CN104229162A - Solar cell probe calibration method for lunar dust measurement instrument - Google Patents
Solar cell probe calibration method for lunar dust measurement instrument Download PDFInfo
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- CN104229162A CN104229162A CN201410453264.2A CN201410453264A CN104229162A CN 104229162 A CN104229162 A CN 104229162A CN 201410453264 A CN201410453264 A CN 201410453264A CN 104229162 A CN104229162 A CN 104229162A
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Abstract
The invention discloses a solar cell probe calibration method for a lunar dust measurement instrument. By using the solar cell probe calibration method, a solar cell probe can be calibrated on the ground; the method is simple and reliable and can provide basis for IOT (in orbit test) of the lunar dust measurement instrument. According to the solar cell probe calibration method, a solar cell shading effect principle is utilized and the solar cell probe is calibrated by establishing a ground calibration device, simulating sunlight irradiation and lunar dust deposition on the solar cell, measuring a relation between a short circuit current of the solar cell probe and a quantity of deposited lunar dust and testing influence of different sunlight incidence angles. By utilizing the calibration result, the lunar dust measurement instrument can calculate the quantity of the deposited lunar dust according to the sunlight incidence angle and the short circuit current of the solar cell probe in the testing process. The ground calibration device adopted by the invention has a simple structure and higher testing accuracy.
Description
Technical field
The present invention relates to space payload calibration technique field, be specifically related to a kind of lunar dust survey meter solar cell probe calibration method.
Background technology
Lunar dust survey meter is the engineering parameter measuring equipment on lunar exploration the second stage of the project CE-3 lander, is now transmitted into moonscape, just at operation on orbit.Lunar dust survey meter comprises two probes, a solar cell probe, and one is SQCM probe.SQCM probe is main measures the special moon dust quantity of menology long-term lunar dust accumulation, the change of monitoring lunar dust mass accumulation; The moon dust quantity splashed during solar cell probe main measurement lander landing menology.Utilize the moon dust quantity splashed during the device landing menology of solar cell probe measurement land, still belong to the first time at home, in the world, used in Apollo moonfall, but do not see the report of relevant calibration method, so ready-made method is not had to use for reference in the demarcation of lunar dust survey meter solar cell probe.
Summary of the invention
In view of this, the invention provides a kind of lunar dust survey meter solar cell probe calibration method, can demarcate solar cell probe on the ground, method is simple, reliable, thus the basis provided for lunar dust survey meter Orbital detection.
Lunar dust survey meter solar cell probe calibration method of the present invention, comprises the steps:
Step 1, builds ground caliberating device;
Caliberating device comprises total internal reflection minute surface (1), simulated solar light source (2), solar cell probe (3), load resistor (4), volt meter (5), sample stage (6) and sample stage angle dial (7); Wherein, sample stage (6) and sample stage angle dial (7) rack-mount, sample stage (6) can rotate, and sample stage (6) and horizontal angle are measured by sample stage angle dial (7) and obtained; Solar cell probe (3) is arranged on sample stage (6), and the light of simulated solar light source (2) reflexes on solar cell probe (3) by total internal reflection minute surface (1); Solar cell probe (3) is connected with load resistor (4), and described load resistor (4) is precision resistance, on volt meter (5) installation load resistance (4);
Step 2, simulated solar light intensity;
Lie on sample stage by 1 standard three-junction gallium arsenide solar battery sheet, wherein, standard three-junction gallium arsenide solar battery sheet is identical with solar cell probe size specification to be determined; Open the preheating of simulated solar light source, after the preheated one-section time, adjustment sample stage and horizontal angle are 0, adjustment simulated solar light source, position between total internal reflection minute surface and standard three-junction gallium arsenide solar battery sheet, until obtain the vertical incidence light that light intensity is 1 solar constant on standard three-junction gallium arsenide solar battery sheet, for situation during simulated solar irradiation incidence angle θ=0 °;
Step 3, is replaced by solar cell probe to be determined by standard three-junction gallium arsenide solar battery sheet;
Step 4, measures without solar cell probe short circuit current during simulation lunar dust quality; Successively the cover glass sprinkled with different quality simulation lunar dust is covered in solar cell detecting head surface to be determined, measures the solar cell probe short circuit current under different simulation lunar dust quality respectively; Described cover glass size is identical with solar cell probe size to be determined;
Step 5, according to the data of test in step 4, electric current knots modification when to calculate solar cell probe short circuit current be 0 compared to simulation lunar dust quality, obtains simulation lunar dust quality and solar cell and to pop one's head in the corresponding relation of short circuit current; Extract minimum value and the maxim of electric current knots modification, the minimum value of solar cell probe range and maxim when the simulation lunar dust quality of its correspondence is angle of incidence of sunlight θ=0 °; The minimum value of range is the minimum resolution of solar cell probe.
