CN107255632A - A kind of Raman spectrum probe extension apparatus for being used to detect deeper solid sample - Google Patents

A kind of Raman spectrum probe extension apparatus for being used to detect deeper solid sample Download PDF

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Publication number
CN107255632A
CN107255632A CN201710499916.XA CN201710499916A CN107255632A CN 107255632 A CN107255632 A CN 107255632A CN 201710499916 A CN201710499916 A CN 201710499916A CN 107255632 A CN107255632 A CN 107255632A
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CN
China
Prior art keywords
inner tube
sample
raman spectrum
extension apparatus
solid sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201710499916.XA
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Chinese (zh)
Inventor
薛晓康
张小沁
刘刚
商照聪
范宾
丁卯
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shanghai Research Institute of Chemical Industry SRICI
Shanghai Tianke Chemical Detection Co Ltd
Original Assignee
Shanghai Research Institute of Chemical Industry SRICI
Shanghai Tianke Chemical Detection Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanghai Research Institute of Chemical Industry SRICI, Shanghai Tianke Chemical Detection Co Ltd filed Critical Shanghai Research Institute of Chemical Industry SRICI
Priority to CN201710499916.XA priority Critical patent/CN107255632A/en
Publication of CN107255632A publication Critical patent/CN107255632A/en
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65Raman scattering

Abstract

The present invention relates to a kind of Raman spectrum probe extension apparatus for being used to detect deeper solid sample, including:Form is offered on inner tube, side wall, the speculum in inner tube is set in the windows be protected sleeve pipe outside inner tube, is arranged on the taper of inner tube front end, is arranged on the focus lens of inner tube rear end.Compared with prior art, the present invention is easy to operate, and the probe stretcher device can be inserted directly into the middle of sample sack, obtains sample Raman spectral information;Simple structure, light path system is made up of quartz glass window, speculum and focus lens, can directly reflect sample spectral signals into detector;Measurement efficiency is high, after probe stretcher device connection Raman spectrum system, and entirely gathering spectrum, matching identification process can complete in a short time.

