CN104950506A - Method for aligning TFT substrates with CF substrates - Google Patents
Method for aligning TFT substrates with CF substrates Download PDFInfo
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- CN104950506A CN104950506A CN201510459271.8A CN201510459271A CN104950506A CN 104950506 A CN104950506 A CN 104950506A CN 201510459271 A CN201510459271 A CN 201510459271A CN 104950506 A CN104950506 A CN 104950506A
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/133308—Support structures for LCD panels, e.g. frames or bezels
- G02F1/133325—Assembling processes
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Abstract
The invention provides a method for aligning TFT substrates with CF substrates. The method comprises the following steps: increasing the process of pairing the TFT substrates with the CF substrates on the basis that the TFT substrates and the CF substrates are manufactured in an explanation way by a traditional full-distance measurement method, so as to pair and align the TFT substrates with the CF substrates, of which the full-distance deviation values approach to each other. The method has higher aligning precision, and can meet the requirement of assembly of a high-resolution TFT-LCD product, and moreover, a color mixing risk, which is caused by the fact that the high-resolution TFT-LCD product is thinned due to the line width of a BM (Black Matrix), is reduced.
Description
Technical field
The present invention relates to technical field of liquid crystal display, particularly relate to the alignment method of a kind of TFT substrate and CF substrate.
Background technology
Thin Film Transistor-LCD (Thin Film Transistor liquid crystal display, TFT-LCD) be utilize the characteristic of liquid crystal material to show a kind of panel display apparatus of image, it has more frivolous, the advantage such as low driving voltage and low-power consumption compared to other display device, has become the main product on current whole consumption market.
TFT-LCD generally includes housing, is located at the panel in housing and is located at the backlight module (Backlight module) in housing.
The structure of TFT-LCD panel is by a colored filter substrate (Color Filter, CF) a, thin-film transistor array base-plate (Thin Film Transistor Array Substrate, TFT Array Substrate) and a liquid crystal layer (Liquid Crystal Layer) be configured between two substrates formed, its principle of work is by applying the rotation that driving voltage controls the liquid crystal molecule of liquid crystal layer on two panels glass substrate, the light refraction of backlight module out being produced picture.The manufacturing process of existing TFT-LCD panel is broadly divided into leading portion array (Array) technique, stage casing becomes box (Cell) technique and back segment module group assembling (Module) technique.Leading portion array processes mainly forms TFT substrate and CF substrate; Stage casing molding process is responsible for, by TFT substrate and CF substrate to group, injecting liquid crystal between and being cut to the size conforming with product; Back segment module group assembling technique is then responsible for the panel after by combination and backlight module, panel drive circuit and housing etc. are assembled.
At present, TFT substrate and CF substrate are all carried out in the mode of alignment mark (Mark) contraposition organizing, as shown in Figure 1, carried out surveying charge-coupled vertical operation with alignment mark 11 contraposition of CF side by corresponding TFT side alignment mark 21 by reading TFT side alignment mark 21 in TFT substrate 20 to the CF side alignment mark 11 on CF substrate 10, the situation after TFT side alignment mark 21 and alignment mark 11 contraposition of CF side complete as shown in Figure 2.As can be seen here, the collocation situation that factor that TFT substrate and CF substrate survey charge-coupled vertical success or not is TFT substrate and CF substrate is affected.The known method that current industry uses adopts range mensuration (Total Pitch) to survey incompatible carrying out group optimization also known as a long cun method.So-called range mensuration, namely after TFT substrate completes, measure the distance values between each TFT side alignment mark in TFT substrate, determine specification and require that CF substrate is according to the CF side alignment mark of this specification corresponding making uniform distances value, guarantees that two substrates can smoothly to group.
It is one of necessary project that range mensuration surveys conjunction mode in the new product of TFT-LCD is produced, and nearly all advanced lines LCD production line all have employed this technology, to guarantee that the group of product founds situation.But for the TFT-LCD product of high resolving power, high-res, because high resolving power requires black matrix" (the Black Matrix on CF substrate, BM) live width reduces, and the live width of BM reduce after require for the precision surveying conjunction will be more harsh, if still adopt traditional range mensuration to survey risk that conjunction mode effectively cannot reduce TFT-LCD product colour mixture.
