CN106154138B - A kind of locating connector applied to integrated circuit detection - Google Patents

A kind of locating connector applied to integrated circuit detection Download PDF

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Publication number
CN106154138B
CN106154138B CN201610462455.4A CN201610462455A CN106154138B CN 106154138 B CN106154138 B CN 106154138B CN 201610462455 A CN201610462455 A CN 201610462455A CN 106154138 B CN106154138 B CN 106154138B
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CN
China
Prior art keywords
stud
clamp plate
integrated circuit
telescopic rod
telescoping tube
Prior art date
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Application number
CN201610462455.4A
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Chinese (zh)
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CN106154138A (en
Inventor
王文庆
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jiangsu Xuhai Environmental Monitoring Co., Ltd.
Original Assignee
Dongguan Lianzhou Intellectual Property Operation and Management Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by Dongguan Lianzhou Intellectual Property Operation and Management Co Ltd filed Critical Dongguan Lianzhou Intellectual Property Operation and Management Co Ltd
Priority to CN201610462455.4A priority Critical patent/CN106154138B/en
Publication of CN106154138A publication Critical patent/CN106154138A/en
Application granted granted Critical
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2884Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2886Features relating to contacting the IC under test, e.g. probe heads; chucks
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2886Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations

Abstract

The invention discloses a kind of locating connectors applied to integrated circuit detection, vertical stud is fixedly connected on its lower clamp plate, upper clamp plate sleeve is on stud, stud upper sleeve on the upside of upper clamp plate has the first compression spring, the both ends of first compression spring press up against on upper clamp plate and swivel nut, swivel nut is screwed onto on stud, it is fixedly connected with column on upper clamp plate on rear side of stud, the upper end of column is fixedly connected with cross bar across swivel nut, stud upper sleeve on the upside of swivel nut has telescoping tube, stud upper sleeve on the upside of telescoping tube has the second compression spring, the both ends of second compression spring press up against on telescoping tube and cap, cap is screwed onto on stud;Telescopic rod is plugged in the telescoping tube, the front end of telescopic rod is plugged with vertical probe.It is to realize to be in contact the device connecting with the detection and localization of integrated circuit detection position point instead of hand, so as to discharge both hands, by being that interference signal, the detection work of convenient single completion integrated circuit is added in integrated circuit manually.

