CN107315122A - A kind of charging pile test device - Google Patents

A kind of charging pile test device Download PDF

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Publication number
CN107315122A
CN107315122A CN201710702670.1A CN201710702670A CN107315122A CN 107315122 A CN107315122 A CN 107315122A CN 201710702670 A CN201710702670 A CN 201710702670A CN 107315122 A CN107315122 A CN 107315122A
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CN
China
Prior art keywords
resistance
charging pile
tested
diode
chip microcomputer
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CN201710702670.1A
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Chinese (zh)
Inventor
江磊
李晋川
吴小海
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Shanghai Ti Xin Electric Technology Co Ltd
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Shanghai Ti Xin Electric Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by Shanghai Ti Xin Electric Technology Co Ltd filed Critical Shanghai Ti Xin Electric Technology Co Ltd
Priority to CN201710702670.1A priority Critical patent/CN107315122A/en
Publication of CN107315122A publication Critical patent/CN107315122A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Abstract

Embodiment of the invention discloses that a kind of charging pile test device, the device includes CP circuitry for signal measurement and CC resistance measuring circuits;Wherein, during testing charging pile to be tested, the CP circuitry for signal measurement is connected with the CP control leads of the charging pile to be tested, peak value, valley, frequency and the dutycycle of the CP signals for measuring the charging pile to be tested;During testing charging pile to be tested, the CC resistance measuring circuits are connected with the CC control leads of the charging pile to be tested, the CC resistance values for measuring the charging pile to be tested.The device is measured by both circuit realirations tested to the electric parameter of charging pile to be tested, so as to carry out more test comprehensively to charging pile to be tested, it is to avoid due to the charging safety problem of the presence not in place caused tested charging pile.

Description

A kind of charging pile test device
Technical field
The present invention relates to electric vehicle charging technical field, more particularly, to a kind of charging pile test device.
Background technology
With the quick popularization and popularization of charging pile, charging pile needs to carry out Function detection after production or installation, due to It is cumbersome using automobile real steering vectors, and then need specific test device to be tested.Usual test device is filled by exchanging Electrical socket, voltmeter, S2 switch analogue means compositions.AC charging socket is used as the attachment means of charging pile, voltmeter progress Voltage measurement, S2 switches carry out charge mode simulation.Existing test device can only be tested charge function, it is impossible to control The detailed electrical parameter of guidance circuit processed is measured.
During the embodiment of the present invention is realized, inventor has found that existing test device can only be carried out to charge function Test, it is impossible to measured to the detailed electrical parameter for controlling guidance circuit.
The content of the invention
The technical problems to be solved by the invention are how to solve existing test device to survey charge function Examination, it is impossible to the problem of being measured to the detailed electrical parameter for controlling guidance circuit.
For above technical problem, surveyed The embodiment provides a kind of charging pile test device, including CP signals Measure circuit and CC resistance measuring circuits;
Wherein, during testing charging pile to be tested, the CP circuitry for signal measurement with it is described to be tested The CP control lead connections of charging pile, peak value, valley, frequency and the duty of the CP signals for measuring the charging pile to be tested Than;
During testing charging pile to be tested, the CC resistance measuring circuits and the charging pile to be tested CC control lead connection, the CC resistance values for measuring the charging pile to be tested.
Alternatively, in addition to display module;
The display module connects the CC resistance measuring circuits and the CP circuitry for signal measurement, for showing the CC The CC resistance values of resistance measuring circuit measurement, and show the frequency of the CP signals of the CP circuitry for signal measurement measurement Rate, dutycycle, valley and peak value.
Alternatively, the CP circuitry for signal measurement include be used for measure the CP signals peak value the first measuring circuit, For measuring the frequency of the CP signals and the second measuring circuit of dutycycle, and for measuring the valley of the CP signals Three measuring circuits;
Wherein, first measuring circuit includes the first diode, the second diode, the first electric capacity, first resistor, second Resistance and single-chip microcomputer;
The first end of first diode as first measuring circuit input, the of first diode Two ends connect the first end of first electric capacity, the second end connection common port of first electric capacity;
The first end of the first resistor connects the first end of first electric capacity, the second end connection of the first resistor The first end of the second resistance, the second end connection common port of the second resistance;
The first end of the second resistance connects the input of the first ADC sampling channels of the single-chip microcomputer, with described the Corresponding first output end of one ADC sampling channels connects the display module;
Second diode is used as clamp diode, the first end connection high level of second diode, the second end Connect the input of the first ADC sampling channels;
During testing the charging pile to be tested, the CP signals pass through the first diode pair institute The charging of the first electric capacity is stated, first electric capacity is discharged by the first resistor and the second resistance and transmitted to described first ADC sampling channels, the single-chip microcomputer is according to transmitting to the peak of CP signals described in the signal of change of the first ADC sampling channels Value.