Summary of the invention
The object of the present invention is to provide the alignment method of a kind of TFT substrate and CF substrate, there is higher aligning accuracy, the group that can meet high resolving power TFT-LCD product stands requirement, and reduces high resolving power TFT-LCD product produces colour mixture risk because of the refinement of BM live width.
For achieving the above object, the invention provides the alignment method of a kind of TFT substrate and CF substrate, comprise the steps:
Step 1, survey conjunction mode based on traditional range mensuration and produce multiple TFT substrate and multiple CF substrate with identical range standard value, each TFT substrate has TFT side alignment mark, each CF substrate has CF side alignment mark corresponding with TFT side alignment mark respectively;
The range actual value of the CF side alignment mark on step 2, the range actual value measuring the TFT side alignment mark in each TFT substrate respectively and each CF substrate, and the range actual value of TFT side alignment mark calculated respectively in each TFT substrate and the X of range standard value are to the range actual value of CF side alignment mark in deviate and Y-direction deviate and each CF substrate and the X of range standard value to deviate and Y-direction deviate;
Step 3, set same as deviate scope, and be divided into multiple group by described with reference to deviate scope, the range actual value of TFT side alignment mark and the X of range standard value are done to drop into the TFT substrate that deviate and Y-direction deviate fall into different group and indicates, be the range actual value of CF side alignment mark and the X of range standard value to drop into the CF substrate that deviate and Y-direction deviate fall into different group indicating;
Step 4, the input indicating according to the input that TFT substrate is done and CF substrate does indicate, and carry out input match to TFT substrate and CF substrate;
Step 5, by pairing TFT substrate and the contraposition of CF substrate.
In described step 3, the reference deviate scope of setting is between-3um and 3um.
Described reference deviate scope is divided into the first group, the second group and the 3rd group ,-3um≤the first group <-1um ,-1um≤the second group < 1um, 1um≤three group≤3um.
T1 is denoted as to the input that the range actual value of TFT side alignment mark and the X of range h standard value are done to the TFT substrate that deviate and Y-direction deviate all fall into the first group, to deviate, the first group is fallen into X, the input that the TFT substrate that Y-direction deviate falls into the second group is done is denoted as T2, to deviate, the first group is fallen into X, the input that the TFT substrate that Y-direction deviate falls into the 3rd group is done is denoted as T3, to deviate, the second group is fallen into X, the input that the TFT substrate that Y-direction deviate falls into the first group is done is denoted as T4, T5 is denoted as to the input that X does to the TFT substrate that deviate and Y-direction deviate all fall into the second group, to deviate, the second group is fallen into X, the input that the TFT substrate that Y-direction deviate falls into the 3rd group is done is denoted as T6, to deviate, the 3rd group is fallen into X, the input that the TFT substrate that Y-direction deviate falls into the first group is done is denoted as T7, to deviate, the 3rd group is fallen into X, the input that the TFT substrate that Y-direction deviate falls into the second group is done is denoted as T8, T9 is denoted as to the input that X does to the TFT substrate that deviate and Y-direction deviate all fall into the 3rd group,
C1 is denoted as to the input that the range actual value of CF side alignment mark and the X of range standard value are done to the CF substrate that deviate and Y-direction deviate all fall into the first group, to deviate, the first group is fallen into X, the input that the CF substrate that Y-direction deviate falls into the second group does is denoted as C2, to deviate, the first group is fallen into X, the input that the CF substrate that Y-direction deviate falls into the 3rd group does is denoted as C3, to deviate, the second group is fallen into X, the input that the CF substrate that Y-direction deviate falls into the first group does is denoted as C4, C5 is denoted as to the input that X does to the CF substrate that deviate and Y-direction deviate all fall into the second group, to deviate, the second group is fallen into X, the input that the CF substrate that Y-direction deviate falls into the 3rd group does is denoted as C6, to deviate, the 3rd group is fallen into X, the input that the CF substrate that Y-direction deviate falls into the first group does is denoted as C7, to deviate, the 3rd group is fallen into X, the input that the CF substrate that Y-direction deviate falls into the second group does is denoted as C8, C9 is denoted as to the input that X does to the CF substrate that deviate and Y-direction deviate all fall into the 3rd group.
