CN107153161A - A kind of unified storage array reserce cell intelligent test system - Google Patents

A kind of unified storage array reserce cell intelligent test system Download PDF

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Publication number
CN107153161A
CN107153161A CN201710405271.9A CN201710405271A CN107153161A CN 107153161 A CN107153161 A CN 107153161A CN 201710405271 A CN201710405271 A CN 201710405271A CN 107153161 A CN107153161 A CN 107153161A
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CN
China
Prior art keywords
chip microcomputer
electronic load
barcode scanning
scanning gun
communication interface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201710405271.9A
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Chinese (zh)
Inventor
华要宇
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Zhengzhou Yunhai Information Technology Co Ltd
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Zhengzhou Yunhai Information Technology Co Ltd
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Filing date
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Priority to CN201710405271.9A priority Critical patent/CN107153161A/en
Publication of CN107153161A publication Critical patent/CN107153161A/en
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • G01R31/378Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC] specially adapted for the type of battery or accumulator
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • G01R31/385Arrangements for measuring battery or accumulator variables

Abstract

The invention discloses a kind of unified storage array reserce cell intelligent test system, the system includes:Display unit, for storing test data;The single-chip microcomputer being connected with display unit, charging current and charging voltage for controlling power module by interface signal, controls barcode scanning gun to carry out bar code recognition by communication interface, and electronic load, the test environment of analogue back-up battery are controlled by communication interface;The power module being connected with single-chip microcomputer;The electronic load being connected with single-chip microcomputer;The barcode scanning gun being connected with single-chip microcomputer.The system realizes automatic control power supply module, electronic load and barcode scanning gun, improves detection efficiency.

