CN105974616A - Method and system for detecting defect of LCD screen - Google Patents

Method and system for detecting defect of LCD screen Download PDF

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Publication number
CN105974616A
CN105974616A CN201510799472.2A CN201510799472A CN105974616A CN 105974616 A CN105974616 A CN 105974616A CN 201510799472 A CN201510799472 A CN 201510799472A CN 105974616 A CN105974616 A CN 105974616A
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China
Prior art keywords
pixel
picture
lcd screen
measured
display
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CN201510799472.2A
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Chinese (zh)
Inventor
梁永飞
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Leshi Zhixin Electronic Technology Tianjin Co Ltd
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Leshi Zhixin Electronic Technology Tianjin Co Ltd
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Priority to CN201510799472.2A priority Critical patent/CN105974616A/en
Publication of CN105974616A publication Critical patent/CN105974616A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • GPHYSICS
    • G02OPTICS
    • G02FDEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306Details
    • G02F1/1309Repairing; Testing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513Liquid crystal panels

Abstract

The embodiment of the invention provides a method and system for detecting a defect of an LCD screen. The method comprises the steps that a main chip of a testing board receives a frame displayed by a to-be-detected LCD screen of image collection equipment, wherein the displayed frame is an actual frame displayed by the to-be-detected LCD screen after a preset frame is input into the to-be-detected LCD screen; the main chip of the testing board judges whether a pixel point of which pixel luminance exceeds first-order luminance exists in the displayed frame or whether a pixel point of which pixel luminance is smaller than second-order luminance exists in the displayed frame, wherein the first-order luminance exceeds the second-order luminance; and if the pixel exists, the main chip of the testing board can make an indication light to indicate that the to-be-detected LCD screen has the defect. Manual participation is not needed during the whole detection, so that efficiency and reliability of the detection are increased; and the problem of detection missing is avoided.

Description

The detection method of LCD screen defect and system
Technical field
The present embodiments relate to LCD screen technical field, particularly relate to the inspection of a kind of LCD screen defect Survey method and system.
Background technology
Nowadays most display devices use LCD screen, but are limited by processing technology, LCD screen Often existing defects, therefore to detect LCD screen in the production process of LCD screen, The LCD screen of existing defects detects to ensure product quality.
The defect of LCD screen is often referred to LCD screen and there is bad point, bad line and bad speckle.It is specifically divided into and deposits At bad point, bad line and the bad speckle of Chang Liang, and there is the darkest bad point, bad line and bad speckle.
The detection method of normal bright defect is to input a black picture, by Manual Visual Inspection to LCD screen Mode detects LCD screen either with or without bright spot, bright line or speck.If it has, then represent LCD screen Existing defects.
The inspection method of the darkest defect is similar with the detection method of normal bright defect, inputs one to LCD screen Individual white picture, detects LCD screen either with or without dim spot, concealed wire or dark by the way of Manual Visual Inspection Speckle.If it has, then represent LCD screen existing defects.
Detecting LCD screen whether existing defects by the way of Manual Visual Inspection, efficiency is low, and easily goes out The problem of existing missing inspection.
Summary of the invention
The embodiment of the present invention provides detection method and the system of a kind of LCD screen defect, existing in order to solve The mode efficiency of Manual Visual Inspection low, and the problem that missing inspection easily occurs.
Embodiments provide the detection method of a kind of LCD screen defect, including:
The master chip of test board receives the picture that the LCD screen to be measured from image capture device shows; The picture of described display is after picture is preset in described LCD screen input to be measured, described liquid crystal to be measured The real screen that screen shows;
The master chip of described test board judges whether there is pixel intensity in the picture of described display more than first The pixel of rank brightness, or, whether the picture of described display exists pixel intensity less than second-order brightness Pixel, described first rank brightness be more than described second-order brightness;
If existing, the master chip of the most described test board indicates described LCD screen to be measured to deposit by display lamp In defect.
