CN104505126A - Dynamic memory testing system and dynamic memory testing method - Google Patents

Dynamic memory testing system and dynamic memory testing method Download PDF

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Publication number
CN104505126A
CN104505126A CN201410751100.8A CN201410751100A CN104505126A CN 104505126 A CN104505126 A CN 104505126A CN 201410751100 A CN201410751100 A CN 201410751100A CN 104505126 A CN104505126 A CN 104505126A
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test
dynamic storage
vector
described
data
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CN201410751100.8A
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Chinese (zh)
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CN104505126B (en
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刘宇骐
陈昆
刘�东
李林旭
章志
李刚
刘晓均
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深圳市国微电子有限公司
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Abstract

The invention discloses a dynamic memory testing system and a dynamic memory testing method. The dynamic memory testing system comprises a test vector generation and update platform and a dynamic memory testing device, wherein the test vector generation and update platform is used for software simulation test by virtue of a dynamic memory simulation model, is used for grasping data in a test waveform to generate special test vectors according to current test, controlling the dynamic memory to be in a vector updating state, executing an operation of updating the vectors and updating the test vectors to the dynamic memory testing device; the dynamic memory testing device is used for storing the test vector used for current test and controlling the dynamic memory to execute the test flow. According to the system and the method disclosed by the invention, due to the test vector generation and update platform, various test vectors required by complete testing dynamic memory command combination can be generated, and are transmitted to the dynamic memory testing device on line to dynamically update the testing vectors so as to quickly and completely test the dynamic memory. The dynamic memory testing system and the dynamic memory testing method disclosed by the invention can be widely applied to the field of digital test.

Description

A kind of dynamic storage test macro and method

Technical field

The present invention relates to digital test field, more particularly, the present invention relates to dynamic storage test macro and method.

Background technology

Dynamic storage is extensively present among computer system as a kind of general storer, and to carry out testing in detail and comprehensively to the functional parameter of storer be the necessary condition ensureing storer energy reliability service; Comprehensive test relates to all possible operator scheme of dynamic storage, proving installation must can produce corresponding test vector, here full test is mainly for command operating legal in dynamic storage, the valid instruction of dynamic storage comprises conventional reading and writing, precharge etc., several in these instructions are combined, just there is the different packing of orders, such as write by reading, read by writing, by reading precharge etc., the conversion of these instructions generally all can be described in the middle of the handbook of dynamic storage; Existing dynamic storage proving installation can't go to support all possible packing of orders to pursue performance, the general test only carrying out the dependent instructions such as dynamic storage reading and writing, therefore, dynamic storage is tested and probably can omit some combination, and comprehensive test can not be supported.

Summary of the invention

In order to solve the problems of the technologies described above, the object of this invention is to provide a kind of dynamic storage proving installation, can realize carrying out full test to dynamic storage.

The technical solution adopted in the present invention is a kind of dynamic storage test macro, comprising: test vector generation and renewal platform, and it is for carrying out Software Simulation Test by dynamic storage realistic model;

The dynamic storage packing of orders according to current required test captures the data of test waveform in Software Simulation Test to produce corresponding test vector; Control described dynamic storage and be in vector more new state, perform online updating operation, described test vector is updated to dynamic storage proving installation;

Dynamic storage proving installation, it is for storing current test test vector used, and controls dynamic storage execution testing process.

Preferably, described dynamic storage proving installation comprises Logic control module, test vector memory module, determination module;

Described test vector memory module, for storing current test test vector used, and connect described test vector generation and upgrade platform, need to accept described test vector generation and upgrade the test vector of platform to its current storage to upgrade according to current test;

Under the triggering of the vectorial enable signal that described test vector memory module sends at Logic control module, the test data of test vector is sent to dynamic storage;

Described Logic control module, for configuring the parameter of current dynamic storage, controls dynamic storage order and performs test vector;

Determination module, under the triggering of comparison enable signal that sends at Logic control module, by dynamic storage response data be written to dynamic storage test data and compare.

Preferably, described determination module comprises: write data buffer, reading data buffer, comparing unit;

Described test vector memory module is sent to said write data buffer and described Logic control module while the test data of test vector is sent to dynamic storage;

Described reading data buffer is used for buffer memory dynamic storage response data;

Each described test vector has mark, and it starts and the vector data terminated and vector numbers;

Described Logic control module sends more enable trigger pip to described comparing unit according to described identification data;

Whether described comparing unit sequentially reads the dynamic storage response data and test vector institute usage data that record according to more enable trigger pip, and coincide both comparing, and comparative result is returned described Logic control module;

Vector numbers when described Logic control module record is misfitted.

