CN104777415A - Manufacturing process of automatic train identification system host - Google Patents

Manufacturing process of automatic train identification system host Download PDF

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CN104777415A
CN104777415A CN 201510184184 CN201510184184A CN104777415A CN 104777415 A CN104777415 A CN 104777415A CN 201510184184 CN201510184184 CN 201510184184 CN 201510184184 A CN201510184184 A CN 201510184184A CN 104777415 A CN104777415 A CN 104777415A
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test
board
manufacturing process
temperature
high
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CN 201510184184
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段文彬
邓克炜
姜章
胡冲
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重庆微标科技有限公司
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Abstract

The invention discloses a manufacturing process of an automatic train identification system host. The manufacturing process comprises the following steps: single-board production, single-board no-power temperature cycle test at -35 DEG C to 70 DEG C, single-board programming, single-board test, whole assembly, integration test for the first time, high-temperature aging test of the powered-on whole machine at 60 DEG C to 70 DEG C, integration test for the second time, high/low-temperature sampling inspection and quality inspection, as well as packaging and storage. According to the manufacturing process, early failure products are screened out through the high-temperature aging test of the powered-on whole machine and the aging test at a high temperature, so that the products can proceed into the index stable period; the process maximally enables defective products to be exposed in the processes, is high in screening test efficiency, and eliminates early failures of the products before discharging the products from the factory.

Description

一种铁路车号自动识别系统主机的制造工艺 A railway ATIS manufacturing process system of the host

技术领域 FIELD

[0001] 本发明涉及铁路车号自动识别系统技术领域,特别涉及一种铁路车号自动识别系统主机的制造工艺。 [0001] The present invention relates to automatic vehicle identification system identification technology, particularly relates to a manufacturing process of Automatic Train Identification system of the host.

背景技术 Background technique

[0002] 铁路车号自动识别系统主要由车号自动识别主机、地面微波天线、射频线缆及防护设施、车轮传感器等部分组成;它能全天候自动采集监测点的车辆通过信息。 [0002] Automatic Train Automatic identification system to identify parts of the host, terrestrial microwave antenna, RF cable and protective equipment, car number of wheel sensors and other components; it weather automatic vehicle monitoring points collected by the information. 读出设备采集到的数据信息:车次、车号、车型、辆序、总辆数、车辆到达时间、车辆通过时间和其它需加载信息。 Reading device information of the collected data: trips, vehicle number, model, vehicle sequence, the total number of vehicles, vehicle time of arrival, time and other information through the vehicle to be loaded. 其中车号自动识别主机主要由主控单元、微波单元(RF单元)、接口部分、电源部分等组成,在其生产过程中要对单板和整机进行温度循环测试和老化测试等。 Wherein the host ATIS mainly by the main control unit, a microwave unit (RF unit), an interface portion, the power supply parts and other components to the board and the whole of the temperature cycle test and burn-in testing of its production process.