Alternatively, second measuring circuit includes the 3rd diode, 3rd resistor, the 4th resistance, the 4th diode, the Five resistance and the single-chip microcomputer;
The first end of 3rd diode as second measuring circuit input, the of the 3rd diode Two ends connect the first end of the 3rd resistor, the second end connection common port of the 3rd resistor;
The first end of the 3rd resistor connects the first end of the 4th diode, and the first of the 4th diode The first end of end connection the 4th resistance, the second end connection charging control switch of the 4th resistance;
Second end of the 4th diode connects the first end of the 5th resistance and the impulse sampling of the single-chip microcomputer Passage, the second end connection high level of the 5th resistance;The the secondth output end connection corresponding with the impulse sampling passage The display module;
During testing the charging pile to be tested, the single-chip microcomputer determines to pass by timed capture function The frequency and dutycycle of the signal of the impulse sampling passage are transported to, and the frequency is shown and described by the display module Dutycycle.
Alternatively, the 3rd measuring circuit includes the 5th diode, the second electric capacity, add circuit and the single-chip microcomputer;
The first end of 5th diode as the 3rd measuring circuit input, the of the 5th diode Two ends connect the first end of second electric capacity, the second end connection common port of second electric capacity;
The first end of second electric capacity connects the first end of the add circuit, the second end connection of the add circuit 2nd ADC sampling channels of the single-chip microcomputer, the 3rd output end corresponding with the 2nd ADC sampling channels connects the display Module;
During testing the charging pile to be tested, the single-chip microcomputer will be transmitted to the 2nd ADC and adopt The analog signal of sample passage is converted into data signal, calculates the valley of the CP signals according to the add circuit, described and lead to Cross the valley that the display module shows the CP signals.
Alternatively, the add circuit follows amplification including the 6th resistance, the 7th resistance, the first follow-up amplifier and second Device;
The first end of second electric capacity connects the first end of the 6th resistance, the second end connection of the 6th resistance The first end of 7th resistance and the input of first follow-up amplifier, the output end of first follow-up amplifier connect Connect the 2nd ADC sampling channels of the single-chip microcomputer;
The input connection reference voltage of second follow-up amplifier, the output end connection of second follow-up amplifier 7th resistance, second end.
Alternatively, the CC resistance measuring circuits include the 8th resistance, the 3rd follow-up amplifier, the 4th follow-up amplifier and The single-chip microcomputer;
During testing the charging pile to be tested, the first end of the 8th resistance connects the CC controls The input of lead processed and the 3rd follow-up amplifier;
The input connection reference voltage of 4th follow-up amplifier, the output end connection of the 4th follow-up amplifier Second end of the 8th resistance;
The output end of 3rd follow-up amplifier connects the 3rd ADC sampling channels of the single-chip microcomputer, with the described 3rd Corresponding 4th output end of ADC sampling channels connects the display module;
During testing the charging pile to be tested, the single-chip microcomputer will be transmitted to the 3rd ADC and adopt The analog signal of sample passage is converted into data signal, the resistance value of CC resistance according to the 8th resistance calculations, and passes through The display module shows the resistance value of the CC resistance.
Alternatively, in addition to be arranged on the 3rd follow-up amplifier output end and the 3rd ADC sampling channels it Between the 9th resistance and the 3rd electric capacity;
The output end of 3rd follow-up amplifier connects the first end of the 9th resistance, the second of the 9th resistance End connects the first end of the 3rd ADC sampling channels and the 3rd electric capacity, and the second end connection of the 3rd electric capacity is public End;
The simulation of 9th resistance and the 3rd electric capacity to the output end output from the 3rd follow-up amplifier is believed Number it is filtered processing, and by the analog signal transmission after filtering process to the 3rd ADC sampling channels.
Alternatively, in addition to CP indicator lamps and CC indicator lamps, the CP indicator lamps and the CC indicator lamps are all connected with described Single-chip microcomputer;
Wherein, the single-chip microcomputer judges whether the frequency of the CP signals is in predeterminated frequency scope and the dutycycle and is It is no in default duty cycle range, if the frequency of the CP signals is not in the range of the predeterminated frequency or the CP signals Dutycycle then controls the CP indicator lamps to send and is unsatisfactory for wanting corresponding to the CP signals not in the default duty cycle range The first prompt message asked;
The single-chip microcomputer judges the resistance value of the CC resistance whether in default CC Standard resistance ranges, if the CC resistance Resistance value then controls the CC indicator lamps to send and is unsatisfactory for wanting corresponding to the CC resistance not in the default CC Standard resistance ranges The second prompt message asked.
Alternatively, in addition to voltmeter and load extension mouth;
During testing charging pile to be tested, the voltmeter shows the voltage exported to the charging pile The magnitude of voltage measured.
