CN105027038A - Tail effect correction for slim pattern touch panels - Google Patents

Abstract

Techniques for correcting tail effect are described herein. In an example embodiment, a device comprises a sensor coupled with a processing logic. The sensor is configured to measure a plurality of measurements from a sensor array, wherein the measurements are representative of a conductive object that is in contact with or proximate to the sensor array. The sensor array comprises RX electrodes and TX electrodes that are interleaved without intersecting each other in a single layer on a substrate of the sensor array. The processing logic is configured to determine a set of adjustment values that correspond to a tail effect associated with the measurements, and to generate adjusted measurements based on the set of adjustment values, wherein the adjusted measurements correct a parasitic signal change of the tail effect.

Description

Tail effect for SLIM type touch panel corrects

Right of priority

This application claims the submit on March 14th, 2013 the 61/785th, the right of priority of No. 131 U.S. Provisional Patent Application and rights and interests, the full content of this temporary patent application is incorporated to herein by reference; The application is the submit on March 13rd, 2013 the 13/800th, the part continuity application of No. 468 U.S. Patent applications, the 61/754th of this patent application hereby claims submission on January 18th, 2013, the right of priority of No. 028 U.S. Provisional Patent Application and rights and interests, these two applications are incorporated to herein all by reference; Submit in the application or on February 24th, 2012 the 13/405th, the part continuity application of No. 071 U.S. Patent application, the 61/559th of this patent application hereby claims submission on November 14th, 2011, submit in the right of priority of No. 590 U.S. Provisional Patent Application and rights and interests and on February 24th, 2011 the 61/446th, the right of priority of No. 178 U.S. Provisional Patent Application and rights and interests, all these patented claims are incorporated to herein all by reference.

Technical field

The disclosure relates generally to the field of touch sensor apparatus, and particularly relates to the process of touch sensor data.

Background

Calculation element (such as notebook, personal digital assistant, mobile communications device, portable entertainment device (such as, handheld video games device, multimedia player etc.) and Set Top Box is (such as, digital cable case, digital video disc (DVD) player etc.)) can comprise and be convenient to user interface device interactive between user and this calculation element.Become the touch input device that a common class user interface device is touch sensor apparatus or operates by capacitive sensing.Touch sensor apparatus may be implemented as touch-screen, touch sensor pad, touch sensor slide block or touch sensor button, and can comprise the touch sensor with capacitive sensor element array.Capacitive induction generally includes scan operation, and the capacitance variations that this operation periodic measurement is associated with capacitive sensor element is to determine that electric conductor (such as, nib, user's finger etc.) is relative to the existence of touch sensor, position and/or motion.

Touch sensor is the expensive components of touch sensor apparatus or its user interface system.A reason of the high manufacturing cost of touch sensor is that conventional sensors is used in the multi-layered electrode material that multilager base plate or single layer substrate are formed, form electrical connection between single electrode segmentation with a series of " wire jumper " and by they with and their other electrode isolation of intersecting.A kind of mode of high cost reducing touch sensor be on the effective coverage of single layer substrate wiring abut against each electrode together trace parts (or segmentation) and without the need to using " wire jumper ".But, such sensor arrangement causes the capacitive cross increased between each electrode to be coupled (such as, especially touch in response to electric conductor), thus causing the touch of mistake, the inaccurate and poor touch-responsive linearity, all these limit the function of touch sensor apparatus and/or cause the Consumer's Experience of difference.

Accompanying drawing explanation

Fig. 1 is the block diagram of the embodiment that the example electronic system comprising touch sensor assemblies is shown.

Fig. 2 is the block diagram of the embodiment of the exemplary sensors system that process touch sensor data is shown.

Fig. 3 A illustrates the simplified plan view of touch sensor apparatus according to example embodiment.

Fig. 3 B illustrates the viewgraph of cross-section of touch sensor apparatus in figure 3 a.

Fig. 3 C illustrates a part for touch sensor according to example embodiment.

Fig. 4 A, 4B, 4C, 4D and 4E illustrate the alternative pattern of the sensor electrode on single layer substrate according to each embodiment.

Fig. 5 illustrates the spur signal in a part for the touch sensor panel being coupling in the SLIM electrode pattern with individual layer according to example embodiment.

Fig. 6 illustrates two wiring touch sensor panels with SLIM electrode pattern according to example embodiment.

Fig. 7 A and 7B illustrates two Example data structure storing the signal value reflecting the tail effect caused by the electric conductor on every face of two wiring touch sensor panel according to example embodiment.

Fig. 8 is the curve map of the example that the tail effect illustrated on two wiring touch sensor panel according to example embodiment corrects.

Fig. 9 is the curve map illustrated about the two wiring tail effect signal of touch sensor panel according to the example embodiment of Fig. 8 and the comparison of correction signal.

Figure 10 A illustrates the data structure of the signal value of the tail effect that the reflection measured by storage is caused by the electric conductor on two wiring touch sensor panel according to example embodiment.

Figure 10 B illustrates the data structure of the signal value stored through adjusting about the correction of the tail effect shown in Figure 10 A.

Figure 11 illustrates the method for correcting tail effect according to example embodiment.

Figure 12 illustrates the exemplary method of the signal value for adjusting tail effect according to some embodiment (such as, all example embodiment as shown in fig. 11).

Figure 13 illustrates by some embodiment of the contact of large electric conductor (such as, such as fat finger) the exemplary method correcting tail effect according to illustrating.

Embodiment

A lot of detail is set forth in following description, the example that such as concrete system, assembly, method etc. are like this, to provide the good understanding of each embodiment of the technology for correcting the tail effect in single-layer touch sensor (such as, such as there is the touch sensor of SLIM electrode pattern) as herein described.But, at least some embodiment can be put into practice when not having these details, and this is obvious for a person skilled in the art.In other instances, well-known assembly or method are not described in detail or are presented with simple block diagram form, to avoid unnecessary fuzzy the techniques described herein.Therefore, the detail hereinafter set forth is only exemplary.Particular implementation can be different from these exemplary details, and still expects within the spirit and scope of the present invention.

" embodiment (an embodiment) ", " embodiment (oneembodiment) ", " example embodiment (an example embodiment) ", " some embodiment (someembodiments) " and " each embodiment (various embodiments) " that quote in the description refers to the special characteristic, structure or the characteristic that combine the embodiment description comprised at least one embodiment of the present invention.In addition, difference place in the description occurs each phrase " embodiment ", " embodiment ", " example embodiment ", " some embodiment " and " each embodiment " not necessarily all refer to identical embodiment.

This instructions comprises quoting accompanying drawing, and accompanying drawing forms the part described in detail.Accompanying drawing illustrates the illustration according to exemplary embodiment.It is enough detailed that these embodiments (herein, also can be described as " example ") are described, to enable those skilled in the art to the embodiment putting into practice claimed theme described herein.Each embodiment can be combined, other embodiments can be utilized, maybe can make structure, logic and electrically change, and not departing from scope and the essence of claimed theme.Be to be understood that embodiment as herein described is not intended to limit the scope of this theme, and be intended to those skilled in the art can be put into practice, make and/or use this theme.

General introduction

As herein described is each embodiment of technology for correcting the tail effect in touch sensor, this touch sensor has sender electrode (TX) in the identical layer (such as, individual layer) of the substrate being disposed in this touch sensor and receiving electrode (RX).Unless explicitly stated otherwise, otherwise " touch sensor " is also called as " sensor array ", " touch sensor array ", " touch panel ", " touch sensor panel " etc. herein.

As used herein, " contact " refers to that electric conductor on the touch-surface of touch sensor (such as, the finger etc. of nib, user) physical contact, and/or refer to wherein electric conductor fully close to the hovering not having the touch-surface of physical contact sensor with the sensor element affecting touch sensor.As used herein, " sensor element " refers to the discrete unit of electrode or lane place (such as, adjacent), in this discrete unit or lane place, can obtain and be independently and the measurement result different from the measurement result/signal obtained from other unit in this touch sensor or positioning area or signal.

Do not use in the single-layer touch sensor of " wire jumper " at use staggered electrode, electric conductor can affect each several part (also referred to as " segmentation ") of multiple electrode, thus cause even not direct under conductive body contact and should not indicate or otherwise detect the change of each electrode capacitance of contact.Spur signal is caused to increase or spur signal minimizing (such as, depending on the type of the induction mechanism that touch sensor uses) by this type of spur signal outside the coupling actual touch sensor region of Contact Effect.The increase of this type of spur signal in one or more sensor elements of touch sensor or reduce is called as herein " tail effect ".

In an example embodiment, device comprises the sensor be coupled with processing logic.Sensor is configured the multiple measurement results measured during scan operation from sensor array, and wherein, the plurality of measurement result represents conductive body contact or close to this sensor array.Sensor array comprises multiple RX electrode and multiple TX electrode, wherein, interlaced with each other and do not intersect in multiple RX electrode and the individual layer of multiple TX electrode on the substrate of sensor array.Processing logic is configured the set determining the adjusted value corresponding to the tail effect be associated with multiple measurement result, and the set based on this adjusted value generates the measurement result after the adjustment corresponding to multiple measurement result, wherein, the measurement result after this adjustment corrects the spur signal change of tail effect.Some aspect in this embodiment, tail effect comprises the spur signal that caused by the intercoupling between the principal trace line of the RX electrode affected by electric conductor and TX electrode to be increased or spur signal reduces, wherein, the contiguous TX electrode wiring of principal trace line of RX electrode.The principal trace line of RX electrode and the forming section of RX electrode are disposed in the touching induction region of sensor array, but the forming section of RX electrode does not affect by electric conductor.

In another example embodiment, method for correcting tail effect comprises step: receive the multiple measurement results measured from sensor array, wherein, the plurality of measurement result represents that electric conductor is contacting with sensor array or close, and interlaced with each other and the multiple RX electrode do not intersected and multiple TX electrode in the individual layer that wherein, this sensor array is included on the substrate of sensor array; The set of the adjusted value corresponding to the tail effect be associated with described multiple measurement result determined by treating apparatus; And the set based on this adjusted value generates the measurement result after the adjustment corresponding to described multiple measurement result, wherein, the measurement result after described adjustment corrects the spur signal change of tail effect.This embodiment some in, multiple measurement result comprises the signal value about sensor element formed by the specific T X electrode of sensor array, and determines that the measurement result after adjusting comprises step: the summation calculating the index forming the RX electrode of sensor element along specific T X electrode; Calculate the summation along the signal value about sensor element of specific T X electrode; Based on summation and the described signal value summation calculating parameter value of described index; And at least adjust each signal value in described signal value to obtain corresponding adjusted value based on the index of described each signal value, parameter value and corresponding RX electrode.

In another example embodiment, system comprises the capacitive sensor array be coupled with capacitance type sensor and the processing logic be coupled with capacitance type sensor.Capacitive sensor array comprises multiple RX electrode and multiple TX electrode, wherein, staggered and not intersected with each other in multiple RX electrode and the individual layer of multiple TX electrode on the substrate of capacitive sensor array.Capacitance type sensor is configured from the multiple measurement result of multiple RX electrode measurements, and wherein, the plurality of measurement result represents conductive body contact or close to this capacitive sensor array.Processing logic is configured the set determining the adjusted value corresponding to the tail effect be associated with multiple measurement result, and the set based on this adjusted value generates the measurement result after the adjustment corresponding to multiple measurement result, wherein, the measurement result after this adjustment corrects the spur signal change of tail effect.

Exemplary operations background

Fig. 1 illustrates the block diagram of an example embodiment of electronic system 100, and electronic system 100 comprises treating apparatus 110, and this treating apparatus can be configured the electric capacity measuring touch sensible surface and the adjustment generated for compensating and/or eliminate tail effect.Electronic system 100 comprises the touch sensible surface 116 (such as, touch-screen, touch pads etc.) being coupled in treating apparatus 110 and main frame 150.In certain embodiments, touch sensible surface 116 is the user interfaces using touch sensor array 121 to detect the touch on surface 116.

