CN107591186A - Voltage x current test automatic switch-over circuit, phase change cells test system and method - Google Patents
Voltage x current test automatic switch-over circuit, phase change cells test system and method Download PDFInfo
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- CN107591186A CN107591186A CN201710749389.3A CN201710749389A CN107591186A CN 107591186 A CN107591186 A CN 107591186A CN 201710749389 A CN201710749389 A CN 201710749389A CN 107591186 A CN107591186 A CN 107591186A
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Abstract
The present invention provides a kind of voltage x current test automatic switch-over circuit, phase change cells test system and method, including：Voltage x current test automatic switch-over circuit with pulse current source module, switch drive module, test mode handover module；Digital sourcemeter；Probe station, the first phase change resistor to be measured and the second phase change resistor to be measured.During voltage tester, voltage x current test automatic switch-over circuit receives pulse voltage signal, and is loaded into the both ends of the first phase change resistor to be measured, and the resistance of the first phase change resistor to be measured is measured by digital sourcemeter；During testing current, voltage x current test automatic switch-over circuit is based on pulse voltage signal and negative DC current signal produces single-pulse current signal, and is loaded into the second phase change resistor to be measured, and the resistance of the second phase change resistor to be measured is measured by digital sourcemeter.Discrete voltage and current test system is synthesized to together by the present invention, realizes the automation of engineering test by the automatic switchover of voltage and current, while reduce noise jamming.
Description
Technical field
The present invention relates to microelectronic, and automatic switch-over circuit, phase change cells are tested more particularly to a kind of voltage x current
Test system and method.
Background technology
The basic functional principle of phase transition storage is phase-change material using based on chalcogenide compound as storage medium,
Phase-change devices unit both ends apply different pulses, are converted by phase-change material between amorphous state and crystalline state and realize that data are deposited
Storage.Phase-change material shows as characteristic of semiconductor in amorphous state, and its resistance shows as high resistant；Semimetal spy is shown as in crystalline state
Property, its resistance is low-resistance.Amorphous state is commonly defined as " RESET " state, and the logical value of corresponding memory cell is " 1 ", corresponding behaviour
As RESET operation；Crystalline state is defined as " SET " state, and the logical value of corresponding memory cell is " 0 ", and corresponding operation is grasped for SET
Make.Resistance difference between SET and RESET state can reach 2~3 orders of magnitude.The basic operation of phase transition storage has three kinds,
Remove outside above-mentioned RESET operation and SET operation, also READ operation.
In PCRAM development, the test of phase-change memory cell contributes to some discrete cells in labor array
Performance.In general, the test of phase-changing memory unit has following several forms：DC current-voltage scanning (I-V
Sweep) test, voltage pulse amplitude-resistance sweep test, current pulse amplitude-resistance scanning (R-I) test, voltage pulse
Width-resistance sweep test, current pulse width-resistance sweep test, fatigue properties test and data retention test etc..
In this several test, both comprising testing current or voltage tester was included, both connect each other but discrete use, discrete voltage
Both it had been unfavorable for the automation of engineering test with current detecting system, and larger noise jamming had again been present, therefore electric current is realized in design
Larger meaning be present in the automatic switch-over circuit of test system and voltage testing system.
The content of the invention
In view of the above the shortcomings that prior art, it is an object of the invention to provide a kind of test of voltage x current to cut automatically
Circuit, phase change cells test system and method are changed, for solving the automation of the test of phase-changing memory unit in the prior art
The problems such as degree is low, and noise jamming is big.
In order to achieve the above objects and other related objects, the present invention provides a kind of voltage x current test automatic switch-over circuit,
The voltage x current test automatic switch-over circuit comprises at least：
Pulse current source module, for producing single-pulse current signal；
Switch drive module, for producing switch controlling signal；
Test mode handover module, the pulse current source module and the switch drive module are connected to, by each switch
The control switch test path of control signal；Pulse voltage signal is exported during voltage tester, exports pulse during testing current
Current signal, measurement path is provided during measurement；
Interface module, draw the input signal and output signal of the voltage x current test automatic switch-over circuit.
Preferably, the voltage x current test automatic switch-over circuit also includes host computer and micro treatment module；It is described upper
Machine sends instruction, controls the micro treatment module to work；The micro treatment module is connected to the host computer, according to described upper
The instruction of machine controls the switch drive module to export corresponding switch controlling signal according to different test patterns.
It is highly preferred that connecting a single supply level switch module between the host computer and the micro treatment module, it is suitable to
The serial ports of RS232 standards.
Preferably, the pulse current source module receives negative DC current signal and pulse voltage signal, in the list
The negative DC current signal is converted into the single-pulse current signal under the driving of pulse voltage signal.