Described step 4 pair TFT substrate and CF substrate carry out input and match and carry out priority according to the priority and sort, the range actual value of TFT side alignment mark and the X of range standard value more level off to the range actual value of CF side alignment mark and the X of range standard value to deviate and Y-direction deviate to deviate and Y-direction deviate, and priority is higher.
The range actual value of TFT side alignment mark and the X of range standard value fall into same group to deviate and the range actual value of CF side alignment mark and the X of range standard value to deviate, when simultaneously the range actual value of TFT side alignment mark and the Y-direction deviate of range standard value and the range actual value of CF side alignment mark and the Y-direction deviate of range standard value fall into same group, it is the highest that TFT substrate and CF substrate carry out dropping into the priority of matching.
The matching method that priority is the highest is: drop into the TFT substrate that is denoted as T1 and drop into the CF substrate being denoted as C1 and match, drop into the TFT substrate that is denoted as T2 and drop into the CF substrate being denoted as C2 and match, drop into the TFT substrate that is denoted as T3 and drop into the CF substrate being denoted as C3 and match, drop into the TFT substrate that is denoted as T4 and drop into the CF substrate being denoted as C4 and match, drop into the TFT substrate that is denoted as T5 and drop into the CF substrate being denoted as C5 and match, drop into the TFT substrate that is denoted as T6 and drop into the CF substrate being denoted as C6 and match, drop into the TFT substrate that is denoted as T7 and drop into the CF substrate being denoted as C7 and match, drop into the TFT substrate that is denoted as T8 and drop into the CF substrate being denoted as C8 and match, drop into the TFT substrate that is denoted as T9 and drop into the CF substrate being denoted as C9 and match.
Beneficial effect of the present invention: the alignment method of a kind of TFT substrate provided by the invention and CF substrate, make on the basis of TFT substrate and CF substrate surveying conjunction mode with traditional range mensuration, add and carry out dropping into the process of matching to TFT substrate and CF substrate, the TFT substrate of range deviate convergence and CF substrate is made to match contraposition, there is higher aligning accuracy, the group that can meet high resolving power TFT-LCD product stands requirement, and reduces high resolving power TFT-LCD product produces colour mixture risk because of the refinement of BM live width.
In order to further understand feature of the present invention and technology contents, refer to following detailed description for the present invention and accompanying drawing, but accompanying drawing only provides reference and explanation use, is not used for being limited the present invention.
Accompanying drawing explanation
Below in conjunction with accompanying drawing, by the specific embodiment of the present invention describe in detail, will make technical scheme of the present invention and other beneficial effect apparent.
In accompanying drawing,
Fig. 1 is that existing TFT substrate and CF substrate carry out the schematic diagram of contraposition with alignment mark;
Fig. 2 is the schematic diagram after completing corresponding to the TFT side alignment mark in Fig. 1 and the alignment mark contraposition of CF side;
Fig. 3 is the process flow diagram of the alignment method of TFT substrate of the present invention and CF substrate;
Fig. 4 to Fig. 8 is respectively in the alignment method of TFT substrate of the present invention and CF substrate and TFT substrate and CF substrate is carried out according to priority level height the schematic diagram that matches;
Fig. 9 corresponds to the TFT substrate of Fig. 4 to Fig. 8 and the matching method table of CF substrate.
Embodiment
For further setting forth the technological means and effect thereof that the present invention takes, be described in detail below in conjunction with the preferred embodiments of the present invention and accompanying drawing thereof.
Refer to Fig. 3, composition graphs 4 to Fig. 8, the invention provides the alignment method of a kind of TFT substrate and CF substrate, comprise the steps:
Step 1, survey conjunction mode based on traditional range mensuration and produce multiple TFT substrate and multiple CF substrate with identical range standard value, each TFT substrate has TFT side alignment mark, each CF substrate has CF side alignment mark corresponding with TFT side alignment mark respectively.