Correspondingly, the embodiment of the present invention additionally provides the detecting system of a kind of LCD screen defect, including:
Image capture device, for, after presetting picture to LCD screen input to be measured, treating described in collection The real screen that the LCD screen surveyed shows;
Test board, including master chip, described master chip, including:
Picture receiver module, shows for receiving the LCD screen to be measured from described image capture device Real screen;
Whether pixel judge module, exist pixel intensity big in the real screen judging described display In the pixel of the first rank brightness, or, whether the real screen of described display exists pixel intensity and is less than The pixel of second-order brightness, described first rank brightness is more than described second-order brightness;
, if there is pixel intensity in the real screen of described display more than the first rank in defect indicating module The pixel of brightness, or, the real screen of described display exists pixel intensity less than second-order brightness Pixel, then indicate described LCD screen existing defects to be measured by display lamp.The embodiment of the present invention carries The detection method of the LCD screen defect of confession and system, preset picture, profit to LCD screen input to be measured The real screen that LCD screen to be measured shows, and the reality that will collect is gathered with image capture device Picture transmission is to test board, and the master chip of test board has each pixel in automatic acquisition real screen The function of pixel intensity, the master chip of test board by the pixel intensity of each pixel in real screen with pre- If the first rank brightness compare, or by the pixel intensity of each pixel in real screen with preset Second-order brightness compare, if real screen existing pixel intensity more than the pixel of the first rank brightness Point, or there is the pixel intensity pixel less than second-order brightness, then the master chip of test board determines to be measured LCD screen existing defects, and indicated by display lamp.Whole detection process need not manually participate in, Improve efficiency and the reliability of detection, it is to avoid the problem that missing inspection occurs.
Accompanying drawing explanation
For the technical scheme being illustrated more clearly that in the embodiment of the present invention, below will be to required in embodiment Accompanying drawing to be used is briefly described, it should be apparent that, the accompanying drawing in describing below is the present invention Some embodiments, for those of ordinary skill in the art, on the premise of not paying creative work, Other accompanying drawing can also be obtained according to these accompanying drawings.
Fig. 1 is the steps flow chart of the detection method of a kind of LCD screen defect in the embodiment of the present invention one Figure;
Fig. 2 is the steps flow chart of the detection method of a kind of LCD screen defect in the embodiment of the present invention two Figure;
Fig. 3 is that the design framework of the detection method of a kind of LCD screen defect in the embodiment of the present invention two shows It is intended to;
Fig. 4 is the structural representation of the detecting system of a kind of LCD screen defect in the embodiment of the present invention three Figure;
Fig. 5 is the structural representation of the detecting system of a kind of LCD screen defect in the embodiment of the present invention four Figure.
Detailed description of the invention
For making the purpose of the embodiment of the present invention, technical scheme and advantage clearer, below in conjunction with this Accompanying drawing in bright embodiment, is clearly and completely described the technical scheme in the embodiment of the present invention, Obviously, described embodiment is a part of embodiment of the present invention rather than whole embodiments.Based on Embodiment in the present invention, those of ordinary skill in the art are obtained under not making creative work premise The every other embodiment obtained, broadly falls into the scope of protection of the invention.
Embodiment one
The detection method of a kind of LCD screen defect that the embodiment of the present invention one propose is discussed in detail.
LCD screen in the embodiment of the present invention can be the LCD screen in TV or display, TV Or the master chip of display has the function automatically obtaining input signal strength, and master chip can obtain liquid The strength range of the signal in region specified by brilliant screen, including high-high brightness and minimum brightness.Such as, pin It is the LCD screen of 1920X1080 to physical resolution, can be for whole LCD screen region (this viewing area of 1920X1080) inputs specific picture, by reading the high-high brightness in this region LCD screen whether existing defects is judged with minimum brightness.And, high-high brightness and the number of minimum brightness According to being stored in the depositor of master chip.
With reference to Fig. 1, it is shown that the detection method of a kind of LCD screen defect in the embodiment of the present invention one Flow chart of steps.
Step 100, presets picture to LCD screen input to be measured.
Owing to whether detection LCD screen exists normal bright defect or the darkest defect, so it is permissible to preset picture For black picture or pure white picture.
Step 102, image capture device gathers the real screen that LCD screen to be measured shows.
Image capture device can be video camera or photographing unit etc., and image acquisition is set by the embodiment of the present invention For being not particularly limited.
LCD screen to be measured can be shot by image capture device, collect LCD screen to be measured The real screen of display.Wherein, image capture device can be with captured in real-time real screen, it is also possible to will be real Border picture photographing becomes a sheet by a sheet photo.
Step 104, the LCD screen to be measured that the master chip of test board receives from image capture device shows The real screen shown.
