CN105983538A - High-productivity test sorting machine system - Google Patents
High-productivity test sorting machine system Download PDFInfo
- Publication number
- CN105983538A CN105983538A CN201510043810.XA CN201510043810A CN105983538A CN 105983538 A CN105983538 A CN 105983538A CN 201510043810 A CN201510043810 A CN 201510043810A CN 105983538 A CN105983538 A CN 105983538A
- Authority
- CN
- China
- Prior art keywords
- electronic component
- testing
- test
- turntable
- sorting machine
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a high-productivity test sorting machine system which includes: a main rotary bench; a load bench which is used for transporting an electronic component to a functional module on the main rotary bench; an auxiliary rotary bench, which includes a plurality of carrier modules so as to receive the electronic component from the functional module on the main rotary bench; and a plurality of test benches which are arranged along the periphery of the auxiliary rotary bench. When the load bench transports the electronic component to the functional module on the main rotary bench in parallel, the test bench receives the electronic component from the carrier modules to test the components, so that influence due to transportation time in a test process period of the test sorting machine is reduced or eliminated.
Description
Technical field
The present invention relates to a kind of testing, sorting machine for testing electronic element (test handler), especially relate to a kind of testing, sorting machine for testing electronic element with high production capacity.
Background technology
In the industry, the testing, sorting machine for electronic component is used in the electronic component that test has been assembled.In this testing, sorting machine, electronic component generally uses vibrations disk feeder (vibratory bowl feeder) or other feed arrangement to be fed to high speed turntable.Then, turntable uses pick-up head electronic component individually picked up, and be in turn transferred into different test platforms, to complete one or more test before their qualified use.
Generally include for the test period of testing, sorting machine: transmit the time that electronic component to test platform is spent, and the time that testing electronic element is spent.Especially in the traditional turntable being used in process as described above, the delivery time is necessary and can not be eliminated, because about each electronic component to be tested, transmitting with testing procedure thereafter is successively to be performed in time.If the testing time is long, system will long-time free, may be transmitted to test until having tested with another electronic component.Result in formation of the bottleneck becoming difficulty the cycle time making the whole process of reduction.In whole test processes cycle time, reduce or eliminate the impact of delivery time would is that useful.
Summary of the invention
Therefore, it is an object of the invention to seek to provide a kind of testing, sorting machine system, it reduces or eliminates the impact of delivery time in the test processes cycle, in order to improve the production capacity of its whole system.
First aspect, the present invention provides a kind of testing, sorting machine, and it includes: main turntable；Loading platform, its functional module being operated to transmit electronic component extremely main turntable；Auxiliary turntable, it includes multiple carrier module, to receive electronic component at the functional module of main turntable；And multiple test platform, it is along the peripheral setting of auxiliary turntable；Wherein, while loading platform transmits the functional module of electronic component extremely main turntable concurrently, test platform is operated at carrier module receive electronic component to test.
Second aspect, the present invention provides a kind of method using testing, sorting machine testing electronic element, and the method includes following steps: from the functional module of loading platform transmission electronic component to main turntable；Electronic component is transmitted to the multiple carrier modules assisting turntable at the functional module of main turntable；And transmission electronic component is to multiple test platforms, the plurality of test platform is along the peripheral setting of auxiliary turntable；Thereafter continue to transmit electronic component concurrently from loading platform to while the functional module of main turntable, at multiple test platforms, test the electronic component received from carrier module.
Refering to the accompanying drawing of the appended specific preferred embodiment of the description present invention, it is very easily with describing the present invention later in detail.The specifics of accompanying drawing and relevant description can not be understood as being limitation of the present invention, and the feature of the present invention limits in detail in the claims.
Accompanying drawing explanation
With reference now to accompanying drawing, the example of testing, sorting machine system of the present invention is described, wherein.
Fig. 1 show the floor map according to the testing, sorting machine system described in the present invention the first preferred embodiment.
Fig. 2 show the schematic perspective view of the testing, sorting machine system of Fig. 1.
Fig. 3 show the floor map according to the testing, sorting machine system described in the present invention the second preferred embodiment.
Fig. 4 show the schematic perspective view of testing, sorting machine system, that illustrates the test platform arranged adjacent to auxiliary turntable (auxiliary rotary turret)；And.
