CN106093745B - A kind of power automatic device chip card Auto-Test System - Google Patents

A kind of power automatic device chip card Auto-Test System Download PDF

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Publication number
CN106093745B
CN106093745B CN201610368897.2A CN201610368897A CN106093745B CN 106093745 B CN106093745 B CN 106093745B CN 201610368897 A CN201610368897 A CN 201610368897A CN 106093745 B CN106093745 B CN 106093745B
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CN
China
Prior art keywords
test
chip card
auto
power supply
instrument
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Application number
CN201610368897.2A
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Chinese (zh)
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CN106093745A (en
Inventor
曹玉保
周兆庆
吴凯
丁琳
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南京国电南自电网自动化有限公司
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Priority to CN201610368897.2A priority Critical patent/CN106093745B/en
Publication of CN106093745A publication Critical patent/CN106093745A/en
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Publication of CN106093745B publication Critical patent/CN106093745B/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834Automated test systems [ATE]; using microprocessors or computers

Abstract

The invention discloses a kind of power automatic device chip card Auto-Test Systems, including test cabinet, PC machine, interchanger and adjustable DC power supply;Multiple testing backboards of chip card are installed, for providing multiple chip cards while carrying out the power supply of measured power output and be connected with chip card by testing backboard as the dsp board of entire test macro signal generator, the power supply and dsp board in the test cabinet;The PC machine is by serial ports and dsp board communication connection, using response formula specification, after the dsp board receives PC machine instruction, answers confirmation message, realizes the scheduling controlling to testing source;The IP address of multiple chip cards determines that Auto-Test System is polled test according to IP address sequence in the position of test cabinet by chip card to be measured, to once complete the automatic test of multiple chip cards.R&D cycle of the invention is short, and low cost has a good application prospect.

Description

A kind of power automatic device chip card Auto-Test System

Technical field

The present invention relates to a kind of power automatic device chip card Auto-Test Systems, belong to circuit board testing technology neck Domain.

Background technique

The operation of electric system is directly related to the daily of the every field such as social life, economy, education, national defence, military affairs Work, power automation is the development trend of electric system, is played in promoting China's economic growth and social progress important Effect.As power automation application is increasingly extensive, function becomes increasingly complex, and hardware integration degree is increasing, power automation The reliability of device is also increasingly taken seriously.

The reliability of power automatic device depends primarily on software reliability and hardware reliability.Wherein hardware reliability Significant portion is determined by the hardware performance of chip card.Beginning of the production test as plate grade functional test carries verifying and inserts The quality control work such as part is welded successfully, plate data input, software version confirm, hardware capability test, to chip card Quality plays important leverage effect.Automatically testing platform refers in the case where people seldom participates in, and measures automatically, handles number According to, and the system for showing and outputing test result.Compared with manual test, what automatic test can either effectively guarantee product can By property, and machine debugging efficiency can be greatly improved, it is low to tester's professional skill requirement, realize power automatic device intelligence Plug-in unit automatic test is inexorable trend.

Virtual instrument technology (Virtual instrument) is to be come using modularized hardware in conjunction with the software of high efficient and flexible Complete the application of various tests, measurement and automation.Virtual instrument has powerful data acquisition function;Secondly as based on number According to the programming language of stream, the operation and calculating to data are simple and efficient;And icon display function abundant is provided, these Feature makes virtual instrument be widely used in Development of auto-testing system at present.Virtual instrument divides data acquisition with data Analysis separates, and the result of data collecting plate card gives software by high speed communication bus, and instrumental function, can be flexible by software realization And it is effectively applied to the work such as various data acquisitions, parameter testing.

For chip card due to many kinds of, Various Functions, Auto-Test System is long there are the R&D cycle at present, and cost is high The problem of.

Summary of the invention

In view of the deficienciess of the prior art, it is an object of the present invention to provide a kind of R&D cycle short, low cost electric power from Chip card Auto-Test System is set in dynamic makeup, realizes the automatic test to power automatic device chip card.

To achieve the goals above, the present invention is to realize by the following technical solutions:

A kind of power automatic device chip card Auto-Test System of the invention, including test cabinet, PC machine, exchange Machine and adjustable DC power supply;Multiple testing backboards of chip card are installed, for providing multiple intelligence in the test cabinet Plug-in unit carries out the power supply of measured power output and the dsp board as entire test macro signal generator, the confession simultaneously Power supply and dsp board are connected with chip card by testing backboard;The PC machine is adopted by serial ports and dsp board communication connection Confirmation message is answered after the dsp board receives PC machine instruction with response formula specification, realizes the scheduling controlling to testing source; The IP address of multiple chip cards determines that Auto-Test System is according to IP in the position of test cabinet by chip card to be measured Sequence of addresses is polled test, to once complete the automatic test of multiple chip cards.

