CN105553477A - Method for testing analog-to-digital converter RHF1201 based on FLEX - Google Patents
Method for testing analog-to-digital converter RHF1201 based on FLEX Download PDFInfo
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- CN105553477A CN105553477A CN201510906007.4A CN201510906007A CN105553477A CN 105553477 A CN105553477 A CN 105553477A CN 201510906007 A CN201510906007 A CN 201510906007A CN 105553477 A CN105553477 A CN 105553477A
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- rhf1201
- flex
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- digital converter
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1071—Measuring or testing
- H03M1/1095—Measuring or testing for ac performance, i.e. dynamic testing
Abstract
The invention discloses a method for testing an analog-to-digital converter RHF1201 based on FLEX. According to the product description, the pins of RHF1201 are respectively connected with excitation single sources, including a power supply, a reference signal, a control signal and a digital signal. By adopting an FLEX test system, different parameters are tested by selecting excitation signals of different performances.
Description
Technical field
The present invention relates to ic test technique, particularly a kind of method of testing analog to digital converter RHF1201 based on FLEX.
Background technology
RHF1201 is a kind of 12 50Msps analog to digital converters, is pipeline organization, has Flouride-resistani acid phesphatase, and data error is corrected, and the advantages such as optimal speed power dissipation ratio, are widely used in aerospace model.MicroFLEX is a kind of LSI testing system, have at a high speed, the function of high precision measurement, and have fairly perfect window editing interface, be suitable for the test of high speed device, FLEX develop the test program of RHF1201 and designs dependence test circuit, test request can be met preferably.
Summary of the invention
The problem that the present invention solves is the problem that in prior art, analog-to-digital conversion device RHF1201 difficulty of test is large, precision is low; For solving described problem, the invention provides a kind of method of testing analog to digital converter RHF1201 based on FLEX.
Method based on FLEX test analog to digital converter RHF1201 provided by the invention comprises: according to the description of product, each pin of RHF1201 connects exciting signal source respectively, comprises power supply, reference signal, control signal and digital signal; Adopting FLEX test macro, testing different parameters by selecting the pumping signal of different performance.
Further, when test integral linearity error, differential linearity error, pumping signal input is connected with simulation signal generator; Simulation signal generator provides amplitude to be the differential sine wave of ± 1V, frequency 2MHz; Digital channel DSSC adopts speed 50Mhz to catch.
Further, test total harmonic distortion, dynamic range, signal to noise ratio, signal and noise distortion than time, pumping signal input is connected with simulation signal generator; Simulation signal generator provides amplitude to be the differential sine wave of ± 1V, frequency 15MHz; Digital channel DSSC adopts speed 50Mhz to catch.
Further, when measuring full scale error, polar zero point error, pumping signal input is connected with the Vsource exceeding resolution in POOLII instrument; By changing Vsource value, reaching digital channel full scale and polar zero point, calculating full scale error and polar zero point error.
Further, when measuring numeral input leakage current test, apply the low and high level of input requirements with the parameter measurement unit PMU in digital channel, measure the electric current of entering apparatus pin respectively.
Further, during the level of test reference source, device powers on, the magnitude of voltage produced with DC30 instrument VI source measuring element reference power source.
Further, when test numeral exports low and high level, leakage current,: connect pumping signal input with the Vsource of ultrahigh resolution in POOLII instrument, by changing Vsource value, reach digital channel complete " 1 " or complete " 0 " state, measure the magnitude of voltage of low and high level with the electric current that the parameter measurement unit PMU in digital channel applies to specify; With digital channel excitation OEB pin, all numerals are exported and is in high impedance status, the voltage applying regulation with the parameter measurement unit PMU in digital channel measures leakage current.
Further, testing power supply, for seasonable, surveys electric current with DC30 passage making alive.
The present invention compared with prior art, its advantage is: solve traditional high-precision adc circuit high-resolution, high linearity, the shortcoming that dynamic parameter cannot be tested, taken into full account when carrying out high speed test, the switching rate of relay, switch performance, on the impact of test result, adopt suitable relay and measurement circuit, ensure that speed and the precision of test, achieve stable high speed test function.