Description

A kind of Raman spectrum probe extension apparatus for being used to detect deeper solid sample
Technical field
The present invention relates to a kind of detection device, more particularly, to a kind of Raman spectrum for being used to detect deeper solid sample Probe extension apparatus.
Background technology
Because hazardous chemical is complicated and diversified, there are gas, a solid, liquid state, organic volatile, the aqueous solution etc., particularly change It is possible that unknown chemical product and non-principal component, title, the species of chemicals are can determine whether by qualitative analysis in work production, with Just information is provided for follow-up rescue work, so as to tackle chemicals burst accident well.
Raman spectrum has:(1) light source uses laser, because the monochromaticjty of laser is fine, laser Raman spectroscopy peak point Sharp, distinguishing is high.(2) Raman spectrum sample preparation is simple, does not destroy sample, directly can be surveyed for solid sample by solid support Fixed, fluid sample can be contained in cuvette and determine, and solid powder can be placed in transparent polybag on solid support Directly determine or determined using cuvette.(3) it is applied to the measurement of water solution system.(4) spectral line of Raman active is group The relation that polarizability changes with normal mode vibration, therefore frequency multiplication only a small amount of in Raman spectrum and group frequency.So, in laser Raman spectrum Spectral peak is clear on figure, and line number is less, fundamental frequency spectral line often only occurs, it is easy to analysis and identification.(5) detection range is wide, including normal The inorganic matter and organic matter seen, can to large biological molecule, naturally with synthetic material (such as CNT, photonic crystal), ore, Live body animal vegetable tissue, water pollution sample, chemical reaction catalyst etc. realize detection.(6) it can in real time, on the spot detect, survey Constant speed degree is fast, easy to operate simple.Spectrometer can realize the all-wave of high speed using CCD using CCD as spectral detector Section spectral scan characteristic, can foreshorten to the spectral scan time several seconds or even shorter.
Due to Raman spectrum have the advantages that it is above-mentioned, therefore chemical component analysis in be widely used.Raman spectrum (1) For liquid and powder sample, select suitable sample cell to be measured, sample cell is positioned over after containing sample using cuvette In, and close after sample cell lid prevents interference of stray light, connection probe and can be measured;(2) for powder sample, filled Enter in transparent plastic bag, be placed into afterwards on solid support, connection probe, and fixed probe with probe cap, it is measured; (3) for blocks of solid, it is placed on solid support, connection probe, and is fixed probe after being surface-treated with probe cap, It is measured.But it is required for taking sample sack apart in above-mentioned sampling process, loads transparent plastic bag or cuvette after being taken out. And the sample of analysis is surface, it is impossible to represent the sample for being wrapped in the inside.
Chinese patent CN 103792220B disclose the fixed dress of a kind of tail optical fiber of Portable Raman spectrometer and probe Put, it includes the upper lid for placing the casing of Raman spectrometer, and the upper lid is hollow box body, and its side is connected with by loose-leaf One cover plate, cover plate is fastened on lid, and correspondence digging in foam, foam is filled with the cavity of the upper lid placement tail optical fiber and spy The tail optical fiber groove and probe grooves of head, and the track of the tail optical fiber groove is arc.The device of the present invention makes tail optical fiber, probe fixed more It is firmly individual reliable, it is therefore prevented that probe and tail optical fiber rocking in casing, while placing tail optical fiber using the space in hollow upper lid And probe, the volume of whole casing has been saved, has made whole casing compacter and is easy to portable.But the fixing device still without Method is detected to deeper solid sample.
The content of the invention
It is an object of the present invention to overcome the above-mentioned drawbacks of the prior art and provide one kind need not be from sample sack Middle taking-up sample loads transparent plastic bag or cuvette, and the probe extension apparatus of invention can be inserted directly into the middle of sample sack, obtained Take the Raman spectrum probe extension apparatus for being used to detect deeper solid sample of sample Raman spectral information.
The purpose of the present invention can be achieved through the following technical solutions:
A kind of Raman spectrum probe extension apparatus for being used to detect deeper solid sample, including:
Form is offered on inner tube, side wall,
Speculum in inner tube,
The windows be protected sleeve pipe outside inner tube is set in,
The taper of inner tube front end is arranged on,
It is arranged on the focus lens of inner tube rear end.
Described form is embedded with quartz glass, increases the transmitance of Raman reflected light.
Described form is arranged on front end close to the position of taper.
Described speculum is placed in inner tube in 40 °~60 °, and reflecting surface is towards form and focus lens.
Described windows be protected sleeve pipe is Collapsible structure, opens and closes the form in inner tube, can so avoid inserting sample It is the friction to quartzy form, that is, facilitates operation to have to arrive very much and protect quartz glass window.
Described taper is inserted into the middle of testing sample, is pulled open windows be protected sleeve pipe, is exposed quartz glass window so that Sample signal is reflexed in device.
Described focus lens are fastened on the rear end of inner tube through connector level.
Compared with prior art, the present invention has advantages below:
(1) easy to operate, the probe stretcher device can be inserted directly into the middle of sample sack, obtain sample Raman spectrum letter Breath.
