CN106370951A - High-efficiency charger testing machine - Google Patents

High-efficiency charger testing machine Download PDF

Info

Publication number
CN106370951A
CN106370951A CN201610818733.5A CN201610818733A CN106370951A CN 106370951 A CN106370951 A CN 106370951A CN 201610818733 A CN201610818733 A CN 201610818733A CN 106370951 A CN106370951 A CN 106370951A
Authority
CN
China
Prior art keywords
test
chip microcomputer
resistance
charger
connect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201610818733.5A
Other languages
Chinese (zh)
Inventor
叶丁有
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to CN201610818733.5A priority Critical patent/CN106370951A/en
Publication of CN106370951A publication Critical patent/CN106370951A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

The invention discloses a high-efficiency charger testing machine. The high-efficiency charger testing machine comprises a testing machine base, a workbench and a measuring head fixation seat, wherein the workbench is arranged on the testing machine base, the workbench is provided with a to-be-tested charger, the testing machine base is provided with a power supply switch, a test switch and a current/voltage meter, the measuring head fixation seat is arranged right above the workbench, the lower end of the measuring head fixation seat is provided with measuring heads, the measuring heads are electrically connected with a test circuit board arranged in the measuring head fixation seat, and the upper end of the measuring head fixation seat is connected with an elevating apparatus above. According to the invention, the structure principle is simple, the operation is convenient, the charger can be rapidly tested, the test efficiency is high, and the labor cost is reduced.

