CN105527584A - Power supply module test device - Google Patents

Power supply module test device Download PDF

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Publication number
CN105527584A
CN105527584A CN201510865963.2A CN201510865963A CN105527584A CN 105527584 A CN105527584 A CN 105527584A CN 201510865963 A CN201510865963 A CN 201510865963A CN 105527584 A CN105527584 A CN 105527584A
Authority
CN
China
Prior art keywords
power module
contact
testing
test circuit
cover plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201510865963.2A
Other languages
Chinese (zh)
Inventor
王家波
盛军
赵桂花
吴晓鸣
刘波
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Luoyang Institute of Electro Optical Equipment AVIC
Original Assignee
Luoyang Institute of Electro Optical Equipment AVIC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Luoyang Institute of Electro Optical Equipment AVIC filed Critical Luoyang Institute of Electro Optical Equipment AVIC
Priority to CN201510865963.2A priority Critical patent/CN105527584A/en
Publication of CN105527584A publication Critical patent/CN105527584A/en
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/40Testing power supplies

Abstract

The invention relates to a power supply module test device, comprising a test base. The test base is provided with a test circuit and a contact member which is used for matching with contacts of the power supply module in a press-contact mode. The contact member is electrically connected to the test circuit. During usage, the power supply module is connected to the test circuit through the pressing match between the contact member of the test base and the contacts of the power supply module, the contacts are guaranteed not to be damaged, and at the same time, a quick test of the power supply module is realized.