[0003] 如附图1所示,传统的制造工艺为:SMT贴片、接插件焊接;单板程序烧录;单板测试;整机装配;集成测试;常温加电老化;整机温循上电测试;集成测试;质量检验;包装等步骤。 [0003] As shown in the drawings, the conventional manufacturing processes as: SMT placement, welding connector; programming in the board; test board; machine assembly; integration testing; normal power aging; thermal cycling machine the electrical test; integration testing; quality control; and packaging steps. 然而电子产品在生产制造时,因设计不合理、原材料或工艺措施方面的原因引起产品的缺陷,这类缺陷不能用一般的测试手段发现,而需要在使用过程中逐渐地被暴露,如硅片表面污染、组织不稳定、焊接空洞、芯片和管壳热阻匹配不良等等。 However, at the time of manufacture of electronic products, unreasonable design reasons, measures of raw materials or processes causing defects of the product, such defects can not be found by a general test methods, we need to be gradually exposed during use, e.g., of silicon surface contamination, tissue unstable solder voids, poor thermal match the chip and the like. 一般这种缺陷需要在元器件工作于额定功率和正常工作温度下运行一千个小时左右才能全部被激活或暴露。 Such defects generally require components work runs under the rated power and normal operating temperature of about one thousand hours can all be activated or exposed. 传统工艺中的常温加电老化工序,通常采用的是测试产品连续通电工作72H小时的稳定性,达到筛选缺陷的目的,而实际的操作过程中根本达不到72小时,所以很难筛选出有缺陷的元器件。 Power at room temperature aging step in the conventional process, generally employed is a continuous energization test product stability 72H work hour, the defective screening purposes, the actual operation of the process did not reach 72 hours, it is difficult to have selected component defects. 另一方面整机温循上电测试的缺陷:①时间短:温循时间只有7.5H,共计5个周期的温度变化,不能达到筛选存在缺陷器件的目的。 On the other hand, the electrical machine thermal cycling test defects: ① short: only 7.5H thermal cycling time, a total of 5 cycles of temperature change, can not achieve the purpose of screening for the presence of the defective device. ②温度变化的时间间隔过短,整机内部未达到设定温度而外部环境就开始变化,导致整机老化效果不佳。 ② temperature change interval is too short, the whole interior of the set temperature does not reach the external environment starts to change, resulting in poor machine aging effect.

发明内容 SUMMARY

[0004] 鉴于以上所述现有技术的不足,发明的目的在于提供一种铁路车号自动识别系统主机的制造工艺,能够使有缺陷的产品在制造工艺过程中暴露出来,高效的筛选出具有缺陷的产品,降低缺陷产品流入市场的概率。 [0004] In view of the above deficiencies of the prior art, the object of the invention is to provide a manufacturing process Automatic Train Identification system of the host, it is possible to make defective products are exposed during the manufacturing process, the filter having an efficient defective products, reduce the probability of defective products into the market.

[0005] 为实现上述目的及其他相关目的,本发明提供一种铁路车号自动识别系统主机的制造工艺,至少包括以下步骤,单板制作、单板不上电温循测试、单板程序烧录、单板测试、整机组装、第一次集成测试、整机上电高温老化测试、第二次集成测试、高低温抽检以及质量检验和包装入库。 [0005] To achieve the above objects and other related objects, the present invention provides a process for producing Automatic Train Identification system host, comprising at least the following steps, making the board, the board is not powered on thermal cycling test, burn program board record, test board, the whole assembly, integration testing for the first time, the whole power high-temperature aging test, the second integration testing, high and low temperature sampling and quality testing and packaging and storage.

[0006] 采用上述工艺,通过增设的单板不上电温循测试、整机上电高温老化测试和高低温抽检测试,达到产品温循测试的目的;单板不上电温循测试,即通过温度变化试验施加应力于器件上,以判定器件是否正确设计或制造,从而达到筛选劣质器件,检查SMT单板的焊接质量,确定器件焊接的可靠性,如SMT不良、易碎和不耐高温器件等;直接在单板组装好后就进行检测,相对于传统的工艺,可以及时的对产品进行筛选,可以防止缺陷产品流入下游,影响后续组装产品的质量和对后续检测结果造成干扰;而通过整机上电高温老化测试,通过高温条件下的老化试验,筛出早期失效产品;使产品提前进入指标稳定期;相对于传统的常温加电老化测试,产品高温老化工作一小时相当于常温下工作40小时,缩短测试时间测试效率得到提高,按照电子器件早期失效 [0006] With the above process, by adding the card does not power on thermal cycling test, the electric machine high temperature aging test, and high and low temperature sampling test, to achieve thermal cycling test product; not on the power board thermal cycling test, i.e., by applying stress to the device temperature test to determine if the correct device designed or manufactured, so as to achieve inferior screening device, SMT board to check the quality of welding, the welding reliability determination device, such as poor SMT, and not frangible refractory devices and the like; detected directly in the well after the board is assembled, with respect to the traditional process, the product can be screened in a timely manner, defective products can be prevented from flowing into the downstream, affecting the quality of the subsequent assembly of the product and interfere with subsequent detection result; and by the high temperature electrical machine aging testing by aging test under high temperature conditions, an early failure of the screen product; index of the product into the stable phase advance; with respect to the conventional power-aging test at room temperature, the product is equivalent to one hour working temperature aging at room temperature at 40 hours, a test test time efficiency is improved, according to early failure of the electronic device 间1000小时来算,产品只要在高温老化工作25小时左右,能将早期失效时间低于1000小时的电子器件筛选出来的;而传统的常温加电老化试验通常不超过72小时,不能使具有缺陷的产品完全暴露出来。 To count between 1000 hours, the product as long as the high temperature aging work around 25 hours, can early failure time less than 1000 hours, filter out electronics; traditional power aging test at room temperature is usually not more than 72 hours, can not have a defect the product is fully exposed. 因此本工艺能够最大限度地使具有缺陷的产品在工艺过程中暴露出来,筛选测试效率高,尽可能把产品的早期失效消灭在产品出厂之前。 Thus, the present process is to maximize the product has a defect in the process exposed, high-efficiency screening test, early product failure as far as possible eliminate prior to product shipment.

