CN106289728A - Naked regarding plate optic test tool and using method thereof - Google Patents

Naked regarding plate optic test tool and using method thereof Download PDF

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Publication number
CN106289728A
CN106289728A CN201610694784.1A CN201610694784A CN106289728A CN 106289728 A CN106289728 A CN 106289728A CN 201610694784 A CN201610694784 A CN 201610694784A CN 106289728 A CN106289728 A CN 106289728A
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CN
China
Prior art keywords
optical
network point
naked
light
test network
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CN201610694784.1A
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Chinese (zh)
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CN106289728B (en
Inventor
陈志恒
叶钧皓
李文妤
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苏州茂立光电科技有限公司
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Priority to CN201610694784.1A priority Critical patent/CN106289728B/en
Publication of CN106289728A publication Critical patent/CN106289728A/en
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Publication of CN106289728B publication Critical patent/CN106289728B/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for

Abstract

The present invention provides a kind of naked regarding plate optic test tool and using method thereof, and measurement jig is used for covering in an optical thin film side to test, and naked regarding plate in order to develop one.Measurement jig includes an optical element and a Test Network point group, optical element has an incident side, for receiving the light of at least one light source, Test Network point group is adjacent to incident side and is laid in optical element in banding, and the distance of Test Network point group and optical element is gradual change.After incident side receives light, Test Network point group forms a main bright band distribution section, through the optical appearance observing main bright band distribution section, one can be obtained and take light capacity adjusting position, naked regarding plate with exploitation, thus can be greatly decreased in development process, each release derivative by examination erroneous administration of purgatives is naked regarding plate cost, and the time cost of sequential test optical effect.