Fig. 5 (a) to Fig. 5 (d) indicates the pick-up head according to the test platform transmitting electronic component between auxiliary turntable and testboard (test platform) described in present pre-ferred embodiments.
Detailed description of the invention
Fig. 1 show the floor map according to the testing, sorting machine system 10 described in the present invention the first preferred embodiment；And Fig. 2 show the schematic perspective view of testing, sorting machine system of Fig. 1.Testing, sorting machine system 10 generally includes main turntable 12 and auxiliary turntable 14, and main turntable 12 has multiple functional module 13 to receive and to process electronic component, and auxiliary turntable 14 has multiple carrier module 15 to be tested to receive electronic component.Loading platform 16 is designed to transmit electronic component in large quantities towards the functional module 13 of main turntable 12.
The electronic component being loaded in the functional module 13 of main turntable 12 is loaded by the pick-up head in functional module 13, and by the position to auxiliary turntable 14 in rotary moving of main turntable 12, is transferred into thereafter on the carrier module 15 of auxiliary turntable 14.The electronic component being transferred on auxiliary turntable 14 is moved further to multiple test platforms 18 by the rotation of auxiliary turntable 14, and pick-up head is located to from assisting pickup electronic component at turntable 14 to carry out testing (seeing the following stated) there.Test platform 18 is operated at carrier module 15 receive electronic component to be tested, and loading platform 16 continues to transmit the functional module of electronic component extremely main turntable 12 simultaneously.Which ensure that and be test for simultaneously at electronic component, main turntable 12 need not keep the free time.
Multiple test platforms 18 should be configured to carry out the test of same type on electronic component, in order to significantly increases production capacity.Thereafter, the electronic component after test is put back on auxiliary turntable 14, and is transferred to the position of main turntable 12 by rotation, and then they are transferred into the functional module 13 of main turntable 12.
Finally, electronic component that be back to main turntable 12, that be found to have defect falls into reject bin 20, and the electronic component having passed through the test of test platform 18 unloads by unloading carrying platform 22.Thus, defective electronic component and do not have defective electronic component to be separated.
Fig. 3 show the floor map according to the testing, sorting machine system 30 described in the present invention the second preferred embodiment.In a second embodiment, main turntable 12 is provided with the first and second auxiliary turntables 32,34.First auxiliary turntable 32 is provided with first group of multiple test platform 36 around its periphery, and the second auxiliary turntable 34 is provided with another or second group of multiple test platform 38 around its periphery.Such as, if testing process is relatively time-consuming flow process, and more test platform 36,38 is needed to improve the production capacity of testing, sorting machine system 30, then first group of multiple test platform 36 can complete the test identical with second group of multiple test platform 38.In this case, electronic component can be sent to the first auxiliary turntable 32 or the second auxiliary turntable 34 is tested.
On the other hand, it should also be understood that, first group of multiple test platform 36 can complete the test different with second group of multiple test platform 38.So, design test platform 36,38 according to the demand of user and there is motility.In this case, electronic component have been conveyed to the first auxiliary turntable 32 with experience test after, electronic component can be transferred into the second auxiliary turntable 34(or direct or through main turntable 12) to experience different tests.
Fig. 4 show the schematic perspective view of testing, sorting machine system 10, that illustrates a test platform 18 arranged adjacent to auxiliary turntable 14.For brevity, it is asserted about the multiple test platforms 18 only one test platform mentioned in Fig. 1 and Fig. 2.This test platform 18 includes a pair shuttle pick-up head 40 arranged around rotating driver 42.Pick-up head 40 is mutually spaced the angle of 180 degree each other, so that rotating driver 42 can rotate pick-up head 40, alternatively locates them with the two or above the carrier module 15 of auxiliary turntable 14, or above the testboard 46 of test platform 18.And, pick-up head 40 is reduced to pick up electronic component in primary importance by the vertical driver 44 coupled mutually with each pick-up head 40, to the second position, promote pick-up head with being rotated to transmit electronic component at it, and reduce pick-up head 40 so that electronic component is placed on the second position.By the testboard 46 that is sent to by electronic component and assist turntable 14 to be spaced to test, auxiliary turntable 14 can continue to other electronic component during the test of other electronic component.