Preferably, the test mode handover module includes first switch, second switch, third switch, the 4th switch, the
Five switches and the 6th switch；The first end connection pulse voltage signal of the first switch, as pulse voltage input end,
Second end connects the first end of the second switch and is used as pulse voltage output end；Second end of the second switch connects
Connect the drive end of the pulse current source module；The first end of 3rd switch connects single-pulse current signal, as simple venation
Current output terminal is rushed, the second end is as the first measurement end；Second end of the first end and the first switch of the 4th switch
Connection, the second end is connected with first measurement end；The first end of 5th switch is as the second measurement end, the second end conduct
Earth terminal；The first end of 6th switch connects the earth terminal, the second end ground connection.
It is highly preferred that each switch is light coupling relay, the switch drive module is light coupling relay drive module.
In order to achieve the above objects and other related objects, the present invention provides a kind of phase change cells test system, the phase transformation
Unit test system comprises at least：
Above-mentioned voltage x current test automatic switch-over circuit, digital sourcemeter, probe station and the first phase change resistor to be measured and second
Phase change resistor to be measured；
Voltage x current test automatic switch-over circuit receives pulse voltage signal and negative DC current signal, and with institute
State probe station, first phase change resistor to be measured and the second phase change resistor connection to be measured；In voltage tester, the voltage
Testing current automatic switch-over circuit provides pulse voltage signal to the described first phase change resistor to be measured；In testing current, institute
State voltage x current and test automatic switch-over circuit to the described second phase change resistor offer single-pulse current signal to be measured；In measurement,
The digital sourcemeter is connected to the described first phase change resistor to be measured or described the by voltage x current test automatic switch-over circuit
The both ends of two phase change resistors to be measured；
The probe station and voltage x current test automatic switch-over circuit, the digital sourcemeter, first phase to be measured
Become resistance and the second phase change resistor to be measured connection, for by probe by the described first phase change resistor to be measured or described second
Phase change resistor to be measured tests automatic switch-over circuit with the voltage x current or the digital sourcemeter is connected.
Preferably, the pulse voltage input end of the voltage x current test automatic switch-over circuit receives pulse voltage letter
Number, bear DC current input and receive negative DC current signal, pulse voltage output end connects the pulse electricity of the probe station
Input is pressed, single-pulse current output end connects the pulse current input of the probe station, and the first test lead connects the number
The first end of word source table, the second test lead connect the second end of the digital sourcemeter, and earth terminal connects the ground connection of the probe station
End.
It is highly preferred that first phase change resistor to be measured is connected to the pulse voltage input of the probe station and the spy
Between the earth terminal of pin platform, second phase change resistor to be measured is connected to the pulse current input of the probe station and the spy
Between the earth terminal of pin platform.
In order to achieve the above objects and other related objects, the present invention provides the test side of above-mentioned phase change cells test system
Method, the phase change cells test system method include：
During voltage tester, voltage x current test automatic switch-over circuit receives pulse voltage signal, and by the list
Pulse voltage signal is loaded into the both ends of the first phase change resistor to be measured, and digital sourcemeter then is parallel into the described first phase transformation to be measured
The both ends of resistance, measure the resistance of first phase change resistor to be measured；
During testing current, the voltage x current test automatic switch-over circuit receives the pulse voltage signal and negative direct current
Current signal, single-pulse current signal is produced based on the pulse voltage signal and the negative DC current signal, by described in
Then the digital sourcemeter is parallel to the described second phase transformation to be measured by single-pulse current signal loading to the second phase change resistor to be measured
The both ends of resistance, measure the resistance of second phase change resistor to be measured.
Preferably, measuring first phase change resistor to be measured or the resistance step of second phase change resistor to be measured includes：
DC voltage is applied to the described first phase change resistor to be measured or second phase change resistor to be measured, measurement flows through described
The electric current of first phase change resistor to be measured or second phase change resistor to be measured, and then obtain the described first phase change resistor to be measured or institute
State the resistance of the second phase change resistor to be measured.
As described above, voltage x current test automatic switch-over circuit, phase change cells test system and the method for the present invention, have
Following beneficial effect：
The voltage x current test automatic switch-over circuit of the present invention, phase change cells test system and method by discrete voltage and
Current detecting system is synthesized to together, is realized the automation of engineering test by the automatic switchover of voltage and current, is reduced simultaneously
Noise jamming.
Brief description of the drawings
Fig. 1 is shown as the structural representation of the voltage x current test automatic switch-over circuit of the present invention.
Fig. 2 is shown as the structural representation of the phase change cells test system of the present invention.
Fig. 3 is shown as the principle schematic of the phase change cells method of testing of the present invention.
