CN106973287A - A kind of test system for cmos sensor - Google Patents
A kind of test system for cmos sensor Download PDFInfo
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- CN106973287A CN106973287A CN201710196104.8A CN201710196104A CN106973287A CN 106973287 A CN106973287 A CN 106973287A CN 201710196104 A CN201710196104 A CN 201710196104A CN 106973287 A CN106973287 A CN 106973287A
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N17/00—Diagnosis, testing or measuring for television systems or their details
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Abstract
The present invention relates to a kind of test system for cmos sensor, the technical problem that test function is few, test chip quantity is few present in prior art is mainly solved, the present invention is by using including directional light lamp box；Quantity is N without camera lens cmos sensor, with the parallel optical position corresponding during no camera lens cmos sensor test；The test board being connected with without camera lens cmos sensor, test board includes the imaging sensor for being used to gather signal data；Test board fixed plate is both secured to without camera lens cmos sensor and test board, the test board fixed mount is fixedly connected on lifting platform；The test board is connected by USB2.0 with control unit, described control unit is also connected with lifting platform, the technical scheme that described control unit is connected by USB cable and serial ports with host computer, preferably resolves the problem, available in cmos sensor performance test.
Description
Technical field
The present invention relates to sensor test field, a kind of test system for cmos sensor is related specifically to.
Background technology
The cmos sensor done of adopting new technology is generally required to be estimated to circuit and pixel performance, so that follow-up use should
Technique is produced in batches.Since to be estimated test to circuit and pixel performance, then be accomplished by carrying out data acquisition, so
Conversion is carried out to data afterwards and draws desired data.Assessment circuit and pixel performance are a critically important link, test chip
Quantity is relatively more, may be tens even up to a hundred, and needs to capture many pictures per chips and analyzed, and workload is still
Than larger, the condition of every test will be consistent, and test environment need to be placed in sealed light box, pass through the control system pair
Data are acquired and computing.
Existing test system be typically only capable to it is single to the circuit and pixel performance of cmos sensor test, and only
A cmos sensor chip can be tested.There is the technical problem that test function is few, test quantity is few in it.Therefore it provides a kind of
The test system that test function is complete, test chip quantity is more, easy to use is just necessary.
The content of the invention
The technical problems to be solved by the invention are that test function present in prior art is few, test chip quantity is few
Technical problem.A kind of new test system for cmos sensor is provided, the test system have test function it is complete, can
The characteristics of once carrying out multi-chip test.
In order to solve the above technical problems, the technical scheme used is as follows：
A kind of test system for cmos sensor, the test system includes providing the directional light lamp box of directional light；
Quantity is N without camera lens cmos sensor, described corresponding with the parallel optical position when being tested without camera lens cmos sensor；With institute
The test board of no camera lens cmos sensor connection is stated, the test board includes the imaging sensor for being used to gather signal data；Institute
State no camera lens cmos sensor and test board is both secured to test board fixed plate, the test board fixed plate is fixedly connected on lifting
Platform；The test board is connected by USB2.0 with control unit, and described control unit is also connected with lifting platform, and the control is single
Member is connected by USB cable and serial ports with host computer；In the test system host computer be located at sealing light box outside, test system its
Remaining part point is positioned in sealing light box；The host computer controls control unit to carry out lifting platform position, directional light lamp by serial ports
Case and USB cable channel selecting；It is described homogeneous without camera lens cmos sensor quantity and test board quantity, test board fixed plate quantity
Together；Wherein, N is positive integer.
In above-mentioned technical proposal, for optimization, further, described control unit includes MCU control panels and USB line road is opened
Close, the MCU control panels are used to control lifting platform position and directional light lamp box, and the USB line way switch is used to select USB cable
Passage.
Further, the directional light lamp box is DNP lamp boxes.
Further, the USB2.0 includes the data lines of VBUS, USB_DP, USB_DP, GND tetra-, for correspondence CMOS
D0~D7, HS, VS, pixel, CLK, SDA, SCK, PWDN data wire of sensor.
Further, the N=3.