Description

Naked regarding plate optic test tool and using method thereof
Technical field
The present invention relates to a kind of naked regarding plate optic test tool and using method thereof.
Background technology
Display device sets aspect according to purposes or assembly group and numerous classification, such as straight-down negative, side entering type can be divided into show set Standby or reflective type display apparatus etc., those display devices the most all must provide sufficient light show through light source component.Light Optical module is mainly dependent on by source component makes lamp source light form area source, and exposes to display floater and then the required picture of display. In light source component, optics be rendered as one of key factor affecting display effect, such as when outgoing light homogeneity slightly deviation Time, the image sharpness of display device then can be affected by and decline to a great extent, and overall optics taste deteriorates the most therewith.
In general, when designing the optical module in light source component, be based on the use of lamp source category, optics group The conditions such as part material, size are designed, and utilize optical module that lamp source uniform light is exposed to display floater.But, light Line is the most sensitive, and the change of a little structure or the factor such as lamp source selection i.e. can change overall optics and present and optics taste, such as when When optical module is used in combination with remaining material thin film, affected by thin film, can cause and cross bright such as regional area and cause light source structure Part forms the situations such as clearly the most demarcated bright area source and occurs, and reduces presenting of optics taste.Therefore for meet various go out light demand When carrying out optical module design, it is necessary to consider various parameter, and finely tune the every change of correction because of, more gradually carry out Experiments of Optics and weight Till multiple abovementioned steps light-out effect needed for obtaining, the global design of light source component can be completed.And if follow-up change With the use of thin film time, with the optical module designed, it is necessary to the structure that corresponding variations or modifications are original again is to maintain such as The requirement of uniform in light emission, therefore Experiments of Optics all must be repeated for different thin film and revise with adjusting, could again obtain new The design aspect of product.
Therefore in optical module product development, all must through numerous optic tests, draw a design and revise just can obtain relevant Parameter is to complete product design, and this measure causes development cost to be significantly increased, and need to spend and carry out Experiments of Optics the most for a long time.Institute With, the present inventor proposes a kind of naked regarding plate optic test tool and using method thereof, effectively to reduce optical articles now in this The disappearance of exploitation.
Summary of the invention
When the technical problem to be solved in the present invention is the optical module in order to overcome in prior art in design light source component Development process complicated, and need the defect of time-consuming sequential test optical effect, it is provided that a kind of naked regarding plate optic test tool And using method, reduce derivative naked of examination erroneous administration of purgatives depending on plate sample making cost and the time gradually measuring and revising, effectively add Speed product development.
The present invention solves above-mentioned technical problem by following technical proposals:
A kind of naked regarding plate optic test tool, it is used for covering and tests at least one optical thin film side, in order to develop One is naked regarding plate, including:
One optical element, has an incident side, for receiving the light that at least one light source sends;And
One Test Network point group, this incident side neighbouring is also laid in this optical element in banding, and this Test Network point group with should The distance gradual change of incident side;
Wherein, after this incident side receives the light that this light source sends, this Test Network point group forms a main bright band areal area Section, through the optical appearance of observation this main bright band distribution section, can obtain one and take light capacity adjusting position, naked in order to develop this Depending on plate.So, the passing naked sample cost by mistake derived regarding plate development process pilot scale and testing time are relatively effectively reduced.
It is preferred that this Test Network point group has gradual change distance for tilting to lay with this incident side, and may utilize main bright band Distribution section sentences to take light capacity adjusting positional information relative to the distance of incident side.
It is preferred that in addition to the most aforementioned Test Network point group is for tilting to lay, this Test Network point group is subsection setup, and in this light Learning base material and form some laying districts of area equation, and these some laying districts are arranged in step shape, thus available laying district is more For accurately taking light capacity adjusting position.
It is preferred that this Test Network point group is trapezoidal laying, and it lays width from one end towards another end decrescence, also can be in optics After base material receives the light of light source, form main bright band distribution section to take light capacity adjusting position.
Additionally, Test Network point group also can aspect be arranged as follows, this Test Network point group is for subsection setup, and in this optics base Material forms area some laying districts decrescence, and the centrage in each this laying district overlaps, and thus takes carrying out test Light capacity adjusting position.
Or, this Test Network point group of part has gradual change distance, this survey of part for tilting to lay with this incident side Examination site group for level lay and laying width from one end towards another end decrescence, and make Test Network point group formed special laying aspect with Test in response to optical thin film kind.
Present invention further teaches a kind of naked using method regarding plate optic test tool, comprise the steps of
S1, provide a measurement jig, covered by least one optical thin film, wherein this measurement jig include an optical element with One Test Network point group, this optical element has the incident side for receiving light, and this Test Network point group is adjacent to this incident side also This optical element it is laid in banding, and the distance gradual change of this Test Network point group and this incident side;And
S2, light this optical element, after this Test Network point group forms a main bright band distribution section, through observing this main bright band The optical appearance of distribution section, can obtain one and take light capacity adjusting position, naked regarding plate to develop one.It is preferred that this Test Network Point group has gradual change distance for tilting to lay with this incident side, and can obtain according to the spacing of main bright band distribution section with incident side Light capacity adjusting position must be taken and develop information as naked regarding plate.
It is preferred that this Test Network point group is subsection setup, and form some laying districts of area equation in this optical element, And these some laying districts are arranged in step shape, take light capacity adjusting position the most accurately to utilize those to lay district.
It is preferred that this Test Network point group is trapezoidal laying, and it lays width from one end towards another end decrescence, also can make optics Base material forms main bright band distribution section in Test Network point group after being lit, and then takes light capacity adjusting position.
