CN106291190B - ZIF connector lower needle test structure - Google Patents
ZIF connector lower needle test structure Download PDFInfo
- Publication number
- CN106291190B CN106291190B CN201610673357.5A CN201610673357A CN106291190B CN 106291190 B CN106291190 B CN 106291190B CN 201610673357 A CN201610673357 A CN 201610673357A CN 106291190 B CN106291190 B CN 106291190B
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- CN
- China
- Prior art keywords
- needle
- probes
- needle block
- zif connector
- springs
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- 238000012360 testing method Methods 0.000 title claims abstract description 53
- 239000000523 sample Substances 0.000 claims abstract description 38
- 230000002093 peripheral effect Effects 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 4
- LAXBNTIAOJWAOP-UHFFFAOYSA-N 2-chlorobiphenyl Chemical compound ClC1=CC=CC=C1C1=CC=CC=C1 LAXBNTIAOJWAOP-UHFFFAOYSA-N 0.000 description 2
- 101710149812 Pyruvate carboxylase 1 Proteins 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 239000002360 explosive Substances 0.000 description 2
- 238000012797 qualification Methods 0.000 description 2
- 238000010276 construction Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The invention discloses a ZIF connector needle-setting test structure which has the advantages of simple structure, high test efficiency and low cost and can meet the automatic requirement of product test. The PCB comprises a PCB (1), a needle block (2), a needle cover (3), at least two springs (4) and a needle block fixing seat (5), wherein a plurality of probes (6) are fixedly arranged on the needle block (2), pinholes (31) which are used for the probes to pass through and are consistent with the probes in number are arranged on the needle cover, the lower ends of the springs are fixedly arranged on the needle block, the upper ends of the springs are propped against the lower side surface of the needle cover, a boss (32) is further arranged on the needle cover, a clamping table (51) which is tightly matched with the boss (32) in a propping manner is arranged on the needle block fixing seat, the PCB and the needle block are fixedly connected with the needle block fixing seat, the probes are arranged in a staggered manner, and the arrangement positions of the probes correspond to the wave crests of PIN feet on the ZIF connector to be tested. The invention can be applied to the field of test equipment.
Description
Technical Field
The invention relates to the field of test equipment, in particular to a ZIF connector lower needle test structure.
Background
At present, the ZIF connector has very small width of the PIN PINs, usually only 0.08mm, and the distance between the PIN PINs is very small, usually 0.175mm, so that the adoption of the needle-down test mode has very great difficulty. The existing clamp test ZIF connector is mainly tested by adopting a manual power strip mode, but the power strip test mode has the following defects:
1. the loss rate of the flat cable is very high, and the flat cable needs to be replaced frequently, so that the cost is increased;
2. the working efficiency is extremely low: because the power strip is manually carried out, time and labor are consumed, and the qualification rate of the test can be influenced due to the fact that the power strip is not inserted in place;
3. the automatic test requirement of the production line cannot be met.
Disclosure of Invention
The invention aims to solve the technical problem of overcoming the defects of the prior art and providing the ZIF connector needle-inserting test structure which has the advantages of simple structure, high test efficiency and low cost and can meet the automatic requirement of product test.
The technical scheme adopted by the invention is as follows: the PCB comprises a PCB, a needle block, a needle cover, at least two springs and a needle block fixing seat, wherein a plurality of probes are fixedly arranged on the needle block, pinholes which are used for the probes to pass through and are consistent with the probes in number are arranged on the needle cover, the lower ends of the springs are fixed on the needle block, the upper ends of the springs are propped against the lower side surface of the needle cover, a boss is further arranged on the needle cover, a clamping table which is tightly matched with the boss in a propping manner is arranged on the needle block fixing seat, the PCB and the needle block are fixedly connected with the needle block fixing seat, a plurality of probes are arranged on the needle block in a staggered manner, and the arrangement positions of the probes correspond to the wave crests of PIN feet on a ZIF connector to be tested.
According to the scheme, the probes are arranged on the PIN block in a staggered mode, the arrangement positions of the probes correspond to the wave crests of the PIN feet on the ZIF connector to be tested, the distance between the wave crests of any two adjacent PIN feet on the ZIF connector is the farthest, and the two adjacent PIN feet are staggered, so that the probes cannot contact with the adjacent PIN feet when the probes are in a needle falling mode, short circuits between the PIN feet are avoided, and the effectiveness and the high efficiency of testing are guaranteed. In addition, the ZIF connector is tested by adopting the structure of the invention, which can be used for automatic testing on automatic equipment, can meet the requirement of product testing automation, and greatly reduces the labor investment and the labor cost compared with the existing mode of manually inserting and arranging wires. The spring is arranged between the needle block and the needle cover to enable the needle block and the needle cover to repel each other, the boss arranged on the needle cover and the clamping table arranged on the needle block fixing seat are tightly propped against each other, when the ZIF connector test is not performed, the boss on the needle cover is tightly propped against the clamping table of the needle block fixing seat under the action of the spring force, and at the moment, the upper end of the probe is hidden in the needle cover and cannot be exposed on the needle cover, so that the probe is well protected; when the ZIF connector is tested, the ZIF connector is pressed on the needle cover, the needle cover is pressed down until the probe is exposed out of the needle cover and is tightly propped against the crest of the PIN of the ZIF connector to be tested, so that the ZIF connector is tested stably, and the test qualification rate and the test efficiency are ensured.
