CN106093745A - A kind of power automatic device chip card Auto-Test System - Google Patents

A kind of power automatic device chip card Auto-Test System Download PDF

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Publication number
CN106093745A
CN106093745A CN201610368897.2A CN201610368897A CN106093745A CN 106093745 A CN106093745 A CN 106093745A CN 201610368897 A CN201610368897 A CN 201610368897A CN 106093745 A CN106093745 A CN 106093745A
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CN
China
Prior art keywords
test
chip card
test system
auto
power supply
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Application number
CN201610368897.2A
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Chinese (zh)
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CN106093745B (en
Inventor
曹玉保
周兆庆
吴凯
丁琳
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Nanjing SAC Automation Co Ltd
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Nanjing SAC Automation Co Ltd
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Priority to CN201610368897.2A priority Critical patent/CN106093745B/en
Publication of CN106093745A publication Critical patent/CN106093745A/en
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Publication of CN106093745B publication Critical patent/CN106093745B/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834Automated test systems [ATE]; using microprocessors or computers

Abstract

The invention discloses a kind of power automatic device chip card Auto-Test System, including test cabinet, PC, switch and adjustable DC power supply;Multiple testing backboards of chip card are installed in described test cabinet, for the power supply providing multiple chip cards to carry out measured power output simultaneously with as the dsp board of whole test system signal generator, described power supply and dsp board are connected by testing backboard with chip card;Described PC is connected with dsp board communication by serial ports, uses response formula stipulations, after described dsp board receives PC instruction, answers confirmation message, it is achieved the scheduling controlling to testing source;The IP address of multiple described chip cards is determined in the position of test cabinet by chip card to be measured, and Auto-Test System is polled test according to IP sequence of addresses, thus once completes the automatic test of multiple described chip cards.The present invention R&D cycle is short, and cost is low, has a good application prospect.

