CN106680595A - Double-probe electric field measurement device based on integrated optical waveguide - Google Patents

Double-probe electric field measurement device based on integrated optical waveguide Download PDF

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Publication number
CN106680595A
CN106680595A CN201510765269.3A CN201510765269A CN106680595A CN 106680595 A CN106680595 A CN 106680595A CN 201510765269 A CN201510765269 A CN 201510765269A CN 106680595 A CN106680595 A CN 106680595A
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China
Prior art keywords
probe
optical waveguide
integrated optical
signal
probes
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CN106680595B (en
Inventor
张凯
刘宇明
沈自才
赵春晴
李蔓
刘向鹏
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Beijing Institute of Spacecraft Environment Engineering
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Beijing Institute of Spacecraft Environment Engineering
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08Measuring electromagnetic field characteristics
    • G01R29/0864Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0878Sensors; antennas; probes; detectors
    • G01R29/0885Sensors; antennas; probes; detectors using optical probes, e.g. electro-optical, luminiscent, glow discharge, or optical interferometers

Abstract

The invention discloses a double-probe electric field measurement device based on an integrated optical waveguide. The double-probe electric field measurement device comprises a laser, an M-Z type integrated optical waveguide sensor, a photoelectric conversion device, a preamplifier, double electronic probes, a data processing and transmission system, and a pair of signal electrodes in the integrated optical waveguide sensor, wherein the laser is connected with the M-Z type integrated optical waveguide sensor through an optical fiber. After modulation by the M-Z type integrated optical waveguide sensor, laser is transmitted to the photoelectric conversion device through an optical fiber for being converted to an electric signal. The electric signal is amplified by the preamplifier and is output to the data processing and transmission system. One electronic probe in the double electronic probes is connected with one signal electrode in a pair of signal electrodes in the M-Z type integrated optical waveguide sensor, and the other electronic probe is connected with the other signal electrode through an insulated rod. The pair of signal electrodes are oppositely and parallelly arranged at two sides of the optical waveguide in the M-Z type integrated optical waveguide sensor.

