CN104596410B - A kind of hexahedron high accuracy morpheme measurement apparatus and method - Google Patents

Abstract

The invention relates to the technical field of precise detection of aerospace inertial devices, in particular to a hexahedral high-precision shape and position measuring device and method. The device includes an inductive micrometer, a marble positioning plate, an inductive probe, a first probe fixing block, a second probe fixing block, a standard parallel knife-edge ruler or a standard rod, a probe connecting wire, a first bracket and a second bracket . The method of the invention has short detection time and high detection efficiency. It takes only 2 minutes to detect the shape and position relationship of a group of planes, while the detection time of the imported high-precision three-coordinate tester is about 20 minutes or more, and the detection efficiency has increased by more than 10 times.

Description

A device and method for measuring hexahedral high-precision shape and position

technical field

The invention relates to the technical field of precise detection of aerospace inertial devices, in particular to a hexahedral high-precision shape and position measuring device and method.

Background technique

The hexahedron forms a high-precision three-dimensional rectangular coordinate system and is an important device for installing and debugging inertial instruments. A hexahedron part used for the installation and debugging of inertial components has six actual working surfaces, and its shape is composed of six mutually perpendicular planes. There are many sizes of hexahedrons, the total height of large hexahedrons can reach 350mm, and the precision requirement is that the verticality and parallelism of each surface should be within 0.002mm. The total height of the small hexahedron is 25mm, and the precision requirement is that the verticality and parallelism of each surface are within 0.001mm. Since the hexahedron will form 24 external angles, the angle accuracy is within 1.3". The shape and position accuracy of the hexahedron directly affects the installation accuracy of various inertial instruments mounted on the inertial group, as well as the accuracy of the established rectangular coordinate system , so the measurement accuracy in the hexahedron processing process is required to be extremely high. With the development of aerospace inertial technology, the demand for high-precision hexahedrons is gradually increasing, requiring production units to have the ability to produce in large quantities. The traditional detection method is to use imported high-precision three-coordinate The tester is not only expensive, but also has high environmental requirements and is difficult to maintain. It also has a long measurement cycle and requires professional testing personnel to operate, which greatly affects the testing efficiency of the hexahedron.

Contents of the invention

The object of the present invention is to propose a hexahedron high-precision shape and position measurement device and method in order to overcome the shortcomings of the existing hexahedron shape and position measurement technology.

The purpose of the present invention is achieved through the following technical solutions.

A hexahedral high-precision shape and position measuring device of the present invention comprises an inductive micrometer, a marble positioning plate, an inductive measuring head, a first measuring head fixing block, a second measuring head fixing block, a standard parallel knife-edge ruler or a standard rod, and a measuring head. Head connecting wire, first bracket and second bracket;

The first measuring head fixing block is a copper cuboid with a central through hole;

The second measuring head fixed block is a steel knife-edge ruler with a central through hole;

The positioning plate is made of marble. The surface finish of the positioning plate is less than Ra0.002mm, and the flatness is less than 0.005mm. The size of the positioning plate can be adjusted according to the size of the hexahedron to be measured.

The electrical probe passes through the central through holes of the first probe fixing block and the second probe fixing block, and the electrical probe is fixed to the first probe fixing block and the second probe fixing block by bolts;

The standard rod is a steel cylinder, the surface finish is less than Ra0.002mm, the cylindricity is less than 0.005mm, the diameter is 15mm-40mm, and the length can be adjusted according to the size of the hexahedron to be measured.

The first bracket is fixed on the marble positioning plate, and is used to support the connection line between the inductive micrometer and the inductive probe;

One end of the second bracket is fixed on the marble positioning plate, and the other end has a platform parallel to the marble positioning plate, which is used to fix and support the first measuring head fixing block;

The inductance micrometer is fixed on the marble positioning plate;

The standard parallel knife-edge ruler or standard rod is fixed on the marble positioning plate, the standard parallel knife-edge ruler or standard rod is in contact with the surface to be measured of the hexahedron, and the standard parallel knife-edge ruler or standard rod is close to the bottom end of the hexahedron to be measured;