Description

A kind of unified storage array reserce cell intelligent test system
Technical field
The present invention relates to reserce cell technical field, more particularly to a kind of unified storage array reserce cell intelligence test System.
Background technology
At present, in cloud computing era, mass data needs power down to store.In order to reduce loss of data risk, to backup electricity The reliability in pond proposes higher requirement, need to simulate various environment and reserce cell is tested.Existing reserce cell tests skill Art is directed to how research carries out power down switch protecting, but is detected for reserce cell self performance, still using general EV2300 is combined, it is necessary to artificial detection with power module, electronic load, although can detect reserce cell partial properties, but intelligence Energyization, automaticity are relatively low, and detection efficiency is relatively low, and mass detection backup storage battery has bottleneck.
The content of the invention
It is an object of the invention to provide a kind of unified storage array reserce cell intelligent test system, automatically controlled with realizing Power module, electronic load and barcode scanning gun, improve detection efficiency.
In order to solve the above technical problems, the present invention provides a kind of unified storage array reserce cell intelligent test system, bag Include:
Display unit, for storing test data;
The single-chip microcomputer being connected with display unit, charging current and charging electricity for controlling power module by interface signal Pressure, controls barcode scanning gun to carry out bar code recognition by communication interface, and electronic load, analogue back-up battery are controlled by communication interface Test environment;
The power module being connected with single-chip microcomputer;
The electronic load being connected with single-chip microcomputer;
The barcode scanning gun being connected with single-chip microcomputer.
It is preferred that, the single-chip microcomputer also includes LC filter circuits.
It is preferred that, the single-chip microcomputer also includes linear isolation chip.
It is preferred that, the single-chip microcomputer produces two-way pwm signal, and the defeated of power module is controlled by adjusting PWM duty cycle Go out magnitude of voltage and output current value.
It is preferred that, the single-chip microcomputer is communicated with electronic load by communication interface, and electronics is set according to communications protocol The mode of operation of load.
It is preferred that, the single-chip microcomputer is communicated with barcode scanning gun by communication interface, reads barcode scanning gun and bar code is swept Value is retouched, scan values and the PN codes that are read by bus are compared, if unanimously, bar code recognition success.
It is preferred that, the single-chip microcomputer is additionally operable to be communicated by bus with reserce cell, under the test environment of simulation Control is charged and discharged to reserce cell.
A kind of unified storage array reserce cell intelligent test system provided by the present invention, including:Display unit, is used for Store test data;The single-chip microcomputer being connected with display unit, for by interface signal control power module charging current and Charging voltage, controls barcode scanning gun to carry out bar code recognition by communication interface, and electronic load is controlled by communication interface, simulates standby The test environment of part battery;The power module being connected with single-chip microcomputer;The electronic load being connected with single-chip microcomputer;With monolithic The connected barcode scanning gun of machine.It can be seen that, in the system, pass through interface signal, communication interface intelligent control power module, Electronic Negative Carry, barcode scanner works, the test environment of the unified storage array reserce cell of simulation reaches intelligentized control method purpose, test process Artificial participation is not required to, testing efficiency is improved, mass detection reserce cell technical bottleneck is especially solved, therefore the system is realized Automatic control power supply module, electronic load and barcode scanning gun, improve detection efficiency.
Brief description of the drawings
In order to illustrate more clearly about the embodiment of the present invention or technical scheme of the prior art, below will be to embodiment or existing There is the accompanying drawing used required in technology description to be briefly described, it should be apparent that, drawings in the following description are only this The embodiment of invention, for those of ordinary skill in the art, on the premise of not paying creative work, can also basis The accompanying drawing of offer obtains other accompanying drawings.
Fig. 1 is a kind of structural representation of unified storage array reserce cell intelligent test system provided by the present invention;
Fig. 2 is the control algolithm flow chart of unified storage array reserce cell intelligent test system.
Embodiment
The core of the present invention is to provide a kind of unified storage array reserce cell intelligent test system, is automatically controlled with realizing Power module, electronic load and barcode scanning gun, improve detection efficiency.
In order that those skilled in the art more fully understand the present invention program, below in conjunction with the embodiment of the present invention Accompanying drawing, the technical scheme in the embodiment of the present invention is clearly and completely described, it is clear that described embodiment is only A part of embodiment of the present invention, rather than whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art The every other embodiment obtained under the premise of creative work is not made, belongs to the scope of protection of the invention.
Term is explained as follows:
BBU (Battery Backup Units) represents Backup Battery Unit;SMBUS(System Management Bus System Management Bus) is represented.
Fig. 1 is a kind of structural representation of unified storage array reserce cell intelligent test system provided by the present invention, The system includes:
Display unit 101, for storing test data;
The single-chip microcomputer 102 being connected with display unit 101, the charging electricity for controlling power module 103 by interface signal Stream and charging voltage, control barcode scanning gun 105 to carry out bar code recognition, electronic load are controlled by communication interface by communication interface 104, the test environment of analogue back-up battery;
The power module 103 being connected with single-chip microcomputer 102;
The electronic load 104 being connected with single-chip microcomputer 102;
The barcode scanning gun 105 being connected with single-chip microcomputer 102.
It can be seen that, in the system, pass through interface signal, communication interface intelligent control power module, electronic load, barcode scanner work Make, the test environment of the unified storage array reserce cell of simulation reaches intelligentized control method purpose, and test process is not required to artificial ginseng With, testing efficiency is improved, mass detection reserce cell technical bottleneck is especially solved, therefore the system is realized and automatically controls electricity Source module, electronic load and barcode scanning gun, improve detection efficiency.
Based on said system, specifically, single-chip microcomputer also includes LC filter circuits.
Further, single-chip microcomputer also includes linear isolation chip.
Wherein, single-chip microcomputer produces two-way pwm signal, and the output voltage of power module is controlled by adjusting PWM duty cycle Value and output current value.