Description

Double probe field measurement devices based on integrated light guide
Technical field
The invention belongs to Space environment detection technical field, specifically, the present invention relates to a kind of based on collection Into double probe field measurement devices of fiber waveguide
Background technology
Electromagnetic field is a kind of most important in universe, most common field, is the day for contacting high-altitude and subsurface information Right medium.Electric field environment in space is detected, the change of electric field, magnetic field and ionosphere parameter is studied Dependency, can be used for the monitoring of the natural disasters such as earthquake, volcano, for space weather to mankind's activity The influence research of (including communication, navigation and GPS location etc.).At present, the survey of comparative maturity in the world The method of quantity space electric field mainly has two kinds:Double probe electric field measurement methods and electronics drift electric field measurement method. Anywhere wherein double probe measurements can work because its technology is simple, mature and reliable, its survey Amount frequency range, up to MHz, is the main method for carrying out space electric field detection at present from DC, its measurement Principle is as shown in Figure 1.The principle of double probe detection electric fields is to measure the potential difference between 2 points, its method It is to stretch out two bars to space, installing in respective termination has the metal ball or metal cylinder being electrically insulated with it Body is electric-field sensor as probe.Current potential on two probes and its each around plasma current potential When consistent, the potential difference measured between two probes has just been obtained along boom divided by the distance between two probes The electric field component in direction.
However, the signal transmission pathway of above-mentioned measuring method its connecting line, probe and outut device composition can Emission source can be become, so as to produce interference to the electromagnetic field of tested region, while external electromagnetic field is at these The electromagnetic induction phenomenon that equipment is produced, will cause measurement result substantial deviation actual value, in addition using cable As signal transmission pathway, it is impossible to provide the path of high bandwidth, the frequency range of measurement is very limited.
The content of the invention
In consideration of it, a kind of it is an object of the invention to provide double probe electric field measurements based on integrated light guide Device, the device is applied to integrated light guide Electro-optical Modulation technology in spatial electronic field measurement.Integrated light wave The advantages of conductive optical sensor has input impedance height, fast response time, sensitivity height, high bandwidth, together When Sensor section without the need for power supply injection just can realize measurement, i.e. passive measurement so will not be to tested The electromagnetic field in region produces interference.The present invention is using Mach-Zehnder (M-Z) types integrated light guide electricity Optical sensor, has the advantages that modulation efficiency is high, temperature stability is good, small volume.Therefore by double probes Probe be connected with the signal electrode of M-Z type integrated light guide, by double probes and integrated light guide technology phase With reference to being expected to realize high sensitivity, the spatial electronic field measurement ability of high bandwidth.
Present invention employs following technical scheme:
Based on double probe field measurement devices of integrated light guide, including the integrated light wave of laser instrument, M-Z type Derivative sensor, photoelectric conversion device, preamplifier, bielectron probe, data processing and Transmission system With a pair of signal electrodes inside the integrated light guide, wherein, the laser instrument for producing laser passes through Fiber-optic transfer gives M-Z type integrated optical waveguide sensor, is filled to opto-electronic conversion by fiber-optic transfer Jing after its modulation Put and be converted to the signal of telecommunication, then amplify output to data processing and Transmission system, double electricity through preamplifier One of sub- probe is connected by one of a pair of signal electrodes in insulating bar and M-Z type integrated optical waveguide sensor Connect, another electron probe is connected by insulating bar with another in signal electrode, a pair of signal electrodes Opposed juxtaposition is arranged at the both sides of fiber waveguide in M-Z type integrated optical waveguide sensor, and space electric field is being entered During row measurement, with the change of bielectron probe surrounding electric field, the electromotive force between electron probe also becomes therewith Change, the change of electromotive force is modulated to M-Z type integrated optical waveguide sensor, makes through integrated light guide The light intensity of sensor laser changes, and the optical signal after modulation is converted to electricity by photoelectric conversion device again Signal, this electric potential signal after the amplification of low noise preamplifier the data processing that is input into cabin and Transmission system.
Wherein, two electron probes are respectively placed in one end of insulating bar so that two probes in a distance, lead to Electric field intensity actual measurement in this direction is obtained by the potential difference of two probes is crossed divided by the distance between two probes Value.
Wherein, bielectron probe stretches out two bars to space, installs in respective termination and is electrically insulated with it Metal ball or metal cylinder be electric-field sensor as probe.
Wherein, the current potential on two electron probes with its each around plasma current potential it is consistent when, survey Measure the electricity that the potential difference between two probes has just obtained along boom direction divided by the distance between two probes Field component.
Compared with prior art, the double probe field measurement devices based on integrated light guide of the invention, will Integrated light guide Electro-optical Modulation technology is applied in spatial electronic field measurement, with advantages below:1)M-Z Type integrated light guide fast response time, sensitivity are high, with great input impedance (>10G Ω), greatly Measurement frequency scope and response speed are improve greatly;2) integrated optical waveguide sensor fast response time, spirit Sensitivity is high, substantially increases measurement frequency scope and response speed, with higher bandwidth, in theory may be used Realize the measurement from direct current to GHz;3) using optical fiber as signal transmission medium, photoelectricity electromagnetic measurement sets Standby that radiation interference will not be produced to tested electromagnetic field, external electromagnetic field is also without interference with the light transmitted in optical fiber Signal;4) measurement of various physical quantitys, such as frequency, phase place information can be carried out, and is not limited to electricity The intensity of field, and it is almost undistorted to the measurement of electromagnetic field signal;5) Sensor section is noted without the need for power supply Enter and just can realize measurement, i.e. passive measurement.M-Z type interferes formula integrated light guide electro-optical sensor to have The advantages of modulation efficiency height, good temperature stability, small volume, therefore based on M-Z type integrated light guide Double probe field measurement devices can realize high sensitivity, the spatial electronic field measurement ability of high bandwidth.
Description of the drawings
Fig. 1 is the structural representation of measurement apparatus in double probe electric field measurement methods in prior art.
Fig. 2 is the structural representation based on the probe-type field measurement device of M-Z type integrated light guide.
In figure:1- laser instrument, 2- optical fiber, 3-M-Z type integrated optical waveguide sensors, 4- opto-electronic conversion dress Put, 5- preamplifiers, 6- electric-field probes, 7- integrated light guide signal electrodes, 8- data processings and biography Defeated system.
Specific embodiment
Below in conjunction with the accompanying drawings to the present invention based on the probe-type field measurement device of M-Z type integrated light guide make into The explanation of one step.
Referring to Fig. 2, Fig. 2 shows the knot based on the probe-type field measurement device of M-Z type integrated light guide Structure schematic diagram.The double probe-type field measurement device based on M-Z type integrated light guide of the present invention, including Laser instrument 1, M-Z type integrated optical waveguide sensor 3, photoelectric conversion device 4, preamplifier 5, double electricity Sub- probe 6, data processing and Transmission system 8 and a pair of the signal electrodes 7 inside integrated light guide, Wherein, the laser instrument 1 for producing laser is transferred to M-Z type integrated optical waveguide sensor 3 by optical fiber 2, Photoelectric conversion device 4 is transferred to by optical fiber 2 Jing after its modulation and is converted to the signal of telecommunication, then it is preposition through low noise Amplifier 5 amplify output to one of data processing and Transmission system 8, bielectron probe 6 by insulating bar with One of a pair of signal electrodes 7 in M-Z type integrated optical waveguide sensor 3 connect, another electron probe 6 It is connected with another in signal electrode 7 by insulating bar, a pair of opposed juxtapositions of signal electrode 7 are arranged at The both sides of fiber waveguide in M-Z type integrated optical waveguide sensor 3, when measuring to space electric field, with The change of the surrounding electric field of bielectron probe 6, the electromotive force between electron probe 6 also changes therewith, electromotive force Change is modulated to M-Z type integrated optical waveguide sensor 3, makes to swash 3 light through integrated optical waveguide sensor Light intensity change, the optical signal after modulation is converted to the signal of telecommunication by photoelectric conversion device 4 again, this Data processing and transmission system that one electric potential signal is input into cabin after the amplification of low noise preamplifier System 8.
Because two probes are respectively placed in one end of boom so that two probes in a distance, therefore by two The potential difference of probe can obtain electric field intensity measured value in this direction divided by the distance between two probes.
In electric field detector based on M-Z type integrated light guide, the detection performance of the structure of probe to electric field Affect very big, therefore the design of probe is most important.In order to be able to reach desired voltage measurement, need preposition The input impedance of amplifying circuit is as far as possible high, and input capacitance should be as far as possible little so that designed probe has Broadband, Larger Dynamic scope, low frequency drift and the features such as low noise, at the same have high temperature adaptation ability and Reliability.
In data processing and Transmission system, a series of process such as signal Jing differential amplifications and filtering detection Afterwards, Jing A/D are converted into digital signal output in remote measurement transmission data bus, meanwhile, to important wave band Waveform acquisition and spectrum analyses are done, and outputs data to bus.System control module is responsible for completing to passing The control of sensor probe detection and the control of programmable amplifier.
Although giving detailed description to specific implementation of the patent mode above and illustrating, should refer to Bright, we can carry out various equivalent changes to above-mentioned embodiment according to the conception of patent of the present invention And modification, the function produced by it still without departing from description and accompanying drawing covered it is spiritual when, all should Within protection scope of the present invention.