Description

A kind of high efficiency charger test machine
Technical field
The present invention relates to charger technical field of measurement and test, specially a kind of high efficiency charger test machine.
Background technology
Charger test machine is mainly for the zero load testing the DC source products such as all kinds of battery chargers, power supply adaptor And load characteristic and the special test equipment that designs, have stable testing, quick and easy, simple to operate the features such as, be adapted to The test of all kinds of chargers.Instrument is built-in with constant voltage, constant current, and constant-resistance loads, and user can easily select loadtype.Instrument Constant-resistance load adopt pure resistor load, test is more stable.The distinctive constant voltage mode of instrument can real analog charge device Charging process.Existing charger test machine test speed is slow, testing efficiency is low, and cost of labor is high.
Content of the invention
It is an object of the invention to provide a kind of high efficiency charger test machine, to solve proposition in above-mentioned background technology Problem.
For achieving the above object, the present invention provides a kind of following technical scheme: high efficiency charger test machine, including test Machine base, workbench and measuring head fixed seat, described workbench is arranged on test machine base, described workbench is placed to be measured Trial charging device, described test machine base is provided with and off switch, test switch and current/voltage table, and described measuring head is fixed Seat is arranged on directly over workbench, and described measuring head fixed seat lower end is provided with measuring head, and described measuring head is electrically connected with and is arranged on Test circuit plate in measuring head fixed seat, described measuring head fixed seat upper end connects the lowering or hoisting gear of top.
Preferably, described test circuit plate include single-chip microcomputer, the first optocoupler, the second optocoupler, the first relay switch, second Relay switch, the 3rd relay switch and the 4th relay switch, the p1.0 end of described single-chip microcomputer, p1.1 end, p1.2 end, P1.3 end, p1.4 end, p1.5 end, p1.6 end, p1.7 end connecting interface c respectively, and the p1.0 end of single-chip microcomputer and p1.1 end are respectively Connect the first optocoupler and the second optocoupler, described first optocoupler and the second optocoupler connecting interface b respectively, the p1.4 of described single-chip microcomputer End, p1.5 end, p1.6 end, p1.7 end connect microcontroller respectively and are grounded, the rst end ground connection of described single-chip microcomputer, single-chip microcomputer P3.0 end and p3.1 end connecting interface a respectively, the p3.2 end of described single-chip microcomputer, p3.3 end, p3.4 end, p3.5 end, p3.6 end, P3.7 end is all hanging, access crystal oscillator between the xtal2 end of described single-chip microcomputer and xtal1 end, described crystal oscillator two ends series capacitance a, Electric capacity b is simultaneously grounded.
Preferably, the vcc end of described single-chip microcomputer is connected in parallel electrochemical capacitor and electric capacity c and is grounded, described single-chip microcomputer P0.0 end and p0.1 end connect resistance a one end and resistance b one end respectively, and the resistance a other end and the resistance b other end connect respectively One LED lamp is simultaneously grounded;The p0.2 end of described single-chip microcomputer and p0.3 end connect resistance c one end and resistance d one end respectively, and resistance c is another One end and the resistance d other end connect the second LED lamp respectively and are grounded;The p0.4 end of described single-chip microcomputer and p0.5 end connect electricity respectively Resistance e one end and resistance f one end, the resistance e other end and the resistance f other end connect the 3rd LED lamp respectively and are grounded;Described single-chip microcomputer P0.6 end and p0.7 end connect resistance g one end and resistance h one end respectively, the resistance g other end and the resistance h other end connect respectively 4th LED lamp is simultaneously grounded, the ea of described single-chip microcomputer termination vcc, the ale end of described single-chip microcomputer, psen end, p2.7 end, p2.6 end, P2.5 end, p2.4 end are all hanging.
Preferably, the p2.3 end of described single-chip microcomputer connects diode a, and described diode a two ends parallel connection the first relay is opened Close;The p2.2 end of described single-chip microcomputer connects diode b, described diode b two ends parallel connection the second relay switch;Described single-chip microcomputer P2.1 end connect diode c, described diode c two ends parallel connection the 3rd relay switch;The p2.0 end of described single-chip microcomputer connects Diode d, described diode d two ends parallel connection the 4th relay switch.
Preferably, its using method comprises the following steps:
A, by charger to be tested be placed on test machine base on, and by test circuit plate pass through control line connect outside Computer;
B, pre-set charger electric parameter to be tested and safety range on computers, charger test ginseng to be tested Number, and input test routine;
C, open test switch, computer calls test program, and sends instructions to the single-chip microcomputer on test circuit plate In;
The first TCH test channel in test program opened by d, test circuit plate single-chip microcomputer, starts to survey after on test machine, display lamp goes out Examination, proceeds to the second TCH test channel immediately after display lamp is bright;Start after display lamp goes out on test machine to test, turn immediately after display lamp is bright Enter the 3rd TCH test channel;Start after display lamp goes out on test machine to test, after display lamp is bright, proceed to the 4th TCH test channel immediately;
On e, test machine, display lamp starts after going out to test, and treats that changing the plate time enters back into the first test after display lamp is bright 1 second Passage, and so on.
Preferably, in described step b, electric parameter includes theoretical under-voltage value, theoretical overpressure value, theoretical over current value and bears Carry resistance;Test parameter includes the scope of the test voltage of test circuit plate and the scope of test electric current.
Compared with prior art, the invention has the beneficial effects as follows:
(1) present configuration principle is simple, easy to operate, is capable of quick testing charger, and testing efficiency is high, reduces Cost of labor.
(2) the test circuit plate strong antijamming capability that the present invention adopts, test speed is fast, greatly improves test effect Rate, compared with conventional art, test speed improves 5 times about.