Preferably, described test vector generation and renewal platform are computing machine, and the test vector of generation is sent to described test vector memory module via parallel interface cable.

Another technical scheme of the present invention is: a kind of dynamic storage method of testing, comprises the steps:

Create test vector generation and upgrade platform, carrying out Software Simulation Test by dynamic storage realistic model;

The dynamic storage packing of orders according to current required test captures the data of test waveform in Software Simulation Test to produce corresponding test vector;

Control described dynamic storage and be in vector more new state, perform online updating operation, described test vector is updated to dynamic storage proving installation;

After online updating operation terminates, dynamic storage proving installation controls dynamic storage and performs testing process.

Preferably, described dynamic storage proving installation control dynamic storage execution testing process specifically comprises the steps:

S1) initialization dynamic storage, makes dynamic storage be configured at desired mode of operation;

S2) test vector in described dynamic storage proving installation is read; Perform test vector, by the vector data of described test vector write dynamic storage, record the vector data and dynamic storage response data that use;

S3) vector data of said write dynamic storage and dynamic storage response data are compared;

S4) repeated execution of steps S2-step S3, until test all test vectors in described dynamic memory device.

Preferably, each described test vector have mark its start and terminate vector data and vector numbers, described step S2) and step S3) between also comprise the steps:

Y1) judge whether described vector data is the vector data that mark starts;

If described vector data is the vector data that mark starts, then records this vector numbers, and perform step S2);

If described vector data is not the vector data that mark starts, then judge whether this vector data is the vector data that mark terminates further;

If this vector data is not the vector data that mark terminates, then perform step S2);

If this vector data is the vector data that mark terminates, then perform step Y2);

Y2) suspend the test vector reading described dynamic storage proving installation, enter comparing state, perform step S3).

Preferably, described step S3) it specifically comprises the steps:

S31) order reads vector data and the dynamic storage response data of said write dynamic storage;

S32) compare the two whether to coincide;

If the two coincide, then perform step S2);

If the two is misfitted, then perform step S33);

S33) vector numbers when record is misfitted.

First beneficial effect of the present invention is:

A kind of dynamic storage test macro provided by the present invention comprises test vector generation and upgrades platform; In dynamic storage test macro, dynamic storage test vector generation and renewal platform can produce at the various specific test vector comprehensively needed for the packing of orders of test dynamic storage and be sent to dynamic storage proving installation online, realization dynamically updates test vector, supports quick full test dynamic storage.

Another beneficial effect of the present invention is:

A kind of dynamic storage method of testing provided by the invention, also dynamic storage proving installation is sent to online with the various specific test vector produced needed for the packing of orders of full test dynamic storage by creating test vector generation and upgrading platform, realization dynamically updates test vector, supports quick full test dynamic storage.

Accompanying drawing explanation

Below in conjunction with accompanying drawing, the specific embodiment of the present invention is described further:

Fig. 1 is a kind of dynamic storage test system structure of the present invention schematic diagram;

Fig. 2 is dynamic storage test macro one specific embodiment structural representation;

Fig. 3 is the schematic flow sheet of a kind of dynamic storage method of testing of the present invention;

Fig. 4 is that dynamic storage proving installation controls dynamic storage execution testing process schematic diagram;

Fig. 5 is that dynamic storage proving installation controls dynamic storage execution testing process one specific embodiment schematic flow sheet.

Embodiment

Be described the principle of invention and feature below in conjunction with accompanying drawing, example, only for explaining invention, is not intended to limit scope of the present invention.

Fig. 1 is a kind of dynamic storage test system structure of the present invention schematic diagram; As shown in Figure 1, a kind of dynamic storage test macro of the present invention, comprise: test vector generation and renewal platform, it is for carrying out Software Simulation Test by dynamic storage realistic model, and the dynamic storage packing of orders according to current required test captures the data of test waveform in Software Simulation Test to produce corresponding test vector; Control described dynamic storage and be in vector more new state, perform online updating operation, described test vector is updated to dynamic storage proving installation; Dynamic storage proving installation, it is for storing current test test vector used, and controls dynamic storage execution testing process.

