CN106370951A - High-efficiency charger testing machine - Google Patents
High-efficiency charger testing machine Download PDFInfo
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- CN106370951A CN106370951A CN201610818733.5A CN201610818733A CN106370951A CN 106370951 A CN106370951 A CN 106370951A CN 201610818733 A CN201610818733 A CN 201610818733A CN 106370951 A CN106370951 A CN 106370951A
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- 238000012360 testing method Methods 0.000 title claims abstract description 132
- 239000013078 crystal Substances 0.000 claims description 6
- 238000000034 method Methods 0.000 claims description 6
- 241001323319 Psen Species 0.000 claims description 3
- 239000003990 capacitor Substances 0.000 claims description 3
- 230000005611 electricity Effects 0.000 claims description 3
- 230000003028 elevating effect Effects 0.000 abstract 1
- 241000208340 Araliaceae Species 0.000 description 2
- 235000005035 Panax pseudoginseng ssp. pseudoginseng Nutrition 0.000 description 2
- 235000003140 Panax quinquefolius Nutrition 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 235000008434 ginseng Nutrition 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention discloses a high-efficiency charger testing machine. The high-efficiency charger testing machine comprises a testing machine base, a workbench and a measuring head fixation seat, wherein the workbench is arranged on the testing machine base, the workbench is provided with a to-be-tested charger, the testing machine base is provided with a power supply switch, a test switch and a current/voltage meter, the measuring head fixation seat is arranged right above the workbench, the lower end of the measuring head fixation seat is provided with measuring heads, the measuring heads are electrically connected with a test circuit board arranged in the measuring head fixation seat, and the upper end of the measuring head fixation seat is connected with an elevating apparatus above. According to the invention, the structure principle is simple, the operation is convenient, the charger can be rapidly tested, the test efficiency is high, and the labor cost is reduced.
Description
Technical field
The present invention relates to charger technical field of measurement and test, specially a kind of high efficiency charger test machine.
Background technology
Charger test machine is mainly for the zero load testing the DC source products such as all kinds of battery chargers, power supply adaptor
And load characteristic and the special test equipment that designs, have stable testing, quick and easy, simple to operate the features such as, be adapted to
The test of all kinds of chargers.Instrument is built-in with constant voltage, constant current, and constant-resistance loads, and user can easily select loadtype.Instrument
Constant-resistance load adopt pure resistor load, test is more stable.The distinctive constant voltage mode of instrument can real analog charge device
Charging process.Existing charger test machine test speed is slow, testing efficiency is low, and cost of labor is high.
Content of the invention
It is an object of the invention to provide a kind of high efficiency charger test machine, to solve proposition in above-mentioned background technology
Problem.
For achieving the above object, the present invention provides a kind of following technical scheme: high efficiency charger test machine, including test
Machine base, workbench and measuring head fixed seat, described workbench is arranged on test machine base, described workbench is placed to be measured
Trial charging device, described test machine base is provided with and off switch, test switch and current/voltage table, and described measuring head is fixed
Seat is arranged on directly over workbench, and described measuring head fixed seat lower end is provided with measuring head, and described measuring head is electrically connected with and is arranged on
Test circuit plate in measuring head fixed seat, described measuring head fixed seat upper end connects the lowering or hoisting gear of top.
Preferably, described test circuit plate include single-chip microcomputer, the first optocoupler, the second optocoupler, the first relay switch, second
Relay switch, the 3rd relay switch and the 4th relay switch, the p1.0 end of described single-chip microcomputer, p1.1 end, p1.2 end,
P1.3 end, p1.4 end, p1.5 end, p1.6 end, p1.7 end connecting interface c respectively, and the p1.0 end of single-chip microcomputer and p1.1 end are respectively
Connect the first optocoupler and the second optocoupler, described first optocoupler and the second optocoupler connecting interface b respectively, the p1.4 of described single-chip microcomputer
End, p1.5 end, p1.6 end, p1.7 end connect microcontroller respectively and are grounded, the rst end ground connection of described single-chip microcomputer, single-chip microcomputer
P3.0 end and p3.1 end connecting interface a respectively, the p3.2 end of described single-chip microcomputer, p3.3 end, p3.4 end, p3.5 end, p3.6 end,
P3.7 end is all hanging, access crystal oscillator between the xtal2 end of described single-chip microcomputer and xtal1 end, described crystal oscillator two ends series capacitance a,
Electric capacity b is simultaneously grounded.