Further, change the angle θ of sample stage and horizontal surface, repeat step 4, obtain the corresponding relation of different angle of incidence of sunlight θ Imitating lunar dust mass accumulation and solar cell short circuit current.
Beneficial effect:
(1) ground of the present invention caliberating device, structure is simple, can effectively demarcate lunar dust survey meter solar cell probe.
(2) the present invention obtains the short circuit current of solar cell probe indirectly in the mode measuring short circuit voltage, the method of short circuit current is measured compared to directly adopting amperemeter/ammtr, because the resistance of amperemeter/ammtr self can affect its survey precision, therefore, the inventive method precision is higher.
(3) consider that sunlight intensity, angle can affect the short circuit current of solar cell probe, and detector in real work time, the sunshine light intensity that it is subject to is 1 sunshine constant, therefore, carrying out timing signal, first the present invention adopts standard three-junction gallium arsenide solar battery sheet to obtain light intensity is the vertical incidence light of 1 solar constant, avoids sunlight intensity on the impact of solar cell probe short circuit current.
(4) solar cell detecting head surface is adopted to cover the light-shading effect of the form simulation solar cell probe of the cover glass sprinkled with simulation lunar dust, by replacing cover glass, the short circuit current of solar cell probe under different moon dust quantity can be obtained easily.
(5) by adjustment sample stage and the angle of horizontal surface, the moon dust quantity and the solar cell relation of popping one's head between short circuit current under different angle of incidence of sunlight can be obtained easily.
Accompanying drawing explanation
Fig. 1 is ground simulation lunar dust mass accumulation test facility figure in lunar dust survey meter solar cell probe calibration method.
Fig. 2 is lunar dust deposition and solar cell short circuit current relation curve under vertical incidence angle.
Fig. 3 is certain lunar dust cumulant Imitating angle of incidence of sunlight degree and short circuit current relation.
Wherein, 1-total internal reflection minute surface, 2-simulated solar light source, 3-solar cell is popped one's head in, 4-load resistor, 5-volt meter, 6-sample stage, 7-sample stage angle dial.
Detailed description of the invention
To develop simultaneously embodiment below in conjunction with accompanying drawing, describe the present invention.
The invention provides a kind of lunar dust survey meter solar cell probe calibration method, utilize solar battery sheet light-shading effect principle, namely there is corresponding relation between solar battery sheet short circuit current and incident light, when solar battery sheet existing dust, incident light can be blocked, affect short circuit current, the amount of dust that short circuit current and solar battery sheet deposit is proportional, so by setting up ground caliberating device, simulated solar irradiation irradiate and solar battery sheet on lunar dust deposition, measure solar cell probe short circuit current and the relation depositing moon dust quantity, test the impact of different angle of incidence of sunlight, solar cell probe is demarcated.Utilize this calibration result, the short circuit current that lunar dust survey meter can be popped one's head according to angle of incidence of sunlight during test and solar cell, calculate the moon dust quantity of deposition.
The present invention adopts caliberating device as shown in Figure 1 to realize the demarcation of popping one's head in solar cell, caliberating device comprises total internal reflection minute surface 1, simulated solar light source 2, solar cell probe 3, load resistor 4, volt meter 5, sample stage 6, sample stage angle dial 7 and cover glass, wherein, sample stage 6 and sample stage angle dial 7 rack-mount, sample stage 6 can rotate, the change of simulated solar irradiation incident angle, and sample stage 6 and horizontal angle can measure acquisition by sample stage angle dial 7; Solar cell probe placement is on sample stage, and cover glass covers on solar cell probe 3; Solar cell probe 3 is arranged on sample stage 6, the light of simulated solar light source 2 reflexes on solar cell probe 3 by total internal reflection minute surface 1, solar cell is popped one's head in 3 external load resistors 4, described load resistor is precision resistance, 20 Ω, by the voltage of volt meter 5 sensing lead resistance 4, calculate the short circuit current I obtaining solar cell probe 3.
Concrete calibration method is as follows:
Step 1, simulated solar light intensity.