The embodiment provides a kind of charging pile test device, the device includes believing the CP of charging pile to be tested Number the circuit tested of peak value, valley, frequency and dutycycle, and the CC resistance of charging pile to be tested measured Circuit.The circuit realirations tested by both are measured to the electric parameter of charging pile to be tested, so as to to be measured Trial charging stake carries out more test comprehensively, it is to avoid because the charging of the presence not in place caused tested charging pile is asked safely Topic.
Brief description of the drawings
In order to illustrate more clearly about the embodiment of the present invention or technical scheme of the prior art, below will be to embodiment or existing There is the accompanying drawing used required in technology description to be briefly described, it should be apparent that, drawings in the following description are this hairs Some bright embodiments, for those of ordinary skill in the art, on the premise of not paying creative work, can be with root Other accompanying drawings are obtained according to these accompanying drawings.
Fig. 1 is the structural representation for the charging pile test device that one embodiment of the invention is provided;
Fig. 2 is the contour structures schematic diagram for the charging pile test device that another embodiment of the present invention is provided;
Fig. 3 is the circuit diagram for the CP circuitry for signal measurement that another embodiment of the present invention is provided;
Fig. 4 is the circuit diagram for the CC resistance measuring circuits that another embodiment of the present invention is provided.
Embodiment
To make the purpose, technical scheme and advantage of the embodiment of the present invention clearer, below in conjunction with the embodiment of the present invention In accompanying drawing, the technical scheme in the embodiment of the present invention is clearly and completely described, it is clear that described embodiment is A part of embodiment of the present invention, rather than whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art The every other embodiment obtained under the premise of creative work is not made, belongs to the scope of protection of the invention.
Fig. 1 is the structural representation for the charging pile test device that the present embodiment is provided.Referring to Fig. 1, the device includes:
CP circuitry for signal measurement 101 and CC resistance measuring circuits 102;
Wherein, during testing charging pile to be tested, the CP circuitry for signal measurement 101 with it is described to be measured The CP control leads connection of trial charging stake is (as shown in figure 1, pass through the AC charging socket 107 of charging pile to be tested and to be tested The CP control leads connection of charging pile), the peak values of the CP signals for measuring the charging pile to be tested, valley, frequency and account for Sky ratio;
During testing charging pile to be tested, the CC resistance measuring circuits 102 to be tested fill with described The CC control leads of electric stake are connected (as shown in figure 1, AC charging socket 107 and trial charging to be measured by charging pile to be tested The CC control leads connection of stake), the CC resistance values for measuring the charging pile to be tested.
It should be noted that the charging pile test device that the present embodiment is provided is used to test the charging pile of vehicle. Traditional device tested charging pile can only be tested the voltage swing that charging pile is exported, and test event is single, The exception of charging pile can not be found in time, evade some security risks.The charging pile test device of the offer of the present embodiment is being passed On the basis of the charging pile test device of system, the circuit measured to the CC resistance and CP signals of charging pile is additionally arranged, it is perfect The test event tested charging pile, realize to carrying out more test comprehensively to charging pile to be tested, it is to avoid by In the charging safety problem for the presence not in place caused tested charging pile.
It will be appreciated that as shown in figure 1, the charging pile test equipment that the present embodiment is provided can only include above-mentioned CP and believe Number measuring circuit 101 and CC resistance measuring circuits 102, can also include power supply circuit 103, A.C. voltmeter 105, charge control Switch 104, load expansion interface 106.As shown in figure 1, during testing charging pile to be tested, AC charging is inserted Seat 107 connects power supply circuit 103 (zero line L, live wire N and ground wire PE are connected respectively), and A.C. voltmeter 105 is to zero line L and live wire N Between voltage measure, i.e., to charging pile export voltage measure.Charging control switch 104 is used to control charging pile Connecting and disconnecting of the circuit between charging pile test device.Load expansion interface 106 is used to connect other loads.
A kind of charging pile test device is present embodiments provided, the device includes the peak to the CP signals of charging pile to be tested The circuit that value, valley, frequency and dutycycle are tested, and the circuit measured to the CC resistance of charging pile to be tested. The circuit realirations tested by both are measured to the electric parameter of charging pile to be tested, so as to charging to be tested Stake carries out more test comprehensively, it is to avoid due to the charging safety problem of the presence not in place caused tested charging pile.
Further, on the basis of above-described embodiment, Fig. 2 shows the charging pile test device that the present embodiment is provided Contour structures schematic diagram, referring to Fig. 2, the charging pile test device also include display module 201;
The display module 201 connects the CC resistance measuring circuits 102 and the CP circuitry for signal measurement 101, is used for The CC resistance values that the CC resistance measuring circuits 102 are measured are shown, and show the measuring circuit of CP signals 101 measurement The CP signals frequency, dutycycle, valley and peak value.