[0007] 作为优选:所述单板制作包括SMT贴片和插接件焊接,制作完成后目检合格则进行单板不上电温循测试。 [0007] Advantageously: the board comprises SMT chip production and the plug welding, visual inspection of the finished board is performed without passing the electric thermal cycling test.

[0008] 作为优选:所述单板不上电温循测试温度测试范围为_35°C至70°C。 [0008] Advantageously: the power board does not test thermal cycling test temperature range of _35 ° C to 70 ° C.

[0009] 作为优选:所述整机上电高温老化测试为使整机在60°C至70°C温度范围内连续工作至少25小时,验证产品连续通电工作的稳定性,筛选出不合格的产品。 [0009] Advantageously: the electric machine on the high temperature aging test for 70 ° C while making the whole temperature range of 60 ° C in continuous operation to at least 25 hours, to verify the stability of the work product of continuous energization, screened unqualified product.

[0010] 作为优选:所述整机组装包括在机箱内安装风扇、电源、开关、LED板、母板、计轴板以及读写器和连线。 [0010] Advantageously: the whole assembly comprising a fan installed in the chassis, power supplies, switches, LED board, a motherboard, and a plate reader count and the shaft connection.

[0011] 作为优选:所述整机组装后还设置有参数配置的步骤,所述参数配置包括计轴板参数配置和读写器参数配置。 [0011] Advantageously: the parameters further provided with a step after the whole assembly, said configuration parameter comprising a counter shaft and the plate reader configuration parameters configuration parameters.

[0012] 作为优选:所述第一次集成测试包括测试串口是否能升级底层程序以及检测串口车号、磁钢数据。 [0012] Advantageously: the first integration testing comprises testing whether the underlying program can be upgraded port and a detector port number, data magnet.

[0013] 如上所述,发明的有益效果是:能够在单板制作完成后及时检查SMT单板的焊接质量,确定器件焊接的可靠性,有效防止缺陷产品流入下游;整机上电高温老化后进行功能指标测量,筛选剔除失效或变值的元器件,能够最大限度地使具有缺陷的产品在工艺过程中暴露出来,筛选测试效率高,尽可能把产品的早期失效消灭在产品出厂之前,而且通过高温条件下的老化试验,筛出早期失效产品;使产品提前进入指标稳定期;相对于传统的常温加电老化测试,产品高温老化工作一小时相当于常温下工作40小时,缩短测试时间测试效率得到提高,测试结果相对传统工艺更可靠。 [0013] As described above, the beneficial effects of the invention are: the welding quality can be finished in time after the board inspection SMT board, the device determines the reliability of soldering, to effectively prevent defective products into the downstream; machine power after high temperature aging index measurement function, excluding filter component failure or change value, it is possible maximize the exposed product having a defect in the process, high efficiency screening test, as far as possible eliminate the early product failure before product shipment, and by aging test under high temperature conditions, an early failure of the screen product; index of the product into the stable phase advance; with respect to the conventional power-aging test at room temperature, the product temperature aging hour of work equivalent to 40 hours at room temperature, to shorten the test time to test efficiency is improved, the test result is more reliable relative to the traditional process.

