CN105097872A - System and methods for extracting correlation curves for organic light emitting device - Google Patents

System and methods for extracting correlation curves for organic light emitting device Download PDF

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Publication number
CN105097872A
CN105097872A CN201510267035.6A CN201510267035A CN105097872A CN 105097872 A CN105097872 A CN 105097872A CN 201510267035 A CN201510267035 A CN 201510267035A CN 105097872 A CN105097872 A CN 105097872A
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oled
pixel
stress
stress condition
voltage
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CN105097872B (en
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戈尔拉玛瑞扎·恰吉
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Ignis Innovation Inc
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Ignis Innovation Inc
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Priority claimed from US14/286,711 external-priority patent/US9881532B2/en
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    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
    • G09G3/3225—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix
    • G09G3/3233—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix with pixel circuitry controlling the current through the light-emitting element
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00—Aspects of the constitution of display devices
    • G09G2300/04—Structural and physical details of display devices
    • G09G2300/0404—Matrix technologies
    • G09G2300/0413—Details of dummy pixels or dummy lines in flat panels
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00—Aspects of the constitution of display devices
    • G09G2300/08—Active matrix structure, i.e. with use of active elements, inclusive of non-linear two terminal elements, in the pixels together with light emitting or modulating elements
    • G09G2300/0809—Several active elements per pixel in active matrix panels
    • G09G2300/0819—Several active elements per pixel in active matrix panels used for counteracting undesired variations, e.g. feedback or autozeroing
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00—Aspects of the constitution of display devices
    • G09G2300/08—Active matrix structure, i.e. with use of active elements, inclusive of non-linear two terminal elements, in the pixels together with light emitting or modulating elements
    • G09G2300/0809—Several active elements per pixel in active matrix panels
    • G09G2300/0842—Several active elements per pixel in active matrix panels forming a memory circuit, e.g. a dynamic memory with one capacitor
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/02—Improving the quality of display appearance
    • G09G2320/029—Improving the quality of display appearance by monitoring one or more pixels in the display panel, e.g. by monitoring a fixed reference pixel
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/04—Maintaining the quality of display appearance
    • G09G2320/043—Preventing or counteracting the effects of ageing
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/04—Maintaining the quality of display appearance
    • G09G2320/043—Preventing or counteracting the effects of ageing
    • G09G2320/045—Compensation of drifts in the characteristics of light emitting or modulating elements
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2360/00—Aspects of the architecture of display systems
    • G09G2360/14—Detecting light within display terminals, e.g. using a single or a plurality of photosensors
    • G09G2360/145—Detecting light within display terminals, e.g. using a single or a plurality of photosensors the light originating from the display screen
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
    • G09G3/3275—Details of drivers for data electrodes
    • G09G3/3291—Details of drivers for data electrodes in which the data driver supplies a variable data voltage for setting the current through, or the voltage across, the light-emitting elements

Abstract

A system determines the efficiency degradation of organic light emitting devices (OLEDs) in multiple array-based semiconductor devices having arrays of pixels that include OLEDs. The system determines the relationship between changes in an electrical operating parameter of the OLEDs and the efficiency degradation of the OLEDs in each of the array-based semiconductor devices, uses the determined relationship for a selected one of the array-based semiconductor devices to determine the efficiency degradation of the OLEDs, and compensates for the efficiency degradation. The relationship between changes in an electrical operating parameter of the OLEDs and the efficiency degradation of the OLEDs in the array-based semiconductor devices may be determined by the use of a test OLED associated with each of the devices.

Description

Extract the system and method for the invariance curve of organic luminescent device
The cross reference of related application
This application claims the priority of the U.S. Patent application 14/286,711 submitted on May 21st, 2015, here the full content of this earlier application is incorporated to by reference herein.
Technical field
The present invention relates generally to the display of the luminescent device using such as OLED and so on, and relates more specifically to the association of characteristics curve that extracts in this class display under different stress condition to compensate the aging of luminescent device.
Background technology
Relative to conventional LCD device, active matrix organic light-emitting device (AMOLED) display provides lower power consumption, manufactures the advantage of flexibility and refresh rate faster.Compared with conventional LCD device, in displayer, there is not backlight, this is because each pixel is made up of the OLED of independent luminous different colours.OLED is based on the galvanoluminescence provided by driving transistors.Driving transistors is thin-film transistor (TFT) normally.The size of the light produced in the power consumption of each pixel and this pixel has direct relation.
At the run duration of organic light emitting diode device, it suffers deterioration, and this causes the light output under constant current to reduce along with the time.OLED also suffers electricity deterioration, and this causes the electric current under constant bias voltage to reduce along with the time.These deteriorations be substantially by OLED execute alive size and duration and the relevant stress of the electric current that produces in this device thus causes.This kind of deterioration due to the environmental factor of the existence and so on of such as temperature, humidity or oxidant contribution in time and mix.The rate of ageing of film transistor device also depends on environment and stress (being biased).Carry out calibration pixel for the pixel historical data previously for several times stored, to determine the aging effect in pixel, thus suitably can determine that pixel transistor and OLED's is aging.Therefore, accurate aging data is needed at the whole life period of display unit.
In a kind of OLED display compensation technique, extract aging (and/or uniformity) of pixel panel and it can be used as original or treated data to store in a lookup table.Then, compensating module uses the data that store to any skew of the electrical parameter and optical parametric that compensate OLED (such as, the skew of OLED working voltage and optical efficiency) and the electricity of backboard and optical parametric any skew (such as, the threshold voltage shift of TFT), the program voltage of each pixel is thus revised according to stored data and video content.Compensating module revises drive TFT biased through OLED to keep the mode of identical luminance level for each grey level according to making enough electric currents.In other words, the aging electricity that is aging with optics and TFT of electricity that suitable program voltage suitably counteracts OLED is deteriorated.