Further, a test groove matched with the ZIF connector to be tested is formed in the upper end face of the needle cover, the needle hole is exposed out of the test groove, and chamfer faces are formed in the peripheral edges of the test groove.
The scheme shows that the test groove and the chamfer surface arranged at the peripheral edge of the test groove can enable the ZIF connector to be tested to be well aligned and imported when being tested, and the accuracy of test connection and the high efficiency of test are guaranteed.
Still further, the lower extreme of probe with PCB board fixed connection, the up end of probe is provided with the chamfer groove perpendicularly alternately, forms the contact in the junction in two adjacent chamfer grooves.
The scheme shows that the test contact end of the probe is provided with a structure with a plurality of contacts, so that the reliability of connection is ensured, and the smooth performance of the test is ensured.
Still further still, still be provided with the locating hole on the needle piece fixing base, the locating hole cooperatees with the contour screw.
The above scheme shows that the pin block module is matched with the positioning hole through the equal-height screw, when the pin block module is installed, the whole pin block module floats, when a product test is carried out, a plurality of different connectors possibly exist on each product, certain height tolerance exists on patches of the different connectors, and the floating pin block module structure can well meet the test of various connectors.
Still further, the number of the springs is four, and the four springs are uniformly distributed around the needle block.
The scheme shows that the four springs are adopted and are uniformly distributed around the needle block, so that the stress of the needle cover is uniform, the needle cover cannot deviate, and the service life of the probe and the smooth performance of the test are ensured.
Drawings
FIG. 1 is a simplified schematic diagram of the structure of the invention in elevation;
FIG. 2 is a simplified schematic diagram of an explosive structure at a first view angle in accordance with the present invention;
FIG. 3 is a simplified schematic diagram of an explosive structure at a second view angle in accordance with the present invention;
FIG. 4 is a simplified schematic cross-sectional construction of the present invention;
FIG. 5 is a simplified schematic structural diagram of the probe;
FIG. 6 is a simplified schematic of the PIN portion of the ZIF connector;
FIG. 7 is a simplified schematic structural view of a projection from a needle aperture in the needle cover to a ZIF connector.
Description of the embodiments
As shown in fig. 1 to 7, the present invention includes a PCB board 1, a needle block 2, a needle cover 3, at least two springs 4, and a needle block fixing seat 5. The locating pin 11 is arranged on the lower side face of the needle block 2, and the locating pin 11 is arranged so as to be convenient for rapidly locating when the PCB is installed. A plurality of probes 6 are fixedly arranged on the needle block 2, and needle holes 31 which are used for the probes 6 to pass through and are consistent with the number of the probes 6 are arranged on the needle cover 3. For different ZIF connectors 8 to be tested, the number of probes of the needle block and the number of pinholes on the needle cover are set to be consistent with the number of PIN PINs of the ZIF connector 8 to be tested. Therefore, the ZIF connectors of different batches can be replaced only by replacing the needle block and the needle cover corresponding to the needle block. The lower end of the spring 4 is fixed on the needle block 2, and the upper end is propped against the lower side surface of the needle cover 3. The number of the springs 4 is four, and the four springs 4 are uniformly distributed around the needle block 2. The needle cover 3 is also provided with a boss 32, and the needle block fixing seat 5 is provided with a clamping table 51 which is in tight fit with the boss 32. The PCB 1 and the needle block 2 are fixedly connected with the needle block fixing seat 5. On the needle block 2, the probes 6 are arranged in a staggered manner, and the arrangement position of the probes 6 corresponds to a crest 7 of a PIN foot on the ZIF connector to be tested.
The upper end face of the needle cover 3 is provided with a test groove 33 matched with the ZIF connector to be tested, the needle hole 31 is exposed on the test groove 33, and the periphery edge of the test groove 33 is provided with a chamfer surface 34. The chamfer face 34 enables the ZIF connector to be tested to be well aligned and guided during testing, and accuracy of test connection and high efficiency of testing are guaranteed. The lower end of the probe 6 is fixedly connected with the PCB 1, the upper end surface of the probe 6 is vertically crossed and provided with an inverted triangle groove 61, and a contact 62 is formed at the joint of two adjacent inverted triangle grooves 61. Because the PIN foot of the ZIF connector is smaller, the connection between the probe and the PIN foot can be well ensured to be effective by adopting the flower needle structure with a plurality of contacts. The needle block fixing seat 5 is also provided with a positioning hole 52, and the positioning hole 52 is matched with a contour screw. The needle block module is matched with the positioning hole through the equal-height screw, and the whole needle block module floats when being installed; when the product is tested, a plurality of different connectors possibly exist on each product, and the patches of the different connectors have certain height tolerance. In addition, the purpose of adopting the contour screw is to guarantee that the needle block module has certain mobility to guarantee the automatic counterpoint of needle block module and connector.