附图说明 BRIEF DESCRIPTION

[0014] 图1为传统制造工艺流程图; [0014] FIG. 1 is a conventional manufacturing process flow diagram;

[0015] 图2为本发明工艺流程图。 [0015] FIG. 2 process flow diagram of the present invention.

具体实施方式 detailed description

[0016] 以下由特定的具体实施例说明发明的实施方式,熟悉此技术的人士可由本说明书所揭露的内容轻易地了解发明的其他优点及功效。 [0016] The following examples illustrate specific embodiments of the invention by a specific, those skilled in the art disclosed in this specification may be readily understand the content of other advantages and effects of the invention.

[0017] 图1所示为传统的制造工艺包括:SMT贴片、接插件焊接;单板程序烧录;单板测试;整机装配;集成测试;常温加电老化;整机温循上电测试;集成测试;质量检验;包装等步骤。 [0017] Figure 1 shows a conventional manufacturing process comprising: SMT patch, welding connector; programming in the board; test board; machine assembly; integration testing; normal power aging; thermal cycling on electrical machine test; integration testing; quality control; and packaging steps. 传统工艺中的常温加电老化工序,通常采用的是测试产品连续通电工作72H小时的稳定性,达到筛选缺陷的目的,而实际的操作过程中根本达不到72小时,所以很难筛选出有缺陷的元器件。 Power at room temperature aging step in the conventional process, generally employed is a continuous energization test product stability 72H work hour, the defective screening purposes, the actual operation of the process did not reach 72 hours, it is difficult to have selected component defects.

[0018] 如图2所示,本发明提供一种铁路车号自动识别系统主机的制造工艺,包括以下步骤,首先通过SMT贴片、接插件焊接等步骤制成单板;单板经AOI自动光学检测仪、目检合格后进行单板不上电温循测试,测试温度范围为_35°C至70°C,即测试单板在_35°C至70°C温度条件下的状况;然后进行单板程序烧录,包括烧写bootloader,烧写底层程序和烧写FPGA程序等;而后进行单板测试,单板测试是进行板卡上器件进行性能指标测试,保证器件的性能达到设计和工艺要求,筛选出单板上不满足性能指标的元器件;整机组装,包括在机箱内安装风扇、电源、开关、LED板、母板、计轴板以及读写器和连线等;整机装完后进行参数配置,包括计轴板参数配置和读写器参数配置;再进行第一次集成测试,对产品的外观检查,对产品功能以及性能进行测试,验证组装完成后 [0018] 2, the present invention provides a process for producing Automatic Train Identification system host, comprising the steps of, firstly made by SMT chip board, connectors welding step; automatic board by AOI after the optical detector for veneer, visual inspection is not qualified power thermal cycling test, the test temperature range of _35 ° C to 70 ° C, i.e. in the testing board to _35 ° C under conditions of a temperature of 70 ° C; then the program board programming, including programming bootloader, the underlying programming FPGA programming procedures and procedures; and then tested for the board, the board is the board test device for performance testing, to ensure the performance of the device to meet the design and process requirements, the board does not meet the selected performance components; the whole assembly, including a fan mounted, the chassis power, switches, LED board, a motherboard, and a counter shaft plate reader and the like to connect; after further performing a first integration testing, visual inspection of the product, the product functionality and performance testing, validation assembled; Bahrain after the machine parameters, the parameters including meter shaft plate reader and the parameters 产品是否合格;然后进行整机上电高温老化测试,使整机在60°C至70°C温度范围内连续工作至少25小时,验证产品连续通电工作的稳定性,筛选出不合格的产品。 The product is qualified; then the high-temperature aging test machine power, so that the whole temperature range of 70 ° C while at 60 ° C for at least 25 hours continuously to verify the stability of the product work continuously energized, substandard products screened. 而后进行第二次集成测试,对产品的外观检查,对产品功能以及性能进行测试,本次测试的主要目的是为了验证高温老化后产品是否合格;最后进行高低温抽检;功能复检;质量检验;现场过车测试;合格产品包装入库,有缺陷的产品返回相应工序制作。 Then a second integration testing, visual inspection of the product, product functionality and performance testing, the main purpose of this test is to verify whether the product is qualified after high temperature aging; Finally, high and low temperature sampling; functional review; Quality Inspection ; on-site car before testing; packaging and storage of qualified products, defective product returns the corresponding production processes.

