CN107358980A - A kind of method of automatic test SSD delays - Google Patents

A kind of method of automatic test SSD delays Download PDF

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Publication number
CN107358980A
CN107358980A CN201710590306.0A CN201710590306A CN107358980A CN 107358980 A CN107358980 A CN 107358980A CN 201710590306 A CN201710590306 A CN 201710590306A CN 107358980 A CN107358980 A CN 107358980A
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CN
China
Prior art keywords
ssd
test
random
automatic test
numjobs
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201710590306.0A
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Chinese (zh)
Inventor
侯玉娇
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Zhengzhou Yunhai Information Technology Co Ltd
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Zhengzhou Yunhai Information Technology Co Ltd
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Priority to CN201710590306.0A priority Critical patent/CN107358980A/en
Publication of CN107358980A publication Critical patent/CN107358980A/en
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50Marginal testing, e.g. race, voltage or current testing
    • G11C29/50012Marginal testing, e.g. race, voltage or current testing of timing
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/10Programming or data input circuits
    • G11C16/20Initialising; Data preset; Chip identification
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor

Abstract

A kind of method of automatic test SSD delays, specifically includes following steps:Format SSD;To the SSD carry out order pretreatments after formatting;Perform SSD order delay test;Perform random pretreatment;Perform SSD random delay test;Output test result.One embodiment of the invention realizes automatic SSD delay tests, and test data is output in form, there is provided goes out succinctly bright test result, can be adjusted for different demands.