Description

A kind of locating connector applied to integrated circuit detection
Technical field:
The present invention relates to the technical fields of integrated circuit detector, being applied to integrated circuit more specifically to one kind The locating connector of detection.
Background technology:
Operational amplifier integrated circuit, also known as integrated operational amplifier, referred to as integrated transporting discharging are by multistage direct coupling Close the high-gain Analogous Integrated Electronic Circuits of amplifying circuit composition.The detection of existing operational amplifier integrated circuit generally manually uses Multimeter DC voltage shelves, between measuring operational amplifier output end and negative power end voltage value (in static state voltage value compared with It is high), while with two input terminals (addition interference signal) for holding metal tweezers and putting successively tactile operational amplifier, if universal meter Needle has swing by a relatively large margin, then illustrates that the operational amplifier is intact;If multimeter indicator is motionless, illustrate operational amplifier Damage.And suchlike manual inspection, the connected probe of detection table will be held and remove determining for contact integrated circuit detection position Position test point, but as operational amplifier integrated circuit detection, it is also necessary to manually give integrated circuit be added interference signal, then one It is more difficult that both hands complete detection.
Invention content:
The purpose of the present invention aiming at the prior art deficiency, and provide it is a kind of applied to integrated circuit detection determine Position attachment device, discharges both hands, and convenient be in contact with the detection and localization of integrated circuit detection position point connect.
To achieve the above object, technical scheme is as follows:
A kind of locating connector applied to integrated circuit detection, including lower clamp plate and upper clamp plate are fixed on lower clamp plate It is connected with vertical stud, for upper clamp plate sleeve on stud, the stud upper sleeve on the upside of upper clamp plate has the first compression spring, the first compression spring Both ends press up against on upper clamp plate and swivel nut, swivel nut is screwed onto on stud, is fixedly connected on the upper clamp plate on rear side of stud The upper end of column, column is fixedly connected with cross bar across swivel nut, and the stud upper sleeve on the upside of swivel nut has telescoping tube, telescoping tube upside Stud upper sleeve there is the second compression spring, the both ends of the second compression spring to press up against on telescoping tube and cap, cap is screwed onto stud On;
Telescopic rod is plugged in the telescoping tube, the front end of telescopic rod is plugged with vertical probe, and the lower end of probe is inserted It being cased with third compression spring and forms the axis platform of annular, the both ends of third compression spring press up against in the axis platform of telescopic rod and probe, The upper end of probe forms handle across telescopic rod, and handle is resisted against on telescopic rod.
The front end of the telescopic rod forms circular connector, and probe is plugged on the connector of telescopic rod.
The rear end of the telescoping tube forms circular connecting seat, and the connecting seat sleeve of telescoping tube is on stud.
The length of telescopic bar is less than the length of telescoping tube, and positioning screw, the bottom end of positioning screw are bolted on telescoping tube It is resisted against on telescopic rod.
Evacuation notch is formed on the upper clamp plate.
The spacing edge-cut of column is formed on the outer wall of the swivel nut, column is placed in the spacing edge-cut of swivel nut.
The beneficial effects of the present invention are:
It is to realize to be in contact the device connecting with the detection and localization of integrated circuit detection position point instead of hand, so as to Both hands are discharged, then by being that interference signal, the convenient single detection work for completing integrated circuit is added in integrated circuit manually.
Description of the drawings:
Fig. 1 is the three-dimensional structural schematic diagram of invention;
Fig. 2 is the dimensional structure diagram for inventing another angle;
Fig. 3 is the structural schematic diagram that invention is faced.
In figure:1, lower clamp plate;2, stud;3, upper clamp plate;31, notch is avoided;4, the first compression spring;5, swivel nut;6, telescoping tube; 7, telescopic rod;71, connector;8, probe;81, axis platform;82, handle;9, third compression spring;10, positioning screw;11, the second compression spring; 12, cap;13, column;14, cross bar.
Specific implementation mode:
Embodiment:See shown in Fig. 1 to 3, a kind of locating connector applied to integrated circuit detection, including lower clamp plate 1 With upper clamp plate 3, vertical stud 2 is fixedly connected on lower clamp plate 1, and 3 sleeve of upper clamp plate is on stud 2, the spiral shell of 3 upside of upper clamp plate 2 upper sleeve of column has the first compression spring 4, the both ends of the first compression spring 4 to press up against on upper clamp plate 3 and swivel nut 5, and swivel nut 5 is screwed onto spiral shell On column 2, it is fixedly connected with column 13 on the upper clamp plate 3 of 2 rear side of stud, the upper end of column 13 is fixedly connected with cross across swivel nut 5 2 upper sleeve of stud of bar 14,5 upside of swivel nut has telescoping tube 6,2 upper sleeve of stud of 6 upside of telescoping tube to have the second compression spring 11, the The both ends of two compression springs 11 press up against on telescoping tube 6 and cap 12, and cap 12 is screwed onto on stud 2;
It is plugged with telescopic rod 7 in the telescoping tube 6, the front end of telescopic rod 7 is plugged with vertical probe 8, under probe 8 End is inserted with third compression spring 9 and forms the axis platform 81 of annular, and the both ends of third compression spring 9 press up against telescopic rod 7 and probe 8 Axis platform 81 on, the upper end of probe 8 forms handle 82 across telescopic rod 7, and handle 82 is resisted against on telescopic rod 7.
The front end of the telescopic rod 7 forms circular connector 71, and probe 8 is plugged on the connector 71 of telescopic rod 7.
The rear end of the telescoping tube 6 forms circular connecting seat, and the connecting seat sleeve of telescoping tube 6 is on stud 2.
7 length of the telescopic rod is less than the length of telescoping tube 6, and positioning screw 10, positioning screw 10 are bolted on telescoping tube 6 Bottom end be resisted against on telescopic rod 7.
Evacuation notch 31 is formed on the upper clamp plate 3.
The spacing edge-cut of column 13 is formed on the outer wall of the swivel nut 5, column 13 is placed in the spacing edge-cut of swivel nut 5 It is interior.
Operation principle:The present invention is the used detection anchor point attachment device that nondominant hand work detects integrated circuit, The edge of integrated circuit board is clamped by upper clamp plate 3 and lower clamp plate 1, to the fixed present apparatus, then adjusts positioning, that is, moves With rotation telescopic rod 7, the probe 8 on telescopic rod 7 is made to be located at the top of detection anchor point, and probe 8 can pass through conducting wire and inspection The table tool of survey is electrically connected, while probe 8 is Elastic Contact with the contact of detection anchor point, is avoided that poor contact.