The range actual value of the CF side alignment mark on step 2, the range actual value measuring the TFT side alignment mark in each TFT substrate respectively and each CF substrate, and the range actual value of TFT side alignment mark calculated respectively in each TFT substrate and the X of range standard value to deviate Δ TP1 (X) with the range actual value of CF side alignment mark on Y-direction deviate Δ TP1 (Y) and each CF substrate with the X of range standard value to deviate Δ TP2 (X) and Y-direction deviate Δ TP2 (Y).
Step 3, set same as deviate scope, and be divided into multiple group by described with reference to deviate scope, the range actual value of TFT side alignment mark and the X of range standard value are done to drop into the TFT substrate that deviate Δ TP1 (X) and Y-direction deviate Δ TP1 (Y) fall into different group and indicates, be the range actual value of CF side alignment mark and the X of range standard value to drop into the CF substrate that deviate Δ TP2 (X) and Y-direction deviate Δ TP2 (Y) fall into different group indicating.
Particularly, as shown in arbitrary width figure of Fig. 4 to Fig. 8, the reference deviate scope Jie Yu of setting in this step 3 ?between 3um and 3um.Described with reference to deviate scope be divided into the first group, the second group and the 3rd group ， ?3um≤the first group < ?1um ， ?1um≤the second group < 1um, 1um≤three group≤3um.
T1 is denoted as to the input that the range actual value of TFT side alignment mark and the X of range standard value are done to the TFT substrate that deviate Δ TP1 (X) and Y-direction deviate Δ TP1 (Y) all fall into the first group, to deviate Δ TP1 (X), the first group is fallen into X, the input that the TFT substrate that Y-direction deviate Δ TP1 (Y) falls into the second group is done is denoted as T2, to deviate Δ TP1 (X), the first group is fallen into X, the input that the TFT substrate that Y-direction deviate Δ TP1 (Y) falls into the 3rd group is done is denoted as T3, to deviate Δ TP1 (X), the second group is fallen into X, the input that the TFT substrate that Y-direction deviate Δ TP1 (Y) falls into the first group is done is denoted as T4, T5 is denoted as to the input that X does to the TFT substrate that deviate Δ TP1 (X) and Y-direction deviate Δ TP1 (Y) all fall into the second group, to deviate Δ TP1 (X), the second group is fallen into X, the input that the TFT substrate that Y-direction deviate Δ TP1 (Y) falls into the 3rd group is done is denoted as T6, to deviate Δ TP1 (X), the 3rd group is fallen into X, the input that the TFT substrate that Y-direction deviate Δ TP1 (Y) falls into the first group is done is denoted as T7, to deviate Δ TP1 (X), the 3rd group is fallen into X, the input that the TFT substrate that Y-direction deviate Δ TP1 (Y) falls into the second group is done is denoted as T8, T9 is denoted as to the input that X does to the TFT substrate that deviate Δ TP1 (X) and Y-direction deviate Δ TP1 (Y) all fall into the 3rd group.
C1 is denoted as to the input that the range actual value of CF side alignment mark and the X of range standard value are done to the CF substrate that deviate Δ TP2 (X) and Y-direction deviate Δ TP2 (Y) all fall into the first group, to deviate Δ TP2 (X), the first group is fallen into X, the input that the CF substrate that Y-direction deviate Δ TP2 (Y) falls into the second group does is denoted as C2, to deviate Δ TP2 (X), the first group is fallen into X, the input that the CF substrate that Y-direction deviate Δ TP2 (Y) falls into the 3rd group does is denoted as C3, to deviate Δ TP2 (X), the second group is fallen into X, the input that the CF substrate that Y-direction deviate Δ TP2 (Y) falls into the first group does is denoted as C4, C5 is denoted as to the input that X does to the CF substrate that deviate Δ TP2 (X) and Y-direction deviate Δ TP2 (Y) all fall into the second group, to deviate Δ TP2 (X), the second group is fallen into X, the input that the CF substrate that Y-direction deviate Δ TP2 (Y) falls into the 3rd group does is denoted as C6, to deviate Δ TP2 (X), the 3rd group is fallen into X, the input that the CF substrate that Y-direction deviate Δ TP2 (Y) falls into the first group does is denoted as C7, to deviate Δ TP2 (X), the 3rd group is fallen into X, the input that the CF substrate that Y-direction deviate Δ TP2 (Y) falls into the second group does is denoted as C8, C9 is denoted as to the input that X does to the CF substrate that deviate Δ TP2 (X) and Y-direction deviate Δ TP2 (Y) all fall into the 3rd group.
