CN105204196B - Substrate inspects method by random samples - Google Patents
Substrate inspects method by random samples Download PDFInfo
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- CN105204196B CN105204196B CN201510659224.8A CN201510659224A CN105204196B CN 105204196 B CN105204196 B CN 105204196B CN 201510659224 A CN201510659224 A CN 201510659224A CN 105204196 B CN105204196 B CN 105204196B
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- random samples
- sampling observation
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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- Nonlinear Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Liquid Crystal (AREA)
Abstract
The present invention provides a kind of substrates to inspect method by random samples, frequency and the other information in side to be inspected by random samples are inspected by random samples by setting, substrate counting is first passed through when substrate reaches to judge whether to reach sampling observation frequency, judge whether the other information in side and the other information in side to be inspected by random samples of substrate are consistent again, and whether the other information in side of substrate is identical with the other information in side of stored substrate, determine whether to inspect substrate by random samples, the product that the step of being judged by the other information of joining side comes from different processing procedure cabins and workbench can be arrived by sampling observation, it avoids because of changeless sampling observation frequency, the substrate inspected by random samples every time is caused to be all from same processing procedure cabin or the same side workbench and the problem of the processing procedure cabin of missing inspection existing defects or workbench, improve product yield.
Description
Technical field
The present invention relates to display technology field more particularly to a kind of substrate sampling observation methods.
Background technology
Liquid crystal display device (LCD, Liquid Crystal Display) has that fuselage is thin, power saving, radiationless etc. numerous
Advantage is widely used.Such as：LCD TV, mobile phone, personal digital assistant (PDA), digital camera, computer
Screen or laptop screen etc..Usual liquid crystal display device includes housing, the liquid crystal display panel in housing and sets
In the backlight module (Backlight module) in housing.Wherein, the structure of liquid crystal display panel is mainly by film crystalline substance
Body pipe array substrate (Thin Film Transistor Array Substrate, TFT Array Substrate), a color film
Substrate (Color Filter, CF) and the liquid crystal layer (Liquid Crystal Layer) being configured between two substrates are formed,
Its operation principle is to control the rotation of the liquid crystal molecule of liquid crystal layer by applying driving voltage on two panels glass substrate, will be carried on the back
The light of optical mode group reflects generation picture.
Usual liquid crystal display panel by color membrane substrates, array substrate, the liquid crystal being sandwiched between color membrane substrates and array substrate,
And sealing glue frame composition.The production method of array substrate be first make tft layer, make again flatness layer and pixel electricity
Pole.After the production method of color membrane substrates has first made black matrix", then color light resistance layer (red green blue photoresist layer) is made, finally
Photoresist spacer is made, completes the making of color membrane substrates.
In the manufacturing process of substrate, in order to ensure the quality of substrate, need to inspect the processing procedure quality of substrate by random samples, it is existing
Technology is to provide a detection device first to the sampling observation method of substrate, and a sampling observation frequency is preset on the detection device, when
After the quantity of color membrane substrates by detection machine reaches preset sampling observation frequency, by detection machine, substrate is detected.However,
In the large-scale production process of substrate, in order to promote prouctiveness, the equipment of processing procedure would generally set multiple processing procedure cabins
(chamber) or the other workbench in multiple sides (stage), multiple processing procedure cabins or workbench are carried out at the same time processing procedure, so for dividing
Not by for multiple substrates of different processing procedure cabins or workbench making, coordinating changeless sampling observation frequency, may be such that every
The substrate of secondary sampling observation is all from same processing procedure cabin or the same side workbench, and can not inspect other processing procedure cabins or work by random samples
Platform leads to the processing procedure cabin of missing inspection existing defects or the substrate of workbench making, leads to not find product exception in time, reduce production
Product yield.
Invention content
The purpose of the present invention is to provide a kind of substrates to inspect method by random samples, using sampling observation frequency and the other information in side to be inspected by random samples, phase
With reference to method inspected by random samples, make to come from different processing procedure cabins and the product of workbench be all detected, avoid missing inspection problem.