(2) simple structure, light path system is made up of quartz glass window, speculum and focus lens, can be by sample spectra Signal is directly reflected into detector, the Laser emission that the speculum in light path system can send Raman spectrum laser to sample On product, also the signal reflex after being scattered through sample can be entered detector.Light is focused using focus lens simultaneously.This can be with Convenient to obtain sample Raman spectral information, luminous intensity will not reduce, it is accurate to test effect.
(3) measurement efficiency is high, after probe stretcher device connection Raman spectrum system, entirely gathers spectrum, compares and know Other process can be completed in a short time.
Brief description of the drawings
Fig. 1 is structural representation of the invention.
In figure, 1- focus lens, 2- windows be protecteds sleeve pipe, 3- forms, 4- tapers, 5- speculums, 6- inner tubes, 7- connections Part.
Embodiment
The present invention is described in detail with specific embodiment below in conjunction with the accompanying drawings.Following examples will be helpful to this area Technical staff further understand the present invention, but the invention is not limited in any way.It should be pointed out that to the general of this area For logical technical staff, without departing from the inventive concept of the premise, various modifications and improvements can be made.These are belonged to Protection scope of the present invention.
Embodiment 1
A kind of Raman spectrum probe extension apparatus for being used to detect deeper solid sample, its structure is as shown in figure 1, bag Include:Form 3 is offered on inner tube 6, side wall, the speculum 5 in inner tube 6 is set in the windows be protected sleeve pipe 2 outside inner tube 6, The taper 4 of the front end of inner tube 6 is arranged on, and is arranged on the focus lens 1 of the rear end of inner tube 6.
Quartz glass is embedded with form 3, so as to increase the transmitance of Raman reflected light.Form 3 is arranged on front end Close to the position of taper.
Speculum 5 is placed in inner tube 6 in 45 °, and reflecting surface is towards form and 3 focus lens.Windows be protected sleeve pipe 2 is can Stretching structure, opens and closes the form in inner tube, and it is the friction to quartzy form that can so avoid insertion sample, that is, facilitates operation to have It can arrive very much and protect quartz glass window.Taper 4 is inserted into the middle of testing sample, is pulled open windows be protected sleeve pipe 2, is exposed quartz Glass vision panel so that sample signal is reflexed in device.Focus lens 1 are fastened on the rear end of inner tube through the level of connector 7.
In the use of the present invention, using following steps:
(1) according to Fig. 1, focus lens 1, windows be protected sleeve pipe 2, taper 4, speculum 5, inner tube 6, connection are sequentially connected Part 7.
(2) terminal, Raman spectrometer are opened and Raman spectrum identifying system is logged in.
(3) preparation of samples.Probe stretcher device is connected in instrument probe, windows be protected sleeve pipe is pulled open, exposes stone English glass vision panel.The device is inserted directly into the middle of sample sack, it is to be measured.
(4) Raman spectroscopy scans are put in storage
That clicks on main interface is scanned into library menu, can enter sample Raman spectroscopy scans and be put in storage functional module, realize sample The scanning of product spectrum and comparison function, and the spectroscopic data of sample can be saved in the database of Raman qualitative recognition system In, it is established that one's own sample spectral data storehouse.
(5) identification compares (sampling check)
" sampling check " button of main interface is clicked on, " sampling check " dialog box is ejected, you can enters the behaviour of sampling check Make.Operation with scanning storage is similar, input " commission numbering ", and clicks on inquiry, you can shows the related data of the commission, grasps Work person can select " reading data to be sampled from spectrometer ", or " being loaded into data to be sampled from external file " two Plant sample mode.
(6) shutdown programm
1) red " X " button in the main menu upper right corner is clicked on, you can the operation of the normal program that logs off.
2) laser probe is closed, and the key on panel behind Raman spectrometer is turned round to " OFF ".
3) switch behind Raman spectrometer on panel is closed.
4) shut down computer.Probe extension apparatus is pulled down, windows be protected sleeve pipe of leaving behind, with standby.
Embodiment 2
A kind of Raman spectrum probe extension apparatus for being used to detect deeper solid sample, including:Opened up on inner tube, side wall There is form, the speculum in inner tube is set in the windows be protected sleeve pipe outside inner tube, is arranged on the taper of inner tube front end, And it is arranged on the focus lens of inner tube rear end.
Quartz glass is embedded with form, so as to increase the transmitance of Raman reflected light.Form is arranged on front end and leaned on The position of nearly taper.Speculum is placed in inner tube in 40 °, and reflecting surface is towards form and focus lens.Windows be protected sleeve pipe For Collapsible structure, the form in inner tube is opened and closed, it is the friction to quartzy form that can so avoid insertion sample, that is, facilitates behaviour Work, which has to arrive very much, protects quartz glass window.Taper is inserted into the middle of testing sample, is pulled open windows be protected sleeve pipe, is exposed stone English glass vision panel so that sample signal is reflexed in device.Focus lens are fastened on the rear end of inner tube through connector level.
Embodiment 3
A kind of Raman spectrum probe extension apparatus for being used to detect deeper solid sample, its structure and embodiment 2 are substantially Identical, difference is:Speculum is placed in inner tube in 60 °, and reflecting surface is towards form and focus lens.
The specific embodiment of the present invention is described above.It is to be appreciated that the invention is not limited in above-mentioned Particular implementation, those skilled in the art can make various deformations or amendments within the scope of the claims, this not shadow Ring the substantive content of the present invention.