Description

A kind of power automatic device chip card Auto-Test System
Technical field
The present invention relates to a kind of power automatic device chip card Auto-Test System, belong to circuit board testing technology neck Territory.
Background technology
The direct relation that runs of power system the daily of the every field such as social life, economy, education, national defence, military affairs Work, power automation is the development trend of power system, plays important in advancing China's economic growth and social progress Effect.Along with power automation application is increasingly extensive, function becomes increasingly complex, and hardware integration degree is increasing, power automation The reliability of device the most increasingly comes into one's own.
The reliability of power automatic device depends primarily on software reliability and hardware reliability.Wherein hardware reliability Significant portion is determined by the hardware performance of chip card.Production test, as the beginning of plate level functional test, carries checking and inserts The quality management and control work such as part welds successfully, the confirmation of plate Data Enter, software version, hardware capability test, to chip card Quality plays important leverage effect.Automatically testing platform refers in the case of people seldom participates in, and automatically measures, processes number According to, and the system showing and outputing test result.Compared with manual test, what automatically test can either effectively ensure product can By property, machine debugging efficiency can be greatly improved again, tester's professional skill is required low, it is achieved power automatic device intelligence Plug-in unit automatic test is inexorable trend.
Virtual instrument technique (Virtual instrument) is to utilize modularized hardware, and the software in conjunction with high efficient and flexible comes Complete the application of various test, measurement and automatization.Virtual instrument has powerful data acquisition function;Secondly as based on number According to the programming language of stream, to the operation of data with calculate simple and efficient;And provide abundant icon display function, these Feature makes virtual instrument be widely used in Development of auto-testing system at present.Data acquisition is divided by virtual instrument with data Separately, the result of data collecting plate card gives software through high speed communication bus, and instrumental function is realized by software in analysis, it is possible to flexibly And it is effectively applied to the work such as various data acquisition, parameter testing.
Chip card is due to of a great variety, Various Functions at present, and it is long that Auto-Test System exists the R&D cycle, and cost is high Problem.
Summary of the invention
The deficiency existed for prior art, it is an object of the present invention to provide a kind of R&D cycle is short, cost is low electric power from Dynamic gasifying device chip card Auto-Test System, it is achieved that the automatic test to power automatic device chip card.
To achieve these goals, the present invention is to realize by the following technical solutions:
A kind of power automatic device chip card Auto-Test System of the present invention, including test cabinet, PC, exchange Machine and adjustable DC power supply;Multiple testing backboards of chip card are installed, for providing multiple intelligence in described test cabinet Plug-in unit carries out the power supply of measured power output and as the dsp board of whole test system signal generator, described confession simultaneously Electricity power supply and dsp board are connected by testing backboard with chip card;Described PC is connected with dsp board communication by serial ports, adopts By response formula stipulations, after described dsp board receives PC instruction, answer confirmation message, it is achieved the scheduling controlling to testing source; The IP address of multiple described chip cards is determined in the position of test cabinet by chip card to be measured, and Auto-Test System is according to IP Sequence of addresses is polled test, thus once completes the automatic test of multiple described chip cards.
Wherein, switch each hardware ethernet communication in automatically testing described test cabinet connects.
Wherein, adjustable DC power supply for exporting the voltage drive needing in Auto-Test System to add, such as open into dynamic Make voltage/return voltage test, plug-in unit power-on and power-off test.
Above-mentioned PC controls power supply output automatically by instrument drivers (here is omitted for existing program) Test system needs the driving voltage added.
Above-mentioned instrument drivers is used to control a software set of programmable instrument, by the control to instrument driving Realize the control to test instrunment;The programming operation of each subprogram correspondence instrument, described programming operation includes initializing, joining Put, read, close;ATS software may be implemented in a variety of ways instrument DLL, and Auto-Test System utilizes instrument Device manufacturer provides DLL storehouse to realize instrument driving.(said method is universal method, and this test system uses instrument business men to provide DLL storehouse)
The DC voltage regulation scope of above-mentioned power supply is 0-300V, and precision is 0.01V.
Guide rail for fixing chip card position is installed in above-mentioned test cabinet.
Above-mentioned test cabinet uses bakelite sheet material.
Test system uses virtual instrument technique, and test system includes four funtion parts: parameter setting, operational monitoring, Test result and service information;Described parameter has been provided for the setting of measuring accuracy;Described operational monitoring is for prison in real time Survey communication health degree, whole test system is monitored and dispatches;Described test result currently tests knot for real-time display Really;When there being defective work to occur, described service information provides maintenance suggestion, and the inefficacy maintenance quickly instructing chip card is fixed Position.
A kind of power automatic device chip card Auto-Test System of the present invention, including test cabinet, PC, exchange Machine and adjustable DC power supply;Achieving the automatic test to power automatic device chip card, the R&D cycle is short, and cost is low, Have a good application prospect, be worthy to be popularized.
Accompanying drawing explanation
Fig. 1 is a kind of power automatic device chip card Auto-Test System schematic diagram of the present invention;
Fig. 2 is a kind of power automatic device chip card ATS software design drawing of the present invention.
Detailed description of the invention
For the technological means making the present invention realize, creation characteristic, reach purpose and be easy to understand with effect, below in conjunction with Detailed description of the invention, is expanded on further the present invention.
Seeing Fig. 1 and Fig. 2, a kind of power automatic device chip card Design of Automatic Test System method of the present invention is such as Under, specifically include following step,
Step (1) test cabinet uses bakelite sheet material, built-in plastic guide rail and power supply.Special testing backboard, will Chip card and power supply, dsp board hardware connects.
Step (2) power supply power is big, can stably provide the power output that 8 chip cards carry out testing simultaneously.
Step (3) dsp board is as the signal generator of whole test system.PC directly passes through serial ports and dsp board communication, Use response formula stipulations, after dsp board receives PC instruction, answer confirmation message, it is achieved the scheduling controlling to test signal.
Step (4) switch connects for automatic test machine case each hardware ethernet communication.
Step (5) instrument driving: the test instrunment in chip card test platform is driven program development.Instrument drives Dynamic program is used to control a software set of programmable instrument, by the control to test instrunment of the control realization of instrument driving System.The programming operation of each subprogram correspondence instrument, such as initializes, configures, reads, closes.Testing system software is permissible Various ways realizes instrument DLL, as utilized apparatus manufacture to provide DLL storehouse, or the driver write voluntarily.
The programme-controlled dc power DC voltage regulation scope that step (6) this test cabinet is selected is 0-300V, and precision is 0.01V, simultaneously back production DC current.PC passes through instrument driving, controls the electricity needing to add in programmable power supply output test platform Pressure excitation, such as open into the test of operation voltage/return voltage, plug-in unit power-on and power-off test.
(7) 8 testing backboard IP addresses of step are determined in the position of test cabinet by chip card to be measured.Automatically system is tested Uniting and be polled test according to IP sequence of addresses, once complete the automatic test of 8 chip cards, testing efficiency is high.
Step (8) software design uses virtual instrument technique, and test system is mainly made up of four partial functions: parameter sets Put, operational monitoring, test result, service information.Parameter arranges some settings mainly completing measuring accuracy.Operational monitoring is real-time Monitoring communication health degree, is monitored whole test system and dispatches.Test result shows current test result in real time.When having When defective work occurs, service information provides maintenance suggestion, quickly instructs the inefficacy maintenance location of chip card.
A kind of power automatic device chip card Auto-Test System of the present invention, including test cabinet, PC, exchange Machine and adjustable DC power supply;Software uses virtual instrument technique to carry out functional design, it is achieved that to power automatic device intelligence The automatic test of plug-in unit, the R&D cycle is short, and cost is low, has a good application prospect, and is worthy to be popularized.
The ultimate principle of the present invention and principal character and advantages of the present invention have more than been shown and described.The technology of the industry Personnel, it should be appreciated that the present invention is not restricted to the described embodiments, simply illustrating this described in above-described embodiment and description The principle of invention, without departing from the spirit and scope of the present invention, the present invention also has various changes and modifications, and these become Change and improvement both falls within scope of the claimed invention.Claimed scope by appending claims and Equivalent defines.