Load expansion interface 106 is specifically located at the side of charging pile test device, as shown in 203 in Fig. 2, charging control System switch 104 is specifically located at the front of charging pile test device, as shown in 204 in Fig. 2.Need, display dress It can be display screen to put, for example, LED display.In addition, the charging pile test device that the present embodiment is provided also includes being arranged on just The CP indicator lamps 205 and CC indicator lamps 206 in face, for when judging that CP signals are unsatisfactory for requiring or CC resistance occurs abnormal, Tester is pointed out by CP indicator lamps and CC indicator lamps, the present embodiment is not specifically limited to this.
The charging pile test device that the present embodiment is provided, in addition to display module, display module show CC resistance measurements electricity Road and the electric parameter of CP circuitry for signal measurement measurement, tester is the electricity that can be appreciated that charging pile to be tested by display module Gas parameter, so that the performance to charging pile judges, pinpoints the problems early.
Further, on the basis of each above-mentioned embodiment, Fig. 3 shows the circuit diagram of CP circuitry for signal measurement, Referring to Fig. 3, the CP circuitry for signal measurement includes being used to measure the first measuring circuit 301 of the peak value of the CP signals, is used for The frequency of the CP signals and the second measuring circuit 302 of dutycycle are measured, and for measuring the valley of the CP signals Three measuring circuits 303;
Wherein, first measuring circuit 301 includes the first diode D1, the second diode D2, the first electric capacity C1, first Resistance R1, second resistance R2 and single-chip microcomputer;
The first end of the first diode D1 is as the input of first measuring circuit (as shown in figure 3, treating During test charging pile is tested, the first diode D1 first end connection CP signals), the first diode D1's Second end connects the first end of the first electric capacity C1, the second end connection common port DGND of the first electric capacity C1;
The first end of the first resistor R1 connects the first end of the first electric capacity C1, the second of the first resistor R1 End connection second resistance R2 first end, the second end connection common port DGND of the second resistance R2;
The first end of the second resistance R2 connects the input of the first ADC sampling channels of the single-chip microcomputer, and described Corresponding first output end of first ADC sampling channels connects the display module;
The second diode D2 connects high level VCC as clamp diode, the first end of the second diode D2, Second end connects the input of the first ADC sampling channels;
During testing the charging pile to be tested, the CP signals pass through D1 pairs of first diode The first electric capacity C1 chargings, the first electric capacity C1 is discharged and transmitted by the first resistor R1 and the second resistance R2 To the first ADC sampling channels, the single-chip microcomputer is according to transmitting to CP described in the signal of change of the first ADC sampling channels The peak value of signal.
During testing charging pile to be tested, the peak value of CP signals is electric to first by the first diode D1 Hold C1 to be charged, the first electric capacity C1 possesses voltage and keeps function.It is defeated that first resistor R1 and second resistance R2 constitutes bleeder circuit Enter to the first ADC sampling channels.Wherein, first resistor R1 and second resistance R2 discharges the first electric capacity C1, in CP signals Peak value reduction when, measurement response speed can be improved, the first diode D1 is clamp diode, protection input to the first ADC The voltage of sampling channel is not higher than VCC.
The charging pile test device that the present embodiment is provided, passes through the first diode D1, the second diode D2, the first electric capacity The signal that CP signals include peak value is converted to digital letter by C1, first resistor R1, second resistance R2 and the first ADC sampling channels Number shown and determined the peak value of CP signals.
Further, on the basis of each above-mentioned embodiment, as shown in figure 3, second measuring circuit 302 includes 3rd diode D3,3rd resistor R3, the 4th resistance R4, the 4th diode D4, the 5th resistance R5 and the single-chip microcomputer;
The first end of the 3rd diode D3 is used as the input of second measuring circuit, the 3rd diode D3 The second end connect the first end of the 3rd resistor R3, the second end connection common port DGND of the 3rd resistor R3;
The first end of the 3rd resistor R3 connects the first end of the 4th diode D4, and the 4th diode D4 First end connect the first end of the 4th resistance R4, the second end connection charging control switch of the 4th resistance R4;
The second end of the 4th diode D4 connects the first end of the 5th resistance R5 and the pulse of the single-chip microcomputer Sampling channel, the second end connection high level VCC of the 5th resistance R5;The second output corresponding with the impulse sampling passage The end connection display module;
During testing the charging pile to be tested, the single-chip microcomputer determines to pass by timed capture function The frequency and dutycycle of the signal of the impulse sampling passage are transported to, and the frequency is shown and described by the display module Dutycycle.
It should be noted that the diode D3 of the second measuring circuit 302 the 3rd, 3rd resistor R3, the 4th resistance R4, the four or two Pole pipe D4, the 5th resistance R5 and single-chip microcomputer.Wherein, the 3rd diode D3,3rd resistor R3 and the 4th resistance R4 are GB/T 18487.1-2015 specified in control guidance circuit fix composition.4th diode D4 and the 5th resistance R5 constitutes pulses switch Circuit, 5V square waves are converted into by 9V square waves or 6V square waves, the impulse sampling passage of single-chip microcomputer are output to, inside single-chip microcomputer Timed capture function, measures the frequency and dutycycle of pulse, and show the frequency and dutycycle that measure by display module.