In addition Test Network point group also can be arranged in aspect as described below, and this Test Network point group is subsection setup, and in this Optical element forms area some laying districts decrescence, and the centrage in each this laying district overlaps, thus to test Acquirement takes light capacity adjusting position.
Or, this Test Network point group of part has gradual change distance, this survey of part for tilting to lay with this incident side Examination site group for level lay and laying width from one end towards another end decrescence, and make Test Network point group formed special laying aspect with Test in response to optical thin film kind.
The most progressive effect of the present invention is:
The present invention's is naked regarding plate optic test tool and using method thereof, can be effectively reduced naked depending on plate exploitation and gradually survey The design cost of examination, it is provided that the most naked regarding plate exploitation test step.Utilize Test Network point group can obtain cooperation various During optical thin film, the naked optical appearance information being likely to be formed depending on plate, after light enters optical element, by optical thin film and Test Network Point group affects, it may appear that main bright band distribution section, can obtain light ability according to the optical appearance of main bright band distribution section and adjust Whole position, carries out the naked exploitation regarding plate.
Accompanying drawing explanation
Fig. 1 is the schematic diagram of the embodiment of the present invention 1.
Fig. 2 is the use schematic diagram of the embodiment of the present invention 1.
Fig. 3 is the schematic diagram that the embodiment of the present invention 1 further implements aspect.
Fig. 4 is the use schematic diagram that the embodiment of the present invention 1 further implements aspect.
Fig. 5 implements the use schematic diagram of aspect for the embodiment of the present invention 1 time.
Fig. 6 is the use schematic diagram of the embodiment of the present invention 1 another enforcement aspect.
Fig. 7 is the flow chart of steps of the embodiment of the present invention 2.
1: measurement jig
10: optical element
101: incident side
102: lay district
11: Test Network point group
2: optical thin film
3: light source
A: main bright band distribution section
Detailed description of the invention
Name preferred embodiment, and combine accompanying drawing and become apparent from intactly illustrating the present invention.
Embodiment 1
Referring to Fig. 1 and Fig. 2, it is the schematic diagram of the embodiment of the present invention 1 and uses schematic diagram.The present invention discloses a kind of naked Depending on plate optic test tool 1, it is used for covering and tests at least one optical thin film 2 side, naked regarding plate in order to develop one.Described Measurement jig 1 include optical element 10 and a Test Network point group 11.
Optical element 10 has an incident side 101, for receiving the light that at least one light source 3 such as light emitting diode is sent Line, it is preferred that optical element 10 is a plate body.Test Network point group 11 is adjacent to incident side and is laid in optical element 10 in banding On, the distance of Test Network point group 11 and incident side 101 be gradual change aspect.Thus, receive what light source 3 sent when incident side 101 After light, Test Network point group 11 position can form a main bright band distribution section A, through the optics observing main bright band distribution section A Performance, can obtain one and take light capacity adjusting position, takes light capacity adjusting position with utilization and carries out the naked exploitation regarding plate and design. Such as due to the distance gradual change of Test Network point group 11 with incident side 101, thus after main bright band distribution section A is formed, utilize main Bright band distribution section A and the distance values of incident side 101, and thereby determine to take light capacity adjusting position, then naked regarding plate pair Should take light capacity adjusting position to carry out light allotment, can solve naked the go out light derivative in response to optical thin film depending on plate affects. Naked refer to can be applicable to the area source component of reflective type display apparatus depending on plate, that is display device institute light requirement can be provided by naked depending on plate Line, to show that picture is used.In response to different display device specifications and demand, use regarding plate all kinds of optical thin films of collocation when naked Time, by the impact on physical properties of optical thin film, different optical thin films can make naked to be had optics far from each other depending on plate and presents.Thoroughly Cross the measurement jig 1 that the present embodiment discloses, can quickly detect and naked coordinate the optics after optical thin film 2 to present depending on plate, and pass through Observe optical appearance and obtain exploitation naked parameter needed for plate, reduce examination erroneous administration of purgatives and derivative sample cost and development time.
In the present embodiment, the laying aspect of Test Network point group 11 for tilt, and then with incident side 101 have gradual change away from From, and it is preferred that the layout density of Test Network point group 11 is certain value, making non-to cover when optical thin film 2, light enters optics After base material 10, the amount of light in each region of Test Network point group 11 is equal.When light source 3 light is entered optical element 10 by incident side 101 After, light can be formed out at Test Network point group 11, but affected by optical thin film 2, have genus at main bright band distribution section A non-homogeneous Go out the optical appearance of light, then through observing main bright band distribution section A to understand the light physical property such as refractive index by optical thin film 2 After impact, the bright dark Distribution Phenomena formed, more thereby obtain taking light capacity adjusting position.Such as capture main bright band distribution section A and the maximum of incident side 101 and minimum range parameter are as taking light capacity adjusting positional information, therefrom in naked regarding plate correspondence district The suitable light ability that takes allotment is done in territory, makes naked light-out effect needed for plate obtains.The most passing need to be in response to different optically thin Film 2 and gradually revise naked regarding plate design mode, can quickly obtain through this measurement jig 1 and cover at different optical thin films 2 Set issuable light-emitting phenomenon, and carry out the naked regarding plate of design according to its test result, exempt design iterations, draw a design and The development procedures such as test, effectively reduce exploitation design cost.Wherein, the 2nd figure for the benefit of showing, main bright band is distributed section A, Therefore non-owner's bright band distribution section location A in Test Network point group 11, is to compare distribution the most intensive the cuing open of section A of main bright band It is illustrated by upper thread, represent at this go out light intensity less than main bright band distribution section A go out light intensity.