Claims (4)

1. a kind of double probe field measurement devices based on integrated light guide, including laser instrument, M-Z type collection Into optical waveguide sensor, photoelectric conversion device, preamplifier, bielectron probe, data processing and biography Defeated system and a pair of signal electrodes in integrated optical waveguide sensor, wherein, for producing laser Laser instrument gives M-Z type integrated optical waveguide sensor by fiber-optic transfer, is given by fiber-optic transfer Jing after its modulation Photoelectric conversion device is converted to the signal of telecommunication, then amplifies output to data processing and transmission through preamplifier One of system, bielectron probe are by a pair of signals in insulating bar and M-Z type integrated optical waveguide sensor One of electrode connects, and another electron probe is connected by insulating bar with another in signal electrode, and one The both sides of fiber waveguide in M-Z type integrated optical waveguide sensor are arranged to signal electrode opposed juxtaposition, right It is electronic between electron probe with the change of bielectron probe surrounding electric field when space electric field is measured Gesture also changes therewith, and the change of electromotive force is modulated to M-Z type integrated optical waveguide sensor, make through The light intensity of integrated optical waveguide sensor laser changes, and the optical signal after modulation is filled again by opto-electronic conversion Put and be converted to the signal of telecommunication, this electric potential signal is input into cabin after the amplification of low noise preamplifier Data processing and Transmission system.
2. double probe field measurement devices of integrated light guide are based on as claimed in claim 1, wherein, Two electron probes are respectively placed in one end of insulating bar so that two probes in a distance, by two probes Potential difference can obtain electric field intensity measured value in this direction divided by the distance between two probes.
3. double probe field measurement devices of integrated light guide are based on as claimed in claim 1, wherein, Two bars are stretched out in bielectron probe to space, respective termination install have with it the metal ball that is electrically insulated or Metal cylinder is electric-field sensor as probe.
4. double probe field measurement devices of integrated light guide are based on as claimed in claim 1, wherein, Current potential on two electron probes with its each around plasma current potential it is consistent when, measure two probes Between the potential difference electric field component that just obtained divided by the distance between two probes along boom direction.
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CN106970273A (en) * 2017-03-30 2017-07-21 北京卫星环境工程研究所 Spiralism type surface potential measurement device based on Electro-optical Modulation

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Publication number Priority date Publication date Assignee Title
CN106970273A (en) * 2017-03-30 2017-07-21 北京卫星环境工程研究所 Spiralism type surface potential measurement device based on Electro-optical Modulation
CN106970273B (en) * 2017-03-30 2019-10-29 北京卫星环境工程研究所 Spiralism type surface potential measurement device based on Electro-optical Modulation

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