Component label instructions
1 voltage x current tests automatic switch-over circuit
11 pulse current source modules
12 host computers
13 single supply level switch modules
14 micro treatment modules
15 switch drive modules
16 test mode handover modules
17 interface modules
2 pulse voltage signal generators
3 gpib bus
4 digital sourcemeters
5 probe stations
6 devices
61 first phase change resistors to be measured
62 second phase change resistors to be measured
Embodiment
Illustrate embodiments of the present invention below by way of specific instantiation, those skilled in the art can be by this specification
Disclosed content understands other advantages and effect of the present invention easily.The present invention can also pass through specific realities different in addition
The mode of applying is embodied or practiced, the various details in this specification can also be based on different viewpoints with application, without departing from
Various modifications or alterations are carried out under the spirit of the present invention.
Refer to Fig. 1~Fig. 3.It should be noted that the diagram provided in the present embodiment only illustrates this in a schematic way
The basic conception of invention, the component relevant with the present invention is only shown in schema then rather than according to package count during actual implement
Mesh, shape and size are drawn, and kenel, quantity and the ratio of each component can be a kind of random change during its actual implementation, and its
Assembly layout kenel may also be increasingly complex.
Embodiment one
As shown in figure 1, the present invention provides a kind of voltage x current test automatic switch-over circuit 1, the voltage x current test is certainly
Dynamic switching circuit comprises at least 1：
Pulse current source module 11, host computer 12, single supply level switch module 13, micro treatment module 14, switch drive
Module 15, test mode handover module 16 and interface module 17.
As shown in figure 1, the pulse current source module 11 receives negative DC current signal and pulse voltage signal, in institute
State the negative DC current signal under the driving of pulse voltage signal and be converted into the single-pulse current signal.
Specifically, in the present embodiment, the pulse current source module 11 includes first input end Rext1, the second input
Hold Rext2, the first output end Idata1, the second output end Idata2, drive end Data, Enable Pin En, power end Vdd and ground terminal
Gnd, wherein, first input end Rext1 and the second input Rext2 receive negative DC current respectively, and drive end Data receives single
Pulse voltage signal, and produce single-pulse current signal in the first output end Idata1 and the second output end Idata2；Power end
Vdd connection supply voltages, are set as 2.6V~6.5V, and in the present embodiment, the supply voltage is set as 5V；In the present embodiment
In, Enable Pin En works in high level, and high level is set as the supply voltage；Ground terminal Gnd is grounded；In the present embodiment,
Single-pulse current signal all the way is only needed to use, therefore, the second input Rext2 is grounded, and the second output end Idata2 is hanging.It is negative
DC current signal obtains single-pulse current signal, the corresponding output electricity of an input current based on pulse voltage signal
Stream, the stability of output pulse current source is ensured with this,
More specifically, the opening and closing of pulse voltage signal control single-pulse current signal, to form pulse signal,
When the pulse voltage is high level, single-pulse current signal is opened；When the pulse voltage signal is low level,
The single-pulse current signal-off, and then determine the pulse width of the single-pulse current signal.The single-pulse current letter
Number pulse width it is identical with the pulse width of the pulse voltage signal.By the arteries and veins for setting the pulse voltage signal
Width is rushed to obtain the pulse width of default single-pulse current signal, in the present embodiment, the pulse voltage signal is
Nanosecond voltage pulse, it is 10MHz, pulse width 200ns that it, which controls frequency setting,.
More specifically, the size of the single-pulse current signal is relevant with the size of the negative DC current signal, can lead to
The setting for crossing ratio obtains default output current value, in the present embodiment, the size of the single-pulse current signal with it is described
The size ratio of negative DC current signal is 4：1.Setting ratio can be needed according to different, be not limited with the present embodiment.
In the present embodiment, the electric current for the single-pulse current signal that the pulse current source module 11 exports may be up to
10mA, output pulse width as little as 100ns, the testing current suitable for PCRAM device cells are analyzed.The pulse current source module
11 can use the hardware circuit for producing single-pulse current signal arbitrarily under the driving of pulse voltage signal or software to realize, can
The size and pulse width of the single-pulse current signal are set according to different application scenarios, are not limited with the present embodiment.
As shown in figure 1, the host computer 12 is used to send control command.
Specifically, in the present embodiment, the host computer 12 is realized using computer.
As shown in figure 1, the single supply level switch module 13 is connected to the host computer 12 and the micro treatment module
Between 14, for carrying out level conversion.
Specifically, in the present embodiment, the single supply level switch module 13 is realized using MAX232 chips, is suitable to
The serial ports of RS232 standards.
As shown in figure 1, the micro treatment module 14 is connected to the single supply level switch module 13, receives and turn through level
The control instruction that the host computer 12 after changing is sent, the switch drive module 15 is controlled according to the instruction of the host computer 12
Corresponding switch controlling signal is exported according to different test patterns.
