machine UA includes a pair of supporting table UB with rising source UF.
Supporting table UB supports the test pallet TT for being moved to underside area.Now, it is preferably, supporting table UB is configured to It is enough guide test pallet TT it is mobile while the shape of supporting track that is supported.Also, between two supporting table UB Electronic unit is electrically connected to the connector of tester it can make to be loaded in test pallet TT electronic unit as to be used in and connect The operation window OW for being connected to tester and working plays a role.Obviously, two supporting table UB can maintain operation window OW's In the range of, it is connected one to the other to other supporting table SB.
As illustrated, rise source UF most simply can be made up of cylinder, but can also be made up of motor.
And then electronic unit is being pressurized to so that electronic unit by tester side by lifting work using connector , can be with excellent compared to the other rising sources of machine UA configurations are being risen in the case of the conventional general structure for being electrically connected to tester Selection of land considers to make test pallet TT increase using the lifting power of connector, compared with.Obviously, in this case, as long as Two supporting tables are made to be arranged at the structure of connector and the lifting of lifting one with connector.Also, now, as going Except two supporting tables in other lifting sources, lift UA composition can also be completed.
In this example, used in the lower portion of mobile chamber as the soak portion for applying thermal stress to electronic unit, Soak portion is moved back in use, can preferably apply as the thermal stress released to electronic unit application in upper portion.This In example, the movement of the electronic unit between mobile chamber and test chamber is carried out in the following order：In the downside of mobile chamber After being partially converted to the electronic unit of high temperature or low temperature and being moved to test chamber to be loaded in test pallet TT state, complete to survey Rise during examination by lift and taken out of to mobile chamber.
As described above, the present invention is illustrated by referring to the embodiment of accompanying drawing, but described embodiment is only It is the explanation to the preferred exemplary of the present invention, it is impossible to be interpreted as present invention is limited only to above-described embodiment, interest field of the invention It is interpreted as claims and its equivalency range.

Claims (13)

  1. A kind of 1. separator for testing electronic parts, it is characterised in that including：
    Mobile chamber, can house the test pallet that heap is loaded with electronic unit, and move along predetermined mobile route；
    Device is transferred, the mobile chamber is transferred on the mobile route；
    Connector, be configured at least side of the mobile route, with can be received from the mobile chamber test pallet or to The mobile chamber provides test pallet, also, electronic unit is electrically connected or is solved with being incorporated into the tester of test window Except connection, can carry out being loaded in heap the test of the electrology characteristic of the electronic unit of test pallet；And
    At least one mobile device, test pallet is set to be moved between the mobile chamber and the connector.
  2. 2. the separator according to claim 1 for testing electronic parts, it is characterised in that
    At least one mobile device is arranged on the mobile chamber and moved together with the mobile chamber.
  3. 3. the separator according to claim 1 for testing electronic parts, it is characterised in that
    The mobile chamber, including：
    First chamber part, the temperature for being loaded in the electronic unit of test pallet for adjusting heap；And
    Second chamber part, it is arranged side-by-side along the vertical direction with the first chamber part, heap is loaded in the electronics of test pallet The temperature of part is recovered to normal temperature,
    The first chamber part is isolated wall with the inside of the second chamber part and separated each other.
  4. 4. the separator according to claim 3 for testing electronic parts, it is characterised in that
    The first chamber part includes：Switch gate, by for receiving positioned at the test pallet of " loaded " position or to the company The first moving hole switch of device transmission test pallet is connect,
    The second chamber part includes：Second moving hole, institute is come from for transmitting test pallet to unloading position or receiving The test pallet of connector is stated,
    The inside of the second chamber part passes through the second moving hole and ft connection.
  5. 5. the separator according to claim 3 for testing electronic parts, it is characterised in that
    Also include：Lift, by making the mobile chamber lifting be at can be from first chamber part to the company The position of device transmission test pallet is connect, or test pallet can be received from the connector in the second chamber part Position.
  6. 6. the separator according to claim 3 for testing electronic parts, it is characterised in that
    Also include：Rising machine, risen by the test pallet for making to be moved to test chamber from the first chamber part, and made Test pallet equipped with the electronic unit for completing test, which can take out of, to be configured at described in the upside of the first chamber part Second chamber part.
  7. 7. the separator according to claim 1 for testing electronic parts, it is characterised in that
    The test window is multiple, and each in multiple test windows is each configured with the connector.
  8. 8. the separator according to claim 7 for testing electronic parts, it is characterised in that
    Also include：Multiple test chambers, the test pallet from the mobile chamber is housed, and be configured at each test window side To maintain the test temperature condition of electronic unit,
    The mobile chamber has one-to-many quantitative relation with the test chamber.
  9. 9. the separator according to claim 7 for testing electronic parts, it is characterised in that
    The multiple connector is respectively arranged at the both sides of the mobile route.
  10. 10. the separator according to claim 1 for testing electronic parts, it is characterised in that also include：
    Test chamber, the test pallet from the mobile chamber is housed, and heap is loaded in the electronics of the test pallet being received The temperature of part maintains test temperature condition；And
    Isolator, for isolating the electricity being located at from the test pallet on the path that the mobile chamber moves to the test chamber Subassembly and extraneous air.
  11. 11. the separator according to claim 1 for testing electronic parts, it is characterised in that also include：
    First buffer chamber, there is the test pallet of electronic unit to be tested to be treated before being moved to the mobile chamber in preloading Machine；And
    Second buffer chamber, house the heap from the mobile chamber and be loaded with the test pallet for the electronic unit for having completed test simultaneously Make its standby,
    First buffer chamber is configured to fixed with the second buffer chamber.
  12. 12. the separator according to claim 11 for testing electronic parts, it is characterised in that
    Before test pallet moves from the inside of first buffer chamber to the inside of the mobile chamber, described first is slow Rush the Warm status of chamber interior by the passage for the closing being formed between first buffer chamber and the mobile chamber and The inside of the mobile chamber is delivered to, and the temperature of the mobile chamber interior is assimilated into inside first buffer chamber Temperature.
  13. A kind of 13. separator for testing electronic parts, it is characterised in that including：
    Chamber is housed, the test pallet that heap is loaded with electronic unit can be housed；
    Connector, it is configured to receive test pallet from the collecting chamber or tests support to the collecting chamber transmission Disk, electronic unit is set to electrically connect or release connection with being incorporated into the tester of test window, can carry out being loaded in heap survey The electrology characteristic test of the electronic unit of pallet is tried, and is configured at the side of the collecting chamber；And
    Multiple mobile devices, test pallet is set to be moved between the collecting chamber and the connector,
    The collecting chamber includes：
    First chamber part, the temperature for being loaded in the electronic unit of test pallet for adjusting heap；And
    Second chamber part, with first chamber part integratedly with reference to and be arranged side-by-side, it is internal with described first chamber part Separated by divider wall, for making the temperature of electronic unit that heap is loaded in test pallet recover to normal temperature,
    It is described that a part of mobile device in the multiple mobile device makes test pallet be partially moved to from the first chamber Connector, another part mobile device make test pallet be moved to the second chamber part from the connector,
    The first chamber part and the second chamber part along the vertical direction on be arranged side-by-side.
CN201710805550.4A 2016-09-09 2017-09-08 Sorting machine for testing electronic components Active CN107807296B (en)