Wherein, interchanger for testing each hardware ethernet communication connection in the test cabinet automatically.

Wherein, adjustable DC power supply be used to export needed in Auto-Test System plus voltage drive, such as open into it is dynamic Make voltage/return voltage test, plug-in unit electrical testing up and down.

Above-mentioned PC machine controls the output of adjustable DC power supply by instrument drivers (details are not described herein again for existing program) The driving voltage added is needed in Auto-Test System.

Above-mentioned instrument drivers are to pass through the control to instrument driving for controlling programmable instrument software set Realize the control to test equipment;Each subprogram corresponds to the programming operation of instrument, and the programming operation includes initialization, matches It sets, read, close;ATS software may be implemented in a variety of ways instrument programming interface, and Auto-Test System utilizes instrument Device manufacturer provides the library DLL and realizes instrument driving.(above method is universal method, this test macro is provided using instrument business men The library DLL)

The DC voltage regulation range of above-mentioned adjustable DC power supply is 0-300V, precision 0.01V.

Guide rail for fixing chip card position is installed in above-mentioned test cabinet.

Above-mentioned test cabinet uses bakelite plate.

Test macro use virtual instrument technology, test macro include four funtion parts: parameter setting, operational monitoring, Test result and service information;The parameter setting is used to complete the setting of measuring accuracy;The operational monitoring for supervising in real time Communication health degree is surveyed, entire test macro is monitored and is dispatched;The test result currently tests knot for real-time display Fruit;When there is rejected product to occur, the service information provides maintenance opinion, quickly instructs the failure of chip card to repair fixed Position.

A kind of power automatic device chip card Auto-Test System of the invention, including test cabinet, PC machine, exchange Machine and adjustable DC power supply;The automatic test to power automatic device chip card is realized, the R&D cycle is short, low cost, It has a good application prospect, is worthy to be popularized.

Detailed description of the invention

Fig. 1 is a kind of power automatic device chip card Auto-Test System schematic diagram of the invention;

Fig. 2 is a kind of power automatic device chip card ATS software design drawing of the invention.

Specific embodiment

To be easy to understand the technical means, the creative features, the aims and the efficiencies achieved by the present invention, below with reference to Specific embodiment, the present invention is further explained.

Referring to Fig. 1 and Fig. 2, a kind of power automatic device chip card Design of Automatic Test System method of the invention is such as Under, following steps are specifically included,

Step (1) tests cabinet and uses bakelite plate, built-in plastic guide rail and power supply.Dedicated testing backboard, will Chip card and power supply, the connection of dsp board hardware.

Step (2) power supply power is big, can stablize the power output for providing 8 chip cards while being tested.

Signal generator of step (3) dsp board as entire test macro.PC machine directly passes through serial ports and dsp board communicates, Using response formula specification, after dsp board receives PC machine instruction, confirmation message is answered, realizes the scheduling controlling to test signal.

Step (4) interchanger is for each hardware ethernet communication connection of automatic test machine case.

Step (5) instrument driving: Driver Development is carried out to the test equipment in chip card test platform.Instrument drives Dynamic program is that the control to test equipment is realized by the control to instrument driving for controlling programmable instrument software set System.Each subprogram corresponds to the programming operation of instrument, such as initialization, configuration, reading, closing.Testing system software can be with Various ways realize instrument programming interface, such as provide the library DLL, or the driver voluntarily write using apparatus manufacture.

The programme-controlled dc power DC voltage regulation range that step (6) this test cabinet is selected is 0-300V, and precision is 0.01V, while back production DC current.PC machine exports the electricity for needing to add in test platform by instrument driving, control programmable power supply Pressure excitation, such as open into operation voltage/return voltage test, plug-in unit up and down electrical testing.

(7) 8 testing backboard IP address of step are determined by chip card to be measured in the position of test cabinet.Automatic test system System is polled test according to IP address sequence, once completes the automatic test of 8 chip cards, and testing efficiency is high.

Step (8) software design uses virtual instrument technology, and test macro is mainly made of four partial functions: parameter is set It sets, operational monitoring, test result, service information.Parameter setting mainly completes some settings of measuring accuracy.Operational monitoring is real-time Monitoring communication health degree, is monitored and dispatches to entire test macro.The current test result of test result real-time display.When having When rejected product occurs, service information provides maintenance opinion, and the failure of chip card is quickly instructed to repair positioning.