Specifically, in the present embodiment, the micro treatment module 14 uses 89C51 chip microcontrollers.
As shown in figure 1, the switch drive module 15 connects the micro treatment module 14, control letter is switched for producing
Number.
Specifically, in the present embodiment, the switch drive module 15 is light coupling relay drive module, is used
ULN2003 chips are realized.The switch drive module 15 receives the control signal of the 89C51 single-chip microcomputers output, produces driving
The switch controlling signal of the test mode handover module 16.Because the carrying load ability of the 89C51 single-chip microcomputers is weaker, because
This needs ULN2003 chips to realize driving function, in addition in the external pull-up resistor of input of ULN2003 chips, in this reality
Apply in example, the resistance of pull-up resistor is set as 10Kohm, can set the resistance of pull-up resistor as needed in actual use, no
It is limited with the present embodiment.In the present embodiment, ULN2003 chips are high withstand voltage, high current Darlington series, by seven silicon NPN
Darlington transistor forms, and has the characteristics that current gain is high, operating voltage is high, temperature range is wide, carrying load ability is strong, is adapted to each
The system that class requires high-speed high-power driving.
As shown in figure 1, the test mode handover module 16 is connected to the pulse current source module 11 and the switch
Drive module 15, by the control switch test path of each switch controlling signal；Pulse voltage signal, electricity are exported during voltage tester
Single-pulse current signal is exported during current test, measurement path is provided during measurement.
Specifically, the test mode handover module 16 includes 6 switches, and in the present embodiment, each switch uses optocoupler
Relay realizes that the device of any achievable switching function is applied to the present invention, is not limited with the present embodiment.More specifically,
The test mode handover module includes the first light coupling relay R1, the second light coupling relay R2, the 3rd light coupling relay R3, the
Four light coupling relay R4, the 5th light coupling relay R5 and the 6th light coupling relay R6.The first of the first light coupling relay R1
End connects pulse voltage signal, connected as pulse voltage input end PULSEH, second ends of the first light coupling relay R1
Connect the first end of the second light coupling relay R2 and as pulse voltage output end PROBE1；The second optocoupler relay
Device R2 the second end connects the drive end Data of the pulse current source module 11；The first end of the 3rd light coupling relay R3
Connect single-pulse current signal, make as single-pulse current output end PROBE3, the second end of the 3rd light coupling relay R3
For the first measurement end SMUH；The first end of the 4th light coupling relay R4 and the second end of the first light coupling relay R2 connect
Connect, the second end of the 4th light coupling relay R4 is connected with the first measurement end SMUH；The 5th light coupling relay R5
First end as the second measurement end SMUL, the second end is as earth terminal PROBE2；The first of the 6th light coupling relay R6
End connects the earth terminal PROBE2, the second end ground connection.The external pull-up resistor of control terminal of each light coupling relay, and with institute
The output end connection of light coupling relay drive module is stated, the first end of each light coupling relay and the second end provide the logical of signal switching
Road；Opening for the first end of each light coupling relay and the second end determine with shut-off by the output of light coupling relay drive module, when
Light coupling relay drive module output (i.e. the control terminal of light coupling relay inputs) is low level, then the of light coupling relay
One end and the shut-off of the second end, equivalent to open circuit；When the light coupling relay drive module exports (the i.e. control terminal of light coupling relay
Input) it is high level, the then first end of light coupling relay and the second end closure, equivalent to conducting.
As shown in figure 1, the interface module 17 draw voltage x current test automatic switch-over circuit input signal and
Output signal.
Specifically, the interface module 17 includes pulse voltage input end PULSEH, pulse voltage output end
PROBE1, earth terminal PROBE2, single-pulse current output end PROBE3, negative DC current input PROBE4 and impedance measurement
The measurement end P0 of equipment.Wherein, the pulse voltage input end PULSEH, the pulse voltage output end PROBE1, institute
State earth terminal PROBE2, the single-pulse current output end PROBE3 and the negative DC current input PROBE4 matches somebody with somebody for buckle
Mould assembly connector (Bayonet Nut Connector, BNC).
Embodiment two
As shown in Fig. 2 the present invention provides a kind of phase change cells test system, the phase change cells test system includes：
The voltage x current test automatic switch-over circuit 1, pulse voltage signal generator 2, gpib bus 3, digital source
Table 4, probe station 5 and device 6.In the present embodiment, the device 6 includes the first 61 and second phase to be measured of phase change resistor to be measured
Become resistance 62.
As shown in Fig. 2 pulse voltage signal generator 2 is used to produce pulse voltage signal.
Specifically, the pulse voltage signal generator 2 is connected by the gpib bus 3 with the host computer 12,
Pulse voltage signal is exported by the control of the host computer 12.In the present embodiment, the pulse voltage signal generator 2
Realized using AWG5000B AWGs.
