CN105067629B - A kind of chromatic circle resistance open defect and resistance value integrated testing method - Google Patents
A kind of chromatic circle resistance open defect and resistance value integrated testing method Download PDFInfo
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- CN105067629B CN105067629B CN201510441604.4A CN201510441604A CN105067629B CN 105067629 B CN105067629 B CN 105067629B CN 201510441604 A CN201510441604 A CN 201510441604A CN 105067629 B CN105067629 B CN 105067629B
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Abstract
The present invention discloses a kind of chromatic circle resistance open defect and resistance value integrated testing method, one, chromatic circle resistance transport mechanism is entered by cutting agency, rolling mechanism on the move rolls the axial lead at chromatic circle resistance both ends to coaxial with chromatic circle resistance barred body；2nd, when chromatic circle resistance reaches rotating mechanism, the clamping device of rotating mechanism clamps axial lead and then at the uniform velocity rotates, and measures chromatic circle resistance resistance value simultaneously in clamping and triggers the sensor of camera, the resistance value measured is transferred to computer；3rd, camera acquires picture while chromatic circle resistance at the uniform velocity rotates；4th, the picture of acquisition is passed to computer and carries out image procossing, then identifies open defect type using open defect recognizer；5th, the comprehensive detection result of open defect type and resistance value is passed into rejecting mechanism, rejecting mechanism performs command adapted thereto, realizes the integrated detection of chromatic circle resistance open defect and resistance value.The present invention, which measures resistance value, detects integrated, the efficiency of raising chromatic circle resistance detection with open defect.
Description
Technical field
The present invention relates to the technical fields of chromatic circle resistance detection, and in particular to a kind of chromatic circle resistance open defect and resistance value collection
Into detection method.
Background technology
Chromatic circle resistance may be caused in lacquering process due to the concentration of paint, enamelling process and baking temperature etc.
The defects of resistive surface colour circle, such as the defects of abscission ring, missing link and ring.The defects of resistive surface colour circle, is in assembling and quality inspection
Accurately identifying for resistance value can be influenced in the process, so as to influence the performance of the replacement of parts and product.Resistance value size detection is electricity
The necessary links of product testing are hindered, resistance size requirements are controlled within the scope of resistance accuracy.It is tight for quality requirement
The high-precision chromatic circle resistance of lattice, it is desirable that appearance detection and resistance value detection are carried out one by one, so as to ensure the quality of product.Electronics at present
Manufacturing enterprise is still generally detected using traditional manual method, and checkability and precision be not high, occupies a large amount of labours,
As the bottleneck of production.In addition, existing detection product is detected mainly for resistance value or open defect at present, can not
The detection method of open defect and resistance value is detected simultaneously, therefore studies chromatic circle resistance open defect and resistance value integrated testing method very
It is necessary to.
Typical appearance automatic checkout system is usually by light source module, image capture module, image digitazation module, number
Image processing module, intelligent decision decision-making module and mechanical execution module composition, as shown in Figure 1.Appearance automatic checkout system is led to
It crosses CCD industrial cameras and target object is converted into picture signal, be then converted into digitized signal and send at dedicated image
Reason system according to information such as pixel distribution, brightness and colors, carries out various operations to extract target signature, according to preset appearance
Xu Du and other conditions output judging result, it is last to reject defective work according to judging result control machinery equipment.
The clear accurately image of acquisition and design open defect recognizer are the key technologies of open defect detecting system.
Chromatic circle resistance belongs to slender type class cylinder, in order to obtain clear accurately image in addition to the choosing of ccd image sensor, camera lens
Type, the design of light-source system, it is important that how complete with image by steadily rolling for set of device guarantee metalfilmresistor
Whole acquisition.Open defect recognizer then needs to meet high efficiency, high-accuracy, and can be only achieved that production line detects in real time will
It asks.