One end of the probe connection line is connected to the inductance micrometer, the middle part is fixed by the first bracket, and the other end is connected to the non-sensitive end of the inductance probe; the sensitive end of the inductance probe is in contact with the surface to be measured of the hexahedron, and the inductance is sensed. The sensitive end of the head is close to the top of the surface to be measured of the hexahedron;

The second probe fixed block is used to limit the hexahedron to be tested;

The standard parallel knife-edge ruler or standard rod is used to limit the hexahedron to be tested, so as to ensure that the tested surface of the hexahedron is perpendicular to the marble positioning plate;

A method for measuring the shape and position of a hexahedron with high precision according to the present invention, the method is used to measure the verticality and parallelism of the six faces of the hexahedron, and the top surface of the hexahedron to be tested is named as the first test surface, and the bottom surface is called the second test surface , the other four sides are viewed from top to bottom, and they are the third test surface, the fourth test surface, the fifth test surface, and the sixth test surface in the direction of the pointer;

The steps are:

(1) Grinding the first test surface and the second test surface, so that the first test surface and the second test surface are all parallel to the marble positioning plate, and take the first test surface and the second test surface as reference planes;

(2) Make the second test surface contact with the marble positioning plate. When the inductive probe touches the third test surface, the pointer of the inductive micrometer deflects. Adjust the zero adjustment knob of the inductive micrometer to make the pointer point to the zero position. ;

(3) Flip the hexahedron so that the first test surface is in contact with the marble positioning plate. When the inductance probe touches the third test surface, the pointer of the inductance micrometer deflects, and the index of the inductance micrometer is the first. The test surface or the perpendicularity between the second test surface and the third test surface.

By analogy, the perpendicularity between the fourth test surface, the fifth test surface, the sixth test surface and the first test surface or the second test surface can be measured.

Beneficial effect

(1) A hexahedral high-precision shape and position measuring device of the present invention has simple structure, convenient assembly, and can be self-assembled. It only includes an inductance micrometer, a marble positioning plate, an inductance probe, a first probe fixing block, There are 9 parts including the probe fixing block, standard parallel knife-edge ruler or standard rod, probe connecting wire, first bracket and second bracket.

(2) A hexahedron high-precision shape and position measuring device of the present invention is cheap compared to expensive imported high-precision three-coordinate testers, and the total price is only one-thousandth of the imported high-precision three-coordinate testers.

(3) A hexahedron high-precision shape and position measuring device of the present invention has high detection accuracy, and the highest accuracy can reach 0.001 mm, which is equivalent to the detection accuracy of imported high-precision three-coordinates.

(4) A hexahedral high-precision shape and position measuring device of the present invention does not require special maintenance and maintenance, and only needs to be simply wiped before testing to keep each table surface clean. However, the imported high-precision three-coordinate tester needs regular calibration and maintenance, which affects the production progress and use effect.

(5) The method for measuring the shape and position of a hexahedron with high precision of the present invention is simple in operation and easy to use, and can be used for calibration and detection of the hexahedron on the spot, without the need for professional inspectors, and general technicians can use it after a brief study.

(6) A method for measuring the shape and position of a hexahedron with high precision in the present invention has short detection time and high detection efficiency. It only takes 2 minutes to detect the shape and position relationship of a group of planes, while the detection time of the imported high-precision three-coordinate tester is about 20 minutes or more, and the detection efficiency has increased by more than 10 times.

Description of drawings

Fig. 1 is the structural representation of device of the present invention;

Figure 2 is a partially enlarged view of Figure 1;

Fig. 3 is a schematic structural diagram of the device of the present invention with a hexahedron.

detailed description

The present invention will be further described below in conjunction with drawings and embodiments.

Example 1

As shown in Figure 1 and Figure 2, a hexahedral high-precision shape and position measuring device includes an inductance micrometer, a marble positioning plate, an inductance probe, a first probe fixing block, a second probe fixing block, and a standard parallel knife edge Ruler or standard rod, probe connecting wire, first bracket and second bracket;

The total height of the hexahedron to be tested is 350mm

The first measuring head fixing block is a copper cuboid with a central through hole;

The second measuring head fixed block is a steel knife-edge ruler with a central through hole;

The positioning plate is made of marble, the surface finish of the positioning plate is Ra0.001mm, the flatness is 0.005mm, and the size of the positioning plate is 400mm×400mm.