Description

A kind of method of automatic test SSD delays
Technical field
The present invention relates to SSD technical field of measurement and test, specifically a kind of method of automatic test SSD delays.
Background technology
With the continuous development of IT field technology, conventional information service and increasingly powerful cloud computing service are to service The performance requirement more and more higher of device.It is fast that SSD (Solid State Drives solid state hard discs) possesses memory rate, and storage performance is high The features such as.For SSD as data medium, its performance directly affects the overall presentation of server.Server hardware supplier is in product The exploitation of performance test during to(for) SSD needs more inputs, latency requirement more and more higher of the client for SSD.
The content of the invention
It is an object of the invention to provide a kind of method of automatic test SSD delays, for testing SSD performance, carry High test rate.
The technical scheme adopted by the invention to solve the technical problem is that:A kind of method of automatic test SSD delays, tool Body comprises the following steps:
Format SSD;
To the SSD carry out order pretreatments after formatting;
Perform SSD order delay test;
Perform random pretreatment;
Perform SSD random delay test;
Output test result.
Further, formatting SSD specific method includes:It is using format orders, junk data inside SSD is clear Remove.
Further, the specific method of order pretreatment includes:Hard-disk content is purged using fio instruments, disk is entered Row 4K sequential writes are full 2 times;Blocksize size is 128K, queue depth 64, numjobs 1.
Further, the specific method of order delay test includes:Execution sequence 4K read operations, Auto-matching drive;Hold Row sequential write is tested, and automatically generates order delay test result.
Further, in order delay test:During read operation, numjobs 1, queue depth 1, the testing time is 600s, a point is taken per 5s;During write operation, blocksize 4K, numjobs 1, testing time 600s, one is taken per 5s Point.
Further, the specific method pre-processed at random includes:Disk is carried out completely 2 times by overall random write using fio instruments; Blocksize is 4K, numjobs 2, queue depth 64.
Further, the specific method of random delay test includes:Carry out the random read operations of 4K, Auto-matching drive;Hold Row random write is tested, and automatically generates random delay test result.
Further, the method for Auto-matching drive includes:Drive is checked using fdisk-l orders, according to defined It is right that drive and the drive that views are carried out, if to success, carries out testing the disk.
Further, in random delay test:In read operation, numjobs 1, queue depth 1, the testing time is 600s, a point is taken per 5s;In write operation, blocksize 4K, numjobs 1, queue depth 1, the testing time is 600s, a point is taken per 5s.
The effect provided in the content of the invention is only the effect of embodiment, rather than whole effects that invention is all, above-mentioned A technical scheme in technical scheme has the following advantages that or beneficial effect:
Automatic SSD delay tests are realized, and test data is output in form, there is provided go out succinctly bright test knot Fruit, it can be adjusted for different demands.
Brief description of the drawings
Fig. 1 is the method flow schematic diagram of the embodiment of the present invention;
Fig. 2 is the test result schematic diagram of the embodiment of the present invention.
Embodiment
In order to the technical characterstic of clear explanation this programme, below by embodiment, and its accompanying drawing is combined, to this Invention is described in detail.Following disclosure provides many different embodiments or example is used for realizing the different knots of the present invention Structure.In order to simplify disclosure of the invention, hereinafter the part and setting of specific examples are described.In addition, the present invention can be with Repeat reference numerals and/or letter in different examples.This repetition is that for purposes of simplicity and clarity, itself is not indicated Relation between various embodiments are discussed and/or set.It should be noted that part illustrated in the accompanying drawings is not necessarily to scale Draw.Present invention omits the description to known assemblies and treatment technology and process to avoid being unnecessarily limiting the present invention.
The present invention suitable multiple systems, it is described in detail herein with linux system.
First do preposition work:Main flow linux system is installed, and obtains root authority.Fio instruments are installed, then will be automatic Change script file to copy under the assigned catalogue under system.
As shown in figure 1, a kind of method of automatic test SSD delays, specifically includes following steps:
Format SSD;To the SSD carry out order pretreatments after formatting;Perform SSD order delay test;Perform with Machine pre-processes;Perform SSD random delay test;Output test result.
Formatting SSD specific method includes:Using format orders, junk data inside SSD is removed.
Because test delay need test SSD order read-write and random read-write delay, test this two parts it Before the action that will first be pre-processed because SSD characteristics are under blank panel state, performance read-write is excessively outstanding, and data are forbidden Really, so before test, it is necessary to there is preprocessing process.
The specific method of order pretreatment includes:Hard-disk content is purged using fio instruments, disk is subjected to 4K sequential writes It is full 2 times;Blocksize size is 128K, queue depth 64, numjobs 1.
The specific method of order delay test includes:Execution sequence 4K read operations, Auto-matching drive;Execution sequence writes survey Examination, automatically generates order delay test result.
The method of Auto-matching drive includes:Drive is checked using fdisk-l orders, according to defined drive with checking It is right that the drive that arrives is carried out, if to success, carries out testing the disk.
In order delay test:During read operation, numjobs 1, queue depth 1, testing time 600s, per 5s Take a point;During write operation, blocksize 4K, numjobs 1, testing time 600s, a point is taken per 5s.
The specific method pre-processed at random includes:Disk is carried out completely 2 times by overall random write using fio instruments;blocksize For 4K, numjobs 2, queue depth 64.
The specific method of random delay test includes:Carry out the random read operations of 4K, Auto-matching drive;Random write is performed to survey Examination, automatically generates random delay test result.
The method and the method one of Auto-matching drive in order delay test of Auto-matching drive in random delay test Cause, just repeat no more herein.
In random delay test:In read operation, numjobs 1, queue depth 1, testing time 600s, per 5s Take a point;In write operation, blocksize 4K, numjobs 1, queue depth 1, testing time 600s, taken per 5s One point.
After the completion of carrying out automatic test, output test result.
As shown in Fig. 2 testing Memblaze SSD, two capacity points 1.6T and 3.2T in a series are tested, Fig. 2 intuitively reflects test result.
Transverse axis represents capacity, and the longitudinal axis represents the time of delay, and unit is microsecond.Cylindricality 1 represents the data institute that 4K orders are read Time, cylindricality 2 represent the time used in the data of 4K sequential writes, and cylindricality 3 represents the data of 4K random writes, and cylindricality 4 represents The data of 4K random writes.
Simply the preferred embodiment of the present invention described above, for those skilled in the art, Without departing from the principles of the invention, some improvements and modifications can also be made, these improvements and modifications are also regarded as this hair Bright protection domain.

Claims (9)