Preferably, the vcc end of described single-chip microcomputer is connected in parallel electrochemical capacitor and electric capacity c and is grounded, described single-chip microcomputer
P0.0 end and p0.1 end connect resistance a one end and resistance b one end respectively, and the resistance a other end and the resistance b other end connect respectively
One LED lamp is simultaneously grounded;The p0.2 end of described single-chip microcomputer and p0.3 end connect resistance c one end and resistance d one end respectively, and resistance c is another
One end and the resistance d other end connect the second LED lamp respectively and are grounded;The p0.4 end of described single-chip microcomputer and p0.5 end connect electricity respectively
Resistance e one end and resistance f one end, the resistance e other end and the resistance f other end connect the 3rd LED lamp respectively and are grounded;Described single-chip microcomputer
P0.6 end and p0.7 end connect resistance g one end and resistance h one end respectively, the resistance g other end and the resistance h other end connect respectively
4th LED lamp is simultaneously grounded, the ea of described single-chip microcomputer termination vcc, the ale end of described single-chip microcomputer, psen end, p2.7 end, p2.6 end,
P2.5 end, p2.4 end are all hanging.
Preferably, the p2.3 end of described single-chip microcomputer connects diode a, and described diode a two ends parallel connection the first relay is opened
Close;The p2.2 end of described single-chip microcomputer connects diode b, described diode b two ends parallel connection the second relay switch;Described single-chip microcomputer
P2.1 end connect diode c, described diode c two ends parallel connection the 3rd relay switch;The p2.0 end of described single-chip microcomputer connects
Diode d, described diode d two ends parallel connection the 4th relay switch.
Preferably, its using method comprises the following steps:
A, by charger to be tested be placed on test machine base on, and by test circuit plate pass through control line connect outside
Computer;
B, pre-set charger electric parameter to be tested and safety range on computers, charger test ginseng to be tested
Number, and input test routine;
C, open test switch, computer calls test program, and sends instructions to the single-chip microcomputer on test circuit plate
In;
The first TCH test channel in test program opened by d, test circuit plate single-chip microcomputer, starts to survey after on test machine, display lamp goes out
Examination, proceeds to the second TCH test channel immediately after display lamp is bright;Start after display lamp goes out on test machine to test, turn immediately after display lamp is bright
Enter the 3rd TCH test channel;Start after display lamp goes out on test machine to test, after display lamp is bright, proceed to the 4th TCH test channel immediately;
On e, test machine, display lamp starts after going out to test, and treats that changing the plate time enters back into the first test after display lamp is bright 1 second
Passage, and so on.
Preferably, in described step b, electric parameter includes theoretical under-voltage value, theoretical overpressure value, theoretical over current value and bears
Carry resistance;Test parameter includes the scope of the test voltage of test circuit plate and the scope of test electric current.
Compared with prior art, the invention has the beneficial effects as follows:
(1) present configuration principle is simple, easy to operate, is capable of quick testing charger, and testing efficiency is high, reduces
Cost of labor.
(2) the test circuit plate strong antijamming capability that the present invention adopts, test speed is fast, greatly improves test effect
Rate, compared with conventional art, test speed improves 5 times about.
Brief description
Fig. 1 is the front view of the present invention;
Fig. 2 is the top view of the present invention;
Fig. 3 is the test circuit plate schematic diagram of the present invention.
Fig. 4 is the test flow chart of the present invention.
Specific embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete
Site preparation description is it is clear that described embodiment is only a part of embodiment of the present invention, rather than whole embodiments.It is based on
Embodiment in the present invention, it is every other that those of ordinary skill in the art are obtained under the premise of not making creative work
Embodiment, broadly falls into the scope of protection of the invention.
Refer to Fig. 1-4, the present invention provides a kind of a kind of technical scheme: high efficiency charger test machine, including test machine
Base 1, workbench 2 and measuring head fixed seat 3, described workbench 2 is arranged on test machine base 1, and described workbench 2 is placed
Charger 4 to be tested, described test machine base 1 is provided with and off switch 5, test switch 6 and current/voltage table 7, described survey
Examination head fixed seat 3 is arranged on directly over workbench 2, and described measuring head fixed seat 3 lower end is provided with measuring head 8, described measuring head 8 electricity
Property test circuit plate 9 in measuring head fixed seat 3 for the connect setting, described measuring head fixed seat 3 upper end connects the lifting of top
Device 10.