Image capture device can be connected with the master chip of test board, and image capture device will collect The real screen output that shows of LCD screen to be measured to the master chip of test board.
Test board can be for detecting the circuit board that LCD screen to be measured makes, wherein, master chip It can be the master chip of TV or display.Whole work of test board are controlled programme-control by master chip.
Step 106, it is big that the master chip of test board judges whether there is pixel intensity in the real screen shown In the pixel of the first rank brightness, or, whether the real screen of display exists pixel intensity less than second The pixel of rank brightness, if existing, then performs step 108;If not existing, then flow process terminates.
Wherein, the first rank brightness is more than second-order brightness.
Current LCD screen is typically 8bit screen, and the brightness section of pixel is 0~255 rank.0 rank table Showing that black picture, 255 rank represent white picture, other rank are ash picture.For there is the pixel of normal bright defect Point, its brightness is generally more than 150 rank;For there is the pixel of the darkest defect, its brightness generally exists Below 50 rank.
The first rank brightness and second-order brightness in the embodiment of the present invention can set according to practical situation Fixed.
If existing, then perform step 108, Ke Yiwei: if the real screen of display exists pixel intensity More than the pixel of the first rank brightness, then perform step 108;Or, if the real screen of display is deposited In pixel intensity less than the pixel of second-order brightness, then perform step 108.
Step 108, the master chip of test board indicates LCD screen existing defects to be measured by display lamp.
If the real screen of display exists the pixel intensity pixel more than the first rank brightness, then test board Master chip LCD screen to be measured can be indicated to there is certain defect by display lamp;If display There is the pixel intensity pixel less than second-order brightness in real screen, then the master chip of test board is permissible Another kind of defect is there is by the LCD screen that the instruction of another display lamp is to be measured.
Display lamp can be exported by the universal input of master chip (General Purpose Input Output, GPIO) control.
In sum, the detection method of the LCD screen defect that the embodiment of the present invention provides, to liquid to be measured Picture is preset in brilliant screen input, utilizes image capture device to gather the actual picture that LCD screen to be measured shows Face, and the real screen collected is transmitted to test board, the master chip of test board has acquisition automatically The function of the pixel intensity of each pixel in real screen, the master chip of test board is by each in real screen The pixel intensity of individual pixel with preset the first rank brightness compare, or by real screen each The pixel intensity of pixel compares, if it is bright to there is pixel in real screen with the second-order brightness preset Degree is more than the pixel of the first rank brightness, or there is the pixel intensity pixel less than second-order brightness, then The master chip of test board determines LCD screen existing defects to be measured, and is indicated by display lamp.Whole inspection Survey process need not manually participate in, improve efficiency and the reliability of detection, it is to avoid asking of missing inspection occurs Topic.
Embodiment two
The detection method of a kind of LCD screen defect that the embodiment of the present invention two propose is discussed in detail.
LCD screen in the embodiment of the present invention can be the LCD screen in TV or display, TV Or the master chip of display has the function automatically obtaining input signal strength, and master chip can obtain liquid The strength range of the signal in region specified by brilliant screen, including high-high brightness and minimum brightness.Such as, pin It is the LCD screen of 1920X1080 to physical resolution, can be for whole LCD screen region (this viewing area of 1920X1080) inputs specific picture, by reading the high-high brightness in this region LCD screen whether existing defects is judged with minimum brightness.And, high-high brightness and the number of minimum brightness According to being stored in the depositor of master chip.
With reference to Fig. 2, it is shown that the detection method of a kind of LCD screen defect in the embodiment of the present invention two Flow chart of steps.
Step 200, presets picture to LCD screen input to be measured.
Owing to whether detection LCD screen exists normal bright defect or the darkest defect, so it is permissible to preset picture For black picture or pure white picture.
If whether detection LCD screen exists normal bright defect, then to LCD screen input black picture to be measured; If whether detection LCD screen exists the darkest defect, then input pure white picture to LCD screen to be measured.
Step 202, image capture device gathers the real screen that LCD screen to be measured shows.
Image capture device can be video camera or photographing unit etc., and image acquisition is set by the embodiment of the present invention For being not particularly limited.
LCD screen to be measured can be shot by image capture device, collect LCD screen to be measured The real screen of display.Wherein, image capture device can be with captured in real-time real screen, it is also possible to will be real Border picture photographing becomes a sheet by a sheet photo.