1 standard three-junction gallium arsenide solar battery sheet is lain on sample stage, wherein, standard three-junction gallium arsenide solar battery sheet is identical with solar cell probe size specification to be determined, opening the preheating of simulated solar light source (made equipment stablize) after 1 hour, adjustment sample stage and horizontal angle are 0, adjustment simulated solar light source, position between total internal reflection minute surface and standard three-junction gallium arsenide solar battery sheet, until obtaining light intensity on solar cell probe is 1 solar constant, namely light intensity is 135.3mW/cm
2vertical incidence light, namely angle of incidence is 0.
Step 2, is replaced by solar cell probe to be determined by standard three-junction gallium arsenide solar battery sheet.
Step 3, consider and directly simulation lunar dust is dropped on solar cell probe, be inconvenient to change moon dust quantity, simultaneously, what the present invention adopted is light-shading effect to determine the relation between amount of dust that solar cell probe curent change and solar battery sheet deposit, therefore, the mode analog solar battery probe lunar dust deposition of placing the cover glass sprinkled with simulation lunar dust above solar cell probe can being adopted, realizing the deposition of different quality lunar dust by replacing cover glass.Get the cover glass being more than or equal to 15 to weigh respectively, weigh respectively again after every sheet glass cover plate sprinkles the simulation lunar dust of different quality, for every sheet glass cover plate, deduct the clean quality of cover glass by the quality sprinkled with simulation lunar dust, obtain every sheet glass cover plate sprinkling simulation lunar dust quality m; Wherein, described cover glass and solar cell pop one's head on solar battery sheet measure-alike.
Step 3.1, opens solar cell probe, solar cell probe short circuit current when measure analog lunar dust quality is 0.
Step 3.2, gets the cover glass that monolithic is coated with simulation lunar dust and is placed on solar cell detecting head surface to be determined, recording voltage meter reading, calculate solar cell probe short circuit current I according to the voltage of load resistor (precision resistance, 20 Ω);
Step 3.3, change cover glass, record the short circuit current of solar cell probe under different lunar dust quality, according to formula ∝ exp (-α m) and the lunar dust quality-short-circuit current data measured simulate vertical incidence angle (angle of incidence is 0) Imitating lunar dust deposition and solar cell and to pop one's head in short circuit current relation curve; Wherein, m is the quality of lunar dust, and α is index parameters.
Step 4, changes the angle θ of sample stage and horizontal surface, repeats step 3.2 and 3.3, obtains the corresponding relation of different angle of incidence of sunlight degree θ Imitating lunar dust mass accumulation and solar cell short circuit current; Make the change curve of the short circuit current of a certain amount of deposition lunar dust under different solar incident angle.
Step 5, according to the data of test in step 3, finds out when solar incident angle θ=0 °, causes minimum value and the maxim of short circuit current knots modification, and the deposition moon dust quantity of its correspondence is minimum value and the maxim of the range of lunar dust survey meter solar cell probe.
Provide a concrete example to be below described.
The test data of the solar cell probe short circuit current under the simulated solar irradiation different incidence angles degree adopting the inventive method to obtain, corresponding to different dust deposit amount is as shown in table 1, and under calibrating vertical incidence angle, the lunar dust survey meter solar cell probe short circuit current moon deposits the corresponding relation of lunar dust as shown in Figure 2.Certain lunar dust cumulant Imitating angle of incidence of sunlight degree and short circuit current relation, as shown in Figure 3.
As shown in Table 1, when angle of incidence of sunlight is 0, change lunar dust quality, the change minimum value (compared with short circuit current when being 0 with lunar dust quality) of short circuit current is 0.0043A, and the simulation lunar dust cumulant on corresponding solar cell probe unit area is 8.42 × 10
-5g/cm
2; The change maxim (compared with short circuit current when being 0 with lunar dust quality) of short circuit current is 0.1366A, and the simulation lunar dust cumulant on corresponding solar cell probe unit area is 5.72 × 10
-3g/cm
2, namely solar cell probe minimum resolution is 8.42 × 10
-5g/cm
2, range ability is 8.42 × 10
-5g/cm
2~ 5.72 × 10
-3g/cm
2, lunar dust survey meter 5 × 10 can be met
-4g/cm
2~ 4 × 10
-3g/cm
2requirement.
Table 1 test figures
Lunar dust survey meter solar cell probe adopts light-shading effect to measure moon dust quantity, and its principle is simple, cost is low, micro-miniaturisation, low in energy consumption.Can monitor in-orbit, particularly monitor the operation process of lunar dust of can kicking up, calibration method of the present invention, contribute to the realization of lunar dust survey meter solar cell probe measurement lunar dust, the data obtained can be to probe into the moon further provides reference.