Accompanying drawing explanation
Fig. 1 is high speed 50Msps of the present invention, 12 analog to digital converter RHF1201 test circuit schematic diagrames.
Embodiment
Hereinafter, in conjunction with the accompanying drawings and embodiments the present invention is further elaborated.
The embodiment provides a kind of method of testing analog to digital converter RHF1201 based on FLEX, Figure 1 shows that test circuit schematic diagram, with reference to figure 1, test comprises the following steps:
1. integral linearity error (IntegralLinearityError), differential linearity error (DifferentialLinearityError): relay S3 closes, BBACSRC1+, BBACSRC-provide pumping signal, pumping signal is amplitude is ± 1V, and frequency is the differential sine wave of 2MHz; Digital channel DSSC adopts speed 50Mhz to catch; INL is calculated, DNL with statistic histogram.
2. total harmonic distortion (THD), dynamic range (SFDR), signal to noise ratio (snr), signal and noise distortion ratio (SINAD): relay S3 closes, and BBACSRC1+, BBACSRC-send amplitude ± 1V, the differential sine wave of frequency 15MHz; Digital channel DSSC adopts speed 50Mhz to catch; THD is calculated, SFDR, SNR, SINAD with DSP.
3. full scale error (FullScaleError), polar zero point error (BipolarZeroError): relay S3 disconnects, S5 closes, with the Vsource of ultrahigh resolution in POOLII instrument as pumping signal, by changing Vsource value, reach digital channel full scale and polar zero point, calculate full scale error and polar zero point error.
4. numeral input leakage current test: the low and high level applying input requirements with the parameter measurement unit PMU in digital channel, measures the electric current of entering apparatus pin respectively.
5. reference source level detecting: device powers on, the magnitude of voltage produced with DC30 instrument VI source measuring element reference power source.
6. numeral exports low and high level, leakage current test: relay S3 disconnects, S5 closes, with the Vsource of ultrahigh resolution in POOLII instrument as pumping signal, by changing Vsource value, reach digital channel complete " 1 " or complete " 0 " state, measure the magnitude of voltage of low and high level with the electric current that the parameter measurement unit PMU in digital channel applies to specify.With digital channel excitation OEB pin, all numerals are exported and is in high impedance status, the voltage that the parameter measurement unit PMU in digital output pin digital channel applies regulation measures leakage current.
7. power supply PowerSupply: survey electric current with DC30 passage making alive.
To sum up, in embodiments of the invention, for different parameters, the pumping signal adopting difference in functionality, different performance to require is tested, when linear parameter testing, the 2Mhz adopting high-performance Arbitrary Waveform Generator to produce to meet test request 1Vpp is sinusoidal wave, and with 50Msps sample rate capture-data, calculate dynamic linear parameter, closely device real running environment; When testing high-performance dynamic parameter, directly producing 15Mhz signal with high-performance 24 Arbitrary Waveform Generators and being activated to RHF1201; When testing the bits per inch word output low and high level parameter that high-resolution requires, with ultrahigh resolution voltage source excitation to RHF1201.Consider the requirement meeting high-performance test, output pin adopts 50 ohms impedance match, relay more than S3 bandwidth 100Mhz, and each relay connects USERPOWER12V and UDBxx, and relay all selects HFS-1A-12LD.
Although the present invention with preferred embodiment openly as above; but it is not for limiting the present invention; any those skilled in the art without departing from the spirit and scope of the present invention; the Method and Technology content of above-mentioned announcement can be utilized to make possible variation and amendment to technical solution of the present invention; therefore; every content not departing from technical solution of the present invention; the any simple modification done above embodiment according to technical spirit of the present invention, equivalent variations and modification, all belong to the protection range of technical solution of the present invention.
Claims (8)
1. test a method of analog to digital converter RHF1201 based on FLEX, it is characterized in that, according to the description of product, each pin of RHF1201 connects exciting signal source respectively, comprises power supply, reference signal, control signal and digital signal; Adopting FLEX test macro, testing different parameters by selecting the pumping signal of different performance.