Wherein, single-chip microcomputer is communicated with electronic load by communication interface, and electronic load is set according to communications protocol Mode of operation.
Wherein, single-chip microcomputer is communicated with barcode scanning gun by communication interface, reads scan values of the barcode scanning gun to bar code, will Scan values are compared with the PN codes read by bus, if unanimously, bar code recognition success.
Further, single-chip microcomputer is additionally operable to be communicated by bus with reserce cell, right under the test environment of simulation Reserce cell charges and discharges control
In the system, single-chip microcomputer is combined with power module, electronic load, and the unified storage array reserce cell of simulation is various Application environment, carries out simulation test.The unified storage storage various application environments of array system reserce cell of single-chip simulation, intelligence control Power module processed, electronic load, barcode recognition equipment, improve measurement efficiency, by simulated experiment, and whether checking system design deposits In defect, shorten the project development cycle, improve system design stability, reliability.The system passes through interface signal intelligent control Power module, electronic load, barcode scanner work, the various applications of BBU in unified memory array system are simulated by bus communication Environment, reaches intelligentized control method purpose, realizes and carries out various simulation tests to reserce cell, shortens the construction cycle, improves unified Storage display stability, reliability.
Based on the system, detailed, single-chip microcomputer is as CPU, with the one piece of man-machine friendship of composition of button display portion Mutual connection interface, can set multigroup different test datas, and every group of test data can select BBU to test type, test-types etc.. It can remember after multigroup test data power down, tester can be with selecting test group according to test case.Display unit is intelligent display Unit, can not only store multigroup test parameter, moreover it is possible to record multigroup test data.Power module is controlled to charge by interface signal Electric current and charging voltage.Power module can be exported with constant pressure, can also constant current output.Electronic load is controlled by communication interface, Simulate various test environments.Electronic load is a kind of intelligent electronic load, can simulate constant pressure, constant current, invariable power, constant-resistance value Load.Barcode scanning gun is controlled to carry out bar row code automatic identification by communication interface.Single-chip microcomputer sends various refer to by bus to BBU Order, is not required to artificial participation, and intelligence carries out charge control, control of discharge, load capacity test, protective capability test, interrupted performance Test.
The system can set multigroup different pieces of information, and tester can be with selecting test group according to test case.Believed by interface Number intelligent control power module, electronic load, barcode scanner work.Test process is not required to artificial participation, improves testing efficiency, especially Solve mass detection reserce cell technical bottleneck.The various of BBU in unified memory array system are simulated by bus communication Application environment, can verify whether system design is reasonable, shortens the construction cycle within the shortest time, improve unified storage array Stability, reliability.
The system is used as central processing system, test item and the key selection of test type one, various test work(using single-chip microcomputer Can one-key operation, raising testing efficiency.The various application environments of the unified storage array reserce cell of simulation, are carried out complete to reserce cell Face is tested, and whether the unified memory array system design of checking is reasonable, shortens the project development cycle, improves system design stable Property, reliability.
Detailed, in specific implementation process, intelligent control algorithm reasonable in design, control power module, electronic load, bar shaped Barcode scanning gun, the various application environments of the unified Memory array reserce cell of simulation, can also set communication protection circuit, it is ensured that intelligent testing Test system stability, reliability.To reach intelligent control purpose, using single-chip microcomputer as central processing system, KEIL is exploitation ring Border, its intelligent control algorithm flow chart of C language programming realization such as Fig. 2.In order to ensure that unified storage array intelligent test system exists It is unaffected under complicated adverse circumstances, improve intelligent test system stability, reliability, can using analog signal isolation circuit, Communicate protection circuit.
The system intelligent control power module, electronic load, bar shaped barcode scanning gun, reach the unified storage array backup electricity of simulation The various application environments in pond, carry out supplied materials, product export test or electric performance test.Supplied materials, product export test are substantially carried out Electric power detection and charge and discharge control, it is ensured that and dump energy meets UN38.3 requirements.The unified storage battle array of electric performance test simulation Row reserce cell application environment, checking reserce cell performance indications match with system design, shorten the construction cycle, improve system Design stability, reliability.
Detailed, single-chip microcomputer produces two-way pwm signal, regulation PWM duty cycle control power module output voltage, current value Size.Linear isolating chip control power module again after two-way pwm signal is filtered through LC.Single-chip microcomputer passes through logical with electronic load Communication interface is communicated, with setting electronic load mode of operation according to communications protocol, is constant current, invariable power, permanent resistance, while with evidence Experiment demand setting constant current value, invariable power value, permanent resistance value.Single-chip microcomputer is communicated with barcode scanning list rifle by communication interface, and reading is swept The scan values of code rifle, barcode scanning gun scan values are compared with reading PN code-phases by bus, judge whether two PN codes are consistent, are reached certainly The purpose of dynamic identification.Single-chip microcomputer, by bus communication, reads BBU working conditions with BBU, sets charging current, charging voltage value, Read charging current, charging voltage, discharge current, discharge voltage value.By bus communication between central control system and BBU, Be reconfigured at corresponding control supervisor BBU is charged, control of discharge, simulate various application environments and test.The system can not only be used In unified storage array reserce cell test system, it can be applied to any system containing reserce cell and carry out simulated experiment.
Detailed Jie has been carried out to a kind of unified storage array reserce cell intelligent test system provided by the present invention above Continue.Specific case used herein is set forth to the principle and embodiment of the present invention, and the explanation of above example is only It is the method and its core concept for being used to help understand the present invention.It should be pointed out that for those skilled in the art For, under the premise without departing from the principles of the invention, some improvement and modification can also be carried out to the present invention, these improve and repaiied Decorations are also fallen into the protection domain of the claims in the present invention.