1. a kind of method of automatic test SSD delays, it is characterized in that, specifically include following steps:
Format SSD;
To the SSD carry out order pretreatments after formatting;
Perform SSD order delay test;
Perform random pretreatment;
Perform SSD random delay test;
Output test result.
2. a kind of method of automatic test SSD delays according to claim 1, it is characterized in that, format the specific of SSD Method includes:Using format orders, junk data inside SSD is removed.
3. a kind of method of automatic test SSD delays according to claim 1, it is characterized in that, the tool of order pretreatment Body method includes:Hard-disk content is purged using fio instruments, it is full 2 times that disk is carried out into 4K sequential writes;Blocksize size For 128K, queue depth 64, numjobs 1.
4. a kind of method of automatic test SSD delays according to claim 1, it is characterized in that, order delay test Specific method includes:Execution sequence 4K read operations, Auto-matching drive;Execution sequence writes test, automatically generates order delay and surveys Test result.
5. a kind of method of automatic test SSD delays according to claim 4, it is characterized in that, in order delay test In:During read operation, numjobs 1, queue depth 1, testing time 600s, a point is taken per 5s;During write operation, Blocksize is 4K, numjobs 1, testing time 600s, and a point is taken per 5s.
6. a kind of method of automatic test SSD delays according to claim 1, it is characterized in that, the tool pre-processed at random Body method includes:Disk is carried out completely 2 times by overall random write using fio instruments;Blocksize is 4K, numjobs 2, and queue is deep Spend for 64.
7. a kind of method of automatic test SSD delays according to claim 1, it is characterized in that, random delay test Specific method includes:Carry out the random read operations of 4K, Auto-matching drive;Random write test is performed, automatically generates random delay survey Test result.
8. a kind of method of automatic test SSD delays according to any one of claim 4 or 7, it is characterized in that, automatically The method of matching drive includes:Drive is checked using fdisk-l orders, carried out according to defined drive and the drive viewed It is right, if to success, carry out testing the disk.
9. a kind of method of automatic test SSD delays according to claim 7, it is characterized in that, tested in random delay In:In read operation, numjobs 1, queue depth 1, testing time 600s, a point is taken per 5s;In write operation, Blocksize is 4K, numjobs 1, queue depth 1, testing time 600s, a point is taken per 5s.
CN201710590306.0A 2017-07-19 2017-07-19 A kind of method of automatic test SSD delays Pending CN107358980A (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107799158A (en) * 2017-11-23 2018-03-13 郑州云海信息技术有限公司 A kind of NVMe SSD IO delays automated testing method
CN108763000A (en) * 2018-05-23 2018-11-06 郑州云海信息技术有限公司 A kind of hard disk I/O Request delay simulation judgment method and system based on Linux platform
CN109215721A (en) * 2018-10-24 2019-01-15 郑州云海信息技术有限公司 A kind of method, device and equipment of test NVME SSD hard disk delay

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103578568A (en) * 2012-07-24 2014-02-12 苏州捷泰科信息技术有限公司 Method and apparatus for testing performances of solid state disks
US20140047289A1 (en) * 2012-08-13 2014-02-13 Unitest Inc Failure detection apparatus for solid state drive tester
CN104360919A (en) * 2014-10-24 2015-02-18 浪潮电子信息产业股份有限公司 Method for automatically testing performance, function and stability of SSD (solid state drive)
CN104765665A (en) * 2015-04-14 2015-07-08 浪潮电子信息产业股份有限公司 Method and device for testing hard disks
CN105893230A (en) * 2016-04-05 2016-08-24 浪潮电子信息产业股份有限公司 Method and device for detecting IOPS performance of hard disks
CN106910532A (en) * 2017-02-23 2017-06-30 郑州云海信息技术有限公司 A kind of method of automatic test SSD performances

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103578568A (en) * 2012-07-24 2014-02-12 苏州捷泰科信息技术有限公司 Method and apparatus for testing performances of solid state disks
US20140047289A1 (en) * 2012-08-13 2014-02-13 Unitest Inc Failure detection apparatus for solid state drive tester
CN104360919A (en) * 2014-10-24 2015-02-18 浪潮电子信息产业股份有限公司 Method for automatically testing performance, function and stability of SSD (solid state drive)
CN104765665A (en) * 2015-04-14 2015-07-08 浪潮电子信息产业股份有限公司 Method and device for testing hard disks
CN105893230A (en) * 2016-04-05 2016-08-24 浪潮电子信息产业股份有限公司 Method and device for detecting IOPS performance of hard disks
CN106910532A (en) * 2017-02-23 2017-06-30 郑州云海信息技术有限公司 A kind of method of automatic test SSD performances

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
百度文库: "高性能测试---FIO 工具测试性能指标", 《百度文库》 *

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107799158A (en) * 2017-11-23 2018-03-13 郑州云海信息技术有限公司 A kind of NVMe SSD IO delays automated testing method
CN108763000A (en) * 2018-05-23 2018-11-06 郑州云海信息技术有限公司 A kind of hard disk I/O Request delay simulation judgment method and system based on Linux platform
CN109215721A (en) * 2018-10-24 2019-01-15 郑州云海信息技术有限公司 A kind of method, device and equipment of test NVME SSD hard disk delay

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