Brief description
Fig. 1 is the front view of the present invention;
Fig. 2 is the top view of the present invention;
Fig. 3 is the test circuit plate schematic diagram of the present invention.
Fig. 4 is the test flow chart of the present invention.
Specific embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete Site preparation description is it is clear that described embodiment is only a part of embodiment of the present invention, rather than whole embodiments.It is based on Embodiment in the present invention, it is every other that those of ordinary skill in the art are obtained under the premise of not making creative work Embodiment, broadly falls into the scope of protection of the invention.
Refer to Fig. 1-4, the present invention provides a kind of a kind of technical scheme: high efficiency charger test machine, including test machine Base 1, workbench 2 and measuring head fixed seat 3, described workbench 2 is arranged on test machine base 1, and described workbench 2 is placed Charger 4 to be tested, described test machine base 1 is provided with and off switch 5, test switch 6 and current/voltage table 7, described survey Examination head fixed seat 3 is arranged on directly over workbench 2, and described measuring head fixed seat 3 lower end is provided with measuring head 8, described measuring head 8 electricity Property test circuit plate 9 in measuring head fixed seat 3 for the connect setting, described measuring head fixed seat 3 upper end connects the lifting of top Device 10.
In the present embodiment, test circuit plate 9 includes single-chip microcomputer 11, the first optocoupler 12, the second optocoupler 13, the first relay are opened Close the 14, second relay switch 15, the 3rd relay switch 16 and the 4th relay switch 17, the p1.0 of described single-chip microcomputer 11 End, p1.1 end, p1.2 end, p1.3 end, p1.4 end, p1.5 end, p1.6 end, p1.7 end connecting interface c 3d respectively, and single-chip microcomputer 11 p1.0 end and p1.1 end connect the first optocoupler 12 and the second optocoupler 13, described first optocoupler 12 and 13 points of the second optocoupler respectively Other connecting interface b 2d, the p1.4 end of described single-chip microcomputer 11, p1.5 end, p1.6 end, p1.7 end connect microcontroller 18 simultaneously respectively Ground connection, the rst end ground connection of described single-chip microcomputer 11, the p3.0 end of single-chip microcomputer 11 and p3.1 end connecting interface a 1d respectively, described list The p3.2 end of piece machine 11, p3.3 end, p3.4 end, p3.5 end, p3.6 end, p3.7 end are all hanging, the xtal2 end of described single-chip microcomputer 11 Access crystal oscillator 19 and xtal1 end between, described crystal oscillator 19 two ends series capacitance a 1c, electric capacity b 2c are simultaneously grounded;Single-chip microcomputer 11 Vcc end is connected in parallel electrochemical capacitor 20 and electric capacity c 3c and is grounded, and the p0.0 end of described single-chip microcomputer 11 and p0.1 end connect respectively Resistance a 1a one end and resistance b 2a one end, the resistance a 1a other end and the resistance b 2a other end connect the first LED lamp 21 respectively And be grounded;The p0.2 end of described single-chip microcomputer 11 and p0.3 end connect resistance c 3a one end and resistance d 4a one end, resistance c respectively The 3a other end and the resistance d 4a other end connect the second LED lamp 22 respectively and are grounded;The p0.4 end of described single-chip microcomputer 11 and p0.5 End connects resistance e 5a one end and resistance f 6a one end respectively, and the resistance e 5a other end and the resistance f 6a other end connect the respectively Three LED lamps 23 are simultaneously grounded;The p0.6 end of described single-chip microcomputer 11 and p0.7 end connect resistance g 7a one end and resistance h 8a mono- respectively End, the resistance g 7a other end and the resistance h 8a other end connect the 4th LED lamp 24 respectively and are grounded, the ea end of described single-chip microcomputer 11 Meet vcc, the ale end of described single-chip microcomputer 11, psen end, p2.7 end, p2.6 end, p2.5 end, p2.4 end are all hanging;Single-chip microcomputer 11 P2.3 end connects diode a 1b, described diode a 1b two ends parallel connection the first relay switch 25;Described single-chip microcomputer 11 P2.2 end connects diode b 2b, described diode b 2b two ends parallel connection the second relay switch 26;Described single-chip microcomputer 11 P2.1 end connects diode c 3b, described diode c 3b two ends parallel connection the 3rd relay switch 27;Described single-chip microcomputer 11 P2.0 end connects diode d 4b, described diode d 4b two ends parallel connection the 4th relay switch 28.
The using method of the present invention comprises the following steps:
A, by charger to be tested be placed on test machine base on, and by test circuit plate pass through control line connect outside Computer;
B, pre-set charger electric parameter to be tested and safety range on computers, charger test ginseng to be tested Number, and input test routine;
C, open test switch, computer calls test program, and sends instructions to the single-chip microcomputer on test circuit plate In;
The first TCH test channel in test program opened by d, test circuit plate single-chip microcomputer, starts to survey after on test machine, display lamp goes out Examination, proceeds to the second TCH test channel immediately after display lamp is bright;Start after display lamp goes out on test machine to test, turn immediately after display lamp is bright Enter the 3rd TCH test channel;Start after display lamp goes out on test machine to test, after display lamp is bright, proceed to the 4th TCH test channel immediately;
On e, test machine, display lamp starts after going out to test, and treats that changing the plate time enters back into the first test after display lamp is bright 1 second Passage, and so on.
In the present embodiment, in step b, electric parameter includes theoretical under-voltage value, theoretical overpressure value, theoretical over current value and bears Carry resistance;Test parameter includes the scope of the test voltage of test circuit plate and the scope of test electric current.
Present configuration principle is simple, easy to operate, is capable of quick testing charger, and testing efficiency is high, reduces Cost of labor;The test circuit plate strong antijamming capability that the present invention adopts, test speed is fast, greatly improves testing efficiency, Compared with conventional art, test speed improves 5 times about.
Although an embodiment of the present invention has been shown and described, for the ordinary skill in the art, permissible Understand and can carry out multiple changes, modification, replacement to these embodiments without departing from the principles and spirit of the present invention And modification, the scope of the present invention be defined by the appended.