Please continue refering to Fig. 3 and Fig. 4, it is another schematic diagram implementing aspect of the embodiment of the present invention 1 and use schematic diagram.With Lower disclose Test Network point group 11 further preferably lay aspect, such as based on tilting under banding aspect, for can the most accurately Acquirement takes light capacity adjusting position, and also can make Test Network point group 11 is subsection setup, and forms area equation in optical element 10 Some laying districts 102, and those lay districts 102 for arranged in step shape setting, as shown in Figure 3.Stair-stepping test site Group 11 also has different distance relative to incident side 101, such as according to the laying at its place after main bright band distributed areas A is formed The spacing of main bright band distributed areas A and incident side 101 can be learnt position by district 102, and then acquisition takes light capacity adjusting position.Its In, the 4th figure for the benefit of showing, main bright band is distributed section A, therefore non-owner's bright band distribution section A position in Test Network point group 11 Put, be to compare the most intensive hatching signal of main bright band distribution section A, represent that the light intensity that goes out at this is divided less than main bright band Cloth section A goes out light intensity, and main bright band distribution section A is positioned at Test Network point group 11 and lays region, graphic center favored area Only for ease of signal, non-for actual main bright band distribution section A.
Please continue refering to the 5th figure, it is the use schematic diagram that the embodiment of the present invention 1 time implements aspect.Test Network point group 11 Except can be tilt or stepped be laid in optical element 10 in addition to, also can be trapezoidal laying, and the laying width of Test Network point group 11 From one end towards another end decrescence.Through the Test Network point group 11 of this kind of aspect, can cover in optical thin film 2 at optical element 10 equally And after being received light by incident side 101, form main bright band distribution section A in Test Network point group 11 position, recycle main bright band and divide Cloth section A takes light capacity adjusting position.Wherein, Fig. 5 for the benefit of showing, main bright band is distributed section A, therefore tests site In group 11, non-owner's bright band distribution section location A is with deeper hatching signal, represents that the light intensity that goes out at this is less than main bright band Distribution section A goes out light intensity.
Additionally, refer to Fig. 6, it is the use schematic diagram that the embodiment of the present invention 1 further implements aspect.Test Network point group 11 Also can be subsection setup, and form area some laying districts 102 decrescence in optical element 10, and respectively lay the center in district 102 Line overlaps.Similarly, utilize the Test Network point group 11 of this kind of aspect, also can cover in optical thin film 2 at optical element 10 And form main bright band distribution section A after receiving light, to take light capacity adjusting position.Or Test Network point group 11 also can present Part has gradual change distance for tilting to lay with incident side 101, and part is laid for level and lays width from one end towards another end Decrescence, Test Network point group 11 is made to form special laying aspect to test in response to optical thin film 2 kind.Wherein, Fig. 6 is Being beneficial to show that main bright band is distributed section A, therefore in Test Network point group 11, non-owner's bright band is distributed section location A with deeper section Line is illustrated, represents that the light intensity that goes out at this is distributed the light intensity that of section A less than main bright band, and main bright band distribution section A is positioned at Test Network point group 11 is laid in region, and graphic center favored area is only for ease of signal, non-by actual main bright band distribution section A bag Containing scope.
Embodiment 2
Referring to Fig. 7, it is the flow chart of steps of the embodiment of the present invention 2, and arranges in pairs or groups the most again refering to Fig. 1 and Fig. 2.The present invention Also disclose a kind of naked using method regarding plate optic test tool, comprise the steps of.First, it is provided that a measurement jig 1, by extremely A few optical thin film 2 covers, and wherein measurement jig 1 includes optical element 10 and Test Network point group 11, and optical element 10 has use In the incident side 101 of reception light, Test Network point group 11 is adjacent to incident side 101 and is laid in optical element 10 in banding, and surveys Examination site group 11 is gradual change (step S01) with the distance of incident side 101.The aspect of measurement jig 1 the most as shown in Figure 1, Yu Guang Learn and on base material 10, lay aforementioned Test Network point group 11, and Test Network point group 11 has the distance of gradual change with incident side 101.
Continue, light optical element 10, after Test Network point group 11 forms main bright band distribution section A, through observing main bright band The optical appearance of distribution section A, can obtain light capacity adjusting position, naked regarding plate (step S02) to develop.As in figure 2 it is shown, After lighting optical element 10 through light source 3, light enters optical element 10 from incident side 101 and is formed in Test Network point group 11 main Bright band distribution section A, can determine to take light capacity adjusting position by observing its optical appearance, and then naked regarding of making to be designed Plate foundation takes light capacity adjusting position and carries out optical design, to meet light demand.Detailed test citing is stated in embodiment 1 And, i.e. it is not repeated here in this.
Similarly, the Test Network point group 11 on optical element 10, it arranges aspect and removes the 1st and 2 figures such as is to tilt banding Outside laying, also can be illustrated in figure 3 subsection setup and form area equation in optical element 10, and be the some of arranged in step shape Lay district 102, and its use state see Fig. 4;Or as it is shown in figure 5, Test Network point group 11 be width by one end towards another end gradually The trapezoidal laying aspect subtracted;Or as shown in Figure 6, Test Network point group 11 also can be subsection setup and form area in optical element 10 Some laying districts 102 decrescence, and each centrage laying district 102 overlap aspect is set;Or Test Network point group 11 can Lay for level, or part is laid and the aspect etc. of the inclined laying of another part in level.The Test Network point group of above aspect 11, all contribute to obtaining measurement jig 1 and cover the optical phenomena that can produce after optical thin film 2, and then acquisition takes light and adjusts position Put to carry out corresponding design for naked depending on plate, exploitation all kinds of naked costs regarding plate needed for and examination erroneous administration of purgatives each sample release are greatly reduced Cost of manufacture.
In sum, through the present invention disclose naked regarding plate optic test tool and using method thereof, can effectively reduce naked Depending on plate development cost and time, by observing the optical appearance that measurement jig produces, and can obtain and corresponding naked take luminous energy depending on plate Power design attitude.The Test Network point group laid on optical element and incident side have different distance, therefore cover when light enters It is located at the optical element of optical thin film, and after Test Network point group forms main bright band distribution section, can be distributed by main bright band The optical appearance of section, pushes away to take light capacity adjusting position and can carry out corresponding design and development to naked depending on plate, effectively exempt examination Erroneous administration of purgatives and derivative each version sample cost, and constantly measure and the time cost revised.
Although the foregoing describing the detailed description of the invention of the present invention, it will be appreciated by those of skill in the art that these Being merely illustrative of, protection scope of the present invention is defined by the appended claims.Those skilled in the art is not carrying on the back On the premise of the principle and essence of the present invention, these embodiments can be made various changes or modifications, but these change Protection scope of the present invention is each fallen within amendment.