As shown in Fig. 2 the digital sourcemeter 4 is used for the resistance for measuring the device 6, and produce negative DC current signal.
Specifically, the digital sourcemeter 4 is connected by the gpib bus 3 with the host computer 12, by the host computer
12 control provides negative DC current signal or carries out the measurement of resistance.In the present embodiment, the digital sourcemeter 4 uses
2602A digital sourcemeters are realized.
As shown in Fig. 2 voltage x current test automatic switch-over circuit 1 connect the pulse voltage signal generator 2,
The digital sourcemeter 4 and the probe station 5, are automatically switched according to testing requirement, meet the demand of automatic test.
Specifically, the voltage x current test automatic switch-over circuit 1 receives pulse voltage signal and negative DC current letter
Number, and is connected with the described first phase change resistor 61 to be measured and second phase change resistor 62 to be measured by the probe station 5
More specifically, the pulse voltage input end PULSEH of the voltage x current test automatic switch-over circuit 1 receives list
Pulse voltage signal, bear DC current input PROBE4 and receive negative DC current signal, pulse voltage output end PROBE1
Connect the pulse voltage input of the probe station 5, the pulse electricity of the single-pulse current output end PROBE3 connections probe station 5
Flow input, the first end of the first test lead SMUH connections digital sourcemeter, the second test lead SMUL connections digital source
Second end of table, the earth terminal of the earth terminal PROBE2 connections probe station 5.First phase change resistor 61 to be measured is connected to institute
State between the pulse voltage input of probe station 5 and the earth terminal of the probe station 5, second phase change resistor 62 to be measured connects
Between the pulse current input of the probe station 5 and the earth terminal of the probe station 5.In voltage tester, the voltage
Testing current automatic switch-over circuit 1 provides pulse voltage signal to the described first phase change resistor 61 to be measured；In testing current,
The voltage x current tests automatic switch-over circuit 1 and provides single-pulse current signal to the described second phase change resistor 62 to be measured；Surveying
During amount, the digital sourcemeter 4 is connected to the described first phase change resistor 61 to be measured by the voltage x current test automatic switch-over circuit 1
Or the both ends of second phase change resistor 62 to be measured.
As shown in Fig. 2 the probe station 5 and voltage x current test automatic switch-over circuit 1, the digital sourcemeter 4, institute
State the first phase change resistor 61 to be measured and second phase change resistor 62 to be measured connect, for by probe by the described first phase to be measured
Become resistance 61 or second phase change resistor 62 to be measured and voltage x current test automatic switch-over circuit 1 or the digital sourcemeter
Connection 4.
Embodiment three
As shown in figure 3, the present invention provides a kind of method of testing of phase change cells test system, the phase change cells test system
System method includes：
During voltage tester, voltage x current test automatic switch-over circuit receives pulse voltage signal, and by the list
Pulse voltage signal is loaded into the both ends of the first phase change resistor to be measured, and digital sourcemeter then is parallel into the described first phase transformation to be measured
The both ends of resistance, measure the resistance of first phase change resistor to be measured.
Specifically, in voltage tester, the first light coupling relay R1 and the 6th light coupling relay the R6 conducting, other light
Coupling relay disconnects.Pulse voltage signal from pulse voltage input end PULSEH enter, and by first optocoupler after
Electrical equipment R1 enters the described first phase change resistor 61 to be measured from pulse voltage output end PROBE1, through the described first phase transformation to be measured
After resistance 61, the earth is flowed into by earth terminal PROBE2.
Specifically, after pulse voltage signal acts on first phase change resistor 61 to be measured, next pulse electricity
Before pressure signal is come, the resistance of now the described first phase change resistor 61 to be measured is measured it is necessary to which the digital sourcemeter 4 is connect
Enter.Now, the 4th light coupling relay R4 and the 5th light coupling relay R5 conductings, other light coupling relays disconnect.Institute
The both ends that digital sourcemeter 4 is linked into the described first phase change resistor 61 to be measured are stated, the digital sourcemeter 4 is by applying a small direct current
Voltage, and negative DC current is read to obtain the resistance of the described first phase change resistor 61 to be measured.
During testing current, the voltage x current test automatic switch-over circuit receives the pulse voltage signal and negative direct current
Current signal, single-pulse current signal is produced based on the pulse voltage signal and the negative DC current signal, by described in
Then the digital sourcemeter is parallel to the described second phase transformation to be measured by single-pulse current signal loading to the second phase change resistor to be measured
The both ends of resistance, measure the resistance of second phase change resistor to be measured.