Step 4, the input indicating according to the input that TFT substrate is done and CF substrate does indicate, and carry out input match to TFT substrate and CF substrate.
Especially, it should be noted that, this step 4 pair TFT substrate and CF substrate carry out input and match and carry out priority according to the priority and sort, the range actual value of TFT side alignment mark and the X of range standard value more level off to the range actual value of CF side alignment mark with the X of range standard value to deviate Δ TP2 (X) and Y-direction deviate Δ TP2 (Y) to deviate Δ TP1 (X) and Y-direction deviate Δ TP1 (Y), then priority is higher.
Same group is fallen into deviate Δ TP1 (X) and the range actual value of CF side alignment mark and the X of range standard value to deviate Δ TP2 (X) at the range actual value of TFT side alignment mark and the X of range standard value, when simultaneously the range actual value of TFT side alignment mark and Y-direction deviate Δ TP2 (Y) of Y-direction deviate Δ TP1 (Y) of range standard value and the range actual value of CF side alignment mark and range standard value fall into same group, it is the highest that TFT substrate and CF substrate carry out dropping into the priority of matching.Be reflected on Fig. 4, namely the matching method that priority is the highest is: drop into the TFT substrate that is denoted as T1 and drop into the CF substrate being denoted as C1 and match, drop into the TFT substrate that is denoted as T2 and drop into the CF substrate being denoted as C2 and match, drop into the TFT substrate that is denoted as T3 and drop into the CF substrate being denoted as C3 and match, drop into the TFT substrate that is denoted as T4 and drop into the CF substrate being denoted as C4 and match, drop into the TFT substrate that is denoted as T5 and drop into the CF substrate being denoted as C5 and match, drop into the TFT substrate that is denoted as T6 and drop into the CF substrate being denoted as C6 and match, drop into the TFT substrate that is denoted as T7 and drop into the CF substrate being denoted as C7 and match, drop into the TFT substrate that is denoted as T8 and drop into the CF substrate being denoted as C8 and match, drop into the TFT substrate that is denoted as T9 and drop into the CF substrate being denoted as C9 and match.
Figure 5 shows that the matching method being only second to limit priority: drop into the TFT substrate that is denoted as T1 and drop into the CF substrate being denoted as C2 and match, drop into the TFT substrate that is denoted as T2 and drop into the CF substrate being denoted as C3 and match, drop into the TFT substrate that is denoted as T4 and drop into the CF substrate being denoted as C5 and match, drop into the TFT substrate that is denoted as T5 and drop into the CF substrate being denoted as C6 and match, drop into the TFT substrate that is denoted as T7 and drop into the CF substrate being denoted as C8 and match, drop into the TFT substrate that is denoted as T8 and drop into the CF substrate being denoted as C9 and match, drop into the CF substrate being denoted as C1 to match with the TFT substrate that input is denoted as T2, drop into the CF substrate being denoted as C2 to match with the TFT substrate that input is denoted as T3, drop into the CF substrate being denoted as C4 to match with the TFT substrate that input is denoted as T5, drop into the CF substrate being denoted as C5 to match with the TFT substrate that input is denoted as T6, drop into the CF substrate being denoted as C7 to match with the TFT substrate that input is denoted as T8, drop into the CF substrate being denoted as C8 to match with the TFT substrate that input is denoted as T9.