Claims (8)

1. naked regarding a plate optic test tool, it is used for covering and tests at least one optical thin film side, in order to develop one Naked regarding plate, it is characterised in that to include:
One optical element, has an incident side, for receiving the light that at least one light source sends;And
One Test Network point group, this incident side neighbouring is also laid in this optical element, and this Test Network point group enters light with this in banding The distance gradual change of side;
Wherein, after this incident side receives the light that this light source sends, this Test Network point group forms a main bright band distribution section, thoroughly Cross the optical appearance observing this main bright band distribution section, one can be obtained and take light capacity adjusting position, naked regarding plate in order to develop this.
The most naked regarding plate optic test tool, it is characterised in that this Test Network point group is for inclination is laid With this incident side, there is gradual change distance.
It is the most naked regarding plate optic test tool, it is characterised in that this Test Network point group is subsection setup, And form some laying districts of area equation in this optical element, and these some laying districts are arranged in step shape.
It is the most naked regarding plate optic test tool, it is characterised in that this Test Network point group is trapezoidal laying, And its laying width is from one end towards another end decrescence.
5. a naked using method regarding plate optic test tool, it is characterised in that comprise the steps of
S1, providing a measurement jig, covered by least one optical thin film, wherein this measurement jig includes an optical element and a survey Examination site group, this optical element has the incident side for receiving light, and this Test Network point group is adjacent to this incident side and in band Shape is laid in this optical element, and the distance gradual change of this Test Network point group and this incident side;And
S2, light this optical element, after this Test Network point group forms a main bright band distribution section, through observing the distribution of this main bright band The optical appearance of section, can obtain one and take light capacity adjusting position, naked regarding plate to develop one.
The most naked using method regarding plate optic test tool, it is characterised in that this Test Network point group is Tilt to lay and with this incident side, there is gradual change distance.
The most naked using method regarding plate optic test tool, it is characterised in that this Test Network point group is Subsection setup, and some laying districts of area equation are formed in this optical element, and these some laying districts are arranged in step shape.
The most naked using method regarding plate optic test tool, it is characterised in that this Test Network point group is Trapezoidal laying, and its laying width is from one end towards another end decrescence.
CN201610694784.1A 2016-08-19 2016-08-19 Naked view plate optic test jig and its application method CN106289728B (en)