Single-chip microcomputer is received after square wave, and the cycle of square wave, the inverse of calculating cycle are measured by timed capture functional measurement Obtain the frequency of the CP signals.Meanwhile, pass through the timed capture functional measurement significant level time shared within a cycle Ratio, obtains the dutycycle of the CP signals.
The present embodiment provide charging pile test device, by the 3rd diode D3,3rd resistor R3, the 4th resistance R4, 4th diode D4, the 5th resistance R5 and single-chip microcomputer are measured to the frequency and dutycycle of CP signals, and pass through display module The frequency and dutycycle are shown, so that tester determines the frequency and dutycycle of CP signals by display module.
Further, on the basis of each above-mentioned embodiment, as shown in figure 3, the 3rd measuring circuit 303 includes 5th diode D5, the second electric capacity C2, add circuit are (for example, the 6th resistance R6, the 7th resistance R7 in Fig. 3, first following and putting Big device U1 and the second follow-up amplifier U2) and the single-chip microcomputer;
The first end of the 5th diode D5 is used as the input of the 3rd measuring circuit 303, the five or two pole Pipe D5 the second end connects the first end of the second electric capacity C2, the second end connection common port DGND of the second electric capacity C2;
The first end of the second electric capacity C2 connects the first end of the add circuit, and the second end of the add circuit connects The 2nd ADC sampling channels of the single-chip microcomputer are connect, the 3rd output end connection corresponding with the 2nd ADC sampling channels is described aobvious Show module;
During testing the charging pile to be tested, the single-chip microcomputer will be transmitted to the 2nd ADC and adopt The analog signal of sample passage is converted into data signal, calculates the valley of the CP signals according to the add circuit, described and lead to Cross the valley that the display module shows the CP signals.
The add circuit includes the 6th resistance R6, the 7th resistance R7, the first follow-up amplifier U1 and second and follows amplification Device U2;
The first end of the second electric capacity C2 connects the first end of the 6th resistance R6, the second of the 6th resistance R6 End connection the 7th resistance R7 first end and the input of the first follow-up amplifier U1, first follow-up amplifier U1 output end connects the 2nd ADC sampling channels of the single-chip microcomputer;
The input connection reference voltage V of the second follow-up amplifier U2ref, the second follow-up amplifier U2's is defeated Go out end connection second ends of the 7th resistance R7.
Further, the second follow-up amplifier U2 and the reference voltage VrefBetween also include resistance R10.Wherein, Resistance R10 is used for current limliting, and circuit is played a protective role.
It should be noted that wherein the valley of CP signals is charged by the 5th diode D5 to the second electric capacity C2, C2 Possesses voltage holding effect.Because the second electric capacity C2 voltage is negative value, it is impossible to be directly entered single-chip microcomputer and measure, thus it is logical Cross the second follow-up amplifier U2, the 6th resistance R6 and the 7th resistance R7 constitutes add circuit, negative pressure is raised, then is input to 2nd ADC input channels of single-chip microcomputer, carry out sampling calculating.Wherein, VrefOn the basis of voltage, amplification is followed by R10 and second Device U2, which is constituted, follows amplifying circuit to be output to the 7th resistance R7, to provide the positive voltage in add circuit.
Specifically, according to circuit connecting relation, if the voltage of the second electric capacity C2 first end is V1, input to the 2nd ADC The voltage of input channel is V0, the 6th resistance R6 resistance is R6, the 7th resistance R7 resistance is R7, then:
According to above formula, the valley point voltage of CP signals
Thus, single-chip microcomputer collection is inputted to the magnitude of voltage V of the single-chip microcomputer0, according toI.e. The valley of CP signals can be calculated, is then shown the valley of CP signals by display module.
The charging pile test device that the present embodiment is provided, includes the 5th diode D5, second by the 3rd measuring circuit 303 Electric capacity C2, add circuit and single-chip microcomputer are that can be achieved to measure the valley of the CP signals of charging pile, and pass through display module The valley of CP signals is shown, so that tester determines the valley of CP signals by display module.
Further, on the basis of each above-mentioned embodiment, as shown in figure 4, the CC resistance measuring circuits include 8th resistance R8, the 3rd follow-up amplifier U3, the 4th follow-up amplifier U4 and the single-chip microcomputer;
During testing the charging pile to be tested, the first end of the 8th resistance R8 connects the CC Control lead (equivalent to connection CC resistance) and the input of the 3rd follow-up amplifier U3;
The input connection reference voltage V of the 4th follow-up amplifier U4ref, the 4th follow-up amplifier VrefIt is defeated Go out end connection the 8th resistance R8 the second end;
The output end of the 3rd follow-up amplifier U3 connects the 3rd ADC sampling channels of the single-chip microcomputer, with described the Corresponding 4th output end of three ADC sampling channels connects the display module;
During testing the charging pile to be tested, the single-chip microcomputer will be transmitted to the 3rd ADC and adopt The analog signal of sample passage is converted into data signal, and the resistance value of the CC resistance is calculated according to the 8th resistance R8, and leads to Cross the resistance value that the display module shows the CC resistance.