Specifically, in testing current, the first light coupling relay R1, the second light coupling relay R2 and described
Six light coupling relay R6 are turned on, and other light coupling relays disconnect.Pulse voltage signal is from pulse voltage input end PULSEH
Into, and enter the pulse current source module 11 by the first light coupling relay R1, the second light coupling relay R2
Drive end Data；Negative DC current signal enters the pulse current source module from the negative DC current input PROBE4
11 first input end Rext1, the pulse current source module 11 produces single-pulse current signal, and is exported from single-pulse current
PROBE3 outputs are held, through after the described second phase change resistor 62 to be measured, the earth is flowed into by the earth terminal PROBE2.
Specifically, after the described in single-pulse current signal function second phase change resistor 62 to be measured, next pulse electricity
Before stream signal is come, the resistance of now the described second phase change resistor 62 to be measured is measured it is necessary to which the digital sourcemeter 4 is connect
Enter.Now, the 3rd light coupling relay R3 and the 5th light coupling relay R5 conductings, other light coupling relays disconnect.Institute
The both ends that digital sourcemeter 4 is linked into the described second phase change resistor 62 to be measured are stated, the digital sourcemeter 4 is by applying a small direct current
Voltage, and negative DC current is read to obtain the resistance of the described second phase change resistor 62 to be measured.
The voltage x current test automatic switch-over circuit of the present invention, phase change cells test system and method by discrete voltage and
Current detecting system is synthesized to together, is realized the automation of engineering test by the automatic switchover of voltage and current, is reduced simultaneously
Noise jamming.
In summary, the present invention provides a kind of voltage x current test automatic switch-over circuit, phase change cells test system and side
Method, voltage x current test automatic switch-over circuit include：Pulse current source module, for producing single-pulse current signal；Switch drives
Dynamic model block, for producing switch controlling signal；Test mode handover module, it is connected to the pulse current source module and described opens
Drive module is closed, by the control switch test path of each switch controlling signal；Pulse voltage signal, electricity are exported during voltage tester
Single-pulse current signal is exported during current test, measurement path is provided during measurement；Interface module, draw the voltage x current test certainly
The input signal and output signal of dynamic switching circuit.Phase change cells test system includes digital sourcemeter, probe station, the first phase to be measured
Become resistance and the second phase change resistor to be measured.During voltage tester, the voltage x current test automatic switch-over circuit receives pulse electricity
Signal is pressed, and the pulse voltage signal is loaded into the both ends of the first phase change resistor to be measured, it is then that digital sourcemeter is in parallel
In the both ends of the described first phase change resistor to be measured, the resistance of measurement first phase change resistor to be measured；During testing current, the electricity
Piezoelectricity current test automatic switch-over circuit receives the pulse voltage signal and negative DC current signal, based on pulse electricity
Press signal and the negative DC current signal to produce single-pulse current signal, the single-pulse current signal loading is treated to second
Phase change resistor is surveyed, then the digital sourcemeter is parallel to the both ends of the described second phase change resistor to be measured, measurement described second is treated
Survey the resistance of phase change resistor.Voltage x current test automatic switch-over circuit, phase change cells test system and the method for the present invention will divide
Vertical voltage and current test system is synthesized to together, and the automatic of engineering test is realized by the automatic switchover of voltage and current
Change, while reduce noise jamming.So the present invention effectively overcomes various shortcoming of the prior art and has high industrial utilization
Value.
The above-described embodiments merely illustrate the principles and effects of the present invention, not for the limitation present invention.It is any ripe
Know the personage of this technology all can carry out modifications and changes under the spirit and scope without prejudice to the present invention to above-described embodiment.Cause
This, those of ordinary skill in the art is complete without departing from disclosed spirit and institute under technological thought such as
Into all equivalent modifications or change, should by the present invention claim be covered.
Claims (11)
1. a kind of voltage x current tests automatic switch-over circuit, it is characterised in that the voltage x current test automatic switch-over circuit is extremely
Include less：
Pulse current source module, for producing single-pulse current signal；
Switch drive module, for producing switch controlling signal；
Test mode handover module, the pulse current source module and the switch drive module are connected to, are controlled by each switch
The control switch test path of signal；Pulse voltage signal is exported during voltage tester, exports single-pulse current during testing current
Signal, measurement path is provided during measurement；
Interface module, draw the input signal and output signal of the voltage x current test automatic switch-over circuit.
2. voltage x current according to claim 1 tests automatic switch-over circuit, it is characterised in that：The voltage x current test
Automatic switch-over circuit also includes host computer and micro treatment module；The host computer sends instruction, controls the micro treatment module work
Make；The micro treatment module is connected to the host computer, and the switch drive module root is controlled according to the instruction of the host computer
Corresponding switch controlling signal is exported according to different test patterns.