At the life period of display, monitored constantly by the measuring circuit fed back based on electricity and extract the electrical parameter of backboard TFT and OLED.Further, the optics ageing parameter of OLED is estimated according to the electricity deterioration data of OLED.But the optics aging effect of OLED also depends on the stress condition in independent pixel, and change between pixel, so accurate compensation can not be guaranteed, unless determined the compensation being suitable for concrete stress level due to stress.
Therefore, for the stress condition on active pixel, need the association of characteristics curve effectively extracting accurate optical parametric and electrical parameter for compensation aging effect and other effect.For the various stress conditions that active pixel may stand at the run duration of display, need that there is various association of characteristics curve.
Summary of the invention
According to an embodiment, provide a kind of system for determining the efficiency degradation based on the organic luminescent device (OLED) in the semiconductor device of array, described semiconductor device has the array of pixel, and described pixel comprises OLED.In the system, at least one stress condition, determine the relation between the change of the electricity operational factor of described OLED and the described efficiency degradation of described OLED; Measure the change of the described electricity operational factor of described OLED; Determine the stress condition of at least one pixel in described semiconductor device or pixel groups; And by using determined relation and determined stress condition, the described efficiency degradation corresponding with the change measured by described electricity operational factor that is described OLED that be that determine described OLED.
In one embodiment, use determined stress condition to select determined relation, for the described efficiency degradation corresponding with the measured change of the described electricity operational factor (such as, OLED voltage) of described OLED determining described OLED.The stress condition of described OLED can be according to the stress history of described OLED (such as, the rolling average of the stress condition that described OLED stands) determine, or to determine according to the speed over time of the described electricity operational factor of described OLED, the speed over time of the described electricity operational factor of described OLED is the function of the stress that described OLED stands.
In view of the detailed description of the various embodiments of carrying out with reference to accompanying drawing, it will be appreciated by one of skill in the art that each aspect of the present invention, wherein will provide the concise and to the point of these accompanying drawings below.
Accompanying drawing explanation
The present invention can be understood best by reference to the explanation carried out by reference to the accompanying drawings below.
Fig. 1 is the block diagram of the displayer system with compensatory control.
Fig. 2 is the circuit diagram of the one in the reference pixel for revising based on measurement data in Fig. 1 of association of characteristics curve.
Fig. 3 is the curve chart of the brightness sent from active pixel, and this curve chart reflects the stress condition that can need the different varying levels in time compensated.
Fig. 4 is the curve chart of different qualities invariance curve and uses predetermined stress condition to determine the curve chart of the result of the technology compensated.
Fig. 5 determines the flow chart with the process of renewing speciality invariance curve based on the reference pixel group under predetermined stress condition.
Fig. 6 uses predetermined association of characteristics curve to compensate the flow chart of the process of the program voltage of the active pixel on display.
Fig. 7 is the correlation curve of the change of OLED efficiency degradation and OLED voltage.
Fig. 8 is the curve chart of OLED stress history and stress intensity.
Fig. 9 A is OLED change in voltage under different stress conditions and the curve chart of time.
Fig. 9 B is OLED voltage changing rate under different stress conditions and the curve chart of time.
Figure 10 is the curve chart of OLED voltage changing rate under different stress conditions and OLED change in voltage.
Figure 11 is the flow chart extracting the process of OLED efficiency degradation according to the change of the OLED parameter of such as OLED voltage and so on.
Although the present invention is vulnerable to various amendment and alternative form, shows specific embodiment by the mode of example in the accompanying drawings and described in detail in this article.But, should be appreciated that the present invention is not intended to be limited to particular forms disclosed.On the contrary, the present invention covers all modifications, equivalent and the replacement scheme that fall in the spirit and scope of the present invention that are defined by the following claims.
Embodiment
Fig. 1 is the electronic display system 100 with active matrix region or pel array 102, in this active matrix region or pel array 102, has the array of active pixel 104 with the deployment arrangements of row and column.For convenience of diagram, illustrate only two row and two row.Be outer peripheral areas 106 in the outside of active matrix region (pel array 102), in outer peripheral areas 106, be furnished with the peripheral circuit in region for driving and control pel array 102.Peripheral circuit comprises grid or address driver circuits 108, source electrode or data driving circuit 110, controller 112 and optional voltage source (such as, EL_Vdd) driver 114.Controller 112 control gate driver 108, source electrode driver 110 and voltage source driver 114.Under the control of controller 112, gate drivers 108 pairs of addresses or selection line SEL [i], SEL [i+1] etc. operate, and there is an address or select line in every a line of the pixel 104 wherein in pel array 102.Share in configuration in following pixel, grid or address driver circuits 108 can also select line GSEL [j] to the overall situation alternatively and right/GSEL [j] operates alternatively, the overall situation selects line GSEL [j] or/GSEL [j] to operate the multiple row (such as, every two row of pixel 104) in the pixel 104 in pel array 102.Under the control of controller 112, source driver circuit 110 pairs of voltage data line Vdata [k], Vdata [k+1] etc. operate, and there is a voltage data line in each row of the pixel 104 wherein in pel array 102.The each pixel of voltage data alignment 104 transports the voltage-programming information of the brightness for representing each luminescent device in pixel 104.Memory element (such as, capacitor) storage voltage programming information in each pixel 104, until luminous or drive cycle unlatching luminescent device.Under the control of controller 112, there is a voltage source line in every a line of the pixel 104 wherein in pel array 102 in optional voltage source driver 114 control voltage source (EL_Vdd) line.Controller 112 is also connected to memory 118, and memory 118 is for storing below by the various association of characteristics curve of the pixel 104 of explanation and ageing parameter.Memory 118 can be the one in flash memory, SRAM, DRAM, their combination and/or other memory or more person.
