CN106093073B - 基板缺陷位置定位方法及装置和系统 - Google Patents
基板缺陷位置定位方法及装置和系统 Download PDFInfo
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- CN106093073B CN106093073B CN201610389092.6A CN201610389092A CN106093073B CN 106093073 B CN106093073 B CN 106093073B CN 201610389092 A CN201610389092 A CN 201610389092A CN 106093073 B CN106093073 B CN 106093073B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9513—Liquid crystal panels
Abstract
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CN201610389092.6A CN106093073B (zh) | 2016-06-02 | 2016-06-02 | 基板缺陷位置定位方法及装置和系统 |
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CN201610389092.6A CN106093073B (zh) | 2016-06-02 | 2016-06-02 | 基板缺陷位置定位方法及装置和系统 |
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CN106093073A CN106093073A (zh) | 2016-11-09 |
CN106093073B true CN106093073B (zh) | 2019-09-17 |
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Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107014826A (zh) * | 2017-04-12 | 2017-08-04 | 武汉华星光电技术有限公司 | Cf基板微观检查机 |
CN109387527A (zh) * | 2017-08-09 | 2019-02-26 | 苏州精濑光电有限公司 | 一种膜上膜内缺陷的检测方法 |
CN108320282A (zh) * | 2018-01-25 | 2018-07-24 | 陕西科技大学 | 多特征信息融合的陶瓷墙地砖表面缺陷检测装置及其方法 |
CN108445010B (zh) * | 2018-03-12 | 2021-01-22 | 昆山国显光电有限公司 | 自动光学检测方法及装置 |
CN108846863B (zh) * | 2018-05-08 | 2021-12-17 | 信利(惠州)智能显示有限公司 | 定位标位置检测方法、装置、计算机和存储介质 |
CN109187557A (zh) * | 2018-09-29 | 2019-01-11 | 武汉亿德光兴科技有限公司 | 一种光学次发射模块自动检测系统和方法 |
CN109959666B (zh) * | 2019-04-11 | 2021-08-03 | 京东方科技集团股份有限公司 | 一种阵列基板缺陷判定方法、处理器及判定系统 |
CN110490875B (zh) * | 2019-10-16 | 2020-01-21 | 武汉精立电子技术有限公司 | 一种屏缺陷过滤方法、装置及存储介质 |
CN112862800B (zh) * | 2021-02-25 | 2023-01-24 | 歌尔科技有限公司 | 缺陷检测方法、装置及电子设备 |
Citations (5)
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JP2004239733A (ja) * | 2003-02-05 | 2004-08-26 | Seiko Epson Corp | 画面の欠陥検出方法及び装置 |
CN2870157Y (zh) * | 2005-10-14 | 2007-02-14 | 彩虹集团电子股份有限公司 | 一种等离子显示屏面板的综合检查修复装置 |
CN103218961A (zh) * | 2013-03-22 | 2013-07-24 | 苏州领视测控科技有限公司 | 一种lcd缺陷在线检测方法及系统 |
CN103604815A (zh) * | 2013-11-26 | 2014-02-26 | 上海海事大学 | 玻璃晶片检测装置与标定方法 |
CN204269561U (zh) * | 2014-12-02 | 2015-04-15 | 广东生益科技股份有限公司 | 一种检测设备 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103698912B (zh) * | 2013-12-12 | 2017-02-15 | 合肥京东方光电科技有限公司 | 一种定位缺陷亚像素位置的方法 |
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2016
- 2016-06-02 CN CN201610389092.6A patent/CN106093073B/zh active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004239733A (ja) * | 2003-02-05 | 2004-08-26 | Seiko Epson Corp | 画面の欠陥検出方法及び装置 |
CN2870157Y (zh) * | 2005-10-14 | 2007-02-14 | 彩虹集团电子股份有限公司 | 一种等离子显示屏面板的综合检查修复装置 |
CN103218961A (zh) * | 2013-03-22 | 2013-07-24 | 苏州领视测控科技有限公司 | 一种lcd缺陷在线检测方法及系统 |
CN103604815A (zh) * | 2013-11-26 | 2014-02-26 | 上海海事大学 | 玻璃晶片检测装置与标定方法 |
CN204269561U (zh) * | 2014-12-02 | 2015-04-15 | 广东生益科技股份有限公司 | 一种检测设备 |
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Application publication date: 20161109 Assignee: Yungu (Gu'an) Technology Co., Ltd.|Bazhou Yungu Electronic Technology Co., Ltd.|Kunshan Institute of technology new flat panel display technology center Co., Ltd Assignor: Kunshan Guo Xian Photoelectric Co., Ltd. Contract record no.: X2019990000157 Denomination of invention: Method for locating defects of base plate, and apparatus and system Granted publication date: 20190917 License type: Common License Record date: 20191031 |
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Effective date of registration: 20191209 Address after: No. 2 Xiangshan Avenue, Yongning Street, Zengcheng District, Guangzhou, Guangdong province (the core of Zengcheng economic and Technological Development Zone) Patentee after: Guangzhou Guoxian Technology Co., Ltd Address before: 215300, No. 1, Longteng Road, Kunshan Development Zone, Jiangsu, Suzhou, 4 Patentee before: Kunshan Guo Xian Photoelectric Co., Ltd. |
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