Fig. 5 (a) to Fig. 5 (d) indicate according to described in present pre-ferred embodiments auxiliary turntable 14 and testboard 46 between transmit the pick-up head 40 of test platform 18 of electronic component, 40'.
In Fig. 5 (a), pick-up head 40 picks up electronic component at the carrier module 15 of auxiliary turntable 14.In Fig. 5 (b), the angle of 180 degree that pick-up head 40,40' are the most pivotably movable with respect each other.Electronic component is positioned on testboard 46 and tests by the first pick-up head 40' now, and the second pick-up head 40 picks up another electronic component at the carrier module 15 of auxiliary turntable 14 simultaneously.
In fig. 5 (c), after the electronic component after electronic component has been tested by and tests is picked up by the first pick-up head 40 again, pick-up head 40,40' rotate the angle of 180 degree the most again.Thereafter, the electronic component after test is placed by the first pick-up head 40 and is returned to assist at the idle carrier module 15 of turntable 14, and the second pick-up head 40' places another electronic component and tests in testboard 46 simultaneously.
In Fig. 5 (d), the lower section of auxiliary turntable 14 Stepping positioning the most forward electronic component transmission extremely first pick-up head 40 of free time not tested by the next one, the electronic component do not tested is picked up by the first pick-up head 40.Pick-up head 40,40' are the most pivotably movable with respect each other 180 degree, the electronic component do not tested is positioned on testboard 46 and tests by the first pick-up head 40 now.For follow-up test period, the flow process that transmits as above will be repeated.
Just being test for simultaneously at electronic component, main turntable 12 can continue when interrupting and minimizing to be loaded into by electronic component on auxiliary turntable 14, withouts waiting for, because being loaded into by electronic component on auxiliary turntable 14, the test that other electron component will be done.Correspondingly, main turntable 12 can continue to not be test for electronic component at loading platform 16.
It is to be appreciated that contribute to the delivery time reducing or cutting down in test period according to the testing, sorting machine system 10,30 described in present pre-ferred embodiments, in order to improve the production capacity of testing, sorting system 10,30.The introducing of one or more auxiliary turntables 14,32,34 makes the transfer operation of electronic component can be done during test period, thereby avoid being attached to the time that the transmission electronic component beyond time test period is spent, because the required test having timely completed on electronic component can be synchronized when the other electron component being just transmitted transmits.
Under aforesaid configuration scenario, it appeared that, for the certain form of electronic component with presumptive test time excursion, comparing for the production capacity of the electronic component of same type with existing testing, sorting machine system, the production capacity of system can be increased to more than 50%.
The present invention described herein is easy to produce change, revise and/or supplement, in specifically described content basis, it is to be appreciated that the present invention includes all these change, revises and/or supplement, and they both fall within the spirit and scope of description above.
Claims (17)
1. a testing, sorting machine, it includes:
Main turntable；
Loading platform, its functional module being operated to transmit electronic component extremely main turntable；
Auxiliary turntable, it includes multiple carrier module, to receive electronic component at the functional module of main turntable；And
Multiple test platforms, it is along the peripheral setting of auxiliary turntable；
Wherein, while loading platform transmits the functional module of electronic component extremely main turntable concurrently, test platform is operated at carrier module receive electronic component to test.
2. testing, sorting machine as claimed in claim 1, wherein, each test platform is configured to complete on electronic component and the test of another test platform same type.
3. testing, sorting machine as claimed in claim 1, wherein, each test platform also includes: for transmitting the pick-up head of electronic component between carrier module and the testboard of test platform.
4. testing, sorting machine as claimed in claim 3, wherein, pick-up head includes a pair reciprocating pick-up head arranged around rotating driver.
5. testing, sorting machine as claimed in claim 4, wherein, this pick-up head is mutually spaced apart the angle of 180 degree, and the two is alternatively arranged on above carrier module or above testboard.
6. testing, sorting machine as claimed in claim 4, this testing, sorting machine also includes:
Vertical driver, it is coupled to each pick-up head, and this vertical driver is configured to reduce pick-up head to pick up electronic component in primary importance, and is rotated to transmit electronic component at pick-up head and promoted pick-up head to the second position.