Further, in addition to be arranged on the 3rd follow-up amplifier U3 output end and the 3rd ADC sampling The 9th resistance R9 and the 3rd electric capacity C3 between passage;
The output end of the 3rd follow-up amplifier U3 connects the first end of the 9th resistance R9, the 9th resistance R9 The second end connect the 3rd ADC sampling channels and the 3rd electric capacity C3 first end, the second of the 3rd electric capacity C3 End connection common port DGND;
The 9th resistance R9 and the 3rd electric capacity C3 are to the output end output from the 3rd follow-up amplifier U3 Analog signal is filtered processing, and by the analog signal transmission after filtering process to the 3rd ADC sampling channels.
Further, the 4th follow-up amplifier U4 and the reference voltage VrefBetween also include resistance R11.Its In, resistance R11 is used for current limliting, and circuit is played a protective role.
It should be noted that in the CC resistance measuring circuits that the present embodiment is provided, the 8th resistance R8 and CC resistance constitutes one Component volt circuit, is filtered after the 3rd follow-up amplifier U3 follows amplification, then through the 9th resistance R9 and the 3rd electric capacity C3, Into the 3rd ADC sampling channels of single-chip microcomputer, the resistance that sampling calculates CC is carried out.
Specifically, according to circuit connecting relation, if the voltage at CC resistance and the 8th resistance R8 tie points is V2, input is extremely The voltage of 3rd ADC input channels is Va, the resistance of CC resistance is Rcc, the 8th resistance R8 resistance is R8, then:
According to above formula, the resistance of CC resistance
Thus, single-chip microcomputer collection is inputted to the magnitude of voltage V of the single-chip microcomputera, according toCC electricity can be calculated The resistance of resistance, is then shown the resistance of CC resistance by display module.
The charging pile test device that the present embodiment is provided, is followed by the 8th resistance R8, the 3rd follow-up amplifier U3, the 4th Amplifier U4 and single-chip microcomputer are measured to the resistance of CC resistance, and show the resistance of CC resistance by display module, to survey Examination personnel determine the resistance of the CC resistance of charging pile to be tested by display module.
Further, on the basis of each above-mentioned embodiment, as shown in Fig. 2 also referring to including CP indicator lamps 205 and CC Show lamp 206, the CP indicator lamps 205 and the CC indicator lamps 206 are all connected with the single-chip microcomputer;
Wherein, the single-chip microcomputer judges whether the frequency of the CP signals is in predeterminated frequency scope and the dutycycle and is It is no in default duty cycle range, if the frequency of the CP signals is not in the range of the predeterminated frequency or the CP signals Dutycycle then controls the CP indicator lamps to send and is unsatisfactory for wanting corresponding to the CP signals not in the default duty cycle range The first prompt message asked;
The single-chip microcomputer judges the resistance value of the CC resistance whether in default CC Standard resistance ranges, if the CC resistance Resistance value then controls the CC indicator lamps to send and is unsatisfactory for wanting corresponding to the CC resistance not in the default CC Standard resistance ranges The second prompt message asked.
It should be noted that predeterminated frequency scope be prespecified frequency range, for example, CP frequency 1KHZ ± The scope of 3%, CP dutycycle is 10%-85%.As long as having one in the frequency and dutycycle of CP signals not set in advance In the range of, then control CP indicator lamps to send the first prompt message.For example, when frequency or dutycycle are unsatisfactory for requiring, control CP indicator lamps 205 are lighted.Similarly, when the resistance value of CC resistance is unsatisfactory for requiring that then control CC indicator lamps 206 are lighted.
It is electric in detection plate after power supply in the method that the present embodiment is provided, resistance is measured by CC pipette tips CC resistance is entered Row measurement, contrasts pipette tips resistance, if meeting Standard, CC indicator lamps is lighted, to represent that CC resistance is qualified, otherwise not Lighted.By CP measuring circuits measure CP signals frequency, dutycycle and peak value, if the frequency of CP signals, dutycycle and Peak value meets Standard, then lights CP indicator lamps, otherwise do not lighted.
Further, on the basis of each above-mentioned embodiment, in addition to voltmeter and load extension mouth;
During testing charging pile to be tested, the voltmeter shows the voltage exported to the charging pile The magnitude of voltage measured.