There are mainly two types of the methods detected on production line to class cylindrical appearance.Method one, as shown in Fig. 2, class cylinder
Roll down from small slope, then roll in the plane, respectively the starting point of plane, 1/3rd of cylinder perimeter and three/
CCD camera at two is installed, acquires complete image.Method two as shown in figure 3, by using multiple cameras, generally at least uses
Three cameras form all-dimensional multi-angle system and obtain image；Method one is suitable for the class cylinder being relatively large in diameter, because of diameter
Larger class cylinder during downslide can held stationary without tilt.Method two needs multiple CCD cameras, into
This is higher, and depth of field control is complex, higher to later image processing requirement, be also not suitable for this kind of diameter of metalfilmresistor compared with
Small class cylinder Image Acquisition.
Invention content
In view of this, the present invention provides a kind of chromatic circle resistance open defect and resistance value integrated testing methods, can be by color
Loop resistance resistance value measures, the efficiency of raising chromatic circle resistance detection integrated with open defect detection.
Realize that technical scheme is as follows：
A kind of chromatic circle resistance open defect and resistance value integrated testing method, include the following steps：
Step 1: chromatic circle resistance enters transport mechanism by the cutting agency of integrated detecting device, transport mechanism drives color
Loop resistance moves, and chromatic circle resistance reaches rotating mechanism after rolling mechanism during movement, and rolling mechanism is electric by colour circle
The axial lead at resistance both ends is rolled to coaxial with chromatic circle resistance barred body；
Step 2: when chromatic circle resistance reaches rotating mechanism, the clamping device of rotating mechanism clamps the axial direction of chromatic circle resistance
Then lead at the uniform velocity rotates, the clamping device of the rotating mechanism is connect with the interface of resistance value measuring instrument, is clamping axial lead
While measure chromatic circle resistance resistance value and trigger the sensor of camera, the resistance value that resistance value measuring instrument measures is transferred to computer；
Step 3: camera acquires picture while chromatic circle resistance starts at the uniform velocity to rotate, camera is at one of chromatic circle resistance
N pictures are acquired to constant duration in swing circle；
Step 4: collected picture, which is passed to computer, carries out image procossing, described image processing includes pretreatment and threshold
Value segmentation；Picture after image procossing is utilized into the open defect type of open defect recognizer identification chromatic circle resistance；
Step 5: the open defect type in computer and the comprehensive detection result of resistance value are passed into rejecting mechanism, if
Disqualified upon inspection, rejecting mechanism make the chromatic circle resistance enter defective work region, if examining qualification, the chromatic circle resistance is with transmission
Mechanism enters certified products region, so as to fulfill the integrated detection of chromatic circle resistance open defect and resistance value.
Further, the pretreatment is to improve picture contrast using histogram equalization, and medium filtering is recycled to go
Except the noise in image.
Further, the Threshold segmentation be according to Image Acquisition scene the suitable segmentation threshold of light environment selection into
Row threshold division forms binary map, and the colour circle mark of chromatic circle resistance is white in binary map, and background is black, reuses intermediate value
The part noise that Threshold segmentation leaves is eliminated in filtering.
Further, the open defect recognizer described in step 4 is：Each pixel gray value of binary map is obtained first,
It is represented with G [m] [n], wherein, m represents the line number of pixel, and n represents the columns of pixel, progressively scans the gray scale of each pixel
It is worth and carries out logic judgment, as G [a] [b+1]-G [a] [b]>0, then it represents that occur for the first time in a row b+1 row position
White pixel point (a, b+1) continues to progressively scan after occurring white pixel point for the first time；When occurring G [c] [d+1]-G again
[c][d]>When 0, judge between the row between the white pixel point (a, b+1) and the current white pixel (c, d+1) that occur for the first time
Away from (b-d), wherein, a<C, if (b-d) represents a left side for colour circle with current white pixel (c, d+1) more than certain threshold value
Otherwise upper angle represents the upper left corner of colour circle with the white pixel point (a, b+1) occurred for the first time；With the top left corner pixel point of colour circle
Based on deviate several pixels to the left downwards and obtain the upper left angle point of detection zone；It is cut according to the upper left angle point of detection zone
Take detection zone；
It introduces number of contours Nc and each row pixel black and white change frequency P two indices examines the detection zone intercepted
It surveys, judges chromatic circle resistance abscission ring and three kinds of ring, missing link open defects；Compared with the colour circle of the chromatic circle resistance of no open defect, when
Nc values increase, and when P values reduce, then abscission ring occur；When Nc values reduce, and P increases, then there is simultaneously ring；When Nc values reduce, P values subtract
Hour, then there is missing link.