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KR10-2016-0116620 2016-09-09
KR20160116620 2016-09-09
KR1020170000801A KR102664951B1 (en) 2016-09-09 2017-01-03 Handler for testing electronic devices
KR10-2017-0000801 2017-01-03

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Cited By (4)

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Publication number Priority date Publication date Assignee Title
CN110391163A (en) * 2019-04-09 2019-10-29 南宁聚信众信息技术咨询有限公司 A kind of chip sorting equipment easy to operate for wafer working process
CN112275657A (en) * 2020-10-13 2021-01-29 珠海市科迪电子科技有限公司 Multi-face size measuring method
CN114192441A (en) * 2018-12-11 2022-03-18 泰克元有限公司 Sorter for testing electronic components
CN114945891A (en) * 2019-12-11 2022-08-26 美光科技公司 Independent thermal chamber for temperature control assembly

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JP2002196042A (en) * 2000-10-10 2002-07-10 Mire Kk Device test handler and its operation method
CN2877897Y (en) * 2005-09-30 2007-03-14 南京熊猫仪器仪表有限公司 Wafer sorting device
CN1989415A (en) * 2004-07-23 2007-06-27 株式会社爱德万测试 Electronic component testing apparatus
CN101470168A (en) * 2007-12-28 2009-07-01 未来产业株式会社 Test handler, method for loading and manufacturing packaged chips
CN103128062A (en) * 2011-11-29 2013-06-05 泰克元有限公司 Test handler and method for operating the same

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JP2002196042A (en) * 2000-10-10 2002-07-10 Mire Kk Device test handler and its operation method
CN1989415A (en) * 2004-07-23 2007-06-27 株式会社爱德万测试 Electronic component testing apparatus
CN2877897Y (en) * 2005-09-30 2007-03-14 南京熊猫仪器仪表有限公司 Wafer sorting device
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Publication number Priority date Publication date Assignee Title
CN114192441A (en) * 2018-12-11 2022-03-18 泰克元有限公司 Sorter for testing electronic components
CN110391163A (en) * 2019-04-09 2019-10-29 南宁聚信众信息技术咨询有限公司 A kind of chip sorting equipment easy to operate for wafer working process
CN114945891A (en) * 2019-12-11 2022-08-26 美光科技公司 Independent thermal chamber for temperature control assembly
CN114945891B (en) * 2019-12-11 2023-11-24 美光科技公司 Independent thermal chamber for temperature control assembly
CN112275657A (en) * 2020-10-13 2021-01-29 珠海市科迪电子科技有限公司 Multi-face size measuring method

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