The charging pile test device that the present embodiment is provided, charging pile controlling switch is by the connection status of convert resistance come mould Intend guiding rule specified in national standard, charging pile output voltage can just be made by switching control switch, A.C. voltmeter is to defeated Go out voltage to measure and show by liquid crystal display.It is electric in detection plate after power supply, resistance is measured to pipette tips CC resistance by CC Measure, and pass through the CC electricity of peak value, valley, frequency and dutycycle of the display module to the CP signals of measurement, and measurement The resistance of resistance is shown, realizes comprehensive measurement to the electric parameter of charging pile.
Finally it should be noted that:The above embodiments are merely illustrative of the technical solutions of the present invention, rather than its limitations;Although The present invention is described in detail with reference to the foregoing embodiments, it will be understood by those within the art that:It still may be used To be modified to the technical scheme described in foregoing embodiments, or equivalent substitution is carried out to which part technical characteristic; And these modification or replace, do not make appropriate technical solution essence depart from various embodiments of the present invention technical scheme spirit and Scope.

Claims (10)

1. a kind of charging pile test device, it is characterised in that including CP circuitry for signal measurement and CC resistance measuring circuits;
Wherein, during testing charging pile to be tested, the CP circuitry for signal measurement and the trial charging to be measured The CP control lead connections of stake, peak value, valley, frequency and the dutycycle of the CP signals for measuring the charging pile to be tested;
During testing charging pile to be tested, the CC of the CC resistance measuring circuits and the charging pile to be tested Control lead connection, the CC resistance values for measuring the charging pile to be tested.
2. the test device according to claim 1, it is characterised in that also including display module;
The display module connects the CC resistance measuring circuits and the CP circuitry for signal measurement, for showing the CC resistance The CC resistance values of measuring circuit measurement, and display CP circuitry for signal measurement measurement the CP signals frequency, Dutycycle, valley and peak value.
3. the test device according to claim 2, it is characterised in that the CP circuitry for signal measurement includes being used to measure Second measurement electricity of the first measuring circuit of the peak value of the CP signals, the frequency for measuring the CP signals and dutycycle Road, and for measuring the measuring circuit of valley the 3rd of the CP signals;
Wherein, first measuring circuit includes the first diode, the second diode, the first electric capacity, first resistor, second resistance And single-chip microcomputer;
The first end of first diode is used as the input of first measuring circuit, the second end of first diode Connect the first end of first electric capacity, the second end connection common port of first electric capacity;
The first end of the first resistor connects the first end of first electric capacity, and the second end connection of the first resistor is described The first end of second resistance, the second end connection common port of the second resistance;
The first end of the second resistance connects the input of the first ADC sampling channels of the single-chip microcomputer, with the first ADC Corresponding first output end of sampling channel connects the display module;
Second diode is used as clamp diode, the first end connection high level of second diode, the connection of the second end The input of the first ADC sampling channels;
During testing the charging pile to be tested, the CP signals pass through described in first diode pair One electric capacity is charged, and first electric capacity is discharged by the first resistor and the second resistance and transmitted to the first ADC Sampling channel, the single-chip microcomputer is according to transmitting to the peak value of CP signals described in the signal of change of the first ADC sampling channels.
4. the test device according to claim 3, it is characterised in that second measuring circuit includes the three or two pole Pipe, 3rd resistor, the 4th resistance, the 4th diode, the 5th resistance and the single-chip microcomputer;
The first end of 3rd diode is used as the input of second measuring circuit, the second end of the 3rd diode Connect the first end of the 3rd resistor, the second end connection common port of the 3rd resistor;
The first end of the 3rd resistor connects the first end of the 4th diode, and the first end of the 4th diode connects Connect the first end of the 4th resistance, the second end connection charging control switch of the 4th resistance;
Second end of the 4th diode connects the first end of the 5th resistance and the impulse sampling passage of the single-chip microcomputer, The second end connection high level of 5th resistance;The second output end corresponding with the impulse sampling passage connects the display Module;
During testing the charging pile to be tested, the single-chip microcomputer by timed capture function determine transmit to The frequency and dutycycle of the signal of the impulse sampling passage, and the frequency and the duty are shown by the display module Than.
5. the test device according to claim 3, it is characterised in that the 3rd measuring circuit includes the five or two pole Pipe, the second electric capacity, add circuit and the single-chip microcomputer;
The first end of 5th diode is used as the input of the 3rd measuring circuit, the second end of the 5th diode Connect the first end of second electric capacity, the second end connection common port of second electric capacity;
The first end of second electric capacity connects the first end of the add circuit, and the second end connection of the add circuit is described 2nd ADC sampling channels of single-chip microcomputer, the 3rd output end corresponding with the 2nd ADC sampling channels connects the display mould Block;
During testing the charging pile to be tested, it is logical that the single-chip microcomputer will be transmitted to the 2nd ADC samplings The analog signal in road is converted into data signal, calculates the valley of the CP signals according to the add circuit, described and pass through institute State the valley that display module shows the CP signals.