In the present embodiment, test circuit plate 9 includes single-chip microcomputer 11, the first optocoupler 12, the second optocoupler 13, the first relay are opened
Close the 14, second relay switch 15, the 3rd relay switch 16 and the 4th relay switch 17, the p1.0 of described single-chip microcomputer 11
End, p1.1 end, p1.2 end, p1.3 end, p1.4 end, p1.5 end, p1.6 end, p1.7 end connecting interface c 3d respectively, and single-chip microcomputer
11 p1.0 end and p1.1 end connect the first optocoupler 12 and the second optocoupler 13, described first optocoupler 12 and 13 points of the second optocoupler respectively
Other connecting interface b 2d, the p1.4 end of described single-chip microcomputer 11, p1.5 end, p1.6 end, p1.7 end connect microcontroller 18 simultaneously respectively
Ground connection, the rst end ground connection of described single-chip microcomputer 11, the p3.0 end of single-chip microcomputer 11 and p3.1 end connecting interface a 1d respectively, described list
The p3.2 end of piece machine 11, p3.3 end, p3.4 end, p3.5 end, p3.6 end, p3.7 end are all hanging, the xtal2 end of described single-chip microcomputer 11
Access crystal oscillator 19 and xtal1 end between, described crystal oscillator 19 two ends series capacitance a 1c, electric capacity b 2c are simultaneously grounded;Single-chip microcomputer 11
Vcc end is connected in parallel electrochemical capacitor 20 and electric capacity c 3c and is grounded, and the p0.0 end of described single-chip microcomputer 11 and p0.1 end connect respectively
Resistance a 1a one end and resistance b 2a one end, the resistance a 1a other end and the resistance b 2a other end connect the first LED lamp 21 respectively
And be grounded;The p0.2 end of described single-chip microcomputer 11 and p0.3 end connect resistance c 3a one end and resistance d 4a one end, resistance c respectively
The 3a other end and the resistance d 4a other end connect the second LED lamp 22 respectively and are grounded;The p0.4 end of described single-chip microcomputer 11 and p0.5
End connects resistance e 5a one end and resistance f 6a one end respectively, and the resistance e 5a other end and the resistance f 6a other end connect the respectively
Three LED lamps 23 are simultaneously grounded;The p0.6 end of described single-chip microcomputer 11 and p0.7 end connect resistance g 7a one end and resistance h 8a mono- respectively
End, the resistance g 7a other end and the resistance h 8a other end connect the 4th LED lamp 24 respectively and are grounded, the ea end of described single-chip microcomputer 11
Meet vcc, the ale end of described single-chip microcomputer 11, psen end, p2.7 end, p2.6 end, p2.5 end, p2.4 end are all hanging;Single-chip microcomputer 11
P2.3 end connects diode a 1b, described diode a 1b two ends parallel connection the first relay switch 25;Described single-chip microcomputer 11
P2.2 end connects diode b 2b, described diode b 2b two ends parallel connection the second relay switch 26;Described single-chip microcomputer 11
P2.1 end connects diode c 3b, described diode c 3b two ends parallel connection the 3rd relay switch 27;Described single-chip microcomputer 11
P2.0 end connects diode d 4b, described diode d 4b two ends parallel connection the 4th relay switch 28.
The using method of the present invention comprises the following steps:
A, by charger to be tested be placed on test machine base on, and by test circuit plate pass through control line connect outside
Computer;
B, pre-set charger electric parameter to be tested and safety range on computers, charger test ginseng to be tested
Number, and input test routine;
C, open test switch, computer calls test program, and sends instructions to the single-chip microcomputer on test circuit plate
In;
The first TCH test channel in test program opened by d, test circuit plate single-chip microcomputer, starts to survey after on test machine, display lamp goes out
Examination, proceeds to the second TCH test channel immediately after display lamp is bright;Start after display lamp goes out on test machine to test, turn immediately after display lamp is bright
Enter the 3rd TCH test channel;Start after display lamp goes out on test machine to test, after display lamp is bright, proceed to the 4th TCH test channel immediately;
On e, test machine, display lamp starts after going out to test, and treats that changing the plate time enters back into the first test after display lamp is bright 1 second
Passage, and so on.
In the present embodiment, in step b, electric parameter includes theoretical under-voltage value, theoretical overpressure value, theoretical over current value and bears
Carry resistance;Test parameter includes the scope of the test voltage of test circuit plate and the scope of test electric current.