To achieve the above object, the present invention provides a kind of substrates to inspect method by random samples, includes the following steps：
Step 1 provides a detection machine, if n is positive integer, the sampling observation frequency of default detection machine is that n and one or more are treated
Inspect the other information in side by random samples, substrate counts zero；Several substrates are provided, substrate enters detection machine one by one；
Step 2, a substrate reach detection machine, and substrate is counted to be iterated cumulative with 1 for increment, and calculation formula is：count
=count+1, wherein count represent substrate counting；
Step 3, detection machine according to substrate counting determines whether to reach sampling observation frequency, if reach sampling observation frequency if continue into
Row step 4 continues to judge whether substrate is counted equal with n if not up to sampling observation frequency, returns substrate counting if equal
Return to step 2 after zero, the direct return to step 2 if unequal；
The other information in side of step 4, detection machine identification substrate, and judge that the other information in side of substrate and the other information in side to be inspected by random samples are
Whether the no other information in identical, substrate side is identical with the other information in side of stored substrate, if the other information in the side of substrate is taken out with waiting
The side level signal of inspection is identical and the other information difference in side with stored substrate then continues step 5, otherwise counts substrate
Be zeroed simultaneously return to step 2；
Substrate is detected and stores the other information in side of the substrate for step 5, detection machine；
Step 6, detection machine compare the other information in side of the substrate of storage and the whether complete phase of the other information in preset side to be inspected by random samples
Together, the other information in side that the substrate of storage is emptied if identical returns again to step 2, otherwise direct return to step 2.
In the step 3, if the value that substrate counts is 1, judgement reaches sampling observation frequency, otherwise judgement not up to sampling observation frequency
Rate.
The substrate is the color membrane substrates of liquid crystal display panel.
The quality of the black matrix" of detection color membrane substrates, color light resistance layer and photoresist spacer in the step 5.
The sampling observation frequency that detection machine is preset in the step 1 is 10.
The other information in the side is to make the processing procedure cabin of the substrate and the information of workbench.
The other information in side to be inspected by random samples is：The first vacuum drying cabin, the second vacuum drying cabin and the color film of color film glue spreader
First baking table of exposure machine.
Beneficial effects of the present invention：The present invention provides a kind of sampling observation methods for substrate detection, are inspected by random samples by setting
Frequency and the other information in side to be inspected by random samples first pass through substrate counting when substrate reaches and judge whether to reach sampling observation frequency, then judge base
The other information in the side of the plate other information in side whether consistent and substrate with the other information in side to be inspected by random samples and the other information in side of stored substrate
Whether identical, the step of determining whether to inspect substrate by random samples, being judged by the other information of joining side, comes from different processing procedures
The product of cabin and workbench can be arrived by sampling observation, avoid, because of changeless sampling observation frequency, causing the substrate inspected by random samples every time equal
From same processing procedure cabin or the same side workbench the problem of the processing procedure cabin of missing inspection existing defects or workbench, it is good to improve product
Rate.
For further understanding of the features and technical contents of the present invention, it please refers to below in connection with the detailed of the present invention
Illustrate and attached drawing, however, the drawings only provide reference and explanation, is not intended to limit the present invention.
Description of the drawings
Below in conjunction with the accompanying drawings, it is described in detail by the specific embodiment to the present invention, technical scheme of the present invention will be made
And other beneficial effects are apparent.
In attached drawing,
Fig. 1 is that the substrate of the present invention inspects the flow chart of method by random samples.
Specific embodiment
The technological means and its effect taken further to illustrate the present invention, below in conjunction with the preferred implementation of the present invention
Example and its attached drawing are described in detail.