The present invention also provides a kind of application method of the test system for cmos sensor, including：
(1) will be without the assembling of camera lens cmos sensor on test board, test board is fixed on fixed mount, places sealing camera bellows
It is interior；
(2) host computer sends instructions to control unit by serial ports, opens directional light lamp box, regulation lifting platform position will
DNP lamp boxes are directed at successively including the test board without camera lens cmos sensor, and control unit controls corresponding USB cable to connect with host computer
It is logical, connect test board, after the completion of control unit feedback command to host computer, host computer passes through on control unit initialization test plate
Without camera lens cmos sensor chip parameter,
(3) exposure time values are set, it is continuous to clap after 100 pictures, according to predetermined path preserve every group the time for exposure institute
100 pictures of collection are a file, and host computer sends instruction, turns off light source；Setting illumination is completely black Dark, claps 5
After picture；
(4) light source is opened, time for exposure increase, repeat step (3) is maximum until the time for exposure, completes chip data and adopts
Collection, into step (5)；
(5) log-on data routine processes chip data；
(6) step (7) is entered after being completed without camera lens cmos sensor on repeat step (2)-(5), test board；
(7) sealing camera bellows is opened, takes out without camera lens cmos sensor, carries out next round test.
In above-mentioned technical proposal, to optimize, further, without camera lens cmos sensor chip parameter in the step (2)
Including data output format, PGA gains, ADC scopes, low 8bit outputs and time for exposure.
Further, the low 8bit is output as high 8bit outputs.
Further, the step (5) includes：
(A) path is set, the pictures of current file 100 are read, average mean_illumination；
(B) according to 5 pictures under completely black Dark, average mean_dark；
(C) Mean_output is calculated according to formula Mean_output=mean_illumination-mean_dark
Value；
(D) average picture is obtained according to the superposition of 100 pictures, asks standard deviation to draw FPN data in the average picture；
(E) 100 values corresponding to each pixel seek standard variance, and random noise is obtained after the standard variance is averaged
Value；
(F) the FPN data are preserved, random noise value is used to draw photoelectric curve.
The present invention gathers the data of no camera lens cmos sensor by integrated multiple data acquisition devices respectively, by upper
Machine obtains and data processing is carried out after the data, completes disposable test multiple without camera lens cmos sensor.The program by using
Multiple test boards on lifting platform are fixed on, each test board is provided with the image processor for data acquisition, image procossing
Device is connected to host computer by control unit.Accordingly, host computer selects test board test corresponding successively by control unit
Without camera lens cmos sensor.In data processing section, the present invention is calculated by using Mean Superposition.Due to output data
Form is Raw data, and each pixel is made up of four components, is R, G1, G2, B respectively.Four components are calculated according to formula
Standard deviation square value：
R=[∑ (Xi-X)) ^2]/n } ^ (1/2)
G1=[∑ (Xi-X)) ^2]/n } ^ (1/2)
G2=[∑ (Xi-X)) ^2]/n } ^ (1/2)
B=[∑ (Xi-X)) ^2]/n } ^ (1/2)
Wherein, X is average value, and Xi is i-th of data.
100 values corresponding to each pixel seek standard deviation square value, and standard deviation square value is averaging and obtains random noise value,
The random noise value of four components is similarly also obtained, four components include F, G1, G2 and R.By obtained data, it is saved in
In Excel, such as Fig. 3：
FPN the and Temporal Noise units drawn are LSB, need to be that volt or electronics just have physics meaning by unit conversion
Justice.Reduced voltage value formula (unit mv):LSB*ADC_range/CDS gains/1024/PGA gains.It is 8bit outputs, divided by
1024, if high 8bit outputs are then divided by 256.Be converted to after voltage data, photoelectric curve can be drawn, by curve mode come
The performance for judging chip circuit and pixel is bad.The data collecting system obtains picture, can also calculate other data, bag
Include：
Sensitivity：
Signal to noise ratio：
Photoresponse is inconsistent：
Conversion gain：
Full trap electric charge：
Beneficial effects of the present invention：
Effect one, is disposably carried out multiple without the test of camera lens cmos sensor, raising utilization rate of equipment and installations；
Effect two, it is disposable to carry out circuit and pixel functional test, add feature；
Effect three, reduces cost；
Effect four, improves convenient test.
Brief description of the drawings
The present invention is further described with reference to the accompanying drawings and examples.
Fig. 1, the test system structure schematic diagram；
Fig. 2, the test system hardware block schematic illustration；
Data processing test data schematic diagram in Fig. 3, embodiment 1；
Fig. 4, testing system software shoots picture schematic flow sheet；
Fig. 5, flow chart of data processing schematic diagram；
Fig. 6, the photoelectric curve being fitted according to test data.