Claims (6)

1. a kind of locating connector applied to integrated circuit detection, including lower clamp plate (1) and upper clamp plate (3), lower clamp plate (1) On be fixedly connected with vertical stud (2), upper clamp plate (3) sleeve is on stud (2), it is characterised in that:On the upside of upper clamp plate (3) Stud (2) upper sleeve has the first compression spring (4), the both ends of the first compression spring (4) to press up against on upper clamp plate (3) and swivel nut (5), spiral shell Set (5) is screwed onto on stud (2), is fixedly connected with column (13) on the upper clamp plate (3) on rear side of stud (2), column (13) it is upper End is fixedly connected with cross bar (14) across swivel nut (5), and stud (2) upper sleeve on the upside of swivel nut (5) has telescoping tube (6), telescoping tube (6) stud (2) upper sleeve on the upside of has the second compression spring (11), the both ends of the second compression spring (11) press up against telescoping tube (6) and On cap (12), cap (12) is screwed onto on stud (2);
It is plugged with telescopic rod (7) in the telescoping tube (6), the front end of telescopic rod (7) is plugged with vertical probe (8), probe (8) lower end is inserted with third compression spring (9) and forms the axis platform (81) of annular, and the both ends of third compression spring (9) press up against In the axis platform (81) of telescopic rod (7) and probe (8), the upper end of probe (8) forms handle (82), handle across telescopic rod (7) (82) it is resisted against on telescopic rod (7).
2. a kind of locating connector applied to integrated circuit detection according to claim 1, it is characterised in that:It is described The front end of telescopic rod (7) forms circular connector (71), and probe (8) is plugged on the connector (71) of telescopic rod (7).
3. a kind of locating connector applied to integrated circuit detection according to claim 1, it is characterised in that:It is described The rear end of telescoping tube (6) form circular connecting seat, the connecting seat sleeve of telescoping tube (6) is on stud (2).
4. a kind of locating connector applied to integrated circuit detection according to claim 1, it is characterised in that:It is described Telescopic rod (7) length is less than the length of telescoping tube (6), and positioning screw (10) is bolted on telescoping tube (6), positioning screw (10) Bottom end is resisted against on telescopic rod (7).
5. a kind of locating connector applied to integrated circuit detection according to claim 1, it is characterised in that:It is described Upper clamp plate (3) on form evacuation notch (31).
6. a kind of locating connector applied to integrated circuit detection according to claim 1, it is characterised in that:It is described The spacing edge-cut of column (13) is formed on the outer wall of swivel nut (5), column (13) is placed in the spacing edge-cut of swivel nut (5).
CN201610462455.4A 2016-06-20 2016-06-20 A kind of locating connector applied to integrated circuit detection Active CN106154138B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610462455.4A CN106154138B (en) 2016-06-20 2016-06-20 A kind of locating connector applied to integrated circuit detection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610462455.4A CN106154138B (en) 2016-06-20 2016-06-20 A kind of locating connector applied to integrated circuit detection