The electrical probe passes through the central through holes of the first probe fixing block and the second probe fixing block, and the electrical probe is fixed to the first probe fixing block and the second probe fixing block by bolts;

The standard rod is a steel cylinder with a surface finish of Ra0.0015mm, a cylindricity of 0.005mm, a diameter of 30mm, and a length of 400mm.

The first bracket is fixed on the marble positioning plate, and is used to support the connection line between the inductive micrometer and the inductive probe;

One end of the second bracket is fixed on the marble positioning plate, and the other end has a platform parallel to the marble positioning plate, which is used to fix and support the first measuring head fixing block;

The inductance micrometer is fixed on the marble positioning plate;

The standard rod is fixed on the marble positioning plate, the standard rod is in contact with the surface to be measured of the hexahedron, and the standard rod is close to the bottom of the surface to be measured of the hexahedron;

One end of the probe connection line is connected to the inductance micrometer, the middle part is fixed by the first bracket, and the other end is connected to the non-sensitive end of the inductance probe; the sensitive end of the inductance probe is in contact with the surface to be measured of the hexahedron, and the inductance is sensed. The sensitive end of the head is close to the top of the surface to be measured of the hexahedron;

The second probe fixed block is used to limit the hexahedron to be tested;

The standard rod is used to limit the hexahedron to be tested, so as to ensure that the surface to be tested of the hexahedron is perpendicular to the marble positioning plate;

As shown in Figure 3, a high-precision shape and position measurement method for a hexahedron is used to measure the verticality of the six faces of the hexahedron, and the top surface of the hexahedron to be tested is named as the first test surface, and the bottom surface is the second test surface. , the other four sides are viewed from top to bottom, and they are the third test surface, the fourth test surface, the fifth test surface, and the sixth test surface in the direction of the pointer;

The steps are:

(1) Grinding the first test surface and the second test surface, so that the first test surface and the second test surface are all parallel to the marble positioning plate, and take the first test surface and the second test surface as reference planes;

(2) Make the second test surface contact with the marble positioning plate. When the inductive probe touches the third test surface, the pointer of the inductive micrometer deflects. Adjust the zero adjustment knob of the inductive micrometer to make the pointer point to the zero position. ;

(3) Flip the hexahedron so that the first test surface is in contact with the marble positioning plate. When the inductance probe touches the third test surface, the pointer of the inductance micrometer deflects, and the index of the inductance micrometer is the first. The test surface or the perpendicularity between the second test surface and the third test surface.

By analogy, the perpendicularity between the fourth test surface, the fifth test surface, the sixth test surface and the first test surface or the second test surface can be measured.

It can be seen from the test results that the perpendicularity of the first test surface or the second test surface to the third test surface, the fourth test surface, the fifth test surface, and the sixth test surface are 0.002mm, 0.01mm, 0.005mm, 0.003 mm.

Example 2

A hexahedron high-precision shape and position measuring device, including an inductive micrometer, a marble positioning plate, an inductive probe, a first probe fixing block, a second probe fixing block, a standard parallel knife-edge ruler or a standard rod, and a probe connecting wire , the first bracket and the second bracket;

The total height of the hexahedron to be tested is 25mm

The first measuring head fixing block is a copper cuboid with a central through hole;

The second measuring head fixed block is a steel knife-edge ruler with a central through hole;

The positioning plate is made of marble, the surface finish of the positioning plate is Ra0.001mm, the flatness is 0.002mm, and the size of the positioning plate is 100mm×100mm.

The electrical probe passes through the central through holes of the first probe fixing block and the second probe fixing block, and the electrical probe is fixed to the first probe fixing block and the second probe fixing block by bolts;

The flatness of the knife-edge part of the standard parallel knife-edge ruler is 0.001mm.