The invention uses the mode of directly mounting and dismounting the pins on the ZIF connector, solves the problem of the traditional testing mode of adopting the manual power strip, greatly reduces the labor cost, ensures that the whole pin block module is suitable for the automatic requirement of the production line, improves the working efficiency, and has stable test, high test precision and high test passing rate; and the structure is compact and simple, and the assembly, maintenance and operation are convenient.
The invention can be applied to the field of test equipment.
Claims (4)
1. The utility model provides a ZIF connector needle test structure down which characterized in that: the test structure comprises a PCB (1), a needle block (2), a needle cover (3), at least two springs (4) and a needle block fixing seat (5), wherein a plurality of probes (6) are fixedly arranged on the needle block (2), pinholes (31) which are used for the probes (6) to pass through and are consistent with the probes (6) in number are arranged on the needle cover (3), the lower ends of the springs (4) are fixed on the needle block (2), the upper ends of the springs are propped against the lower side surface of the needle cover (3), a boss (32) is further arranged on the needle cover (3), a clamping table (51) which is in tight fit with the boss (32) is arranged on the needle block fixing seat (5), the PCB (1) and the needle block (2) are fixedly connected with the needle block fixing seat (5), the plurality of probes (6) are arranged in a dislocation mode, and the arrangement positions of the probes (6) correspond to the positions of the PINs on the ZIF connector to be tested; the lower end of the probe (6) is fixedly connected with the PCB (1), the upper end face of the probe (6) is vertically and crosswise provided with a chamfer groove (61) matched with a PIN foot, and a contact (62) is formed at the joint of two adjacent chamfer grooves (61).
2. The ZIF connector lower pin test structure of claim 1, wherein: the upper end face of the needle cover (3) is provided with a test groove (33) matched with the ZIF connector to be tested, the needle hole (31) is exposed out of the test groove (33), and the peripheral edge of the test groove (33) is provided with a chamfer surface (34).
3. The ZIF connector lower pin test structure of claim 1, wherein: and the needle block fixing seat (5) is also provided with a positioning hole (52), and the positioning hole (52) is matched with the equal-height screw.
4. A ZIF connector lower pin test structure according to any one of claims 1 to 3, wherein: the number of the springs (4) is four, and the four springs (4) are uniformly distributed around the needle block (2).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610673357.5A CN106291190B (en) | 2016-08-16 | 2016-08-16 | ZIF connector lower needle test structure |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610673357.5A CN106291190B (en) | 2016-08-16 | 2016-08-16 | ZIF connector lower needle test structure |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106291190A CN106291190A (en) | 2017-01-04 |
| CN106291190B true CN106291190B (en) | 2023-07-25 |
Family
ID=57671759
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610673357.5A Active CN106291190B (en) | 2016-08-16 | 2016-08-16 | ZIF connector lower needle test structure |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106291190B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108680774B (en) * | 2018-07-18 | 2024-02-13 | 珠海市运泰利自动化设备有限公司 | ZIF flat cable turns over earlier and then hidden visual interlocking prevents slow-witted mechanism |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN202133690U (en) * | 2011-05-23 | 2012-02-01 | 家原探针工业有限公司 | Improved Probe Probe |
| CN202256408U (en) * | 2011-10-27 | 2012-05-30 | 纬创资通股份有限公司 | probe |
| CN203117235U (en) * | 2013-01-09 | 2013-08-07 | 矽品科技（苏州）有限公司 | Test probe |
| CN203786157U (en) * | 2014-03-26 | 2014-08-20 | 深圳市明信测试设备有限公司 | Conversion device for PCB connector test |
| CN203838194U (en) * | 2014-04-28 | 2014-09-17 | 昆山明创电子科技有限公司 | PCB board small needle testing tool |
| CN204230530U (en) * | 2014-07-01 | 2015-03-25 | 昆山恒睿测控软件有限公司 | Tapered relocation mechanism |
| CN204789649U (en) * | 2015-07-14 | 2015-11-18 | 珠海市运泰利自动化设备有限公司 | ZIF connector hypodermic needle surveys test panel |
| CN105467176A (en) * | 2015-12-10 | 2016-04-06 | 苏州世纪福智能装备股份有限公司 | A double layer floating type high density connector |
| CN105629151A (en) * | 2015-12-16 | 2016-06-01 | 珠海市运泰利自动化设备有限公司 | Precision test probe module set |
| CN205958669U (en) * | 2016-08-16 | 2017-02-15 | 珠海市运泰利自动化设备有限公司 | ZIF connector hypodermic needle tests structure |
-
2016
- 2016-08-16 CN CN201610673357.5A patent/CN106291190B/en active Active
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| Publication number | Publication date |
|---|---|
| CN106291190A (en) | 2017-01-04 |
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