Advantageous effect：
1st, the present invention realizes that resistance value measures by the interface contact of chromatic circle resistance axial lead and resistance value measuring instrument, by colour circle
Resistance is measured to be integrated with open defect detection, is realized the automatic detection of chromatic circle resistance open defect and resistance value, is improved color
The efficiency of loop resistance detection.
2nd, image capturing system of the present invention realizes that image is complete only with single industrial camera by way of rotating resistance
Accurately acquisition, it is simple and practical in structure, reduce testing cost.
3rd, the open defect detection algorithm in the present invention is simple and reliable based on the gray value of pixel, for colour circle
The detection of resistance appearance, quality management and analysis have important meaning.
Description of the drawings
Fig. 1 typical appearance automatic detecting structure figures.
Fig. 2 cylindrical rollers surface image acquires schematic diagram.
Fig. 3 heat eye Image Acquisition schematic diagrames.
Fig. 4 RJ25 types metal film fixed resister schematic diagrames of the present invention.
Fig. 5 open defects of the present invention and resistance value integrated testing method flow chart.
Fig. 6 integrated detecting device schematic diagrames of the present invention.
The partial enlarged view of Fig. 7 integrated detecting devices of the present invention.
Fig. 8 (a) rotating mechanism partial front elevation views of the present invention.
Fig. 8 (b) rotating mechanism partial left side views of the present invention.
The front view of Fig. 9 (a) rolling rollers of the present invention.
The left view of Fig. 9 (b) rolling rollers of the present invention.
The front view of Figure 10 (a) support board structures of the present invention.
The vertical view of Figure 10 (b) support board structures of the present invention.
The front view of chain structure of Figure 11 (a) present invention with baffle.
The left view of chain structure of Figure 11 (b) present invention with baffle.
Wherein, chains of the 1- with baffle, 2- rolling rollers, 3- resistors, 4- reflective photoelectric sensors, 5- cameras, 6-
Turntable, 7- supporting plates, 8- stepper motors, 9- sprocket wheels, 10- relays, 11- resistance value measuring instrument interfaces.
Specific embodiment
The present invention will now be described in detail with reference to the accompanying drawings and examples.
As shown in figure 4, the present invention provides a kind of chromatic circle resistance open defect and resistance value integrated testing methods；Here with
The method for integrating detection to chromatic circle resistance open defect and resistance value for RJ25 type metal film fixed resisters illustrates.Such as
Shown in Fig. 5, RJ25 type metal film fixed resisters are mainly made of the barred body of the axial lead at both ends and interlude, outside barred body
Colour circle mark is coated on periphery.The method of the present invention can both measure the resistance of RJ25 type metal film resistors by axial lead
Value, can also pass through the open defect of colour circle Mark Detection RJ25 type metal film resistors.
Step 1: chromatic circle resistance enters transport mechanism by the cutting agency of integrated detecting device, transport mechanism drives color
Loop resistance moves, and chromatic circle resistance reaches rotating mechanism after rolling mechanism during movement, and rolling mechanism is electric by colour circle
The axial lead at resistance both ends is rolled to coaxial with chromatic circle resistance barred body.