The priority that TFT substrate shown in Fig. 6, Fig. 7, Fig. 8 and CF substrate carry out matching reduces successively, no longer launches to describe in detail herein.In actual mechanical process, can select to drop into the TFT substrate that indicates and CF substrate matches with corresponding according to priority sequencing from high to low by the matching method table of the TFT substrate shown in Fig. 9 and CF substrate.
Step 5, by pairing TFT substrate and the contraposition of CF substrate.
The TFT substrate of range deviate convergence and CF substrate are matched contraposition by this step 5, there is higher aligning accuracy, can meet high resolving power TFT ?the group of LCD product stand requirement, and reduce high resolving power TFT ?LCD product produce the risk of colour mixture because of the refinement of BM live width.
In sum, the alignment method of TFT substrate of the present invention and CF substrate, make on the basis of TFT substrate and CF substrate surveying conjunction mode with traditional range mensuration, add and carry out dropping into the process of matching to TFT substrate and CF substrate, the TFT substrate of range deviate convergence and CF substrate is made to match contraposition, have higher aligning accuracy, the group that can meet high resolving power TFT-LCD product stands requirement, and reduces high resolving power TFT-LCD product produces colour mixture risk because of the refinement of BM live width.
The above, for the person of ordinary skill of the art, can make other various corresponding change and distortion according to technical scheme of the present invention and technical conceive, and all these change and be out of shape the protection domain that all should belong to the claims in the present invention.
Claims (7)
1. an alignment method for TFT substrate and CF substrate, is characterized in that, comprises the steps:
Step 1, survey conjunction mode based on traditional range mensuration and produce multiple TFT substrate and multiple CF substrate with identical range standard value, each TFT substrate has TFT side alignment mark, each CF substrate has CF side alignment mark corresponding with TFT side alignment mark respectively;
The range actual value of the CF side alignment mark on step 2, the range actual value measuring the TFT side alignment mark in each TFT substrate respectively and each CF substrate, and the range actual value of TFT side alignment mark calculated respectively in each TFT substrate and the X of range standard value to deviate (Δ TP1 (X)) with the range actual value of CF side alignment mark in Y-direction deviate (Δ TP1 (Y)) and each CF substrate with the X of range standard value to deviate (Δ TP2 (X)) and Y-direction deviate (Δ TP2 (Y));
Step 3, set same as deviate scope, and be divided into multiple group by described with reference to deviate scope, the range actual value of TFT side alignment mark and the X of range standard value are done to drop into the TFT substrate that deviate (Δ TP1 (X)) and Y-direction deviate (Δ TP1 (Y)) fall into different group and indicates, be the range actual value of CF side alignment mark and the X of range standard value to drop into the CF substrate that deviate (Δ TP2 (X)) and Y-direction deviate (Δ TP2 (Y)) fall into different group indicating;
Step 4, the input indicating according to the input that TFT substrate is done and CF substrate does indicate, and carry out input match to TFT substrate and CF substrate;
Step 5, by pairing TFT substrate and the contraposition of CF substrate.
2. the alignment method of TFT substrate as claimed in claim 1 and CF substrate, is characterized in that, in described step 3, the reference deviate scope of setting is between-3um and 3um.
3. the alignment method of TFT substrate as claimed in claim 2 and CF substrate, it is characterized in that, described reference deviate scope is divided into the first group, the second group and the 3rd group,-3um≤the first group <-1um,-1um≤the second group < 1um, 1um≤three group≤3um.