[0019] 其中,单板不上电温循测试的作用为: [0019] wherein the power board is not acting as a thermal cycling test:

[0020] 温度变化试验其目的为施加应力于器件上,以决定器件是否正确设计或制造,从而达到筛选劣质器件,如SMT不良、易碎和不耐高温器件等;温度循环在温度循环过程中,高热应力和热疲劳交互作用在产品上,影响着产品的机械、物理化学和电气性能: [0020] Test temperature stress applied to an object on the device, to determine if the correct device designed or manufactured, so as to achieve filter devices of poor quality, such as poor SMT, and not heat the frangible means and the like; temperature cycling during temperature cycling in , high thermal stress and thermal fatigue interaction on the product, the product affects the mechanical, physical, chemical and electrical properties:

[0021] 机械:由于产品由不同的材料组成,材料膨胀系数的差异产生机械应力,在承受高低温双向变化的热应力时,应力变化在结合部产生有效作用,使缺陷暴露 [0021] Equipment: Due to the different materials, the difference of thermal expansion coefficient generating mechanical stress, thermal stress when subjected to high temperature changes in two-way, stress generated in the connecting portion acting effectively the exposure of the defects

[0022] 物理化学:产品中的橡胶和有机塑料等材料在低温下变硬发脆,高温下软化松弛,超出使用温度范围时,其机械性能和抗减振特性均会发生变化,导致产品失效; [0022] Physicochemical: products rubber and an organic material such as hard plastic brittle at low temperatures, high temperature softening relaxation, beyond temperature range, its mechanical properties and the damping properties are vary, resulting in product failure ;

[0023] 电气性能:高温能够导致电路发生温漂,增大电路发热量,加速绝缘体的老化甚至热击穿,影响半导体器件如三极管的放大倍数和穿透电,从而造成产品失效; [0023] Electrical properties: high temperature can cause drift generating circuit, increasing the amount of heat circuit, even accelerated aging of thermal breakdown of the insulator, a semiconductor device such as a magnification of impact and penetration power transistor, resulting in product failure;

[0024] 温度循环透发的故障模式:参数漂移与电路稳定性;电路板开路、短路、分层等缺陷;电路板腐蚀、裂纹、表面和过孔缺陷;元件缺陷、松动、装配不当或错装;结击穿、开焊、冷焊、虚焊等焊接缺陷;连线伸张或松动以及电线掉头、连接不好、接触不良、粘结不牢、紧固件缺陷、脆性断裂;电迀移、热匹配、金属化、密封失效等。 [0024] Temperature cycling through the hair failure modes: parameter drift and stability of the circuit; board opens, shorts, delamination and other defects; circuit board corrosion, cracks, surface defects and vias; defective components, loose, or improper assembly error means; junction breakdown, open welding, cold welding, weld defects such as weld; stretching or loosening of the wires and a wire turn, a bad connection, poor contact, adhesion is not strong, the fastener defects, brittle fracture; Gan electrical shift , thermal matching, metallization, seal failure and the like. 结合产品温循条件与产品B0M (关键器件规格书)设定温循工作温度条件。 Thermal cycling conditions combined product item B0M (key device specifications) is set working temperature thermal cycling conditions.

[0025] 其中整机上电高温老化测试主要作用和目的为: [0025] wherein the electrical machine and the high-temperature aging test purposes is a major role:

[0026] 电子产品在生产制造时,因设计不合理、原材料或工艺措施方面的原因引起产品的质量问题有两类,第一类是产品的性能参数不达标,生产的产品不符合使用要求;第二类是潜在的缺陷,这类缺陷不能用一般的测试手段发现,而需要在使用过程中逐渐地被暴露,如硅片表面污染、组织不稳定、焊接空洞、芯片和管壳热阻匹配不良等等。 [0026] Electronic products during manufacturing, due to unreasonable design, materials or workmanship reason measures due to the quality of the products in question are of two kinds. The first is the performance parameters of the product is not up to the production of products which do not meet; the second category is the potential defects, such defects can not be found by a general test methods, need to be gradually exposed during use, such as a silicon wafer surface contamination, tissue unstable solder voids, the chip and the matching resistance bad and so on. 一般这种缺陷需要在元器件工作于额定功率和正常工作温度下运行一千个小时左右才能全部被激活或暴露。 Such defects generally require components work runs under the rated power and normal operating temperature of about one thousand hours can all be activated or exposed. 显然,对每只元器件测试一千个小时是不现实的,所以需要对其施加热应力和偏压,例如进行高温功率应力试验,来加速这类缺陷的提早暴露。 Obviously, for each component test one thousand hours is impractical, it is necessary to bias and thermal stress applied thereto, for example, high-temperature stress test power to accelerate early exposure such defects. 也就是给电子产品施加热的、电的、机械的或多种综合的外部应力,模拟严酷工作环境,消除加工应力和残余溶剂等物质,使潜伏故障提前出现,尽快使产品通过失效浴盆特性初期阶段,进入高可靠的稳定期。 I.e. heat is applied to the electronic, electrical, mechanical or more integrated external stress, simulated harsh working environment, eliminating process stress and residual solvent and other substances, so that the latent failure in advance, so that as soon as the initial characteristics of the product by failure tub stage, into the highly reliable stable phase. 老化后进行功能指标测量,筛选剔除失效或变值的元器件,尽可能把产品的早期失效消灭在产品出厂之前。 Function parameters measured after aging, eliminate screening component failure or change values, as much as possible to eliminate early failure of the product prior to product shipment.

[0027] 根据高温老化加速系数公式,可以计算出产品高温老化工作一小时,相当于常温下工作40小时。 [0027] The high temperature accelerated aging coefficient formula, the product can be calculated temperature aging work one hour, equivalent to 40 hours at room temperature. 按照电子器件早期失效时间1000小时来算,产品只要在高温老化工作25小时左右,理论上是能将早期失效时间低于1000小时的电子器件筛选出来的,相对于传统工艺常温老化72小时时间,本发明工艺更能够发现产品早期缺陷。 The electronic device according to early failure count to 1000 hours, as long as the product temperature at about aging for 25 hours is theoretically possible to early failure time of 1000 hours is less than an electronic device screening out, with respect to the conventional solution at room temperature 72 hours aging time, further process of the invention can be found early product defects. 结合产品老化条件与产品BOM (关键器件规格书)设定老化工作温度条件,本例中为60 °C。 Bonding product aging conditions and product BOM (key device specifications) aging the set operating temperatures, in this case 60 ° C.

[0028] 高低温抽检目的:模拟温度骤变的环境下,产品性能会不会发生改变,或者故障。 [0028] The high and low temperature sampling Objective: under simulated environmental temperature fluctuations, will not change the performance or failure. (参照标准GBT2423)。 (Reference standard GBT2423). 抽检标准:按照GB2828-2003抽样方案,一般检验水平,加严检验一次抽样方案执行。 Sampling criteria: the general inspection level, tightened inspection single sampling program implementation in accordance with GB2828-2003 sampling plan. 通过高低温抽检进一步确定产品是否合格,提高工艺的可靠性。 High and low temperature by further sampling to determine whether the product is qualified, improve the reliability of the process.

[0029] 现场过车测试:产品在实际工作环境下运行测试,测试数据满足生产测试现场过车判定标准,保证产品出厂质量和功能要求。 [0029] spot a car test: run the test product in a real work environment, test data to meet production criteria of the test site a car, ensure the quality of manufactured products and functional requirements.