Conversion between the valid instruction supported described in dynamic storage generally can be described in the middle of the handbook of dynamic storage, specific test vector is adopted to go to test the method for the specific packing of orders in the present invention, according to dynamic storage handbook described by all packing of orders generate corresponding test vector go test with the performance realizing comprehensively testing dynamic storage, do not omit.In the present embodiment, test vector generation and renewal platform are computing machine, by using the various specific test vector needed for the dynamic storage realistic model generation full test dynamic storage in computing machine, its detailed process comprises: produce test vector raw data by the corresponding chip model of software module, recording these data and carry out process generation to its form can stored in the test vector of test vector memory module, and the test vector of generation is sent to described dynamic storage proving installation via parallel interface cable; In the present embodiment, many test vectors can leave in a vectorial raw data document in turn for format analysis processing and vector test.

Fig. 2 is dynamic storage proving installation one specific embodiment structural representation; As shown in Figure 2, in the present embodiment, dynamic storage proving installation comprises Logic control module, test vector memory module, determination module;

Test vector memory module, for storing current test test vector used, and connects described test vector generation and upgrades platform, needs acceptance test vector to generate and upgrade the test vector of platform to its current storage to upgrade according to current test.

Under the triggering of the vectorial enable signal that test vector memory module sends at Logic control module, the test data of test vector is sent to dynamic storage.In the present embodiment, vectorial enable signal to be width be 1 control signal, be mainly used in the output controlling test vector memory module, when enable signal is 1 time, allow vectorial memory module to export data, the output of prohibiting vector memory module when being 0.

Logic control module, for configuring the parameter of current dynamic storage, controls dynamic storage order and performs test vector;

Determination module, under the triggering of comparison enable signal that sends at Logic control module, by dynamic storage response data be written to dynamic storage test data and compare; In the present embodiment, compare that enable signal is the same with above-mentioned vectorial enable signal is the control signal that width is 1, its effect is exactly that enable determination module carries out data compare operation.

In the present embodiment, determination module comprises: write data buffer, reading data buffer, comparing unit; Test vector memory module is sent to write data buffer and described Logic control module while the test data of test vector is sent to dynamic storage; Read data buffer and be used for buffer memory dynamic storage response data; Each test vector has mark, and it starts and the vector data terminated and vector numbers; Logic control module sends more enable trigger pip to described comparing unit according to identification data; Whether comparing unit sequentially reads the dynamic storage response data and test vector institute usage data that record according to more enable trigger pip, and coincide both comparing, and comparative result is returned described Logic control module; Vector numbers when Logic control module record is misfitted, vector numbers when record is misfitted, contributes to follow-up poor prognostic cause analysis.

A kind of dynamic storage test macro provided by the invention, the various specific test vector needed for the packing of orders of full test dynamic storage can be produced by test vector generation and renewal platform and be sent to dynamic storage proving installation online, realization dynamically updates test vector, reaches the object of quick full test dynamic storage.

Present invention also offers a kind of dynamic storage method of testing, Fig. 3 is the schematic flow sheet of a kind of dynamic storage method of testing of the present invention, and as shown in Figure 3, a kind of dynamic storage method of testing, comprises the steps:

Create test vector generation and upgrade platform, carrying out Software Simulation Test by dynamic storage realistic model;

The dynamic storage packing of orders according to current required test captures the data of test waveform in Software Simulation Test to produce corresponding test vector;

Control described dynamic storage and be in vector more new state, perform online updating operation, described test vector is updated to dynamic storage proving installation.

The present invention adopts specific test vector to go to test the method for the specific packing of orders, according to dynamic storage handbook described by all packing of orders go test with the performance realizing comprehensively testing dynamic storage, do not omit, creating test vector generation and upgrading platform fundamental purpose is generate the various specific test vector needed for the packing of orders of full test dynamic storage, and described test vector is updated to dynamic storage proving installation by online updating mode, support quick full test dynamic storage.

In the present embodiment, online updating operation is by manually completing, comprise the steps: to control dynamic storage proving installation at reset mode, transmit test vector to dynamic storage proving installation, renewal vector operations terminates, control dynamic storage proving installation and withdraw reset mode, dynamic storage proving installation enters normal operating conditions.

After online updating operation terminates, dynamic storage proving installation controls dynamic storage and performs testing process.Fig. 4 is that dynamic storage proving installation controls dynamic storage execution testing process schematic diagram, and as shown in Figure 4, in the present embodiment, dynamic storage proving installation controls dynamic storage execution testing process and specifically comprises the steps:

S1) initialization dynamic storage, makes dynamic storage be configured at desired mode of operation;

S2) test vector in described dynamic storage proving installation is read; Perform test vector, by the vector data of described test vector write dynamic storage, record the vector data and dynamic storage response data that use, during execution test vector, keep dynamic memory refresh operation.