In accompanying drawing：1- test boards, 2- directional lights, 3- directional light lamp boxes, 4- sealing camera bellows, 5- lifting platforms.
Embodiment
In order to make the purpose , technical scheme and advantage of the present invention be clearer, with reference to embodiments, to the present invention
It is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, it is not used to
Limit the present invention.
Embodiment 1,
The present embodiment provides a kind of test system for cmos sensor, such as Fig. 1, and the test system includes providing flat
The directional light lamp box of row light, the directional light lamp box is DNP lamp boxes；Quantity for 3 without camera lens cmos sensor, it is described without camera lens
Cmos sensor is corresponding with the parallel optical position when testing；With the test board being connected without camera lens cmos sensor, it is described
Test board includes the imaging sensor for being used to gather signal data；It is described to be both secured to survey without camera lens cmos sensor and test board
Test plate (panel) fixed mount, the test board fixed mount is fixedly connected on lifting platform；The test board by USB2.0 and control unit
Connection, described control unit is also connected with lifting platform, and described control unit is connected by USB cable and serial ports with host computer；Institute
State host computer in test system to be located at outside sealing light box, test system remainder is positioned in sealing camera bellows；The host computer
Control unit is controlled to carry out lifting platform position, directional light lamp box and USB cable channel selecting by serial ports；It is described without camera lens CMOS
Number of sensors and test board quantity, test board fixed plate quantity all same.
Described control unit includes MCU control panels and USB line way switch, and the MCU control panels are used to control lifting platform position
Put and directional light lamp box, the USB line way switch is used to select USB cable passage.
Such as Fig. 2, each cmos sensor is connected to imaging sensor by USB2.0, and imaging sensor carries out data and adopted
Collection, the data are transmitted by USB cable, control unit to host computer.Then, host computer carries out data processing to data.Number
According to process such as Fig. 5 of processing.
The USB2.0 includes the data lines of VBUS, USB_DP, USB_DP, GND tetra-, the D0 for correspondence cmos sensor
~D7, HS, VS, pixel, CLK, SDA, SCK, PWDN data wire.
A kind of application method of the test system for cmos sensor is provided in such as Fig. 4, the present embodiment, including：
(1) 3 are assembled on test board without camera lens cmos sensor, test board is fixed on fixed mount, places sealing
In camera bellows；
(2) such as Fig. 4, host computer sends instructions to control unit by serial ports, opens directional light lamp box, regulation lifting platform position
Put, DNP lamp boxes will be directed at successively including the test board without camera lens cmos sensor, control unit control corresponding USB cable with it is upper
Position machine connection, connect test board, after the completion of control unit feedback command arrive host computer, host computer pass through control unit initialization survey
On test plate (panel) without camera lens cmos sensor chip parameter, including data output format, PGA gains, ADC scopes, low 8bit outputs
And the time for exposure.Initiation parameter exports for Raw data；Exposure pieces is set to 1 row, and correspondence noise is mainly caused by circuit；
PGA gains are set to 8x；ADC scopes, which are set to minimum value, can improve measuring accuracy；Low 8bit outputs, wherein low 8bit outputs can be
High 8bit outputs.
(3) such as Fig. 4, exposure time values are set, it is continuous to clap after 100 pictures, preserve every group of exposure according to predetermined path
100 pictures that time is gathered are a file, and host computer sends instruction, turns off light source；Setting illumination is completely black Dark,
Clap after 5 pictures；
(4) light source is opened, time for exposure increase, repeat step (3) is maximum until the time for exposure, completes chip data and adopts
Collection, into step (5)；
(5) such as Fig. 5, log-on data routine processes chip data；
(6) such as Fig. 4, host computer sends serial ports and instructed to control unit again, lifting platform is controlled, by the 2nd test board pair
Quasi- DNP lamp boxes, while the USB cable tested on 2 plates is connected in host computer, host computer is matched somebody with somebody without camera lens cmos sensor chip
Parameter is put, figure is then clapped, above-mentioned action is repeated, until test board 3 has been tested, chest is opened, three new chips is changed and carries out
Test.