Display system 100 can also comprise current source circuit, and this current source circuit provides fixed current on current offset line.In some configurations, reference current can be provided to current source circuit.In this kind of configuration, current source control part controls the sequential applying bias current on current offset line.Do not thering is provided in the configuration of reference current to current source circuit, current source address driver controls the sequential applying bias current on current offset line.
It is known that for each pixel 104 in display system 100, need to use the information for the brightness representing the luminescent device in this pixel 104 to come its programming.Frame definition comprises the time period in programming cycle or stage and driving or light period or stage, wherein in programming cycle or during the stage, use for representing that the program voltage of brightness is to each pixel of programming in display system 100, and at driving or light period or during the stage, each luminescent device in each pixel is unlocked with according to the Intensity LEDs corresponding with the program voltage be stored in memory element.Therefore, frame forms in many still images of complete motion picture shown on display system 100.There are at least two kinds for programming and driving the scheme of pixel: line by line or frame by frame.When programming line by line, one-row pixels is programmed, and this row pixel of front wheel driving of then next line pixel being programmed and drive.When programming frame by frame, first the pixel of all row in display system 100 being programmed, and driving all frames line by line.Any one scheme can adopt the of short duration vertical blanking time of not programming to pixel or driving in the beginning of each period or end.
The assembly being arranged in pel array 102 outside can outer peripheral areas 106 around laying out pixel array 102, and outer peripheral areas 106 and pel array 102 are arranged on identical physics substrate.These assemblies comprise gate drivers 108, source electrode driver 110 and optional voltage source control part 114.Alternately, some assemblies in outer peripheral areas can be arranged on the same substrate with pel array 102, and other arrangement of components is on different substrates, or all component in outer peripheral areas can be arranged on different substrates from pel array 102.Gate drivers 108, source electrode driver 110 form display driving circuit together with voltage source control part 114.Display driving circuit in some configuration can comprise gate drivers 108 and source electrode driver 110 but not comprise voltage source control part 114.
Display system 100 also comprises current source and reading circuit 120, current source and reading circuit 120 read from DOL Data Output Line VD [k], VD [k+1] etc. and export data, there is a DOL Data Output Line in each row of the active pixel 104 wherein in pel array 102.Optional parametric device (such as, reference pixel) 130 to be in groups fabricated in outer peripheral areas 106 and to be arranged on the edge being positioned at active pixel 104 outside of pel array 102.Reference pixel 130 can also receive input signal from controller 112, and data-signal can be outputted to current source and reading circuit 120.Reference pixel 130 comprises driving transistors and OLED, but whether for showing a part for the pel array 102 of image.Illustrated by inciting somebody to action below, the reference pixel 130 of different group is in different stress conditions via the different levels of current from current providing circuit 120.Be not a part for pel array 102 due to reference pixel 130 and therefore do not show image, therefore reference pixel 130 can be provided for representing the data of the aging effect under different stress condition.Although illustrate only the reference pixel 130 of a line and row in Fig. 1, should be appreciated that the reference pixel that can there is arbitrary number.Each reference pixel 130 in example illustrated in fig. 1 is manufactured into the optical sensor 132 adjacent to correspondence.Optical sensor 132 is for determining the luminance level sent by the reference pixel 130 of correspondence.Should be appreciated that parametric device (such as, reference pixel 130) can be independently device instead of be fabricated in there is active pixel 104 display on.
Fig. 2 shows an example of the drive circuit 200 for the exemplary reference pixel 130 of in Fig. 1.The drive circuit 200 of reference pixel 130 comprises driving transistors 202, organic luminescent device (OLED) 204, holding capacitor 206, selects transistor 208 and monitor transistor 210.Voltage source 212 is connected to driving transistors 202.As shown in Figure 2, in this example, driving transistors 202 is the thin-film transistors manufactured by amorphous silicon.Select line 214 to be connected to and select transistor 208 to activate drive circuit 200.Program voltage is applied to driving transistors 202 by voltage-programming input line 216.The output of OLED204 and/or driving transistors 202 monitored by monitoring line 218.Select line 214 to be connected to and select transistor 208 and monitor transistor 210.At reading time durations, line 214 is selected to be driven high.Program voltage can be applied via program voltage input line 216.Monitoring voltage can be read from the monitoring line 218 be connected with monitor transistor 210.The signal selecting line 214 can be sent to concurrently with the pixel programming cycle.
Stress can be added with certain levels of current to reference pixel 130 by applying constant voltage to program voltage input line 216.As by described below, export permission within the running time of reference pixel 130 for applied stress condition determination electrology characteristic data based on the reference voltage being applied to program voltage input line 216 from the voltage that monitoring line 218 is measured.Alternately, monitoring line 218 and program voltage input line 216 can merge (that is, Data/Mon) into a line, to perform programming by this single line and to monitor this two kinds of functions.The output of optical sensor 132 allows within the running time of reference pixel 130 for stress condition determination optical characteristics data.
According to an exemplary embodiment, in display system 100 in FIG, based on the aging brightness regulating each pixel (or sub-pixel) of at least one pixel, to keep basic uniform display in working life (such as, the 75000 hours) period of system.The non-limiting example comprising the display device of display system 100 comprises mobile phone, digital camera, personal digital assistant (PDA), computer, television set, portable video player, global positioning system (GPS) etc.
Along with the OLED material of active pixel 104 is aging, increase for keeping the voltage needed for the constant current of the given level in OLED.In order to the electricity compensating OLED is aging, memory 118 store each active pixel for keeping the bucking voltage needed for constant current.It also has the data of association of characteristics curve form for different stress condition storage, controller 112 uses these data to determine bucking voltage, with amendment for driving the program voltage of each OLED of active pixel 104, thus also compensated the aging brightness showing desired output level suitably of optics of OLED thus by the electric current increasing OLED.Especially, memory 118 stores multiple predefined association of characteristics curve or function, the deterioration of the luminance efficiency of the OLED that these predefined association of characteristics curves or function representation run under different predetermined stress conditions.Different predetermined stress conditions generally represents the dissimilar stress that active pixel 104 may suffer at pixel life period or service conditions.Different stress conditions can comprise the mixing of the constant current demand of varying level from low to high, constant luminance demand from low to high or plural stress level.Such as, stress level can be stress level under certain electric current and can be stress level under another electric current in another percentage of time in certain percentage of time.Other stress level can be special (specialized) stress level, such as, for representing on display system 100 level of shown average stream video (averagestreamingvideo).At first, the benchmark electrology characteristic of the parametric device of such as reference pixel 130 and so under different stress condition and baseline optical characteristic are stored in memory 118.In this example, after manufacture parametric device, benchmark electrology characteristic and the baseline optical characteristic of this parametric device is measured immediately from this parametric device.
Each this kind of stress condition can be applied in the following way: keep the constant current in reference pixel 130 in a period of time to reference pixel (such as, reference pixel 130) in groups; Keep the constant luminance of reference pixel 130 in a period of time; And/or the brightness of electric current in reference pixel or reference pixel is changed in a period of time with different predeterminated levels and predetermined space.The electric current produced in reference pixel 130 or luminance level can be such as high level, low value and/or the mean value desired by application-specific of display system 100.Such as, the application of such as computer monitor and so on requires high level.Similarly, in reference pixel, the time period of generation current or luminance level can be depending on the application-specific of display system 100.
Being contemplated that to obtain identical aging effect under each predetermined stress condition, applying different predetermined stress conditions at the run duration of display system 100 to different reference pixels 130.In other words, the first predetermined stress condition is applied to first group of reference pixel, the second predetermined stress condition is applied to second group of reference pixel, etc.In this example, display system 100 has many group reference pixels 130, is added stress under the stress condition that in the scope of the low current value to high current value that are in pixel 16 of these reference pixels are different.Therefore, there is the reference pixel 130 of 16 different groups in this example.Certainly, can adopt the stress condition of greater or lesser quantity, this depends on the factor of desired accuracy, the physical space in outer peripheral areas 106, the amount of available disposal ability and the amount and so on for the memory of storage characteristics invariance curve data such as compensated.
By making reference pixel or reference pixel group stand stress condition continuously, the assembly of reference pixel is aging according to the service conditions of stress condition.When stress condition being applied to reference pixel at the run duration of system 100, the electrology characteristic of measurement and assessment reference pixel and optical characteristics, to obtain data for determining calibration curve, wherein these calibration curves are used for the aging of active pixel 104 in compensated array 102.In this example, for often organizing reference pixel 130, per hourly once measure optical characteristics and electrology characteristic.Therefore, for the measurement characteristics of reference pixel 130, upgrade corresponding association of characteristics curve.Certainly, can carry out these and measure within shorter time period or longer time period, this depends on the accuracy desired by compensation of ageing.
Usually, the brightness of OLED204 has direct linear relationship with the electric current being applied to OLED204.The optical characteristics of OLED can be represented as:
L＝O*I
In this formula, brightness L is the result being multiplied by electric current I based on the coefficient O of the characteristic of OLED.Along with OLED204 is aging, coefficient O reduces, and therefore under constant current value, brightness reduces.Therefore, the brightness of measuring at a given current can be used for for the coefficient O determining specific OLED204 under predetermined stress condition at special time place by the aging characteristic variations caused.
The electrology characteristic measured represents the relation between the voltage being provided to driving transistors 202 and the electric current produced in OLED204 thus.Such as, the thin-film transistor of the monitor transistor 210 in voltage sensor or such as Fig. 2 and so on can be utilized to measure the change of the voltage needed for constant current level for realizing in the OLED of reference pixel.Required voltage generally along with OLED204 and driving transistors 202 aging and increase.Required voltage and output current have power and restrain relation, as shown by the following formula.
I＝k*(V-e) a
In this formula, electric current I is determined by the constant k be multiplied with the result that input voltage V deducts coefficient e, and wherein coefficient e represents the electrology characteristic of driving transistors 202.Therefore, the power that voltage and electric current I have a variable a restrains relation.Along with transistor 202 is aging, coefficient e increases, and thus, needs larger voltage to produce identical electric current.Therefore, the electric current measured from reference pixel may be used for the value of the coefficient e determining specific reference pixel for the stress condition being applied to reference pixel at special time.
As mentioned above, optical characteristics O represents in the brightness of the OLED204 of the reference pixel 130 in the Fig. 2 measured by optical sensor 132 and OLED204 between electric current relation.Measured electrology characteristic e represents the relation between applied voltage and consequent electric current.When stress condition is applied to reference pixel, the optical sensor by the optical sensor 132 in such as Fig. 1 and so on carrys out the change of the brightness of witness mark pixel 130 under constant current level relative to baseline optical characteristic.The change of electrology characteristic relative to benchmark electrology characteristic can be measured, to determine that electric current exports from monitoring line.At the run duration of display system 100, stress condition levels of current is applied to reference pixel 130 continuously.When expecting to measure, remove this stress condition electric current, and activate selection line 214.Apply reference voltage, and obtain consequent luminance level from the output of optical sensor 132, and measure output voltage from monitoring line 218.Thus obtained data and previous optical data and electrical data are compared, to determine for specific stress condition to be exported by the aging electric current caused and the change of brightness output, and upgrades the characteristic of the reference pixel under this stress condition.The performance data through upgrading is used to carry out renewing speciality invariance curve.
Then, by using the electrology characteristic and optical characteristics measured from reference pixel, for the association of characteristics curve (or function) that predetermined stress condition is determined in time.For the given pixel run under this stress condition, association of characteristics curve provide between the aging and optical degradation of the electricity of expection can quantitative relationship.More particularly, each point on association of characteristics curve determines the correlation between the optical characteristics of the OLED of the given pixel under locating this stress condition the preset time of measuring reference pixel 130 and electrology characteristic.Then, for active pixel 104 aging under the stress condition identical with the stress condition being applied to reference pixel 130, controller 112 can use this characteristic to determine suitable bucking voltage.In another example, can periodically from basic OLED measuring basis optical characteristics while the optical characteristics of the OLED of witness mark pixel.Basis OLED is not added stress or is added stress with known and controlled speed.This will eliminate any environmental impact with reference to OLED characteristic.
Due to manufacturing process well known by persons skilled in the art and other factors, each reference pixel 130 of display system 100 may not have uniform characteristic, and this causes different luminescent properties.In a kind of technology, the value of electrology characteristic by being obtained by reference pixel in groups under predetermined stress condition and the value of light characteristic are averaging.The better expression of stress condition on the impact of mean pixel obtains in the following way: add stress condition to reference pixel 130 in groups, and applies average (pollingaveraging) technology of poll to avoid defect, measurement noises and the other problem that may occur during adding stress condition to reference pixel.Such as, improper value (such as, due to the reference pixel of noise or inefficacy and the improper value determined) can be removed by equalization.This technology can have the predetermined luminance level and electrology characteristic that must be satisfied before those values are comprised in equalization.For the reference pixel under given applied stress condition, extra statistical regression technology can also be used to provide less weight to the electrical and optical properties value significantly different from other measured value.
In this example, each stress condition is applied to the reference pixel of different group.The optical characteristics of witness mark pixel and electrology characteristic, and adopt poll averaging and/or statistical regression technology to determine the different qualities invariance curve corresponding with each stress condition.By different association of characteristics profile memory in memory 118.Although this example uses parametric device to determine invariance curve, can according to such as determining invariance curve according to historical data or by the alternate manner of the predetermined mode of manufacturer and so on.
At the run duration of display system 100, the reference pixel 130 often organized can stand respective stress condition, and upgrades by controller 112 and be stored in association of characteristics curve in memory 118 at first to reflect the data from obtaining with the reference pixel 130 that active pixel 104 stands identical external condition.Thus, the association of characteristics curve of each active pixel 104 can be adjusted to the electrology characteristic of reference pixel 130 and the measurement of light characteristic based on the run duration at display system 100.Therefore, the electrology characteristic under each stress condition and light characteristic to be stored in memory 118 and at the run duration of display system 100, it to be upgraded.The storage of data can be piecewise linear model.In this example, this piecewise linear model has 16 coefficients, and these 16 coefficients are updated when the voltage of witness mark pixel 130 and light characteristic.Alternately, can by using linear regression or determining by storing data in the look-up table in memory 118 and upgrade curve.
The association of characteristics curve producing and store under each possibility stress condition is unpractical, this is because will need a large amount of resources (such as, memory storage, disposal ability etc.).Disclosed display system 100 overcomes this restriction by following operation: the dispersion number determining and store the association of characteristics curve under predetermined stress condition, and subsequently by using linear or nonlinear algorithm to combine those predefined association of characteristics curves with the compensating factor of each pixel 104 of the specific service conditions combining display system 100 according to each pixel.As mentioned above, in this example, there is the scope of 16 different predetermined stress conditions, and in memory 118, therefore store 16 different association of characteristics curves.
For each pixel 104, display system 100 analyzes the stress condition being just applied to this pixel 104, and by use algorithm and based on panel pixel predefined association of characteristics curve and measured electricity is aging determines compensating factor.Then, display system 100 provides voltage based on compensating factor to pixel.Therefore, the stress of specific pixel 104 determined by controller 112, and for the adjoint performance data that the stress condition of specific pixel 104 is determined immediate two predetermined stress conditions and obtained from the reference pixel 130 under the stress condition that these are predetermined.Therefore, the stress condition of active pixel 104 drops between low predetermined stress condition and high predetermined stress condition.
For the ease of open, the example of the following linear processes formula for combining association of characteristics curve is described by two this predefined association of characteristics curves; But, should be appreciated that the predefine association of characteristics curve that can utilize other quantity any in the example technique for combined characteristic invariance curve.These two illustrative properties invariance curves comprise the first association of characteristics curve determined for condition of high ground stress and the second association of characteristics curve determined for low-stress.
Use the ability of different qualities invariance curve can provide accurate compensation to the active pixel 104 of the different stress condition of the predetermined stress condition stood from be applied to reference pixel 130 to different levels.Fig. 3 shows the curve chart of the different stress conditions in time of active pixel 104, it illustrates the luminance level sent in time.During first time period, the brightness of active pixel is represented by trace 302, and trace 302 shows brightness at 300 and 500 nit (cd/cm 2) between.Therefore, the stress condition being applied to active pixel during trace 302 is relatively high.In the second time period, the brightness of active pixel is represented by trace 304, and trace 304 shows brightness between 300 and 100 nits.Therefore, the stress condition during trace 304 is lower than the stress condition of first time period, and the aging effect of pixel is during this period different from the aging effect under condition of high ground stress.In the 3rd time period, the brightness of active pixel is represented by trace 306, and trace 306 shows brightness between 100 and 0 nit.Stress condition during this period is lower than the stress condition of the second time period.In the 4th time period, the brightness of active pixel is represented by trace 308, and trace 308 shows returning to the higher stress condition based on the higher brightness between 400 and 500 nits.
For the concrete stress condition of each active pixel 104, the stress condition of the reference pixel 130 of limited quantity and the limited quantity of correspondence can require to use average or (movement) on average continuously.For each pixel, concrete stress condition can be mapped as the linear combination of the association of characteristics curve from multiple reference pixel 130.Two characteristic combinations under predetermined stress condition can compensate accurately to all stress conditions appeared between these stress conditions.Such as, close association of characteristics curve can be determined for the active pixel with the stress condition be between these two reference curves with reference to association of characteristics curves for two under high and low-stress.Controller 112 uses weighted moving average algorithm (weightedmovingaveragealgorithm) to combine and is stored in first and second in memory 118 with reference to association of characteristics curve.Stress condition St (the t that active pixel was located in certain time i) can be represented as:
St(t i)＝(St(t i-1)*k avg+L(t i))/(k avg+1)
In this formula, St (t i-1) be stress condition at previous time place, k avgit is rolling average constant.L (t i) be the measurement brightness that active pixel was located in this certain time, it can be determined by following formula:
L ( t i ) = L p e a k ( g ( t i ) g p e a k ) γ
In this formula, L peakit is the maximum brightness that the design of display system 100 is allowed.Variable g (t i) be measure time gray scale, g peakbe the highest gray value (such as, 255) used, and γ is gamma constant.Use the weighted moving average algorithm of the association of characteristics curve of predetermined height and low-stress can via following formula to determine compensating factor K comp:
K comp＝K highf high(ΔI)+K lowf low(ΔI)
In this formula, f highfirst function corresponding with the association of characteristics curve of high predetermined stress condition, and f lowsecond function corresponding with the association of characteristics curve of low predetermined stress condition.Δ I is the change of the electric current under fixed voltage input in OLED, it illustrates the change (electricity deterioration) caused by aging effect of measuring at special time place.Should be appreciated that the change of electric current can be replaced by the changes delta V of the voltage under fixed current.K highthe weight variable of the association of characteristics curve being assigned to condition of high ground stress, and K lowit is the weight of the association of characteristics curve being assigned to low-stress.Weight variable K can be determined according to following formula highand K low:
K high＝St(t i)/L high
K low＝1-K high
Here, L highthe brightness relevant to condition of high ground stress.
Voltage in the active pixel that any time of run duration is located or the change of electric current represent electrology characteristic, and represent optical characteristics as the curent change of a part for the function of high or low stress condition.In this example, by the brightness under condition of high ground stress, peak brightness and average compensating factor (function of the difference between two association of characteristics curves) K avgbe stored in memory 118, for the compensating factor determining each active pixel.Supplementary variable be stored in memory 118, supplementary variable includes but not limited to the gray value (such as, gray value 255) of the high-high brightness that display system 100 is allowed.In addition, can carry out to determine by rule of thumb mean compensation algorithm factor K according to the data obtained during stress condition is applied to reference pixel avg.
Thus, can adjust the optical degradation of any pixel 104 in display system 100 and electricity aging between relation, to avoid the error relevant from the difference (divergence) of the association of characteristics curve caused by different stress conditions.The quantity of the association of characteristics curve stored can also be minimized to following quantity, and this quantity guarantees that averaging is enough accurate for required compensation level.
Compensating factor K compmay be used for by regulating the program voltage of active pixel to compensate oled light efficiency aging.Another is for determining that for the stress condition on active pixel the technology of suitable compensating factor can be called as dynamic mobile average (dynamicmovingaveraging).Dynamic mobile averaging comprises: change rolling average COEFFICIENT K at the life period of display system 100 avg, to compensate the difference between two association of characteristics curves under different predetermined stress conditions, thus the distortion preventing display from exporting.Along with the OLED of active pixel is aging, the difference between two association of characteristics curves under different stress condition increases.Therefore, K can be increased at the life period of display system 100 avg, with the sharply transition between two curves avoiding having the active pixel of the stress condition dropped between two predetermined stress conditions.Measured curent change Δ I can be used to regulate K avgvalue, to improve the performance of the algorithm for determining compensating factor.
At another for improving in the technology (being called as the rolling average based on event) of the performance of compensation deals, after each ageing step, make system reset.This technology further increases the extraction of the association of characteristics curve of the OLED to each active pixel 104.(or after user opens or closes display system 100) reset display system 100 after each ageing step.In this example, compensating factor K is determined by following formula comp:
K comp＝K comp_evt+K high(f high(ΔI)-f high(ΔI evt))+K low(f low(ΔI)-f low(ΔI evt))
In this formula, K comp_evtthe compensating factor calculated at previous time place, and Δ I evtit is the change at the OLED electric current of previous time durations under fixed voltage.Compensating as other determines technology, and the change of electric current can be replaced by the change of the OLED voltage under fixed current.
Fig. 4 shows the curve chart 400 of the different qualities invariance curve based on different technologies.Curve chart 400 compares the change of the change of optical compensation percentage and the voltage for generation of the OLED of the active pixel needed for given electric current.As shown in curve chart 400, in larger change place for reflecting the voltage that active pixel is aging, heavily stressed predetermined properties invariance curve 402 departs from from low stress predetermined properties invariance curve 404.Point 406 in groups represents by rolling average (movingaveraging) technology and the calibration curve of the current compensation for active pixel determined at different change in voltage places according to predetermined properties invariance curve 402 and 404.Along with the change for reflecting aging voltage increases, the transition of calibration curve 406 has sharply transition between low stress association of characteristics curve 404 and heavily stressed association of characteristics curve 402.Point 408 in groups represents the association of characteristics curve determined by average (dynamicmovingaveraging) technology of dynamic mobile.Point 410 in groups represents the compensating factor by determining based on rolling average (event-basedmovingaveraging) technology of event.Based on OLED characteristic, a kind of technology in above-mentioned technology can be used to improve compensation to OLED efficiency degradation.
As mentioned above, the electrology characteristic of first group of sampled pixel is measured.Such as, the electrology characteristic of each pixel in first group of sampled pixel can be measured by the thin-film transistor (TFT) be connected with each pixel.Alternately, such as, optical characteristics (such as, brightness) can be measured by the optical sensor arranged for each pixel in the sampled pixel of first group.The variable quantity required by brightness that can extract each pixel according to the drift of the voltage of more than one pixel.This can be realized by the series of computation of the correlation between the brightness for determining to be provided to the luminescent material in the voltage of pixel or the drift of electric current and/or this pixel.
Can by the processing apparatus of the processing apparatus or other such devices and so on of the controller 112 in such as Fig. 1 perform above-mentioned for extraction property invariance curve with the aging method of the pixel in compensated array, for computer, the technical staff of software and network field it is understood that, can according to as described in this article and the instruction that illustrates and through the more than one general-purpose computing system of programming, microprocessor, digital signal processor, microcontroller, application-specific integrated circuit (ASIC) (ASIC), programmable logic device (PLD), field programmable logic device (FPLD), field programmable gate array (FPGA) etc. realizes above-mentioned processing apparatus easily.
In addition, plural computing system or device can replace any one in controller described herein.Therefore, as needs, the principle and advantage of the distributed treatment can also realize such as redundancy, copying etc. and so on, to increase robustness and the performance of controller described herein.
The operation of the exemplary characteristic invariance curve for compensating aging method can be performed by machine readable instructions.In these examples, machine readable instructions comprises the algorithm performed by such as lower device: (a) processor, (b) controller and/or (c) other suitable processing apparatus more than one.Algorithm may be implemented as such as flash memories, CD-ROM, floppy disk, hard drive, the software that the tangible medium of digital video (multipurpose) dish (DVD) and so on or other memory device store, but the person skilled in the art will easily understand, whole algorithm and/or its part alternately can perform and/or be implemented as in known manner firmware or specialized hardware (such as by the device except processor, it can by application-specific integrated circuit (ASIC) (ASIC), programmable logic device (PLD), field programmable logic device (FPLD), field programmable gate array (FPGA), discrete logics etc. are implemented).Such as, for compensating any one of the part of the association of characteristics curve of aging method or all can being implemented by software, hardware and/or firmware.In addition, some or all of described machine readable instructions can manually be implemented.
Fig. 5 is for determining the flow chart with the process of the association of characteristics curve of refresh display system (display system 100 such as, in Fig. 1).Select stress condition, to be provided for the sufficient benchmark (500) associated the scope of the stress condition of active pixel.Then, for each stress condition selects one group of reference pixel (502).Then, at each stress condition place, pair reference pixel of each group corresponding with this stress condition adds stress, and the optical characteristics of Memory Reference and electrology characteristic (504).Measure with periodic intervals and record the luminance level (506) of each pixel in each group.Then, light characteristic (508) is determined by being averaging the brightness measured by each pixel in the pixel groups under each stress condition.Determine the electrology characteristic (510) of each pixel in every group.Determine the mean value of each pixel in group, to determine average electrology characteristic (512).Then, the association of characteristics curve (514) under using the average luminous characteristics often organized and average electrology characteristic to upgrade corresponding predetermined stress condition.Once determine and upgrade invariance curve, controller can use the association of characteristics curve through upgrading to compensate the aging effect of the active pixel standing different stress condition.
With reference to figure 6, show use if the suitable predetermined properties invariance curve for display system 100 obtained in process is in Figure 5 to determine the flow chart of the process of the compensating factor of the active pixel at given time place.The brightness (600) that source pixel sends is defined based on maximum brightness and program voltage.The stress condition (602) of specific active pixel is measured based on previous stress condition, determined brightness and the mean compensation algorithm factor.Suitable predetermined stress association of characteristics curve (604) is read from memory.In this example, two association of characteristics curves correspond to predetermined stress condition, and wherein, the measured stress condition of active pixel drops between these predetermined stress conditions.Then, controller 112 changes by using the curtage measured from active pixel and determines coefficient (606) according to each predetermined stress condition.Then, amended coefficient determined by controller, added to the program voltage (608) of active pixel with calculation compensation voltage.Determined stress condition is stored in memory (610).Then, controller 112 stores new compensating factor, and the compensating factor that then can this be adopted new during each frame period after witness mark pixel 130 is to revise the program voltage (612) of active pixel.
OLED efficiency degradation can be calculated based on the correlation curve (correlation curve such as, in Fig. 7) between the change of OLED electricity and efficiency degradation.Here, detect the change of OLED electrical parameter, and use this value to come from the deterioration of curve extraction efficiency.Then, correspondingly pixel current can be regulated, to compensate deterioration.Significant challenge is, correlation curve is the function of stress condition.Therefore, in order to realize compensating more accurately, a kind of needs are exactly the impact considering different stress condition.In one approach, the stress condition of each pixel (pixel groups) is used to select among different correlation curve, to extract suitable loss in efficiency for each concrete situation.Now, by the multiple method for identified sign condition of description.
First, the stress history of each pixel (pixel groups) can be created.Simply, stress history can be the rolling average of stress condition.In order to improve counting accuracy, the stress history of weighting can be used.Here, as in the example that describes in fig. 8, the impact of each stress can have the different weights based on stress intensity or cycle.Such as, in the selection of OLED correlation curve, the impact of low-intensity stress is little.Therefore, there is the curve of little weight under can being used in small intensity, such as, curve in Fig. 8.Sub sampling (sub-sampling) can also be used to carry out calculated stress history, to reduce memory transfer activity (memorytransferactivity).In one case, can suppose that stress history is low frequency in time.In this case, do not need to sample to the pixel condition of every frame.Content-based frame rate (contentframerate) sampling rate of different application can be revised.Here, in each image duration, only select a small amount of pixel to obtain the stress history of renewal.
In another case, can suppose that stress history is spatially low frequency.In this case, do not need to sample to all pixels.Here, use pixel subset to carry out calculated stress history, and interpolation technique then can be used to calculate the stress history of all pixels.
In another case, can the low sampling rate on the assembly time and low sampling rate spatially.
In some cases, the memory needed for stress history and computing module may not be comprised.Here, as illustrated in figures 9a and 9b, the rate of change of OLED electrical parameter can be used to extract stress condition.Fig. 9 A illustrate low, in and Δ V under condition of high ground stress oLEDover time, and 9B shows rate of change under identical stress condition and the correlation of time.
As shown in Figure 10, the rate of change of electrical parameter can be used as the indicating device of stress condition.Such as, as shown in Figure 10, for different stress condition, modeling can be carried out to the electrical parameter rate of change changed based on electrical parameter, or extract by experiment.Rate of change also can be used to extract stress condition based on measured change with comparing of electrical parameter rate of change.Here, the function using change and rate of change into electrical parameter to set up.Alternately, can applied stress condition, correlation curve and measured running parameter.
Figure 11 is the flow chart for compensating the process of OLED efficiency degradation based on the change of OLED electrical parameter and the measurement of rate of change.In this process, in step 1101, extract the change of OLED parameter (such as, OLED voltage), and then calculate the rate of change of OLED parameter in step 1102 based on the value previously extracted.Then, the change of step 1103 operation parameter and rate of change identify stress condition.Finally, step 1104 carrys out computational efficiency deterioration according to stress condition, measured parameter and correlation curve.
Although illustrate and described specific embodiment of the present invention, aspect and application, but be to be understood that, the invention is not restricted to disclosed accurate configuration and layout in this application, and various amendment, change and change can become obvious according to the above description when not departing from the spirit and scope of the present invention as defined by the appended claims.

Claims (7)

1., for determining a method for the efficiency degradation based on the organic luminescent device (OLED) in the semiconductor device of array, described semiconductor device has the array of pixel, and described pixel comprises OLED, and described method comprises:
For at least one stress condition, determine the relation between the change of the electricity operational factor of described OLED and the described efficiency degradation of described OLED;
Measure the change of the described electricity operational factor of described OLED;
Determine the stress condition of at least one pixel in described semiconductor device or pixel groups; And
By using determined relation and determined stress condition, the described efficiency degradation corresponding with the change measured by described electricity operational factor that is described OLED that be that determine described OLED.
2. the method for claim 1, wherein use determined stress condition to select determined relation, for the described efficiency degradation corresponding with the change measured by the described electricity operational factor of described OLED determining described OLED.
3. the method for claim 1, wherein described electricity operational factor is OLED voltage.
4. the method for claim 1, wherein the stress condition of described OLED determines according to the stress history of described OLED.
5. method as claimed in claim 4, wherein, described stress history is the rolling average of the stress condition that described OLED stands.
6. the method for claim 1, wherein, the stress condition of described OLED determines according to the speed over time of the described electricity operational factor of described OLED, and the described speed over time of the described electricity operational factor of described OLED is the function of the stress that described OLED stands.
7., the method for claim 1, wherein for different stress conditions, determine the described relation between the change of the described electricity operational factor of described OLED and the described efficiency degradation of described OLED.
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109841191A (en) * 2017-11-27 2019-06-04 三星显示有限公司 Show equipment
CN110751923A (en) * 2019-11-28 2020-02-04 北京加益科技有限公司 Hybrid aging compensation method and device, electronic equipment and readable storage medium
CN111833783A (en) * 2019-04-18 2020-10-27 天马日本株式会社 Display apparatus and method of controlling the same

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117043839A (en) * 2020-12-16 2023-11-10 华为技术有限公司 Organic light emitting diode compensation using photodiodes
CN114200286A (en) * 2021-11-30 2022-03-18 昆山国显光电有限公司 Performance evaluation method and device for luminescent material of display module

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004025615A1 (en) * 2002-09-16 2004-03-25 Koninklijke Philips Electronics N.V. Display device
US20080024694A1 (en) * 2006-07-25 2008-01-31 Kyocera Corporation Liquid crystal display device
US20080048951A1 (en) * 2006-04-13 2008-02-28 Naugler Walter E Jr Method and apparatus for managing and uniformly maintaining pixel circuitry in a flat panel display
US20090058772A1 (en) * 2007-09-04 2009-03-05 Samsung Electronics Co., Ltd. Organic light emitting display and method for driving the same
CN102741910A (en) * 2010-02-04 2012-10-17 伊格尼斯创新公司 System and methods for extracting correlation curves for an organic light emitting device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104769661B (en) * 2012-11-05 2017-07-18 佛罗里达大学研究基金会有限公司 Luminance compensation in display

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004025615A1 (en) * 2002-09-16 2004-03-25 Koninklijke Philips Electronics N.V. Display device
US20080048951A1 (en) * 2006-04-13 2008-02-28 Naugler Walter E Jr Method and apparatus for managing and uniformly maintaining pixel circuitry in a flat panel display
US20080024694A1 (en) * 2006-07-25 2008-01-31 Kyocera Corporation Liquid crystal display device
US20090058772A1 (en) * 2007-09-04 2009-03-05 Samsung Electronics Co., Ltd. Organic light emitting display and method for driving the same
CN102741910A (en) * 2010-02-04 2012-10-17 伊格尼斯创新公司 System and methods for extracting correlation curves for an organic light emitting device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109841191A (en) * 2017-11-27 2019-06-04 三星显示有限公司 Show equipment
CN111833783A (en) * 2019-04-18 2020-10-27 天马日本株式会社 Display apparatus and method of controlling the same
CN110751923A (en) * 2019-11-28 2020-02-04 北京加益科技有限公司 Hybrid aging compensation method and device, electronic equipment and readable storage medium

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