S3) vector data of said write dynamic storage and dynamic storage response data are compared; Between the execution data comparable period, keep dynamic memory refresh operation; Because of the action need that the two data is compared longer a period of time, length has during this period of time exceeded the maximum time interval required for dynamic storage distributed refresh, therefore in the present embodiment carrying out keeping refresh operation in the process that data compare, ensure that dynamic storage internal data can not be lost.

S4) repeated execution of steps S2-step S3, until test all test vectors in described dynamic memory device.

Fig. 5 is that dynamic storage proving installation controls dynamic storage execution testing process one specific embodiment schematic flow sheet, as shown in Figure 5, in this specific embodiment, each test vector has mark, and it starts and the vector data terminated and vector numbers, in step S2) perform following steps afterwards:

Y1) judge whether vector data is the vector data that mark starts;

If vector data is the vector data that mark starts, then records this vector numbers, and perform step S2);

If vector data is not the vector data that mark starts, then judge whether this vector data is the vector data that mark terminates further;

If this vector data is not the vector data that mark terminates, then perform step S2);

If this vector data is the vector data that mark terminates, then perform step Y2);

Y2) suspend the test vector reading described dynamic storage proving installation, enter comparing state, keep dynamic memory refresh operation, perform step S3).

Step S3 in the present embodiment) it specifically comprises the steps:

S31) order reads vector data and the dynamic storage response data of said write dynamic storage;

S32) compare the two whether to coincide;

If the two coincide, then perform step S2);

If the two is misfitted, then perform step S33);

S33) vector numbers when record is misfitted, then performs step S2).Vector numbers when record is misfitted, for the follow-up analysis to product poor prognostic cause of engineering staff provides strong foundation, contributes to engineering staff and finds problem points more fast, accurately.

A kind of dynamic storage method of testing provided by the invention, also dynamic storage proving installation is sent to online with the various specific test vector produced needed for the packing of orders of full test dynamic storage by creating test vector generation and upgrading platform, realization dynamically updates test vector, supports quick full test dynamic storage.

More than that better enforcement of the present invention is illustrated, but the invention is not limited to embodiment, those of ordinary skill in the art also can make all equivalent variations or replacement under the prerequisite without prejudice to spirit of the present invention, and these equivalent distortion or replacement are all included in the application's claim limited range.

Claims (8)