Wherein, often set the single exposure time to be accomplished by clapping 100 figures, three chips have all been clapped, it is also desirable to one
Section time, it is possible to use this period, tester can carry out data processing with log-on data processing routine to 100 pictures,
Step (5) includes：
(A) path is set, the pictures of current file 100 are read, average mean_illumination；
(B) according to 5 pictures under completely black Dark, average mean_dark；
(C) Mean_output is calculated according to formula Mean_output=mean_illumination-mean_dark
Value；
(D) average picture is obtained according to the superposition of 100 pictures, asks standard deviation to draw FPN data in the average picture,
Standard variance formula：Each number in σ={ [∑ (Xi-X)) ^2]/n } ^ (1/2), one group of data is averaged with this group of data
Several poor square and again divided by data number, then root of making even；Because output data form is Raw data, each picture
Element is made up of four components, is R, G1, G2, B respectively.The standard deviation square value of four components is calculated according to formula：
R=[∑ (Xi-X)) ^2]/n } ^ (1/2)
G1=[∑ (Xi-X)) ^2]/n } ^ (1/2)
G2=[∑ (Xi-X)) ^2]/n } ^ (1/2)
B=[∑ (Xi-X)) ^2]/n } ^ (1/2)
X is average value, and Xi is i-th of data.
(E) 100 values corresponding to each pixel seek standard variance, and random noise is obtained after the standard variance is averaged
Value, is saved in Excel, such as Fig. 3, FPN the and Temporal Noise units that method of being stated in way is drawn are LSB, need to be by unit
Convert as volt or electronics, reduced voltage value formula:LSB*ADC_range/CDS_gain/1024/PGA gains, unit mv；It is low
8bit export divided by 1024, high 8bit output then divided by 256；
(F) the FPN data are preserved, random noise value is converted to after voltage data, core is judged for drawing photoelectric curve
The performance of piece circuit and pixel.
Test system in the present embodiment can also draw sensitivity, and signal to noise ratio, photoresponse is inconsistent, conversion gain and full
Trap electric charge：
Sensitivity：
Signal to noise ratio：
Photoresponse is inconsistent：
Conversion gain：
Full trap electric charge：
Fig. 6 is the photoelectric curve according to measured data fitting.
Although illustrative embodiment of the invention is described above, in order to the technology of the art
Personnel are it will be appreciated that the present invention, but the present invention is not limited only to the scope of embodiment, to the common skill of the art
For art personnel, as long as long as various change is in the spirit and scope of the invention that appended claim is limited and is determined, one
The innovation and creation using present inventive concept are cut in the row of protection.
Claims (4)
1. a kind of test system for cmos sensor, it is characterised in that：The test system includes sealing camera bellows, and there is provided flat
The directional light lamp box of row light；Quantity is N without camera lens cmos sensor, described to be put down with described when test without camera lens cmos sensor
Row optical position correspondence；With the test board being connected without camera lens cmos sensor, the test board includes being used to gather signal number
According to imaging sensor；Described to be both secured to test board fixed mount without camera lens cmos sensor and test board, the test board is consolidated
Determine frame and be fixedly connected on lifting platform；The test board is connected by USB2.0 with control unit, described control unit also with liter
Platform connection is dropped, and described control unit is connected by USB cable and serial ports with host computer；
Host computer is located at outside sealing light box in the test system, and test system remainder is positioned in sealing light box；
The host computer controls control unit to carry out lifting platform position, directional light lamp box and USB cable channel selecting by serial ports；
It is described without camera lens cmos sensor quantity and test board quantity, test board fixed mount quantity all same；
Wherein, N is positive integer.
2. the test system according to claim 1 for cmos sensor, it is characterised in that：Described control unit includes
MCU control panels and USB line way switch, the MCU control panels are used to control lifting platform position and directional light lamp box, the USB line
Way switch is used to select USB cable passage.
3. the test system according to claim 1 for cmos sensor, it is characterised in that：The directional light lamp box is
DNP lamp boxes.
4. the test system according to claim 1 for cmos sensor, it is characterised in that：The N=3.
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| CN201710196104.8A CN106973287B (en) | 2017-03-29 | 2017-03-29 | Test system for CMOS sensor |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN115575802A (en) * | 2022-12-07 | 2023-01-06 | 武汉乾希科技有限公司 | Test system of optical sensor chip |
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