Publications (2)

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CN106154138A CN106154138A (en) 2016-11-23
CN106154138B true CN106154138B (en) 2018-08-17

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Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19741352A1 (en) * 1997-09-19 1999-04-15 Mci Computer Gmbh Test socket for testing integrated circuit structural elements having connecting legs
CN200953371Y (en) * 2006-09-06 2007-09-26 罗贯诚 Battery charge
DE102006053006A1 (en) * 2006-11-10 2008-05-15 Ratzky, Christian Circuit testing device, has contact unit for connecting circuit with testing device, and fixation unit for fixing circuit, where contact unit is connected with fixation unit by frame, which is attached detachably to contact unit
CN102508487A (en) * 2011-11-11 2012-06-20 扬州新海电气自动化有限公司 Efficient detection device for motor control modules
CN102778593A (en) * 2011-05-12 2012-11-14 亚旭电脑股份有限公司 Inspection device applying probe contact for signal transmission
CN102854453A (en) * 2012-08-17 2013-01-02 苏州启智机电技术有限公司 Probe-type test fixture
CN103063959A (en) * 2012-12-29 2013-04-24 北京德天泉机电设备有限公司 Bed-of-nails tool for detecting circuit board
CN103149388A (en) * 2013-02-06 2013-06-12 深圳欧菲光科技股份有限公司 Integrated circuit test connecting device and integrated circuit test connecting method
CN203365492U (en) * 2013-07-26 2013-12-25 英利能源(中国)有限公司 Probe assembly and solar cell module tester possessing same

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19741352A1 (en) * 1997-09-19 1999-04-15 Mci Computer Gmbh Test socket for testing integrated circuit structural elements having connecting legs
CN200953371Y (en) * 2006-09-06 2007-09-26 罗贯诚 Battery charge
DE102006053006A1 (en) * 2006-11-10 2008-05-15 Ratzky, Christian Circuit testing device, has contact unit for connecting circuit with testing device, and fixation unit for fixing circuit, where contact unit is connected with fixation unit by frame, which is attached detachably to contact unit
CN102778593A (en) * 2011-05-12 2012-11-14 亚旭电脑股份有限公司 Inspection device applying probe contact for signal transmission
CN102508487A (en) * 2011-11-11 2012-06-20 扬州新海电气自动化有限公司 Efficient detection device for motor control modules
CN102854453A (en) * 2012-08-17 2013-01-02 苏州启智机电技术有限公司 Probe-type test fixture
CN103063959A (en) * 2012-12-29 2013-04-24 北京德天泉机电设备有限公司 Bed-of-nails tool for detecting circuit board
CN103149388A (en) * 2013-02-06 2013-06-12 深圳欧菲光科技股份有限公司 Integrated circuit test connecting device and integrated circuit test connecting method
CN203365492U (en) * 2013-07-26 2013-12-25 英利能源(中国)有限公司 Probe assembly and solar cell module tester possessing same

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Effective date of registration: 20181224

Address after: 221113 Huangji Town Industrial Park, Tongshan District, Xuzhou City, Jiangsu Province

Patentee after: Xuzhou Guhan Fragrance Industry Co., Ltd.

Address before: 523000 productivity building 406, high tech Industrial Development Zone, Songshan Lake, Dongguan, Guangdong

Patentee before: DONGGUAN LIANZHOU INTELLECTUAL PROPERTY OPERATION AND MANAGEMENT CO., LTD.

TR01 Transfer of patent right
TR01 Transfer of patent right

Effective date of registration: 20190711

Address after: 221000 Academy of Agricultural Sciences, Damiao Street Office, Xuzhou Economic and Technological Development Zone, Jiangsu Province

Patentee after: Jiangsu Xuhai Environmental Monitoring Co., Ltd.

Address before: 221113 Huangji Town Industrial Park, Tongshan District, Xuzhou City, Jiangsu Province

Patentee before: Xuzhou Guhan Fragrance Industry Co., Ltd.

TR01 Transfer of patent right