Description

A kind of power module testing apparatus
Technical field
The present invention relates to a kind of power module testing apparatus.
Background technology
A kind of power supply DC/DC conversion chip of land grid array during LTM4600 power module; input voltage range 4.5V-20V; output voltage range can from 0.6V-5V (adopting single peripheral hardware resistance to determine); maximum output current can reach 10A; its peak point current can reach 14A; output voltage regulation can reach 1.5%; top efficiency can reach 92%; transient response speed is ultrafast; switching frequency representative value is 850KHz; the marking signal having power supply good exports, and has output over-voltage protection and optional short circuit timeing closing device.But this power module pin-free non-soldering tin ball, it is the square plate electrode of array status bottom it, the contact density of electrode is high, for ensureing the integrality of contact, welded type cannot be taked to detect (welded type detect refer to pin or solder ball to be connected in test circuit detect), domesticly postsearch screening can not be carried out, cannot judge that whether normal the function of power module is, when not rejecting defective device, adopt the welding manner of print tin cream, be assembled to after on circuit board through often breaking down, increase troubleshooting difficulty and production cost, be unfavorable for the raising of production efficiency.
Summary of the invention
The object of the invention is to improve a kind of power module testing apparatus, to solve the problem that in prior art, the ball power module of pin-free non-soldering tin cannot detect.
In order to solve the problem, technical scheme of the present invention is:
A kind of power module testing apparatus, comprises testing base, testing base is provided with test circuit and for pushing up with the contact on power module the contact element that press contacts coordinates, contact element conducts electricity with described test circuit and is connected.
Described contact element is resilient contact.
Power module testing apparatus also comprises the pressing plate for being pressed in by described power module in described testing base.
Described releasable connection structure is screw connecting structure.
Described test circuit is the test circuit for power module output detections.
The peripheral circuit that described test circuit comprises power supply, port corresponding to power module connects, for display power supply module output voltage display device and be used to indicate output voltage whether normal diode.
The circuit board that described testing base comprises upper and lower cover plate and is arranged between upper and lower cover plate, described test circuit is arranged on described circuit board, described contact element is installed on described lower cover, circuit board is provided with the circuit board perforation of passing for described contact element from top to bottom, the upper end of upper cover plate is provided with the power module adaptive locating slot loaded from top to bottom, and the bottom land of locating slot is provided with the upper cover plate perforation be guided through for described contact element from top to bottom.
Described contact element to be conducted electricity with test circuit by wire and is connected.
Described test circuit comprises switch, voltage table and power light, upper cover plate offers switch hole, voltage table reading viewport and power light viewport.
Beneficial effect of the present invention is: during use, is pushed up and is press-fitted incompatible realization and is connected on test circuit by power module, can also realize the quick test to power module while ensureing not damage contact by the contact of the contact element in testing base and power module.
Resilient contact can ensure the contact effect of contact element and contact, thus ensures that test process carries out smoothly.
Accompanying drawing explanation
Fig. 1 is the structural representation of upper cover plate in the present invention;
Fig. 2 is that the A-A of Fig. 1 is to cut-open view;
Fig. 3 is the structural representation of lower cover in the present invention;
Fig. 4 is that the B-B of Fig. 3 is to cut-open view;
Fig. 5 is the circuit diagram of test circuit in the present invention.
Embodiment
A kind of embodiment of power module testing apparatus is as shown in Fig. 1 ~ 5: comprise testing base; testing base comprises upper cover plate 1, lower cover 9 and circuit board (not shown); the lower face of upper cover plate 1 is provided with upper cover plate container cavity 8; the upper surface of lower cover 9 is provided with lower cover container cavity 10; upper and lower container cavity forms the space that power circuit board is arranged; upper and lower cover plate is assembled together by screw; circuit board is arranged between upper and lower cover plate, can form protection like this to circuit board.Circuit board is provided with test circuit, lower cover is provided with vertical contact element (not shown) of arranging, in the present embodiment, contact element is resilient contact, resilient contact comprises the installation portion be connected with lower cover and the floating contact site be assemblied in by spring floating on installation portion, and installation portion is connected with test circuit by wire.Circuit board is provided with the circuit board perforation of passing from the bottom to top for contact element, the upper end of upper cover plate is provided with the power module adaptive locating slot 4 loaded from top to bottom, the bottom land of locating slot is provided with the upper cover plate perforation 3 be guided through for contact element from top to bottom, and upper cover plate perforation 3 can ensure the intensity of contact element.The upper cover plate of testing base there is the pressing plate for being pressed in by power module in testing base by releasable connection anatomical connectivity.In the present embodiment, the power module tested adopts LTM4600, LTM4600 to be encapsulated as LGA, pin-free non-soldering tin ball, and be the square plate electrode of array status bottom it, contact density is high.Test circuit is the test circuit of the detection output voltage designed for LTM4600.
Concrete, test circuit as shown in Figure 1, comprises a power supply P; A display device L; A single-pole single-throw switch (SPST) K; Five electric capacity C1 (10uf), C2 (10uf), C3 (22uf), C4 (470uf), C5 (100pf); Four resistance R1 (100k), R2 (49.9k), R3 (1k), R4 (4.7k); A light emitting diode V1 (green), probe array (ZL) is LTM4600 to be measured.In the present embodiment, display device L adopts the digital voltmeter bought.As other embodiments, also homemade collection and display device can be adopted.Upper cover plate offers switch hole 6, voltage table reading viewport 5 and power light viewport 2.
The positive pole of power supply P connects 1 pin of K, the negative pole of P connect 1 pin of C1, C2,1 pin of R2, R3,1 pin of C3, C4, V1 negative pole, ZL 2,6,7,2,4 pin of L; 2 pin of 2 end C1, C2 of K, 2 pin of R4,1 of ZL; 1 pin of R4 connects the positive pole of V1; 3 of ZL connects 2 pin, 2 pin of C3, C4, C5,3 pin of L of R1, R3; 4 of ZL connects 1 pin of C5,2 pin of R2; 5 of ZL connects 1 pin of R1.
Input voltage V iNbe 4.5 ~ 20V, output voltage V oUT=1.8V, output current are the mu balanced circuit of 10A.Different output voltage V oUTresistance R is set with output voltage sETrelation as follows:
V O U T = 0.6 V · 100 K + R S E T R S E T
In Fig. 1, R2 is output voltage setting resistance, V oUT=1.8V, can obtain R2=49.9K Ω by formulae discovery above.C1, C2, C3 are multilayer ceramic capacitors, and C4 is solid electrolytic capacitor.Switch control rule " K " is set at power input, uses resistance " R4 " to be power light " V1 " dividing potential drop at input end; The voltage output value of the direct display power supply module of digital voltmeter is used at power output end.
The present embodiment carries out output test for LTM4600, as other embodiments, adopt other power modules of LGA encapsulation also can utilize design of the present invention to test, only need test circuit to carry out changing to make it be adapted to corresponding power module, of course simultaneously also should according to the test request of corresponding power module, the adjustment position of elastic probe and the connection with test circuit.Because test circuit itself can find from product description according to the test request of power module, be that those skilled in the art can realize, therefore being formed in this and not repeating of corresponding test circuit.
In other embodiments of the invention: all right exposed setting of circuit board; Certain lower cover also can be arranged at the top of circuit board; Contact element also can be do not have flexible rigid contact part; Pressing plate also can not be connected with testing base by screw connecting structure, such as is only be placed on power module by pressing plate, only relies on the weight of pressing plate to come to apply pressure to power module; When power module own wt is enough to ensure each contact element and contact reliable contacts comparatively greatly, pressing plate also can not be established; The structure of testing base can also be following structure, testing base comprises holder and sliding seat, test circuit is arranged on holder, contact element is arranged in sliding seat, during use, power module is arranged on holder, sliding seat is press-fited the conducting realizing each contact on contact element and power module on holder.