Claims (6)

1. a kind of high efficiency charger test machine, including test machine base, workbench and measuring head fixed seat it is characterised in that: Described workbench is arranged on test machine base, described workbench is placed charger to be tested, described test machine base sets There are on and off switch, test switch and current/voltage table, described measuring head fixed seat is arranged on directly over workbench, described survey Examination head fixed seat lower end is provided with measuring head, and described measuring head is electrically connected with the test circuit plate being arranged in measuring head fixed seat, Described measuring head fixed seat upper end connects the lowering or hoisting gear of top.
2. a kind of high efficiency charger test machine according to claim 1 it is characterised in that: described test circuit plate includes Single-chip microcomputer, the first optocoupler, the second optocoupler, the first relay switch, the second relay switch, the 3rd relay switch and the 4th Relay switch, the p1.0 end of described single-chip microcomputer, p1.1 end, p1.2 end, p1.3 end, p1.4 end, p1.5 end, p1.6 end, p1.7 End respectively connecting interface 3d, and the p1.0 end of single-chip microcomputer and p1.1 end connect the first optocoupler and the second optocoupler respectively, described first Optocoupler and the second optocoupler connecting interface 2d respectively, the p1.4 end of described single-chip microcomputer, p1.5 end, p1.6 end, p1.7 end connect respectively Microcontroller is simultaneously grounded, the rst end ground connection of described single-chip microcomputer, and connecting interface 1d, institute are distinguished in the p3.0 end of single-chip microcomputer and p3.1 end State the p3.2 end of single-chip microcomputer, p3.3 end, p3.4 end, p3.5 end, p3.6 end, p3.7 end all hanging, the xtal2 end of described single-chip microcomputer Access crystal oscillator and xtal1 end between, described crystal oscillator two ends series capacitance 1c, electric capacity 2c are simultaneously grounded.
3. a kind of high efficiency charger test machine according to claim 1 it is characterised in that: the vcc end of described single-chip microcomputer Be connected in parallel electrochemical capacitor and electric capacity 3c and be grounded, the p0.0 end of described single-chip microcomputer and p0.1 end connect respectively resistance 1a one end and Resistance 2a one end, the resistance 1a other end and the resistance 2a other end connect the first LED lamp respectively and are grounded;The p0.2 of described single-chip microcomputer End and p0.3 end connect resistance 3a one end and resistance 4a one end respectively, and the resistance 3a other end and the resistance 4a other end connect the respectively Two LED lamps are simultaneously grounded;The p0.4 end of described single-chip microcomputer and p0.5 end connect resistance 5a one end and resistance 6a one end, resistance 5a respectively The other end and the resistance 6a other end connect the 3rd LED lamp respectively and are grounded;The p0.6 end of described single-chip microcomputer and p0.7 end connect respectively Connecting resistance 7a one end and resistance 8a one end, the resistance 7a other end and the resistance 8a other end connect the 4th LED lamp respectively and are grounded, institute State the ea termination vcc of single-chip microcomputer, the ale end of described single-chip microcomputer, psen end, p2.7 end, p2.6 end, p2.5 end, p2.4 end are all outstanding Empty.
4. a kind of high efficiency charger test machine according to claim 1 it is characterised in that: the p2.3 end of described single-chip microcomputer Connect diode 1b, described diode 1b two ends parallel connection the first relay switch;The p2.2 end of described single-chip microcomputer connects diode 2b, described diode 2b two ends parallel connection the second relay switch;The p2.1 end of described single-chip microcomputer connects diode 3b, described two poles Pipe 3b two ends parallel connection the 3rd relay switch;The p2.0 end of described single-chip microcomputer connects diode 4b, and described diode 4b two ends are simultaneously Join the 4th relay switch.
5. realize a kind of using method of high efficiency charger test machine described in claim 1 it is characterised in that: its user Method comprises the following steps:
A, charger to be tested is placed on test machine base, and test circuit plate is passed through control line and connect outside calculating Machine;
B, pre-set charger electric parameter to be tested and safety range on computers, charger test parameter to be tested, And input test routine;
C, open test switch, computer calls test program, and sends instructions in the single-chip microcomputer on test circuit plate;
The first TCH test channel in test program opened by d, test circuit plate single-chip microcomputer, starts to test after on test machine, display lamp goes out, The second TCH test channel is proceeded to immediately after display lamp is bright;Start after display lamp goes out on test machine to test, proceed to immediately after display lamp is bright 3rd TCH test channel;Start after display lamp goes out on test machine to test, after display lamp is bright, proceed to the 4th TCH test channel immediately;
On e, test machine, display lamp starts after going out to test, and treats that changing the plate time enters back into the first TCH test channel after display lamp is bright 1 second, And so on.
6. a kind of high efficiency charger test machine described in a claim 5 using method it is characterised in that: described step b Middle electric parameter includes theoretical under-voltage value, theoretical overpressure value, theoretical over current value and load resistance;Test parameter includes test electricity The scope of the test voltage of road plate and the scope of test electric current.
CN201610818733.5A 2016-09-13 2016-09-13 High-efficiency charger testing machine Pending CN106370951A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610818733.5A CN106370951A (en) 2016-09-13 2016-09-13 High-efficiency charger testing machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610818733.5A CN106370951A (en) 2016-09-13 2016-09-13 High-efficiency charger testing machine