Claims (6)

1. a power automatic device chip card Auto-Test System, it is characterised in that include testing cabinet, PC, friendship Change planes and adjustable DC power supply;
Multiple testing backboards of chip card are installed, for providing multiple chip cards to survey simultaneously in described test cabinet The power supply of examination power output and as the dsp board of whole test system signal generator, described power supply and dsp board with Chip card is connected by testing backboard;
Described PC is connected with dsp board communication by serial ports, uses response formula stipulations, after described dsp board receives PC instruction, returns Answer confirmation message, it is achieved the scheduling controlling to testing source;
The IP address of multiple described chip cards is determined in the position of test cabinet by chip card to be measured, Auto-Test System root It is polled test according to IP sequence of addresses, thus once completes the automatic test of multiple described chip cards.
Power automatic device chip card Auto-Test System the most according to claim 1, it is characterised in that described PC Machine controls the driving voltage needing to add in power supply output Auto-Test System by instrument drivers.
Power automatic device chip card Auto-Test System the most according to claim 2, it is characterised in that described instrument Device driver is used to control a software set of programmable instrument, by the control realization of instrument driving to test instrunment Control;The programming operation of each subprogram correspondence instrument, described programming operation includes initializing, configures, reads, closes; ATS software may be implemented in a variety of ways instrument DLL, and Auto-Test System utilizes apparatus manufacture to provide DLL Storehouse realizes instrument driving.
Power automatic device chip card Auto-Test System the most according to claim 1, it is characterised in that described confession The DC voltage regulation scope of electricity power supply is 0-300V, and precision is 0.01V.
Power automatic device chip card Auto-Test System the most according to claim 1, it is characterised in that described survey Guide rail for fixing chip card position is installed in test-run a machine case.
Power automatic device chip card Auto-Test System the most according to claim 1, it is characterised in that described survey Test-run a machine case uses bakelite sheet material.
CN201610368897.2A 2016-05-30 2016-05-30 A kind of power automatic device chip card Auto-Test System Active CN106093745B (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107703473A (en) * 2017-10-16 2018-02-16 许继电气股份有限公司 A kind of automatic detection device of direct current transportation OPTODYN modules
CN108490337A (en) * 2018-03-14 2018-09-04 广州视源电子科技股份有限公司 Board test method, system, readable storage medium storing program for executing and computer equipment
CN109813524A (en) * 2018-12-03 2019-05-28 深圳市天视通电子科技有限公司 A kind of method, apparatus and system of mould group batch testing

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CN204086983U (en) * 2014-09-26 2015-01-07 上海步科自动化股份有限公司 A kind of PLC product automatic testing equipment
CN105025674A (en) * 2014-04-30 2015-11-04 上海鼎勒智能科技发展有限公司 Intelligent instrument combined cabinet facilitating strain disposal outside cabinet

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CN1574268A (en) * 2003-05-30 2005-02-02 夏普株式会社 Device test apparatus and test method
US20130120012A1 (en) * 2008-03-05 2013-05-16 Stmicroelectronics S.R.I. Testing integrated circuits using few test probes
CN101528016A (en) * 2009-04-17 2009-09-09 天津凯发电气股份有限公司 Case of electrified railway protective measuring and controlling device
CN202267716U (en) * 2011-09-26 2012-06-06 国电南京自动化股份有限公司 Test system of CPU plug-in unit used for relay protection measurement and control apparatus
CN202563029U (en) * 2012-05-20 2012-11-28 西安科技大学 Electrical performance and temperature characteristic testing device for multi-station electronic material
CN202975201U (en) * 2012-12-07 2013-06-05 北京爱科迪信息通讯技术有限公司 Device for detecting satellite antenna electrical parts
CN103499997A (en) * 2013-09-13 2014-01-08 中国科学院近代物理研究所 Backboard for NIM case and manufacturing method thereof
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107703473A (en) * 2017-10-16 2018-02-16 许继电气股份有限公司 A kind of automatic detection device of direct current transportation OPTODYN modules
CN108490337A (en) * 2018-03-14 2018-09-04 广州视源电子科技股份有限公司 Board test method, system, readable storage medium storing program for executing and computer equipment
CN109813524A (en) * 2018-12-03 2019-05-28 深圳市天视通电子科技有限公司 A kind of method, apparatus and system of mould group batch testing

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