1. a dynamic storage test macro, is characterized in that: comprising:
Test vector generation and renewal platform, it is for carrying out Software Simulation Test by dynamic storage realistic model; The dynamic storage packing of orders according to current required test captures the data of test waveform in Software Simulation Test to produce corresponding test vector; Control described dynamic storage and be in vector more new state, perform online updating operation, described test vector is updated to dynamic storage proving installation;
Dynamic storage proving installation, it is for storing current test test vector used, and controls dynamic storage execution testing process.
2. a kind of dynamic storage test macro according to claim 1, it is characterized in that, described dynamic storage proving installation comprises Logic control module, test vector memory module, determination module;
Described test vector memory module, for storing current test test vector used, and connect described test vector generation and upgrade platform, need to accept described test vector generation and upgrade the test vector of platform to its current storage to upgrade according to current test;
Under the triggering of the vectorial enable signal that described test vector memory module sends at Logic control module, the test data of test vector is sent to dynamic storage;
Described Logic control module, for configuring the parameter of current dynamic storage, controls dynamic storage order and performs test vector;
Determination module, under the triggering of comparison enable signal that sends at Logic control module, by dynamic storage response data be written to dynamic storage test data and compare.
3. a kind of dynamic storage test macro according to claim 2, is characterized in that: described determination module comprises: write data buffer, read data buffer, comparing unit;
Described test vector memory module is sent to said write data buffer and described Logic control module while the test data of test vector is sent to dynamic storage;
Described reading data buffer is used for buffer memory dynamic storage response data;
Each described test vector has mark, and it starts and the vector data terminated and vector numbers;
Described Logic control module sends more enable trigger pip to described comparing unit according to described identification data;
Whether described comparing unit sequentially reads the dynamic storage response data and test vector institute usage data that record according to more enable trigger pip, and coincide both comparing, and comparative result is returned described Logic control module;
Vector numbers when described Logic control module record is misfitted.
4. a kind of dynamic storage test macro according to Claims 2 or 3, is characterized in that, described test vector generation and renewal platform are computing machine, and the test vector of generation is sent to described test vector memory module via parallel interface cable.
5. a dynamic storage method of testing, comprises the steps:
Create test vector generation and upgrade platform, carrying out Software Simulation Test by dynamic storage realistic model;
The dynamic storage packing of orders according to current required test captures the data of test waveform in Software Simulation Test to produce corresponding test vector;
Control described dynamic storage and be in vector more new state, perform online updating operation, described test vector is updated to dynamic storage proving installation;
After online updating operation terminates, dynamic storage proving installation controls dynamic storage and performs testing process.
6. a kind of dynamic storage method of testing according to claim 5, is characterized in that: described dynamic storage proving installation controls dynamic storage and performs testing process and specifically comprise the steps:
S1) initialization dynamic storage, makes dynamic storage be configured at desired mode of operation;
S2) test vector in described dynamic storage proving installation is read; Perform test vector, by the vector data of described test vector write dynamic storage, record the vector data and dynamic storage response data that use;
S3) vector data of said write dynamic storage and dynamic storage response data are compared;
S4) repeated execution of steps S2-step S3, until test all test vectors in described dynamic memory device.
7. a kind of dynamic storage method of testing according to claim 6, it is characterized in that: each described test vector have mark its start and terminate vector data and vector numbers, described step S2) and step S3) between also comprise the steps:
Y1) judge whether described vector data is the vector data that mark starts;
If described vector data is the vector data that mark starts, then records this vector numbers, and perform step S2);
If described vector data is not the vector data that mark starts, then judge whether this vector data is the vector data that mark terminates further;
If this vector data is not the vector data that mark terminates, then perform step S2);
If this vector data is the vector data that mark terminates, then perform step Y2);
Y2) the described dynamic storage of reading is suspended surveythe test vector of electricity testing device, enters comparing state, performs step S3).
8. a kind of dynamic storage method of testing according to claim 7, is characterized in that: described step S3) it specifically comprises the steps:
S31) order reads vector data and the dynamic storage response data of said write dynamic storage;
S32) compare the two whether to coincide;
If the two coincide, then perform step S2);
If the two is misfitted, then perform step S33);
S33) vector numbers when record is misfitted.
CN201410751100.8A 2014-12-09 2014-12-09 A kind of dynamic memory test system and method CN104505126B (en)

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Cited By (5)

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Publication number Priority date Publication date Assignee Title
CN105389237A (en) * 2015-12-15 2016-03-09 江苏辰云信息科技有限公司 Performance test tool for block-level storage system
CN107705819A (en) * 2017-09-21 2018-02-16 深圳市致存微电子企业(有限合伙) A kind of storage chip sorting technique, sorter and categorizing system
CN109725249A (en) * 2019-01-31 2019-05-07 安庆师范大学 A kind of testing process dynamic adjusting method and adjustment system
CN109817273A (en) * 2019-02-12 2019-05-28 记忆科技(深圳)有限公司 A kind of NAND performance test methods and its system
CN110632499A (en) * 2019-09-23 2019-12-31 珠海格力电器股份有限公司 Test vector generation method based on test object and storage medium

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CN101038325A (en) * 2007-02-14 2007-09-19 北京中星微电子有限公司 Method and device for testing chip

Patent Citations (3)

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Publication number Priority date Publication date Assignee Title
TWI221614B (en) * 2000-07-31 2004-10-01 Hitachi Ltd Tester architecture construction data generating method, tester architecture constructing method and test circuit
US20060168498A1 (en) * 2003-06-19 2006-07-27 Advantest Corporation Test apparatus and program for testing a dut
CN101038325A (en) * 2007-02-14 2007-09-19 北京中星微电子有限公司 Method and device for testing chip

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105389237A (en) * 2015-12-15 2016-03-09 江苏辰云信息科技有限公司 Performance test tool for block-level storage system
CN107705819A (en) * 2017-09-21 2018-02-16 深圳市致存微电子企业(有限合伙) A kind of storage chip sorting technique, sorter and categorizing system
CN109725249A (en) * 2019-01-31 2019-05-07 安庆师范大学 A kind of testing process dynamic adjusting method and adjustment system
CN109817273A (en) * 2019-02-12 2019-05-28 记忆科技(深圳)有限公司 A kind of NAND performance test methods and its system
CN110632499A (en) * 2019-09-23 2019-12-31 珠海格力电器股份有限公司 Test vector generation method based on test object and storage medium

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