In the example embodiment of Fig. 1, on the individual layer that touch sensor 121 is included in substrate staggered and do not have intersected with each other (such as, in SLIM type) sensor electrode 121 (1)-121 (N) (wherein, N is positive integer).Touch sensor 121 is coupled to the pin 113 (1)-113 (N) for the treatment of apparatus 110 via the one or more emulation buss 115 transmitting multiple signal.For convenience of explanation, in this embodiment, each electrode 121 (1)-121 (N) is represented as capacitor.The self-capacitance of each electrode in touch sensor 121 is measured by the capacitance type sensor 101 in treating apparatus 110.In certain embodiments, depend on the type of touch sensor, capacitance type sensor can be configured the mutual capacitance detected when electric conductor (such as, nib, the finger etc. of user) electrode when contacting one or more electrode.

Capacitance type sensor 101 (being also only called " sensor ") can comprise the relaxor or other devices that electric capacity are converted to measured value.Capacitance type sensor 101 can also comprise counter or the timer of measuring oscillator output.Capacitance type sensor 101 can also comprise component software count value (such as, capacitance) being converted to and detecting and judge (judging also referred to as change detection) or relative magnitude.In certain embodiments, the measured value obtained by capacitance type sensor 101 can be the signal value of the one or more characteristics representing signal; In certain embodiments, signal value can be in addition or change the value of deriving from measured value based on characteristics of signals (such as, such as voltage and/or current amplitude, former electric capacity etc.) into.It is to be noted, measure electric capacity and have various known method, such as when current vs voltage phase-shift measurement, resistor-capacitor circuit chargometer, capacitance bridge frequency divider, Charger transfer, Approach by inchmeal, sigma-delta modulator, charge accumulation circuit, field effect, mutual capacitance, frequency displacement or other capacitance measurement algorithms.It is pointed out that and replace the original count of assessment relative to threshold value, capacitance type sensor can assess other measurement result to determine user interactions.Such as, in the capacitance type sensor with sigma-delta modulator, capacitance type sensor can assess the ratio of the pulse width of output, with to be substituted on specific threshold or under original count.

In the example embodiment of Fig. 1, treating apparatus 110 also comprises processing logic 102.The operation of processing logic 102 can be implemented in firmware; Alternatively, they can be implemented in hardware or in software.Processing logic 102 is configured the operation performing and implement for the technology of correction tail effect as described herein.Such as, processing logic 102 can receive the measurement result from capacitance type sensor 101, adjustment measurement result is to compensate/to eliminate tail effect, and the measurement result subsequently after Use Adjustment is to determine the state of touch sensor 121, such as inspected object (such as, finger, nib etc.) whether on a touch sensor or close to touch sensor (such as, determine the existence of object), object be detected on a touch sensor where (such as, determine the location of object), the motion of tracking object, or in relevant other information of the object to be detected of touch sensor.

In another embodiment, replace and perform at treating apparatus (such as, such as treating apparatus 110) in the operation of processing logic, treating apparatus can send to main frame (such as, such as main frame 150) data that raw data or part process.As shown in fig. 1, main frame 150 can comprise the decision logic 151 of the above-mentioned part or all of operation performing processing logic 102.The operation of decision logic 151 can be implemented in firmware, hardware, software or their combination.Main frame 150 can comprise the senior application programming interface (API) in application 152, it performs and receives the routine of data, such as compensate for sensitivity difference, other backoff algorithms, datum renewal routine, startup and/or initialization routine, interpolation arithmetic, zoom operations and/or implement the operation of the technology for correcting tail effect as described herein.The operation described about processing logic 102 can be implemented in decision logic 151, application 152, or implements in other hardware, software and/or firmware in treating apparatus 110 outside.In some other embodiment, treating apparatus 110 can be main frame 150.

In another embodiment, treating apparatus 110 also can comprise non-inductive movable block 103.This block 103 can be used to process data and/or receive data/transmit data to main frame 150 from main frame 150.Such as, other assembly can be implemented, with operational processes device together with touch sensor 121 110 (such as, keyboard, keypad, mouse, trace ball, LED, display or other peripheral units).

Treating apparatus 110 can reside on common carrier substrate (such as such as integrated circuit (IC) tube core substrate or multi-chip module substrate).Alternatively, the assembly for the treatment of apparatus 110 can be one or more independently integrated circuit and/or discrete component.In one embodiment, treating apparatus 110 can be programmable system on the chip that manufactures on single IC chip, such as, and such as, on the chip treating apparatus developed by the Cypress semiconductor company of San Jose programmable system (PSoC ^tM).Alternatively, treating apparatus 110 can be one or more other treating apparatus known to persons of ordinary skill in the art, such as microprocessor or CPU (central processing unit), controller, application specific processor, digital signal processor (DSP), special IC (ASIC), field programmable gate array (FPGA) or other programmable devices.In alternative embodiments, such as, treating apparatus 110 can be network processing unit, and this network processing unit has the multiple processors comprising core unit and multiple micro engine.In addition, treating apparatus 110 can comprise any combination of general processing unit and special processor.

In one embodiment, electronic system 100 is embodied as user interface in the device comprising touch sensible surface 116, such as portable electric device, portable and/or smart phone, cell phone, notebook computer, personal computer, personal data auxiliary (PDA), call box, keyboard, TV, remote controllers, monitor, palm multimedia device, handheld video player, game device, family or industrial electrical equipment control panel or other computer peripheral devices or input media.Alternatively, electronic system 100 can be used in the device of other types.It is pointed out that the assembly of electronic system 100 can comprise above-mentioned all component.Alternatively, electronic system 100 can only include some assembly in said modules, or comprises the other assembly do not listed here.

Fig. 2 illustrates the block diagram measured electric capacity being converted to the capacitive touch sensors array 121 (being also referred to as " touch sensor ") of coordinate and an embodiment of capacitance type sensor 101 (being also only called " sensor ").Each coordinate calculates based on measured electric capacity.In one embodiment, touch sensor 121 and capacitance type sensor 101 are implemented in the system of such as electronic system 100.Touch sensor 121 comprises the matrix 225 with N number of receiving electrode and M sender electrode.Such as, matrix 225 comprises sender electrode (TX) 222 and receiving electrode (RX) 223.Each electrode in matrix 225 is connected with capacitive induction circuit 201 with multiplexer 213 by demultplexer 212.

Capacitance type sensor 101 comprises multiplexer controller 211, demultplexer 212 and multiplexer 213, clock generator 214, signal generator 215, demodulator circuit 216 and analog to digital converter (ADC) 217.ADC 217 is coupled further with touch coordinate converter 218.Touch coordinate converter 218 outputs signal to processing logic 102.

Sender electrode in matrix 225 and receiving electrode can be arranged, make each sender electrode with at same base flaggy (such as, individual layer) on receiving electrode interlock, but does not intersect with receiving electrode and keeps their electric (such as, electric currents) to isolate simultaneously.Therefore, each sender electrode can with each capacitive coupling in receiving electrode.Such as, sender electrode 222 is in the sensor element district 226 of matrix 225 and receiving electrode 223 capacitive coupling, and wherein, " E " shape portion of receiving electrode 223 and " comb " shape portion of sender electrode 222 interlock.In the electrode pattern shown in matrix 225, be electrically coupled to one another to form single (level) receiving electrode in outer ring (bezel) the part (not shown) of " E " shape portion of same horizontal plane at touch sensor 121, and each sender electrode is " comb " shape and run (vertically) from the top-to-bottom of matrix 225.

In certain embodiments, capacitance type sensor (such as, sensor 101 in such as Fig. 1) use mutual capacitance induction technology can be configured, according to this technology, the mutual capacitance presented in the sensor element area of two electrodes can be measured by treating apparatus (treating apparatus 120 such as, in such as Fig. 1).Processing logic is allowed to determine the location contacted on a touch sensor in the change of this mutual capacitance of one or more sensor element area.Responded to by mutual capacitance, one group of electrode (such as, such as row electrode) is designated as transmission (TX) electrode.Sender electrode is driven by the TX signal putting on sender electrode by sending multiplexer.Another group electrode (such as, such as column electrode) is designated as transmission (TX) electrode.The mutual capacitance of the sensor element formed at column electrode and row electrode region interlaced with each other can be measured by the signal of sampling on each receiving electrode.In certain embodiments, receive multiplexer may be used for the signal of sampling on one or more receiving electrode and the reception measuring-signal turning back to processing logic 102 (and/or to another assembly of the treating apparatus) is provided.

Referring back to Fig. 2, clock generator 214 provides clock signal to signal generator 215, and signal generator 215 produces transmission (TX) signal 224 being supplied to the sender electrode of touch sensor 121.In one embodiment, signal generator 215 comprises the one group of switch operated according to the clock signal from clock generator 214.This switch can generate TX signal 224 by the output terminal of signal generator 215 being regularly connected to the first voltage and being connected to the second voltage subsequently, and wherein, described first voltage and the second voltage are different.

The output terminal of signal generator 215 is connected with demultplexer 212, and this permission TX signal 224 is applied to any one in M sender electrode of touch sensor 121.In one embodiment, multiplexer controller 211 controls demultplexer 212, makes TX signal 224 be applied in each sender electrode 222 with controlled sequence.Demultplexer 212 can also be used for ground connection, suspension or space signal is connected to current other sender electrodes not applying TX signal 224.

Because the capacitive coupling between sender electrode and receiving electrode, the TX signal 224 putting on each sender electrode responds to the electric current in each receiving electrode.Such as, when TX signal 224 is applied in sender electrode 222 by demultplexer 212, reception (RX) signal 227 of TX signal 224 on the receiving electrode of induction matrix 225.The multiplexer 213 of each demodulator circuit 216 that is linked in sequence in N number of receiving electrode can be measured by using by RX signal 227 on each receiving electrode subsequently in order.

The mutual capacitance that is associated with each sensor element (such as, given TX electrode and the staggered region of given RX electrode) can use demultplexer 212 and multiplexer 213 by selecting the incompatible induction of each available set of TX electrode and RX electrode.For improving performance, multiplexer 213 can also be segmented, and is routed to other demodulator circuit 216 to allow the more than one receiving electrode in matrix 225.The example wherein with receiving electrode demodulator circuit 216 has 1 in the distributing rationally of 1 correspondence, and multiplexer 213 can not be present in this system.

When object (such as pointing) convergence electrode matrix 225, this object causes the minimizing of the mutual capacitance only had between some electrode.Such as, if finger is placed proximity sensor element district 226 (region that sender electrode 222 is staggered with receiving electrode 223), the existence of finger will reduce the minimizing of mutual capacitance between electrode 222 and electrode 223.Therefore, on touch sensor 121, the location of finger can by identifying that one or more receiving electrode of having and reducing mutual capacitance and minimizing mutual capacitance on one or more receiving electrode measured time are by identifying that the sender electrode applying TX signal 224 to it is determined.

By the mutual capacitance that each sensor element determined with formed by the sender electrode in matrix 225 and receiving electrode is associated, the location of one or more touch contact can be determined.This is determined it can is continuously, walks abreast, or frequently can occur at common electrode place.

In certain embodiments, can be used in finger or the electric conductor position that causes electric capacity to increase at one or more electrode for the additive method detecting the existence of finger or electric conductor, wherein, described one or more electrode can be arranged with specific interlace pattern.Such as, the finger placed close to the electrode of touch sensor may introduce the additional ground capacitance increasing total capacitance between electrode and ground connection.The location of finger can from detecting that the location of the one or more electrodes increasing electric capacity is determined.

The current signal 227 responded to is by demodulator circuit 216 rectification.The commutated current that demodulator circuit 216 exports can be filtered subsequently and be converted to digital code by ADC 217.

The digital code coordinate converter 218 that can be touched subsequently is converted to the touch position coordinates of position of the input of instruction touch sensor 121.Touch position coordinates is transmitted to processing logic 102 as input signal.In one embodiment, input signal receives at the input end of processing logic 102.In one embodiment, this input end can be configured the capacitance measurements receiving the multiple row-coordinate of instruction and multiple row coordinate.Alternatively, this input end can be configured and receive row-coordinate and row coordinate.

In certain embodiments, processing logic 102 can be configured the capacitance measurements (being also referred to as herein " difference value signal ") that generation (or such as receiving from touch coordinate receiver 218) represents differential signal.Such as, processing logic 102 can be configured and the differential signal of given sensor element is defined as sensor element (such as, when electric conductor do not contact touch sensor and touch sensor by scanning time) stable (settled)/benchmark (such as, expection or charge completely) electric capacity with as the measured sensor element of a part for scan operation electric capacity (such as, when electric conductor may or may not touch sensor be contacted) between difference.Electric capacity for the differential signal of calculating sensor element can be self-capacitance and/or the mutual capacitance of sensor element.

In various embodiments, processing logic can calculate the differential signal of each sensor element in touch sensor based on the capacitance measurements of the self-capacitance and/or mutual capacitance that represent sensor element.Such as, the self-capacitance of given sensor element can be included in the electric capacity formed between sensor element and reference voltage (such as, such as ground voltage).The mutual capacitance of given sensor element can be included in the sender electrode and receiving electrode that form sensor element and/or and one or more electric conductors (such as, the finger of such as nib or user) of capacitive sensor element electric isolution between the electric capacity that formed.

Single-layer touch sensor

Past has attempted the quantity of reduction layer, and therefore reduces the manufacturing cost of touch sensor.In certain embodiments, single-layer touch sensor is only applicable to single touch reception.These touch-sensitive sensors use a series of electrode usually, and the width of this electrode linearly changes from one end of electrode to the other end.Utilize the signal intensity along electrode length, the coordinate along electrode axis is determined.Determined by conventional numerical method at the coordinate to electrode axis vertical direction.In other embodiments, the many touch sensors of individual layer use the pad array in filling sensor region, and each pad (or electrode) is responded to separately with self-capacitance inductive mode.This type of embodiment needs a large number of Measurement channel and pin in the individual traces and controller chip of each sensing pad usually, to obtain the accepted precision of even very small size sensor.

In certain embodiments, touch sensor apparatus comprises the touch sensor with individual layer effective coverage.In addition, touch sensor is provided with trace number of conductors reduced to minimum wiring diagram and detects needed for multiple contact (such as, such as " touch ") simultaneously.As a result, the whole manufacturing cost of touch sensor and the whole manufacturing cost of corresponding touch sensor apparatus can be minimized.

Fig. 3 A and 3B is the reduced graph of the touch sensor apparatus 301 (such as, such as capacitive induction device) according to example embodiment.In this embodiment, touch sensor 301 is " touch-screen " devices comprising the touch sensor with effective coverage 302 and non-active area 303.As said use herein, " effective coverage " and " touching induction region " of touch sensor refers to that sensor can generate signal, causes capacitance variations or otherwise detect one or more region contacted." non-active area " of touch sensor refers to " non-inductive region " and does not detect or otherwise respond the region contacted.Touch sensor apparatus 301 comprises liquid crystal display (LCD) panel 304 be arranged in below touch sensor 305 (such as, such as sensor array or assembly).As general understanding, effective coverage 302 can correspond to touch sensor 305 transparent (such as, visual) size and dimension in region, and non-active area 303 can correspond to touch sensor 305 nontransparent (such as, non-visual) region, this nontransparent region can be covered by shell (casing) (not shown) or other devices stoping contact effect.Touch sensor 305 comprises the lamination (or protective seam) 306 being attached to the face relative with LCD by bonding agent 307.Touch sensor apparatus 301 also comprises flexible print circuit (FPC) afterbody 308 extended from it, and this afterbody can be used to electric signal wiring line to connect up electric signal to touch sensor 305 with from touch sensor 305.

Fig. 3 C illustrates a part for the touch sensor 310 (such as, such as capacitive sensor array) according to example embodiment.Touch sensor 310 comprises the non-active area (or outer ring portion) 316 with the substrate 312 of effective coverage (or central part) 314 and the edge close to substrate 312.The central part 314 of substrate 312 can correspond to effective (such as, touch sensible) region (region 302 of the touch sensor apparatus 301 such as, in such as Fig. 3 A) of touch sensor apparatus.The outer ring portion 316 of substrate 312 can correspond to non-effective (such as, non-inductive) region (region 303 of the touch sensor apparatus 301 such as, in such as Fig. 3 A) of touch sensor apparatus.In certain embodiments, substrate 312 is made up of the electrically insulating material (such as glass, polyethylene terephthalate (PET) or their combination) with high light transmission.

Electrod-array is formed on the central part 314 of substrate 312, and this electrod-array comprises first group of (or multiple) electrode 318 (being also referred to as " the first electrode ") and second group of (or multiple) electrode 320 (being also referred to as " the second electrode ").First electrode 318 and the second electrode 320 all in the upper formation of the identical layer (such as, individual layer) of substrate 312, but do not intersect each other and keep electricity (such as, electric current) isolation each other simultaneously.In certain embodiments, in order to form the first electrode and the second electrode, transparent conductive material layer (such as indium tin oxide (ITO) or silver nanoparticle film) can be deposited on substrate 312 (or on).As hereinafter will in greater detail, during the scan operation that touch sensor 310 performs, the first electrode 318 can be used as sending (TX) electrode, and the second electrode 320 can be used as receiving (RX) electrode.But, should be appreciated that these TX and RX roles are only exemplary, and can be converted in each other embodiments.

First electrode 318 is roughly " comb " shapes with the comb component towards left side as shown in Figure 3 C.In the part of the touch sensor 310 in fig. 3 c, comprise three the first electrodes 318 (such as, 318a, 318b and 318c) and two the second electrodes 320 (such as, 320a and 320b).Three the first electrodes are substantially vertical also roughly along the whole length extension of the central part 314 of substrate 312.Be to be understood that, although other embodiments can be used in the first electrode being different from the varying number that vertical direction extends, but, in other embodiments, a subset of the first electrode can only extend around lower half length of central part, and another subset of the first electrode upwards extends from the outer ring portion of B.B.P.

According to the technology for correcting tail effect as herein described, second electrode comprises one or more forming section, one or more principal trace line and at least one secondary trace, wherein, principal trace line and forming section connect up in effective (touch sensible) region of touch sensor.As used herein, principal trace line is also referred to as " circuit " or " trace line "." shaping " portion of electrode has the width being greater than principal trace line width and the geometric configuration being different from basic straight line.Forming section is electrically connected to corresponding principal trace line, and each principal trace line is electrically coupled to the secondary trace in non-effective (non-inductive) region of touch sensor.Connecting up in the effective coverage of touch sensor at least partially of other principal trace lines one or more of other the second electrodes one or more that the principal trace line of given second electrode is formed along the non-active area (such as, the outer ring portion of touch sensor) of given further away from each other the second electrode.In addition, principal trace line the connecting up in effective coverage at least partially along given first electrode of given second electrode.Be electrically coupled to secondary trace wiring in the non-active area (such as, such as outer ring portion) of touch sensor of the principal trace line of given second electrode.Therefore, the principal trace line of given second electrode may by the impact of conductive body contact (this may have impact on during scan operation from the change of the signal of given second electrode measurement), because principal trace line is connected up in effective, the touching induction region of touch sensor.On the other hand, therefore secondary trace by this type of Contact Effect, because secondary trace connects up in region in non-effective, the non-inductive of touch sensor, and does not have impact to the signal from the second electrode measurement usually during scan operation.

As explanation, in fig. 3 c, the first electrode 318 is disposed in row 322, and the second electrode 320 is arranged and is expert in 324, and wherein, each row 322 comprise one in the first electrode 318, and each row 324 comprises one in the second electrode 320.Each roughly " E " shape portion extended to the right comprised as shown in Figure 3 C in second electrode 320.Each " E " shape portion of given second electrode 320 and corresponding one staggered (such as, with interdigital pattern) of the first electrode 318.In each row 324, " E " shape portion of given second electrode 320 is electrically coupled to one another, and " comb " shape component of each " E " shape portion and corresponding first electrode 318 staggered (such as, interdigital).Such as, second electrode 320b comprises three " E " shape portions (such as, 320b-1,320b-2,320b-3), each " E " shape portion is electrically connected to corresponding principal trace line (such as, corresponding 326a, 326b, 326c), wherein, be electrically coupled to one another on the secondary trace (such as, 330b) of all corresponding principal trace lines in outer ring portion 316.It is pointed out that the appointment electrode pattern illustrated in fig. 3 c is only exemplary, therefore, other electrode shapes and cross figure (can not be interdigital) are possible and in the scope of the techniques described herein.

In fig. 3 c, the substantially parallel wiring of principal trace line 326 of the forming section of the second electrode 320 is coupled to and adjacent one another are.The principal trace line of second electrode in outer ring the portion 316 and more forming sections wirings of contiguous other second electrodes longer than the principal trace line of the second electrode closer to outer ring portion further away from each other.

First electrode 318, second electrode 320 and principal trace line 326 can be made up of indium tin oxide (ITO) and above be formed at same base flaggy (such as, individual layer) in the mode of general plane.In other words, although do not specifically illustrate in fig. 3 c, but the first electrode 318, second electrode 320 and principal trace line 326 can have roughly the same thickness (such as, 300 dusts (A)) and can lay (lay) in roughly the same plane.

As shown in Figure 3 C, insulating material (body or layer) 328 formed in outer ring (outside) portion 316 of substrate 312 or otherwise with its attachment.Insulating material 328 covers the end of the principal trace line 326 extended in outer ring portion 316, but it is pointed out that insulating material 328 does not extend on the central part 314 of substrate 312.Insulating material 328 can be made up of such as epoxy resin or resin material and have the thickness such as between 5 and 25 microns (μm) be deposited on substrate 312.In certain embodiments, insulating material 328 can be the flexible base, board being attached to substrate 312, such as flexible print circuit (FPC).Insulating material 328 is by given secondary trace 330 and at least some principal trace line 326 electric isolution.Such as, in fig. 3 c, insulating material 328 makes secondary trace 330b insulate with the principal trace line of those the second electrodes 320 being different from electrode 320b with the principal trace line 326 being connected to the second electrode 320a.

The insulating material 328 of secondary trace (or multiple conductor) 330 in the outer ring portion 316 of substrate 312 is formed.In one embodiment, secondary trace 330 is made from silver.Interested to the embodiment of Fig. 3 C, given secondary trace 330 is electrically connected to all principal trace lines 326 be associated with given second electrode 320 in the given row of row 324 (and only having).In addition, in the embodiment of Fig. 3 C, the secondary trace 330 of isolation is electrically coupled to the counter electrode of the first electrode 318.Such as, secondary trace 330a is coupled in the first electrode 318c.In certain embodiments, for reducing the wiring area in outer ring portion 316, the spacing of the track width in outer collar region and secondary trace 330 can be reduced to minimum.Such as, to be 10-50 μm and spacing be width that the metal trace circuit of 10-50 μm can be used in outer collar region.

Should be appreciated that touch sensor 310 can comprise the other one group of trace do not illustrated in fig. 3 c.Such as, other one group of ground connection trace can be formed and can be roughly parallel to the first electrode 318 and connect up in the effective coverage of touch sensor 310.This type of ground connection trace may be used for providing ground connection, so that by the first given electrode 318 and next-door neighbour/adjacent main trace 326 electric isolution being connected to the second electrode 320.Therefore, each ground connection trace can be electrically connected at least one that be coupled in the secondary trace 330 of system earth.

In operation, secondary trace 330 is coupled (such as, can operation communication with it) to electronic system (such as, all systems as shown in Figure 2), to perform scan operation to touch sensor 310.In a scanning operation, touch sensor 310 is by providing signal residue first electrode 318 ground connection coming to be operated to each electrode (being called " driving " TX electrode) in the first electrode 318 successively simultaneously.Signal is responded to, because the electric capacity be coupled between which in these second electrodes 320 (RX electrode) with the forming section interlocked with driving TX electrode.The signal responded in RX electrode is measured and/or record by the processing logic in electronic system.The signal of measured/record can change (from predetermined reference value), due to the existence of electric conductor (such as, this type of is pointed or nib) contacted with a part for touch sensor 310.The signal intensity (such as, from reference value) that RX electrode is measured represents the change of the electric capacity (such as, in " mutual capacitance ") between the one or more and driving TX electrode RX electrode.After measuring the signal on RX electrode, by providing signal to next TX electrode and measuring corresponding RX electrode in an identical manner, continue scan operation.

Fig. 4 A-E illustrates alternative form, pattern and layout according to the first electrode 318 of each embodiment of the techniques described herein and the second electrode 320.Such as, the embodiment illustrated in Figure 4 A comprises the first electrode 318 and the second electrode 320, it comprise as with previous about the first electrode and the second electrode relative respectively " spiral " structure of " comb " and " E " shape structure of being discussed.But, should be appreciated that and can use other shapes, pattern and layout (as shown in each alternate embodiment shown in Fig. 4 B, 4C, 4D and 4E).

In certain embodiments, different materials may be used for forming sensor (such as, first and second) electrode, such as copper, aluminium, silver-colored any suitable conductive material that maybe can form suitable pattern.And FPC may be used for forming sensor electrode.In this type of embodiment, each conductive layer in FPC can form the first electrode as above and the second electrod-array through correctly configuring and form its principal trace line.Therefore, should be appreciated that described electrode, trace and insulating material (or body) all can be formed by the FPC of single correct configuration.As be apparent, however, to one skilled in the art that, this type of embodiment is specially adapted to nontransparent device, such as mouse pad, track pad, touch pad etc.In addition, in certain embodiments, substrate can be made up of other materials, such as comprises any suitable plastic of ethene, polyamide, and described material depends on that specific device may be opaque.

In certain embodiments, touch sensor can lay sensor electrode to be formed by using alternative conductive material (such as wire netting).In this type of embodiment, sensor electrode by arranging wire netting electrode to be formed on pet substrate.In alternative embodiments, wire netting sensor electrode can be arranged on the glass substrate.In other embodiments, sensor electrode can be formed on PET or with silver nanoparticle wire on the glass substrate with silver nanoparticle wire.In other embodiments, touch sensor can be formed by another glass of glass (or other transparent insulations) eyeglass being bonded to placement sensor electrode pattern in the above.In other other embodiments, touch sensor can by glass (or other transparent insulation materials) is bonded to comprise sensor patterns one piece of PET on formed.

Therefore, embodiment as herein described provides a kind of touch sensor apparatus, it has the single layer structure in the effective coverage (or part) of the touch sensor at this device, and sandwich construction can be used in outer ring (or other non-inductive) part of touch sensor for routing traces.This type of multilayer wiring allows to reuse trace, makes touch sensor use the trace of minimum number and drive the minimum number pin in electronic system of touch sensor apparatus, thus reduces relevant manufacturing cost.

Tail effect

Tail effect in single-layer touch sensor can be in response to electric conductor (such as, nib, the finger etc. of user), and the spur signal contacted in one or more sensor element increases or spur signal reduces with touch sensor.In certain embodiments, the tail effect for given sensor element is caused by the spur signal be coupled between TX electrode and the principal trace line of RX electrode, and therefore the forming section of this principal trace line is not also subject to Contact Effect outside actual contact area.

Technology for correcting tail effect as herein described provides the analysis of the signal distribution plots to the particular fragments from touch sensor.This analysis uses linear-apporximation (such as, measurement/derivation signal value based on the sensor element lower than some tail effect threshold value) to calculate the adjusted value of the spur signal change correcting tail effect, and this adjusted value was deducted to calculate the position coordinates of contact from the signal value of measured/derivation before executing location calculates.

Fig. 5 illustrates the spur signal in a part for the touch sensor panel in the touching induction region being coupling in touch sensor with single-layer electrodes pattern.According to example embodiment, the part 510 of touch sensor comprises ground connection trace 512 and 514, TX electrode 516 and 518 (being arranged to vertical row) and RX electrode 520,522,524,526,528 and 530 (being arranged to horizontal line).Ground connection trace 512 and 514 to be disposed in the touching induction region of touch sensor part 510 and almost parallel and be close to TX electrode wiring.Ground connection trace (such as, such as ground connection trace 514) for providing ground connection, so that by given TX electrode (such as, such as TX electrode 516) with RX electrode close on/adjacent portions (such as, such as RX electrode section 530a-2 and 530b-2,528a-2 and 528b-2,526a-2 and 526b-2 etc.) electric isolution.Each substantially vertical layout in TX electrode 516 and 518 also comprises roughly " comb " shape component staggered with the forming section of RX electrode 520-530.Each in RX electrode 520,522,524,526,528 and 530 arranges in its row, and as shown, comprise at least two roughly " E " shape portions, each " E " shape portion is electrically connected to himself corresponding principal trace line, each principal trace line is electrically connected to other principal trace lines of RX electrode successively by the secondary trace (not shown) in non-inductive (such as, the outer ring) region of touch sensor.

Particularly, RX electrode 520 comprises the forming section 520a-1 being electrically connected to principal trace line 520b-1 and the forming section 520a-2 being electrically connected to principal trace line 520b-2.Equally, RX electrode 522 comprises the forming section 522a-1 being electrically connected to principal trace line 522b-1 and the forming section 522a-2 being electrically connected to principal trace line 522b-2.RX electrode 524 comprises the forming section 524a-1 being electrically connected to principal trace line 524b-1 and the forming section 524a-2 being electrically connected to principal trace line 524b-2.RX electrode 526 comprises the forming section 526a-1 being electrically connected to principal trace line 526b-1 and the forming section 526a-2 being electrically connected to principal trace line 526b-2.RX electrode 528 comprises the forming section 528a-1 being electrically connected to principal trace line 528b-1 and the forming section 528a-2 being electrically connected to principal trace line 528b-2.Finally, RX electrode 530 comprises the forming section 530a-1 being electrically connected to principal trace line 530b-1 and the forming section 530a-2 being electrically connected to principal trace line 530b-2.

Fig. 5 illustrates the operational circumstances that the contact 540 of electric conductor affects by touch sensor portion 510.As shown, to contact on the 540 forming section 520a-1 being mainly located in RX electrode 520 and on the forming section 522a-1 being therefore positioned at RX electrode 522 on a small quantity; In addition, on the forming section 522a-2 contacting on forming section 520a-2 that 540 parts are positioned RX electrode 520 and be positioned at RX electrode 522 on a small quantity.Contact 540 to be also positioned on TX electrode 516 and 518 and to affect this TX electrode.But, as shown, 540 principal trace line 524b-1,526b-1,528b-1 and 530b-1 (respectively corresponding RX electrode 524,526,528 and 530) also in the 542a of capacitive effect intercoupling region are contacted.Equally, principal trace line 524b-2,526b-2,528b-2 and the 530b-2 (respectively corresponding RX electrode 524,526,528 and 530) in 540 capacitive effect intercoupling region 542b is contacted.Because the intercoupling of contact 540 in 542a and 542b of region, tracer signal is changed (the corresponding benchmark from them) by the signal value read from RX electrode 524,526,528 and 530 during scan operation, even if this contact is not positioned on the forming section of RX electrode 524,526,528 and 530, and therefore, the forming section of these RX electrodes is not by this Contact Effect.These signal intensities represent the tail effect caused by the intercoupling in 542a and 542b of region.Therefore, if the signal value read from RX electrode 524,526,528 and 530 is not corrected by the signal intensity that the tail effect for the intercoupling among 542a and 542b of region causes, then the location, position of contact 540 on a touch sensor may calculate incorrect (such as, as from its actual locating bias).

As shown in Figure 5, the unactual principal trace line being touched the RX electrode of covering of forming section there is extra intercoupling.But, these (not by Contact Effect) forming sections interlock to be formed with the forming section of corresponding TX electrode the sensor element obtaining unlike signal value by this.Therefore, tail effect causes more sensor element error logging to contact, because the principal trace line being connected to these sensor elements directly affects (even if sensor element itself is not in the contact areas) by contact.In addition, due to contiguous/adjacent each TX electrode wiring of identical principal trace line, be touched covering TX electrode more, tail effect will be higher.

As shown in Figure 5, when RX electrode connects up from the top of touch sensor to bottom, tail effect " is seen " (or record) by downstream RX electrode.If RX electrode connects up from the bottom of touch sensor to top, then contrary tail effect " will be seen ".In certain embodiments, in order to the overall width in region that the principal trace line by RX electrode is taken (such as, the such as width of intercoupling region 542a and 542b) reduce to minimum, touch sensor (such as, such as SLIM touch panel) can such as from outer ring, the top/non-inductive region of touch sensor and from outer ring, bottom/non-inductive region by two wiring.This means that (about) half of RX electrode will have from the wiring of outer ring, top (such as, to downward-extension) principal trace line, remaining RX electrode has its principal trace line of connect up from the outer ring, bottom of touch sensor (such as, upwards extending).

The example of two wiring, single-layer touch sensor is shown in Figure 6.In the example embodiment of Fig. 6, touch sensor 610 comprises outer ring, top (non-inductive) region 616, top effectively (touch sensible) region 614a, bottom effectively (touch sensible) region 614b and outer ring, bottom (non-inductive) region 626.RX electrode in the 614a of effective coverage, top connects up from collar region top 616, and the RX electrode in the 614b of effective coverage, bottom connects up from collar region bottom 626.In embodiment shown in Figure 6, the TX electrode in effective coverage, top 614a and effective coverage, bottom 614b all connects up from collar region top 616.In other embodiments, be similar to RX electrode, such as, if there is the demand of the RC constant reducing sensor element, then TX electrode also can be separated and two wiring from relative non-inductive region.

When two wiring touch sensor panel (panel in such as Fig. 6), the independent tail effect that the contact of electric conductor will cause on every face of panel.Such as, the sensor element of the medium line 615 of outer ring wiring bottom changing to downwards and towards wherein connecting up from contact area is formed tail effect by the contact being placed in effective coverage, the top 614a of touch sensor 610.Equally, the contact being placed in effective coverage, the bottom 614b of touch sensor 610 will form tail effect from the sensor element of contact area upwards and towards medium line 615.

The example of the independent tail effect on every face of two wiring, single-layer touch sensor panel is shown in Fig. 7 A and 7B.Particularly, Fig. 7 A and 7B illustrates the Example data structure storing the signal value reflecting the tail effect caused by the electric conductor on every face of two wiring touch sensor panel according to example embodiment.

Fig. 7 A and 7B illustrates the data structure 700 storing difference value signal, wherein this signal value is in specific scan operation (illustrating in fig. 7) and different scan operation (illustrating in figure 7b) period, and the multiple measurement results measured from the sensor element of sensor array derive.Sensor array comprises effective touching induction region (by Reference numeral 714 logic display), non-inductive region, top (by Reference numeral 716 logic display) and non-inductive region, bottom (by Reference numeral 726 logic display).

In Fig. 7 A and 7B, the sensor element of sensor array is the box (box) formed by 11 TX electrodes and 19 RX electrodes by logical expressions.The sensor of operation sensor array or processing logic (not shown) store/associate the independent index value of each independent TX electrode, and wherein, this index value is disposed in the sequence of the physical layout representing TX electrode in sensor array; Equally, this sensor or processing logic also store/associate the independent index value of each independent RX electrode, and wherein, this index value is disposed in the sequence of the physical layout representing RX electrode in sensor array.

Such as, in Fig. 7 A and 7B, TX index 702 represents the integer-valued sequence of the scope of 11 TX electrodes from 0 to 10; Equally, RX index 704 represents the integer-valued sequence of the scope of 19 RX electrodes from 0 to 18.In the embodiment shown in Fig. 7 A and 7B, there is the RX electrode that index value " 0 " arrives " 9 " connect up from non-inductive region, top (716), thus form the top section of sensor array, and the remaining index value " 10 " that has arrives the RX electrode of " 18 " from non-inductive region, bottom (726) wiring, thus form the base section of this sensor array.

Fig. 7 A and 7B also illustrates the differential signal obtained by the scan operation of correspondence, and this differential signal is used for each sensor element represented in data structure 700.Such as, in the scan operation of Fig. 7 A, differential signal 701a (having the value of " 19 ") is measured or otherwise obtain for sensor element, and this sensor element is by the forming section formation of TX index be the TX electrode of " 9 " and RX index the be RX electrode of " 16 ".In the scan operation of Fig. 7 B, differential signal 701b (having the value of " 1 ") is measured or otherwise obtain for identical sensor element (that is, this sensor element is by the forming section formation of TX index be the TX electrode of " 9 " and RX index the be RX electrode of " 16 ").It is to be noted, because each embodiment can use the sensor array of the sender electrode and receiving electrode with varying number and the different encoding schemes about corresponding TX index and RX index, the technology for correcting tail effect as herein described is not limited to the electrode of specific quantity.Therefore, sensor array and correspond to the TX index of data structure 700 shown in Fig. 7 A and 7B and RX index is considered to be illustrative implication, and nonrestrictive implication.

In fig. 7, the difference value for the sensor element represented in data structure 700 is obtained by the scan operation of putting in preset time.This difference value instruction contact 706a is present on the touch-surface in the base section of sensor array.This difference value also indicates tail effect 708a also to exist only in the base section of this array.It may be noted that, this difference value represents the state-therefore of the sensor element of the sensor array in the time performing scan operation, the contact 706a illustrated in fig. 7 can be Static Contact (such as, such as pat) can be maybe the part of more complicated gesture (such as, such as roll screen gesture).

In figure 7b, the difference value for the sensor element represented in data structure 700 is obtained by the scan operation (such as, at different time points) being different from the scan operation reflected in fig. 7.With reference to figure 7B, this difference value instruction contact 706b is present on the touch-surface in the top section of sensor array.This difference value also indicates tail effect 708b also to exist only in the top section of this sensor array.A part for the contact 706b illustrated in figure 7b can be Static Contact (such as, such as patting) can be maybe more complicated gesture (such as, such as roll screen gesture).

It may be noted that the degree that shows except tail effect can from being designed into except design changes, various different sensor design tends to above-mentioned parasitic tail effect.Therefore, in various embodiments, each technology for correcting tail effect as herein described can be implemented for the sensor array according to various different designs technical construction.This type of design and technology include but not limited to single solid-state rhombus design, MH3 and wire netting.

The example of process tail effect data

Assuming that RX index value increases in the direction in the face of the touch sensor away from the RX electrode that connects up by this, the tail effect in single-layer touch sensor is proportional with the RX index of RX electrode under a touch.Such as, the forming section of the RX electrode of the actual contact of distance is far away, and its tail effect signal obtained from intercoupling is more.Quote Fig. 5 exemplarily, when comparing with the RX electrode shown in other, although forming section 530a-1 with 530a-2 contacts 540 further away from each other, but RX electrode 530 obtains maximum signals from intercoupling, at least because: (1) principal trace line portion 530b-1 and 530b-2 respectively along TX electrode 516 and 518 run longer length; And (2) when there is electric conductor 540, it reduces the signal from whole four forming sections of RX electrode, this signal is direct proportional influenced relative to the benchmark of the sensor element (520a-1,520a-2,522a-1,522a-2) of correspondence, and therefore bottom RX electrode 530 still obtains maximum signal from intercoupling.In other words, due to the intercoupling under contact 540, RX electrode 520 obtains minimum signal to be increased, because this RX electrode has the shortest principal trace line.

According to the technology for correcting tail effect as herein described, given scan operation (being also referred to as scanning " frame " or " circulation ") obtains the measurement result of all the sensors element in sensor array (such as, by TX electrode power supply and the signal that reads on RX electrode).In certain embodiments, obtain measurement result and can comprise multiplexed several or whole RX electrode simultaneously; When obtaining, this group measurement result from whole RX electrode represents the measurement result of single scan operation.Processing logic determines the difference value signal-such as from the measurement result obtained by scan operation, by the measurement result of acquisition and the reference value being stored for respective sensor element being compared.Subsequently, suppose that all the sensors element had lower than the signal intensity of some threshold value is caused by tail effect, the techniques described herein provide the parameter building/determine proximal line based on determined difference value signal, determined parameter is used to calculate the adjusted value for each influenced sensor element corresponding to tail effect, and deduct the adjusted value of each calculating from the signal value of respective sensor element, thus correct tail effect.

It may be noted that, in two wiring touch sensor design (it provides the touch sensor with two separate cabling portions), when the positive tail effect of each lieutenant colonel in two separate cabling portions, the independent proximal line itself with independent parameter can be used.Instruction starts at the edge of each part of touch sensor and the proximal line with different angles terminated in the middle of touch sensor by this type of independent parameter.The example of this type of pair of proximal line is shown in Figure 8.

Fig. 8 is the curve map of the example that the tail effect of the specific middle TX electrode illustrated on two wiring touch sensor panel corrects.In curve map 800, signal 806 is by detecting from the specific scan operation of two wiring touch sensor and drawing along the X-axis of expression RX index value 804 and the Y-axis of expression difference value signal 802.It is likely the differential signal level (about " 55 " left and right) of tail effect that tail effect threshold value 803 defines.The techniques described herein are for determining the parameter (such as, angle or slope) of the best-fit line 808a at the top of touch sensor and the best-fit line 808b for the bottom of touch sensor.As shown in Figure 8, line 808a has the slope different from line 808b, and these two kinds of lines all from their respective edges of touch sensor wherein between (RX surrounding them has the RX index value of " 10 ") extend.Reference numeral 807 indicates the differential signal of the tail effect impact in the bottom of sensor that is touched from RX electrode group.

In certain embodiments, the contact threshold value setting that can depend on touch sensor of tail effect threshold value or the absolute peak signal of particular percentile that sets as this threshold value.In certain embodiments, tail effect threshold value is depended on, and absolute peak signal is more meaningful, because tail effect is directly proportional to the value of absolute peak signal.Such as, In a particular embodiment, tail effect threshold value is set to the number percent of the contact definite threshold of touch sensor.In this particular embodiment portable, this determines to contact threshold value is adaptive and is determined by the peak-peak that potential scan operation detects, and the typical set of tail effect threshold value is 2/3rds (2/3) of self-adaptation contact threshold value.

More general says, if touch sensor is intended to wisp operation (such as, such as pinkie or stylus), so, preferred use dynamically/threshold value of self-adaptation type, because be not so large from actual touch and the difference from the scan operation measurement result (such as, original count) of tail effect.Such as, the contact from 4mm finger can generate the signal approximately identical with the signal amplitude of the tail effect from larger finger (such as, 20mm points).Therefore, dynamically/self-adaptation contact definite threshold is used to be that useful-initial low-down detection threshold can be set to detect the contact compared with pinkie, and after this, based on actual measurement contact peak-peak signal value (such as, original count), this contact dynamic conditioning contact definite threshold can be specially.In this illustration, tail effect threshold value can be set to be less than 50% of the actual peak-peak signal detected.In this way, each contact of detecting of tail effect threshold value " self-adaptation ".

In certain embodiments; if touch sensor is intended to the operation of larger object (such as; such as normal or fat finger); so; the tail effect threshold value that preferred use is fixing, because the difference between the amplitude of the amplitude of actual touch and tail effect signal is significantly (due to intercoupling).Such as, threshold value 803 in Fig. 8 represents the fixed threshold that may be used for the pact " 55 " determining tail effect signal-such as can be considered to tail effect signal higher than " 0 " and lower than the difference value signal of " 55 ".

According to the technology for correcting tail effect as herein described, the linear-apporximation that the differential signal lower than the sensor element of (fixing or self-adaptation) tail effect threshold value is used for the given TX electrode forming these sensor elements by this calculates.

In certain embodiments, equation 1 below for determine differential signal because tail effect causes and formed the sensor element corresponding to this differential signal RX electrode index value between the linear-apporximation (such as, such as best-fit line) of correlativity:

S _i＝a*rxIndex+b (1)

Wherein:

B is interception (or skew) parameter equaling (or being approximately equal to) " 0 ", because there is not tail effect signal (or negligible) (such as in the edge of the touch sensor that RX electrode connects up by this, because not there is the obvious principal trace line length being exposed to contact) at the RX electrode at this edge

RxIndex is the RX index value of (such as, i-th) the RX electrode forming (such as, an i-th) separated sensor element along given TX electrode,

A is that constant-slope (or angle) parameter value of the distortion rate (slope) of the near optimal fit line defining given TX electrode (it is to be noted, if use the design of two wiring touch sensor, then Slope Parameters value is unique for each TX electrode and each part of touch sensor of connecting up thus for RX electrode), and

S _irepresent one (such as, i-th) adjusted value of separated sensor element, wherein, this adjusted value corresponds to the tail effect signal (as determined based near optimal fit line) at i-th sensor element and should deduct to correct tail effect from the differential signal of this sensor element.

In certain embodiments, Slope Parameters value (or coefficient) a can determine by using equation 2 below:

Wherein,

S _ithe difference value signal obtained from (such as, i-th) the separated sensor element formed by (such as, an i-th) RX electrode along given TX electrode,

I is its difference value signal s _ibe greater than " 0 " and be less than just by the RX index value (along given TX electrode) of (such as, i-th) separated sensor element of tail effect threshold value used,

N is greater than " 0 " and the quantity being less than the sensor element of the difference value signal of tail effect threshold value along having of given TX electrode,

for being greater than " 0 " and the summation being less than the difference value signal of the sensor element of the difference value signal of tail effect threshold value along having of given TX electrode, and

∑ i is the summation with the RX index value being greater than " 0 " and being less than the sensor element of the difference value signal of tail effect threshold value along given TX electrode.Therefore, according to equation 2, the differential signal only had has the sensor element of the value between " 0 " and " threshold value " for determining the parameter of near optimal fit line, and remaining sensor element and their RX index value are skipped and avoid calculating.

Example for the near optimal fit line of two wiring touch sensor (such as, such as best-fit line 808b) shown in Figure 8.As shown in Figure 8, the sensor element corresponding to the difference value signal indicated by Reference numeral 807 is only had for determining the parameter of best-fit line 808b.

In certain embodiments, after Slope Parameters (or coefficient) a for given TX electrode is determined (such as, the equation 2 according to above), for the adjusted value S of corresponding (such as, i-th) sensor element _icalculated (such as, according to equation 1 above).Tail effect is subsequently by using the difference value signal s of equation (3) below by obtaining from corresponding (such as, i-th) sensor element _ideduct adjusted value S _icorrect:

Diff _rxIndex＝s _rxIndex-a*rxIndex (3)

(it equals s _i-corrects=s _i-S _i)

Wherein,

A*rxIndex (such as, S _i) be the adjusted value corresponding to along given TX electrode and RX index value the tail effect being the sensor element (such as, i-th sensor element) of the RX electrode formation of " rxIndex ",

S _rxIndex(such as, s _i) be the difference value signal of sensor element (such as, i-th sensor element) original acquisition that the RX electrode being " rxIndex " along given TX electrode and RX index value is formed, and

Diff _rxIndex(such as, s _i-corrects) be the tail effect correction differential signal value of sensor element (such as, i-th sensor element) that the RX electrode being " rxIndex " along given TX electrode and RX index value is formed.

In the example shown in Fig. 8, the left side (such as, top) of touch sensor does not almost receive the signal from contact, and therefore, it is minimum that the tail effect for this side corrects.On the right side (such as, bottom) of touch sensor, observe the tail effect from contact, and be subtracted according to the parameter of the techniques described herein based on best-fit line 808b from the signal demand of this tail effect.The signal that produced (as tail effect correct) draw on Fig. 9.

Fig. 9 is the curve map of the comparison that tail effect signal on two wiring touch sensor panels of Fig. 8 and correction signal are shown.In curve map 900, original signal 906 (such as, as by detect from the specific scan operation of two wiring touch sensor) and correction signal 916 are along representing the X-axis of RX index value 804 and representing that the Y-axis of difference value signal 802 is drawn.As shown in Figure 9, tail effect signal 907 is eliminated from original signal 906, and appears without tail end in correction signal 916 again.Sometimes, in certain embodiments, tail effect corrects the negative signal value that can produce sensor element tail effect wherein being detected; But, this calculates unimportant to position (such as, position coordinates), because position calculation algorithm in these embodiments gets rid of all negative differential signal values.

In certain embodiments, tail effect corrects the position calculation of contact being only applied to and performing and detect, and tail effect corrects to should not be in after position calculation completes and is resumed original state.This is necessary, to keep in touch sensor sensor element about the correction reference value of the practical measurement signals from given scan operation, and guarantees that the input data for scan operation will have identical visual tail effect.

In certain embodiments, recover tail effect to correct and can perform by using equation 4 below:

Diff _rxIndex＝s _rxIndex+a*rxIndex (4)

(it equals s _i=s _i-corrects+ S _i)

Wherein,

A*rxIndex (such as, S _i) be the adjusted value corresponding to along given TX electrode and RX index value the tail effect being the sensor element (such as, i-th sensor element) of the RX electrode formation of " rxIndex ",

S _rxIndex(such as, s _i-corrects) be the difference value signal that the tail effect of the current storage of the sensor element (such as, i-th sensor element) that the RX electrode being " rxIndex " along given TX electrode and RX index value is formed corrects, and

Diff _rxIndex(such as, s _i) be recovery (such as, the original) difference value signal of sensor element (such as, i-th sensor element) that the RX electrode being " rxIndex " along given TX electrode and RX index value is formed.

This recovery that tail effect corrects is applied to separately each part (such as, if use the design of two wiring touch sensor) of the touch sensor that each TX electrode and RX electrode connect up by this.

The example of tail effect correction data is shown in Figure 10 A and 10B, and these data experimentally obtain from specific embodiment.Particularly, Figure 10 A illustrates the data structure 1000 storing difference value signal, and this difference value signal reflects the tail effect caused by the electric conductor on two wiring touch sensor.Figure 10 B illustrates the same data structure 1000 of the signal value stored through adjusting for the correction of tail effect.In Figure 10 A and 10B, the sensor element logical expressions of touch sensor are the box formed by 11 TX electrodes and 19 RX electrodes, wherein, TX index 1002 is that scope represents the round values sequence of 11 TX electrodes from 0 to 10, and RX index 1004 is scope round values sequences from 0 to 18 expressions, 19 RX electrodes.In the embodiment shown in Figure 10 A and 10B, there is index value " 0 " and arrive the RX electrode of " 9 " from top non-inductive area routing, thus form the top section of touch sensor, and the remaining index value " 10 " that has arrives the RX electrode of " 18 " from bottom non-inductive area routing, thus form the base section of this touch sensor.

In Figure 10 A, the difference value signal for the sensor element represented in data structure 1000 is obtained by the scan operation of putting in preset time.This difference value signal instruction contact is present in the contact area 1006a in the base section of touch sensor.This difference value signal also indicates tail effect to be present in tail effect region 1008.In fig. 1 ob, the difference value for the sensor element represented in data structure 1000 is corrected by for tail effect 1008 according to the techniques described herein.Such as, the adjusted value corresponding to tail effect has been calculated for the sensor element in touch sensor, and these adjusted values deduct from the corresponding difference value signal be stored in data structure 1000.Therefore, in fig. 1 ob, data structure 1000 is at contact area 1006b with corrected in territory, tail region 1018 signal value of correction differential stored for each sensor element.Therefore, Figure 10 A illustrates the initialize signal figure that there is tail effect, and Figure 10 B illustrates the correction signal figure that tail effect is eliminated according to the techniques described herein.After application tail effect corrects, as shown in Figure 10 B, the right side of position in the middle of contact area 1006b of the object contacted with touch sensor.

In the embodiment using two wiring touch sensor, RX index value (such as, " rxIndex " value that such as superincumbent equation 1,3 and 4 uses) touch sensor end always " 0 " (even if this RX index value corresponds to last RX electrode in the sequence), and should should have the RX index value of the increment number of this RX electrode equaled from touch sensor edge closest to the RX electrode (or sensor element) in the middle of touch sensor.In other words, in order to the object of tail effect correction calculation, the index of RX electrode should to be increased from RX electrode by this by the side of the touch sensor connected up from " 0 ".Therefore, when two wiring touch panel, in order to the object (such as, the equation 1,3 and 4 as above) of tail effect correction calculation as herein described, the mapping again of the RX index value of RX electrode may be needed.Such as, arrive " 18 " (nine RX electrodes for bottom) about Figure 10 A, RX index value " 10 " and before calculating tail effect corrects, should be again mapped to the value that " 9 " arrive " 0 " respectively.This is that the techniques described herein can be kept at a kind of mode of the correlativity existed between tail effect in single-layer touch sensor and RX index value and sole mode-in other words, tail effect increase with contact under the increase of RX index value of RX electrode proportional.

For correcting the method example of tail effect

Figure 11 illustrates the exemplary method for correcting tail effect.Method step in Figure 11 is described to be performed (processing logic 102 such as, in such as Fig. 1) by processing logic later.But it may be noted that each is implemented and embodiment can use various and possible multiple assembly to perform the operation of the method in Figure 11.Such as, in various embodiments, processing logic can be implemented in every way, and described various mode includes but not limited to: the software and/or firmware instructions that store as one group, when it is performed by one or more processor, it can operate and perform one or more operation; As the executable one or more component software of one or more calculation element (such as, software module, function library, the OO class, dynamic link library etc. of compiling and/or decipher); And as any combination of one or more component software and one or more nextport hardware component NextPort (such as, processor, microcontroller, special IC (ASIC) etc.).In another example, processing logic in various embodiments can be implemented or its function can be distributed in two or more assemblies that can perform some additional operations and function in single integrated package.Therefore, below, the description as the method performed by processing logic in Figure 11 should be regarded as illustrative implication and nonrestrictive implication.

At block 1100 to 1170, processing logic performs scan operation.At block 1100, as the part of scan operation, processing logic receives the multiple measurement results measured from sensor array.This measurement result is by the Contact Effect (such as, the finger of such as nib or user) of electric conductor at the touch-surface of sensor array.In certain embodiments, the measurement result received by processing logic can comprise the difference value signal for all sensors element in sensor array (or part); In other embodiments, processing logic can receive the raw measurement results (such as, original signal counting) of sensor elements and can calculate corresponding difference value signal.

After reception and/or calculating correspond to the difference value signal of received measurement result, in block 1102, variable (" txIndex ") is initialised to the operation of zero by processing logic execution, and this variable represents the TX index value of the current TX electrode just performing calculating for it.

In block 1104, processing logic determines whether to need processed any residue TX electrode.Such as, processing logic performs the compare operation being stored in the value in " txIndex " variable and comparing with variable or constant (" txLast "), this variable or constant (" txLast ") represent the summation (summation of the TX electrode such as, in such as sensor array) as the processed TX electrode of the part needs of scan operation.If " txIndex " variable is less than " txLast " variable, so, at least current TX electrode still needs to be processed, and this processing logic continues to perform the operation in block 1112 to 1128.If " txIndex " variable is not less than " txLast " variable, so, the difference value signal for the sensor element of all TX electrodes is all processed, and this processing logic continues to perform the operation in block 1130.

Block 1110 comprises block 1112 to 1126, this block comprises the operation that processing logic performs the Slope Parameters value a of the best-fit line of the tail effect signal (being indicated by " txIndex " variable) of the approximate current TX electrode of calculating (such as, according to equation 2 above).If sensor array is by two wiring, so, processing logic performs operation (such as, the operation in block 1112 to 1126) in block 1,110 twice-namely, once for each part of the sensor array of the RX electrode that connects up by this.It is to be noted, when performing these operations of the base section being used for sensor array, the RX index value of the RX electrode connected up from this part may need again to be mapped (such as, in order to preserve the correlativity existed between tail effect and RX index value) as mentioned above.

In block 1112, variable (" rxIndex ") is initialised to the operation of zero by processing logic execution, and this variable represents the RX index value of the current RX electrode (along current TX electrode) just performing calculating for it.

In block 1114, variable (" snsSum ") is initialised to the operation of zero by processing logic execution, and this variable represents the summation of the RX index value of the sensor element (being formed along current TX electrode) be included in Slope Parameters (or coefficient) the value a calculating current TX electrode.

In block 1116, processing logic determines whether any residue RX electrode needing to be treated for current TX electrode.Such as, processing logic performs the compare operation being stored in the value in " rxIndex " variable and comparing with variable or constant (" txLast "), and this variable or constant (" txLast ") represent the sum needing the RX electrode being treated for current TX electrode.If " rxIndex " variable is less than " rxLast " variable, so, at least current RX electrode still needs to be processed, and this processing logic continues to perform the operation in block 1118 to 1124.If " rxIndex " variable is not less than " rxLast " variable, so, difference value signal from all RX electrodes along current TX electrode is processed, and processing logic continues the operation of execution in block 1126, and (this block calculates the Slope Parameters value of current TX electrode a).

In block 1118, processing logic is determined in the calculating whether difference value signal of current RX electrode is included in for the Slope Parameters value a of current TX electrode.Such as, if the difference value signal of current RX electrode is greater than " 0 " and is less than tail effect threshold value, so, processing logic comprises this difference value signal in this computation.It may be noted that the actual difference value signal being formed " current " sensor element by current RX electrode (as by variable " rxIndex " instruction) and current TX electrode (as by variable " txIndex " instruction) of this difference value signal.Determine for carrying out this, processing logic can perform following operation (this operation is the Boolean calculation of compare operation operand):

Signal >0 and signal < threshold value

Wherein " signal " is the variable of the difference value signal storing current sensor element, and " threshold value " stores the variable being just used to processed scan operation (fixing or self-adaptation) tail effect threshold value.If " signal " variable is the variable between " 0 " and " threshold value ", so, current sensor element needs to be included in the calculating for the Slope Parameters value a of current TX electrode, and processing logic continues to perform the operation in block 1120 and 1122.If " signal " variable is not the variable between " 0 " and " threshold value ", so, current sensor element needs to be skipped by this calculating/get rid of, and processing logic continues to perform the operation in block 1124.

In block 1120, processing logic determines the summation of the difference value signal be included in for the sensor element in the calculating of the Slope Parameters value a of current TX electrode.Such as, processing logic is to the difference value signal (the current RX electrode of this sensor element by the instruction of " rxIndex " variable and the current TX electrode formation by the instruction of " txIndex " variable) of the current accumulative total interpolation current sensor element of the up to the present processed difference value signal for current TX electrode.For performing interpolation, processing logic can perform following operation

Summation [txIndex]=summation [txIndex]+signal

Wherein, " summation [txIndex] " be store for the difference value signal of current TX electrode accumulative total (such as, difference value signal by the sensor element formed for the RX electrode of current TX electrode be up to the present processed) variable, and " signal " is the variable of the difference value signal storing just processed current sensor element.

In block 1122, processing logic determines the summation of the RX index value be included in for the sensor element in the calculating (such as, according to equation 2 above) of current TX electrode.Such as, being included in of sensor element that this RX index value adds to along current TX electrode formation by processing logic calculates in the current accumulative total of the RX index value be used in the Slope Parameters value a of current TX electrode.For performing interpolation, processing logic can perform following operation

snsNum＝snsNum+rxIndex

This operation adds " rxIndex " variable to " snsNum " variable, thus is effectively added to by the RX index value of front electrode in the accumulative total of the RX index value of the sensor element being up to the present treated for current TX electrode.

In block 1124, processing logic setting needs the RX index value of processed next RX electrode and continues to perform the operation in block 1116.Such as, processing logic executable operations

rxIndex++

This operation adds " 1 " to " rxIndex " variable, to indicate next RX electrode to become now the current RX electrode supplying process; After this, processing logic continues the operation in block 1116.

After the difference value signal from all RX electrodes along current TX electrode is processed, processing logic determines that in block 1116 current " rxIndex " variable is not less than " rxLast " variable.Therefore, processing logic continues the operation in block 1126.

In block 1126, processing logic calculates the Slope Parameters value a of current TX electrode, and stores this parameter value be associated with current TX electrode.Such as, processing logic executable operations

Coef [txIndex]=summation [txIndex]/snsNum

Wherein, " Coef [txIndex] " stores the variable for the Slope Parameters value a of current TX electrode, " summation [txIndex] " is the variable of the summation of the difference value signal of the sensor element along current TX electrode stored for correcting tail effect, and " snsNum " is the variable of the summation of the RX index value of the sensor element for current TX electrode stored for correcting tail effect.

In block 1128, processing logic setting needs the TX index value of processed next TX electrode and continues to perform the operation in block 1104.Such as, processing logic executable operations

txIndex++

This operation adds " 1 " to " txIndex " variable, to indicate next TX electrode to become now the current TX electrode supplying process; After this, processing logic continues the operation in block 1104.

After the difference value signal for all TX electrodes is processed, processing logic determines that in block 1104 current " txIndex " variable is not less than " txLast " variable.Therefore, processing logic continues the operation in block 1130.

In block 1130, processing logic determines the adjusted value of the tail effect of the sensor element corresponded on each TX electrode, and subsequently by deducting its corresponding adjusted value from this type of difference value signal each, correct the difference value signal of these sensor elements on each TX electrode.Two exemplary methods for adjusting the difference value signal of sensor element tail effect are described about Figure 12 and 13 below.

In block 1150, the signal value that processing logic uses tail effect to correct performs local/maximum value search and calculates electric conductor position location on an array of sensors.Such as, in certain embodiments, the data structure of the tail effect correction signal value that processing logic can search for the single local maximum be stored in outside specific portion max-thresholds, wherein, described single local maximum is the signal value being greater than the signal value surrounding it in this data structure.Each in each signal value and its neighbor can compare by processing logic, and when its neighbor does not have much higher value, can judge that given signal value is local maximum.After this, processing logic uses (such as, in centre of moment location algorithm) about the information finding local maximum, to calculate electric conductor contact position on an array of sensors (such as, such as touch coordinate and/or the location centre of moment).

In certain embodiments, may only tail effect be needed to correct in the stage calculating electric conductor position location on an array of sensors.Therefore, after completing position calculation in these embodiments, the operation that processing logic can perform in block 1160 corrects with the tail effect recovering each TX electrode.Such as, in these embodiments, processing logic can perform the calculating above described in equation 4, so that in the raw differential signal value recovering to receive as the part of the scan operation in block 1100/obtain in corresponding data structure.This type of tail effect recovers any downstream subsequently guaranteed based on the data be stored in data structure to be executed correctly.

In certain embodiments, processing logic (optional) can upgrade the reference value of each sensor element for sensor array stored in block 1170.Usually, this type of reference value is stored in firmware and regularly maintains to guarantee the exact operations of sensor array.Such as, because the condition (such as, temperature, humidity etc.) of device operation may change, so at least some scan operation can be configured regularly calculating correction and apply this correction to stored reference value.

After recovery tail effect corrects and/or upgrades reference value, processing logic turns back to block 1100 and continues the next scan operation of process.

Figure 12 illustrates the exemplary method of the signal value according to some embodiment adjustment tail effect.Such as, the method for Figure 12 can be performed as a part for the operation in the block 1130 of Figure 11 as above.Method step in Figure 12 is described to be performed (processing logic 102 such as, in such as Fig. 1) by processing logic later.But it may be noted that each is implemented and embodiment can use various and possible multiple assembly to perform the operation of the method in Figure 12.Such as, in various embodiments, processing logic can be implemented in every way, and described various mode includes but not limited to: as one group of storing software and/or firmware instructions, when it is performed by one or more processor, it can operate and perform one or more operation; As the executable one or more component software of one or more calculation element; As any combination of one or more component software and one or more nextport hardware component NextPort; And as single integrated package or as two or more assemblies that can perform additional operations.Therefore, below, the description as the method performed by processing logic in Figure 12 should be regarded as illustrative implication and nonrestrictive implication.

At block 1204, Slope Parameters (or coefficient) the value a for the TX electrode of sensor array has been calculated and has been stored in the mode that the TX electrode corresponding with them is associated.Such as, as a part for any given scan operation, processing logic can keep (in memory or in firmware stores) stores and is calculated (such as, according to the block 1102-1128 in Figure 11) array for the parameter value of the TX electrode of sensor array.

With reference to Figure 12, in block 1132, variable (" txIndex ") is initialised to the operation of zero by processing logic execution, and this variable represents the TX index value of the current TX electrode just performing calculating for it.

In block 1134, processing logic determines whether to need processed any residue TX electrode.Such as, processing logic performs the compare operation being stored in the value in " txIndex " variable and comparing with variable or constant (" txLast "), this variable or constant (" txLast ") represent the sum (sum of the TX electrode such as, in such as sensor array) needing the TX electrode being treated for tail effect adjustment.If " txIndex " variable is less than " txLast " variable, so, at least current TX electrode still needs to be processed, and this processing logic continues to perform the operation in block 1136A to 1144.If " txIndex " variable is not less than " txLast " variable, so, the difference value signal for the sensor element of all TX electrodes is all processed, and this processing logic proceeds the operation in block 1250.

In block 1136A, variable (" rxIndex ") is initialised to the operation of zero by processing logic execution, and this variable represents the RX index value of the current RX electrode (along current TX electrode) just performing calculating for it.

In block 1138, processing logic determines whether any residue RX electrode needing to be treated for current TX electrode.Such as, processing logic performs the compare operation being stored in the value in " rxIndex " variable and comparing with variable or constant (" txLast "), and this variable or constant (" txLast ") represent the sum needing the RX electrode being treated for current TX electrode.If " rxIndex " variable is less than " rxLast " variable, so, at least current RX electrode still needs to be processed, and this processing logic continues to perform the operation in block 1140 and 1142.If " rxIndex " variable is not less than " rxLast " variable, so, difference value signal from the RX electrode along current TX electrode is processed, and processing logic continues to perform operation in block 1144 (setting of this block for the treatment of next TX electrode).

In block 1140, processing logic adjustment is used for the difference value signal of the tail effect of current sensor element (the current TX electrode of its current RX electrode by the instruction of " rxIndex " variable and the instruction of " txIndex " variable is formed).Such as, processing logic performs following operation

Signal _correct=signal-Coef [txIndex] * rxIndex

Wherein, " signal _correct" be that storage is as being adjusted for the variable of the difference value signal of the current sensor element of tail effect; " signal " is the variable of the measurement/acquisition difference value signal storing just processed current sensor element, and " Coef [txIndex] " is the variable of the Slope Parameters value a having been calculated and stored for current TX electrode.It may be noted that value (that is, product) " Coef [txIndex] * rxIndex " represents the adjusted value of the tail effect correcting current sensor element.

In block 1142, processing logic setting needs the RX index value of processed next RX electrode and continues the operation in block 1138.Such as, processing logic executable operations

rxIndex++

This operation adds " 1 " to " rxIndex " variable, to indicate next RX electrode to become now the current RX electrode supplying process; After this, processing logic continues the operation in block 1138.

After the difference value signal from all RX electrodes along current TX electrode is processed, processing logic determines that in block 1138 current " rxIndex " variable is not less than " rxLast " variable.Therefore, processing logic continues the operation in block 1144.

In block 1144, processing logic setting needs the TX index value of processed next TX electrode and continues the operation in block 1134.Such as, processing logic executable operations

txIndex++

This operation adds " 1 " to " txIndex " variable, to indicate next TX electrode to become now the current TX electrode supplying process; After this, processing logic continues the operation in block 1134.

After the difference value signal of the sensor element of all TX electrodes adjusts in the above described manner, processing logic determines that in block 1134 current " txIndex " variable is not less than " txLast " variable.Therefore, processing logic continues the operation in block 1250.

In block 1250, processing logic performs the operation (such as, such as using tail effect correction signal value calculating electric conductor position location on an array of sensors) described in block 1150 in fig. 11.

The example of supplementary features and alternate embodiment

In certain embodiments, can provide to avoid in certain operational situations may by some shortcoming in the inconsistent shortcoming caused of signal for the technology for correcting tail effect as herein described.

Such as, under large electric conductor when (such as, such as fat finger) signal imperfect earth, the sinking making the sequence of " annular (donut) " contact area may be had.When being detected on an array of sensors, this type of " annular " contact may cause some internal sensor components to be considered to have tail effect (such as, having the difference value signal lower than tail effect threshold value), and in fact, they are in contact.In other words, these difference value signals can be low to being enough under the tail effect threshold value be linearly similar to for best-fit.Therefore, when tail effect correction is employed as previously described, sinking (" annular " hole) in the signal value caused by large electric conductor will become larger, and owing to deducting tail effect adjustment from very low difference value signal, may increase the possibility that contact area is separated.But, this type of contact area is separated normally bad, because it may cause the single contact of the large electric conductor (such as, such as fat finger) of two detections (and position calculation) contacted separately instead of reality.

For solving this shortcoming, in certain embodiments, the techniques described herein provide the tail effect of those sensor elements only corrected in the sensor element downstream with maximum RX index value.(it may be noted that in this context, downstream refers to the direction of the sensor array column border away from the RX electrode that connects up by this.)

Figure 13 illustrates the adjustment tail effect the exemplary method avoiding contact area to be separated of considering that large electric conductor (such as, such as fat finger) contacts.Method in Figure 13 comprises the same block as the method in Figure 12, except such as compared with the block 1136A in Figure 12, beyond the block 1136B selecting different elements by this.

Each piece in Figure 13 operate in hereinafter is described to be performed (processing logic 102 such as, in such as Fig. 1) by processing logic.But it may be noted that each implement and embodiment can use difference and possible multiple assembly to perform the method in Figure 13.Therefore, below, the description as the method performed by processing logic in Figure 13 should be regarded as illustrative implication and nonrestrictive implication.

At block 1304, Slope Parameters (or coefficient) the value a for the TX electrode of sensor array has been calculated and has been stored in the mode that the TX electrode corresponding with them is associated.In block 1132, processing logic performs the operation of " txIndex " initialization of variable to zero, and " txIndex " variable represents the TX index value of current TX electrode.In block 1134, processing logic determines whether to need processed any residue TX electrode.Such as, if " txIndex " variable is less than " txLast " variable, so, at least current TX electrode still needs to be processed, and this processing logic continues to perform the operation in block 1136B to 1144.If " txIndex " variable is not less than " txLast " variable, so, the difference value signal for the sensor element of all TX electrodes is all processed, and this processing logic proceeds the operation in block 1350.

In block 1136B, processing logic only selects the tail effect adjustment its RX electrode being detected to those sensor elements in the RX electrode downstream with maximum difference value signal in the part as just processed scan operation.Such as, processing logic is by " rxIndex " initialization of variable to the value higher than variable (" rxMax ") value, and variable (" rxMax ") represents the RX index value being detected the RX electrode with the highest difference value signal along current TX electrode.For performing this initialization, processing logic can perform following operation

rxIndex＝rxMax+1

In order to the object of aforesaid operations, " rxMax " variable for each TX electrode can be found and in the linear approximation coefficient computing interval, preserve (such as, as a part for the operation in block 1112 to 1124 in Figure 11) in the mode be associated with this TX electrode.By setting " rxlndex " variable by this way, the techniques described herein provide the difference value signal that will be only corrected for those sensor elements of its RX index value outside " rxMax " index value scope of all TX electrodes.If sensor array is two wirings, so, the operation in block 1136B can be alone applied every one side of the sensor array in the RX electrode that connects up by this.

In block 1138, processing logic determines whether any residue RX electrode needing to be treated for current TX electrode.Such as, if " rxIndex " variable is less than " rxLast " variable, so, at least current RX electrode still needs to be processed, and this processing logic continues to perform the operation in block 1140 and 1142.If " rxIndex " variable is not less than " rxLast " variable, so, difference value signal from the RX electrode along current TX electrode is processed, and processing logic continues to perform operation in block 1144 (setting of this block for the treatment of next TX electrode).

In block 1140, processing logic adjustment is used for the difference value signal of the tail effect of current sensor element (the current TX electrode of its current RX electrode by the instruction of " rxIndex " variable and the instruction of " txIndex " variable is formed).Such as, processing logic performs following operation

Signal _correct=signal-Coef [txIndex] * rxIndex

It may be noted that value (that is, product) " Coef [txIndex] * rxIndex " represents the adjusted value of the tail effect correcting current sensor element.

In block 1142, processing logic setting needs the RX index value of processed next RX electrode and continues the operation in block 1138.After the difference value signal from the selected RX electrode along current TX electrode is processed, in block 1138, processing logic determines that current " rxIndex " variable is not less than " rxLast " variable.Therefore, processing logic continues the operation in block 1144.In block 1144, processing logic setting needs the TX index value of processed next TX electrode and continues the operation in block 1134.After the difference value signal of the sensor element of all TX electrodes is adjusted in the above described manner, in block 1134, processing logic determines that current " txIndex " variable is not less than " txLast " variable.Therefore, processing logic continues the operation in block 1350.In block 1350, processing logic performs the operation (such as, such as use tail effect correction signal value calculate the operation of electric conductor position location on an array of sensors) described in block 1150 in fig. 11.

In certain embodiments, the techniques described herein simple (such as, faster) implement can comprise calculating only for the Slope Parameters value of those TX electrodes between in the contact areas, and the tail effect of those sensor elements that adjustment is formed by means of only those TX electrodes.In these embodiments, method for correcting tail effect is similar to the method illustrated in figs. 11 and 12, cycle through except all TX electrodes except replacing, these methods only select the operation of the subset of TX electrode (such as, being such as only included in the subset of those TX electrodes in the middle of contact area) by providing.

In certain embodiments, the technology for correcting tail effect as herein described not only may be used for mutual capacitance type sensor array, and may be used for the sensor array with self-capacitance design.This type of application of the techniques described herein is possible for self-capacitance sensor array, can be activated because they also provide and can produce multiple sensors of signal distribution plots that can be analyzed.In addition, the techniques described herein are not only applied with capacitive induction and are associated, and may be used for other induction technologies (such as, remove the shade in optical sensor application), and can be used for providing the design of any other type of the arrays of sensor elements that can receive the spur signal be coupled with linear distribution figure.

Each embodiment of technology for correcting tail effect as herein described can comprise various operation.These operations can be performed by nextport hardware component NextPort, software, firmware or their combination.As used herein, term " is coupled in " and can means after direct-coupling by one or more plug-in package indirect coupling.Any signal provided in each bus as herein described can be provided by one or more common bus with other signal time division multiplexings.In addition, the interconnection between each circuit unit or each piece can be shown as each bus or single-signal-line.It is one or more single-signal-lines that each bus can be selected else, and each single-signal-line can to select else be each bus.

Specific embodiment may be implemented as computer program, and this program product can comprise and being stored on non-transitory computer-readable medium (such as, such as volatile storage and/or non-volatile storage).These instructions can be used for programming and comprise one or more universal or special processor (such as, such as CPU (central processing unit) or CPU) or its equivalent is (such as, such as process core, processing engine, microcontroller etc.) one or more devices, make when this instruction is performed by processor or its equivalent, this instruction impels the operation for correcting tail effect as herein described described in the execution of this device.Computer-readable medium can also comprise for storing with the readable form of machine (such as, such as device or computing machine) (such as, such as software, process application) or one or more mechanism of the information of transmission.Non-transitory computer-readable recording medium can include but not limited to electromagnetic memory medium (such as, floppy disk, hard disk etc.), optical storage medium (such as, CD-ROM), the medium of magnetic-optical storage medium, ROM (read-only memory) (ROM), random access memory (RAM), erasable and programable memory (such as, EPROM and EEPROM), flash memory or the another kind known or later development types now that is applicable to storage information.

Although the operation of context of methods illustrates with certain order and describes, the order of operation of often kind of method can be changed, and specific operation can be performed with reversed sequence, or makes specific operation can be operated to small part executed in parallel with other.In other embodiments, the child-operation of each instruction or different operating can with interval and/or the mode replaced.

In the foregoing specification, the present invention is described about its certain exemplary embodiments.But obviously, various change and change can be made to it, and the of the present invention more wide essence do not departed from as set forth in the following claims and scope.Therefore, this instructions and accompanying drawing should be considered to be exemplary implication instead of restrictive implication.

Claims (20)

1. a device, comprising:

Sensor array, described sensor array comprises multiple reception RX electrode and multiple transmission TX electrode, wherein, interlaced with each other and do not intersect in the touching induction region in described multiple RX electrode and the individual layer of multiple TX electrode on the substrate of described sensor array;

Sensor, described sensor is configured to be measured from multiple measurement results of described sensor array, and wherein, described multiple measurement result represents electric conductor and to contact with described sensor array or close to described sensor array; And

With the processing logic of described sensors coupled, wherein, described processing logic is configured and at least performs following operation:

Determine the set of the adjusted value corresponding to the tail effect be associated with described multiple measurement result; And

Set based on described adjusted value generates the measurement result after the adjustment corresponding to described multiple measurement result, and wherein, the measurement result after described adjustment corrects described tail effect.

2. device as claimed in claim 1, wherein, described tail effect comprises the spur signal that caused by the intercoupling between the principal trace line of the RX electrode affected by described electric conductor and TX electrode to be increased or spur signal reduces, wherein, the contiguous described TX electrode wiring of the described principal trace line of described RX electrode.

3. device as claimed in claim 2, wherein, the described principal trace line of described RX electrode and the forming section of described RX electrode are disposed in the described touching induction region of described sensor array, but the described forming section of described RX electrode does not affect by described electric conductor.

4. device as claimed in claim 1, wherein, described sensor array is included in the first non-inductive region on the opposite side of described sensor array and the second non-inductive region, wherein, first subset of multiple TX electrode described in the first subset sums of described multiple RX electrode is from described first non-inductive area routing, and the second subset of multiple TX electrode described in the second subset sums of described multiple RX electrode is from described second non-inductive area routing.

5. device as claimed in claim 1, wherein, described processing logic is also configured the measurement result after based on described adjustment and determines the position coordinates of described electric conductor on described sensor array.

6. device as claimed in claim 1, wherein, described multiple measurement result comprises the signal value of the sensor element formed by the specific T X electrode of described sensor array, and wherein, the measurement result after described adjustment comprises the adjusted value corresponding to described signal value.

7. device as claimed in claim 6, wherein, in order to determine the described adjusted value about described specific T X electrode, described processing logic is configured and performs following operation:

Calculate the summation of the index forming the RX electrode of described sensor element along described specific T X electrode;

Calculate the summation along the described signal value of the described sensor element of described specific T X electrode;

Based on summation and the described signal value summation calculating parameter value of described index; And

At least based on: the index of each described signal value, described parameter value and corresponding RX electrode adjusts each signal value in described signal value, to obtain corresponding adjusted value.

8. device as claimed in claim 6, wherein, the described signal value of the described sensor element formed by described specific T X electrode is less than tail effect threshold value.

9. device as claimed in claim 6, wherein, the described RX electrode forming described sensor element along described specific T X electrode has the index being greater than and being formed and have the index of the RX electrode of the sensor element of peak signal value.

10. a method, comprising:

Receive the multiple measurement results measured from sensor array, wherein, described multiple measurement result represents electric conductor and to contact with described sensor array or close to described sensor array;

Wherein, described sensor array comprises multiple reception RX electrode and multiple transmission TX electrode, wherein, interlaced with each other and do not intersect in the touching induction region in described multiple RX electrode and the individual layer of described multiple TX electrode on the substrate of described sensor array;

The set of the adjusted value corresponding to the tail effect be associated with described multiple measurement result determined by treating apparatus; And

Set based on described adjusted value generates the measurement result after the adjustment corresponding to described multiple measurement result, and wherein, the measurement result after described adjustment corrects described tail effect.

11. methods as claimed in claim 10, wherein, described tail effect comprises the spur signal that caused by the intercoupling between the principal trace line of the RX electrode affected by described electric conductor and TX electrode to be increased or spur signal reduces, and wherein, the contiguous described TX electrode wiring of the described principal trace line of described RX electrode.

12. methods as claimed in claim 11, wherein, the principal trace line of described RX electrode and the forming section of described RX electrode are disposed in the described touching induction region of described sensor array, but the described forming section of described RX electrode does not affect by described electric conductor.

13. methods as claimed in claim 10, also comprise the differential signal determining the sensor element of described sensor array based on received multiple measurement results.

14. methods as claimed in claim 10, wherein:

Described multiple measurement result comprises the signal value of the sensor element formed by the specific T X electrode of described sensor array; And

Measurement result after described adjustment determined by described treating apparatus comprises:

Calculate the summation of the index forming the RX electrode of described sensor element along described specific T X electrode;

Calculate the summation along the described signal value of the described sensor element of described specific T X electrode;

Parameter value is calculated based on the summation of described index and the described summation of described signal value; And

At least based on: the index of each described signal value, described parameter value and corresponding RX electrode adjusts each signal value in described signal value, to obtain corresponding adjusted value.

15. methods as claimed in claim 14, wherein, the measurement result after described adjustment determined by described treating apparatus also comprises:

By described multiple measurement result and tail effect threshold value being compared, select the described signal value of the described sensor element formed by the described specific T X electrode of described sensor array.

16. methods as claimed in claim 14, wherein, the measurement result after described adjustment determined by described treating apparatus also comprises:

Determine to be formed the first index of the RX electrode of the sensor element with peak signal value; And

By only selecting to be less than tail effect threshold value and those signal values with the index being greater than described first index select the described signal value of the described sensor element formed by the described specific T X electrode of described sensor array.

17. methods as claimed in claim 10, also comprise, determine the position coordinates of described electric conductor on described sensor array based on the measurement result after described adjustment.

18. 1 kinds of systems, comprising:

Capacitive sensor array, described capacitive sensor array comprises multiple reception RX electrode and multiple transmission TX electrode, wherein, interlaced with each other and do not intersect in the touching induction region in described multiple RX electrode and the individual layer of described multiple TX electrode on the substrate of described capacitive sensor array;

Capacitance type sensor, described capacitance type sensor is coupled with described capacitive sensor array, described capacitance type sensor is configured from the multiple measurement result of described multiple RX electrode measurements, wherein, described multiple measurement result represents electric conductor and to contact with described capacitive sensor array or close to described capacitive sensor array; And

Processing logic, described processing logic is coupled with described capacitance type sensor, and wherein, described processing logic is configured and at least performs following operation:

Determine the set of the adjusted value corresponding to the tail effect be associated with described multiple measurement result; And

Set based on described adjusted value generates the measurement result after the adjustment corresponding to described multiple measurement result, and wherein, the measurement result after described adjustment corrects described tail effect.

19. systems as claimed in claim 18, wherein:

Described tail effect comprises to be increased or spur signal reduces by the be coupled spur signal that causes of the stray capacitance between the principal trace line of the RX electrode affected by described electric conductor and TX electrode, wherein, and the contiguous described TX electrode wiring of described principal trace line of described RX electrode; And

The described principal trace line of described RX electrode and the forming section of described RX electrode are disposed in the described touching induction region of described capacitive sensor array, but the described forming section of described RX electrode does not affect by described electric conductor.

20. systems as claimed in claim 18, wherein, described capacitive sensor array is included in the first non-inductive region on the opposite side of described capacitive sensor array and the second non-inductive region, wherein, first subset of multiple TX electrode described in the first subset sums of described multiple RX electrode is from described first non-inductive area routing, and the second subset of multiple TX electrode described in the second subset sums of described multiple RX electrode is from described second non-inductive area routing.