6. the test device according to claim 5, it is characterised in that the add circuit includes the 6th resistance, the 7th Resistance, the first follow-up amplifier and the second follow-up amplifier;
The first end of second electric capacity connects the first end of the 6th resistance, and the second end connection of the 6th resistance is described The input of the first end of 7th resistance and first follow-up amplifier, the output end connection institute of first follow-up amplifier State the 2nd ADC sampling channels of single-chip microcomputer;
The input connection reference voltage of second follow-up amplifier, the output end connection of second follow-up amplifier is described 7th the second end of resistance.
7. the test device according to claim 2, it is characterised in that the CC resistance measuring circuits include the 8th electricity Resistance, the 3rd follow-up amplifier, the 4th follow-up amplifier and the single-chip microcomputer;
During testing the charging pile to be tested, the first end of the 8th resistance connects the CC controls and drawn The input of line and the 3rd follow-up amplifier;
The input connection reference voltage of 4th follow-up amplifier, the output end connection of the 4th follow-up amplifier is described Second end of the 8th resistance;
The output end of 3rd follow-up amplifier connects the 3rd ADC sampling channels of the single-chip microcomputer, is adopted with the 3rd ADC Corresponding 4th output end of sample passage connects the display module;
During testing the charging pile to be tested, it is logical that the single-chip microcomputer will be transmitted to the 3rd ADC samplings The analog signal in road is converted into data signal, the resistance value of CC resistance according to the 8th resistance calculations, and by described Display module shows the resistance value of the CC resistance.
8. the device according to claim 7, it is characterised in that also including being arranged on the defeated of the 3rd follow-up amplifier The 9th resistance and the 3rd electric capacity gone out between end and the 3rd ADC sampling channels;
The output end of 3rd follow-up amplifier connects the first end of the 9th resistance, and the second end of the 9th resistance connects Connect the first end of the 3rd ADC sampling channels and the 3rd electric capacity, the second end connection common port of the 3rd electric capacity;
9th resistance and the 3rd electric capacity enter to the analog signal of the output end output from the 3rd follow-up amplifier Row filtering process, and by the analog signal transmission after filtering process to the 3rd ADC sampling channels.
9. the device according to claim 8, it is characterised in that also including CP indicator lamps and CC indicator lamps, the CP refers to Show that lamp and the CC indicator lamps are all connected with the single-chip microcomputer;
Wherein, the single-chip microcomputer judges whether whether the frequency of the CP signals located in predeterminated frequency scope and the dutycycle In default duty cycle range, if the frequency of the CP signals not in the range of the predeterminated frequency or the CP signals duty It is unsatisfactory for what is required corresponding to the CP signals than in the default duty cycle range, then not controlling the CP indicator lamps to send First prompt message;
The single-chip microcomputer judges the resistance value of the CC resistance whether in default CC Standard resistance ranges, if the resistance of the CC resistance Value then controls the CC indicator lamps to send and is unsatisfactory for what is required corresponding to the CC resistance not in the default CC Standard resistance ranges Second prompt message.
10. the device according to claim 1, it is characterised in that also including voltmeter and load extension mouth;
During testing charging pile to be tested, the voltmeter is shown to be carried out to the voltage that the charging pile is exported The magnitude of voltage of measurement.
CN201710702670.1A 2017-08-16 2017-08-16 A kind of charging pile test device Pending CN107315122A (en)

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Application Number Priority Date Filing Date Title
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108254626A (en) * 2018-01-17 2018-07-06 深圳威迈斯电源有限公司 A kind of Vehicular charger wide scope duty ratio CP signal detecting methods based on low-power chip
CN108258761A (en) * 2018-01-26 2018-07-06 北京新能源汽车股份有限公司 A kind of charge/discharge control method and electric vehicle
CN108957141A (en) * 2018-07-27 2018-12-07 北京新能源汽车股份有限公司 Resistance value detection device, charger and the electric car at a kind of connection confirmation end CC

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108254626A (en) * 2018-01-17 2018-07-06 深圳威迈斯电源有限公司 A kind of Vehicular charger wide scope duty ratio CP signal detecting methods based on low-power chip
WO2019140800A1 (en) * 2018-01-17 2019-07-25 深圳威迈斯电源有限公司 Vehicle-mounted charger wide-range duty cycle cp signal detection method based on low-power-consumption chip
CN108258761A (en) * 2018-01-26 2018-07-06 北京新能源汽车股份有限公司 A kind of charge/discharge control method and electric vehicle
CN108258761B (en) * 2018-01-26 2020-07-17 北京新能源汽车股份有限公司 Charging and discharging control method and electric automobile
CN108957141A (en) * 2018-07-27 2018-12-07 北京新能源汽车股份有限公司 Resistance value detection device, charger and the electric car at a kind of connection confirmation end CC
CN108957141B (en) * 2018-07-27 2021-04-06 北京新能源汽车股份有限公司 Resistance detection device, charger and electric automobile who confirms CC end are connected

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