7. testing, sorting machine as claimed in claim 1, this testing, sorting machine also includes:
Another assists turntable, and it has another and organizes multiple carrier modules；And
Another organizes multiple test platforms, and it is arranged along this another the peripheral of auxiliary turntable with testing electronic element.
8. testing, sorting machine as claimed in claim 7, wherein, this another multiple carrier modules of group are configured at main turntable receive electronic component.
9. testing, sorting machine as claimed in claim 8, wherein, this another organize the test of multiple test platform same types that multiple test platforms complete on electronic component and assist turntable.
10. testing, sorting machine as claimed in claim 7, wherein, this another multiple carrier modules of group are configured at auxiliary turntable receive electronic component.
11. 1 kinds of methods using testing, sorting machine testing electronic element, the method includes following steps:
Functional module from loading platform transmission electronic component to main turntable；
Electronic component is transmitted to the multiple carrier modules assisting turntable at the functional module of main turntable；And
Transmission electronic component is to multiple test platforms, and the plurality of test platform is along the peripheral setting of auxiliary turntable；Thereafter
Continue to transmit electronic component concurrently from loading platform to while the functional module of main turntable, at multiple test platforms, test the electronic component received from carrier module.
The method of 12. a kind of testing electronic elements as claimed in claim 11, wherein, each test platform completes and the test of other test platform same type on electronic component.
The method of 13. a kind of testing electronic elements as claimed in claim 11, the method also includes following steps:
Before testing electronic element, at carrier module, transmission electronic component is to the testboard being arranged on test platform, meanwhile, assists turntable to continue to other electronic component during the test of other electron component.
The method of 14. a kind of testing electronic elements as claimed in claim 11, the method also includes following steps:
Transmitting electronic component and assist turntable to another, this another auxiliary turntable includes another and organizes multiple carrier modules and be arranged on peripheral another of this another auxiliary turntable and organize multiple test platforms；And
Testing electronic element at multiple test platforms is organized this another.
The method of 15. a kind of testing electronic elements as claimed in claim 14, wherein, this another multiple carrier modules of group receive electronic component at main turntable.
The method of 16. a kind of testing electronic elements as claimed in claim 15, wherein, this another organize the test of multiple test platform same types that multiple test platforms complete on electronic component and assist turntable.
The method of 17. a kind of testing electronic elements as claimed in claim 14, wherein, this another multiple carrier modules of group receive electronic component at multiple carrier modules of auxiliary turntable.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510043810.XA CN105983538B (en) | 2015-01-28 | 2015-01-28 | High-yield test sorting machine system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510043810.XA CN105983538B (en) | 2015-01-28 | 2015-01-28 | High-yield test sorting machine system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105983538A true CN105983538A (en) | 2016-10-05 |
| CN105983538B CN105983538B (en) | 2019-12-06 |
Family
ID=57035658
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510043810.XA Active CN105983538B (en) | 2015-01-28 | 2015-01-28 | High-yield test sorting machine system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105983538B (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2018082089A1 (en) * | 2016-11-04 | 2018-05-11 | 厦门市三安光电科技有限公司 | Transfer device, transfer method and manufacture method for microelement, microelement device, and electronic apparatus |
| CN110389293A (en) * | 2018-04-17 | 2019-10-29 | 先进科技新加坡有限公司 | Device and method for the certification of electron device testing platform |
| CN113716278A (en) * | 2021-09-10 | 2021-11-30 | 深圳市华腾半导体设备有限公司 | Efficient rotary table conveying system for light splitting |
| CN118091452A (en) * | 2024-04-28 | 2024-05-28 | 深圳市泰科动力系统有限公司 | Modularized lithium battery test equipment |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW550771B (en) * | 2000-12-29 | 2003-09-01 | Yient Co Ltd | Apparatus for inspecting surface-mounted chips |