In the present embodiment, which is implemented as follows：
RJ25 type metal films fixed resister 3 enters the chain 1 with baffle, institute by the cutting agency of integrated detecting device
It is the chain with baffle that transport mechanism, which is stated, in the present embodiment, and as can be seen from FIG. 6, the chain 1 with baffle drives RJ25 type metals
Film fixed resister 3 is at rolling roller 2, and the rolling mechanism is rolling roller 2 in the present embodiment, and RJ25 type metal films are consolidated
Resistor 3 is determined after rolling, and the axial lead at both ends will be coaxial with 3 barred body of resistor by straightening.The main function of this step
It is to ensure that resistor 3 does not generate circular runout in the rotation in later stage, so that it is guaranteed that the quality of acquisition image.
Fig. 6 is integrated detecting device vertical view used in the present embodiment, and Fig. 7 is the partial elevational elevation view of the device.
It is the front view and left view of the chain 1 with baffle, since 3 interlude of resistor is circle as shown in Figure 11 (a) and Figure 11 (b)
Cylindricality is easily rolled with the movement of chain, and barrier partitions open each resistor 3, and each resistor 3 is limited adjacent
Two baffles between, ensure resistor 3 will not occur with chain roll and it is crooked.As shown in Fig. 9 (a) and Fig. 9 (b),
Front view and left view for rolling roller 2.
Step 2: when chromatic circle resistance reaches rotating mechanism, the clamping device of rotating mechanism clamps the axial direction of chromatic circle resistance
Then lead at the uniform velocity rotates, the clamping device of the rotating mechanism is connect with the interface of resistance value measuring instrument, is clamping axial lead
While measure chromatic circle resistance resistance value and trigger the sensor of camera 5, the resistance value that resistance value measuring instrument measures is transferred to computer.
At the time of for judging that chromatic circle resistance reaches rotating mechanism, ensureing the clamping device of rotating mechanism can accurately press from both sides
Tight chromatic circle resistance is realized in the following manner in embodiment：
In the present embodiment, rotating mechanism includes reflective photoelectric sensor 4, relay 10, supporting plate 7 and turntable 6.
After rolling, RJ25 type metal films fixed resister 3 continues to move along, and when reaching designated position, will trigger
Electric signal is transmitted to whirler by the reflective photoelectric sensor 4 on the chain 1 with baffle, reflective photoelectric sensor 4
Relay 10 in structure.
When relay 10 receives the electric signal of reflective photoelectric sensor 4, arrived and turned according to reflective photoelectric sensor 4
The distance of the card slot of disk 6 and the movement speed of chain 1 set the delay time of relay 10 so that when resistor 3 is moved to support
On plate 7 and its axial lead is in 6 card slot of turntable, i.e., the rotation center position directly below of turntable 6 when, relay 10 is closed,
It lifts card slot to move up, so as to lift the rotation center position that resistor 3 is moved upward to turntable 6.
Such as Figure 10 (a) and the structure diagram that (b) is supporting plate 7, supporting plate 7 is the height in order to increase resistor 3, is prevented
When relay 10 lifts resistor 3, movement vertically and horizontally is so that the axial lead of resistor 3 is hindered by baffle
It keeps off and deforms.
If Fig. 8 (a) and Fig. 8 (b) show the partial enlarged view of rotating mechanism, 6 center of card slot and turntable of turntable 6 it is convex
Platform coordinates limiting to clamp the axial lead of resistor 3 and then at the uniform velocity rotate jointly, the portion that the card slot of turntable 6 is contacted with axial lead
Divide and resistor 3 using circular-arc-shaped design, is avoided to generate the axial lead that displacement damages resistor 3 simultaneously.The center of turntable
Boss is connect with resistance value measuring instrument interface 11, and 3 resistance value of measuring resistor and camera is triggered while axial lead is clamped
Sensor, the resistance value that resistance value measuring instrument measures are transferred to computer；
Step 3: camera acquires picture while chromatic circle resistance starts at the uniform velocity to rotate, camera is at one of chromatic circle resistance
N pictures are acquired to constant duration in swing circle；
Camera 5 acquires picture while resistor 3 starts at the uniform velocity to rotate, and camera 5 is in a swing circle of resistor 3
Acquire 3 pictures to interior constant duration；After completing Image Acquisition, relay 10 is powered off and is moved down, and resistor 3 returns to support
It is continued to move along on plate 7 and by the drive of chain 1 with baffle.