Publications (1)

Publication Number Publication Date
CN106370951A true CN106370951A (en) 2017-02-01

Family

ID=57896726

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610818733.5A Pending CN106370951A (en) 2016-09-13 2016-09-13 High-efficiency charger testing machine

Country Status (1)

Country Link
CN (1) CN106370951A (en)

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101593989A (en) * 2008-12-31 2009-12-02 中南林业科技大学 An intelligent battery test charger and its control method
US20110254582A1 (en) * 2010-04-15 2011-10-20 Atc Logistics & Electronics, Inc. Systems and methods for modular testing of chargers
CN104215798A (en) * 2014-09-10 2014-12-17 东莞市冠佳电子设备有限公司 Corded automatic charger power-on tester
CN104227422A (en) * 2014-09-10 2014-12-24 东莞市冠佳电子设备有限公司 Automatic testing, riveting and laser carving production line for wired charger
CN104237573A (en) * 2014-10-09 2014-12-24 崧顺电子(深圳)有限公司 Automatic testing equipment for cellphone chargers
CN104330683A (en) * 2014-10-11 2015-02-04 邓文强 Mobile phone charger test equipment
CN105562938A (en) * 2016-01-29 2016-05-11 东莞市奥海电源科技有限公司 Charger automatic test and laser engraving production line
CN205539246U (en) * 2016-02-01 2016-08-31 东莞市奥海电源科技有限公司 A fill electrical function accredited testing organization for charger test wire
CN205539245U (en) * 2016-02-01 2016-08-31 东莞市奥海电源科技有限公司 A charger high pressure accredited testing organization for charger test wire
CN206274339U (en) * 2016-09-13 2017-06-23 叶丁有 A kind of high efficiency charger test machine