Referring to Fig. 1, the present invention provides a kind of substrates to inspect method by random samples, include the following steps：
Step 1 provides a detection machine, if n is positive integer, the sampling observation frequency of default detection machine is that n and one or more are treated
Inspect the other information in side by random samples, substrate counts zero；Several substrates are provided, substrate enters detection machine one by one；
Specifically, the other information in the side is to make the processing procedure cabin of the substrate and the information of workbench, the substrate is liquid
The color membrane substrates of LCD panel, the sampling observation frequency n=10, the preset other information in side to be inspected by random samples are：Aligner CP#1、
Coater VCD#1 and Coater VCD#2, represent respectively color film exposure machine the first baking table and color film glue spreader first
It is dried in vacuo cabin and the second vacuum drying cabin.
Step 2, a substrate reach detection machine, and substrate is counted to be iterated cumulative with 1 for increment, and calculation formula is：count
=count+1, wherein count represent substrate counting；
Step 3, detection machine according to substrate counting determines whether to reach sampling observation frequency, if reach sampling observation frequency if continue into
Row step 4 continues to judge whether substrate is counted equal with n if not up to sampling observation frequency, returns substrate counting if equal
Return to step 2 after zero, the direct return to step 2 if unequal；
Specifically, if the value that substrate counts is 1, i.e. during count=1, then judgement reaches sampling observation frequency, otherwise judges not reach
To sampling observation frequency, each substrate counts count and is added to 10, i.e. during count=n, count is reset.
The other information in side of step 4, detection machine identification substrate, and judge that the other information in side of substrate and the other information in side to be inspected by random samples are
Whether the no other information in identical, substrate side is identical with the other information in side of stored substrate, if the other information in the side of substrate is taken out with waiting
The side level signal of inspection is identical and the other information difference in side with stored substrate then continues step 5, otherwise counts substrate
Be zeroed simultaneously return to step 2；
Substrate is detected and stores the other information in side of the substrate for step 5, detection machine；
Specifically, the matter of the black matrix" of the detection machine testing color membrane substrates, color light resistance layer and photoresist spacer
Amount.
Step 6, detection machine compare the other information in side of the substrate of storage and the whether complete phase of the other information in preset side to be inspected by random samples
Together, the other information in side that the substrate of storage is emptied if identical returns again to step 2, otherwise direct return to step 2.
In conclusion the present invention provides a kind of sampling observation method for substrate detection, frequency is inspected by random samples by setting and is treated
It inspects the other information in side by random samples, substrate counting is first passed through when substrate reaches and judges whether to reach sampling observation frequency, then judge that the side of substrate is other
The other information in side of whether consistent and substrate the other information in side of information and the other information in side to be inspected by random samples and stored substrate whether phase
Together, the step of determining whether to inspect substrate by random samples, being judged by the other information of joining side comes from different processing procedure cabins and work
Making the product of platform can be arrived by sampling observation, avoid, because of changeless sampling observation frequency, the substrate inspected by random samples every time being caused to be all from together
One processing procedure cabin or the same side workbench and the problem of the processing procedure cabin of missing inspection existing defects or workbench, improve product yield.
The above, for those of ordinary skill in the art, can according to the technique and scheme of the present invention and technology
Other various corresponding changes and deformation are made in design, and all these changes and deformation should all belong to the claims in the present invention
Protection domain.
Claims (7)
1. a kind of substrate inspects method by random samples, which is characterized in that includes the following steps：
Step 1 provides a detection machine, if n is positive integer, the sampling observation frequency of default detection machine is that n and one or more are waited to inspect by random samples
The other information in side, substrate count zero；Several substrates are provided, substrate enters detection machine one by one；
Step 2, a substrate reach detection machine, and substrate is counted to be iterated cumulative with 1 for increment, and calculation formula is：Count=
Count+1, wherein count represent substrate counting；
Step 3, detection machine determine whether to reach sampling observation frequency, continue to walk if sampling observation frequency is reached according to substrate counting
Rapid 4, continue to judge whether substrate is counted equal with n if not up to sampling observation frequency, after substrate is counted zero if equal
Return to step 2, the direct return to step 2 if unequal；
The other information in side of step 4, detection machine identification substrate, and judge the other information in side of substrate and the other information in side to be inspected by random samples whether phase
With and the other information in side of substrate and the other information in side of stored substrate it is whether identical, if the other information in the side of substrate is inspected by random samples with waiting
Side level signal it is identical and the other information difference in side with stored substrate then continues step 5, otherwise substrate counting is returned
Zero and return to step 2；
Substrate is detected and stores the other information in side of the substrate for step 5, detection machine；
Step 6, detection machine compare the substrate of storage the other information in side and the other information in preset side to be inspected by random samples it is whether identical, if
Identical, the other information in side for emptying the substrate of storage returns again to step 2, otherwise direct return to step 2.