Step 204, the LCD screen to be measured that the master chip of test board receives from image capture device shows The real screen shown.
Image capture device can be connected with the master chip of test board, and image capture device will collect The real screen output that shows of LCD screen to be measured to the master chip of test board.
Test board can be for detecting the circuit board that LCD screen to be measured makes, wherein, master chip It can be the master chip of TV or display.Whole work of test board are controlled programme-control by master chip.
Step 206, it is big that the master chip of test board judges whether there is pixel intensity in the real screen shown In the pixel of the first rank brightness, or, whether the real screen of display exists pixel intensity less than second The pixel of rank brightness, if existing, then performs step 208;If not existing, then perform step 210.
Wherein, the first rank brightness is more than second-order brightness, and the first rank brightness could be arranged to 200 rank, the Second order brightness could be arranged to 50 rank.The first rank brightness and second-order brightness in the embodiment of the present invention are permissible It is set according to practical situation.
Current LCD screen is typically 8bit screen, and the brightness section of pixel is 0~255 rank.0 rank table Showing that black picture, 255 rank represent white picture, other rank are ash picture.For there is the pixel of normal bright defect Point, its brightness is generally more than 150 rank;For there is the pixel of the darkest defect, its brightness generally exists Below 50 rank.
Preferably, when default picture is black picture, the master chip of test board judges the actual picture of display Whether face exists the pixel intensity pixel more than the first rank brightness;When default picture is pure white picture, The master chip of test board judges whether there is pixel intensity in the real screen shown less than second-order brightness Pixel.
If existing, then perform step 208, Ke Yiwei: if the real screen of display exists pixel intensity More than the pixel of the first rank brightness, then perform step 208;Or, if the real screen of display is deposited In pixel intensity less than the pixel of second-order brightness, then perform step 208.
If not existing, then perform step 210, Ke Yiwei: if the real screen of display does not exist pixel Brightness is more than the pixel of the first rank brightness, and, the real screen of display does not exist pixel intensity and is less than The pixel of second-order brightness, then perform step 210.
Step 208, the master chip of test board indicates LCD screen existing defects to be measured by display lamp.
If the real screen of display exists the pixel intensity pixel more than the first rank brightness, then test board Master chip can by first display lamp indicate LCD screen to be measured there is normal bright defect;If display There is the pixel intensity pixel less than second-order brightness in real screen, then the master chip of test board is permissible There is the darkest defect in the LCD screen to be measured by the second display lamp instruction.
Display lamp can be exported by the universal input of master chip (General Purpose Input Output, GPIO) control.
Step 210, the master chip of test board indicates LCD screen to be measured not exist by the 3rd display lamp Defect.
Above-mentioned first display lamp, the second display lamp and the 3rd display lamp can be three light emitting diode (Light Emitting Diode, LED), respectively LED1, LED2 and LED3.When LED1 is bright, table Show that LCD screen to be measured exists normal bright defect;When LED2 is bright, the LCD screen representing to be measured exists The darkest defect;When LED3 is bright, represent LCD screen not existing defects to be measured.
Whether lighted by display lamp and can determine LCD screen to be measured whether existing defects intuitively, with And the defect existed is normal bright defect or the darkest defect.
Preferably, a serial ports can be increased on test board, will be tested in data by the serial ports increased Pass to the server of LCD screen production system, follow the trail of for product and management.
Wherein, test data include the test result of LCD screen to be measured whether existing defects;When to be measured LCD screen existing defects time, test data include that LCD screen to be measured exists normal bright defect or often Dark defect.
In sum, the detection method of the LCD screen defect that the embodiment of the present invention provides, its design framework Figure is as shown in Figure 3.Preset picture to LCD screen input to be measured, utilize image capture device collection to treat The real screen that the LCD screen surveyed shows, and the real screen collected is transmitted to test board, survey The master chip of test plate (panel) has the function of the pixel intensity of each pixel, test in automatic acquisition real screen The pixel intensity of each pixel in real screen is compared by the master chip of plate with the first default rank brightness Relatively, or the pixel intensity of each pixel in real screen is compared with the second-order brightness preset, If real screen existing pixel intensity more than the pixel of the first rank brightness, or there is pixel intensity and be less than The pixel of second-order brightness, then the master chip of test board determines LCD screen existing defects to be measured, and Indicated by display lamp.When real screen exists the pixel that pixel intensity is more than the first rank brightness, The GPIO1 of master chip controls LED1 and lights, and the LCD screen representing to be measured exists normal bright defect;Work as reality When there is the pixel that pixel intensity is less than second-order brightness in the picture of border, the GPIO2 of master chip controls LED2 lights, and the LCD screen representing to be measured exists the darkest defect;When real screen neither exists pixel More than the pixel of the first rank brightness, the most there is not the pixel intensity pixel less than second-order brightness in brightness Time, the GPIO3 of master chip controls LED3 and lights, and the LCD screen representing to be measured does not exist normal bright defect With normal bright defect.And can be by the serial ports on test board by the test data of LCD screen to be measured Pass to the server of production system, for tracking of products and management.Wherein, whole work of master chip can To be controlled by master chip control program.Between serial ports and master chip, permissible between serial ports and server By universal asynchronous receiving-transmitting transmitter (Universal Asynchronous Receiver/Transmitter, UART) connect.Whole detection process need not manually participate in, and improves efficiency and the reliability of detection, Avoid the problem that missing inspection occurs.
Embodiment three
The detecting system of a kind of LCD screen defect that the embodiment of the present invention three propose is discussed in detail.
With reference to Fig. 4, it is shown that the detecting system of a kind of LCD screen defect in the embodiment of the present invention three Structural representation.
Described system may include that image capture device 30 and test board 32.
Wherein, test board 32 may include that master chip 321.Master chip 321 may include that picture connects Receive module 3211, pixel judge module 3212, defect indicating module 3213.
Image capture device 30, for, after presetting picture to LCD screen input to be measured, gathering described The real screen that LCD screen to be measured shows.
Picture receiver module 3211, for receiving the liquid crystal to be measured from described image capture device 30 The real screen that screen shows.
Whether pixel judge module 3212, exist pixel bright in the real screen judging described display Degree is more than the pixel of the first rank brightness, or, whether the real screen of described display exists pixel intensity Less than the pixel of second-order brightness, described first rank brightness is more than described second-order brightness.
, if there is pixel intensity in the real screen of described display more than the in defect indicating module 3213 The pixel of single order brightness, or, the real screen of described display exists pixel intensity bright less than second-order The pixel of degree, then indicate described LCD screen existing defects to be measured by display lamp.
In sum, the detecting system of the LCD screen defect that the embodiment of the present invention provides, to liquid to be measured Picture is preset in brilliant screen input, utilizes image capture device to gather the actual picture that LCD screen to be measured shows Face, and the real screen collected is transmitted to test board, the master chip of test board has acquisition automatically The function of the pixel intensity of each pixel in real screen, the master chip of test board is by each in real screen The pixel intensity of individual pixel with preset the first rank brightness compare, or by real screen each The pixel intensity of pixel compares, if it is bright to there is pixel in real screen with the second-order brightness preset Degree is more than the pixel of the first rank brightness, or there is the pixel intensity pixel less than second-order brightness, then The master chip of test board determines LCD screen existing defects to be measured, and is indicated by display lamp.Whole inspection Survey process need not manually participate in, improve efficiency and the reliability of detection, it is to avoid asking of missing inspection occurs Topic.
Embodiment four
The detecting system of a kind of LCD screen defect that the embodiment of the present invention four propose is discussed in detail.
With reference to Fig. 5, it is shown that the detecting system of a kind of LCD screen defect in the embodiment of the present invention four Structural representation.
Described system may include that image capture device 40 and test board 42.
Wherein, test board 42 may include that master chip 421, master chip control module 422, serial ports 423. Master chip 421 may include that picture receiver module 4211, pixel judge module 4212, and defect indicates Module 4213, normal indicating module 4214, test data transmission module 4215.
Image capture device 40, for, after presetting picture to LCD screen input to be measured, gathering described The real screen that LCD screen to be measured shows.
Preferably, described default picture is black picture or pure white picture.
Picture receiver module 4211, for receiving the liquid crystal to be measured from described image capture device 40 The real screen that screen shows.
Whether pixel judge module 4212, exist pixel bright in the real screen judging described display Degree is more than the pixel of the first rank brightness, or, whether the real screen of described display exists pixel intensity Less than the pixel of second-order brightness, described first rank brightness is more than described second-order brightness.
Preferably, when described default picture is black picture, described pixel judge module 4212 is used for Judge the pixel that whether there is pixel intensity in the picture of described display more than the first rank brightness;When described When default picture is pure white picture, described pixel judge module 4212 is for judging the picture of described display In whether there is pixel intensity less than the pixel of second-order brightness.
, if there is pixel intensity in the real screen of described display more than the in defect indicating module 4213 The pixel of single order brightness, or, the real screen of described display exists pixel intensity bright less than second-order The pixel of degree, then indicate described LCD screen existing defects to be measured by display lamp.
Preferably, if the picture of the described described display of defect indicating module 4213 existing pixel intensity and being more than The pixel of the first rank brightness, then indicate described LCD screen to be measured to there is Chang Liang by the first display lamp Defect;If the picture of described display exists the pixel intensity pixel less than second-order brightness, then pass through There is the darkest defect in the second described LCD screen to be measured of display lamp instruction.
, if there is not pixel intensity in the picture of described display more than first in normal indicating module 4214 The pixel of rank brightness, and, the picture of described display does not exist pixel intensity less than second-order brightness Pixel, then indicate described LCD screen to be measured not existing defects by the 3rd display lamp.
Test data transmission module 4215, for transmitting test data to liquid crystal by described serial ports 423 The server of screen production system.
Wherein, described test data include the test result of described LCD screen to be measured whether existing defects; When described LCD screen existing defects to be measured, described test data include described LCD screen to be measured There is normal bright defect or the darkest defect.
Whole work of master chip 421 are controlled by master chip control module 422.
In sum, the detecting system of the LCD screen defect that the embodiment of the present invention provides, to liquid to be measured Picture is preset in brilliant screen input, utilizes image capture device to gather the actual picture that LCD screen to be measured shows Face, and the real screen collected is transmitted to test board, the master chip of test board has acquisition automatically The function of the pixel intensity of each pixel in real screen, the master chip of test board is by each in real screen The pixel intensity of individual pixel with preset the first rank brightness compare, or by real screen each The pixel intensity of pixel compares, if it is bright to there is pixel in real screen with the second-order brightness preset Degree is more than the pixel of the first rank brightness, or there is the pixel intensity pixel less than second-order brightness, then The master chip of test board determines LCD screen existing defects to be measured, and is indicated by display lamp.Whole inspection Survey process need not manually participate in, improve efficiency and the reliability of detection, it is to avoid asking of missing inspection occurs Topic.
System embodiment described above is only schematically, wherein said illustrates as separating component Unit can be or may not be physically separate, the parts shown as unit can be or Person may not be physical location, i.e. may be located at a place, or can also be distributed to multiple network On unit.Some or all of module therein can be selected according to the actual needs to realize the present embodiment The purpose of scheme.Those of ordinary skill in the art are not in the case of paying performing creative labour, the most permissible Understand and implement.
Through the above description of the embodiments, those skilled in the art is it can be understood that arrive each reality The mode of executing can add the mode of required general hardware platform by software and realize, naturally it is also possible to by firmly Part.Based on such understanding, the portion that prior art is contributed by technique scheme the most in other words Dividing and can embody with the form of software product, this computer software product can be stored in computer can Read in storage medium, such as ROM/RAM, magnetic disc, CD etc., including some instructions with so that one Computer equipment (can be personal computer, server, or the network equipment etc.) performs each to be implemented The method described in some part of example or embodiment.
Last it is noted that above example is only in order to illustrate technical scheme, rather than to it Limit;Although the present invention being described in detail with reference to previous embodiment, the ordinary skill of this area Personnel it is understood that the technical scheme described in foregoing embodiments still can be modified by it, or Person carries out equivalent to wherein portion of techniques feature;And these amendments or replacement, do not make corresponding skill The essence of art scheme departs from the spirit and scope of various embodiments of the present invention technical scheme.

Claims (10)

1. the detection method of a LCD screen defect, it is characterised in that including:
The master chip of test board receives the picture that the LCD screen to be measured from image capture device shows; The picture of described display is after picture is preset in described LCD screen input to be measured, described liquid crystal to be measured The real screen that screen shows;
The master chip of described test board judges whether there is pixel intensity in the picture of described display more than first The pixel of rank brightness, or, whether the picture of described display exists pixel intensity less than second-order brightness Pixel, described first rank brightness be more than described second-order brightness;
If existing, the master chip of the most described test board indicates described LCD screen to be measured to deposit by display lamp In defect.
Method the most according to claim 1, it is characterised in that described default picture is black picture Or pure white picture;
When described default picture is black picture, the master chip of described test board judges the picture of described display Whether face exists the pixel intensity pixel more than the first rank brightness;
When described default picture is pure white picture, the master chip of described test board judges the picture of described display Whether face exists the pixel intensity pixel less than second-order brightness.
Method the most according to claim 1, it is characterised in that if existing, the most described test board Master chip indicates described LCD screen existing defects to be measured by display lamp, including:
If the picture of described display exists the pixel intensity pixel more than the first rank brightness, the most described survey The master chip of test plate (panel) indicates described LCD screen to be measured to there is normal bright defect by the first display lamp;
If the picture of described display exists the pixel intensity pixel less than second-order brightness, the most described survey The darkest defect is there is in the master chip of test plate (panel) by the second described LCD screen to be measured of display lamp instruction.
Method the most according to claim 1, it is characterised in that also include:
If the picture of described display does not exist the pixel intensity pixel more than the first rank brightness, and, institute State the pixel that there is not pixel intensity in the picture of display less than second-order brightness, the most described test board Master chip indicates described LCD screen to be measured not existing defects by the 3rd display lamp.
Method the most according to claim 3, it is characterised in that the master chip of described test board passes through The serial ports arranged on described test board is by the server of test data transmission to LCD screen production system;
Wherein, described test data include the test result of described LCD screen to be measured whether existing defects; When described LCD screen existing defects to be measured, described test data include described LCD screen to be measured There is normal bright defect or the darkest defect.
6. the detecting system of a LCD screen defect, it is characterised in that including:
Image capture device, for, after presetting picture to LCD screen input to be measured, treating described in collection The real screen that the LCD screen surveyed shows;
Test board, including master chip, described master chip, including:
Picture receiver module, shows for receiving the LCD screen to be measured from described image capture device Real screen;
Whether pixel judge module, exist pixel intensity big in the real screen judging described display In the pixel of the first rank brightness, or, whether the real screen of described display exists pixel intensity and is less than The pixel of second-order brightness, described first rank brightness is more than described second-order brightness;
, if there is pixel intensity in the real screen of described display more than the first rank in defect indicating module The pixel of brightness, or, the real screen of described display exists pixel intensity less than second-order brightness Pixel, then indicate described LCD screen existing defects to be measured by display lamp.
System the most according to claim 6, it is characterised in that described default picture is black picture Or pure white picture;
When described default picture is black picture, described pixel judge module is used for judging described display Picture in whether there is pixel intensity more than the pixel of the first rank brightness;
When described default picture is pure white picture, described pixel judge module is used for judging described display Picture in whether there is pixel intensity less than the pixel of second-order brightness.
System the most according to claim 6, it is characterised in that
If the picture of the described described display of defect indicating module existing pixel intensity more than the first rank brightness Pixel, then indicate described LCD screen to be measured to there is normal bright defect by the first display lamp;If it is described The picture of display exists the pixel intensity pixel less than second-order brightness, is then referred to by the second display lamp Show that described LCD screen to be measured exists the darkest defect.
System the most according to claim 6, it is characterised in that described master chip, also includes:
Normal indicating module, if it is bright more than the first rank to there is not pixel intensity in the picture of described display The pixel of degree, and, the picture of described display does not exist the pixel intensity pixel less than second-order brightness Point, then indicate described LCD screen to be measured not existing defects by the 3rd display lamp.
System the most according to claim 8, it is characterised in that be provided with string on described test board Mouthful, described master chip, also include:
Test data transmission module, for producing test data transmission to LCD screen by described serial ports The server of system;
Wherein, described test data include the test result of described LCD screen to be measured whether existing defects; When described LCD screen existing defects to be measured, described test data include described LCD screen to be measured There is normal bright defect or the darkest defect.
CN201510799472.2A 2015-11-18 2015-11-18 Method and system for detecting defect of LCD screen Pending CN105974616A (en)

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Application publication date: 20160928