Claims (9)

1. a power module testing apparatus, is characterized in that: comprise testing base, testing base is provided with test circuit and for pushing up with the contact on power module the contact element that press contacts coordinates, contact element conducts electricity with described test circuit and is connected.
2. power module testing apparatus according to claim 1, is characterized in that: described contact element is resilient contact.
3. power module testing apparatus according to claim 2, is characterized in that: power module testing apparatus also comprises the pressing plate for being pressed in by described power module in described testing base.
4. power module testing apparatus according to claim 3, is characterized in that: described releasable connection structure is screw connecting structure.
5. power module testing apparatus according to claim 1, is characterized in that: described test circuit is the test circuit for power module output detections.
6. power module testing apparatus according to claim 5, is characterized in that: the peripheral circuit that described test circuit comprises power supply, port corresponding to power module connects, for display power supply module output voltage display device and be used to indicate output voltage whether normal diode.
7. the power module testing apparatus according to claim 1 ~ 6 any one, it is characterized in that: the circuit board that described testing base comprises upper and lower cover plate and is arranged between upper and lower cover plate, described test circuit is arranged on described circuit board, described contact element is installed on described lower cover, circuit board is provided with the circuit board perforation of passing for described contact element from top to bottom, the upper end of upper cover plate is provided with the power module adaptive locating slot loaded from top to bottom, and the bottom land of locating slot is provided with the upper cover plate perforation be guided through for described contact element from top to bottom.
8. power module testing apparatus according to claim 7, is characterized in that: described contact element to be conducted electricity with test circuit by wire and is connected.
9. power module testing apparatus according to claim 7, is characterized in that: described test circuit comprises switch, voltage table and power light, upper cover plate offers switch hole, voltage table reading viewport and power light viewport.
CN201510865963.2A 2015-12-01 2015-12-01 Power supply module test device Pending CN105527584A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510865963.2A CN105527584A (en) 2015-12-01 2015-12-01 Power supply module test device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510865963.2A CN105527584A (en) 2015-12-01 2015-12-01 Power supply module test device

Publications (1)

Publication Number Publication Date
CN105527584A true CN105527584A (en) 2016-04-27

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Family Applications (1)

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CN201510865963.2A Pending CN105527584A (en) 2015-12-01 2015-12-01 Power supply module test device

Country Status (1)

Country Link
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109061522A (en) * 2018-09-03 2018-12-21 北京电子工程总体研究所 A kind of system and method for power-supply device self -support
CN110261792A (en) * 2019-06-18 2019-09-20 深圳市嘉兆鸿电子有限公司 DC power supply detection method, device, test terminal and readable storage medium storing program for executing

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2809657Y (en) * 2005-06-23 2006-08-23 威盛电子股份有限公司 Test assembly for electrical property test of electrical package
CN101430354A (en) * 2007-11-08 2009-05-13 环隆电气股份有限公司 Test method and apparatus for pin element
CN102095946A (en) * 2009-12-15 2011-06-15 日月光封装测试(上海)有限公司 General electrical testing device for packaging structures
CN102707244A (en) * 2012-05-23 2012-10-03 苏州市职业大学 Performance test system for miniature switching power supply
CN103558562A (en) * 2013-11-07 2014-02-05 浙江中控技术股份有限公司 Testing device and method for power module
CN104678328A (en) * 2015-03-26 2015-06-03 石家庄迪龙科技有限公司 Full-automatic comprehensive power supply detector

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2809657Y (en) * 2005-06-23 2006-08-23 威盛电子股份有限公司 Test assembly for electrical property test of electrical package
CN101430354A (en) * 2007-11-08 2009-05-13 环隆电气股份有限公司 Test method and apparatus for pin element
CN102095946A (en) * 2009-12-15 2011-06-15 日月光封装测试(上海)有限公司 General electrical testing device for packaging structures
CN102707244A (en) * 2012-05-23 2012-10-03 苏州市职业大学 Performance test system for miniature switching power supply
CN103558562A (en) * 2013-11-07 2014-02-05 浙江中控技术股份有限公司 Testing device and method for power module
CN104678328A (en) * 2015-03-26 2015-06-03 石家庄迪龙科技有限公司 Full-automatic comprehensive power supply detector

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109061522A (en) * 2018-09-03 2018-12-21 北京电子工程总体研究所 A kind of system and method for power-supply device self -support
CN110261792A (en) * 2019-06-18 2019-09-20 深圳市嘉兆鸿电子有限公司 DC power supply detection method, device, test terminal and readable storage medium storing program for executing

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Application publication date: 20160427