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101593989A (en) * 2008-12-31 2009-12-02 中南林业科技大学 An intelligent battery test charger and its control method
US20110254582A1 (en) * 2010-04-15 2011-10-20 Atc Logistics & Electronics, Inc. Systems and methods for modular testing of chargers
CN104215798A (en) * 2014-09-10 2014-12-17 东莞市冠佳电子设备有限公司 Corded automatic charger power-on tester
CN104227422A (en) * 2014-09-10 2014-12-24 东莞市冠佳电子设备有限公司 Automatic testing, riveting and laser carving production line for wired charger
CN104237573A (en) * 2014-10-09 2014-12-24 崧顺电子(深圳)有限公司 Automatic testing equipment for cellphone chargers
CN104330683A (en) * 2014-10-11 2015-02-04 邓文强 Mobile phone charger test equipment
CN105562938A (en) * 2016-01-29 2016-05-11 东莞市奥海电源科技有限公司 Charger automatic test and laser engraving production line
CN205539246U (en) * 2016-02-01 2016-08-31 东莞市奥海电源科技有限公司 A fill electrical function accredited testing organization for charger test wire
CN205539245U (en) * 2016-02-01 2016-08-31 东莞市奥海电源科技有限公司 A charger high pressure accredited testing organization for charger test wire
CN206274339U (en) * 2016-09-13 2017-06-23 叶丁有 A kind of high efficiency charger test machine

Similar Documents

Publication Publication Date Title
CN101034117B (en) Method and device for measuring power frequency parameters of transmission lines
CN108919002B (en) A test system for DC charging pile
CN201348658Y (en) Battery tester
CN202267720U (en) Distributed-type power interconnected inverter and electric vehicle charging machine integrated detection platform
CN105375572A (en) Intelligent detection device for electric automobile AC charging pile
CN103196491A (en) Transformer integral comprehensive detection device
CN205898937U (en) Hand -held type intelligence multichannel detects inspection of a line ware
CN113253079A (en) Microcomputer type direct current system insulation monitoring test device and method
CN102565591B (en) Automatic testing device for frequency converter power board
CN205280878U (en) Insulating and nuclear phase device of high influence electricity circuit is disturbed to high safe falling
CN205139349U (en) Arrester discharge counter and leakage current table check gauge
CN203976235U (en) Electric block energy efficiency testing device
CN208384025U (en) A kind of test macro of direct-current charging post
CN207557400U (en) A kind of low voltage failure circuit investigates instrument
CN111474512B (en) Acceptance detection method and device for newly-installed metering equipment and readable storage medium
CN202102059U (en) Power unit testing apparatus
CN208795801U (en) A kind of automatic no-load voltage ratio tester
CN203396921U (en) Multi-load voltage switch power test device
CN209417165U (en) A kind of charging pile test macro
CN106370951A (en) High-efficiency charger testing machine
CN202649459U (en) Temporary load device for electric energy metering device field calibration
CN206274339U (en) A kind of high efficiency charger test machine
CN205941851U (en) Automatic test equipment of test four ways output module power
CN214953981U (en) Aging testing cabinet
CN215678574U (en) Residual voltage and capacitor discharge automatic test tool

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication

Application publication date: 20170201

RJ01 Rejection of invention patent application after publication