Present configuration principle is simple, easy to operate, is capable of quick testing charger, and testing efficiency is high, reduces
Cost of labor;The test circuit plate strong antijamming capability that the present invention adopts, test speed is fast, greatly improves testing efficiency,
Compared with conventional art, test speed improves 5 times about.
Although an embodiment of the present invention has been shown and described, for the ordinary skill in the art, permissible
Understand and can carry out multiple changes, modification, replacement to these embodiments without departing from the principles and spirit of the present invention
And modification, the scope of the present invention be defined by the appended.
Claims (6)
1. a kind of high efficiency charger test machine, including test machine base, workbench and measuring head fixed seat it is characterised in that:
Described workbench is arranged on test machine base, described workbench is placed charger to be tested, described test machine base sets
There are on and off switch, test switch and current/voltage table, described measuring head fixed seat is arranged on directly over workbench, described survey
Examination head fixed seat lower end is provided with measuring head, and described measuring head is electrically connected with the test circuit plate being arranged in measuring head fixed seat,
Described measuring head fixed seat upper end connects the lowering or hoisting gear of top.
2. a kind of high efficiency charger test machine according to claim 1 it is characterised in that: described test circuit plate includes
Single-chip microcomputer, the first optocoupler, the second optocoupler, the first relay switch, the second relay switch, the 3rd relay switch and the 4th
Relay switch, the p1.0 end of described single-chip microcomputer, p1.1 end, p1.2 end, p1.3 end, p1.4 end, p1.5 end, p1.6 end, p1.7
End respectively connecting interface 3d, and the p1.0 end of single-chip microcomputer and p1.1 end connect the first optocoupler and the second optocoupler respectively, described first
Optocoupler and the second optocoupler connecting interface 2d respectively, the p1.4 end of described single-chip microcomputer, p1.5 end, p1.6 end, p1.7 end connect respectively
Microcontroller is simultaneously grounded, the rst end ground connection of described single-chip microcomputer, and connecting interface 1d, institute are distinguished in the p3.0 end of single-chip microcomputer and p3.1 end
State the p3.2 end of single-chip microcomputer, p3.3 end, p3.4 end, p3.5 end, p3.6 end, p3.7 end all hanging, the xtal2 end of described single-chip microcomputer
Access crystal oscillator and xtal1 end between, described crystal oscillator two ends series capacitance 1c, electric capacity 2c are simultaneously grounded.
3. a kind of high efficiency charger test machine according to claim 1 it is characterised in that: the vcc end of described single-chip microcomputer
Be connected in parallel electrochemical capacitor and electric capacity 3c and be grounded, the p0.0 end of described single-chip microcomputer and p0.1 end connect respectively resistance 1a one end and
Resistance 2a one end, the resistance 1a other end and the resistance 2a other end connect the first LED lamp respectively and are grounded;The p0.2 of described single-chip microcomputer
End and p0.3 end connect resistance 3a one end and resistance 4a one end respectively, and the resistance 3a other end and the resistance 4a other end connect the respectively
Two LED lamps are simultaneously grounded;The p0.4 end of described single-chip microcomputer and p0.5 end connect resistance 5a one end and resistance 6a one end, resistance 5a respectively
The other end and the resistance 6a other end connect the 3rd LED lamp respectively and are grounded;The p0.6 end of described single-chip microcomputer and p0.7 end connect respectively
Connecting resistance 7a one end and resistance 8a one end, the resistance 7a other end and the resistance 8a other end connect the 4th LED lamp respectively and are grounded, institute
State the ea termination vcc of single-chip microcomputer, the ale end of described single-chip microcomputer, psen end, p2.7 end, p2.6 end, p2.5 end, p2.4 end are all outstanding
Empty.
4. a kind of high efficiency charger test machine according to claim 1 it is characterised in that: the p2.3 end of described single-chip microcomputer
Connect diode 1b, described diode 1b two ends parallel connection the first relay switch;The p2.2 end of described single-chip microcomputer connects diode
2b, described diode 2b two ends parallel connection the second relay switch;The p2.1 end of described single-chip microcomputer connects diode 3b, described two poles
Pipe 3b two ends parallel connection the 3rd relay switch;The p2.0 end of described single-chip microcomputer connects diode 4b, and described diode 4b two ends are simultaneously
Join the 4th relay switch.