4. the alignment method of TFT substrate as claimed in claim 3 and CF substrate, it is characterized in that, T1 is denoted as to the input that the range actual value of TFT side alignment mark and the X of range standard value are done to the TFT substrate that deviate (Δ TP1 (X)) and Y-direction deviate (Δ TP1 (Y)) all fall into the first group, to deviate (Δ TP1 (X)), the first group is fallen into X, the input that the TFT substrate that Y-direction deviate (Δ TP1 (Y)) falls into the second group is done is denoted as T2, to deviate (Δ TP1 (X)), the first group is fallen into X, the input that the TFT substrate that Y-direction deviate (Δ TP1 (Y)) falls into the 3rd group is done is denoted as T3, to deviate (Δ TP1 (X)), the second group is fallen into X, the input that the TFT substrate that Y-direction deviate (Δ TP1 (Y)) falls into the first group is done is denoted as T4, T5 is denoted as to the input that X does to the TFT substrate that deviate (Δ TP1 (X)) and Y-direction deviate (Δ TP1 (Y)) all fall into the second group, to deviate (Δ TP1 (X)), the second group is fallen into X, the input that the TFT substrate that Y-direction deviate (Δ TP1 (Y)) falls into the 3rd group is done is denoted as T6, to deviate (Δ TP1 (X)), the 3rd group is fallen into X, the input that the TFT substrate that Y-direction deviate (Δ TP1 (Y)) falls into the first group is done is denoted as T7, to deviate (Δ TP1 (X)), the 3rd group is fallen into X, the input that the TFT substrate that Y-direction deviate (Δ TP1 (Y)) falls into the second group is done is denoted as T8, T9 is denoted as to the input that X does to the TFT substrate that deviate (Δ TP1 (X)) and Y-direction deviate (Δ TP1 (Y)) all fall into the 3rd group,
C1 is denoted as to the input that the range actual value of CF side alignment mark and the X of range standard value are done to the CF substrate that deviate (Δ TP2 (X)) and Y-direction deviate (Δ TP2 (Y)) all fall into the first group, to deviate (Δ TP2 (X)), the first group is fallen into X, the input that the CF substrate that Y-direction deviate (Δ TP2 (Y)) falls into the second group does is denoted as C2, to deviate (Δ TP2 (X)), the first group is fallen into X, the input that the CF substrate that Y-direction deviate (Δ TP2 (Y)) falls into the 3rd group does is denoted as C3, to deviate (Δ TP2 (X)), the second group is fallen into X, the input that the CF substrate that Y-direction deviate (Δ TP2 (Y)) falls into the first group does is denoted as C4, C5 is denoted as to the input that X does to the CF substrate that deviate (Δ TP2 (X)) and Y-direction deviate (Δ TP2 (Y)) all fall into the second group, to deviate (Δ TP2 (X)), the second group is fallen into X, the input that the CF substrate that Y-direction deviate (Δ TP2 (Y)) falls into the 3rd group does is denoted as C6, to deviate (Δ TP2 (X)), the 3rd group is fallen into X, the input that the CF substrate that Y-direction deviate (Δ TP2 (Y)) falls into the first group does is denoted as C7, to deviate (Δ TP2 (X)), the 3rd group is fallen into X, the input that the CF substrate that Y-direction deviate (Δ TP2 (Y)) falls into the second group does is denoted as C8, C9 is denoted as to the input that X does to the CF substrate that deviate (Δ TP2 (X)) and Y-direction deviate (Δ TP2 (Y)) all fall into the 3rd group.
5. the alignment method of the TFT substrate as described in claim 1 or 4 and CF substrate, it is characterized in that, described step 4 pair TFT substrate and CF substrate carry out input and match and carry out priority according to the priority and sort, the range actual value of TFT side alignment mark and the X of range standard value more level off to the range actual value of CF side alignment mark with the X of range standard value to deviate (Δ TP2 (X)) and Y-direction deviate (Δ TP2 (Y)) to deviate (Δ TP1 (X)) and Y-direction deviate (Δ TP1 (Y)), and priority is higher.
6. the alignment method of TFT substrate as claimed in claim 5 and CF substrate, it is characterized in that, the range actual value of TFT side alignment mark and the X of range standard value fall into same group to deviate (Δ TP1 (X)) and the range actual value of CF side alignment mark and the X of range standard value to deviate (Δ TP2 (X)), when the range actual value of TFT side alignment mark and the Y-direction deviate (Δ TP2 (Y)) of the Y-direction deviate (Δ TP1 (Y)) of range standard value and the range actual value of CF side alignment mark and range standard value fall into same group simultaneously, it is the highest that TFT substrate and CF substrate carry out dropping into the priority of matching.