3. voltage x current according to claim 2 tests automatic switch-over circuit, it is characterised in that：The host computer with it is described
A single supply level switch module, the serial ports suitable for RS232 standards are connected between micro treatment module.
4. voltage x current according to claim 1 tests automatic switch-over circuit, it is characterised in that：The pulse current source mould
Block receives negative DC current signal and pulse voltage signal, by the negative direct current under the driving of the pulse voltage signal
Current signal is converted into the single-pulse current signal.
5. voltage x current according to claim 1 tests automatic switch-over circuit, it is characterised in that：The test mode switching
Module includes first switch, second switch, third switch, the 4th switch, the 5th switch and the 6th switch；The first switch
First end connection pulse voltage signal, as pulse voltage input end, the second end connect the second switch first end,
And it is used as pulse voltage output end；Second end of the second switch connects the drive end of the pulse current source module；Institute
State the first end connection single-pulse current signal of the 3rd switch, as single-pulse current output end, the second end is as the first measurement
End；The first end of 4th switch is connected with the second end of the first switch, and the second end is connected with first measurement end；
The first end of 5th switch is as the second measurement end, and the second end is as earth terminal；The first end connection of 6th switch
The earth terminal, the second termination the earth.
6. voltage x current according to claim 5 tests automatic switch-over circuit, it is characterised in that：Each switch is optocoupler relay
Device, the switch drive module are light coupling relay drive module.
7. a kind of phase change cells test system, it is characterised in that the phase change cells test system comprises at least：
Voltage x current test automatic switch-over circuit, digital sourcemeter, probe station and the as described in claim 1~6 any one
One phase change resistor to be measured and the second phase change resistor to be measured；
Voltage x current test automatic switch-over circuit receives pulse voltage signal and negative DC current signal, and with the spy
Pin platform, first phase change resistor to be measured and the second phase change resistor connection to be measured；In voltage tester, the voltage x current
Test automatic switch-over circuit and provide pulse voltage signal to the described first phase change resistor to be measured；In testing current, the electricity
Piezoelectricity current test automatic switch-over circuit provides single-pulse current signal to the described second phase change resistor to be measured；It is described in measurement
Voltage x current tests automatic switch-over circuit and the digital sourcemeter is connected into the described first phase change resistor to be measured or described second treated
Survey the both ends of phase change resistor；
The probe station and voltage x current test automatic switch-over circuit, the digital sourcemeter, the first phase power transformation to be measured
Resistance and the second phase change resistor to be measured connection, for by probe by the described first phase change resistor to be measured or described second to be measured
Phase change resistor tests automatic switch-over circuit with the voltage x current or the digital sourcemeter is connected.
8. phase change cells test system according to claim 7, it is characterised in that：The voltage x current test is automatically switched
The pulse voltage input end of circuit receives pulse voltage signal, bears DC current input and receives negative DC current signal,
Pulse voltage output end connects the pulse voltage input of the probe station, and single-pulse current output end connects the probe station
Pulse current input, the first test lead connects the first end of the digital sourcemeter, and the second test lead connects the digital source
Second end of table, earth terminal connect the earth terminal of the probe station.
9. the phase change cells test system according to claim 7 or 8, it is characterised in that：First phase change resistor to be measured
It is connected between the pulse voltage input of the probe station and the earth terminal of the probe station, second phase change resistor to be measured
It is connected between the pulse current input of the probe station and the earth terminal of the probe station.
10. the method for testing of the phase change cells test system as described in claim 7~9 any one, it is characterised in that described
Phase change cells method of testing comprises at least：
During voltage tester, voltage x current test automatic switch-over circuit receives pulse voltage signal, and by the pulse
Voltage signal is loaded into the both ends of the first phase change resistor to be measured, and digital sourcemeter then is parallel into the described first phase change resistor to be measured
Both ends, measure the resistance of first phase change resistor to be measured；
During testing current, the voltage x current test automatic switch-over circuit receives the pulse voltage signal and negative DC current
Signal, single-pulse current signal is produced based on the pulse voltage signal and the negative DC current signal, by the simple venation
Rush current signal and be loaded into the second phase change resistor to be measured, the digital sourcemeter is then parallel to the described second phase change resistor to be measured
Both ends, measure the resistance of second phase change resistor to be measured.
11. phase change cells method of testing according to claim 10, it is characterised in that：Measure the described first phase power transformation to be measured
The resistance step of resistance or second phase change resistor to be measured includes：
DC voltage is applied to the described first phase change resistor to be measured or second phase change resistor to be measured, measurement flows through described first
The electric current of phase change resistor to be measured or second phase change resistor to be measured, and then obtain the described first phase change resistor to be measured or described
The resistance of two phase change resistors to be measured.