5. realize a kind of using method of high efficiency charger test machine described in claim 1 it is characterised in that: its user
Method comprises the following steps:
A, charger to be tested is placed on test machine base, and test circuit plate is passed through control line and connect outside calculating
Machine;
B, pre-set charger electric parameter to be tested and safety range on computers, charger test parameter to be tested,
And input test routine;
C, open test switch, computer calls test program, and sends instructions in the single-chip microcomputer on test circuit plate;
The first TCH test channel in test program opened by d, test circuit plate single-chip microcomputer, starts to test after on test machine, display lamp goes out,
The second TCH test channel is proceeded to immediately after display lamp is bright;Start after display lamp goes out on test machine to test, proceed to immediately after display lamp is bright
3rd TCH test channel;Start after display lamp goes out on test machine to test, after display lamp is bright, proceed to the 4th TCH test channel immediately;
On e, test machine, display lamp starts after going out to test, and treats that changing the plate time enters back into the first TCH test channel after display lamp is bright 1 second,
And so on.
6. a kind of high efficiency charger test machine described in a claim 5 using method it is characterised in that: described step b
Middle electric parameter includes theoretical under-voltage value, theoretical overpressure value, theoretical over current value and load resistance;Test parameter includes test electricity
The scope of the test voltage of road plate and the scope of test electric current.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610818733.5A CN106370951A (en) | 2016-09-13 | 2016-09-13 | High-efficiency charger testing machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610818733.5A CN106370951A (en) | 2016-09-13 | 2016-09-13 | High-efficiency charger testing machine |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106370951A true CN106370951A (en) | 2017-02-01 |
Family
ID=57896726
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610818733.5A Pending CN106370951A (en) | 2016-09-13 | 2016-09-13 | High-efficiency charger testing machine |
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| US20110254582A1 (en) * | 2010-04-15 | 2011-10-20 | Atc Logistics & Electronics, Inc. | Systems and methods for modular testing of chargers |
| CN104215798A (en) * | 2014-09-10 | 2014-12-17 | 东莞市冠佳电子设备有限公司 | Corded automatic charger power-on tester |
| CN104227422A (en) * | 2014-09-10 | 2014-12-24 | 东莞市冠佳电子设备有限公司 | Automatic testing, riveting and laser carving production line for wired charger |
| CN104237573A (en) * | 2014-10-09 | 2014-12-24 | 崧顺电子(深圳)有限公司 | Automatic testing equipment for cellphone chargers |
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| CN105562938A (en) * | 2016-01-29 | 2016-05-11 | 东莞市奥海电源科技有限公司 | Charger automatic test and laser engraving production line |
| CN205539246U (en) * | 2016-02-01 | 2016-08-31 | 东莞市奥海电源科技有限公司 | A fill electrical function accredited testing organization for charger test wire |
| CN205539245U (en) * | 2016-02-01 | 2016-08-31 | 东莞市奥海电源科技有限公司 | A charger high pressure accredited testing organization for charger test wire |
| CN206274339U (en) * | 2016-09-13 | 2017-06-23 | 叶丁有 | A kind of high efficiency charger test machine |
-
2016
- 2016-09-13 CN CN201610818733.5A patent/CN106370951A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101593989A (en) * | 2008-12-31 | 2009-12-02 | 中南林业科技大学 | An intelligent battery test charger and its control method |
| US20110254582A1 (en) * | 2010-04-15 | 2011-10-20 | Atc Logistics & Electronics, Inc. | Systems and methods for modular testing of chargers |
| CN104215798A (en) * | 2014-09-10 | 2014-12-17 | 东莞市冠佳电子设备有限公司 | Corded automatic charger power-on tester |
| CN104227422A (en) * | 2014-09-10 | 2014-12-24 | 东莞市冠佳电子设备有限公司 | Automatic testing, riveting and laser carving production line for wired charger |
| CN104237573A (en) * | 2014-10-09 | 2014-12-24 | 崧顺电子(深圳)有限公司 | Automatic testing equipment for cellphone chargers |
| CN104330683A (en) * | 2014-10-11 | 2015-02-04 | 邓文强 | Mobile phone charger test equipment |
| CN105562938A (en) * | 2016-01-29 | 2016-05-11 | 东莞市奥海电源科技有限公司 | Charger automatic test and laser engraving production line |
| CN205539246U (en) * | 2016-02-01 | 2016-08-31 | 东莞市奥海电源科技有限公司 | A fill electrical function accredited testing organization for charger test wire |
| CN205539245U (en) * | 2016-02-01 | 2016-08-31 | 东莞市奥海电源科技有限公司 | A charger high pressure accredited testing organization for charger test wire |
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