[0030] 任何熟悉此技术的人士皆可在不违背发明的精神及范畴下,对上述实施例进行修饰或改变。 [0030] Any person skilled in this art can be made at without departing from the spirit and scope of the invention, the above-described embodiments can be modified or changed. 因此,举凡所属技术领域中具有通常知识者在未脱离发明所揭示的精神与技术思想下所完成的一切等效修饰或改变,仍应由发明的权利要求所涵盖。 Thus, one skilled in the art that whenever all having ordinary knowledge in the technical ideas and spirit of the disclosed invention without departing from the completed equivalent modified or altered, should still be encompassed by the claims of the invention.

Claims (7)

  1. 1.一种铁路车号自动识别系统主机的制造工艺,其特征在于:至少包括以下步骤,单板制作、单板不上电温循测试、单板程序烧录、单板测试、整机组装、第一次集成测试、整机上电高温老化测试、第二次集成测试、高低温抽检以及质量检验和包装入库。 An Automatic Train Identification of the manufacturing process of the host system, characterized by: at least comprising the steps of making the board, the board is not powered on thermal cycling test, the program board programming, test board, the whole assembly , the first integration testing, high temperature aging test on the machine power, the second integration testing, high and low temperature sampling and quality testing and packaging and storage.
  2. 2.根据权利要求1所述的一种铁路车号自动识别系统主机的制造工艺,其特征在于:所述单板制作包括SMT贴片和插接件焊接,制作完成后目检合格则进行单板不上电温循测试。 Train 2. The manufacturing process according to an automatic identification system as claimed in claim host, wherein: the board comprises SMT chip production and the plug welding, visual inspection after finished passing the single plate temperature cycle test is not powered on.
  3. 3.根据权利要求1所述的一种铁路车号自动识别系统主机的制造工艺,其特征在于:所述单板不上电温循测试温度测试范围为_35°C至70°C。 According to claim 1 for a railway car number of the manufacturing process of automatic identification of a host system, wherein: the power board does not test thermal cycling test temperature range of _35 ° C to 70 ° C.
  4. 4.根据权利要求1所述的一种铁路车号自动识别系统主机的制造工艺,其特征在于:所述整机上电高温老化测试为使整机在60°C至70°C温度连续工作至少25小时,验证产品连续通电工作的稳定性,筛选出不合格的产品。 The manufacturing process of claim 1. A host Automatic Train Identification system as claimed in claim wherein: the electrical machine that the high-temperature aging test for continuous operation at 60 ° C to 70 ° C over the whole temperature at least 25 hours, to verify the stability of the product work continuously energized, substandard products screened.
  5. 5.根据权利要求1所述的一种铁路车号自动识别系统主机的制造工艺,其特征在于:所述整机组装包括在机箱内安装风扇、电源、开关、LED板、母板、计轴板以及读写器和连线。 5. Train according to one manufacturing process of the automatic identification system 1, the host as claimed in claim, wherein: said machine includes a mounting assembly fans, power supplies in the chassis, switches, LED board, a motherboard, Axle and a plate reader and wires.
  6. 6.根据权利要求1所述的一种铁路车号自动识别系统主机的制造工艺,其特征在于:所述整机组装后还设置有参数配置的步骤,所述参数配置包括计轴板参数配置和读写器参数配置。 According to claim 1. A manufacturing process of Automatic Train Identification system host, characterized in that claim: further step of setting the parameters of the whole assembly, said counter shaft comprises a plate configuration parameters configuration parameters and the reader configuration parameters.
  7. 7.根据权利要求1所述的一种铁路车号自动识别系统主机的制造工艺,其特征在于:所述第一次集成测试包括测试串口是否能升级底层程序以及检测串口车号、磁钢数据。 According to claim 1 for a railway car number of the manufacturing process of automatic identification of a host system, wherein: said first test comprises testing whether the integrated serial program can be upgraded and detecting underlying serial number, data magnet .
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