In sum, these are only preferred embodiment of the present invention, be not intended to limit protection scope of the present invention.Within the spirit and principles in the present invention all, any amendment done, equivalent replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (2)
1. a lunar dust survey meter solar cell probe calibration method, is characterized in that, comprise the steps:
Step 1, builds ground caliberating device;
Caliberating device comprises total internal reflection minute surface (1), simulated solar light source (2), solar cell probe (3), load resistor (4), volt meter (5), sample stage (6) and sample stage angle dial (7); Wherein, sample stage (6) and sample stage angle dial (7) rack-mount, sample stage (6) can rotate, and sample stage (6) and horizontal angle are measured by sample stage angle dial (7) and obtained; Solar cell probe (3) is arranged on sample stage (6), and the light of simulated solar light source (2) reflexes on solar cell probe (3) by total internal reflection minute surface (1); Solar cell probe (3) is connected with load resistor (4), and described load resistor (4) is precision resistance, on volt meter (5) installation load resistance (4);
Step 2, simulated solar light intensity;
Lie on sample stage by 1 standard three-junction gallium arsenide solar battery sheet, wherein, standard three-junction gallium arsenide solar battery sheet is identical with solar cell probe size specification to be determined; Open the preheating of simulated solar light source, after the preheated one-section time, adjustment sample stage and horizontal angle are 0, adjustment simulated solar light source, position between total internal reflection minute surface and standard three-junction gallium arsenide solar battery sheet, until obtain the vertical incidence light that light intensity is 1 solar constant on standard three-junction gallium arsenide solar battery sheet, for situation during simulated solar irradiation incidence angle θ=0 °;
Step 3, is replaced by solar cell probe to be determined by standard three-junction gallium arsenide solar battery sheet;
Step 4, measures without solar cell probe short circuit current during simulation lunar dust quality; Successively the cover glass sprinkled with different quality simulation lunar dust is covered in solar cell detecting head surface to be determined, measures the solar cell probe short circuit current under different simulation lunar dust quality respectively; Described cover glass size is identical with solar cell probe size to be determined;
Step 5, according to the data of test in step 4, electric current knots modification when to calculate solar cell probe short circuit current be 0 compared to simulation lunar dust quality, obtains simulation lunar dust quality and solar cell and to pop one's head in the corresponding relation of short circuit current; Extract minimum value and the maxim of electric current knots modification, the minimum value of solar cell probe range and maxim when the simulation lunar dust quality of its correspondence is angle of incidence of sunlight θ=0 °; The minimum value of range is the minimum resolution of solar cell probe.
2. lunar dust survey meter solar cell probe calibration method as claimed in claim 1, it is characterized in that, change the angle θ of sample stage and horizontal surface, repeat step 4, obtain the corresponding relation of different angle of incidence of sunlight θ Imitating lunar dust mass accumulation and solar cell short circuit current.
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Cited By (3)
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CN109305392A (en) * | 2017-07-28 | 2019-02-05 | 王洋 | A kind of optics load radiation calibration pointing accuracy determining device and control method |
CN113345309A (en) * | 2021-05-07 | 2021-09-03 | 哈尔滨工业大学 | Lunar dust sprinkling device for lunar multi-factor comprehensive environment simulation |
CN115683963A (en) * | 2022-09-19 | 2023-02-03 | 兰州空间技术物理研究所 | Device and method for testing lunar dust deposition uniformity |
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Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109305392A (en) * | 2017-07-28 | 2019-02-05 | 王洋 | A kind of optics load radiation calibration pointing accuracy determining device and control method |
CN109305392B (en) * | 2017-07-28 | 2021-11-16 | 王洋 | Optical load radiometric calibration pointing accuracy determination device and control method |
CN113345309A (en) * | 2021-05-07 | 2021-09-03 | 哈尔滨工业大学 | Lunar dust sprinkling device for lunar multi-factor comprehensive environment simulation |
CN113345309B (en) * | 2021-05-07 | 2023-01-03 | 哈尔滨工业大学 | Lunar dust sprinkling device for lunar multi-factor comprehensive environment simulation |
CN115683963A (en) * | 2022-09-19 | 2023-02-03 | 兰州空间技术物理研究所 | Device and method for testing lunar dust deposition uniformity |
CN115683963B (en) * | 2022-09-19 | 2023-10-27 | 兰州空间技术物理研究所 | Device and method for testing deposition uniformity of moon dust |
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Application publication date: 20141224 |