| CN1968876A (en) * | 2004-04-13 | 2007-05-23 | Tdk株式会社 | Chip part conveyance method, its device, appearance inspection method, and its device |
| JP2012228638A (en) * | 2011-04-25 | 2012-11-22 | Young Tek Electronics Corp | Mounted chip test/selection device |
| CN103286076A (en) * | 2012-02-10 | 2013-09-11 | 先进科技新加坡有限公司 | Handling system for testing electronic components |
| CN203830306U (en) * | 2014-05-16 | 2014-09-17 | 歌尔声学股份有限公司 | High-precision precision workpiece detection sorting machine |
-
2015
- 2015-01-28 CN CN201510043810.XA patent/CN105983538B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW550771B (en) * | 2000-12-29 | 2003-09-01 | Yient Co Ltd | Apparatus for inspecting surface-mounted chips |
| CN1968876A (en) * | 2004-04-13 | 2007-05-23 | Tdk株式会社 | Chip part conveyance method, its device, appearance inspection method, and its device |
| JP2012228638A (en) * | 2011-04-25 | 2012-11-22 | Young Tek Electronics Corp | Mounted chip test/selection device |
| CN103286076A (en) * | 2012-02-10 | 2013-09-11 | 先进科技新加坡有限公司 | Handling system for testing electronic components |
| CN203830306U (en) * | 2014-05-16 | 2014-09-17 | 歌尔声学股份有限公司 | High-precision precision workpiece detection sorting machine |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2018082089A1 (en) * | 2016-11-04 | 2018-05-11 | 厦门市三安光电科技有限公司 | Transfer device, transfer method and manufacture method for microelement, microelement device, and electronic apparatus |
| TWI670828B (en) * | 2016-11-04 | 2019-09-01 | 大陸商廈門市三安光電科技有限公司 | Transfer device for micro device, transfer method for micro device, method for manufacturing micro device device, micro device device, and electronic device |
| CN110389293A (en) * | 2018-04-17 | 2019-10-29 | 先进科技新加坡有限公司 | Device and method for the certification of electron device testing platform |
| TWI698651B (en) * | 2018-04-17 | 2020-07-11 | 新加坡商先進科技新加坡有限公司 | Apparatus and method for authentication of electronic device test stations |
| US10996308B2 (en) | 2018-04-17 | 2021-05-04 | Asm Technology Singapore Pte Ltd | Apparatus and method for authentication of electronic device test stations |
| CN113716278A (en) * | 2021-09-10 | 2021-11-30 | 深圳市华腾半导体设备有限公司 | Efficient rotary table conveying system for light splitting |
| CN118091452A (en) * | 2024-04-28 | 2024-05-28 | 深圳市泰科动力系统有限公司 | Modularized lithium battery test equipment |
| CN118091452B (en) * | 2024-04-28 | 2024-07-12 | 深圳市泰科动力系统有限公司 | Modularized lithium battery test equipment |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105983538B (en) | 2019-12-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US9606171B2 (en) | High throughput test handler system | |
| CN101804405B (en) | Electronic device sorter comprising dual buffers | |
| CN106249134B (en) | Electronic product tests production line and its test method | |
| CN1306581C (en) | Sorting handler for burn-in tester | |
| CN103286076B (en) | Handling system for testing electronic components | |
| TW201910237A (en) | Material sorting device based on TRAY disk and sorting method | |
| KR101698451B1 (en) | Apparatus for characteristic inspection and sorting of electronic comonent | |
| CN105983538A (en) | High-productivity test sorting machine system | |
| US8056698B2 (en) | Tray handling apparatus and semiconductor device inspecting method using the same | |
| JP6125447B2 (en) | Turret handler and method of operation | |
| US10730703B2 (en) | Conveying apparatus, conveying method and inspection system | |
| TWI534440B (en) | Semiconductor component test sorting machine and test support method in the sorting machine | |
| CN101088634A (en) | Burn-in sorter and sorting method using the same | |
| TW202014708A (en) | Electronic component test apparatus which comprises a feeding device, a testing device, and a transporting device | |
| CN106233441A (en) | Engagement device and joint method | |
| TW201016570A (en) | Transport control device and transport control method | |
| TWI468676B (en) | Semiconductor element appearance inspection classification machine | |
| KR200339601Y1 (en) | apparatus for vision inspection of semiconductor devices | |
| CN212095121U (en) | Lamp assembling and testing integrated machine | |
| TWI718852B (en) | Delivering method thereof | |
| CN108857347A (en) | A kind of spring loading machine | |
| CN205701492U (en) | A kind of sorting operation platform | |
| CN105521950A (en) | Method and device for automatically sorting pistons and regularly placing pistons | |
| US20180188318A1 (en) | Dual-feed test handling system | |
| TW201421013A (en) | Electronic device inspection and classification equipment |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |