CN105676148A - Apparatus for improving automated testing efficiency of switching power supplies and programming method - Google Patents

Apparatus for improving automated testing efficiency of switching power supplies and programming method Download PDF

Info

Publication number
CN105676148A
CN105676148A CN201610262159.XA CN201610262159A CN105676148A CN 105676148 A CN105676148 A CN 105676148A CN 201610262159 A CN201610262159 A CN 201610262159A CN 105676148 A CN105676148 A CN 105676148A
Authority
CN
China
Prior art keywords
switching power
power supply
test
electronic load
sub
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201610262159.XA
Other languages
Chinese (zh)
Inventor
苟昌华
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Langchao Electronic Information Industry Co Ltd
Inspur Electronic Information Industry Co Ltd
Original Assignee
Langchao Electronic Information Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Langchao Electronic Information Industry Co Ltd filed Critical Langchao Electronic Information Industry Co Ltd
Priority to CN201610262159.XA priority Critical patent/CN105676148A/en
Publication of CN105676148A publication Critical patent/CN105676148A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/40Testing power supplies

Abstract

The invention discloses an apparatus for improving automated testing efficiency of switching power supplies and a programming method. The apparatus comprises two switching power supplies; testing equipment of each switching power supply comprises an oscilloscope, a DC power supply and an electronic load instrument; each set of oscilloscope, DC power supply and electronic load instrument are interconnected via GPIBs, and are connected with a PC via GPIB-USB-HS. According to the method disclosed by the invention, based on automated testing, via GPIB interconnection, only testing apparatus needs to be expanded into an apparatus capable of being used for simultaneously carrying out automated testing on the two switching power supplies. Testing time is shortened, and efficiency of research personnel is improved. Only a testing VI needs to be partitioned into two sub-VIs which respectively control testing on two switching power supplies on the software level, and each sub-VI calls each pre-written test item, so as not to cause excessive increase of complexity of a program.

Description

A kind of device improving Switching Power Supply automatic test efficiency and programmed method
Technical field
The present invention relates to Switching Power Supply technical field of measurement and test, it is specifically related to a kind of device improving Switching Power Supply automatic test efficiency and LabVIEW programmed method, specifically build satisfied two Switching Power Supplies of an energy and carry out the device of automatic test simultaneously, and propose a kind of LabVIEW programmed method controlling the realization of this device. To obtain the test device of higher efficiency.
Background technology
Along with developing rapidly of server and PC industry, its key building block Switching Power Supply being had higher requirement, in the R&D process of server, traditional power supply test is an important step that is numerous and diverse, time-consuming and that can not save again. How to improve testing efficiency, shorten the construction cycle, reduce system cost, meet the testing requirement that day by day updates, be one of all big enterprises' effective means of promoting self product competitiveness.
Summary of the invention
The technical problem to be solved in the present invention is: for the problems referred to above, the present invention proposes a kind of device improving Switching Power Supply automatic test efficiency and LabVIEW programmed method, a kind of improves testing efficiency, shortens two Switching Power Supplies of R&D cycle and carry out the apparatus and method of automatic test simultaneously.
The technical solution adopted in the present invention is:
A kind of device improving Switching Power Supply automatic test efficiency, described device includes two Switching Power Supplies, the test equipment of each Switching Power Supply includes oscillograph, DC source, electronic load instrument, often overlap and between oscillograph, DC source, electronic load instrument, adopt the interconnection of GPIB connecting line, and be connected by GPIB-USB-HS and PC, forming a set of powerful test equipment, this device can carry out the test of two Switching Power Supplies simultaneously;
DC source is responsible for providing input voltage, utilizes power line to be connected with the input of Switching Power Supply;
Electronic load instrument is responsible for providing static state/dynamic load to draw load, load line be connected with the output of Switching Power Supply;
Oscillograph is connected with each test point by probe;
Each test equipment is owned by the GPIB address of oneself, for LabVIEW control.
Described electronic load instrument adopts multichannel output electronic load instrument, and two set test equipment share an electronic load instrument.
A kind of programmed method improving Switching Power Supply automatic test efficiency, whole procedure division is two submodules by described method, each module is each responsible for the test of a Switching Power Supply, programmed by LabVIEW, write the sub-VI of each test event of Switching Power Supply respectively, fluctuate including Ripple(), Transient(transient state), Vds(drain voltage), Deadtime(idle hours), Overshoot(overshoot) and Undershoot(undershoot) sub-VI;
Simultaneously each module calls Ripple(fluctuation respectively), Transient(transient state), Vds(drain voltage), Deadtime(idle hours), Overshoot(overshoot) and Undershoot(undershoot) sub-VI, to carry out the test of continuous item.
Program write workload, more single power supply test VI, can't increase how many, thus increasing the efficiency of program.
Sub-VI is the VI for other VI, similar with subprogram. Sub-VI is the key component of stratification and modularity VI, and it can make VI be prone to debugging and safeguard. Using sub-VI is a kind of effective programming technique, because it allows to reuse identical code in different occasions.
The invention have the benefit that
Test device only on the basis of automatic test, need to be expanded to the device being available for two Switching Power Supplies automatic test simultaneously by the inventive method by GPIB interconnection. Save the testing time, improve the efficiency of research staff.
Only at software view, test VI need to being divided into two sub-VI, be each responsible for controlling the test of two Switching Power Supplies, every sub-VI, by the sub-VI calling each test event finished writing in advance, therefore can't cause that the complexity of program increases too many.
Accompanying drawing explanation
Fig. 1 is that the present invention tests device interconnecting schematic diagram;
Fig. 2 is LabVIEW programming block diagram.
Detailed description of the invention
Below in conjunction with Figure of description, according to detailed description of the invention, the present invention is further described:
Embodiment 1:
As shown in Figure 1, a kind of device improving Switching Power Supply automatic test efficiency and programmed method, described device includes two Switching Power Supplies, the test equipment of each Switching Power Supply includes oscillograph, DC source, electronic load instrument, often overlap and between oscillograph, DC source, electronic load instrument, adopt the interconnection of GPIB connecting line, and be connected by GPIB-USB-HS and PC, forming a set of powerful test equipment, this device can carry out the test of two Switching Power Supplies simultaneously;
DC source is responsible for providing input voltage, utilizes power line to be connected with the input of Switching Power Supply;
Electronic load instrument is responsible for providing static state/dynamic load to draw load, load line be connected with the output of Switching Power Supply;
Oscillograph is connected with each test point by probe; The oscillograph that the present embodiment adopts is four-way, it is possible to detect multiple test point;
Each test equipment is owned by the GPIB address of oneself, for LabVIEW control.
Embodiment 2
On the basis of embodiment 1, electronic load instrument described in the present embodiment adopts multichannel output electronic load instrument, and two set test equipment share an electronic load instrument.
Embodiment 3
As shown in Figure 2, a kind of programmed method improving Switching Power Supply automatic test efficiency based on embodiment 1 or 2, whole procedure division is two submodules by described method, each module is each responsible for the test of a Switching Power Supply, programmed by LabVIEW, write the sub-VI of each test event of Switching Power Supply respectively, fluctuate including Ripple(), Transient(transient state), Vds(drain voltage), Deadtime(idle hours), Overshoot(overshoot) and Undershoot(undershoot) sub-VI;
Simultaneously each module calls Ripple(fluctuation respectively), Transient(transient state), Vds(drain voltage), Deadtime(idle hours), Overshoot(overshoot) and Undershoot(undershoot) sub-VI, to carry out the test of continuous item.
Program write workload, more single power supply test VI, can't increase how many, thus increasing the efficiency of program.
Upper embodiment is merely to illustrate the present invention; and it is not limitation of the present invention; those of ordinary skill about technical field; without departing from the spirit and scope of the present invention; can also make a variety of changes and modification; therefore all equivalent technical schemes fall within scope of the invention, and the scope of patent protection of the present invention should be defined by the claims.

Claims (3)

1. the device improving Switching Power Supply automatic test efficiency, it is characterized in that: described device includes two Switching Power Supplies, the test equipment of each Switching Power Supply includes oscillograph, DC source, electronic load instrument, often overlap and between oscillograph, DC source, electronic load instrument, adopt the interconnection of GPIB connecting line, and be connected by GPIB-USB-HS and PC;
DC source is responsible for providing input voltage, utilizes power line to be connected with the input of Switching Power Supply;
Electronic load instrument is responsible for providing static state/dynamic load to draw load, load line be connected with the output of Switching Power Supply;
Oscillograph is connected with each test point by probe;
Each test equipment is owned by the GPIB address of oneself, for LabVIEW control.
2. a kind of device improving Switching Power Supply automatic test efficiency according to claim 1, it is characterised in that: described electronic load instrument adopts multichannel output electronic load instrument, and two set test equipment share an electronic load instrument.
3. based on a kind of programmed method improving Switching Power Supply automatic test efficiency of claim 1 or 2, it is characterized in that: whole procedure division is two submodules by described method, each module is each responsible for the test of a Switching Power Supply, programmed by LabVIEW, write the sub-VI of each test event of Switching Power Supply respectively, including the sub-VI of fluctuation, transient state, drain voltage, idle hours, overshoot and undershoot;
Each module calls the sub-VI of fluctuation, transient state, drain voltage, idle hours, overshoot and undershoot respectively simultaneously, to carry out the test of continuous item.
CN201610262159.XA 2016-04-25 2016-04-25 Apparatus for improving automated testing efficiency of switching power supplies and programming method Pending CN105676148A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610262159.XA CN105676148A (en) 2016-04-25 2016-04-25 Apparatus for improving automated testing efficiency of switching power supplies and programming method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610262159.XA CN105676148A (en) 2016-04-25 2016-04-25 Apparatus for improving automated testing efficiency of switching power supplies and programming method

Publications (1)

Publication Number Publication Date
CN105676148A true CN105676148A (en) 2016-06-15

Family

ID=56216014

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610262159.XA Pending CN105676148A (en) 2016-04-25 2016-04-25 Apparatus for improving automated testing efficiency of switching power supplies and programming method

Country Status (1)

Country Link
CN (1) CN105676148A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106646273A (en) * 2017-02-22 2017-05-10 郑州云海信息技术有限公司 Switching power supply performance test method, system and device
CN107634641A (en) * 2017-09-11 2018-01-26 郑州云海信息技术有限公司 A kind of automatic debugging system and method based on Switching Power Supply automatic test platform
CN108983081A (en) * 2018-08-03 2018-12-11 德丰电创科技股份有限公司 Electric tool switch test macro quadratic programming method and system
CN109116265A (en) * 2018-07-25 2019-01-01 郑州云海信息技术有限公司 The processing method and system of the fully loaded upper electrical anomaly concussion of power module overshoot test

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201373911Y (en) * 2009-02-23 2009-12-30 深圳市联欣科技有限公司 Integrated test system for switch power source
CN101806869A (en) * 2010-03-22 2010-08-18 株洲南车时代电气股份有限公司 General-purpose automatic test system for locomotive switching power supply and method thereof
CN102486533A (en) * 2010-12-01 2012-06-06 西安中科麦特电子技术设备有限公司 LED switching power supply test device
CN102680911A (en) * 2012-05-31 2012-09-19 株洲南车时代电气股份有限公司 System and method for testing multi-user parallel of locomotive switch power supply
CN203178453U (en) * 2013-04-17 2013-09-04 北京星原丰泰电子技术股份有限公司 Automatic test system for switch power supply module
CN104062604A (en) * 2014-07-10 2014-09-24 重庆灿源电子有限公司 Automatic testing system (ATS)
CN105137364A (en) * 2015-07-23 2015-12-09 浪潮电子信息产业股份有限公司 Automatic test system of switch power supply

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201373911Y (en) * 2009-02-23 2009-12-30 深圳市联欣科技有限公司 Integrated test system for switch power source
CN101806869A (en) * 2010-03-22 2010-08-18 株洲南车时代电气股份有限公司 General-purpose automatic test system for locomotive switching power supply and method thereof
CN102486533A (en) * 2010-12-01 2012-06-06 西安中科麦特电子技术设备有限公司 LED switching power supply test device
CN102680911A (en) * 2012-05-31 2012-09-19 株洲南车时代电气股份有限公司 System and method for testing multi-user parallel of locomotive switch power supply
CN203178453U (en) * 2013-04-17 2013-09-04 北京星原丰泰电子技术股份有限公司 Automatic test system for switch power supply module
CN104062604A (en) * 2014-07-10 2014-09-24 重庆灿源电子有限公司 Automatic testing system (ATS)
CN105137364A (en) * 2015-07-23 2015-12-09 浪潮电子信息产业股份有限公司 Automatic test system of switch power supply

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
徐剑英等: "基于GPIB的高精度开关电源测试系统设计", 《测控技术》 *
潘迪夫等: "基于labview的开关电源自动测试系统", 《数采与监测》 *

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106646273A (en) * 2017-02-22 2017-05-10 郑州云海信息技术有限公司 Switching power supply performance test method, system and device
CN107634641A (en) * 2017-09-11 2018-01-26 郑州云海信息技术有限公司 A kind of automatic debugging system and method based on Switching Power Supply automatic test platform
CN109116265A (en) * 2018-07-25 2019-01-01 郑州云海信息技术有限公司 The processing method and system of the fully loaded upper electrical anomaly concussion of power module overshoot test
CN109116265B (en) * 2018-07-25 2021-02-02 苏州浪潮智能科技有限公司 Method and system for processing full-load power-on abnormal oscillation during power module overshoot test
CN108983081A (en) * 2018-08-03 2018-12-11 德丰电创科技股份有限公司 Electric tool switch test macro quadratic programming method and system

Similar Documents

Publication Publication Date Title
CN105183644B (en) A kind of multitask integrated automation test system and method
CN103631720B (en) The generation method and apparatus of test case
CN106571166B (en) MT29F series NAND FLASH test aging system with customizable flow
CN100589587C (en) Automatic test system for handset single-plate and its method
Park et al. Plant model generation for PLC simulation
CN103530231A (en) Application program testing method and system based on service process control
CN102682166A (en) SMT (Surface Mounted Technology) equipment rapid processing system and method
CN103110230B (en) Intelligent clothing production system and intelligent clothing production method
Debevec et al. Virtual factory as an advanced approach for production process optimization
CN104778124A (en) Automatic testing method for software application
CN105760296B (en) Automatic test control method, device and terminal
CN103577907A (en) Continuous integration testing method and system
CN102906579A (en) Method and apparatus for scheduling a use of test resources of a test arrangement for the execution of test groups
CN104345262A (en) Universal circuit board test system
CN103547934A (en) Parallel concurrent test system and method
CN102608522B (en) Constant-temperature crystal oscillator ageing parameter automatic measurement instrument
CN201716591U (en) Automatic test system used for testing ECU and based on PXI system
US7117455B2 (en) System and method for derivative-free optimization of electrical circuits
CN102590730A (en) Modularized open PCBA (Printed Circuit Board Assembly) functional circuit test platform, system and method
CN205786884U (en) A kind of Testing System for Electronic Equipment
CN102184749B (en) A kind of automatic test approach of DCS switch board
CN103645399B (en) A kind of converter valve submodule Auto-Test System and thyristor test circuit thereof
Wang et al. Mechatronics education at CDHAW of Tongji University: Laboratory guidelines, framework, implementations and improvements
Wang et al. Cost benefit analysis of series systems with warm standby components and general repair time
CN102662846A (en) Testing method combining automatic tool and testing case

Legal Events

Date Code Title Description
PB01 Publication
C06 Publication
SE01 Entry into force of request for substantive examination
C10 Entry into substantive examination
RJ01 Rejection of invention patent application after publication

Application publication date: 20160615

RJ01 Rejection of invention patent application after publication