The first bracket is fixed on the marble positioning plate, and is used to support the connection line between the inductive micrometer and the inductive probe;

One end of the second bracket is fixed on the marble positioning plate, and the other end has a platform parallel to the marble positioning plate, which is used to fix and support the first measuring head fixing block;

The inductance micrometer is fixed on the marble positioning plate;

The standard parallel knife-edge ruler is fixed on the marble positioning plate, the standard parallel knife-edge ruler is in contact with the surface to be measured of the hexahedron, and the standard parallel knife-edge ruler is close to the bottom end of the hexahedron to be measured;

One end of the probe connection line is connected to the inductance micrometer, the middle part is fixed by the first bracket, and the other end is connected to the non-sensitive end of the inductance probe; the sensitive end of the inductance probe is in contact with the surface to be measured of the hexahedron, and the inductance is sensed. The sensitive end of the head is close to the top of the surface to be measured of the hexahedron;

The second probe fixed block is used to limit the hexahedron to be tested;

The standard parallel knife-edge ruler is used to limit the hexahedron to be tested, so as to ensure that the tested surface of the hexahedron is perpendicular to the marble positioning plate;

A hexahedron high-precision shape and position measurement method, the method is used to measure the verticality and parallelism of the six faces of the hexahedron, and name the top face of the hexahedron to be tested as the first test face, the bottom face as the second test face, and the other four Looking from the top to the bottom of the first side, the third test surface, the fourth test surface, the fifth test surface, and the sixth test surface are followed in the direction of the pointer;

The steps are:

(1) Grinding the first test surface and the second test surface, so that the first test surface and the second test surface are all parallel to the marble positioning plate, and take the first test surface and the second test surface as reference planes;

(2) Make the second test surface contact with the marble positioning plate. When the inductive probe touches the third test surface, the pointer of the inductive micrometer deflects. Adjust the zero adjustment knob of the inductive micrometer to make the pointer point to the zero position. ;

(3) Flip the hexahedron so that the first test surface is in contact with the marble positioning plate. When the inductance probe touches the third test surface, the pointer of the inductance micrometer deflects, and the index of the inductance micrometer is the first. The test surface or the perpendicularity between the second test surface and the third test surface.

By analogy, the perpendicularity between the fourth test surface, the fifth test surface, the sixth test surface and the first test surface or the second test surface can be measured.

According to the test results, the verticality of the first test surface or the second test surface and the third test surface, the fourth test surface, the fifth test surface, and the sixth test surface are respectively 0.001mm, 0.005mm, 0.002mm, 0.004 mm.

Claims (5)