2. substrate as described in claim 1 inspects method by random samples, which is characterized in that in the step 3, if the value that substrate counts is 1,
Then judgement reaches sampling observation frequency, otherwise judgement not up to sampling observation frequency.
3. substrate as described in claim 1 inspects method by random samples, which is characterized in that the substrate is the color film base of liquid crystal display panel
Plate.
4. substrate as claimed in claim 3 inspects method by random samples, which is characterized in that the black of color membrane substrates is detected in the step 5
The quality of matrix, color light resistance layer and photoresist spacer.
5. substrate as claimed in claim 3 inspects method by random samples, which is characterized in that the sampling observation frequency of detection machine is preset in the step 1
Rate is 10.
6. substrate as described in claim 1 inspects method by random samples, which is characterized in that the other information in the side is to make the system of the substrate
Journey cabin and the information of workbench.
7. substrate as claimed in claim 6 inspects method by random samples, which is characterized in that the other information in side to be inspected by random samples is：Color film gluing
The first of machine is dried in vacuo first baking table in cabin, the second vacuum drying cabin and color film exposure machine.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201510659224.8A CN105204196B (en) | 2015-10-13 | 2015-10-13 | Substrate inspects method by random samples |
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| CN201510659224.8A CN105204196B (en) | 2015-10-13 | 2015-10-13 | Substrate inspects method by random samples |
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| CN105204196A CN105204196A (en) | 2015-12-30 |
| CN105204196B true CN105204196B (en) | 2018-07-10 |
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| CN110097260B (en) * | 2019-04-12 | 2023-12-19 | 格力电器（芜湖）有限公司 | Product inspection method, apparatus, device, and storage medium |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009175488A (en) * | 2008-01-25 | 2009-08-06 | Seiko Epson Corp | Inspection method for electro-optical device |
| KR20110130572A (en) * | 2010-05-28 | 2011-12-06 | 조영창 | Block base inspecting method using the same |
| CN102642716A (en) * | 2012-04-11 | 2012-08-22 | 深圳市华星光电技术有限公司 | Picking and placing device of glass substrate |
| CN103217816A (en) * | 2013-04-01 | 2013-07-24 | 深圳市华星光电技术有限公司 | Detecting method of array base plate and detecting table and detecting device thereof |
| CN103235430A (en) * | 2013-05-08 | 2013-08-07 | 深圳市华星光电技术有限公司 | Detection method of panel bonding semi-finished product |
-
2015
- 2015-10-13 CN CN201510659224.8A patent/CN105204196B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009175488A (en) * | 2008-01-25 | 2009-08-06 | Seiko Epson Corp | Inspection method for electro-optical device |
| KR20110130572A (en) * | 2010-05-28 | 2011-12-06 | 조영창 | Block base inspecting method using the same |
| CN102642716A (en) * | 2012-04-11 | 2012-08-22 | 深圳市华星光电技术有限公司 | Picking and placing device of glass substrate |
| CN103217816A (en) * | 2013-04-01 | 2013-07-24 | 深圳市华星光电技术有限公司 | Detecting method of array base plate and detecting table and detecting device thereof |
| CN103235430A (en) * | 2013-05-08 | 2013-08-07 | 深圳市华星光电技术有限公司 | Detection method of panel bonding semi-finished product |
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| Publication number | Publication date |
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| CN105204196A (en) | 2015-12-30 |
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