Claims (7)

1. a kind of Raman spectrum probe extension apparatus for being used to detect deeper solid sample, it is characterised in that the extension apparatus Including:
Form is offered on inner tube, side wall,
Speculum in inner tube,
The windows be protected sleeve pipe outside inner tube is set in,
The taper of inner tube front end is arranged on,
It is arranged on the focus lens of inner tube rear end.
2. a kind of Raman spectrum probe extension apparatus for being used to detect deeper solid sample according to claim 1, its It is characterised by, described form is embedded with quartz glass.
3. a kind of Raman spectrum probe extension apparatus for being used to detect deeper solid sample according to claim 1, its It is characterised by, described form is arranged on front end close to the position of taper.
4. a kind of Raman spectrum probe extension apparatus for being used to detect deeper solid sample according to claim 1, its It is characterised by, described speculum is placed in inner tube in 40 °~60 °, reflecting surface is towards form and focus lens.
5. a kind of Raman spectrum probe extension apparatus for being used to detect deeper solid sample according to claim 1, its It is characterised by, described windows be protected sleeve pipe is Collapsible structure, opens and closes the form in inner tube.
6. a kind of Raman spectrum probe extension apparatus for being used to detect deeper solid sample according to claim 1, its It is characterised by, described taper is inserted into the middle of testing sample.
7. a kind of Raman spectrum probe extension apparatus for being used to detect deeper solid sample according to claim 1, its It is characterised by, described focus lens are fastened on the rear end of inner tube through connector level.
CN201710499916.XA 2017-06-27 2017-06-27 A kind of Raman spectrum probe extension apparatus for being used to detect deeper solid sample Pending CN107255632A (en)

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CN201710499916.XA CN107255632A (en) 2017-06-27 2017-06-27 A kind of Raman spectrum probe extension apparatus for being used to detect deeper solid sample

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107703117A (en) * 2017-10-31 2018-02-16 上海化工研究院有限公司 A kind of Raman spectrum probe extension apparatus for being used in liquid detect
CN109507124A (en) * 2018-12-01 2019-03-22 湖北理工学院 A kind of plug-in type liquid molten steel composition device for fast detecting
CN112432939A (en) * 2020-11-26 2021-03-02 上海化工院检测有限公司 Optical fiber Raman probe device with drilling function and using method
CN113606692A (en) * 2021-08-11 2021-11-05 深圳市佳泰机电工程有限公司 Engineering design method and device for laying area of radiation air conditioner

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CN102858224A (en) * 2010-04-23 2013-01-02 柯尼卡美能达先进多层薄膜株式会社 Probe
CN103792220A (en) * 2012-10-31 2014-05-14 福州高意通讯有限公司 Apparatus for fixing tail fiber and probe of portable Raman spectrometer
CN106037668A (en) * 2016-07-06 2016-10-26 北京交通大学 Raman probe for in-vivo and in-situ puncture diagnosis

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US8125634B1 (en) * 2009-07-30 2012-02-28 The United States Of America As Represented By The Secretary Of The Navy Optical additive solc filter for deep ultraviolet applications
CN102858224A (en) * 2010-04-23 2013-01-02 柯尼卡美能达先进多层薄膜株式会社 Probe
CN103792220A (en) * 2012-10-31 2014-05-14 福州高意通讯有限公司 Apparatus for fixing tail fiber and probe of portable Raman spectrometer
CN106037668A (en) * 2016-07-06 2016-10-26 北京交通大学 Raman probe for in-vivo and in-situ puncture diagnosis

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107703117A (en) * 2017-10-31 2018-02-16 上海化工研究院有限公司 A kind of Raman spectrum probe extension apparatus for being used in liquid detect
CN109507124A (en) * 2018-12-01 2019-03-22 湖北理工学院 A kind of plug-in type liquid molten steel composition device for fast detecting
CN112432939A (en) * 2020-11-26 2021-03-02 上海化工院检测有限公司 Optical fiber Raman probe device with drilling function and using method
CN113606692A (en) * 2021-08-11 2021-11-05 深圳市佳泰机电工程有限公司 Engineering design method and device for laying area of radiation air conditioner

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Address after: 200062 Shanghai city Putuo District Yunling Road No. 345

Applicant after: Shanghai Chemical Research Institute Co., Ltd.

Applicant after: Shanghai Chemical Institute Testing Co., Ltd.

Address before: 200062 Shanghai city Putuo District Yunling Road No. 345

Applicant before: Shanghai Chemical Research Institute Co., Ltd.

Applicant before: Shanghai Tianke Chemical Detection Co., Ltd.

RJ01 Rejection of invention patent application after publication
RJ01 Rejection of invention patent application after publication

Application publication date: 20171017