A kind of power automatic device chip card Auto-Test System of the invention, including test cabinet, PC machine, exchange Machine and adjustable DC power supply;Software carries out Functional Design with virtual instrument technology, realizes to power automatic device intelligence The automatic test of plug-in unit, the R&D cycle is short, and low cost has a good application prospect, and is worthy to be popularized.

The above shows and describes the basic principles and main features of the present invention and the advantages of the present invention.The technology of the industry Personnel are it should be appreciated that the present invention is not limited to the above embodiments, and the above embodiments and description only describe this The principle of invention, without departing from the spirit and scope of the present invention, various changes and improvements may be made to the invention, these changes Change and improvement all fall within the protetion scope of the claimed invention.The claimed scope of the invention by appended claims and its Equivalent thereof.

Claims (4)

1. a kind of power automatic device chip card Auto-Test System, which is characterized in that including testing cabinet, PC machine, friendship It changes planes and adjustable DC power supply;
Multiple testing backboards of chip card are installed, for providing multiple chip card while being surveyed in the test cabinet The power supply and dsp board as entire test macro signal generator for trying power output, the power supply and dsp board with Chip card is connected by testing backboard;
The PC machine is by serial ports and dsp board communication connection, using response formula specification, after the dsp board receives PC machine instruction, returns Confirmation message is answered, realizes the scheduling controlling to testing source;
The IP address of multiple chip cards by chip card to be measured test cabinet position determine, Auto-Test System root It is polled test according to IP address sequence, to once complete the automatic test of multiple chip cards;
The PC machine controls adjustable DC power supply by instrument drivers and exports the excitation for needing to add in Auto-Test System electricity Pressure;
The instrument drivers are to be realized for controlling programmable instrument software set by the control to instrument driving Control to test equipment;Each subprogram corresponds to the programming operation of instrument, the programming operation include initialization, configuration, It reads, close;ATS software may be implemented in a variety of ways instrument programming interface, and Auto-Test System utilizes instrument plant Quotient provides the library DLL and realizes instrument driving.
2. power automatic device chip card Auto-Test System according to claim 1, which is characterized in that it is described can The DC voltage regulation range of tuning DC power supply is 0-300V, precision 0.01V.
3. power automatic device chip card Auto-Test System according to claim 1, which is characterized in that the survey Guide rail for fixing chip card position is installed in test-run a machine case.
4. power automatic device chip card Auto-Test System according to claim 1, which is characterized in that the survey Test-run a machine case uses bakelite plate.
CN201610368897.2A 2016-05-30 2016-05-30 A kind of power automatic device chip card Auto-Test System CN106093745B (en)

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CN201610368897.2A CN106093745B (en) 2016-05-30 2016-05-30 A kind of power automatic device chip card Auto-Test System

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Application Number Priority Date Filing Date Title
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CN106093745B true CN106093745B (en) 2019-04-16

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Publication number Priority date Publication date Assignee Title
CN108490337A (en) * 2018-03-14 2018-09-04 广州视源电子科技股份有限公司 Board test method, system, readable storage medium storing program for executing and computer equipment

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CN103499997A (en) * 2013-09-13 2014-01-08 中国科学院近代物理研究所 Backboard for NIM case and manufacturing method thereof
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CN105025674A (en) * 2014-04-30 2015-11-04 上海鼎勒智能科技发展有限公司 Intelligent instrument combined cabinet facilitating strain disposal outside cabinet

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Publication number Priority date Publication date Assignee Title
CN1574268A (en) * 2003-05-30 2005-02-02 夏普株式会社 Device test apparatus and test method
CN101528016A (en) * 2009-04-17 2009-09-09 天津凯发电气股份有限公司 Case of electrified railway protective measuring and controlling device
CN202267716U (en) * 2011-09-26 2012-06-06 国电南京自动化股份有限公司 Test system of CPU plug-in unit used for relay protection measurement and control apparatus
CN202563029U (en) * 2012-05-20 2012-11-28 西安科技大学 Electrical performance and temperature characteristic testing device for multi-station electronic material
CN202975201U (en) * 2012-12-07 2013-06-05 北京爱科迪信息通讯技术有限公司 Device for detecting satellite antenna electrical parts
CN103499997A (en) * 2013-09-13 2014-01-08 中国科学院近代物理研究所 Backboard for NIM case and manufacturing method thereof
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