2. according to method of testing analog to digital converter RHF1201 based on FLEX according to claim 1, it is characterized in that, when test integral linearity error INL, differential linearity error DNL, pumping signal input is connected with simulation signal generator; Simulation signal generator provides amplitude to be the differential sine wave of ± 1V, frequency 2MHz; Digital channel DSSC adopts speed 50Mhz to catch.
3. according to method of testing analog to digital converter RHF1201 based on FLEX according to claim 1, it is characterized in that, test total harmonic distortion THD, dynamic range SFDR, signal to noise ratio snr, signal with noise distortion than SINAD time, pumping signal input is connected with simulation signal generator; Simulation signal generator provides amplitude to be the differential sine wave of ± 1V, frequency 15MHz; Digital channel DSSC adopts speed 50Mhz to catch.
4. according to method of testing analog to digital converter RHF1201 based on FLEX according to claim 1, it is characterized in that, when measuring full scale error, polar zero point error, pumping signal input is connected with the Vsource of ultrahigh resolution in POOLII instrument; By changing Vsource value, reaching digital channel full scale and polar zero point, calculating full scale error and polar zero point error.
5. according to method of testing analog to digital converter RHF1201 based on FLEX according to claim 1, it is characterized in that, when measuring numeral input leakage current test, apply the low and high level of input requirements with the parameter measurement unit PMU in digital channel, measure the electric current of entering apparatus pin respectively.
6. according to method of testing analog to digital converter RHF1201 based on FLEX according to claim 1, it is characterized in that, during the embedded reference source level of test component, device powers on, the magnitude of voltage produced with DC30 instrument VI source measuring element reference power source.
7. according to method of testing analog to digital converter RHF1201 based on FLEX according to claim 1, it is characterized in that, when test numeral exports low and high level, leakage current: be connected to device stimulus signal input part with the Vsource of ultrahigh resolution in POOLII instrument, by changing Vsource value, reach digital channel complete " 1 " or complete " 0 " state, measure the magnitude of voltage of low and high level with the electric current that the parameter measurement unit PMU in digital channel applies to specify; With digital channel excitation OEB pin, all numerals are exported and is in high impedance status, the voltage that the parameter measurement unit PMU in all digital output pin digital channels applies regulation measures leakage current.
8. according to method of testing analog to digital converter RHF1201 based on FLEX according to claim 1, it is characterized in that, testing power supply, for seasonable, surveys electric current with DC30 passage making alive.
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Citations (4)
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| CN101088223A (en) * | 2004-12-23 | 2007-12-12 | 泰拉丁公司 | Using a parametric measurement unit for converter testing |
| US20110246809A1 (en) * | 2010-04-02 | 2011-10-06 | Dewhirst Adam H | Synchronization of Converters Having Varying Group-Delays in a Measurement System |
| CN102420610A (en) * | 2010-09-27 | 2012-04-18 | 飞思卡尔半导体公司 | Method for testing digital-to-analog converter and analog-to-digital converter |
| CN102868402A (en) * | 2012-09-18 | 2013-01-09 | 上海航天测控通信研究所 | Test method for testing main performance indices of analog-to-digital converter (ADC) |
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Patent Citations (4)
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|---|---|---|---|---|
| CN101088223A (en) * | 2004-12-23 | 2007-12-12 | 泰拉丁公司 | Using a parametric measurement unit for converter testing |
| US20110246809A1 (en) * | 2010-04-02 | 2011-10-06 | Dewhirst Adam H | Synchronization of Converters Having Varying Group-Delays in a Measurement System |
| CN102420610A (en) * | 2010-09-27 | 2012-04-18 | 飞思卡尔半导体公司 | Method for testing digital-to-analog converter and analog-to-digital converter |
| CN102868402A (en) * | 2012-09-18 | 2013-01-09 | 上海航天测控通信研究所 | Test method for testing main performance indices of analog-to-digital converter (ADC) |
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| STMICROELECTRONICS GROUP OF COMPANIES: "Rad-hard 12-bit 0.5 to 50 Msps A/D converter", 《IC资料网》 * |
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