7. the alignment method of TFT substrate as claimed in claim 6 and CF substrate, it is characterized in that, drop into the TFT substrate that is denoted as T1 and drop into the CF substrate being denoted as C1 and match, drop into the TFT substrate that is denoted as T2 and drop into the CF substrate being denoted as C2 and match, drop into the TFT substrate that is denoted as T3 and drop into the CF substrate being denoted as C3 and match, drop into the TFT substrate that is denoted as T4 and drop into the CF substrate being denoted as C4 and match, drop into the TFT substrate that is denoted as T5 and drop into the CF substrate being denoted as C5 and match, drop into the TFT substrate that is denoted as T6 and drop into the CF substrate being denoted as C6 and match, drop into the TFT substrate that is denoted as T7 and drop into the CF substrate being denoted as C7 and match, drop into the TFT substrate that is denoted as T8 and drop into the CF substrate being denoted as C8 and match, drop into the TFT substrate that is denoted as T9 and drop into the CF substrate being denoted as C9 and match.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105511126A (en) * | 2016-01-21 | 2016-04-20 | 京东方科技集团股份有限公司 | Display panel and preparing method and testing method thereof |
| CN108681127A (en) * | 2018-07-03 | 2018-10-19 | 京东方科技集团股份有限公司 | A kind of display panel, its production method and display device |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20060123946A (en) * | 2005-05-30 | 2006-12-05 | 삼성에스디아이 주식회사 | Mask frame assembly for thin layer deposition and manufacturing method of organic light emitting display device thereused |
| CN1996550A (en) * | 2005-12-28 | 2007-07-11 | 上海广电Nec液晶显示器有限公司 | Joint method of the base plate |
| CN101126854A (en) * | 2006-08-17 | 2008-02-20 | 株式会社爱发科 | Joint method and manufacturing device for joint substrate |
| CN103499902A (en) * | 2013-08-15 | 2014-01-08 | 京东方科技集团股份有限公司 | Method and device for adjusting and controlling total pitch of substrate |
| CN103969873A (en) * | 2014-04-23 | 2014-08-06 | 京东方科技集团股份有限公司 | Method for aligning mask to substrate and manufacturing method of colored film substrate |
| CN104808434A (en) * | 2015-05-21 | 2015-07-29 | 合肥京东方光电科技有限公司 | Substrate, mask plate, display device and alignment method |
-
2015
- 2015-07-29 CN CN201510459271.8A patent/CN104950506B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20060123946A (en) * | 2005-05-30 | 2006-12-05 | 삼성에스디아이 주식회사 | Mask frame assembly for thin layer deposition and manufacturing method of organic light emitting display device thereused |
| CN1996550A (en) * | 2005-12-28 | 2007-07-11 | 上海广电Nec液晶显示器有限公司 | Joint method of the base plate |
| CN101126854A (en) * | 2006-08-17 | 2008-02-20 | 株式会社爱发科 | Joint method and manufacturing device for joint substrate |
| CN103499902A (en) * | 2013-08-15 | 2014-01-08 | 京东方科技集团股份有限公司 | Method and device for adjusting and controlling total pitch of substrate |
| CN103969873A (en) * | 2014-04-23 | 2014-08-06 | 京东方科技集团股份有限公司 | Method for aligning mask to substrate and manufacturing method of colored film substrate |
| CN104808434A (en) * | 2015-05-21 | 2015-07-29 | 合肥京东方光电科技有限公司 | Substrate, mask plate, display device and alignment method |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105511126A (en) * | 2016-01-21 | 2016-04-20 | 京东方科技集团股份有限公司 | Display panel and preparing method and testing method thereof |
| CN105511126B (en) * | 2016-01-21 | 2018-11-13 | 京东方科技集团股份有限公司 | Display panel and preparation method thereof and detection method |
| CN108681127A (en) * | 2018-07-03 | 2018-10-19 | 京东方科技集团股份有限公司 | A kind of display panel, its production method and display device |
| CN108681127B (en) * | 2018-07-03 | 2021-08-24 | 京东方科技集团股份有限公司 | Display panel, manufacturing method thereof and display device |
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|---|---|
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