1. A hexahedron high-precision shape and position measuring device is characterized in that: it comprises an inductive micrometer, a marble positioning plate, an inductive probe, a first probe fixed block, a second probe fixed block, a standard parallel knife-edge ruler or a standard Rod, probe connecting wire, first support and second support; The first measuring head fixing block is a copper cuboid with a central through hole; The second measuring head fixed block is a steel knife-edge ruler with a central through hole; The electrical probe passes through the central through holes of the first probe fixing block and the second probe fixing block, and the electrical probe is fixed to the first probe fixing block and the second probe fixing block by bolts; The first bracket is fixed on the marble positioning plate, and is used to support the connection line between the inductive micrometer and the inductive probe; One end of the second bracket is fixed on the marble positioning plate, and the other end has a platform parallel to the marble positioning plate, which is used to fix and support the first measuring head fixing block; The inductance micrometer is fixed on the marble positioning plate; The standard parallel knife-edge ruler or standard rod is fixed on the marble positioning plate, the standard parallel knife-edge ruler or standard rod is in contact with the surface to be measured of the hexahedron, and the standard parallel knife-edge ruler or standard rod is close to the bottom end of the hexahedron to be measured; One end of the probe connection line is connected to the inductance micrometer, the middle part is fixed by the first bracket, and the other end is connected to the non-sensitive end of the inductance probe; the sensitive end of the inductance probe is in contact with the surface to be measured of the hexahedron, and the inductance is sensed. The sensitive end of the head is close to the top of the surface to be measured of the hexahedron; The second probe fixed block is used to limit the hexahedron to be tested; The standard parallel knife-edge ruler or standard rod is used to limit the hexahedron to be tested, so as to ensure that the surface to be tested of the hexahedron is perpendicular to the marble positioning plate; the surface finish of the marble positioning plate is less than Ra0.002mm, and the flatness is less than 0.005mm. The size of the positioning plate is adjusted according to the size of the hexahedron to be measured; the standard rod is a steel cylinder, the surface finish is less than Ra0.002mm, the cylindricity is less than 0.005mm, the diameter is 15mm to 40mm, and the length is adjusted according to the size of the hexahedron to be measured . 2. A method for measuring the shape and position of a hexahedron with high precision, which is used to measure the verticality of the six faces of the hexahedron, and name the top face of the hexahedron to be tested as the first test face, the bottom face as the second test face, and the other four Looking from the top to the bottom from the side, it is the third test surface, the fourth test surface, the fifth test surface, and the sixth test surface according to the direction of the pointer; It is characterized in that the steps are: (1) use a kind of hexahedron high-precision shape and position measuring device described in claim 1 to grind the first test surface and the second test surface, so that the first test surface and the second test surface are all parallel to the marble positioning plate, and Taking the first test surface and the second test surface as reference surfaces; (2) Make the second test surface contact with the marble positioning plate. When the inductive probe touches the third test surface, the pointer of the inductive micrometer deflects. Adjust the zero adjustment knob of the inductive micrometer to make the pointer point to the zero position. ; (3) Flip the hexahedron so that the first test surface is in contact with the marble positioning plate. When the inductance probe touches the third test surface, the pointer of the inductance micrometer deflects, and the index of the inductance micrometer is the first. The test surface or the perpendicularity between the second test surface and the third test surface. 3. a kind of hexahedron high-precision shape and position measuring method according to claim 2, is characterized in that: (1) Grinding the first test surface and the second test surface, so that the first test surface and the second test surface are all parallel to the marble positioning plate, and take the first test surface and the second test surface as reference planes; (2) Make the second test surface contact with the marble positioning plate. When the inductive probe touches the fourth test surface, the pointer of the inductive micrometer deflects. Adjust the zero adjustment knob of the inductive micrometer to make the pointer point to the zero position. ; (3) Flip the hexahedron so that the first test surface is in contact with the marble positioning plate. When the inductance probe touches the fourth test surface, the pointer of the inductance micrometer deflects, and the index of the inductance micrometer is the first. The test surface or the perpendicularity between the second test surface and the fourth test surface. 4. a kind of hexahedron high-precision shape and position measuring method according to claim 2, is characterized in that: (1) Grinding the first test surface and the second test surface, so that the first test surface and the second test surface are all parallel to the marble positioning plate, and take the first test surface and the second test surface as reference planes; (2) Make the second test surface contact with the marble positioning plate. When the inductive probe touches the fifth test surface, the pointer of the inductive micrometer deflects. Adjust the zero adjustment knob of the inductive micrometer to make the pointer point to the zero position ; (3) Flip the hexahedron so that the first test surface is in contact with the marble positioning plate. When the inductance probe touches the fifth test surface, the pointer of the inductance micrometer deflects, and the index of the inductance micrometer is the first. The test surface or the perpendicularity between the second test surface and the fifth test surface. 5. a kind of hexahedron high-precision shape and position measuring method according to claim 2, is characterized in that: (1) Grinding the first test surface and the second test surface, so that the first test surface and the second test surface are all parallel to the marble positioning plate, and take the first test surface and the second test surface as reference planes; (2) Make the second test surface contact with the marble positioning plate. When the inductive probe touches the sixth test surface, the pointer of the inductive micrometer deflects. Adjust the zero adjustment knob of the inductive micrometer to make the pointer point to the zero position. ; (3) Flip the hexahedron so that the first test surface is in contact with the marble positioning plate. When the inductance probe touches the sixth test surface, the pointer of the inductance micrometer deflects, and the index of the inductance micrometer is the first. The test surface or the perpendicularity between the second test surface and the sixth test surface.