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110726864A (en) * | 2019-11-14 | 2020-01-24 | 济南新吉纳远程测控股份有限公司 | Self-adaptive direct-current signal sampling circuit and sampling device |
| CN111123073A (en) * | 2019-12-27 | 2020-05-08 | 天津芯海创科技有限公司 | Quick self-checking device of hardware board card |
| CN112486052A (en) * | 2020-10-15 | 2021-03-12 | 中车青岛四方机车车辆股份有限公司 | Bogie real-time sensor intelligent detection electrical control system |
| CN113311322A (en) * | 2021-05-28 | 2021-08-27 | 苏州欧菲特电子股份有限公司 | Load driving and mutual inductor signal processing device |
| CN113985104A (en) * | 2021-10-27 | 2022-01-28 | 四川创安微电子有限公司 | Circuit and method for detecting voltage and current signals in chip |
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Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6047393A (en) * | 1997-06-13 | 2000-04-04 | Advantest Corporation | Memory testing apparatus |
| KR100317207B1 (en) * | 2000-04-27 | 2001-12-24 | 우상엽 | Test apparatus for semiconductor memory |
| CN1905077A (en) * | 2006-06-27 | 2007-01-31 | 中国科学院上海微系统与信息技术研究所 | System and method for testing device unit of phase change storage |
| CN101567142A (en) * | 2009-05-07 | 2009-10-28 | 哈尔滨工程大学 | Black box system used in electronic circuit experiment |
| CN101770816A (en) * | 2009-12-22 | 2010-07-07 | 河南大学 | Resistive random access memory (RRAM) unit test system and switcher thereof |
| CN102354537A (en) * | 2011-07-06 | 2012-02-15 | 华中科技大学 | Method and system for testing chip of phase change memory |
| US8745452B2 (en) * | 2011-08-23 | 2014-06-03 | Samsung Electronics Co., Ltd. | Resistive memory device and test systems and methods for testing the same |
-
2017
- 2017-08-28 CN CN201710749389.3A patent/CN107591186B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6047393A (en) * | 1997-06-13 | 2000-04-04 | Advantest Corporation | Memory testing apparatus |
| KR100317207B1 (en) * | 2000-04-27 | 2001-12-24 | 우상엽 | Test apparatus for semiconductor memory |
| CN1905077A (en) * | 2006-06-27 | 2007-01-31 | 中国科学院上海微系统与信息技术研究所 | System and method for testing device unit of phase change storage |
| CN101567142A (en) * | 2009-05-07 | 2009-10-28 | 哈尔滨工程大学 | Black box system used in electronic circuit experiment |
| CN101770816A (en) * | 2009-12-22 | 2010-07-07 | 河南大学 | Resistive random access memory (RRAM) unit test system and switcher thereof |
| CN102354537A (en) * | 2011-07-06 | 2012-02-15 | 华中科技大学 | Method and system for testing chip of phase change memory |
| US8745452B2 (en) * | 2011-08-23 | 2014-06-03 | Samsung Electronics Co., Ltd. | Resistive memory device and test systems and methods for testing the same |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110726864A (en) * | 2019-11-14 | 2020-01-24 | 济南新吉纳远程测控股份有限公司 | Self-adaptive direct-current signal sampling circuit and sampling device |
| CN110726864B (en) * | 2019-11-14 | 2021-10-29 | 济南新吉纳远程测控股份有限公司 | Self-adaptive direct-current signal sampling circuit and sampling device |
| CN111123073A (en) * | 2019-12-27 | 2020-05-08 | 天津芯海创科技有限公司 | Quick self-checking device of hardware board card |
| CN111123073B (en) * | 2019-12-27 | 2022-05-10 | 天津芯海创科技有限公司 | Quick self-checking device of hardware board card |
| CN112486052A (en) * | 2020-10-15 | 2021-03-12 | 中车青岛四方机车车辆股份有限公司 | Bogie real-time sensor intelligent detection electrical control system |
| CN113311322A (en) * | 2021-05-28 | 2021-08-27 | 苏州欧菲特电子股份有限公司 | Load driving and mutual inductor signal processing device |
| CN113985104A (en) * | 2021-10-27 | 2022-01-28 | 四川创安微电子有限公司 | Circuit and method for detecting voltage and current signals in chip |
| CN113985104B (en) * | 2021-10-27 | 2023-09-01 | 四川创安微电子有限公司 | Circuit and method for detecting voltage and current signals in chip |
| CN116859223A (en) * | 2023-09-05 | 2023-10-10 | 西安赛英特科技有限公司 | On-line self-checking method and circuit for VI source and VI source |
| CN116859223B (en) * | 2023-09-05 | 2023-12-08 | 西安赛英特科技有限公司 | On-line self-checking method and circuit for VI source and VI source |
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