Step 4: collected picture, which is passed to computer, carries out image procossing, described image processing includes pretreatment and threshold
Value segmentation；Picture after image procossing is utilized into the open defect type of open defect recognizer identification chromatic circle resistance；
The pretreatment is to improve picture contrast using histogram equalization, is recycled in medium filtering removal image
Noise.
The Threshold segmentation is the suitable segmentation threshold progress threshold value point of light environment selection according to Image Acquisition scene
It cuts to form binary map, resistor colour circle mark is white in binary map, and background is black, reuses medium filtering and eliminates threshold value
Divide the part noise left.
The open defect recognizer is：Each pixel gray value of binary map is obtained first, is represented with G [m] [n],
In, m represents the line number of pixel, and n represents the columns of pixel, progressively scans the gray value of each pixel and carry out logic and sentence
It is disconnected, as G [a] [b+1]-G [a] [b]>0, then it represents that white pixel point (a, b occur for the first time in a row b+1 row position
+ 1), continue to progressively scan after occurring white pixel point for the first time；When occurring G [c] [d+1]-G [c] [d] again>When 0, judge
Column pitch (b-d) between the white pixel point (a, b+1) occurred for the first time and current white pixel (c, d+1), wherein, a<
C, if (b-d) represents the upper left corner of colour circle with current white pixel (c, d+1), otherwise with first more than certain threshold value
The white pixel point (a, b+1) of secondary appearance represents the upper left corner of colour circle；Based on the top left corner pixel point of colour circle downwards to the left
It deviates several pixels and obtains the upper left angle point of detection zone；Detection zone is intercepted according to the upper left angle point of detection zone.
It introduces number of contours Nc and each row pixel black and white change frequency P two indices examines the detection zone intercepted
It surveys, judges chromatic circle resistance abscission ring and three kinds of ring, missing link open defects；Abscission ring refers to breakthrough at least occurring there are a colour circle
Mouthful, and ring refers to by irregular colour circle paint be connected there are adjacent two colour circle, missing link refers at least lack a colour circle.This reality
Apply chromatic circle resistance Nc=5, P=10 without open defect in example；When Nc values increase, and P values reduce, then there is abscission ring；When Nc values
Reduce, when P increases, then simultaneously ring occur；When Nc values reduce, and P values reduce, then there is missing link.
Step 5: the open defect type in computer and the comprehensive detection result of resistance value are passed into rejecting mechanism, if
Disqualified upon inspection, rejecting mechanism make the chromatic circle resistance enter defective work region, if examining qualification, the chromatic circle resistance is with transmission
Mechanism enters certified products region, so as to fulfill the integrated detection of chromatic circle resistance open defect and resistance value.
In conclusion the foregoing is merely a prefered embodiment of the invention, it is not intended to limit the scope of the present invention.
All within the spirits and principles of the present invention, any modification, equivalent replacement, improvement and so on should be included in the present invention's
Within protection domain.