Claims (7)

1. a kind of unified storage array reserce cell intelligent test system, it is characterised in that including:
Display unit, for storing test data;
The single-chip microcomputer being connected with display unit, charging current and charging voltage for controlling power module by interface signal, Control barcode scanning gun to carry out bar code recognition by communication interface, electronic load is controlled by communication interface, analogue back-up battery Test environment;
The power module being connected with single-chip microcomputer;
The electronic load being connected with single-chip microcomputer;
The barcode scanning gun being connected with single-chip microcomputer.
2. the system as claimed in claim 1, it is characterised in that the single-chip microcomputer also includes LC filter circuits.
3. system as claimed in claim 2, it is characterised in that the single-chip microcomputer also includes linear isolation chip.
4. system as claimed in claim 3, it is characterised in that the single-chip microcomputer produces two-way pwm signal, by adjusting PWM Dutycycle controls the output voltage values and output current value of power module.
5. system as claimed in claim 4, it is characterised in that the single-chip microcomputer is led to electronic load by communication interface News, the mode of operation of electronic load is set according to communications protocol.
6. system as claimed in claim 5, it is characterised in that the single-chip microcomputer is led to barcode scanning gun by communication interface News, read barcode scanning gun to the scan values of bar code, and scan values and the PN codes that are read by bus are compared, if unanimously, Bar code recognition success.
7. the system as described in any one in claim 1 to 6, it is characterised in that the single-chip microcomputer is additionally operable to and backup electricity Pond is communicated by bus, charges and discharges control to reserce cell under the test environment of simulation.
CN201710405271.9A 2017-05-31 2017-05-31 A kind of unified storage array reserce cell intelligent test system Pending CN107153161A (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107678902A (en) * 2017-10-31 2018-02-09 郑州云海信息技术有限公司 A kind of method of testing and its device of unified storage array
CN109387792A (en) * 2018-10-30 2019-02-26 郑州云海信息技术有限公司 A kind of unified storage array intelligence power consumption test system

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JP3736563B2 (en) * 1993-12-24 2006-01-18 ソニー株式会社 Battery evaluation device
JP2003115330A (en) * 2001-10-04 2003-04-18 Nec Mobile Energy Kk Battery pack testing device
CN201348658Y (en) * 2009-01-04 2009-11-18 吴劲松 Battery tester
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
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CN109387792A (en) * 2018-10-30 2019-02-26 郑州云海信息技术有限公司 A kind of unified storage array intelligence power consumption test system

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Application publication date: 20170912