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JPH06313883A (en) * 1993-03-03 1994-11-08 Nec Corp Back light device for liquid crystal panel
GB2353890A (en) * 1999-08-27 2001-03-07 Screen Technology Ltd Display arrangement
CN1441235A (en) * 2002-02-25 2003-09-10 瀚宇彩晶股份有限公司 Adjustable optical measurement equipment for liquid crystal panel
CN201153349Y (en) * 2007-12-24 2008-11-19 荣艺科技有限公司 Improved structure of light conducting plate
TW200928338A (en) * 2007-12-31 2009-07-01 Innolux Display Corp Adjustable optical measuring tool and method for using same
CN102588834A (en) * 2011-11-18 2012-07-18 友达光电股份有限公司 Backlight module and optical diaphragm thereof
CN103277744A (en) * 2013-05-30 2013-09-04 广州创维平面显示科技有限公司 Side-light type LED backlight module debugging jig
CN204494198U (en) * 2015-01-14 2015-07-22 上海向隆电子科技有限公司 Light source module and light guide plate
CN105650490A (en) * 2016-03-09 2016-06-08 苏州向隆塑胶有限公司 Lighting lamp and design method for light guide plate of lighting lamp
CN105929479A (en) * 2016-04-25 2016-09-07 上海向隆电子科技有限公司 Front light plate and design method thereof

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06313883A (en) * 1993-03-03 1994-11-08 Nec Corp Back light device for liquid crystal panel
GB2353890A (en) * 1999-08-27 2001-03-07 Screen Technology Ltd Display arrangement
CN1441235A (en) * 2002-02-25 2003-09-10 瀚宇彩晶股份有限公司 Adjustable optical measurement equipment for liquid crystal panel
CN201153349Y (en) * 2007-12-24 2008-11-19 荣艺科技有限公司 Improved structure of light conducting plate
TW200928338A (en) * 2007-12-31 2009-07-01 Innolux Display Corp Adjustable optical measuring tool and method for using same
CN102588834A (en) * 2011-11-18 2012-07-18 友达光电股份有限公司 Backlight module and optical diaphragm thereof
CN103277744A (en) * 2013-05-30 2013-09-04 广州创维平面显示科技有限公司 Side-light type LED backlight module debugging jig
CN204494198U (en) * 2015-01-14 2015-07-22 上海向隆电子科技有限公司 Light source module and light guide plate
CN105650490A (en) * 2016-03-09 2016-06-08 苏州向隆塑胶有限公司 Lighting lamp and design method for light guide plate of lighting lamp
CN105929479A (en) * 2016-04-25 2016-09-07 上海向隆电子科技有限公司 Front light plate and design method thereof

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