Claims (4)
1. a kind of chromatic circle resistance open defect and resistance value integrated testing method, which is characterized in that include the following steps：
Step 1: chromatic circle resistance enters transport mechanism by the cutting agency of integrated detecting device, transport mechanism drives colour circle electricity
Resistance movement, chromatic circle resistance reaches rotating mechanism after rolling mechanism during movement, and rolling mechanism is by chromatic circle resistance two
The axial lead at end is rolled to coaxial with chromatic circle resistance barred body；
Step 2: when chromatic circle resistance reaches rotating mechanism, the clamping device of rotating mechanism clamps the axial lead of chromatic circle resistance
Then it at the uniform velocity rotates, the clamping device of the rotating mechanism is connect with the interface of resistance value measuring instrument, is clamping the same of axial lead
When measure chromatic circle resistance resistance value and trigger the sensor of camera, the resistance value that resistance value measuring instrument measures is transferred to computer；
Step 3: camera acquires picture while chromatic circle resistance starts at the uniform velocity to rotate, camera is in a rotation of chromatic circle resistance
N pictures are acquired to constant duration in period；
Step 4: collected picture, which is passed to computer, carries out image procossing, described image processing includes pretreatment and threshold value point
It cuts；Picture after image procossing is utilized into the open defect type of open defect recognizer identification chromatic circle resistance；
Step 5: the open defect type in computer and the comprehensive detection result of resistance value are passed into rejecting mechanism, if examining
Unqualified, rejecting mechanism makes the chromatic circle resistance enter defective work region, if examining qualification, the chromatic circle resistance is with transport mechanism
Into certified products region, so as to fulfill the integrated detection of chromatic circle resistance open defect and resistance value.
2. a kind of chromatic circle resistance open defect as described in claim 1 and resistance value integrated testing method, which is characterized in that described
It pre-processes to improve picture contrast using histogram equalization, recycles the noise in medium filtering removal image.
3. a kind of chromatic circle resistance open defect as described in claim 1 and resistance value integrated testing method, which is characterized in that described
Threshold segmentation is that the light environment at foundation Image Acquisition scene selects suitable segmentation threshold to form binary map into row threshold division,
The colour circle mark of chromatic circle resistance is white in binary map, and background is black, reuses medium filtering elimination Threshold segmentation and leaves
Part noise.
4. a kind of chromatic circle resistance open defect as described in claim 1 and resistance value integrated testing method, which is characterized in that step
Open defect recognizer described in four is：Each pixel gray value of binary map is obtained first, is represented with G [m] [n], wherein, m
Represent the line number of pixel, n represents the columns of pixel, progressively scans the gray value of each pixel and carry out logic judgment, work as G
[a][b+1]-G[a][b]>0, then it represents that there is white pixel point (a, b+1) for the first time in a row b+1 row position,
Continue to progressively scan after there is white pixel point for the first time；When occurring G [c] [d+1]-G [c] [d] again>When 0, judge for the first time
Column pitch (b-d) between the white pixel point (a, b+1) of appearance and current white pixel (c, d+1), wherein, a<C, if
(b-d) more than certain threshold value, then the upper left corner of colour circle is represented with current white pixel (c, d+1), otherwise to go out for the first time
Existing white pixel point (a, b+1) represents the upper left corner of colour circle；It is deviated to the left downwards based on the top left corner pixel point of colour circle
Several pixels obtain the upper left angle point of detection zone；Detection zone is intercepted according to the upper left angle point of detection zone.
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| CN106529572B (en) * | 2016-10-14 | 2019-07-09 | 广州视源电子科技股份有限公司 | Detection method, device and the automatic optical detecting system of chromatic circle resistance |
| CN109118433B (en) * | 2017-06-22 | 2022-03-29 | 南京理工大学 | Color ring resistance color code identification method |
| CN110376206A (en) * | 2019-07-09 | 2019-10-25 | 湖南晗光智能科技股份有限公司 | A kind of the lead vision detection system and detection method of fireworks |
| CN111915607A (en) * | 2020-08-31 | 2020-11-10 | 佛山市南海区广工大数控装备协同创新研究院 | Metal film resistor surface strip defect detection method based on machine vision |
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| JP2012040466A (en) * | 2010-08-13 | 2012-03-01 | Camtek Ltd | System and method of imaging two or more objective side surfaces |
| CN102735967B (en) * | 2012-06-13 | 2014-12-24 | 苏州慧捷自动化科技有限公司 | Comprehensive tester for electrical performance of electronic element |
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